US5576730A - Active matrix substrate and a method for producing the same - Google Patents
Active matrix substrate and a method for producing the same Download PDFInfo
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- US5576730A US5576730A US08/043,384 US4338493A US5576730A US 5576730 A US5576730 A US 5576730A US 4338493 A US4338493 A US 4338493A US 5576730 A US5576730 A US 5576730A
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
- G09G3/3648—Control of matrices with row and column drivers using an active matrix
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
- G09G3/3685—Details of drivers for data electrodes
- G09G3/3688—Details of drivers for data electrodes suitable for active matrices only
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S345/00—Computer graphics processing and selective visual display systems
- Y10S345/904—Display with fail/safe testing feature
Definitions
- the present invention relates to an active matrix substrate having a driving circuit integrally formed therewith and used for a liquid crystal display device and the like, and a method for inspecting the same.
- a liquid crystal display device includes an active matrix substrate and a counter substrate opposed to the active matrix substrate with a liquid crystal layer interposed therebetween.
- a conventional active matrix substrate has a built-in driving circuit as is shown in FIG. 9.
- an active matrix substrate has a base panel 100, a plurality of gate bus lines 101 each acting as a scanning signal line, and a plurality of source bus lines 102 each acting as a data signal line.
- the gate bus lines 101 and the source bus lines 102 are provided on the base panel 100.
- the gate bus lines 101 and the source bus lines 102 intersect each other. Each intersection has a pixel capacitance 103 and a pixel transistor 104 as a switching device.
- Each pixel transistor 104 has a gate electrode connected to the corresponding gate bus line 101, a source electrode connected to the corresponding source bus line 102, and a drain electrode connected to the corresponding pixel capacitance 103.
- Each pixel capacitance 103 is provided for retaining a video signal supplied thereto through the pixel transistor 104 as a signal charge.
- the gate bus lines 101 are each connected to and also driven by a gate driving circuit 105.
- a gate driving circuit 105 is constituted by a shift register formed on the base panel 100, and is driven by an external power source and controlled by a start signal, a clock signal or the like externally supplied.
- Each source bus line 102 is connected to one of three external signal lines 108 through an analog switch 107 which is controlled to be on or off by a source driving circuit 106.
- one column of the pixel transistors 104 is connected to an identical source bus line 102.
- the source bus lines 102 are each connected to one column of the pixel capacitances 103 through the corresponding pixel transistors 104.
- each pixel capacitance 103 is connected to the corresponding pixel transistor 104 through one of two electrodes of the pixel capacitance 103.
- the source bus lines 102 are each connected to an additional capacitance 109 through one of two electrodes of the additional capacitance 109.
- the other electrode of the additional capacitance 109, which is not connected to the source bus line 102, and the other electrode of the pixel capacitance 103, which is not connected to the pixel transistor 104, are both connected to a wiring 110 and have an identical reference potential with each other.
- the source driving circuit 106 is constituted by a shift register formed on the base panel 100, and is driven by an external power source and controlled by a start signal, a clock signal or the like externally supplied.
- the three external signal lines 108 receive red, green and blue video signals, respectively, through an external terminal 120.
- a parasitic capacitance 111 is generated at each external signal line 108.
- the active matrix substrate having the above-described configuration is operated in the following manner.
- An ON signal is outputted from the gate driving circuit 105 to all the gate bus lines 101 sequentially, thereby turning on each row of the pixel transistors 104 connected to each gate bus line 101 which has received the ON signal. While the ON signal is being outputted to one gate bus line 101, an ON signal is outputted from the source driving circuit 106 to all the analog switches 107 sequentially, thereby turning on the analog switches 107. Then, the source bus line 102 connected to the analog switch 107 which has been turned on gets into connection with the corresponding external signal line 108. Thus, the pixel capacitance 103 connected to each pixel transistor 104 which has been turned on is applied with a signal charge through the source bus line 102.
- the signal charge applied to the pixel capacitance 103 is maintained while the gate driving circuit 105 is outputting an ON signal to the gate bus lines 101 which do not correspond to this pixel capacitance 103, since the pixel transistor 104 corresponding to this pixel capacitance 103 is kept off. In this manner, the gate driving circuit 105 outputs an ON signal to all the gate bus lines 101.
- a cycle of the above-described procedure is finished, namely, all the gate bus lines 101 have received an ON signal, the same procedure is repeated.
- An optical transmittance of a liquid crystal layer depends on an effective voltage applied to each pixel capacitance 103 during one cycle.
- An improvement in the display quality of the liquid crystal display device is achieved by applying a sufficient level of signal charge to each pixel capacitance 103 and also reducing the amount of leak current to a minimum value so as to maintain the charge applied to the pixel capacitance 103.
- the active matrix substrate gets into a drivable state as a part of a liquid crystal display device when combined with a counter substrate with a liquid crystal layer interposed therebetween. Once the active matrix substrate becomes drivable, an optical inspection for any defect can be performed. However, even if the active matrix substrate is judged to have a defect, the defect cannot be corrected unless the active matrix substrate is disassembled. Therefore, the process of assembling the active matrix substrates into a liquid crystal display device is wasted.
- a method for electrically inspecting an active matrix substrate concerning operation of each pixel before the assembly into a liquid crystal display device is effective for improving the yield and reducing the product cost, since such a method, for example, eliminates unnecessary disassembly and reassembly process which would be necessary after the inspection with a conventional inspection method and allows the defect to be corrected relatively easily.
- Such an electrical method is performed by use of an inspection apparatus shown in FIG. 10.
- FIG. 10 is an equivalent circuit diagram for applying a charge corresponding to an inspection signal to one pixel capacitance 103 and detecting the level of the signal from the pixel capacitance 103.
- the inspection apparatus is connected to the external terminal 120 of the active matrix substrate.
- the inspection apparatus includes a switch 116 through which an inspection signal is inputted to the active matrix substrate, a switch 112 connected to the external terminal 120, a buffer 113 connected to the external terminal 120 through the switch 112, an A/D converter 114 for receiving a signal from the buffer 113, and a computer 115 for receiving a signal from the A/D converter 114.
- the active matrix substrate is inspected in the following manner.
- the switch 116 is turned on to supply the external terminal 120 with a certain potential as an inspection signal, and in this state, the gate driving circuit 105 and the source driving circuit 106 (FIG. 9) are driven.
- the gate driving circuit 105 and the source driving circuit 106 (FIG. 9) are driven.
- a signal charge is sequentially applied to each of the pixel capacitances 103 corresponding to the pixel transistors 104 and the analog switches 107 which have been turned on. After the signal charge is kept for a certain period of time, the switch 112 is turned on to drive again the gate driving circuit 105 and the source driving circuit 106.
- the level of the signal corresponding to the signal charges which have been retained in the corresponding pixel capacitances 103 are sequentially detected through the external terminals 120, and amplified by the buffer 113 to be inputted to the computer 115 through the A/D converter 114. If an abnormality is generated with at least either one of the applying operation of the signal charge to the pixel capacitance 103 or the retaining operation of the signal charge in the pixel capacitance 103, the level of the signal corresponding to the signal charge is not detected. Thus, the active matrix substrate is judged to have a defect.
- the position where the defect exists can also be detected based on the timing and the distribution shape of the pulses of the detected signal.
- Such an inspecting method is proposed in, for example, Japanese Patent Publication No. 1-36118 and Japanese Laid-Open Patent Publication No. 64-9375.
- the pixel capacitance 103 is small compared with the additional capacitance 109 at the source bus line 102 and the parasitic capacitance 111 at the external signal line 108. Accordingly, the level of the signal charge to be detected is low, thus making it difficult to measure the level of the signal charge.
- the pixel capacitance 103 is 0.2 pF
- the additional capacitance 109 is 5 pF
- the parasitic capacitance 111 is 15 pF
- a change in the potential detected from the external terminal 120 is 50 mV per pixel, which is extremely small.
- the signal charge applied to the pixel capacitance 103 has a small absolute value and thus the signal detected from the external terminal 120 is easily influenced by noise, it is difficult to ensure a sufficient S/N ratio.
- the switches 112 and 116 which are externally provided have problems in that the input capacitance of the switches 112 and 116 is large compared with the pixel capacitance 103 and thus the level of the signal detected from the external terminal 120 is further lowered, and that a fluctuation in the potential of the external signal line 108 accompanied by the ON/OFF operation of the switches 112 and 116 is large.
- Another problem concerns rubbing treatment.
- An active matrix substrate which has been judged satisfactory or which has been subjected to correction is sent to a process of forming an image forming section of the liquid crystal display device.
- rubbing treatment is performed to align liquid crystal molecules as a display medium.
- an alignment film of polyimide or the like formed on the active matrix substrate is rubbed by a cloth, which generates a large amount of static electricity, Static electricity may be generated in other processes for producing a liquid crystal display device such as a coating process and a seal printing process. If such a process for producing a liquid crystal display device is performed after the above-described electrical inspection, the pixel transistors 104 are possibly broken by the large amount of static electricity, resulting in an increase in defects.
- An active matrix substrate includes a plurality of pixel electrodes arranged in a matrix; a plurality of data lines for supplying video signals to the pixel electrodes; a plurality of scanning lines for supplying scanning signals for selecting at least one of the pixel electrodes which is to be supplied with the video signals; and an external signal supplying circuit for externally supplying the video signals to the data lines.
- the external signal supplying circuit includes a data line connection section connected to the data lines; an inspection signal inputting section and an inspection signal outputting section both connected to the data line connection section; and a switching device for electrically connecting one of the inspection signal inputting section and the inspection signal outputting section to the data line connection section.
- the inspection signal inputting section includes an inspection signal inputting terminal, and a first switching element provided between the inspection signal inputting terminal and the data line connection section; and the inspection signal outputting section includes an inspection signal outputting terminal, a second switching element provided between the data line connection section and the inspection signal outputting terminal, and a signal amplifying circuit provided between the inspection signal outputting terminal and the second switching element.
- the active matrix substrate further includes a source driving circuit including a first terminal for controlling the supply of the video signal from the data lines; and a gate driving circuit including a second terminal for controlling the supply of the scanning signal from the scanning lines.
- a method for inspecting an active matrix substrate includes the steps of electrically connecting an inspection signal inputting section to a data line connection section through a switching device so as to supply an inspection signal to the data line connection section from the inspection signal inputting section; electrically connecting an inspection signal outputting section to the data line connection section through the switching device so as to detect a signal from the inspection signal outputting section; and analyzing the signal detected from the inspection signal outputting section so as to judge if the active matrix substrate has a defect.
- a preferred embodiment of the invention further includes the steps of forming a short ring for electrically connecting an inspection signal inputting terminal, an inspection signal outputting terminal, a first terminal, a second terminal, and the data line connection section, in a case when the active matrix substrate is judged to have no defect; and removing the short ring after an alignment treatment of a display medium.
- an inspection signal outputting section is provided with a signal amplifying circuit.
- a signal is sent in the state of being amplified to an external circuit which is easily influenced by noise.
- Such an operation realizes small influence of noise and signal measurement with a high S/N ratio.
- the input capacitance of a second switching element is smaller compared with the case where a switch is externally provided, the level of the detected signal is not influenced by the capacitance.
- a first switching element and the second switching element may have an n-type TFT (thin film transistor) and a p-type TFT in which a source electrode of the n-type TFT is connected to a source electrode of the p-type TFT, a drain electrode of the n-type TFT is connected to a drain electrode of the p-type TFT, and a gate electrode of the p-type TFT receives a signal obtained by inverting a signal inputted to a gate electrode of the n-type TFT.
- n-type TFT thin film transistor
- a short ring may be provided for shortcircuiting all scanning lines, all data lines, an inspection signal inputting terminal, an inspection signal outputting terminal, a first terminal provided with a source driving circuit, a second terminal provided with a gate driving circuit, a data line connection section, and all other terminals provided on a base panel.
- damage to the active matrix substrate caused by the static electricity in a process for forming an image forming section of a liquid crystal display device can be prevented, thereby improving the yield.
- the invention described herein makes possible the advantages of providing an active matrix substrate and a method for inspecting the same, according to which signal charges can be measured with a high S/N ratio with little influence of noise, a fluctuation in the potential of an external signal line accompanied by the ON/OFF operation of switches can be reduced to a minimum extent, and switching devices are not broken by a process for producing a liquid crystal display device such as rubbing treatment performed after an electrical inspection.
- FIG. 1 is a block diagram of an active matrix substrate according to an example of the present invention.
- FIG. 2 is an equivalent circuit diagram for applying a charge corresponding to an inspection signal to one pixel capacitance of the active matrix substrate shown in FIG. 1 and detecting the level of the signal from the pixel capacitance.
- FIG. 3 is a timing chart of a vertical scanning period for applying an inspection signal to a pixel capacitance of the active matrix substrate shown in FIG. 1.
- FIG. 4 is a timing chart of a horizontal scanning period for applying an inspection signal to a pixel capacitance of the active matrix substrate shown in FIG. 1.
- FIG. 5 is a timing chart of a vertical scanning period for detecting a signal in the active matrix substrate shown in FIG. 1.
- FIG. 6 is a timing chart of a horizontal scanning period for detecting a signal in the active matrix substrate shown in FIG. 1.
- FIG. 7 is a block diagram of the active matrix substrate shown in FIG. 1 in the state of being connected to a short ring A.
- FIG. 8 is a configuration diagram of a switch according to another example of the present invention.
- FIG. 9 is a block diagram of a conventional active matrix substrate.
- FIG. 10 is an equivalent circuit diagram for applying a charge corresponding to an inspection signal to one pixel capacitance shown in FIG. 9 and detecting the level of the signal from the pixel capacitance.
- FIG. 1 shows a configuration for an active matrix substrate according to an example of the present invention.
- the active matrix substrate shown in FIG. 1 includes a base panel 22, gate bus lines 1 provided on the base panel 22 in the number of n, each corresponding to a row, and source bus lines 2 provided on the base panel 22 in the number of m, each corresponding to a column.
- m is a multiple of 3.
- the gate bus lines 1 and the source bus lines 2 intersect each other. Each intersection has a pixel capacitance 3 and a pixel transistor 4. In this manner, a plurality of the pixel capacitances 3 and a plurality of the pixel transistors 4 are arranged in a matrix, respectively.
- Each pixel transistor 4 has a gate electrode connected to the corresponding gate bus line 1, a source electrode connected to the corresponding source bus line 2, and a drain electrode connected to the corresponding pixel capacitance 3.
- Each pixel capacitance 3 is provided for retaining a video signal supplied thereto through the pixel transistor 4 as a signal charge.
- the gate bus lines 1 are each connected to and also driven by a gate driving circuit 5.
- a gate driving circuit 5 is constituted by a shift register formed on the base panel 22, and is driven by an external power source and controlled by a start signal, a clock signal or the like externally supplied.
- Each source bus line 2 is connected to either one of three external signal lines 8 through an analog switch 7 which is controlled to be on or off by a source driving circuit 6.
- the left-most source bus line 2 is connected to the external signal line 8 for red
- the second source bus line 2 from the left is connected to the external signal line 8 for green
- the third source bus line 2 from the left is connected to the external signal line 8 for blue.
- the other source bus lines 2 are arranged in the same manner.
- one column of the pixel transistors 4 is connected to an identical source bus line 2.
- the source bus lines 2 are each connected to one column of the pixel capacitances 3 through the corresponding pixel transistors 4.
- each pixel capacitance 3 is connected to the corresponding pixel transistor 4 through one of two electrodes of the pixel capacitance 3.
- the source bus lines 2 are each connected to an additional capacitance 9 through one of two electrodes of the additional capacitance 9.
- the other electrode of the additional capacitance 9, which is not connected to the source bus line 2, and the other electrode of the pixel capacitance 3, which is not connected to the pixel transistor 4, are both connected to a wiring 10 and have an identical reference potential with each other.
- the three external signal lines 8 receive red, green and blue video signals, respectively, through an external terminal 17 provided at an end of each thereof. If each analog switch 7 is on at this point, the video signal received is sent to the corresponding source bus line 2.
- Each of the three external signal lines 8 also has another external terminal 20 at the other end thereof.
- Each external signal line 8 further has a switch 16 at a position between the external terminal 20 and one of connection points of the external signal lines 8 and the source bus lines 2, the one being closest to the external terminals 20.
- the switch 16 is formed on the base panel 22 and is controlled to be on or off by a control signal inputted from an external terminal 19.
- Each of the external signal lines 8 has a branch line which is branched at a branch point between the switch 16 and the connection point of the external signal line 8 and the source bus line 2 closest to the external terminal 20.
- Each branch line has an external terminal 21 at an end thereof.
- Each branch line further has a switch 12 between the branch point and the external terminal 21.
- Each branch line still further has a buffer circuit 13 between the switch 12 and the external terminal 21.
- the switch 12 and the buffer circuit 13 are formed on the base panel 22.
- the switch 12 is controlled to be on or off by a control signal inputted from an external terminal 18.
- a parasitic capacitance 11 is generated at each external signal line 8.
- the additional capacitance 9 retains a video signal on the source bus line 2.
- each external signal line 8 between the branch point and the external terminal 17 is referred to as a data line connection section.
- the switches 12 and 15 are each constituted by a MOSFET (metal-oxide-semiconductor field effect transistor) having a semiconductor layer formed of polysilicon or single crystalline silicon, but not limited to such a construction.
- MOSFET metal-oxide-semiconductor field effect transistor
- the source driving circuit 6 is constituted by a shift register formed on the base panel 22, and is driven by an external power source and controlled by a start signal, a clock signal or the like externally supplied.
- An active matrix substrate having the above-described configuration is electrically inspected concerning the operation of each pixel by use of a built-in system shown in FIG. 2.
- FIG. 2 is an equivalent circuit diagram for applying a charge corresponding to an inspection signal to one pixel capacitance and detecting the level of the signal from the pixel capacitance.
- each pixel capacitance 3 is connected to the source bus line 2 through the pixel transistor 4 controlled by the gate bus line 1.
- the source bus line 2 has the additional capacitance 9.
- the source bus line 2 is connected to the external signal line 8 through the analog switch 7 controlled by the source driving circuit 6.
- the external signal line 8 has the parasitic capacitance 11.
- the external signal line 8 has the external terminal 17 for inputting a video signal and further the switches 12 and 16.
- the switch 16 is controlled to be on or off by a control signal inputted through the external terminal 19.
- the switch 16 is on, the external terminal 20 connected to one of two sides of the switch 16 and the external signal line 8 connected to the other side of the switch 16 are conductive to each other.
- an inspection signal can be supplied to the external signal line 8 through the external terminal 20.
- the switch 12 is controlled to be on or off by a control signal inputted through the external terminal 18.
- the buffer circuit 13 connected to one of two sides of the switch 12 and the external signal line 8 connected to the other side of the switch 12 are conductive to each other.
- a signal can be detected at the external terminal 21 in the state of being amplified through the buffer circuit 13.
- the detected signal is A/D converted by an A/D converter 14 to be processed by a computer 15.
- the external terminal 17 is connected to no external apparatus.
- the explanation will be done using the external signal line 8 for red as an example, but the procedure is identical for the other external signal lines 8 for green and blue.
- the gate driving circuit 5 is driven to sequentially send gate signals Y 1 through Y n to the gate bus lines 1.
- the gate signals Y 1 through Y n are kept high only for one horizontal scanning period (1H).
- the operation for one horizontal scanning period will be described with reference to FIG. 4.
- the source driving circuit 6 is driven to sequentially send control signals X 1 through X m to the analog switches 7, thereby turning on the analog switches 7.
- FIG. 4 only every third signal is shown since the explanation concerns only the external signal line 8 for red.
- the analog switches 7 are on, the source bus lines 2 are applied with additional capacitances 9 (S 1 through S m-2 ) by an inspection signal.
- the pixel capacitances 3 expressed by P(1, i) through P(m-2, i) corresponding to the above row of the pixel transistors 4 are also applied with a signal charge.
- the pixel capacitance 3 F(l, k) is connected to the pixel transistor 4 which is connected to the kth gate bus line 1 and the lth source bus line 2.
- the source bus lines 2 are immediately applied with the additional capacitance 9 (S 1 through S m-2 ).
- the application of the signal charge to the pixel capacitances 3 (P(1, i) through P(m-2, i)) is continued even after the analog switches 7 are turned off since the time constant for such application is long.
- sufficient time is provided before the source driving circuit 6 sends the first control signal to the source bus line 2 during each horizontal scanning period and after the source driving circuit 6 sends the last control signal to the source bus line 2 during each horizontal scanning period.
- the switch 12 is turned on to output the signal to the buffer circuit 13.
- the switch 16 is off.
- the gate driving circuit 5 is driven to sequentially send gate signals Y 1 through Y n to the gate bus lines 1.
- the gate signals Y 1 through Y n are kept high only for one horizontal scanning period (1H).
- the pixel transistors 4 connected to each gate bus line 1 which has received the gate signal are turned on. In this state, the signal charges kept in the pixel capacitances 3 are sent to the source bus lines 2.
- the source driving circuit 6 is driven to sequentially send control signals X 1 through X m-2 to the analog switches 7, thereby turning on the analog switches 7.
- the signals sent to the source bus lines 2 from the pixel capacitances 3 are further sent to the external signal line 8 through the analog switches 7 and still further sent to the buffer circuit 13 through the switch 12.
- the signals are amplified by the buffer circuit 13 to be signals R r , which are A/D converted to digital signals by the A/D converter 14 and are inputted to the computer 15.
- the signals R r are obtained by sequentially detecting the level of the signals corresponding to the signal charges kept in the pixel capacitances 3.
- the computer 15 sequentially stores the signals R r in specified memories. Further, the computer 15 compares each signal R r with a specified pattern to judge if there is any defect in the gate driving circuit 5, the source driving circuit 6, the gate bus lines 1, the source bus lines 2, the pixel capacitances 3, the pixel transistors 4, the analog switches 7, and the external signal lines 8 for transmitting the signals, and the like. In a case where no abnormality is generated in the operation of the gate driving circuit 5, the source driving circuit 6, the pixel capacitances 3, the pixel transistors 4, and the analog switches 7, and further no disconnection and other malfunction is found in the gate bus lines 1, the source bus lines 2 and the external signal lines 8, the signal R r is detected to have ideal periodical pulses as is shown in FIG. 6.
- the active matrix substrate can be judged normal.
- the position and the type of the defect can be specified to some extent from the timing and the distribution shape of the pulses of the signal R r .
- the signal R r lacks one of the pulses at a position corresponding to the defective pixel transistor 4 or pixel capacitance 3, the pulses being sequentially generated. From such a phenomenon, the abnormality can be detected.
- the position where the signal R r lacks a pulse it can be determined which pixel transistor 4 or pixel capacitance 3 is defective.
- the signal R r lacks pulses corresponding to the pixel transistors 4 or pixel capacitances 3 belonging to a certain row, it can be judged that the gate bus line 1 of that row or the gate driving circuit 5 for selecting the gate bus line 1 is defective. In a case where the signal R r lacks pulses corresponding to the pixel transistors 4 or pixel capacitances 3 belonging to a certain column, it can be judged that the source bus line 2, the analog switch 7 both corresponding to that column or the source driving circuit 6 for selecting the source bus line 2 is defective.
- every third control signals X 1 through X m-2 for controlling the analog switches 7 to be on or off are outputted sequentially for the each external signal line 8. Accordingly, there is an interval between two consecutive signals for each external signal line 8.
- the switch 16 By turning on the switch 16 and supplying a reference potential to the external terminal 20 during every such interval, the signal remaining at the parasitic capacitance 11 of the external signal line 8 can be erased.
- the signal remaining at the additional capacitance 9 of the source bus line 2 can be erased.
- the buffer circuit 13 may be constituted by a circuit such as an operation amplifier or a source follower using a TFT. By constituting the buffer circuit 13 so as to have an input impedance which is smaller than the pixel capacitance 3 and a voltage gain which is 1 or more, preferably, which is larger than the ratio of the additional capacitance 9 with respect to the pixel capacitance 3, a highly precise inspection can be performed.
- the switches 12 and 16 for controlling the input and the output of an inspection signal to and from the external signal line and the buffer circuit 13 are formed on the base panel 22. Due to such a configuration, influence of noise can be reduced and thus signal measurement with a high S/N ratio is realized, thereby improving the inspection precision.
- a cycle of signal measurement requires only two vertical scanning periods, namely, one several tenths of a second in a case when, for example, a liquid crystal display device having 100,000 pixels is actually operated at an operating frequency.
- the pixel capacitance 3 is approximately 0.2 pF
- the additional capacitance 9 of the source bus line 2 is approximately 5 pF
- the parasitic capacitance 11 of the external signal line 8 is approximately 15 pF.
- Such an inconvenience is solved by repeating the above-described procedure of applying a charge corresponding to an inspection signal R to one pixel capacitance 3 and detecting the level of the signal R r from the pixel capacitance 3. For example, 10 to 100 times and then summing signals detected from an identical pixel capacitance 3. In this manner, the S/N ratio is further improved, thus to make it possible to detect a defect which is caused by a leak or the like having a time constant which is approximately the same or lower than that of the driving timing in the above-described procedure as well as a defect such as a complete disconnection or a shortcircuit.
- the gate bus lines 1, the source bus lines 2, the external terminals 17, 18, 19, 20 and 21, all terminals provided with the gate driving circuit 5 and with the source driving circuits 6, and all other terminals provided on the base panel 22 are not electrically shortcircuited to one another.
- the pixel transistors 4 are possibly broken by the effect of static electricity. Such a phenomenon results in a significant decline in the yield.
- a short ring A is provided as is shown in FIG.
- the short ring A for electrically shortcircuiting all the gate bus lines 1, all the source bus lines 2, the external terminals 17, 18, 19, 20 and 21, all the terminals provided with the gate driving circuit 5 and with the source driving circuit 6, and all other terminals provided on the base panel 22.
- a transparent conductive film formed of, for example, ITO (indium tin oxide) is used for the short ring A
- the short ring A and the pixel electrode of the pixel capacitances 3 can simultaneously be formed.
- the short ring A is formed and then a process for producing a liquid crystal display device such as rubbing treatment is performed, the short ring A is removed to complete the active matrix substrate.
- the inspection signal R for applying the pixel capacitances 3 with signal charges is an AC pulse signal which is inverted each horizontal scanning period, and each time one column of the pixel capacitances 3 are applied with the signal charges, the signals are retained in the pixel capacitances 3.
- the present invention is not limited to such a process.
- the timing at which an AC pulse signal is inverted is not limited to one horizontal scanning period.
- a constant inspection signal R is used to apply all the pixel capacitances 3 with signal charges and then the retaining operation is performed, thereafter the signal R r is detected.
- the active matrix substrate has a plurality of external signal lines 8 so as to remove a signal remaining at the parasitic capacitances 11 thereof within the interval between two consecutive signals.
- the present invention is not limited to such a configuration, but any other configuration may be applied as long as a signal remaining at the parasitic capacitance 11 can be removed.
- the external signal lines 8 can be provided in any other number as well as three.
- a switch for refreshing a potential may be provided between each source bus line 2 and the ground.
- Such a switch may be formed of a MOSFET as the switches 12 and 16.
- the gate bus lines 1 are linear and parallel to one another and the source bus lines 2 are also linear and parallel to one another.
- the present invention is not limited to such a configuration, but any other configuration may be applied as long as the gate bus lines 1 are driven by the gate driving circuit 5 and the source bus lines 2 are driven by the source driving circuit 6.
- the number of the source bus lines 2 are not necessarily a multiple of 3.
- the terminals 17, 18, 19, 20 and 21, all the terminals provided with the gate driving circuit 5 and with the source driving circuit 6 are connected to the short ring A.
- All the gate bus lines, all the scanning lines and all other terminals provided on the base panel 22 may be connected to the short ring A.
- the present invention is not limited to such a configuration, but any point of each lines on which the each above-mentioned terminals is provided may be connected to the short ring A in stead of the each above-mentioned terminals.
- FIG. 8 shows a configuration of each of the switches 12 and 16 according to another example of the present invention.
- the switches 12 and 16 may each have an n-type TFT Tr1 and a p-type TFT Tr2.
- a source electrode of the n-type TFT Tr1 is connected to a source electrode of the p-type TFT Tr2; and a drain electrode of the n-type TFT Tr1 is connected to a drain electrode of the p-type TFT Tr2.
- a gate electrode of the p-type TFT Tr2 receives a signal obtained by inverting a signal inputted to a gate electrode of the n-type TFT Tr1.
- the TFT Tr1 may be of p-type, in the case of which the TFT Tr2 is of n-type.
- the switch 12 or 16 having such a configuration When the switch 12 or 16 having such a configuration is turned off, the potential fluctuation caused by the parasitic capacitance between the source electrode and the drain electrode of the n-type TFT Tr1 and the potential fluctuation caused by the parasitic capacitance between the source electrode and the source electrode of the p-type TFT Tr2 cancel each other, and thus a fluctuation in the potential of the external signal line 8 is reduced to a minimum extent. Accordingly, the signal measurement can be performed with still higher precision.
- transistors each having a semiconductor layer formed of polysilicon or single crystalline silicon may be used as switching devices. In such a case, a switching device having satisfactory characteristics with a high mobility can be produced in an identical process with that of the pixel transistor 4 and the analog switch 7.
- the operation of the pixel transistors can be inspected with high reliability at a high speed as well as the operation of the driving circuits and the bus lines.
- a highly precise inspection can be possible.
- the position of the defect can be reliably detected.
- the position of the defect can be assumed to some extent based on the distribution of abnormalities of the detected signal R r .
- an inspection signal R is inputted to apply the pixel capacitance 3 with a signal charge, an efficient inspection can be performed for all the functions concerning the application operation of the signal charges with the pixel capacitances and the signal charge retaining operation by the pixel capacitances 3 and the pixel transistors 4.
- the switch and the buffer circuit provided to the external signal line Due to the switch and the buffer circuit provided to the external signal line, a signal can be amplified at a stage where the influence of noise is small. Accordingly, the S/N ratio at the inspection is improved so as to obtain a highly precise inspection. Further, since the input capacitance of the switch 12 for controlling the detection of the signal R r is smaller compared with the case where a switch is externally provided, the level of the detected signal is not influenced by the capacitance. In a case where the switches 12 and 16 each have an n-type TFT and a p-type TFT described above, the fluctuation in the potential of the external signal line 8 accompanied by the ON/OFF operation of the switches 12 and 16 is reduced to a minimum extent. Accordingly, the S/N ratio at the inspection is improved so as to obtain a highly precise inspection.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4-087283 | 1992-04-08 | ||
JP8728392A JP2758103B2 (ja) | 1992-04-08 | 1992-04-08 | アクティブマトリクス基板及びその製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
US5576730A true US5576730A (en) | 1996-11-19 |
Family
ID=13910467
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US08/043,384 Expired - Lifetime US5576730A (en) | 1992-04-08 | 1993-04-06 | Active matrix substrate and a method for producing the same |
Country Status (2)
Country | Link |
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US (1) | US5576730A (ja) |
JP (1) | JP2758103B2 (ja) |
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