US20070018675A1 - Semiconductor wafer examination method and semiconductor chip manufacturing method - Google Patents

Semiconductor wafer examination method and semiconductor chip manufacturing method Download PDF

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Publication number
US20070018675A1
US20070018675A1 US11/458,781 US45878106A US2007018675A1 US 20070018675 A1 US20070018675 A1 US 20070018675A1 US 45878106 A US45878106 A US 45878106A US 2007018675 A1 US2007018675 A1 US 2007018675A1
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US
United States
Prior art keywords
wafer
semiconductor
electrode
examination
chip
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
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US11/458,781
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English (en)
Inventor
Hideki Yuzawa
Kazuhiro Kijima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Assigned to SEIKO EPSON CORPORATION reassignment SEIKO EPSON CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KIJIMA, KAZUHIRO, YUZAWA, HIDEKI
Publication of US20070018675A1 publication Critical patent/US20070018675A1/en
Priority to US11/775,377 priority Critical patent/US20070259459A1/en
Priority to US11/775,449 priority patent/US20070259461A1/en
Priority to US11/775,309 priority patent/US20070254388A1/en
Priority to US11/775,278 priority patent/US7598730B2/en
Priority to US11/775,437 priority patent/US7573256B2/en
Abandoned legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2868—Complete testing stations; systems; procedures; software aspects
    • G01R31/287—Procedures; Software aspects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
    • G01R31/2875—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature related to heating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2881—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to environmental aspects other than temperature, e.g. humidity or vibrations

Definitions

  • the present invention relates to a semiconductor wafer examination method by wafer probing, and a semiconductor chip manufacturing method.
  • a semiconductor wafer formed with a plurality of semiconductor chips is subjected to an electric examination on a semiconductor chip basis so that screening is performed to find any defective piece.
  • Such an examination includes a probe examination by probing.
  • the wafer is generally diced so that chips are formed. This thus may cause a failure to some semiconductor devices of the semiconductor chips if heat and pressure act on the electrodes of the semiconductor chips in the subsequent process of semiconductor chip implementation, for example.
  • a failure detection is no sooner than semiconductor chip implementation, e.g., during the package check.
  • An advantage of some aspects of the invention is to provide a semiconductor wafer examination method with which screening is performed at an earlier stage with high accuracy to find any possible failure.
  • Another advantage of some aspects of the invention is to provide a semiconductor chip manufacturing method using the examination method of the invention.
  • the invention is directed to a semiconductor wafer examination method that includes: a step of preparing a wafer formed with a chip area for use as a semiconductor chip; a first probe examination in which the wafer is examined by probing; a step of pressing an electrode of the wafer with a pressure member having a flat surface; and a second probe examination in which the wafer is examined by probing.
  • any failure that is highly likely to occur to a semiconductor wafer e.g., at the time of semiconductor chip implementation, can be detected in advance so that screening can be performed with better reliability. This favorably leads to the reduction of failure occurrence so that the resulting semiconductor chip can be high in reliability.
  • the electrode in the step of pressing the electrode, the electrode can be heated.
  • an upper surface of the electrode in the step of pressing the electrode, an upper surface of the electrode can be made flat.
  • the pressure member can use a bonding tool.
  • a semiconductor device in the chip area, can be formed below the electrode.
  • the invention is also directed to a semiconductor chip manufacturing method that includes: a step of preparing a wafer formed with a chip area for use as a semiconductor chip; a first probe examination in which the wafer is examined by probing; a step of pressing an electrode of the wafer with a pressure member having a flat surface; a second probe examination in which the wafer is examined by probing; and a step of forming the semiconductor chip by dicing the wafer.
  • the resulting semiconductor chip manufactured by such an examination method can be less likely to cause a failure.
  • FIG. 1 is a diagram showing the procedure in an embodiment of the invention.
  • FIG. 2 is a diagram showing process operations in the embodiment of the invention.
  • FIG. 3 is another diagram showing the process operations in the embodiment of the invention.
  • FIG. 4 is a diagram showing the partial configuration of a semiconductor wafer in the embodiment of the invention.
  • FIG. 1 is a diagram for illustrating a semiconductor wafer examination method of the embodiment.
  • FIG. 2 is a cross sectional diagram schematically showing a process of the semiconductor wafer examination method.
  • FIG. 3 is a schematic plan view of a wafer being an examination object.
  • FIG. 4 is a schematic cross sectional view of a part of a chip area.
  • a wafer is prepared for examination use. As shown in FIGS. 2 and 3 , this wafer is configured by a semiconductor substrate 10 formed with a plurality of chip areas 12 , which serve as semiconductor chips after wafer dicing.
  • the chip areas 12 are provided with an integrated circuit that is not shown.
  • the integrated circuit is not specifically defined by configuration, and may include an active element such as transistor or a passive element such as resistor, coil, or capacitor.
  • the chip areas 12 are each provided with electrodes 14 for connection use.
  • the electrode 14 can be electrically connected to the inside of each corresponding chip area 12 .
  • the term electrode 14 may include any other electrodes not electrically connected to the chip areas 12 .
  • the electrode 14 may be configured to include a pad 16 , and a bump 18 formed on the pad 16 .
  • the bump 18 may be a gold bump, or a nickel bump with gold plating.
  • the wafer is examined in the procedure of FIG. 1 .
  • the wafer is first examined using a probe device by probing, i.e., a first probe examination (S 1 ).
  • the probe examination is not specifically defined in manner, and any known technique will be adopted.
  • the electrodes 14 formed to the chip areas 12 of the semiconductor wafer are brought in contact with a probe needle of a probe card for voltage application of a predetermined level from the probe needle.
  • the chip areas 12 are then examined electrically using a tester, e.g., continuity test.
  • the probe needle is brought in contact with the electrodes 14 on the basis of the chip area 12 or of a plurality of chip areas 12 so that the chip areas 12 can be examined sequentially as indicated by an arrow of FIG. 3 , for example.
  • the electrodes 14 of the wafer are then pressed with a pressure member (S 2 ).
  • a pressure member 20 having a flat surface 22 is moved downward with the flat surface 22 facing down, and the flat surface 22 is brought in contact with the upper surfaces of the electrodes 14 .
  • the pressure member 20 is then moved downward again to press the electrodes 14 for application thereto of a predetermined level of pressure. If a user wants to check the influence as a result of heating of the electrodes 14 , the electrodes are to be pressed while the pressure member 20 is being heated.
  • the electrodes 14 are pressed against the wiring section of the substrate while being heated using a bonding tool. If a user wants to check the resulting influence, the electrodes 14 may be pressed and heated in the process b with more strict requirements for implementation so that the influence can be checked with better reliability.
  • COG Process b Load on Electrodes 14 30 MPa 45 MPa Temperature of Electrodes 14 300 degrees or lower 300 to 350 degrees
  • the pressurization/heating operation in the process b can be applied on the basis of the chip area 12 or of a plurality of chip areas 12 .
  • the bump 18 of each of the electrodes 14 is made flat on the upper surface.
  • the pressure member 20 is not specifically restrictive as long as being adjustable at least for pressurization, preferably, being adjustable for both pressurization and heating.
  • the pressure member 20 may serve also as a bonding tool for use for a collective connection between the wiring section of the substrate and the electrodes of the semiconductor chips.
  • the wafer is then examined by probing, i.e., a second probe examination (S 3 ), similarly to the first probe examination.
  • This probe examination enables to detect any failure occurred as a result of the probe examination, i.e., in the pressurization operation in the process b, or the pressurization/heating operation therein.
  • the examination technique of this embodiment is applicable to a semiconductor wafer with semiconductor chips of a general type.
  • the examination technique is useful also to examine a semiconductor wafer including a semiconductor unit of the following type.
  • the semiconductor device is formed with semiconductor devices such as MIS (Metal Insulator Semiconductor) transistor 30 also below the electrode 14 .
  • the semiconductor substrate 10 is formed with a device isolation insulation layer 20 .
  • the device isolation insulation layer 20 can be formed by STI (Shallow Trench Isolation), LOCOS (Local Oxidation of Silicon), semi-recessed LOCOS, and others.
  • the device isolation insulation layer 20 of FIG. 4 is the one formed by STI.
  • the MIS transistor 30 is formed in an area 10 A directly below the electrode 14 .
  • an MIS transistor 40 is provided similarly to the area 10 A.
  • the MIS transistor 30 is configured to include a gate insulation layer 32 , a gate electrode 34 provided on the gate insulation layer 32 , and an impurity region 36 formed to the semiconductor substrate 10 .
  • the impurity region 36 serves as a source or drain region.
  • the MIS transistor 40 is configured similarly to the MIS transistor 30 , including a gate insulation layer 42 , a gate electrode 44 , and an impurity region 46 .
  • the gate electrodes 34 and 44 are each configured by a polysilicon layer, a polycide layer, or others.
  • the MIS transistors 30 and 40 may each include a sidewall insulation layer.
  • a reference numeral 14 denotes a wiring layer.
  • inter-layer insulation layers 50 and 60 are so formed in this order as to cover the MIS transistors 30 and 40 .
  • the inter-layer insulation layers 50 and 60 are each made of a known general material.
  • a wiring layer 52 of a predetermined pattern is formed, and an electrical connection is established by a contact layer 54 between the wiring layer 52 and the impurity region 36 of the MIS transistor 30 .
  • the inter-layer insulation layer 60 is formed thereon with the pad 16 .
  • the pad 16 establishes an electrical connection by the wiring layer 52 and a contact layer 64 .
  • the pad 16 is formed by a metal such as aluminum or copper.
  • the semiconductor unit may be also formed with a passivation layer 70 , which is formed with an aperture 72 from which at least a part of the pad 16 is exposed.
  • the aperture 72 may be so formed as to expose therefrom only the center portion of the pad 16 . That is, the passivation layer 70 may be so formed as to cover the peripheral portion of the pad 16 .
  • the passivation layer 70 may be formed by SiO 2 , SiN, polyimide resin, or others.
  • the aperture 72 is formed with the bump 18 , i.e., the bump 18 is formed on the exposure surface of the pad 16 .
  • the bump 18 is so formed as to reach over the passivation layer 70 .
  • the bump 18 is formed by a single or a plurality of layers, and is made of a metal such as gold, nickel, or copper.
  • the bump 18 is not specifically defined by outer shape, and may be formed rectangular (including square and rectangle), or formed circular. The outer dimension of the bump 18 may be smaller than that of the pad 16 . With this being the case, the bump 18 may be formed only in an area overlapping the pad 16 .
  • a barrier layer may be formed at the bottom of the bump 18 .
  • the barrier layer may serve to prevent material dissipation for both the pad 16 and the bump 18 .
  • the barrier layer may be formed by a single or a plurality of layers, and may be formed by sputtering.
  • the barrier layer may be also made to improve the adhesion between the pad 16 and the bump 18 .
  • the barrier layer may include a titanium tungsten (TiW) layer.
  • TiW titanium tungsten
  • the top surface of the barrier layer may be an electroplated metal layer, e.g., Au layer, for deposition of the bump 18 .
  • the MIS transistor 30 is formed below the electrode 14 , if the electrode 14 is pressurized and heated when being connected to any other component, not only the electrode 14 but also the components therebelow are affected thereby. As a result, this easily leads to failures of the devices compared with a case where the electrode 14 is formed therebelow with no device such as MIS transistor. With the examination method of this embodiment, however, the processes b and c enable to detect failures being highly likely to occur as a result of semiconductor chip implementation even prior to the implementation. This is surely applicable to a case where no MIS transistor is formed below the electrode 14 .
  • the wafer is diced by any known dicing technique so that semiconductor chips can be formed.
  • any failures that are highly likely to occur as a result of semiconductor chip implementation can be detected beforehand, e.g., in the form of semiconductor wafer, so that screening can be performed with better reliability with respect to the resulting semiconductor chips.
  • This favorably reduces the failure frequency of the semiconductor chips for use, and the resulting semiconductor chips can be increased in reliability.
  • Such characteristics are considered advantageous especially with a semiconductor wafer in which devices such as MIS transistors are formed below the electrodes.
  • the upper surfaces of the electrodes 14 are pressed, preferably, pressed and heated so that the upper surface of the bump 18 of each of the electrodes 14 can be made flat.
  • the bump 18 can be flat enough, and the electrodes 14 are highly reliable in terms of connection.
  • the invention includes any configuration substantially the same as the configurations described in the embodiment, e.g., configurations leading to the same functions, methods, and results, or configurations leading to the same objects and effects.
  • the invention also includes any configuration in which a component(s) are changed if not essential.
  • the invention also includes any configuration leading to the same effects or achieving the same objects as those described in the embodiment.
  • the invention also includes any configuration in which any known technique is taken into consideration for the configurations described in the embodiment.

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
US11/458,781 2005-07-25 2006-07-20 Semiconductor wafer examination method and semiconductor chip manufacturing method Abandoned US20070018675A1 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
US11/775,377 US20070259459A1 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,449 US20070259461A1 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,309 US20070254388A1 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,278 US7598730B2 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,437 US7573256B2 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005-214218 2005-07-25
JP2005214218A JP4178417B2 (ja) 2005-07-25 2005-07-25 半導体装置の製造方法

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US11/775,377 Division US20070259459A1 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,309 Division US20070254388A1 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,449 Division US20070259461A1 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,437 Division US7573256B2 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,278 Division US7598730B2 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method

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US11/458,781 Abandoned US20070018675A1 (en) 2005-07-25 2006-07-20 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,278 Expired - Fee Related US7598730B2 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,309 Abandoned US20070254388A1 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,377 Abandoned US20070259459A1 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,449 Abandoned US20070259461A1 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,437 Expired - Fee Related US7573256B2 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method

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US11/775,278 Expired - Fee Related US7598730B2 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,309 Abandoned US20070254388A1 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,377 Abandoned US20070259459A1 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,449 Abandoned US20070259461A1 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method
US11/775,437 Expired - Fee Related US7573256B2 (en) 2005-07-25 2007-07-10 Semiconductor wafer examination method and semiconductor chip manufacturing method

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008306105A (ja) * 2007-06-11 2008-12-18 Oki Electric Ind Co Ltd 半導体装置の製造方法
JP4888666B2 (ja) * 2008-07-08 2012-02-29 セイコーエプソン株式会社 半導体ウェハの検査方法および半導体チップの製造方法

Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5346861A (en) * 1990-09-24 1994-09-13 Tessera, Inc. Semiconductor chip assemblies and methods of making same
US5532610A (en) * 1993-08-25 1996-07-02 Nec Corporation Apparatus for testing semicondctor wafer
US5556810A (en) * 1990-06-01 1996-09-17 Kabushiki Kaisha Toshiba Method for manufacturing a semiconductor device wherein a semiconductor chip is connected to a lead frame by metal plating
US5836071A (en) * 1996-12-26 1998-11-17 Texas Instrument Incorporated Method to produce known good die using temporary wire bond, die attach and packaging
US5952840A (en) * 1996-12-31 1999-09-14 Micron Technology, Inc. Apparatus for testing semiconductor wafers
US6048750A (en) * 1997-11-24 2000-04-11 Micron Technology, Inc. Method for aligning and connecting semiconductor components to substrates
US6091475A (en) * 1996-12-19 2000-07-18 Shin-Etsu Polymer Co., Ltd. Connector for display inspection of a liquid crystal display panel and method for the preparation thereof
US6219908B1 (en) * 1991-06-04 2001-04-24 Micron Technology, Inc. Method and apparatus for manufacturing known good semiconductor die
US6233184B1 (en) * 1998-11-13 2001-05-15 International Business Machines Corporation Structures for wafer level test and burn-in
US6383825B1 (en) * 1996-09-30 2002-05-07 Micron Technology, Inc. Method and system for testing semiconductor dice, semiconductor packages and semiconductor wafers
US6605522B1 (en) * 1992-08-27 2003-08-12 Kabushiki Kaisha Toshiba Method of manufacturing a semiconductor device having a protruding bump electrode
US20030189439A1 (en) * 1999-09-27 2003-10-09 Ryuji Kohno Semiconductor inspection apparatus
US20040070413A1 (en) * 2002-10-02 2004-04-15 Susumu Kasukabe Probe sheet, probe card, semiconductor test equipment and semiconductor device fabrication method
US7160797B2 (en) * 2004-05-12 2007-01-09 Kulicke And Soffa Industries, Inc. Method of bumping die pads for wafer testing

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5787145A (en) 1980-11-20 1982-05-31 Seiko Epson Corp Semiconductor device
JPS5923530A (ja) * 1982-07-30 1984-02-07 Hitachi Ltd 半導体装置及びその製造方法
JPS6386541A (ja) 1986-09-30 1988-04-16 Toshiba Corp 半導体チツプの実装法
US6288561B1 (en) * 1988-05-16 2001-09-11 Elm Technology Corporation Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus
JPH05283490A (ja) 1992-04-02 1993-10-29 Fuji Electric Co Ltd 集積回路装置の試験方法
JP2002110751A (ja) * 2000-10-03 2002-04-12 Hitachi Ltd 半導体集積回路装置の検査装置および製造方法
TW508987B (en) * 2001-07-27 2002-11-01 Phoenix Prec Technology Corp Method of forming electroplated solder on organic printed circuit board
JP3759909B2 (ja) * 2002-02-22 2006-03-29 松下電器産業株式会社 半導体装置及びその製造方法
JP2003309050A (ja) 2002-04-17 2003-10-31 Hitachi Ltd 半導体装置の製造方法
US7279919B2 (en) * 2005-01-14 2007-10-09 Verigy (Singapore) Pte. Ltd. Systems and methods of allocating device testing resources to sites of a probe card

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5556810A (en) * 1990-06-01 1996-09-17 Kabushiki Kaisha Toshiba Method for manufacturing a semiconductor device wherein a semiconductor chip is connected to a lead frame by metal plating
US5346861A (en) * 1990-09-24 1994-09-13 Tessera, Inc. Semiconductor chip assemblies and methods of making same
US6219908B1 (en) * 1991-06-04 2001-04-24 Micron Technology, Inc. Method and apparatus for manufacturing known good semiconductor die
US6605522B1 (en) * 1992-08-27 2003-08-12 Kabushiki Kaisha Toshiba Method of manufacturing a semiconductor device having a protruding bump electrode
US5532610A (en) * 1993-08-25 1996-07-02 Nec Corporation Apparatus for testing semicondctor wafer
US6383825B1 (en) * 1996-09-30 2002-05-07 Micron Technology, Inc. Method and system for testing semiconductor dice, semiconductor packages and semiconductor wafers
US6091475A (en) * 1996-12-19 2000-07-18 Shin-Etsu Polymer Co., Ltd. Connector for display inspection of a liquid crystal display panel and method for the preparation thereof
US5836071A (en) * 1996-12-26 1998-11-17 Texas Instrument Incorporated Method to produce known good die using temporary wire bond, die attach and packaging
US5952840A (en) * 1996-12-31 1999-09-14 Micron Technology, Inc. Apparatus for testing semiconductor wafers
US6048750A (en) * 1997-11-24 2000-04-11 Micron Technology, Inc. Method for aligning and connecting semiconductor components to substrates
US6233184B1 (en) * 1998-11-13 2001-05-15 International Business Machines Corporation Structures for wafer level test and burn-in
US20030189439A1 (en) * 1999-09-27 2003-10-09 Ryuji Kohno Semiconductor inspection apparatus
US20040070413A1 (en) * 2002-10-02 2004-04-15 Susumu Kasukabe Probe sheet, probe card, semiconductor test equipment and semiconductor device fabrication method
US7160797B2 (en) * 2004-05-12 2007-01-09 Kulicke And Soffa Industries, Inc. Method of bumping die pads for wafer testing

Also Published As

Publication number Publication date
JP4178417B2 (ja) 2008-11-12
JP2007035772A (ja) 2007-02-08
US20070259460A1 (en) 2007-11-08
US7598730B2 (en) 2009-10-06
US20070259461A1 (en) 2007-11-08
US20070259459A1 (en) 2007-11-08
US20070259458A1 (en) 2007-11-08
US7573256B2 (en) 2009-08-11
US20070254388A1 (en) 2007-11-01

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