WO2004027886A1 - 圧電体素子、液体吐出ヘッド及びこれらの製造方法 - Google Patents
圧電体素子、液体吐出ヘッド及びこれらの製造方法 Download PDFInfo
- Publication number
- WO2004027886A1 WO2004027886A1 PCT/JP2003/011844 JP0311844W WO2004027886A1 WO 2004027886 A1 WO2004027886 A1 WO 2004027886A1 JP 0311844 W JP0311844 W JP 0311844W WO 2004027886 A1 WO2004027886 A1 WO 2004027886A1
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- WO
- WIPO (PCT)
- Prior art keywords
- lower electrode
- piezoelectric
- film
- metal layer
- piezoelectric film
- Prior art date
Links
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- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/135—Nozzles
- B41J2/14—Structure thereof only for on-demand ink jet heads
- B41J2/14201—Structure of print heads with piezoelectric elements
- B41J2/14233—Structure of print heads with piezoelectric elements of film type, deformed by bending and disposed on a diaphragm
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/135—Nozzles
- B41J2/16—Production of nozzles
- B41J2/1607—Production of print heads with piezoelectric elements
- B41J2/161—Production of print heads with piezoelectric elements of film type, deformed by bending and disposed on a diaphragm
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/135—Nozzles
- B41J2/16—Production of nozzles
- B41J2/1621—Manufacturing processes
- B41J2/1623—Manufacturing processes bonding and adhesion
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/135—Nozzles
- B41J2/16—Production of nozzles
- B41J2/1621—Manufacturing processes
- B41J2/1626—Manufacturing processes etching
- B41J2/1628—Manufacturing processes etching dry etching
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/135—Nozzles
- B41J2/16—Production of nozzles
- B41J2/1621—Manufacturing processes
- B41J2/1631—Manufacturing processes photolithography
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/135—Nozzles
- B41J2/16—Production of nozzles
- B41J2/1621—Manufacturing processes
- B41J2/164—Manufacturing processes thin film formation
- B41J2/1642—Manufacturing processes thin film formation thin film formation by CVD [chemical vapor deposition]
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/135—Nozzles
- B41J2/16—Production of nozzles
- B41J2/1621—Manufacturing processes
- B41J2/164—Manufacturing processes thin film formation
- B41J2/1646—Manufacturing processes thin film formation thin film formation by sputtering
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/07—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
- H10N30/074—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by depositing piezoelectric or electrostrictive layers, e.g. aerosol or screen printing
- H10N30/077—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by depositing piezoelectric or electrostrictive layers, e.g. aerosol or screen printing by liquid phase deposition
- H10N30/078—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by depositing piezoelectric or electrostrictive layers, e.g. aerosol or screen printing by liquid phase deposition by sol-gel deposition
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/20—Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators
- H10N30/204—Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators using bending displacement, e.g. unimorph, bimorph or multimorph cantilever or membrane benders
- H10N30/2047—Membrane type
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/135—Nozzles
- B41J2/14—Structure thereof only for on-demand ink jet heads
- B41J2/14201—Structure of print heads with piezoelectric elements
- B41J2/14233—Structure of print heads with piezoelectric elements of film type, deformed by bending and disposed on a diaphragm
- B41J2002/14258—Multi layer thin film type piezoelectric element
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/135—Nozzles
- B41J2/14—Structure thereof only for on-demand ink jet heads
- B41J2002/14491—Electrical connection
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/80—Constructional details
- H10N30/85—Piezoelectric or electrostrictive active materials
- H10N30/853—Ceramic compositions
- H10N30/8548—Lead based oxides
- H10N30/8554—Lead zirconium titanate based
Definitions
- the present invention relates to a piezoelectric element having an electromechanical conversion function, a liquid discharge head using the piezoelectric element, and a method of manufacturing them.
- the present invention relates to a piezoelectric element capable of obtaining excellent voltage resistance and durability, a liquid discharge head using the same, and a method of manufacturing them.
- a liquid discharge head such as a ink jet recording head uses a piezoelectric element as a driving source for discharging droplets such as ink droplets.
- this piezoelectric element is configured to include a piezoelectric thin film and an upper electrode and a lower electrode disposed to sandwich the piezoelectric thin film.
- Japanese Patent Application Laid-Open No. 2000-01977 patterns the lower electrode in a predetermined shape. Then, it is disclosed to form a piezoelectric thin film.
- the crystallinity of the piezoelectric thin film in the vicinity of the lower electrode end may not be sufficient, and the reliability can not be said to be sufficient.
- the present invention is to provide a more reliable piezoelectric element and liquid discharge head that withstands high voltages by improving the crystallinity of the piezoelectric film near the lower electrode end. With the goal. Disclosure of the invention
- the piezoelectric element of the present invention comprises: a diaphragm; a lower electrode formed in a predetermined pattern on the diaphragm; a piezoelectric film formed on the lower electrode; An upper electrode formed on the body film. And a metal layer formed on the diaphragm in the vicinity of the piezoelectric film and electrically disconnected from the lower electrode. It has a broken metal layer.
- the metal layer is formed of the same material as the lower electrode.
- the distance between the lower electrode and the metal layer electrically disconnected from the lower electrode is preferably 200 or less.
- the piezoelectric film is formed to cover at least a part of the metal layer, and an electrode for wiring extending from the upper electrode is covered with the piezoelectric film among the metal layers. It is desirable that the piezoelectric layer be formed on the other portion and be insulated from the metal layer by the piezoelectric film.
- a second metal layer which is a metal layer formed on the diaphragm and which is electrically disconnected from the lower electrode and which is electrically connected to a wiring electrode extending from the upper electrode Furthermore, the configuration may be provided.
- the piezoelectric film is formed on the lower electrode formed in the predetermined pattern and on the diaphragm in which the lower electrode does not exist, and the piezoelectric film is formed on the lower electrode.
- the number of layers of the piezoelectric film is larger than that of the portion formed on the vibration plate.
- a liquid discharge head comprises: the piezoelectric element described above; a pressure chamber whose internal volume changes due to mechanical displacement of the piezoelectric element; and an outlet for communicating with the pressure chamber to discharge droplets. And have.
- a liquid discharge apparatus includes the above-described liquid discharge head, and a drive device for driving the liquid discharge head.
- the method of manufacturing a piezoelectric element according to the present invention comprises the steps of: forming a lower electrode and a metal layer near the lower electrode in a predetermined pattern on a diaphragm; and forming a piezoelectric film on the lower electrode And a step of forming an upper electrode on the piezoelectric film, wherein the metal layer is formed so as to be electrically disconnected from the lower electrode.
- Another method of manufacturing a piezoelectric element according to the present invention comprises: forming a conductive film on a diaphragm; forming a piezoelectric film on the conductive film; forming a first piezoelectric film; and forming the piezoelectric film Deposition first
- the conductive film is patterned by patterning the piezoelectric film and the conductive film, which are formed in a process, to form a lower electrode, and a metal layer electrically cut from the lower electrode and positioned in the vicinity of the lower electrode.
- the method for manufacturing a liquid discharge head according to the present invention comprises the steps of: forming a piezoelectric element by the above method; forming a pressure chamber whose internal volume changes due to mechanical displacement of the piezoelectric element; Forming a discharge port communicating with the pressure chamber and discharging a droplet.
- FIG. 1 is a perspective view for explaining the structure of a printer (liquid discharge device) in which a piezoelectric element according to an embodiment of the present invention is used.
- FIG. 2 is an exploded perspective view showing the structure of the main part of an ink jet recording head which is a liquid discharge head according to an embodiment of the present invention.
- FIG. 3 is a plan view showing details of the arrangement of piezoelectric elements in the ink jet recording head according to the first embodiment.
- FIG. 4 is a plan view (a) in which the encircling line iii part of FIG. 3 is enlarged, its i i i cross-sectional view (b) and ii i ii cross-sectional view (c).
- FIG. 5 is a plan view showing the details of the arrangement of the piezoelectric element in the ink jet recording head according to the second embodiment.
- FIG. 6 is a plan view (a) in which the encircling line ii i of FIG. 5 is enlarged, its i-i cross-sectional view (b) and ii-ii cross-sectional view (c).
- FIG. 7 is a schematic cross-sectional view showing a method of manufacturing the ink jet recording head.
- FIG. 8 is a schematic cross-sectional view showing a method of manufacturing the ink jet recording head.
- FIG. 9 is a schematic cross sectional view showing a modified example of the above manufacturing method, and shows a step corresponding to FIG.
- reference numeral 20 is a pressure chamber substrate
- 30 is a diaphragm
- 31 is an oxide film
- 32 is r 0 2 film
- 40 is a piezoelectric element
- 42 is a conductive layer
- 42 a is an inner metal layer
- 42 b is an outer metal layer
- 42 d is a lower electrode
- 43 is a piezoelectric thin film
- 4 is an upper electrode.
- FIG. 1 is a perspective view for explaining the structure of a printer which is a liquid discharge apparatus using a piezoelectric element according to an embodiment of the present invention.
- the main body 2 is provided with a tray 3, an outlet 4 and an operation button 9. Further, inside the main body 2, an ink jet recording head 1 which is a liquid discharge head, a sheet feeding mechanism 6, and a control circuit 8 are provided.
- the ink jet recording head 1 includes a plurality of piezoelectric elements formed on a substrate, and is configured to be able to eject ink, which is a liquid, from the nozzles in response to the ejection signal supplied from the control circuit 8. .
- the main body 2 is a housing of the printer, and the sheet feeding mechanism 6 is disposed at a position where the sheet 5 can be supplied from the tray 3, and the inkjet recording head 1 is disposed so as to print on the sheet 5.
- the tray 3 is configured to be able to supply the paper 5 before printing to the paper feeding mechanism 6, and the discharge port 4 is an outlet from which the paper 5 for which printing has been completed is discharged.
- the sheet feeding mechanism 6 is provided with a motor 600, rollers 600, and other mechanical structures (not shown).
- the motor 600 is rotatable in response to a drive signal supplied from the control circuit 8.
- the mechanical structure is configured to be able to transmit the rotational force of the motor 600 to the rollers 6 0 1 ⁇ 6 0 2.
- the rollers 601 and 602 are designed to rotate when the rotational force of the motor 600 is transmitted, and pull in the sheet 5 placed on the tray 3 by the rotation, and print by the head 1 It has become possible to supply it.
- the control circuit 8 includes a CPU, ROM, RAM, interface circuit, etc. (not shown), and supplies a drive signal to the paper feeding mechanism 6 in correspondence with the print information supplied from the computer via a connector (not shown). Or, the ejection signal ink jet type It can be supplied to the recording head 1. Further, the control circuit 8 can perform setting of an operation mode, reset processing and the like in response to an operation signal from the operation panel 9.
- the printer according to the present embodiment is an ink jet recording head having excellent voltage resistance and durability, which will be described later, and good printing performance, and thus is a printer with high performance.
- FIG. 2 is an exploded perspective view showing the structure of the main part of an ink jet recording head which is a liquid discharge head according to an embodiment of the present invention.
- the ink jet recording head comprises a nozzle plate 10, a pressure chamber substrate 20, and a diaphragm 30.
- the pressure chamber substrate 20 is provided with a pressure chamber (cavity) 21, a side wall 22, a reservoir 23 and a supply port 24.
- the pressure chamber 21 is formed as a space for storing ink and the like by discharging the substrate such as silicon.
- the side wall 22 is formed to partition the pressure chamber 21.
- the reservoir 23 is a common flow path for supplying the ink to the pressure chambers 21 via the supply port 24.
- the pressure chamber 21, the side wall 22, the reservoir 23, and the supply port 24 are shown in a simplified manner, but may have a large number of pressure chambers and the like as shown in FIG.
- the nozzle plate 10 is bonded to one surface of the pressure chamber substrate 20 so that the nozzle 11 is disposed at a position corresponding to each of the pressure chambers 21 provided in the pressure chamber substrate 20. ing.
- the diaphragm 30 is formed by laminating an oxide film 31 and a ZrO 2 film 32 as described later, and is bonded to the other surface of the pressure chamber substrate 20.
- the diaphragm 30 is provided with an ink tank connection port (not shown) so that the ink stored in the ink tank (not shown) can be supplied to the reservoirs 23 of the pressure chamber substrate 20.
- a unit consisting of a nozzle plate 10, a diaphragm 30 and a pressure chamber substrate 20 is housed in a housing 25 to form an ink jet recording head 1.
- FIG. 3 is a plan view showing the details of the arrangement of piezoelectric elements in the ink jet recording head of the first embodiment.
- a large number of piezoelectric elements 40 are alternately arranged in two rows.
- 3 6 0 dpi dot per inch
- 3 6 0 piezoelectric elements 40 are disposed in a first row in 1 inch
- 3 6 0 piezoelectric elements in a second row The 40's are placed at a position offset from the first row by 70's.
- the lower electrode 42 d of the piezoelectric element 40 is an electrode common to the respective columns.
- An inner metal layer 42a electrically cut off from the lower electrode 42d and an upper electrode 44 described later is formed in the vicinity of the inner side of the two rows of lower electrodes 42d.
- an outer metal layer 42b electrically cut off from the lower electrode 42d and the upper electrode 44 described later is formed in the vicinity of the outer side of the lower electrode 42d in two rows.
- the inner metal layer 42a and the outer metal layer 42b described here surround the piezoelectric element 40 together with the portion of the lower electrode 42d in which the piezoelectric element 40 is not formed. From the upper electrode of the piezoelectric element 40, the strip electrode 45 for wiring passes through the upper side of the inner metal layer 42a without contacting the inner metal layer 42a. It is spreading.
- FIG. 4 is an enlarged plan view (a) of the encircling line iii part of FIG. 3, its i i i cross-sectional view (b) and ii-ii cross-sectional view (c).
- each discharge portion of the inkjet head 1 is formed by sequentially laminating a ZrO 2 film 32, a lower electrode 42d, a piezoelectric thin film 43 and an upper electrode 44 on an oxide film 31. Is configured.
- the oxide film 31 is formed, for example, as an insulating film on a pressure chamber substrate 20 made of single crystal silicon having a thickness of 100 ⁇ ⁇ .
- a film made of silicon oxide (S i 0 2 ) is formed to a thickness of 1.0.
- the Z r 0 2 film 32 is a layer having elasticity, and forms a diaphragm 30 integrally with the oxide film 31.
- the film 1: 0 2 film 32 preferably has a thickness of 200 nm or more and 800 nm or less in order to have a function to impart inertia.
- an adhesion layer (not shown) made of titanium or chromium may be provided.
- the adhesion layer is formed to improve the adhesion to the installation surface of the piezoelectric element, and may not be formed if the adhesion can be secured.
- the thickness is preferably 10 nm or more.
- the lower electrode 42 d has a layer structure of a layer including at least I r, for example, a layer including I r from the bottom layer / a layer including P t / a layer including I r.
- the total thickness of the lower electrode 42 d is, eg, 200 nm.
- the layer structure of the lower electrode 42 d is not limited to this, and may be a layer including I r -containing layer ZP t or a two-layer structure including P t -containing layer I r. Also, it may be composed of only the layer containing I r.
- the piezoelectric thin film 43 is a ferroelectric substance composed of a crystal of piezoelectric ceramics, preferably a ferroelectric piezoelectric material such as lead zirconate titanate (PZT), or niobium oxide or oxide metal. It consists of those to which metal oxides such as nickel and magnesium oxide are added.
- the composition of the piezoelectric thin film 43 is appropriately selected in consideration of the characteristics of the piezoelectric element, the application, and the like. Specifically, lead titanate (P b T i 0 3 ), lead zirconate titanate
- the thickness of the piezoelectric thin film 43 needs to be suppressed to such an extent that no cracks occur in the manufacturing process, and on the other hand, must be thick enough to exhibit sufficient displacement characteristics, for example, 1000 nm or more and 1 500 nm or less.
- the upper electrode 44 is an electrode paired with the lower electrode 42 d, and is preferably made of P t or I r.
- the thickness of the upper electrode 44 is preferably about 50 nm.
- the lower electrode 42d is an electrode common to each piezoelectric element.
- the inner metal layer 42a and the outer metal layer 42b are located at the same height as the lower electrode 42d. But is separated from the lower electrode 42 d.
- the interval is desirably 200 ° // in or less, preferably 100 ⁇ or less, and more preferably 50 ⁇ or less.
- the lower limit of the distance may be such that it becomes electrically nonconductive, for example, 5 ⁇ um or more is desirable.
- the piezoelectric thin film 43 of the individual piezoelectric element 40 extends on the inner metal layer 42 a, and on it, a strip electrode 45 for wiring which can be conducted to the upper electrode 44. It is formed. Therefore, in the first embodiment, the strip electrode 45 is insulated from the inner metal layer 4 2 a by the piezoelectric thin film 43.
- the inner metal layer 4 2 a is preferably formed of the same material as the lower electrode 4 2 d. Even if they are not formed of the same material, it is desirable that the infrared absorptivity be similar to that of the lower electrode 42 d.
- the outer metal layer 42 b is also located at the same height as the lower electrode 42 d, but is separated from the lower electrode 42 d and the inner metal layer 42 a.
- the interval is desirably 2 0 0 / z m or less, preferably 1 0 0 ⁇ or less, and more preferably 5 0 m or less.
- the lower limit of the distance may be such as to be electrically nonconductive, for example, 5 m or more is desirable.
- the outer metal layer 42 b is also separated from the strip electrode 45 and the upper electrode 44.
- a piezoelectric thin film 43 is formed on a part of the outer metal layer 42b, the upper electrode 44 and the outer metal layer 42b are not in contact with each other.
- the outer metal layer 42 b is also preferably formed of the same material as the lower electrode 42 d. Even if the same material is not used, it is desirable that the infrared absorptivity be similar to that of the lower electrode 42 d.
- a reservoir 23 for supplying liquid to the pressure chamber 21 is provided at a position closer to the outer metal layer 42 b than the piezoelectric element 40.
- FIG. 5 is a plan view showing the details of the arrangement of piezoelectric elements in the ink jet recording head of the second embodiment. Parts having the same functions as in the first embodiment are assigned the same reference numerals.
- the inner metal layer 42c which is the second metal layer, is divided into segments corresponding to the respective piezoelectric elements 40. Since the strip electrodes 45 are formed right above each of the inner metal layers 42c, the inner metal layers 42c are not visible in the plan view of FIG.
- FIG. 6 is a plan view (a) in which the encircling line iii part of FIG. 5 is enlarged, its i i i cross-sectional view (b) and ii-ii cross-sectional view (c).
- the piezoelectric thin film 43 does not completely cover the inner metal layer 42c.
- a strip electrode 45 for wiring conducted to the upper electrode 44 can be conducted to the inner metal layer 42 c. Since the inner metal layer 42c does not conduct to the lower electrode 42d and does not conduct to the adjacent inner electrode layer 42c (segment), even if it conducts to the strip electrode 45, There is no problem in the air.
- FIG. 7 and FIG. 8 are cross-sectional schematic views showing a method of manufacturing the piezoelectric element and the inkjet recording head. 7 and 8 will be described along the configuration of the ink jet recording head according to the first embodiment described with reference to FIGS. 3 and 4 above, but in the same procedure, description will be made using FIGS. 5 and 6.
- the ink jet recording head of the second embodiment can also be manufactured. Oxide film formation process (S 1)
- This process is a high temperature treatment in oxidation atmosphere containing silicon substrate oxygen or water vapor as the pressure chamber substrate 2 0 is the step you form an oxide film 3 1 made of silicon oxide (S i 0 2) .
- CVD method can also be used.
- the sigma 0 2 film 3 2 is obtained by high-temperature processes that form a layer of O Ri Z r on sputtering or vacuum evaporation method, or the like in an oxygen atmosphere.
- a conductive film 42 to be a lower electrode containing I r is formed on the Z r 0 2 film 32. For example, first, a layer containing I r is formed, then a layer containing P t is formed, and a layer containing I r is further formed.
- Each layer constituting the conductive film 42 is formed by depositing Ir or Pt on the ZrO 2 film 32 by sputtering or the like.
- an adhesion layer (not shown) made of titanium or chromium may be formed by a sputtering method or a vacuum evaporation method.
- the conductive film 42 is first masked to a desired shape in order to separate it into the inner metal layer 42a and the outer metal layer 42b and the lower electrode 42d, and the periphery thereof is formed. Perform patting by etching. Specifically, first, a resist material having a uniform thickness is applied on the conductive film 42 by a spinner method, a spray method or the like (not shown), and then a mask is formed in the shape of a piezoelectric element. After exposure and development, a resist pattern is formed on the conductive film (not shown).
- This ion milling also commonly used to expose the the Z r 0 2 film 3 2 is removed by etching part of the conductive film by a dry etching method or the like, the inner metal layer 4 2 a, the outer metal layer 4 2 b, the lower electrode 4 Form 2 d. Furthermore, cleaning by reverse sputtering is carried out in order to remove contaminants, acid portions and the like attached to the lower electrode surface in the patterning step (shown in FIG. Four
- This step is a step of forming a Ti nucleus (layer) (not shown) on the lower electrode 42 d by sputtering or the like.
- the reason why the Ti nucleus (layer) is formed is that crystal growth occurs from the lower electrode side by growing PzT with the Ti crystal as a nucleus, and a dense, columnar crystal can be obtained.
- the average thickness of the Ti core (layer) is 3 to 7 nm, preferably 4 to 6 nm.
- This step is a step of forming a piezoelectric precursor film 4 3 ′ by a sol-gel method.
- a sol composed of an organic metal alkoxide solution is coated on the Ti core by a coating method such as spin coating. Then, it is dried at a constant temperature for a fixed time, and the solvent is evaporated. After drying, it is further degreased at a predetermined high temperature for a certain period of time in an air atmosphere, and the organic ligand coordinated to the metal is thermally decomposed to form a metal oxide.
- the coating, drying, and degreasing steps are repeated a predetermined number of times, for example, twice to laminate a piezoelectric precursor film consisting of two layers. By these drying and degreasing processes, the metal alkoxide and acetate in the solution undergo thermal decomposition of the ligand to form a metal, oxygen and metal network.
- this process is not limited to the sol-gel method, but may be MOD (Metal Organic Deposition) method.
- the piezoelectric precursor film 4 3 ′ After forming the piezoelectric precursor film 4 3 ′, it is fired to crystallize the piezoelectric thin film. By this firing, the piezoelectric thin film 4 3 ′ changes from an amorphous state to a rhombohedral crystal structure, and changes to a thin film exhibiting an electromechanical conversion action to become a piezoelectric thin film 4 3.
- the temperature rise at the time of firing becomes dull in the region where the lower electrode 42 d is not formed.
- the present embodiment as shown in FIG. 3 and FIG. 5, since the formation region of the piezoelectric film is surrounded by the lower electrode 42 d, the inner metal layer 42 a and the outer metal layer 42 b, Even in the region where the lower electrode 42 d is not formed, a sufficient temperature rise can be ensured. As a result, the firing conditions of the piezoelectric thin film become uniform.
- the crystallinity in the vicinity of the end of the lower electrode 42 d of the piezoelectric thin film is improved, and the voltage resistance and the durability are improved. Further, since the firing conditions in the entire wafer can be made uniform, the piezoelectric characteristics between the piezoelectric elements can be made uniform.
- the piezoelectric thin film 43 can be made to have a desired thickness by repeating the formation (S 5) of the precursor film as described above and the firing (S 6) thereof a plurality of times.
- the film thickness of the precursor film to be applied per baking is set to 20 ° nm and repeated six times.
- An upper electrode 4 4 is formed on the piezoelectric thin film 43 by electron beam evaporation or sputtering.
- the piezoelectric thin film 43 and the upper electrode 44 are patterned into a predetermined shape of the piezoelectric element. Specifically, after spin-coating a resist on the upper electrode 44, exposure / development and patterning are performed according to the position where the pressure chamber should be formed. Using the remaining resist as a mask, the upper electrode 44 and the piezoelectric thin film 43 are etched by ion milling or the like. Through the above steps, the piezoelectric element 40 is formed.
- a strip electrode 45 is formed to conduct to the upper electrode 44.
- the material of the strip electrode 45 is preferably gold, which has low rigidity and low electrical resistance. Besides, aluminum and copper are also suitable.
- the strip electrode 45 is formed to a film thickness of about 0.5 ⁇ ⁇ , and then conductive to each upper electrode and patterned so that the wiring can be drawn out.
- anisotropic etching using an active gas such as anisotropic 1 ′ ′ raw etching or parallel plate reactive etching is formed, and the portion left unetched becomes the side wall 22.
- the reservoir 2 3 is an outer metal layer 42 b. At the opposite position, it is formed in a shape slightly smaller than the outer metal layer 42 b, A through hole is formed by a laser or the like.
- the nozzle plate 10 is bonded to the pressure chamber substrate 20 after etching with an adhesive. Align so that each nozzle 1 1 is placed in the space of each pressure chamber 2 1 when bonding.
- the pressure chamber substrate 20 to which the nozzle plate 10 is bonded is attached to a housing (not shown), and the ink jet recording head 1 is completed.
- FIG. 9 is a schematic cross sectional view showing a modified example of the above manufacturing method, and shows a process corresponding to FIG.
- the steps S1 to S3 are the same as those in FIG. 7 and the steps after S 6 c are the same as those in FIG.
- the conductive film 42 is formed in S 3
- the first layer 43 a of the piezoelectric thin film is formed before the patterning (S 6 a)
- the first layer of the piezoelectric thin film 4 3 a and the conductive film 4 2 are put together and patterned (S 6 b).
- Step of forming the first layer of piezoelectric thin film (S 6 a)
- the first layer 4 of the piezoelectric thin film is formed on the conductive film 42.
- Form 3a For example, after forming the Ti core (layer) to a thickness of 3 to 7 nm, preferably 4 to 6 nm, the coating of the sol is carried out in the same manner as described for S5 and S6 in FIG. 7 above. The steps of drying and degreasing are repeated twice, and this is fired to form the first layer 43a of the piezoelectric thin film to a thickness of about 200 nm.
- the first layer 4 3 a of the piezoelectric thin film and the conductive film 4 2 are patterned into the same shape as S 4 in FIG.
- the conductive film 42 is separated into a lower electrode 42 d, an inner metal layer 42 a, and an outer metal layer 42 b.
- the portion of the piezoelectric thin film from which the first layer 4 3 a and the conductive film 4 2 have been removed exposes the Z r 0 2 film 32.
- the piezoelectric thin film 43 After forming a Ti nucleus (layer) to, for example, 1 nm or more and 4 nm or less on the first layer 43 a of the piezoelectric thin film and the exposed Z r 0 2 film 32, the piezoelectric thin film The second and subsequent layers are formed in the same manner as the first layer. And, until the predetermined thickness is applied, Repeat the steps of drying, degreasing and baking. As a result, on the lower electrode 42 d, the piezoelectric thin film 43 having a larger number of layers than the exposed Z r 0 2 film 32 is formed. For example, a 6 ′ layer is formed on the lower electrode 42 d, and a five-layered piezoelectric thin film 43 is formed on the exposed Z r O 2 film 32.
- the composition change (diffusion from oxide and piezoelectric film) of the conductive layer to be the lower electrode and the increase in film thickness may occur, especially at the time of firing of the first layer of the piezoelectric film. Such things are likely to happen. If the first layer of the piezoelectric film is fired after the patterning of the conductive layer, an imbalance in the film thickness of the conductive layer occurs near the boundary of the patterning, which may lower the crystallinity of the piezoelectric film or possibly cause a crack. However, according to the modification of FIG. 9, this can be prevented.
- the change in the composition and thickness of the conductive layer at the time of firing the first layer 43a of the piezoelectric thin film Occurs uniformly in the film surface direction. Therefore, stable crystallinity of the piezoelectric thin film is secured, and generation of cracks in the piezoelectric thin film can be prevented.
- the composition and thickness of the conductive layer change during firing of the first layer 43a of the piezoelectric thin film the composition of the lower electrode 42 d and the firing of the second and subsequent layers of the piezoelectric thin film will be described.
- the film thickness change is small. Therefore, good crystallinity similar to that of the first layer of the piezoelectric thin film can be obtained.
- the formation region of the piezoelectric thin film is surrounded by the lower electrode 42 d, the inner metal layer 42 a, and the outer metal layer 42 b, The firing conditions of the piezoelectric thin film become uniform. Therefore, as described in S 6 of FIG. 7, the crystallinity in the vicinity of the patterning boundary of the lower electrode 42 d of the piezoelectric thin film is further improved, and the voltage resistance and the durability are further improved.
- the ink jet recording head according to the first embodiment described with reference to FIGS. 3 and 4 is manufactured by the method of the modification described with reference to FIGS. 9 and 8 (however, the piezoelectric thin film has a thickness of 1).
- the distance between the 1 m PZT, the lower electrode 42 d and the inner metal layer 42 a and the outer metal layer 42 b is 50 m), and it is manufactured by the conventional method (however, the piezoelectric thin film is Film thickness 1.
- the distance between the 1 ⁇ m PZT, the lower electrode 42 d and the inner metal layer 42 a and the outer metal layer 42 b was 500 ⁇ m ⁇ ), and the withstand voltage resistance was examined.
- the durability was examined at a drive voltage of 35 V.
- the characteristics were bad at about 1 billion pulses, but in the above embodiment, it was able to withstand driving of 400 billion pulses or more.
- the ink jet recording head according to the above-described embodiment exhibits a dramatic improvement in performance.
- the piezoelectric element manufactured according to the present invention is not limited to the piezoelectric element of the above-mentioned ink jet recording head, but also a nonvolatile semiconductor memory device, a thin film capacitor, a pi port electrical detector, a sensor, surface acoustic wave optical waveguide Adaptation to the fabrication of tubes, optical storage devices, spatial light modulators, ferroelectric devices such as frequency doublers for diode lasers, dielectric devices, pi-port electrical devices, piezoelectric devices, and electro-optical devices it can.
- the liquid discharge head of the present invention discharges a liquid containing a color material used for manufacturing a color filter for a liquid crystal display or the like, in addition to a head for discharging an ink used in an ink jet recording apparatus.
- a head for discharging a liquid containing an electrode material used for forming an electrode such as a head, an organic EL display, an FED (surface emitting display), etc.
- a head for discharging a liquid containing a bioorganic substance used for manufacturing a biochip It is possible to apply to heads which jet various liquids.
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/497,456 US7226151B2 (en) | 2002-09-17 | 2003-09-17 | Piezoelectric element, liquid ejection head and process for manufacturing them |
EP20030797635 EP1453113A4 (en) | 2002-09-17 | 2003-09-17 | PIEZOELECTRIC ELEMENT, LIQUID EJECTION HEAD, AND METHOD FOR MANUFACTURING THE SAME |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002270664 | 2002-09-17 | ||
JP2002-270664 | 2002-09-17 | ||
JP2003-308459 | 2003-09-01 | ||
JP2003308459A JP4058691B2 (ja) | 2002-09-17 | 2003-09-01 | 液体吐出ヘッド及び液体吐出装置 |
Publications (1)
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WO2004027886A1 true WO2004027886A1 (ja) | 2004-04-01 |
Family
ID=32032865
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PCT/JP2003/011844 WO2004027886A1 (ja) | 2002-09-17 | 2003-09-17 | 圧電体素子、液体吐出ヘッド及びこれらの製造方法 |
Country Status (5)
Country | Link |
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US (1) | US7226151B2 (ja) |
EP (1) | EP1453113A4 (ja) |
JP (1) | JP4058691B2 (ja) |
CN (1) | CN100433393C (ja) |
WO (1) | WO2004027886A1 (ja) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
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KR100528350B1 (ko) * | 2004-02-27 | 2005-11-15 | 삼성전자주식회사 | 잉크젯 프린트헤드의 압전 액츄에이터 및 그 형성 방법 |
US7591542B2 (en) * | 2004-06-03 | 2009-09-22 | Brother Kogyo Kabushiki Kaisha | Piezoelectric actuator, method for producing the same and ink-jet head |
JP4640649B2 (ja) * | 2006-03-17 | 2011-03-02 | セイコーエプソン株式会社 | 液滴吐出ヘッド、画像形成装置、および成膜装置 |
JP2007281031A (ja) * | 2006-04-03 | 2007-10-25 | Seiko Epson Corp | アクチュエータ装置及び液体噴射ヘッド並びに液体噴射装置 |
JP4492821B2 (ja) * | 2007-03-13 | 2010-06-30 | セイコーエプソン株式会社 | 圧電素子 |
JP5052455B2 (ja) * | 2008-08-13 | 2012-10-17 | 富士フイルム株式会社 | 成膜装置、成膜方法、圧電膜、および、液体吐出装置 |
JP5526559B2 (ja) * | 2009-02-25 | 2014-06-18 | セイコーエプソン株式会社 | 液体噴射ヘッドの製造方法、圧電素子の製造方法、及び圧電素子 |
JP2011049413A (ja) * | 2009-08-28 | 2011-03-10 | Fujifilm Corp | 圧電デバイス |
US8118410B2 (en) * | 2009-08-31 | 2012-02-21 | Hewlett-Packard Development Company, L.P. | Piezoelectric printhead and related methods |
US20110228730A1 (en) * | 2009-10-30 | 2011-09-22 | Qualcomm Incorporated | Scheduling simultaneous transmissions in wireless network |
US8388116B2 (en) * | 2009-10-30 | 2013-03-05 | Hewlett-Packard Development Company, L.P. | Printhead unit |
WO2012036103A1 (en) * | 2010-09-15 | 2012-03-22 | Ricoh Company, Ltd. | Electromechanical transducing device and manufacturing method thereof, and liquid droplet discharging head and liquid droplet discharging apparatus |
CN103072378B (zh) * | 2011-10-25 | 2015-07-01 | 珠海赛纳打印科技股份有限公司 | 一种液体喷头及其制造方法 |
US8727508B2 (en) * | 2011-11-10 | 2014-05-20 | Xerox Corporation | Bonded silicon structure for high density print head |
DE102014117510A1 (de) | 2014-11-28 | 2016-06-02 | Osram Opto Semiconductors Gmbh | Optoelektronisches Bauelement |
CN109514998B (zh) * | 2017-09-19 | 2020-09-15 | 精工爱普生株式会社 | 液体喷出头、液体喷出装置以及压电器件 |
CN111703205B (zh) * | 2019-03-18 | 2022-06-14 | 大连瑞林数字印刷技术有限公司 | 一种压电喷墨打印喷头的驱动元件结构 |
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JPH1093045A (ja) * | 1996-09-13 | 1998-04-10 | Toshiba Corp | キャパシタ及びその製造方法 |
EP0963846A2 (en) * | 1998-06-08 | 1999-12-15 | Seiko Epson Corporation | Ink jet recording head and ink jet recording apparatus |
JP2000198197A (ja) | 1998-07-29 | 2000-07-18 | Seiko Epson Corp | インクジェット式記録ヘッド及びインクジェット式記録装置 |
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JP3543933B2 (ja) | 1999-01-26 | 2004-07-21 | セイコーエプソン株式会社 | インクジェット式記録ヘッド及びインクジェット式記録装置 |
JP3102481B1 (ja) | 1998-06-08 | 2000-10-23 | セイコーエプソン株式会社 | インクジェット式記録ヘッド及びインクジェット式記録装置 |
US6502928B1 (en) | 1998-07-29 | 2003-01-07 | Seiko Epson Corporation | Ink jet recording head and ink jet recording apparatus comprising the same |
US6705708B2 (en) * | 2001-02-09 | 2004-03-16 | Seiko Espon Corporation | Piezoelectric thin-film element, ink-jet head using the same, and method for manufacture thereof |
-
2003
- 2003-09-01 JP JP2003308459A patent/JP4058691B2/ja not_active Expired - Lifetime
- 2003-09-17 CN CNB038036843A patent/CN100433393C/zh not_active Expired - Lifetime
- 2003-09-17 WO PCT/JP2003/011844 patent/WO2004027886A1/ja active Application Filing
- 2003-09-17 EP EP20030797635 patent/EP1453113A4/en not_active Withdrawn
- 2003-09-17 US US10/497,456 patent/US7226151B2/en not_active Expired - Lifetime
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JPH1093045A (ja) * | 1996-09-13 | 1998-04-10 | Toshiba Corp | キャパシタ及びその製造方法 |
EP0963846A2 (en) * | 1998-06-08 | 1999-12-15 | Seiko Epson Corporation | Ink jet recording head and ink jet recording apparatus |
JP2000198197A (ja) | 1998-07-29 | 2000-07-18 | Seiko Epson Corp | インクジェット式記録ヘッド及びインクジェット式記録装置 |
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Also Published As
Publication number | Publication date |
---|---|
CN1630949A (zh) | 2005-06-22 |
EP1453113A4 (en) | 2009-06-03 |
JP2004134764A (ja) | 2004-04-30 |
US7226151B2 (en) | 2007-06-05 |
US20050052504A1 (en) | 2005-03-10 |
EP1453113A1 (en) | 2004-09-01 |
CN100433393C (zh) | 2008-11-12 |
JP4058691B2 (ja) | 2008-03-12 |
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