TWI753384B - 玻璃瓶的檢查方法及玻璃瓶的製造方法 - Google Patents

玻璃瓶的檢查方法及玻璃瓶的製造方法 Download PDF

Info

Publication number
TWI753384B
TWI753384B TW109109179A TW109109179A TWI753384B TW I753384 B TWI753384 B TW I753384B TW 109109179 A TW109109179 A TW 109109179A TW 109109179 A TW109109179 A TW 109109179A TW I753384 B TWI753384 B TW I753384B
Authority
TW
Taiwan
Prior art keywords
glass bottle
image
engraving
pattern
inspection
Prior art date
Application number
TW109109179A
Other languages
English (en)
Chinese (zh)
Other versions
TW202100988A (zh
Inventor
原田崇
鈴木岳
Original Assignee
日商東洋玻璃股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商東洋玻璃股份有限公司 filed Critical 日商東洋玻璃股份有限公司
Publication of TW202100988A publication Critical patent/TW202100988A/zh
Application granted granted Critical
Publication of TWI753384B publication Critical patent/TWI753384B/zh

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Textile Engineering (AREA)
  • Theoretical Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
TW109109179A 2019-06-21 2020-03-19 玻璃瓶的檢查方法及玻璃瓶的製造方法 TWI753384B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019-115236 2019-06-21
JP2019115236A JP7220128B2 (ja) 2019-06-21 2019-06-21 ガラスびんの検査方法及びガラスびんの製造方法

Publications (2)

Publication Number Publication Date
TW202100988A TW202100988A (zh) 2021-01-01
TWI753384B true TWI753384B (zh) 2022-01-21

Family

ID=73994983

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109109179A TWI753384B (zh) 2019-06-21 2020-03-19 玻璃瓶的檢查方法及玻璃瓶的製造方法

Country Status (6)

Country Link
JP (1) JP7220128B2 (ko)
KR (1) KR102540808B1 (ko)
CN (1) CN112492887A (ko)
PH (1) PH12020552062A1 (ko)
TW (1) TWI753384B (ko)
WO (1) WO2020255498A1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4325206A1 (en) 2022-08-18 2024-02-21 F. Hoffmann-La Roche AG Method for compensating defective partitions of a microfluidic chip

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5004909A (en) * 1988-05-30 1991-04-02 Kirin Beer Kabushiki Kaisha Method and apparatus for inspecting sidewalls of bottles using stripe pattern illumination
WO2003042673A1 (en) * 2001-11-16 2003-05-22 Heineken Technical Services B.V. Method and apparatus for generating a robust reference image of a container and for selecting of a container
CN105407346A (zh) * 2014-09-04 2016-03-16 宏达国际电子股份有限公司 影像分割方法
CN206974915U (zh) * 2017-06-22 2018-02-06 山东明佳科技有限公司 一种玻璃容器视觉在线检测设备
CN207181324U (zh) * 2017-06-27 2018-04-03 建湖国创机械制造有限公司 一种透明玻璃瓶全方位智能检测装置
TWM578796U (zh) * 2019-01-31 2019-06-01 統一企業股份有限公司 Container defect detecting device

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58216906A (ja) 1983-05-12 1983-12-16 Toyo Glass Kk びん方向自動検査方法
KR900007548B1 (ko) * 1985-10-04 1990-10-15 다이닛뽕스쿠링세이소오 가부시키가이샤 패턴 마스킹 방법 및 그 장치
JP3283356B2 (ja) * 1993-09-22 2002-05-20 マツダ株式会社 表面検査方法
JPH07160887A (ja) * 1993-12-13 1995-06-23 Hewtec:Kk パターンマッチング検査方法とその装置
JPH09161056A (ja) * 1995-12-08 1997-06-20 Fuji Electric Co Ltd 円形容器内面検査方法
JP2002140695A (ja) * 2000-11-01 2002-05-17 Omron Corp 検査方法およびその装置
JP3934359B2 (ja) * 2001-04-23 2007-06-20 日立エンジニアリング株式会社 透明容器内充填液体中の異物検査装置
JP4284646B2 (ja) * 2002-12-27 2009-06-24 キリンテクノシステム株式会社 異物検査装置及び異物検査用の照明装置
JP2004251662A (ja) * 2003-02-18 2004-09-09 Shibuya Kogyo Co Ltd 物品検査方法と物品検査装置
JP4508838B2 (ja) * 2004-11-11 2010-07-21 大日本印刷株式会社 容器の口部の検査装置
JP2008107311A (ja) * 2006-09-29 2008-05-08 Hitachi Chem Co Ltd 欠陥検査方法及び欠陥検査装置
JP2010048745A (ja) * 2008-08-25 2010-03-04 Asahi Glass Co Ltd 欠陥検査システムおよび欠陥検査方法
JP2010060312A (ja) * 2008-09-01 2010-03-18 Kirin Techno-System Co Ltd 異物検査装置及び異物検査システム
JP5726045B2 (ja) * 2011-11-07 2015-05-27 株式会社神戸製鋼所 タイヤ形状検査方法、及びタイヤ形状検査装置
JP2013134101A (ja) * 2011-12-26 2013-07-08 Kirin Techno-System Co Ltd 異物検査装置
JP6585992B2 (ja) * 2015-10-16 2019-10-02 株式会社キーエンス 画像検査装置
JP6851802B2 (ja) * 2016-12-12 2021-03-31 東洋ガラス株式会社 製びん機の金型制御システム
KR102205582B1 (ko) * 2017-02-28 2021-01-21 도요 가라스 가부시키가이샤 용기 검사장치 및 용기 검사방법
KR102300158B1 (ko) * 2017-04-26 2021-09-10 도요 가라스 가부시키가이샤 용기 검사장치 및 용기 검사방법

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5004909A (en) * 1988-05-30 1991-04-02 Kirin Beer Kabushiki Kaisha Method and apparatus for inspecting sidewalls of bottles using stripe pattern illumination
WO2003042673A1 (en) * 2001-11-16 2003-05-22 Heineken Technical Services B.V. Method and apparatus for generating a robust reference image of a container and for selecting of a container
CN105407346A (zh) * 2014-09-04 2016-03-16 宏达国际电子股份有限公司 影像分割方法
CN206974915U (zh) * 2017-06-22 2018-02-06 山东明佳科技有限公司 一种玻璃容器视觉在线检测设备
CN207181324U (zh) * 2017-06-27 2018-04-03 建湖国创机械制造有限公司 一种透明玻璃瓶全方位智能检测装置
TWM578796U (zh) * 2019-01-31 2019-06-01 統一企業股份有限公司 Container defect detecting device

Also Published As

Publication number Publication date
CN112492887A (zh) 2021-03-12
JP7220128B2 (ja) 2023-02-09
JP2021001793A (ja) 2021-01-07
PH12020552062A1 (en) 2021-05-31
WO2020255498A1 (ja) 2020-12-24
KR102540808B1 (ko) 2023-06-12
KR20210002528A (ko) 2021-01-08
TW202100988A (zh) 2021-01-01

Similar Documents

Publication Publication Date Title
US10890537B2 (en) Appearance inspection device, lighting device, and imaging lighting device
US20060000968A1 (en) Glass bottle inspection device
JP7382519B2 (ja) ガラスびんの検査方法及びガラスびんの製造方法並びにガラスびんの検査装置
WO2018061196A1 (ja) ガラス容器の焼傷検査装置
JP2015524059A (ja) 可視パターンを有する透明な又は半透明な容器を検査するための光学的方法
TWI753384B (zh) 玻璃瓶的檢查方法及玻璃瓶的製造方法
JPH0736004B2 (ja) 検査方法及び装置
JP5773741B2 (ja) 透明体ボトルの外観検査装置及び外観検査方法
JP4986255B1 (ja) 容器口部検査方法及び装置
JP3241666B2 (ja) ガラス容器の欠陥検査装置
KR102205582B1 (ko) 용기 검사장치 및 용기 검사방법
JP2003247953A (ja) 液晶パネル外観検査方法及び検査装置
JP2010204051A (ja) 検査装置および検査方法
JP6049652B2 (ja) びん底検査装置
KR101168399B1 (ko) 타이어 휠 검사방법
JP2008076223A (ja) 円筒状透明体の検査方法とそれに用いる検査装置
JP2023137057A (ja) 欠陥予測モデルの生成方法、びん外観検査方法、およびびん外観検査装置
JP6420180B2 (ja) 表面検査装置および表面検査方法
JP2004361085A (ja) 外観検査装置
JPH0695077B2 (ja) ガラス壜の底面検査装置
JP7040972B2 (ja) サポートリング付き容器のサポートリング検査装置及びサポートリング検査方法
JPH08304295A (ja) 表面欠陥検出方法および装置
JP2010008125A (ja) ガラス基板内の気泡選別処理法
JP6073261B2 (ja) びん底検査装置
JP2012122877A (ja) 液中異物検査方法