JP2005005629A - Electronic device - Google Patents

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Publication number
JP2005005629A
JP2005005629A JP2003170185A JP2003170185A JP2005005629A JP 2005005629 A JP2005005629 A JP 2005005629A JP 2003170185 A JP2003170185 A JP 2003170185A JP 2003170185 A JP2003170185 A JP 2003170185A JP 2005005629 A JP2005005629 A JP 2005005629A
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Japan
Prior art keywords
circuit board
electronic device
housing
substrate
electronic
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JP2003170185A
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JP4218434B2 (en
Inventor
Takehide Yokozuka
剛秀 横塚
Masahide Harada
正英 原田
Shiro Yamashita
志郎 山下
Kaoru Uchiyama
内山  薫
Kuniyuki Eguchi
州志 江口
Masahiko Asano
雅彦 浅野
Koji Sato
弘二 佐藤
Isamu Yoshida
勇 吉田
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Hitachi Ltd
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Hitachi Ltd
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Priority to JP2003170185A priority Critical patent/JP4218434B2/en
Priority to PCT/JP2004/008458 priority patent/WO2004112129A1/en
Publication of JP2005005629A publication Critical patent/JP2005005629A/en
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Publication of JP4218434B2 publication Critical patent/JP4218434B2/en
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0201Thermal arrangements, e.g. for cooling, heating or preventing overheating
    • H05K1/0203Cooling of mounted components
    • H05K1/0204Cooling of mounted components using means for thermal conduction connection in the thickness direction of the substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • H01L23/367Cooling facilitated by shape of device
    • H01L23/3677Wire-like or pin-like cooling fins or heat sinks
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/73Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/191Disposition
    • H01L2924/19101Disposition of discrete passive components
    • H01L2924/19105Disposition of discrete passive components in a side-by-side arrangement on a common die mounting substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09009Substrate related
    • H05K2201/09054Raised area or protrusion of metal substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10227Other objects, e.g. metallic pieces
    • H05K2201/10416Metallic blocks or heatsinks completely inserted in a PCB
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10621Components characterised by their electrical contacts
    • H05K2201/10734Ball grid array [BGA]; Bump grid array
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0058Laminating printed circuit boards onto other substrates, e.g. metallic substrates
    • H05K3/0061Laminating printed circuit boards onto other substrates, e.g. metallic substrates onto a metallic substrate, e.g. a heat sink

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Cooling Or The Like Of Electrical Apparatus (AREA)
  • Combinations Of Printed Boards (AREA)
  • Mounting Of Printed Circuit Boards And The Like (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To improve heat-radiating characteristics of an electronic device, especially to improve heat-radiating characteristics of an electronic device using an interposer substrate. <P>SOLUTION: The electronic device has an electronic substrate having a first circuit substrate whereon an electronic component is mounted and a second circuit substrate electrically connected to the first circuit substrate and fixed to a housing, and the housing whereto the electronic substrate is fixed. A structure wherein the first circuit substrate is fixed to the housing in a space wherein it is not superposed with the second circuit substrate is employed. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

【0001】
【発明の属する技術分野】
本発明は、エンジンコントロールユニットに代表される高放熱構造が必要な電子装置に関する。
【0002】
【従来の技術】
通常、電子装置は、出荷前に熱サイクル試験を行うことにしている。特に、ECU等の車載用電子制御装置では、エンジンのオンオフや環境温度の変化により車体内の温度が大きく変化し、広い温度領域での熱サイクル(通常、−40度〜120度:自動車用電子機器の環境試験通則JASOD001)に耐える仕様が要求される。今般、ECUをよりエンジン近くに配置する傾向があるため、この温度範囲の上限の仕様をより高くする傾向がある。従って、車載用電子装置には、一般の電子装置よりも高い放熱性が必要とされる。
【0003】
近年の電子装置は、半導体装置等の電子部品をインタポーザ基板(中間回路基板)に搭載し、そのインタポーザ基板をはんだバンプ等によりマザーボード(回路基板)に搭載する構造を採用することが多くなってきた。
【0004】
発熱源である電子部品から放熱先である筐体までの間にマザーボードとインターポザ基板の2つの基板を挟み込む構造になるので、従来のマザーボードに電子部品を直接搭載する構造に比べて放熱性は低くなる。
【0005】
放熱性を向上させる手法として、従来、コア材である金属板の両面に配線層と絶縁層を形成したメタルコア基板をインタポーザ基板に用い、そのインターポーザ基板の両面の樹脂層と配線層の一部を取り除き、コア材上面側に電子部品である半導体装置を直接フェースアップ方式で搭載し、コア材下面側とマザーボード上面側とをはんだとメッキで接続した構造がある。(特許文献1、図34)。
【0006】
【特許文献1】特開2003−46022
【0007】
【発明が解決しようとする課題】
しかし、上記従来の技術では、筐体内に搭載されるインターポーザ基板とマザーボードとの間の放熱には着目していたが、筐体も含めた電子装置全体の放熱性を向上させることが十分に検討されていなかった。
【0008】
つまり、本発明の目的は、電子装置の放熱性を向上させることにある。
【0009】
【課題を解決するための手段】
本願には上記課題を解決することができる複数の発明を含むであり、以下にその代表的なものを記載する。
【0010】
筐体と、筐体に接着されている電子基板とを備え、該電子基板は、電子部品が搭載されている第1の回路基板(インターポザ基板)と、該第1の回路基板と電気的に接続されているとともに、該筐体に固定されている第2の回路基板(マザーボード)とを有する電子装置において、インターポーザ基板が、マザーボードと重畳しない空間で該筐体に固定された構造とすることにより、固定に用いることができる面積を大きくすることができるようになるので、次の効果がある。
【0011】
(1)接着面積が大きくなるということにより、落下等の強い衝撃が掛かったときでも、インターポーザ基板とマザーボードとの間の断線を抑制できる。
【0012】
(2)かかる空間を放熱経路として用いることにより、直接筐体へ通じる大きな放熱経路を形成することができる。
【0013】
また、上記態様の第1の回路基板は、第2の回路基板とは別に成形された部材を介して該筐体に固定しておくようにすることが好ましい。
【0014】
メッキ等では形成できる形状(面積や厚み)に限界があるが、別部品として予め成形しておけば、面積や厚みの限界はあまり気にしなくてもよくなり、低コストで大きな面積の固定ができるようになる。また、かかる部材を熱伝導係数の大きな部材を用いることで、大きな断面積を持つ放熱経路を確保することができる。
【0015】
また、上記態様において、第2の回路基板は貫通孔を備え、該第1の回路基板と該筐体との間であって該貫通孔と重畳する空間に、該第2の回路基板とは別に成形された部材を備えるようにすることが好ましい。
【0016】
このように、貫通孔を第2の基板に設けることで、第1の回路基板と第2の回路基板との非重畳空間を第2の回路基板の中央に配置できるようになる。つまり、放熱源である電子部品の直下に放熱部材を配置できるようになるので、放熱性が向上する。
【0017】
当然、放熱性の観点から、上述した部材として、第2の回路基板よりも熱伝導率が大きいものを用いることが好ましい。
【0018】
自動車用途のような高い信頼性を必要とする場合、第1の基板と前記第2の基板とが重畳する空間にゲル状の絶縁物が充填することが好ましい。
【0019】
また、部材と第1の回路基板の接着面の少なくとも一方、又は/及び、部材と筐体の接着面のすくなくとも一方に、凹凸があることが好ましい。
【0020】
また、部材が筐体の一部が成形された筐体の突起である場合には、接続に用いる接着層による熱伝導性の低下を防止できるので、放熱性の向上に寄与する、
また、第1の回路基板として、メタルコア基板を使う場合、裏面の一部で金属板を露出させ、その部分と記筐体とを接着させるようにすることで、より放熱性を向上させることができる。
【0021】
【発明の実施の形態】
図2に、電子装置の1例である、エンジンコントロールユニット(ECU)モジュールの蓋を外した斜視図を示す。
【0022】
ECUモジュールは、外部との信号の入出力を行うコネクタが形成されたアルミ筐体27(蓋は図示していない。)と、コネクタと配線で電気的に接続され、アルミ筐体27上に搭載されたマザーボード(回路基板)15と、マザーボード15上に搭載された半導体パッケージ41と、筐体27内部を満たすシリコーンゲルを備えている。
【0023】
なお、シリコーンゲルはなくてもよいが、本例では信頼性向上の観点から充填している。
【0024】
図1は、図2の断面図である。
【0025】
半導体パッケージ41は、樹脂層と回路層13とを備えた回路基板(インターポーザ基板)11と、このインターポーザ基板11に接着剤5でダイボンディングされ、ボンディングワイヤ3により回路層13に電気的に接続されている電源ICである半導体装置1と、この半導体装置1、ボンディングワイヤ3及び回路層とを封止するようにインターポーザ基板11上をモールドする樹脂7を備えている。ダイボンディングに用いた接着剤5は、銀をフィラーとして樹脂に含有させた銀ペーストである。
【0026】
マザーボード15は、樹脂層と回路層13とを備えた回路基板であり、はんだ23で電子部品21が搭載され、BGA(ボールグリッドアレイ)はんだ19で半導体パッケージ41が搭載されている。
【0027】
また、マザーボード15は、インターポーザ基板上の半導体装置1が搭載された領域と重畳する領域に貫通孔を備えている。
【0028】
筐体27は、突起29を備え、この突起がマザーボード15の貫通孔に嵌め込まれており、その突起29とインターポーザ基板11が接着剤31で固定されている。また、突起29以外の場所は接着剤25でマザーボード15に接着されている。なお、接着剤31には、シリコーンに銀のフィラーを含有させた樹脂接着剤31が用いられ、接着剤25には、銀ペーストが用いられている。
【0029】
このように、筐体27の突起29をマザーボード15の貫通孔を利用してインターポーザ基板11に接続することで、半導体装置1の発する熱によりインターポーザ基板11にこもる熱を、高い熱導伝性の材料で形成された短かい放熱経路で高い筐体へ逃がすことができるので、電子装置の放熱性を向上することができている。
【0030】
なお、樹脂接着剤31は、銀以外の金属又はアルミナ等の金属無機化合物といった樹脂よりも熱伝導率の高いフィラーを含有する樹脂ペーストや、回路基板の樹脂層よりも熱伝導率の大きなはんだに変えることもできる。
【0031】
また、樹脂接着剤31の樹脂は、接着性を確保することができれば、シリコーン以外の材料を用いることもできるが、本例では、インターポーザ基板とマザーボードとの熱膨張係数の差により生じるBGAはんだ接続部の熱疲労破壊、銀ペースト自体の破壊及び界面剥離を抑制するために、BGAはんだ接続部に用いたはんだ材料よりもヤング率の小さいシリコーン系の樹脂ペーストを用いている。なお、シリコーン系の樹脂のほかにグリース、シートでも同様の効果を得ることができる。
【0032】
次に、図1のECUモジュールの製造プロセスを説明する。
【0033】
図3は、図1のECUモジュールの製造プロセスを示す図である。
【0034】
まず、半導体パッケージ41の製造プロセスを説明する(図3(a))。
【0035】
インターポーザ基板11の表面に、5mm角の半導体装置1をフェースアップに配置してはんだ又は銀ペースト5でダイボンディングする。ダイボンディング後、ボンディングワイヤ3にて半導体装置の端子とインターポーザ基板のパッドとを電気的に接続する。次に、電子部品9を搭載する。なお、この接続方式は電子部品の種類に応じて適宜選択する。次に、取り扱い性や信頼性を高めるために、樹脂7でモールドする。次に、パッケージ基板裏面に、はんだBGA接続用のパッドを形成する。なお、このパッドは、直径0.6mm、ピッチ1.27mmで、ニッケルめっき、さらには金めっきを施すことで形成した。また、このパッドは、半導体装置1を形成した位置の裏面に半導体装置1の大きさより若干大きい領域を除いた領域に形成した。パッドを形成すると同時に、その除いた領域に5mm角程度の金属層を形成しておく。BGA接続用パッドには、直径0.76mmのSn3Ag0.5Cuはんだボール19を搭載、リフローし、はんだバンプを形成した。アルミ筐体27は、5mm角、高さ2.0mmの突起部29をフライスによる機械加工で形成した。
【0036】
次に、マザーボード15の製造プロセスを説明する。
【0037】
樹脂基板(プリント基板、厚さ:1.5mm)を用意し、この基板に、所望の位置にルーター加工により貫通孔43を形成しておく(図3(b))。
【0038】
次に、マザーボード15と半導体パッケージ41との接合について説明する。
【0039】
マザーボード15上の所定の位置に、半導体パッケージ41と電子部品21を位置合わせして搭載し、240℃で5分ほどはんだを溶融し、リフロー接続する(図3(c))。なお、貫通孔のサイズは、7mm角とした。マザーボードの貫通孔41には、アルミの突起29が配されることになるので、開口部をアルミ突出部のサイズより大きくすることにより、基板の筐体に対する位置合わせ精度の条件を緩和すると共に、パッケージとアルミ突起部を接着する接着剤31の余剰分を貯めるスペースとして有効である。
【0040】
次に、インターポーザ基板を搭載したマザーボードをアルミ筐体に接着するプロセスについて説明する。
【0041】
突起部付きのアルミ筐体の基板搭載部分に、シリコーン接着剤25を塗布するとともに、突起部には熱伝導率が高くてヤング率の小さいシリコーンを主成分とし、銀フィラーを含有する銀ペースト31を塗布する(図3(d))。部品を搭載した貫通孔を備えたマザーボード(状態(C))をアルミ筐体上に搭載し、150℃、1時間硬化させる。マザーボードの穴からは、先のアルミ筐体に形成した突出部29が、基板表面より、0.5mmほど突き出ることになる。パッケージと基板を電気的に接続するはんだボール高さがおよそ0.4mm程度、基板厚さが1.6mm、シリコーン接着剤厚さが0.1mm程度なので、トータル2.1mm程度となる。銀ペースト31の厚さを0.1mm程度とすればよい。
【0042】
以上の本態様の構造は次の特徴を備えているといえる。
【0043】
まず、筐体と、筐体に接着されている電子基板とを備え、該電子基板は、電子部品が搭載されているインターポザ基板と、該インターポーザ基板基板と電気的に接続されているとともに、該筐体に固定されている第マザーンボードマザーボードとを有する電子装置において、インターポーザ基板が、マザーボードと重畳しない空間で該筐体に固定された構造となっている点である。
【0044】
このような構造は、インターポーザ基板とマザーボードの熱膨張係数の差による影響を受けないので、より強い固定を得ることができる。マザーボードを介在させないことで、固定方式に制約がなくなり、接着面積を大きくできる。従って、接着面積の増加により、落下等の強い衝撃が掛かったときでも、インターポーザ基板とマザーボードとの間の断線を抑制できるという効果がある。また、マザーボードを介在させずに、放熱できるので、直接筐体へ通じる大きな放熱経路を形成することもできる。
【0045】
また、インターポザーザ基板は、マザーボードとは別に成形された部材を介して筐体に固定しておくようにすることが好ましい。
【0046】
従来、メッキ等で形成できる形状(面積や厚み)は限界があるが、別部品として予め成形しておけば、面積や厚みの限界はあまり気にしなくてもよくなり、低コストで大きな面積の固定ができるようになる。また、かかる部材を熱伝導係数の大きな部材を用いることで、大きな断面積を持つ放熱経路を確保することができるようになる。
【0047】
また、マザーボードは貫通孔を備え、インターポザーザ基板と該筐体との間であって該貫通孔と重畳する空間に、該マザーボードとは別に成形された部材を備えるようにすることが好ましい。
【0048】
このように、貫通孔をマザーボードに設けることで、インターポーザ基板とマザーボードとの非重畳空間をマザーボードの中央に配置できるようになる。つまり、放熱源である電子部品の直下に放熱部材を配置できるようになるので、筐体までの経路の断面積が大きくでき、放熱性が向上する。
【0049】
当然、放熱性の観点から、上述した部材として、マザーボードの樹脂層よりも熱伝導率が大きいものを用いることが好ましい。
【0050】
車載用電子装置では、インターポザーザ基板とマザーボードとが重畳する空間にゲル状の絶縁物が充填されているので、上記構造は特に効果がある。
【0051】
また、部材が筐体の一部が成形された筐体の突起であるので、接続に用いる接着層による熱伝導性の低下を防止できるので、放熱性の向上に寄与している。
【0052】
次に、図1と異なる他の構造について説明する。
【0053】
図4は、図1とは異なるECUもジュールの断面図である。
【0054】
アルミ筐体27は、従来どおり、その内面側はほとんど平板の状態とする。別途成形したアルミの金属ブロック33を作製し、これをアルミ筐体27に、金属フィラーを含有したシリコーン接着剤35を用いて接着する。
【0055】
本実施例によれば、固定強度を向上させるたり、放熱性を向上させることができるだけでなく、基板の筐体に対する位置合わせ精度の制限を緩和することができる。接着剤31は、熱伝導率の大きい銀やその他の金属あるいはアルミナ等の金属無機化合物の粉体を含有する樹脂ペーストや、さらに熱伝導率の高いはんだであることが、放熱特性上望ましい。
【0056】
また、接着剤として、ヤング率の小さいシリコーン系の樹脂ペーストやグリース、シートを用いることにより、BGAはんだ接続部におよぼす熱疲労破壊を緩和し、また銀ペースト自体の破壊や界面剥離を緩和できるので、接続信頼性上望ましい。
【0057】
図5は、図1に示した実施例に対して、次の点で異なる実施例である。パッケージを構成する基板がメタルコア基板37であり、メタルコア基板表裏の絶縁樹脂を一部除去し、コアメタルが露出した部分に高発熱なチップ1をフェースアップで銀ペースト5で接着し、電気的な接続は、ワイヤボンディング3でパッケージ基板上のボンディングパッドと接続する。他の部品も必要に応じてパッケージ基板上に搭載し、樹脂モールド7することにより、取り扱い性を向上できる。パッケージ裏面のコアメタル露出部分に対して、アルミ筐体突出部33を、シリコーン系の銀ペースト31で接着する。本実施例によれば、高発熱チップから熱容量の大きいアルミ筐体までの間を、熱伝導率の低い回路基板の絶縁樹脂層なしで接続できるため、放熱性を極めて高めることができる。また、接着部31もしくは35のいずれかもしくは両方を、非導電フィラー入りの接着剤もしくはフィラーなしの接着剤とすることにより、コアメタルとアルミ筐体の絶縁性を保つことも可能である。
【0058】
図6は、前述の実施例に対して、コアメタル39とアルミ突出部33の接続を、はんだボール45で行っている点で異なる。放熱部分をはんだボール接続とすることにより、製造プロセスを簡易化することができる。放熱に寄与する接続総面積は減少するが、はんだ自体の熱伝導率は銀ペーストのそれより10倍程度大きいため、前述の実施例より放熱性を下げないことは可能である。はんだボールではなく、前述の実施例における銀ペースト接続部分全体をはんだで接続すれば、さらに放熱性は向上する。
【0059】
図6に示した実施例を実現するための製造プロセスを、図7に簡単に示し、以下に説明する。
【0060】
まず、パッケージ部分の製造方法を示す(図7(c)上)。パッケージ基板としては、メタルコア基板37を使用する。メタルコア基板の製造は、公知の方法で行う。ただし、絶縁樹脂部分を除去する必要があり、これを炭酸レーザー加工で行う。デスミア処理後、コアメタル39表面に、およそ5mm角の高発熱な電子部品1をフェースアップではんだや銀ペースト5でダイボンディングする。電気的接続は、ワイヤボンディング3にて行う。さらに取り扱い性や信頼性を高めるために、樹脂7でモールドする。パッケージ基板裏面には、はんだBGA接続用のパッドを形成する。このパッドは、例えば直径0.6mm、ピッチ1.27mmで、ニッケルめっき、さらには金めっきを施す。このBGA用パッドを基板裏面に全体に形成せず、一部、放熱用の5mm角の領域を残す。以上のプロセスは、図5に記載の実施例に対しても有効である。この放熱用の領域に、直径0.6mm、1.27mmピッチの絶縁樹脂除去部(ざぐり部)を形成する。このざぐり部は、チップ搭載部と同様の方法すなわちレーザ加工により、形成する。このざぐり部の直径を、他のBGAパッドとほぼ同サイズにすると、供給はんだボールサイズを同じとすることができるので、プロセス管理が容易になる。また、ざぐり部のピッチを小さくして数を増やす、もしくはざぐり部の面積を大きくすることにより、放熱性を向上できる。BGA接続用パッドおよび放熱用ざぐり部に、それぞれ直径0.76mmのSn3Ag0.5Cuはんだボール19および45を搭載、リフローし、はんだを形成しておく。
【0061】
ECUアルミ筐体には、5mm角、高さ1.7mmの突起部33を所望の位置に形成しておく。この突起部は、前述の実施例のような方法にて形成する。突起部上には、パッケージ裏面の放熱用はんだパターンに合うように、はんだ接続用のメタライズすなわち厚さ5ミクロンのニッケルさらには0.5ミクロンの金めっきを形成する。このメタライズは、はんだと反応すれば何でも良く、形成方法もスパッタ等、何でも良い。
【0062】
基板は公知の技術による樹脂基板(プリント基板、厚さ:1.5mm)とし、この基板に、所望の位置にルーター加工により穴を形成しておく。穴のサイズは、6mm角とする。アルミ突出部のサイズより大きくすることにより、基板の筐体に対する位置合わせ精度の制約を緩和できる。
【0063】
本実施例では、突起部付きのアルミ筐体の基板搭載部分にシリコーン接着剤を塗布して、この穴あきの基板を搭載し、150℃、1時間硬化させる。基板の穴からは、先のアルミ筐体に形成した突出部が、基板表面より、0.2mmほど突き出ることになる。
【0064】
基板上の所定の位置に、先のパッケージやその他電子部品を位置合わせして搭載し、240℃で5分ほどはんだを溶融し、すべてのはんだ接続部を同時にリフロー接続する。
【0065】
放熱のための金属突起部および基板開口部は、上記実施例では搭載チップと同サイズとしたが、チップサイズより大きいと、放熱性をさらに向上できる。また、金属突起部および基板開口部がチップサイズより小さいと、基板の配線可能な領域が増え、基板サイズを小さくすることができる。また、放熱部は、その水平断面形状が必ずしも正方形や長方形である必要はなく、円形や、角が丸みを帯びた形状であれば、位置合わせ性に重要な役割を果たす表面張力を向上させることができ、また応力集中を避けることによる信頼性向上が可能となる。
【0066】
図8に、他の電子装置の構造を示す。
【0067】
図1の電子装置と異なるのは、突起29最上面に、微小な溝又は突起100を設けている点である。
【0068】
図1の構造では、樹脂接着剤又ははんだで構成された接着剤31が突起29とインターポーザ基板11との間に介在することにより、微小な間隔がその接続面に生じるが、微小突起を設けることにより、溝で接着力を確保しつつ、突起をインターポーザ基板に押し付けることで、これらの間隔を縮めることができるので、放熱性を向上することができる。
【0069】
図9に、他の電子装置の構造を示す。
【0070】
図4の電子装置と異なるのは、金属ブロック33の上面と下面に、微小な溝又は突起101と102を設けている点である。
【0071】
図4の構造では、樹脂接着剤又ははんだで構成された接着剤31が、金属ブロック33とマザーボード15との間及び金属ブロック33とインターポーザ基板11との間に介在することにより、微小な間隔がその接続面に生じる。しかし、金属ブロック33の上面と下面に微小突起を設けることにより、溝で接着力を確保しつつ、突起をインターポーザ基板に押し付けることで、これらの間隔を縮めることができるので、放熱性を向上することができる。
【0072】
なお、この突起と溝により形成された凹凸のある金属ブロックは、図5、6の金属ブロックに適用すると同様の効果がある。ただし、図6の構造の金属ブロックの上面ははんだバンプとの接続であり、凹凸は無いほうが好ましい。
【0073】
【発明の効果】
本発明によれば、電子装置の放熱性を向上することができる。
【図面の簡単な説明】
【図1】図1は、電子装置の断面図である。
【図2】図2は、ECUモジュールの斜視図である。
【図3】図3は、図1の構造の製造プロセスを表す断面図である。
【図4】図4は、電子装置の断面図である。
【図5】図5は、電子装置の断面図である。
【図6】図6は、電子装置の断面図である。
【図7】図7は、製造プロセスを示す図である。
【図8】図8は、電子装置の断面図である。
【図9】図9は、電子装置の断面図である。
【符号の説明】
1…半導体装置、3…ボンディングワイヤ、5…樹脂接着剤、7…モールド樹脂、9…電子部品、11…インターポーザ基板、13…回路層、15…マザーボード、17…回路層、19…はんだバンプ、21…電子部品、23…はんだ、25…樹脂接着剤、27…アルミ筐体、29…突起、31…樹脂接着剤、33…金属ブロック、35…樹脂接着剤、37…メタルコア基板、39…コアメタル(内層した金属板)、41…半導体パッケージ、43…貫通孔、45…放熱用はんだボール
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an electronic device that requires a high heat dissipation structure represented by an engine control unit.
[0002]
[Prior art]
Usually, electronic devices are subjected to a thermal cycle test before shipping. In particular, in an in-vehicle electronic control device such as an ECU, the temperature in the vehicle body changes greatly due to the on / off of the engine or a change in environmental temperature, and a thermal cycle in a wide temperature range (usually −40 degrees to 120 degrees: automotive electronics Specifications that can withstand the general environmental test rules for equipment (JASOD001) are required. Nowadays, since the ECU tends to be arranged closer to the engine, the upper limit specification of this temperature range tends to be higher. Therefore, the in-vehicle electronic device is required to have higher heat dissipation than a general electronic device.
[0003]
In recent years, an electronic device such as a semiconductor device is mounted on an interposer board (intermediate circuit board), and a structure in which the interposer board is mounted on a mother board (circuit board) by solder bumps has been increasingly used. .
[0004]
Since it has a structure in which two boards, a motherboard and an interposer board, are sandwiched between an electronic component that is a heat source and a housing that is a heat dissipation destination, heat dissipation is low compared to a structure in which electronic components are directly mounted on a conventional motherboard. Become.
[0005]
As a technique for improving heat dissipation, a metal core substrate in which a wiring layer and an insulating layer are formed on both surfaces of a metal plate, which is a core material, is used as an interposer substrate, and a resin layer and a part of the wiring layer on both surfaces of the interposer substrate are used. There is a structure in which a semiconductor device which is an electronic component is directly mounted on the upper surface side of the core material by a face-up method, and the lower surface side of the core material and the upper surface side of the motherboard are connected by solder and plating. (Patent Document 1, FIG. 34).
[0006]
[Patent Document 1] Japanese Patent Laid-Open No. 2003-46022
[0007]
[Problems to be solved by the invention]
However, in the above conventional technology, attention has been paid to heat radiation between the interposer board and the motherboard mounted in the housing, but it is fully studied to improve the heat radiation performance of the entire electronic device including the housing. Was not.
[0008]
That is, an object of the present invention is to improve heat dissipation of an electronic device.
[0009]
[Means for Solving the Problems]
The present application includes a plurality of inventions that can solve the above-described problems, and typical ones are described below.
[0010]
A housing, and an electronic board bonded to the housing, the electronic board being electrically connected to the first circuit board (interposer board) on which electronic components are mounted and the first circuit board In an electronic device that is connected and has a second circuit board (motherboard) fixed to the casing, the interposer board is fixed to the casing in a space that does not overlap with the motherboard. Therefore, the area that can be used for fixing can be increased, and the following effects are obtained.
[0011]
(1) Since the adhesion area is increased, disconnection between the interposer substrate and the motherboard can be suppressed even when a strong impact such as dropping is applied.
[0012]
(2) By using such a space as a heat dissipation path, a large heat dissipation path that directly leads to the housing can be formed.
[0013]
Moreover, it is preferable to fix the 1st circuit board of the said aspect to this housing | casing through the member shape | molded separately from the 2nd circuit board.
[0014]
There is a limit to the shape (area and thickness) that can be formed by plating, etc. However, if it is molded in advance as a separate part, there is no need to worry about the limit of area or thickness, and fixing a large area at low cost become able to. In addition, a heat dissipation path having a large cross-sectional area can be secured by using a member having a large thermal conductivity coefficient.
[0015]
Further, in the above aspect, the second circuit board includes a through hole, and the second circuit board is located in a space between the first circuit board and the housing and overlapping the through hole. It is preferable to provide a separately molded member.
[0016]
Thus, by providing the through hole in the second substrate, the non-overlapping space between the first circuit board and the second circuit board can be arranged in the center of the second circuit board. That is, since the heat radiating member can be arranged directly under the electronic component which is a heat radiating source, the heat dissipation is improved.
[0017]
Of course, from the viewpoint of heat dissipation, it is preferable to use a member having a higher thermal conductivity than the second circuit board.
[0018]
When high reliability is required, such as for automotive applications, it is preferable to fill a space where the first substrate and the second substrate overlap with a gel-like insulator.
[0019]
Moreover, it is preferable that at least one of the bonding surfaces of the member and the first circuit board, or / and at least one of the bonding surfaces of the member and the housing have irregularities.
[0020]
In addition, when the member is a projection of the casing formed by part of the casing, it is possible to prevent a decrease in thermal conductivity due to the adhesive layer used for connection, which contributes to an improvement in heat dissipation.
Also, when using a metal core substrate as the first circuit board, the heat dissipation can be further improved by exposing the metal plate at a part of the back surface and bonding the part and the housing. it can.
[0021]
DETAILED DESCRIPTION OF THE INVENTION
FIG. 2 shows a perspective view of an engine control unit (ECU) module, which is an example of an electronic device, with a lid removed.
[0022]
The ECU module is mounted on the aluminum casing 27 and is electrically connected to the aluminum casing 27 (with a lid not shown) in which a connector for inputting / outputting signals from / to the outside is formed. A mother board (circuit board) 15, a semiconductor package 41 mounted on the mother board 15, and a silicone gel filling the inside of the housing 27 are provided.
[0023]
Silicone gel may be omitted, but in this example, it is filled from the viewpoint of improving reliability.
[0024]
FIG. 1 is a cross-sectional view of FIG.
[0025]
The semiconductor package 41 is a circuit board (interposer board) 11 having a resin layer and a circuit layer 13, and is die-bonded to the interposer board 11 with an adhesive 5, and is electrically connected to the circuit layer 13 by a bonding wire 3. A semiconductor device 1 that is a power supply IC, and a resin 7 that molds the interposer substrate 11 so as to seal the semiconductor device 1, the bonding wire 3, and the circuit layer are provided. The adhesive 5 used for die bonding is a silver paste containing silver as a filler in a resin.
[0026]
The mother board 15 is a circuit board including a resin layer and a circuit layer 13, and an electronic component 21 is mounted with solder 23 and a semiconductor package 41 is mounted with BGA (ball grid array) solder 19.
[0027]
The mother board 15 includes a through hole in a region overlapping with a region where the semiconductor device 1 is mounted on the interposer substrate.
[0028]
The casing 27 includes a protrusion 29, and this protrusion is fitted into the through hole of the mother board 15, and the protrusion 29 and the interposer substrate 11 are fixed with an adhesive 31. Further, locations other than the protrusions 29 are bonded to the mother board 15 with an adhesive 25. For the adhesive 31, a resin adhesive 31 in which a silver filler is contained in silicone is used, and for the adhesive 25, a silver paste is used.
[0029]
In this way, by connecting the protrusions 29 of the housing 27 to the interposer substrate 11 using the through holes of the mother board 15, the heat accumulated in the interposer substrate 11 due to the heat generated by the semiconductor device 1 is highly thermally conductive. Since it can escape to a high housing | casing with the short heat dissipation path | route formed with the material, the heat dissipation of an electronic device can be improved.
[0030]
The resin adhesive 31 is used for a resin paste containing a filler having a higher thermal conductivity than a resin such as a metal other than silver or a metal inorganic compound such as alumina, or a solder having a higher thermal conductivity than the resin layer of the circuit board. It can also be changed.
[0031]
In addition, the resin of the resin adhesive 31 can be made of a material other than silicone as long as the adhesiveness can be ensured. In this example, the BGA solder connection caused by the difference in thermal expansion coefficient between the interposer substrate and the mother board is used. In order to suppress thermal fatigue failure of the part, destruction of the silver paste itself, and interface peeling, a silicone resin paste having a Young's modulus smaller than that of the solder material used for the BGA solder connection part is used. The same effect can be obtained with grease and sheet in addition to the silicone resin.
[0032]
Next, a manufacturing process of the ECU module of FIG. 1 will be described.
[0033]
FIG. 3 is a diagram showing a manufacturing process of the ECU module of FIG.
[0034]
First, the manufacturing process of the semiconductor package 41 will be described (FIG. 3A).
[0035]
A 5 mm square semiconductor device 1 is placed face up on the surface of the interposer substrate 11 and die-bonded with solder or silver paste 5. After die bonding, the terminal of the semiconductor device and the pad of the interposer substrate are electrically connected by the bonding wire 3. Next, the electronic component 9 is mounted. This connection method is appropriately selected according to the type of electronic component. Next, in order to improve handleability and reliability, it molds with resin 7. Next, a solder BGA connection pad is formed on the back surface of the package substrate. This pad was formed by nickel plating and further gold plating with a diameter of 0.6 mm and a pitch of 1.27 mm. Further, this pad was formed on the back surface of the position where the semiconductor device 1 was formed, in a region excluding a region slightly larger than the size of the semiconductor device 1. At the same time as forming the pad, a metal layer of about 5 mm square is formed in the removed area. A Sn3Ag0.5Cu solder ball 19 having a diameter of 0.76 mm was mounted on the BGA connection pad and reflowed to form a solder bump. The aluminum casing 27 was formed by machining a projection 29 having a 5 mm square and a height of 2.0 mm by milling.
[0036]
Next, a manufacturing process of the mother board 15 will be described.
[0037]
A resin substrate (printed substrate, thickness: 1.5 mm) is prepared, and a through hole 43 is formed on the substrate by router processing at a desired position (FIG. 3B).
[0038]
Next, joining of the mother board 15 and the semiconductor package 41 will be described.
[0039]
The semiconductor package 41 and the electronic component 21 are aligned and mounted at a predetermined position on the mother board 15, and the solder is melted at 240 ° C. for about 5 minutes and reflow-connected (FIG. 3C). The size of the through hole was 7 mm square. Since the aluminum protrusion 29 is arranged in the through hole 41 of the motherboard, by making the opening portion larger than the size of the aluminum protruding portion, the condition of the alignment accuracy with respect to the housing of the substrate is eased. This is effective as a space for storing a surplus of the adhesive 31 that bonds the package and the aluminum protrusion.
[0040]
Next, a process for bonding a mother board on which an interposer substrate is mounted to an aluminum casing will be described.
[0041]
A silicone paste 25 is applied to a substrate mounting portion of an aluminum housing with a protrusion, and the protrusion has a silver paste 31 containing, as a main component, silicone having a high thermal conductivity and a low Young's modulus, and containing a silver filler. Is applied (FIG. 3D). A mother board (state (C)) having a through-hole on which components are mounted is mounted on an aluminum casing and cured at 150 ° C. for 1 hour. From the hole of the motherboard, the protruding portion 29 formed in the previous aluminum casing protrudes from the substrate surface by about 0.5 mm. Since the solder ball height for electrically connecting the package and the substrate is about 0.4 mm, the substrate thickness is 1.6 mm, and the silicone adhesive thickness is about 0.1 mm, the total is about 2.1 mm. The thickness of the silver paste 31 may be about 0.1 mm.
[0042]
It can be said that the structure of the above aspect has the following characteristics.
[0043]
First, a housing and an electronic substrate bonded to the housing are provided. The electronic substrate is electrically connected to the interposer substrate on which the electronic component is mounted, the interposer substrate substrate, and the electronic substrate. In the electronic apparatus having the first motherboard on the motherboard fixed to the casing, the interposer substrate is fixed to the casing in a space that does not overlap with the motherboard.
[0044]
Such a structure is not affected by the difference in thermal expansion coefficient between the interposer substrate and the mother board, so that stronger fixation can be obtained. By not interposing the motherboard, there are no restrictions on the fixing method and the bonding area can be increased. Therefore, even if a strong impact such as dropping is applied due to the increase in the adhesion area, there is an effect that the disconnection between the interposer substrate and the mother board can be suppressed. Moreover, since heat can be radiated without interposing a mother board, a large heat radiating path leading directly to the housing can be formed.
[0045]
The interposer substrate is preferably fixed to the housing via a member formed separately from the mother board.
[0046]
Conventionally, there is a limit to the shape (area and thickness) that can be formed by plating, etc. However, if it is molded in advance as a separate part, the area and thickness limits do not have to be considered much, and the large area is low cost. It can be fixed. Further, by using a member having a large thermal conductivity coefficient as such a member, a heat radiation path having a large cross-sectional area can be secured.
[0047]
Further, it is preferable that the motherboard has a through hole, and a member formed separately from the motherboard is provided in a space between the interposer substrate and the housing and overlapping the through hole.
[0048]
Thus, by providing the through hole in the mother board, the non-overlapping space between the interposer board and the mother board can be arranged at the center of the mother board. That is, since the heat radiating member can be disposed immediately below the electronic component that is the heat radiating source, the cross-sectional area of the path to the housing can be increased, and the heat dissipation is improved.
[0049]
Of course, from the viewpoint of heat dissipation, it is preferable to use a member having a higher thermal conductivity than the resin layer of the mother board as the above-described member.
[0050]
In a vehicle-mounted electronic device, the above structure is particularly effective because a space in which the interposer substrate and the motherboard overlap is filled with a gel-like insulator.
[0051]
Further, since the member is a projection of the casing in which a part of the casing is molded, a decrease in thermal conductivity due to the adhesive layer used for connection can be prevented, which contributes to an improvement in heat dissipation.
[0052]
Next, another structure different from FIG. 1 will be described.
[0053]
FIG. 4 is a cross-sectional view of the joule that is different from the ECU shown in FIG.
[0054]
The aluminum casing 27 is almost flat on the inner surface side as before. A separately formed aluminum metal block 33 is produced, and this is bonded to the aluminum casing 27 using a silicone adhesive 35 containing a metal filler.
[0055]
According to this embodiment, not only can the fixing strength be improved and the heat dissipation can be improved, but also the restriction on the alignment accuracy of the substrate with respect to the housing can be relaxed. The adhesive 31 is preferably a resin paste containing a powder of silver, other metal having a high thermal conductivity, or a metal inorganic compound such as alumina, or a solder having a higher thermal conductivity in terms of heat dissipation characteristics.
[0056]
In addition, by using a silicone-based resin paste, grease, or sheet with a low Young's modulus as the adhesive, thermal fatigue damage to the BGA solder joint can be mitigated, and damage to the silver paste itself and interface peeling can be mitigated. This is desirable for connection reliability.
[0057]
FIG. 5 is different from the embodiment shown in FIG. 1 in the following points. The substrate constituting the package is a metal core substrate 37, a part of the insulating resin on the front and back surfaces of the metal core substrate is removed, and the chip 1 with high heat generation is bonded to the exposed portion of the core metal with the silver paste 5 by face-up, so as to be electrically connected. Are connected to bonding pads on the package substrate by wire bonding 3. When other components are mounted on the package substrate as necessary and the resin mold 7 is used, the handleability can be improved. The aluminum casing protrusion 33 is bonded to the exposed portion of the core metal on the back surface of the package with a silicone-based silver paste 31. According to this embodiment, since the high heat generating chip and the aluminum housing having a large heat capacity can be connected without the insulating resin layer of the circuit board having a low thermal conductivity, the heat dissipation can be extremely enhanced. Moreover, it is also possible to maintain the insulation between the core metal and the aluminum casing by using either or both of the adhesive portions 31 and 35 as an adhesive containing a non-conductive filler or an adhesive without a filler.
[0058]
FIG. 6 is different from the above-described embodiment in that the connection between the core metal 39 and the aluminum protruding portion 33 is performed by the solder ball 45. The manufacturing process can be simplified by making the heat dissipation part a solder ball connection. Although the total connection area contributing to heat dissipation is reduced, the thermal conductivity of the solder itself is about 10 times larger than that of the silver paste. If the entire silver paste connection portion in the above-described embodiment is connected by solder instead of the solder ball, the heat dissipation is further improved.
[0059]
A manufacturing process for realizing the embodiment shown in FIG. 6 is briefly shown in FIG. 7 and described below.
[0060]
First, a manufacturing method of the package part is shown (upper part of FIG. 7C). A metal core substrate 37 is used as the package substrate. The metal core substrate is manufactured by a known method. However, it is necessary to remove the insulating resin portion, which is performed by carbonic acid laser processing. After the desmear treatment, a high heat generation electronic component 1 of about 5 mm square is die-bonded to the surface of the core metal 39 with solder or silver paste 5 face up. Electrical connection is made by wire bonding 3. Furthermore, in order to improve handling property and reliability, it molds with resin 7. A solder BGA connection pad is formed on the back surface of the package substrate. This pad has, for example, a diameter of 0.6 mm and a pitch of 1.27 mm, and is subjected to nickel plating and further gold plating. This BGA pad is not formed on the entire back surface of the substrate, leaving a part of a 5 mm square area for heat dissipation. The above process is also effective for the embodiment shown in FIG. Insulating resin removing portions (bottle portions) having a diameter of 0.6 mm and a pitch of 1.27 mm are formed in this heat radiation region. This counterbore part is formed by the same method as the chip mounting part, that is, by laser processing. If the counterbore diameter is approximately the same size as other BGA pads, the supplied solder ball size can be made the same, thereby facilitating process management. Moreover, heat dissipation can be improved by decreasing the pitch of the spot facing portion to increase the number or increasing the area of the spot facing portion. The Sn3Ag0.5Cu solder balls 19 and 45 having a diameter of 0.76 mm are mounted on the BGA connection pad and the heat-dissipating counterbore, respectively, and reflowed to form solder.
[0061]
A projection 33 having a 5 mm square and a height of 1.7 mm is formed at a desired position on the ECU aluminum casing. This protrusion is formed by the method as in the previous embodiment. A metallization for solder connection, that is, nickel having a thickness of 5 microns, or gold plating having a thickness of 0.5 microns is formed on the protrusion so as to match the solder pattern for heat dissipation on the back surface of the package. This metallization may be anything as long as it reacts with solder, and the formation method may be anything such as sputtering.
[0062]
The substrate is a resin substrate (printed substrate, thickness: 1.5 mm) by a known technique, and holes are formed in this substrate by router processing at a desired position. The hole size is 6 mm square. By making it larger than the size of the aluminum protruding portion, it is possible to relax restrictions on the alignment accuracy of the substrate with respect to the housing.
[0063]
In this embodiment, a silicone adhesive is applied to the substrate mounting portion of the aluminum housing with the protrusions, and the substrate with the holes is mounted and cured at 150 ° C. for 1 hour. From the hole of the substrate, the protruding portion formed in the previous aluminum casing protrudes about 0.2 mm from the surface of the substrate.
[0064]
The previous package and other electronic components are aligned and mounted at predetermined positions on the substrate, the solder is melted at 240 ° C. for about 5 minutes, and all the solder connection portions are simultaneously reflow-connected.
[0065]
The metal protrusions and substrate openings for heat dissipation are the same size as the mounted chip in the above embodiment, but heat dissipation can be further improved if they are larger than the chip size. Further, if the metal protrusion and the substrate opening are smaller than the chip size, the wiring area of the substrate increases, and the substrate size can be reduced. In addition, the horizontal cross-sectional shape of the heat dissipating part does not necessarily need to be square or rectangular, and if the shape is round or rounded, the surface tension plays an important role in alignment. It is possible to improve reliability by avoiding stress concentration.
[0066]
FIG. 8 shows the structure of another electronic device.
[0067]
A difference from the electronic device of FIG. 1 is that a minute groove or protrusion 100 is provided on the uppermost surface of the protrusion 29.
[0068]
In the structure of FIG. 1, the adhesive 31 composed of a resin adhesive or solder is interposed between the protrusion 29 and the interposer substrate 11, so that a minute interval is generated on the connection surface, but a minute protrusion is provided. Accordingly, by pressing the protrusions against the interposer substrate while securing the adhesive force with the grooves, these intervals can be reduced, so that the heat dissipation can be improved.
[0069]
FIG. 9 shows the structure of another electronic device.
[0070]
A difference from the electronic device of FIG. 4 is that minute grooves or protrusions 101 and 102 are provided on the upper and lower surfaces of the metal block 33.
[0071]
In the structure of FIG. 4, the adhesive 31 composed of a resin adhesive or solder is interposed between the metal block 33 and the mother board 15 and between the metal block 33 and the interposer substrate 11, so that a minute interval is formed. It occurs on the connecting surface. However, by providing minute protrusions on the upper and lower surfaces of the metal block 33, the distance between the protrusions can be reduced by pressing the protrusions against the interposer substrate while securing the adhesive force with the grooves, thereby improving heat dissipation. be able to.
[0072]
The uneven metal block formed by the protrusions and grooves has the same effect when applied to the metal blocks shown in FIGS. However, it is preferable that the upper surface of the metal block having the structure of FIG.
[0073]
【The invention's effect】
ADVANTAGE OF THE INVENTION According to this invention, the heat dissipation of an electronic device can be improved.
[Brief description of the drawings]
FIG. 1 is a cross-sectional view of an electronic device.
FIG. 2 is a perspective view of an ECU module.
FIG. 3 is a cross-sectional view showing a manufacturing process of the structure of FIG. 1;
FIG. 4 is a cross-sectional view of an electronic device.
FIG. 5 is a cross-sectional view of an electronic device.
FIG. 6 is a cross-sectional view of an electronic device.
FIG. 7 is a diagram showing a manufacturing process;
FIG. 8 is a cross-sectional view of an electronic device.
FIG. 9 is a cross-sectional view of an electronic device.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 ... Semiconductor device, 3 ... Bonding wire, 5 ... Resin adhesive, 7 ... Mold resin, 9 ... Electronic component, 11 ... Interposer substrate, 13 ... Circuit layer, 15 ... Motherboard, 17 ... Circuit layer, 19 ... Solder bump, DESCRIPTION OF SYMBOLS 21 ... Electronic component, 23 ... Solder, 25 ... Resin adhesive, 27 ... Aluminum housing | casing, 29 ... Protrusion, 31 ... Resin adhesive, 33 ... Metal block, 35 ... Resin adhesive, 37 ... Metal core board | substrate, 39 ... Core metal (Inner layer metal plate), 41 ... semiconductor package, 43 ... through hole, 45 ... solder ball for heat dissipation

Claims (18)

筐体と、筐体に接着されている電子基板とを備え、
該電子基板は、
電子部品が搭載されている第1の回路基板と、
該第1の回路基板と電気的に接続されているとともに、該筐体に固定されている第2の回路基板とを有する電子装置において、
該第1の回路基板が、該第2の回路基板と重畳しない空間で該筐体に固定されていることを特徴とする電子装置。
A housing and an electronic substrate bonded to the housing;
The electronic substrate is
A first circuit board on which electronic components are mounted;
In an electronic device having a second circuit board that is electrically connected to the first circuit board and fixed to the housing,
The electronic device, wherein the first circuit board is fixed to the housing in a space that does not overlap with the second circuit board.
請求項1において、
該第1の回路基板は、該第2の回路基板とは別に成形された部材を介して該筐体に固定されていることを特徴とする電子装置。
In claim 1,
The electronic device, wherein the first circuit board is fixed to the housing via a member formed separately from the second circuit board.
請求項1又は2において、
該第2の回路基板は貫通孔を備え、
該第1の回路基板と該筐体との間であって該貫通孔と重畳する空間に、該第2の回路基板とは別に成形された部材を備えることを特徴とする電子装置。
In claim 1 or 2,
The second circuit board has a through hole;
An electronic device comprising: a member formed separately from the second circuit board in a space between the first circuit board and the housing and overlapping the through hole.
請求項1から3のいずれかにおいて、
前記部材は、第2の回路基板よりも熱伝導率が大きいことを特徴とする電子装置。
In any one of Claim 1 to 3,
The electronic device is characterized in that the member has a thermal conductivity larger than that of the second circuit board.
請求項1から4のいずれかにおいて、
前記第1の基板と前記第2の基板とが重畳する空間にゲル状の絶縁物が充填されていることを特徴とする電子装置。
In any one of Claim 1-4,
An electronic device, wherein a space in which the first substrate and the second substrate overlap is filled with a gel-like insulator.
請求項2から5のいずれかにおいて、
前記部材と前記筐体とが、はんだ又は樹脂に該樹脂よりも熱伝導率の大きいフィラーが含有された樹脂接着剤により接着されている構造、
前記部材と前記第1の回路基板とが、はんだ又は樹脂に該樹脂よりも熱導伝率の大きなフィラーが含有された樹脂接着剤により接着されている構造、
又は、これら双方を備えた構造を有することを特徴とする電子装置。
In any of claims 2 to 5,
A structure in which the member and the housing are bonded to a solder or resin by a resin adhesive containing a filler having a higher thermal conductivity than the resin;
A structure in which the member and the first circuit board are bonded to a solder or resin by a resin adhesive containing a filler having a higher thermal conductivity than the resin;
Alternatively, an electronic device having a structure including both of them.
請求項2から6のいずれかにおいて、
前記部材と前記第1の回路基板の接着面の少なくとも一方、又は、前記部材と前記筐体の接着面のすくなくとも一方に、凹凸があることを特徴とする電子装置。
In any of claims 2 to 6,
An electronic device, wherein at least one of an adhesion surface of the member and the first circuit board, or at least one of an adhesion surface of the member and the housing is uneven.
請求項2から5のいずれかにおいて、
前記部材は、前記筐体の一部が成形された筐体の突起であることを特徴とする電子装置。
In any of claims 2 to 5,
The electronic device according to claim 1, wherein the member is a projection of a casing in which a part of the casing is molded.
請求項8において、
前記部材と前記第1の回路基板とが、はんだ又は樹脂に該樹脂よりも熱伝導率の大きなフィラーが含有された接着剤により接着されていることを特徴とする電子装置。
In claim 8,
The electronic device is characterized in that the member and the first circuit board are bonded to each other with an adhesive containing solder having a higher thermal conductivity than that of resin.
請求項8又は9において、
前記部材と前記第1の回路基板の接着面の少なくとも一方に、凹凸があることを特徴とする電子装置。
In claim 8 or 9,
An electronic device, wherein at least one of the bonding surface of the member and the first circuit board has irregularities.
請求項2において、
前記第1の回路基板は、金属板の両面に樹脂層及び回路層が形成されているメタルコア基板であり、
その裏面の一部で該金属板が露出しており、
その露出している部分と前記筐体が、前記部材を介して接続されていることを特徴とする電子装置。
In claim 2,
The first circuit board is a metal core board in which a resin layer and a circuit layer are formed on both surfaces of a metal plate,
The metal plate is exposed at a part of the back surface,
The exposed portion and the housing are connected via the member.
請求項11において、
前記金属板は、前記部材との接続面に凹凸を有することを特徴とする電子装置。
In claim 11,
The electronic device according to claim 1, wherein the metal plate has irregularities on a connection surface with the member.
請求項3において、
前記部材と前記貫通孔の側壁との間に間隔があることを特徴とする電子装置。
In claim 3,
An electronic device characterized in that there is a gap between the member and the side wall of the through hole.
請求項2において、
前記第2の回路基板の表面の回路と前記第1の回路基板の裏面の回路との接続に用いたはんだのヤング率よりも、前記部材と前記第1の回路基板との間又は前記部材と前記第1の回路基板との間の接着に用いた接着剤又ははんだのヤング率の方が小さいことを特徴とする電子装置。
In claim 2,
More than the Young's modulus of the solder used to connect the circuit on the front surface of the second circuit board and the circuit on the back surface of the first circuit board, between the member and the first circuit board, or the member An electronic device having a smaller Young's modulus of an adhesive or solder used for bonding to the first circuit board.
請求項11において、
前記第1の回路基板は、その表面に前記金属板が露出している領域を有し、
その領域の金属板上に前記半導体装置がダイボンディングされ、ワイヤボンディングで第1の回路基板回路層と半導体装置の端子が接合されていることを特徴とする電子装置。
In claim 11,
The first circuit board has a region where the metal plate is exposed on the surface thereof,
An electronic device, wherein the semiconductor device is die-bonded on a metal plate in the region, and a first circuit board circuit layer and a terminal of the semiconductor device are bonded by wire bonding.
請求項2において、
前記部材と前記第1の回路基板との間が、シリコーンにフィラーを含有させた接着剤で固定されていることを特徴とする電子装置。
In claim 2,
An electronic apparatus, wherein the member and the first circuit board are fixed with an adhesive containing silicone filler.
請求項2において、
前記第2の回路基板と前記第1の回路基板との間が、SnとAgを含む鉛フリーはんだで接続されていることを特徴とする電子装置。
In claim 2,
An electronic apparatus, wherein the second circuit board and the first circuit board are connected by lead-free solder containing Sn and Ag.
筐体と、筐体に接着されている電子基板とを備え、
該電子基板は、
電子部品が搭載されている第1の回路基板と、
該第1の回路基板と電気的に接続されているとともに、該筐体に固定されている第2の回路基板とを有する電子装置において、
該第1の回路基板が第2の回路基板を介さずに筐体に固定されていることを特徴とする電子装置。
A housing and an electronic substrate bonded to the housing;
The electronic substrate is
A first circuit board on which electronic components are mounted;
In an electronic device having a second circuit board that is electrically connected to the first circuit board and fixed to the housing,
An electronic device, wherein the first circuit board is fixed to a housing without passing through a second circuit board.
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