WO2004106945A1 - 電子部品試験装置 - Google Patents

電子部品試験装置

Info

Publication number
WO2004106945A1
WO2004106945A1 PCT/JP2004/007363 JP2004007363W WO2004106945A1 WO 2004106945 A1 WO2004106945 A1 WO 2004106945A1 JP 2004007363 W JP2004007363 W JP 2004007363W WO 2004106945 A1 WO2004106945 A1 WO 2004106945A1
Authority
WO
WIPO (PCT)
Prior art keywords
chip
moving device
held
output terminal
input
Prior art date
Application number
PCT/JP2004/007363
Other languages
English (en)
French (fr)
Other versions
WO2004106945A2 (ja
WO2004106945A3 (ja
Inventor
Akihiko Ito
Kazuyuki Yamashita
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from PCT/JP2003/006835 external-priority patent/WO2004106954A1/ja
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to US10/558,385 priority Critical patent/US7511522B2/en
Priority to JP2005506502A priority patent/JPWO2004106945A1/ja
Publication of WO2004106945A1 publication Critical patent/WO2004106945A1/ja
Publication of WO2004106945A2 publication Critical patent/WO2004106945A2/ja
Publication of WO2004106945A3 publication Critical patent/WO2004106945A3/ja

Links

Abstract

　ＩＣチップ（ＩＣ）の入出力端子（ＨＢ）をテストヘッドのコンタクト部に押し付けて試験を行う電子部品試験装置であって、ＩＣチップ（ＩＣ）の入出力端子（ＨＢ）が導出している前面を把持部（４１４）により把持して移動させるＩＣ移動装置４１０と、把持される前のＩＣチップ（ＩＣ）の前面を撮像する第１のカメラ（４１５）と、把持されたＩＣチップ（ＩＣ）の背面を撮像する第２のカメラ（４２０）と、第１のカメラ（４１５）及び第２のカメラ（４２０）により撮像された画像情報から、ＩＣ移動装置（４１０）に把持されたＩＣチップ（ＩＣ）の入出力端子（ＨＢ）の位置を算出し、当該算出結果に基づいて、ＩＣ移動装置（４１０）に把持されたＩＣチップ（ＩＣ）の入出力端子（ＨＢ）のコンタクト部に対する相対的位置を特定する画像処理装置と備え、ＩＣ移動装置４１０は、画像処理装置により特定されたＩＣチップ（ＩＣ）の入出力端子（ＨＢ）のコンタクト部に対する相対的位置に基づいて、ＩＣチップの位置を補正する。
PCT/JP2004/007363 2003-05-30 2004-05-28 電子部品試験装置 WO2004106945A2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US10/558,385 US7511522B2 (en) 2003-05-30 2004-05-28 Electronic device test apparatus
JP2005506502A JPWO2004106945A1 (ja) 2003-05-30 2004-05-28 電子部品試験装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPPCT/JP03/06835 2003-05-30
PCT/JP2003/006835 WO2004106954A1 (ja) 2003-05-30 2003-05-30 電子部品試験装置

Publications (3)

Publication Number Publication Date
WO2004106945A1 true WO2004106945A1 (ja) 2004-12-09
WO2004106945A2 WO2004106945A2 (ja) 2004-12-09
WO2004106945A3 WO2004106945A3 (ja) 2005-02-17

Family

ID=33485800

Family Applications (2)

Application Number Title Priority Date Filing Date
PCT/JP2003/006835 WO2004106954A1 (ja) 2003-05-30 2003-05-30 電子部品試験装置
PCT/JP2004/007363 WO2004106945A2 (ja) 2003-05-30 2004-05-28 電子部品試験装置

Family Applications Before (1)

Application Number Title Priority Date Filing Date
PCT/JP2003/006835 WO2004106954A1 (ja) 2003-05-30 2003-05-30 電子部品試験装置

Country Status (7)

Country Link
US (1) US7511522B2 (ja)
JP (1) JPWO2004106945A1 (ja)
KR (1) KR100815490B1 (ja)
CN (1) CN1788205A (ja)
AU (1) AU2003241977A1 (ja)
TW (1) TW200504376A (ja)
WO (2) WO2004106954A1 (ja)

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