TWI753384B - Glass bottle inspection method and glass bottle manufacturing method - Google Patents

Glass bottle inspection method and glass bottle manufacturing method Download PDF

Info

Publication number
TWI753384B
TWI753384B TW109109179A TW109109179A TWI753384B TW I753384 B TWI753384 B TW I753384B TW 109109179 A TW109109179 A TW 109109179A TW 109109179 A TW109109179 A TW 109109179A TW I753384 B TWI753384 B TW I753384B
Authority
TW
Taiwan
Prior art keywords
glass bottle
image
engraving
pattern
inspection
Prior art date
Application number
TW109109179A
Other languages
Chinese (zh)
Other versions
TW202100988A (en
Inventor
原田崇
鈴木岳
Original Assignee
日商東洋玻璃股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商東洋玻璃股份有限公司 filed Critical 日商東洋玻璃股份有限公司
Publication of TW202100988A publication Critical patent/TW202100988A/en
Application granted granted Critical
Publication of TWI753384B publication Critical patent/TWI753384B/en

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00General purpose image data processing
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

Abstract

[課題]本發明,是提供一種玻璃瓶的檢查方法及玻璃瓶的製造方法,可從畫像自動地判別在表面具有雕刻的玻璃瓶中有無缺點。 [技術內容]玻璃瓶的檢查方法的一態樣,是對於在胴部的表面具有雕刻的玻璃瓶進行檢查的方法,包含:將旋轉的玻璃瓶攝像並將胴部的全周被攝像的畫像取得的畫像取得過程S12、及將畫像中包含源自雕刻的模樣的雕刻領域屏蔽的屏蔽過程S18、及對於畫像中除了被屏蔽的雕刻領域以外的領域判別有無缺點的判別過程S20。[Problem] The present invention provides a method for inspecting a glass bottle and a method for producing a glass bottle, which can automatically determine whether a glass bottle having an engraving on the surface has a defect from an image. [Technical content] An aspect of the glass bottle inspection method is a method of inspecting a glass bottle having an engraving on the surface of the body, including imaging the rotating glass bottle and capturing an image of the entire circumference of the body The acquired image acquisition process S12, the masking process S18 of masking the engraving area including the pattern derived from the engraving in the image, and the determination process S20 of judging the presence or absence of defects in the area other than the masked engraving area in the image.

Description

玻璃瓶的檢查方法及玻璃瓶的製造方法Glass bottle inspection method and glass bottle manufacturing method

本發明,是有關於在胴部的表面具有雕刻之玻璃瓶的檢查方法及該玻璃瓶的製造方法。The present invention relates to a method for inspecting a glass bottle having an engraving on the surface of the body, and a method for producing the glass bottle.

已知在表面施加了具有凹凸的雕刻的玻璃瓶。具有雕刻的玻璃瓶,是具有獨創性和高級感,對於消費者可產生較佳的印象。It is known to have engraved glass bottles with concavities and convexities applied to the surface. The glass bottle with engraving is original and high-end, and can create a better impression on consumers.

在這種的表面具有凹凸的玻璃瓶的檢查方法,例如專利文獻1已被提案。專利文獻1的發明,是光學地判別由凹凸所形成的雕刻面及無凹凸的平滑面。 [先前技術文獻] [專利文獻]For example, Patent Document 1 has proposed an inspection method of a glass bottle having irregularities on its surface. The invention of Patent Document 1 is to optically discriminate the engraved surface formed by unevenness and the smooth surface without unevenness. [Prior Art Literature] [Patent Literature]

[專利文獻1]日本特開昭58-216906號公報[Patent Document 1] Japanese Patent Laid-Open No. 58-216906

[發明所欲解決之問題][Problems to be Solved by Invention]

但是在專利文獻1的發明中,只可判別有凹凸的面及無凹凸的面,並無法檢查玻璃瓶的缺點。欲光學地檢查具有凹凸的雕刻的玻璃瓶的話,不易判別出:是由凹凸所產生的陰影,還是由刮傷和氣泡等的缺點所產生的陰影。即使現在,具有凹凸的玻璃瓶的刮傷和氣泡等的有無缺點,還是只能依賴目視檢查。However, in the invention of Patent Document 1, only the surface with unevenness and the surface without unevenness can be discriminated, and the defects of the glass bottle cannot be inspected. When an engraved glass bottle with unevenness is to be optically inspected, it is difficult to determine whether it is a shadow caused by the unevenness or a shadow caused by defects such as scratches and air bubbles. Even now, the presence or absence of flaws such as scratches and air bubbles in glass bottles having irregularities can only be relied on by visual inspection.

在此,本發明,是提供一種玻璃瓶的檢查方法及玻璃瓶的製造方法,可從畫像自動地判別在表面具有雕刻的玻璃瓶中有無缺點。 [用以解決問題之技術手段]Herein, the present invention provides a method for inspecting a glass bottle and a method for producing a glass bottle, which can automatically determine whether a glass bottle having an engraving on the surface has a defect from an image. [Technical means to solve the problem]

為了解決上述的課題的至少一部分,本發明可以由以下的態樣或是適用例實現。In order to solve at least a part of the above-mentioned problems, the present invention can be realized by the following aspects or application examples.

又,在以下的說明中,「雕刻」,是指由玻璃瓶的表面的凹凸所產生的外觀的造形設計,「模樣」,是指在將玻璃瓶攝像所獲得的畫像中出現的起因於「雕刻」的明暗濃度的變化。In addition, in the following description, "engraving" refers to the shape design of the appearance caused by the irregularities on the surface of the glass bottle, and "pattern" refers to the appearance caused by the "image" obtained by photographing the glass bottle. Sculpting" changes in light and dark density.

[1]本發明的玻璃瓶的檢查方法的一態樣,是對於在胴部的表面具有雕刻的玻璃瓶進行檢查的方法,包含:將旋轉的前述玻璃瓶攝像並將前述胴部的全周被攝像的畫像取得的畫像取得過程、及將前述畫像中包含源自前述雕刻的模樣的雕刻領域屏蔽的屏蔽過程、及對於前述畫像中除了被屏蔽的前述雕刻領域以外的領域判別有無缺點的判別過程。[1] An aspect of the glass bottle inspection method of the present invention is a method of inspecting a glass bottle having an engraving on the surface of a body portion, comprising: imaging the rotating glass bottle and measuring the entire circumference of the body portion. The image acquisition process of the captured image, the masking process of masking the engraving area in the image including the pattern originating from the engraving, and the determination of whether or not there is a defect in the area other than the masked engraving area in the image process.

依據上述玻璃瓶的檢查方法的一態樣的話,因為對於判別除了雕刻領域以外的領域是否有無缺點,所以可以從畫像自動地判別在表面具有雕刻的玻璃瓶中有無缺點。According to one aspect of the glass bottle inspection method described above, the presence or absence of defects in a glass bottle having an engraving on the surface can be automatically determined from an image to determine whether or not there is a defect in a field other than the engraving field.

[2]對於上述玻璃瓶的檢查方法的一態樣,前述缺點,是至少包含表面缺點,前述畫像取得過程,是由線感測器將透過了前述胴部的透過光攝像。[2] In one aspect of the glass bottle inspection method described above, the above-mentioned defects include at least surface defects, and the above-mentioned image acquisition process is to image the transmitted light that has passed through the above-mentioned body portion by a line sensor.

依據上述玻璃瓶的檢查方法的一態樣的話,藉由線感測器將透過光攝像,即使是如表面氣泡的陰影不易出現的缺點,也可以從畫像自動地判別。According to one aspect of the glass bottle inspection method described above, the transmitted light is captured by the line sensor, so that even a defect such as a shadow of a surface bubble that does not easily appear can be automatically determined from the image.

[3]對於上述玻璃瓶的檢查方法的一態樣,進一步包含模樣位置檢出過程,其是使用事先依據前述雕刻的外形所作成的圖型登錄畫像,圖型搜尋由前述畫像取得過程所取得的前述畫像,而檢出前述模樣,前述屏蔽過程,是可以屏蔽包含藉由前述模樣位置檢出過程所檢出的前述模樣的前述雕刻領域。[3] An aspect of the above-mentioned glass bottle inspection method further includes a pattern position detection process, which uses a pattern registration image previously created based on the shape of the engraving, and the pattern search is obtained by the image acquisition process. The above-mentioned image is detected, and the above-mentioned pattern is detected, and the above-mentioned masking process can mask the above-mentioned engraving area including the above-mentioned pattern detected by the above-mentioned pattern position detection process.

依據上述玻璃瓶的檢查方法的一態樣的話,因為可使用依據雕刻的外形所作成的圖型登錄畫像來檢出模樣,所以即使模樣的濃淡較薄,仍可以穩定地檢出模樣的位置。According to one aspect of the glass bottle inspection method described above, since the pattern can be detected using the pattern registration image created according to the shape of the engraving, the pattern position can be stably detected even if the pattern is thin in shade.

[4]對於上述玻璃瓶的檢查方法的一態樣,前述模樣位置檢出過程,是對於前述畫像中的規定高度範圍進行圖型搜尋。[4] In one aspect of the glass bottle inspection method, the pattern position detection process is to perform a pattern search for a predetermined height range in the image.

依據上述玻璃瓶的檢查方法的一態樣的話,畫像中的模樣的出現的高度因為是幾乎固定,所以藉由對於規定高度範圍進行圖型搜尋,就可以減少檢查裝置的負荷。According to one aspect of the glass bottle inspection method described above, since the height at which the pattern in the image appears is almost constant, the load on the inspection apparatus can be reduced by performing pattern search in a predetermined height range.

[5]本發明的玻璃瓶的製造方法的一態樣,是由粗模從塊料成形成型坯,由精整模型將前述型坯成形成前述玻璃瓶,對於前述玻璃瓶進行上述玻璃瓶的檢查方法的一態樣而獲得被判別為無前述缺點的玻璃瓶。[5] An aspect of the method for producing a glass bottle according to the present invention comprises forming a preform from a block with a rough die, forming the parison from a finishing mold to form the glass bottle, and performing the glass bottle process on the glass bottle. According to one aspect of the inspection method, a glass bottle judged to be free of the aforementioned drawbacks is obtained.

依據上述玻璃瓶的製造方法的一態樣的話,即使具有雕刻的玻璃瓶,因為可以自動地判別缺點,所以也可以製造無缺點的玻璃瓶。 [發明的效果]According to an aspect of the manufacturing method of the said glass bottle, even if it has an engraved glass bottle, since a flaw can be discriminated automatically, a flawless glass bottle can be manufactured. [Effect of invention]

依據本發明的玻璃瓶的檢查方法的一態樣的話,可以從畫像自動地判別在表面具有雕刻的玻璃瓶中有無缺點。依據本發明的玻璃瓶的製造方法的一態樣的話,即使具有雕刻的玻璃瓶,也可以製造無缺點的玻璃瓶。According to one aspect of the glass bottle inspection method of the present invention, the presence or absence of defects in a glass bottle having an engraving on the surface can be automatically determined from an image. According to an aspect of the manufacturing method of the glass bottle of this invention, even if it has an engraved glass bottle, a flawless glass bottle can be manufactured.

以下,使用圖面詳細說明本發明的最佳的實施方式。又,以下說明的實施方式,不是用於限定本發明的申請專利範圍所記載的內容。且,以下說明的結構的全部,不一定皆是本發明的必須構成要件。Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the drawings. In addition, the embodiments described below are not intended to limit the contents described in the scope of the claims of the present invention. In addition, all of the structures described below are not necessarily essential components of the present invention.

本實施方式的玻璃瓶的檢查方法,是對於在胴部的表面具有雕刻的玻璃瓶進行檢查的方法,包含:將旋轉的前述玻璃瓶攝像並將前述胴部的全周被攝像的畫像取得的取得過程、及將前述畫像中包含源自前述雕刻的模樣的雕刻領域屏蔽的屏蔽過程、及對於前述畫像中除了被屏蔽的前述雕刻領域以外的領域判別有無缺點的判別過程。The glass bottle inspection method according to the present embodiment is a method of inspecting a glass bottle having an engraving on the surface of the body part, comprising: taking an image of the rotating glass bottle and acquiring an image of the entire circumference of the body part. The acquisition process, the masking process of masking the engraving area including the pattern derived from the engraving in the image, and the determination process of determining whether or not there is a defect in the area other than the masked engraving area in the image.

本實施方式的玻璃瓶的製造方法,是由粗模從塊料成形成型坯,將前述型坯由精整模型而成形成玻璃瓶,對於前述玻璃瓶進行上述玻璃瓶的檢查方法的一態樣而獲得被判別為無前述缺點的玻璃瓶。The method for producing a glass bottle of the present embodiment is an aspect in which a preform is formed from a block with a rough die, the preform is formed into a glass bottle by a finishing mold, and the glass bottle inspection method described above is performed on the glass bottle. Instead, a glass bottle judged to be free of the aforementioned drawbacks was obtained.

1.檢查裝置 使用第1圖及第2圖,詳細說明玻璃瓶10的檢查裝置1。第1圖是示意使用本實施方式的檢查方法的檢查裝置1的側面圖,第2圖是示意該檢查裝置1的俯視圖。1. Check the device The inspection apparatus 1 of the glass bottle 10 is demonstrated in detail using FIG. 1 and FIG. 2. FIG. FIG. 1 is a side view illustrating an inspection apparatus 1 using the inspection method of the present embodiment, and FIG. 2 is a plan view illustrating the inspection apparatus 1 .

第1圖及第2圖所示的檢查裝置1,是在表面具有雕刻15的玻璃瓶10的檢查裝置1。檢查裝置1,是被組入無圖示的玻璃瓶10的生產線,並成為該生產線的一部分,成形後,將被漸冷的玻璃瓶10朝檢查裝置1搬運,將檢查後的玻璃瓶10朝下一個過程搬運。The inspection apparatus 1 shown in FIG. 1 and FIG. 2 is the inspection apparatus 1 of the glass bottle 10 which has the engraving 15 on the surface. The inspection device 1 is incorporated into a production line of glass bottles 10 (not shown in the figure), and forms part of the production line. After forming, the glass bottles 10 that have been gradually cooled are conveyed to the inspection device 1, and the inspected glass bottles 10 are conveyed to the inspection device 1. Next process handling.

檢查裝置1,是包含:具有將光照射玻璃瓶10的發光面22的發光部20、及隔著玻璃瓶10與發光部20相面對配置的攝像部40、及包含依據由攝像部40所攝像的玻璃瓶10的畫像80(第4圖)判別有無缺點的判別部52的控制部50。The inspection apparatus 1 includes: a light emitting part 20 having a light emitting surface 22 for irradiating light on the glass bottle 10; an imaging part 40 arranged to face the light emitting part 20 across the glass bottle 10; The image 80 (FIG. 4) of the imaged glass bottle 10 is the control part 50 of the judgment part 52 which judges the presence or absence of a defect.

在此,如第1圖所示,玻璃瓶10是在正立狀態下,即在中心軸12是沿著垂直方向的狀態下受到檢查。垂直方向是重力的方向,水平方向是與垂直方向垂直交叉的方向。Here, as shown in FIG. 1 , the glass bottle 10 is inspected in an upright state, that is, in a state in which the central axis 12 is along the vertical direction. The vertical direction is the direction of gravity, and the horizontal direction is the direction perpendicular to the vertical direction.

檢查裝置1,是包含:將玻璃瓶10一邊繞中心軸12的周圍旋轉一邊支撐的載置台30、及一邊與玻璃瓶10的側面接觸一邊將玻璃瓶10旋轉的側滾子32。如第1圖所示,側滾子32雖是位於玻璃瓶10及攝像部40之間,但只是方便說明側滾子32用,側滾子32是被配置於不會妨礙攝像部40將玻璃瓶10攝像的位置。The inspection apparatus 1 includes a stage 30 that supports the glass bottle 10 while rotating around the center axis 12 , and a side roller 32 that rotates the glass bottle 10 while contacting the side surface of the glass bottle 10 . As shown in FIG. 1, although the side roller 32 is located between the glass bottle 10 and the imaging unit 40, it is only for the convenience of describing the side roller 32, and the side roller 32 is arranged so as not to hinder the imaging unit 40 from moving the glass The position where the bottle 10 is photographed.

玻璃瓶10,是透明或是半透明。半透明,是指可藉由來自透過了玻璃瓶10的發光部20的光而判別玻璃瓶10的胴部13的缺點例如表面氣泡18的程度的透明度。玻璃瓶10,是例如具有橫斷面圓形的頸部11及胴部13、及底部14的廣口瓶。玻璃瓶10的橫斷面形狀,是多角形也可以。玻璃瓶10,是在表面具有雕刻15。雕刻15,是形成於玻璃瓶10的表面的凹凸,例如,藉由被刻在成形用模具的表面的凹凸而成形。The glass bottle 10 is transparent or translucent. Translucency refers to a degree of transparency that can be used to identify defects of the body 13 of the glass bottle 10 , such as surface air bubbles 18 , by light from the light-emitting portion 20 that has passed through the glass bottle 10 . The glass bottle 10 is, for example, a wide-mouthed bottle having a neck 11, a body 13, and a bottom 14 having a circular cross-section. The cross-sectional shape of the glass bottle 10 may be polygonal. The glass bottle 10 has an engraving 15 on the surface. The engraving 15 is the asperity formed on the surface of the glass bottle 10, and is formed by, for example, the asperity engraved on the surface of the molding die.

側滾子32,是與胴部13接觸,將玻璃瓶10繞中心軸12的周圍旋轉。中心軸12,是成為玻璃瓶10旋轉的旋轉中心軸的虛線。側滾子32,是藉由旋轉控制部62的指令將馬達60的驅動力透過皮帶35等朝玻璃瓶10傳達,將玻璃瓶10旋轉。側滾子32,是將玻璃瓶10由規定速度旋轉規定量。規定量的旋轉,是指使玻璃瓶10的全周可被攝像的充分的量。規定量的旋轉,是設定成例如1.5圈以上,使可以由1個畫像資料把握檢出體的整體。旋轉檢出部54,是可以直接或是間接安裝於馬達60的旋轉式編碼器。依據旋轉檢出部54的脈衝輸出,由攝像部40將玻璃瓶10的規定次數分的畫像攝像。The side rollers 32 are in contact with the body portion 13 and rotate the glass bottle 10 around the center axis 12 . The central axis 12 is a dotted line that becomes the rotational central axis of the glass bottle 10 to rotate. The side roller 32 rotates the glass bottle 10 by transmitting the driving force of the motor 60 to the glass bottle 10 through the belt 35 or the like by the instruction of the rotation control unit 62 . The side roller 32 rotates the glass bottle 10 by a predetermined amount at a predetermined speed. The predetermined amount of rotation refers to a sufficient amount to allow the entire circumference of the glass bottle 10 to be imaged. The predetermined amount of rotation is set to, for example, 1.5 or more turns, so that the entire detected object can be grasped from one image data. The rotation detection unit 54 is a rotary encoder that can be directly or indirectly attached to the motor 60 . Based on the pulse output of the rotation detection unit 54 , the imaging unit 40 captures images of the glass bottle 10 for a predetermined number of times.

發光部20,是照射玻璃瓶10的光源。發光部20,是在玻璃瓶10側具有發光面22,可以從攝像部40的相反側照射玻璃瓶10的面光源。發光部20的高度,是設定於可以照射預定由檢查裝置1檢查的最大的玻璃瓶10的整體。如第2圖所示,發光面22的全寬度W2,是比玻璃瓶10的全寬度W1更狹窄。藉由將全寬度W2比全寬度W1更窄,就可將表面氣泡18的陰影明確地攝像。全寬度W1、W2,是從俯視看檢查裝置1的情況時的玻璃瓶10及發光面22的全寬度。The light-emitting unit 20 is a light source that illuminates the glass bottle 10 . The light emitting unit 20 is a surface light source that has a light emitting surface 22 on the side of the glass bottle 10 and can illuminate the glass bottle 10 from the side opposite to the imaging unit 40 . The height of the light-emitting part 20 is set so that the whole of the largest glass bottle 10 scheduled to be inspected by the inspection apparatus 1 can be irradiated. As shown in FIG. 2 , the overall width W2 of the light-emitting surface 22 is narrower than the overall width W1 of the glass bottle 10 . By making the full width W2 narrower than the full width W1, the shadow of the surface air bubble 18 can be clearly imaged. The full widths W1 and W2 are the full widths of the glass bottle 10 and the light-emitting surface 22 when the inspection apparatus 1 is viewed from above.

如第2圖所示,發光面22,是例如長方形的形狀,其幾乎全面發光。發光面22,是正對於玻璃瓶10及攝像部40,透過了玻璃瓶10的光可到達攝像部40。As shown in FIG. 2 , the light emitting surface 22 is, for example, a rectangular shape, and emits light on almost the entire surface. The light-emitting surface 22 faces the glass bottle 10 and the imaging unit 40 , and the light that has passed through the glass bottle 10 can reach the imaging unit 40 .

發光部20的光源,是可以使用例如LED和有機EL等的公知的光源。發光部20是擴散照明,使用LED的情況時可以在發光面22利用擴散板將均一的光對於玻璃瓶10照射。擴散板,可以使用將來自LED等的光源的光擴散並朝外部射出的公知者。光是藉由擴散板而被擴散,當使用多數的光源的情況時,可以減少光源不存在的部分的不均勻。As the light source of the light emitting unit 20, for example, a known light source such as LED and organic EL can be used. The light-emitting part 20 is diffused illumination, and when LEDs are used, the glass bottle 10 can be irradiated with uniform light using a diffusion plate on the light-emitting surface 22 . A known diffuser plate can be used which diffuses and emits light from a light source such as an LED to the outside. The light is diffused by the diffuser plate, and when a large number of light sources are used, the unevenness of the part where the light source does not exist can be reduced.

攝像部40,是將玻璃瓶10與挾持發光部20相面對配置。攝像部40,是配置成將中心軸12的延長線上的玻璃瓶10的表面攝像。攝像部40,是配置成可以將玻璃瓶10的至少檢查對象部分攝像,在此,玻璃瓶10的胴部13的垂直方向的整體可進入攝像部40的視野內。The imaging unit 40 is arranged so that the glass bottle 10 and the light-emitting unit 20 are held to face each other. The imaging unit 40 is arranged so as to image the surface of the glass bottle 10 on the extension line of the central axis 12 . The imaging unit 40 is arranged so as to be capable of imaging at least the inspection object part of the glass bottle 10 , and the entire vertical direction of the body 13 of the glass bottle 10 can enter the field of view of the imaging unit 40 .

攝像部40,可以藉由透過了玻璃瓶10的發光部20的光而將包含檢出體(例如包含表面氣泡18)的畫像攝像。攝像部40,是例如,可以使用公知的線感測器照相機。攝像部40,是藉由旋轉檢出部54的輸出配合側滾子32的旋轉而攝像,旋轉速度即使由任何的原因變化也不會影響畫像80。The imaging unit 40 can capture an image including the detected object (for example, including the surface air bubble 18 ) by the light transmitted through the light emitting unit 20 of the glass bottle 10 . As the imaging unit 40, for example, a known line sensor camera can be used. The imaging unit 40 captures an image by the output of the rotation detecting unit 54 in accordance with the rotation of the side roller 32, and the image 80 is not affected even if the rotation speed changes for any reason.

攝像部40,是將胴部13的全周攝像,將其資料朝控制部50的畫像處理部53發訊。The imaging unit 40 images the entire circumference of the body 13 and transmits the data to the image processing unit 53 of the control unit 50 .

控制部50,是包含:判別部52、及畫像處理部53。控制部50,是例如,由CPU(中央處理器、Central Processing Unit)和GPU(圖形處理單元、Graphics Processing Unit)等的處理器、HDD(Hard Disk Drive)、SSD(Solid State Drive)、ROM(唯讀記憶體、Read-Only Memory)、RAM(動態隨機存取記憶體、Random Access Memory)等的記憶裝置、鍵盤、滑鼠、觸控板等的輸入裝置、液晶顯示器、有機EL(電致發光、Electro Luminescence)顯示器等的顯示裝置、I/O板等的數位輸入輸出板等構成。控制部50,是實行檢查玻璃瓶10的處理。由檢查裝置1將玻璃瓶10由規定速度間歇搬運的處理,雖是由與控制部50不同的控制部實行,但是也可以由控制部50實行。The control unit 50 includes a determination unit 52 and an image processing unit 53 . The control unit 50 is, for example, a processor including a CPU (Central Processing Unit) and a GPU (Graphics Processing Unit), an HDD (Hard Disk Drive), an SSD (Solid State Drive), a ROM ( Memory devices such as read-only memory, Read-Only Memory, and RAM (Random Access Memory), input devices such as keyboards, mice, and touchpads, liquid crystal displays, and organic EL (electrical) It is composed of display devices such as light-emitting, Electro Luminescence) displays, and digital input and output boards such as I/O boards. The control unit 50 executes the process of inspecting the glass bottle 10 . Although the processing of intermittently conveying the glass bottle 10 at a predetermined speed by the inspection apparatus 1 is performed by a control unit different from the control unit 50 , it may be performed by the control unit 50 .

判別部52,是依據從攝像部40所取得的畫像判別有無缺點。由判別部52所判別的缺點,是例如,表面缺點。表面缺點,是指存在於玻璃瓶10的內表面或是外表面的表面氣泡18、污垢、異物。判別部52,是除了判別表面缺點以外,也可以判別例如玻璃瓶10的內部的缺點。判別部52,是將例如縱的長度是3.0mm以上,橫的長度是1.0mm以上,深度是0.05mm以上的表面氣泡18判別為缺點較佳。且,判別部52,不會誤將源自雕刻15的畫像的模樣判別為缺點較佳。The determination unit 52 determines the presence or absence of a defect based on the image acquired from the imaging unit 40 . The defect determined by the determination unit 52 is, for example, a surface defect. Surface defects refer to surface air bubbles 18 , dirt, and foreign matter existing on the inner surface or the outer surface of the glass bottle 10 . The determination unit 52 is capable of determining, for example, defects in the interior of the glass bottle 10 in addition to surface defects. The determination unit 52 preferably determines the surface air bubbles 18 having a vertical length of 3.0 mm or more, a horizontal length of 1.0 mm or more, and a depth of 0.05 mm or more as defects. In addition, it is preferable that the determination unit 52 does not mistake the appearance of the image derived from the engraving 15 as a defect.

控制部50,是將判別部52的判別結果將玻璃瓶10朝外部輸出,例如,將由檢查裝置1的排出部之後的線判別為有缺點的玻璃瓶10排除。對於控制部50的具體的處理,是由下述「3.檢查方法」說明。The control unit 50 outputs the determination result of the determination unit 52 to the outside of the glass bottles 10 , for example, excludes the glass bottles 10 determined to be defective by the line after the discharge unit of the inspection apparatus 1 . The specific processing of the control unit 50 is described in the following "3. Inspection method".

2.製造方法 說明本實施方式的玻璃瓶10的製造方法。玻璃瓶10,首先是由粗模從塊料成形成型坯。型坯,是在已被配置於粗模內的高溫的塊料內將壓縮空氣吹入而成形成有底筒狀。也可以配合壓縮空氣而使用滑閥。接著,將型坯朝精整模型移動,在精整模型內將壓縮空氣朝型坯吹入將製品也就是玻璃瓶10成形。成形隨後的玻璃瓶10因為是高溫,所以朝漸冷爐移動使緩慢地被冷卻。對於從漸冷爐被搬出的玻璃瓶10實行下述檢查方法。且,實行下述檢查方法後,可將被判別為無缺點的玻璃瓶10作為良好的製品。2. Manufacturing method The manufacturing method of the glass bottle 10 of this embodiment is demonstrated. The glass bottle 10 is first formed into a preform from a block by a rough die. The parison is formed into a bottomed cylindrical shape by blowing compressed air into a high-temperature block placed in a rough mold. A spool valve can also be used with compressed air. Next, the parison is moved toward the sizing mold, and compressed air is blown into the parison in the sizing mold to mold the glass bottle 10 , which is a product. Since the glass bottle 10 after forming is high temperature, it is slowly cooled by moving toward the gradual cooling furnace. The following inspection method is implemented about the glass bottle 10 carried out from the gradual cooling furnace. And the glass bottle 10 judged to have no defect can be regarded as a good product by carrying out the following inspection method.

如此,依據本實施方式的玻璃瓶10的製造方法的話,即使具有雕刻15的玻璃瓶10,因為可以自動地判別缺點,所以也可以製造無缺點的玻璃瓶10。Thus, according to the manufacturing method of the glass bottle 10 of this embodiment, even if it has the glass bottle 10 with the engraving 15, since a defect can be discriminated automatically, the glass bottle 10 without a defect can be manufactured.

3.檢查方法 使用第3圖~第7圖說明使用第1圖及第2圖中的檢查裝置1的本實施方式的玻璃瓶10的檢查方法。第3圖是本實施方式的檢查方法的流程圖,第4圖是畫像80的一例,第5圖是說明畫像前處理S14、模樣位置檢出過程S16及屏蔽過程S18的圖,第6圖是說明畫像前處理S14及屏蔽過程S18的圖,第7圖是說明判別過程S20的圖。3. Inspection method The inspection method of the glass bottle 10 of this embodiment using the inspection apparatus 1 of FIG. 1 and FIG. 2 is demonstrated using FIG. 3 - FIG. 7. FIG. FIG. 3 is a flowchart of the inspection method according to the present embodiment, FIG. 4 is an example of the image 80, FIG. 5 is a diagram explaining the image preprocessing S14, the pattern position detection process S16, and the masking process S18, and FIG. 6 is a Fig. 7 is a diagram for explaining the image preprocessing S14 and the masking process S18, and Fig. 7 is a diagram for explaining the determination process S20.

如第3圖所示,本實施方式的檢查方法,是對於在胴部13的表面具有雕刻15的玻璃瓶10進行檢查的方法,至少包含:畫像取得過程S12、及屏蔽過程S18、及判別過程S20。本實施方式的檢查方法,也可以在S12之前進一步包含開始攝像的過程S10,也可以在S12之後包含對於畫像施加規定的處理的畫像前處理S14,也可以在S14之後進一步包含模樣位置檢出過程S16。對於各過程一邊參照第1圖及第2圖一邊如以下依序地說明。As shown in FIG. 3, the inspection method of the present embodiment is a method of inspecting a glass bottle 10 having an engraving 15 on the surface of the body portion 13, and includes at least an image acquisition process S12, a masking process S18, and a discrimination process S20. The inspection method of the present embodiment may further include a process S10 of starting imaging before S12, may include an image pre-processing S14 for applying predetermined processing to an image after S12, or may further include a pattern position detection process after S14 S16. Each process will be sequentially described below with reference to FIG. 1 and FIG. 2 .

S10:控制部50,是朝攝像部40發出攝像開始的指令。攝像部40,是依據控制部50的指令,由線感測器將透過了繞中心軸12的周圍旋轉的玻璃瓶10的胴部13的透過光攝像。此時,控制部50,是依據來自旋轉檢出部54的輸出而運算玻璃瓶10的旋轉角度,連續攝像1.5圈(例如 360°×1.5=540°)。第1圖所示的缺點,是例如表面氣泡18。藉由線感測器將透過光攝像,即使如表面氣泡18的陰影的不易出現的缺點,也可以從畫像自動地判別。被攝像的畫像資料,是從攝像部40朝控制部50被發訊。S10: The control unit 50 instructs the imaging unit 40 to start imaging. The imaging unit 40 captures the transmitted light transmitted through the body 13 of the glass bottle 10 that rotates around the central axis 12 by the line sensor in accordance with the instruction of the control unit 50 . At this time, the control unit 50 calculates the rotation angle of the glass bottle 10 based on the output from the rotation detection unit 54, and continuously images 1.5 times (for example, 360°×1.5=540°). The disadvantage shown in FIG. 1 is, for example, surface air bubbles 18 . By imaging the transmitted light by the line sensor, even a defect such as the shadow of the surface air bubble 18 that does not easily appear can be automatically determined from the image. The image data to be captured is transmitted from the imaging unit 40 to the control unit 50 .

S12:控制部50,是實行將從攝像部40被發訊的胴部13的全周被攝像的畫像80(第4圖)取得的畫像取得過程S12。畫像80,是被記憶於控制部50的無圖示的記憶裝置。在畫像80中,至少使胴部13的1.5圈分的畫像被攝像,也可以進一步使頸部11的1.5圈分的畫像被攝像。畫像80是藉由具有胴部13的1.5圈分以上,控制部50,就可以將相當於胴部13的1圈分的複數檢查領域(82~84、88、89)不中斷地配置於畫像80。S12 : The control unit 50 executes the image acquisition process S12 of acquiring the image 80 ( FIG. 4 ) captured from the image 80 ( FIG. 4 ) of the entire circumference of the body 13 transmitted from the imaging unit 40 . The image 80 is a memory device (not shown) stored in the control unit 50 . In the image 80, at least an image of 1.5 circles of the body 13 is captured, and an image of 1.5 circles of the neck 11 may be further captured. The image 80 has more than 1.5 circles of the body 13, and the control unit 50 can arrange a plurality of inspection areas (82 to 84, 88, 89) corresponding to one circle of the body 13 in the portrait without interruption. 80.

第4圖所示的畫像80,是顯示源自雕刻15的模樣15a、及朝縱方向延伸的接縫線16、及表面氣泡陰影18a,是作為暗影被攝像的狀態。接縫線16,是藉由使用將玻璃瓶10成形時的模具所形成的段差而發生的陰影。在畫像80中被判別為缺點的陰影,是除了源自表面氣泡18而形成的表面氣泡陰影18a以外,也可以包含源自內部的氣泡、白石、異物等而形成的陰影。為了將這些的陰影明確與模樣15a和接縫線16區別而判別為缺點,在畫像80中的胴部13被攝像的部分中,設有複數矩形的檢查領域(82~84、88、89),在各檢查領域實行事先被設定的檢查規則。在第4圖中各檢查領域(82~84、88、89)是由虛線顯示。The image 80 shown in FIG. 4 shows the pattern 15a derived from the engraving 15, the seam line 16 extending in the vertical direction, and the surface bubble shadow 18a, and is captured as a dark shadow. The seam line 16 is a shadow generated by the step difference formed by using the mold when molding the glass bottle 10 . The shadows identified as defects in the image 80 may include, in addition to the surface bubble shadows 18a derived from the surface bubbles 18, shadows derived from internal bubbles, white stones, foreign matter, and the like. In order to clearly distinguish these shadows from the pattern 15a and the seam line 16 and identify them as defects, a plurality of rectangular inspection areas (82 to 84, 88, 89) are provided in the portion of the image 80 where the body 13 is imaged. , the pre-set inspection rules are implemented in each inspection area. In FIG. 4, each inspection area (82 to 84, 88, 89) is shown by a dotted line.

S14:畫像處理部53,是為了更確實地實行模樣位置檢出過程S16,而對於模樣15a實行畫像前處理S14。畫像前處理S14,是為了由抽象的形狀來圖型搜尋模樣15a,例如可以進行「模糊處理」。「模糊處理」,是例如可以藉由平均化濾波器進行,平均化濾波器是將矚目畫素的畫素值,置換成濾波器尺寸範圍內的全畫素值的平均值並輸出的二次元濾波器。S14: The image processing unit 53 executes the image preprocessing S14 on the pattern 15a in order to more reliably execute the pattern position detection process S16. The image preprocessing S14 is to search for the pattern 15a from an abstract shape, for example, "blurring" may be performed. "Blurring" can be performed, for example, by an averaging filter. The averaging filter is a quadratic element that replaces the pixel value of the eye-catching pixel with the average value of all pixel values within the filter size range and outputs it. filter.

且畫像前處理S14,是除了「模糊處理」以外,也可以採用例如將陰影的黑加以膨脹的「膨脹處理」。In addition to the "blurring process", the image pre-processing S14 may employ, for example, a "dilation process" in which the black of the shadow is inflated.

S16:如第5圖所示,判別部52,是實行模樣位置檢出過程S16。在實行模樣位置檢出過程S16之前,如第5圖(a)所示,操作者是事先準備依據雕刻15的外形而作成的圖型登錄畫像86。圖型登錄畫像86也可以依據源自雕刻15的模樣15a的外形而作成。圖型登錄畫像86,是比雕刻15更稍大的框,也可以設定成與矩形的第1檢查領域82相同大小。圖型登錄畫像86,是被記憶於控制部50的無圖示的記憶裝置。S16: As shown in FIG. 5, the determination unit 52 executes the pattern position detection process S16. Before executing the pattern position detection process S16 , as shown in FIG. 5( a ), the operator prepares the pattern registration image 86 created according to the outer shape of the engraving 15 in advance. The pattern registration image 86 may be created according to the shape of the pattern 15 a derived from the engraving 15 . The pattern registration image 86 is a frame slightly larger than the engraving 15 , and may be set to the same size as the rectangular first inspection area 82 . The pattern registration image 86 is a memory device (not shown) stored in the control unit 50 .

接著,判別部52,是實行模樣位置檢出過程S16。如第5圖(b)及(c)所示,模樣位置檢出過程S16,是對於在畫像取得過程S12所取得的畫像80,使用事先依據雕刻15的外形所作成的圖型登錄畫像86進行圖型搜尋,而檢出模樣15a。圖型搜尋,是在畫像80內搜尋適合圖型登錄畫像86的檢出體,當圖型登錄畫像86與一定程度模樣15a的外形一致時,就將檢出體檢出作為模樣15a。因為使用依據雕刻15的外形所作成的圖型登錄畫像86而檢出模樣15a,所以模樣15a的濃淡即使較薄,仍可以穩定地檢出模樣15a的位置。Next, the determination unit 52 executes the pattern position detection process S16. As shown in FIGS. 5(b) and (c), the pattern position detection process S16 is performed using the pattern registration image 86 previously created according to the shape of the engraving 15 for the image 80 acquired in the image acquisition process S12. The pattern is searched, and the pattern 15a is detected. The pattern search is to search the image 80 for a detected object suitable for the pattern registration image 86, and when the pattern registration image 86 matches the shape of the pattern 15a to a certain extent, the detected object is detected as the pattern 15a. Since the pattern 15a is detected using the pattern registration image 86 created according to the outer shape of the engraving 15, the position of the pattern 15a can be stably detected even if the shade of the pattern 15a is thin.

模樣位置檢出過程S16,是可以對於畫像80中的規定高度範圍進行圖型搜尋。如第1圖所示玻璃瓶10是位於載置台30上,被攝像的畫像80中的模樣15a的出現的高度是幾乎一定。在此,如第4圖所示,將來自畫像80的下端的第1高度H1作為下限,將第2高度H2的水平方向的範圍設定於圖型搜尋領域85(由一點鎖線包圍的矩形領域),在圖型搜尋領域85內進行圖型搜尋。如此藉由對於規定高度範圍進行圖型搜尋,就可以減少檢查裝置1的處理的負荷。In the pattern position detection process S16 , pattern search can be performed for a predetermined height range in the image 80 . As shown in FIG. 1, the glass bottle 10 is positioned on the mounting table 30, and the height of the appearance of the pattern 15a in the photographed image 80 is almost constant. Here, as shown in FIG. 4, the first height H1 from the lower end of the image 80 is set as the lower limit, and the horizontal range of the second height H2 is set in the pattern search area 85 (the rectangular area surrounded by a dotted lock line) , and perform a pattern search in the pattern search field 85 . By performing a pattern search for a predetermined height range in this way, the processing load of the inspection apparatus 1 can be reduced.

S18:畫像處理部53,是實行屏蔽過程S18。如第5圖(d)及(e)所示,屏蔽過程S18,是藉由遮罩87而將畫像80中包含源自雕刻15的模樣15a的雕刻領域81屏蔽。雕刻領域81,是包含模樣15a的整體的寬度。雕刻領域81,也可以是藉由圖型登錄畫像86而被包圍的領域,也可以是將比圖型登錄畫像86更若干窄且更接近模樣15a的範圍作為雕刻領域81。遮罩87,是與雕刻領域81等同。遮罩87,是與圖型登錄畫像86一起,事先被作成。也可以事先設定遮罩87及圖型登錄畫像86的配置。由此,藉由圖型搜尋而確認了圖型登錄畫像86是被配置於畫像80中適切的位置的話,在雕刻領域81被設定於畫像80的同時藉由遮罩87進行屏蔽。且,畫像處理部53,是依據藉由圖型搜尋而檢出的模樣15a的位置,將事先設定的形狀的複數檢查領域(82~84、88、89)配置於畫像80。藉由事先設定好模樣15a的位置及各檢查領域(82~84、88、89)的位置之間的相對位置,當模樣15a的位置被決定的話,就可以將複數檢查領域(82~84、88、89)的位置自動地佈局配置在畫像80上。S18: The image processing unit 53 executes the masking process S18. As shown in FIGS. 5( d ) and ( e ), in the masking process S18 , the engraving area 81 including the pattern 15 a originating from the engraving 15 in the portrait 80 is masked by the mask 87 . The engraving area 81 is the entire width including the pattern 15a. The engraving area 81 may be an area surrounded by the pattern registration image 86 , or an area slightly narrower than the pattern registration image 86 and closer to the pattern 15 a may be the engraving area 81 . Mask 87 is equivalent to engraving field 81 . The mask 87 is created in advance together with the pattern registration image 86 . The arrangement of the mask 87 and the pattern registration image 86 may be set in advance. As a result, if it is confirmed by the pattern search that the pattern registration image 86 is arranged at an appropriate position in the image 80, the engraving area 81 is set in the image 80 and masked by the mask 87 at the same time. Furthermore, the image processing unit 53 arranges, on the image 80 , a plurality of inspection areas ( 82 to 84 , 88 , 89 ) of preset shapes based on the position of the pattern 15 a detected by the pattern search. By setting the relative position between the position of the pattern 15a and the positions of the inspection areas (82 to 84, 88, 89) in advance, when the position of the pattern 15a is determined, the plural inspection areas (82 to 84, 88, 89) can be set. 88, 89) are automatically laid out on the portrait 80.

除了上述的S14~S18以外,例如,S14也可以採用其他的畫像處理。例如,畫像處理部53,也可以藉由將由第6圖(a)的畫像取得過程S12所取得的畫像80,如第6圖(b)進行複數次的膨脹處理將模樣15a加粗,將其畫像80如第6圖(c)進行二值化處理,由判別部52實行模樣位置檢出過程S16而檢出的模樣15a並設定雕刻領域81,使畫像處理部53如第6圖(d)實行屏蔽過程S18。此情況,模樣位置檢出過程S16,可以藉由由二值化處理所獲得的模樣15a的重心及面積而檢出模樣15a。In addition to the above-described S14 to S18, for example, other image processing may be employed in S14. For example, the image processing unit 53 may make the image 80 acquired by the image acquisition process S12 of FIG. 6(a) a plurality of times of expansion processing as shown in FIG. The image 80 is binarized as shown in Fig. 6(c), the pattern 15a detected by the discriminating unit 52 executing the pattern position detection process S16, and the engraving area 81 is set, so that the image processing unit 53 is as shown in Fig. 6(d) The masking process S18 is carried out. In this case, in the pattern position detection process S16, the pattern 15a can be detected from the center of gravity and the area of the pattern 15a obtained by the binarization process.

S20:判別部52,是實行判別過程S20。判別過程S20,是對於畫像80中除了被屏蔽的雕刻領域81以外的領域,判別有無缺點。因為是對於除了雕刻領域81以外的領域有無缺點進行判別,所以可以從畫像80自動地判別在表面具有雕刻15的玻璃瓶10中有無缺點。判別過程S20,是各別對於被設定於畫像80的第1檢查領域82、第2檢查領域83、第3檢查領域84、第4檢查領域88及第5檢查領域89,由各別規定的檢查規則實行,判別有無缺點。各檢查領域,是事先被設定成為例如規定的大小的矩形狀。S20: The determination unit 52 executes the determination process S20. The determination process S20 is to determine the presence or absence of defects in areas other than the masked engraving area 81 in the portrait 80 . Since it is determined whether or not there is a defect in a field other than the engraving field 81 , the presence or absence of a defect in the glass bottle 10 having the engraving 15 on the surface can be automatically determined from the image 80 . The determination process S20 is for each of the first inspection area 82 , the second inspection area 83 , the third inspection area 84 , the fourth inspection area 88 , and the fifth inspection area 89 , which are set in the image 80 , to be inspected individually. The rules are implemented, and the shortcomings are judged. Each inspection area is set in advance, for example, in a rectangular shape of a predetermined size.

第1檢查領域82,是將雕刻領域81的周圍包圍的領域,比第2檢查領域83更狹窄。在第1檢查領域82中,除了由遮罩87所被覆的領域以外,對於如第7圖(a)陰影的線較細(或較薄)的表面氣泡18,畫像處理部53是進行了例如縱橫方向強調處理之後,進行二值化處理的話如第7圖(b)所示陰影的線就成為無中斷的連續體。判別部52,是二值化處理後,依據檢出體的面積及最大長度,來判別檢出體是否為缺點,檢出體不是缺點的情況時判別為「無缺點」,控制部50是將該玻璃瓶10作為良品處理(S22)。且,在檢出體具有缺點的情況中判別為「具有缺點」,控制部50是將該玻璃瓶10作為不良品處理(S24)。The first inspection area 82 is an area surrounding the engraving area 81 and is narrower than the second inspection area 83 . In the first inspection area 82, except for the area covered by the mask 87, the image processing unit 53 performs, for example, the surface air bubbles 18 with thin (or thin) lines hatched in Fig. 7(a). After the vertical and horizontal direction emphasis processing is performed, if the binarization processing is performed, the hatched line as shown in Fig. 7(b) becomes an uninterrupted continuum. The determination unit 52, after the binarization process, determines whether the detected object is a defect or not based on the area and the maximum length of the detected object. This glass bottle 10 is treated as a good product (S22). Then, when the detected object has a defect, it is determined that it has a defect, and the control unit 50 treats the glass bottle 10 as a defective product (S24).

第2檢查領域83,是將第1檢查領域82的周圍包圍,從畫像80的下端至頸部11的下端為止延伸。第2檢查領域83,是除了第1檢查領域82以外的部分。畫像處理部53,是對於第2檢查領域83進行與第1檢查領域82同樣的畫像處理,判別部52是判別檢出體是否為缺點(S20)。因為在第2檢查領域83將模樣15a誤判別為缺點的可能性較低,所以判別部52,可以由比第1檢查領域82更高的精度來判別第2檢查領域83的檢出體。The second inspection area 83 surrounds the first inspection area 82 and extends from the lower end of the image 80 to the lower end of the neck 11 . The second inspection area 83 is a portion other than the first inspection area 82 . The image processing unit 53 performs the same image processing as the first inspection area 82 for the second inspection area 83, and the determination unit 52 determines whether the detected object is a defect (S20). Since the second inspection area 83 is less likely to erroneously determine the pattern 15a as a defect, the determination unit 52 can determine the detected objects in the second inspection area 83 with higher accuracy than the first inspection area 82 .

2個第3檢查領域84,是被配置於第2檢查領域83的左右的外側,從畫像80的下端至頸部11的下端為止延伸。第3檢查領域84,是被配置於畫像80中的接縫線16出現的部分。第3檢查領域84中的檢查規則,有必要與檢出體接縫線16區別。例如,如第7圖(c)及(d),將檢出體朝縱方向複數分割,並測量被分割的框內的橫方向的二線間距離D1、D2。判別部52,當二線間距離D1是比規定的寬度更寬且上下的框內的檢出體是例如3個以上連續的情況時,就判別為表面氣泡18,二線間距離D2是比規定的寬度更窄的話,就判別為接縫線16。且,畫像處理部53,是從第7圖(e)的畫像將縱方向的陰影(接縫線16)消去,進一步二值化處理成如第7圖(f)之後,判別部52,是藉由檢出體的面積判別是否為缺點。此時因為可以藉由由畫像處理強調縱方向的輝度變化將縱方向的陰影消去,所以會殘留縱方向具有輝度變化的具有橫長的部分的表面氣泡。如此藉由同時適用二種不同的檢查規則,就不會將接縫線16弄錯成缺點,且可更正確地檢查。The two third inspection areas 84 are arranged on the left and right outer sides of the second inspection areas 83 and extend from the lower end of the image 80 to the lower end of the neck 11 . The third inspection area 84 is a portion where the seam line 16 arranged in the image 80 appears. The inspection rule in the third inspection area 84 needs to be different from the detection body seam line 16 . For example, as shown in FIGS. 7( c ) and ( d ), the detected object is divided into plural numbers in the vertical direction, and the distances D1 and D2 between the two lines in the horizontal direction within the divided frame are measured. The discriminating unit 52 discriminates that the surface bubble 18 is the surface air bubble 18 when the distance D1 between the two lines is wider than a predetermined width and the detected objects in the upper and lower frames are, for example, three or more consecutive, and the distance D2 between the two lines is the ratio. If the predetermined width is narrower, it is determined as the seam line 16 . In addition, the image processing unit 53 removes the vertical shadow (the seam line 16 ) from the image in FIG. 7(e), and further performs binarization processing as shown in FIG. 7(f), and the determination unit 52 is: Whether it is a defect is judged by the area of the detected body. At this time, since the vertical shading can be eliminated by emphasizing the vertical luminance change by the image processing, surface air bubbles having a horizontally long portion having a vertical luminance change remain. In this way, by applying two different inspection rules at the same time, the seam line 16 is not mistaken as a defect and can be inspected more accurately.

第4檢查領域88,是在第2檢查領域83及第3檢查領域84之間,從畫像80的下端至頸部11的下端為止延伸。第4檢查領域88,是與胴部13中的第2檢查領域83相面對的部分。畫像處理部53及判別部52,可以對於第4檢查領域88,進行與第2檢查領域83同樣的處理。The fourth inspection area 88 extends from the lower end of the image 80 to the lower end of the neck 11 between the second inspection area 83 and the third inspection area 84 . The fourth inspection area 88 is a portion facing the second inspection area 83 in the body 13 . The image processing unit 53 and the determination unit 52 can perform the same processing as the second inspection area 83 with respect to the fourth inspection area 88 .

第5檢查領域89,是對應在第2檢查領域83~第4檢查領域88的上方延伸的頸部11的部分。第5檢查領域89,是除了接縫線16被攝像的位置以外,在畫像80上被分開配置2個。其是因為在位於2個第5檢查領域89之間的位置中會發生與接縫線16垂直交叉的干擾陰影。畫像處理部53及判別部52,可以對於第5檢查領域89,進行例如與第3檢查領域84同樣的處理。The fifth inspection area 89 corresponds to the portion of the neck 11 extending above the second inspection area 83 to the fourth inspection area 88 . The fifth inspection area 89 is divided into two on the image 80 except for the position where the seam line 16 is imaged. This is because interference shadows perpendicular to the seam line 16 occur at positions located between the two fifth inspection areas 89 . The image processing unit 53 and the determination unit 52 can perform, for example, the same processing as the third inspection area 84 for the fifth inspection area 89 .

本發明,不限定於上述的實施方式,可進一步進行各種的變形,包含與實施方式所說明的構成(結構)實質上相同的構成(結構)。在此,「相同的構成(結構)」,是指功能、方法、及結果是相同的構成(結構),或是目的效果相同的構成(結構)。且,本發明,是包含將由實施方式所說明的構成(結構)的非本質的部分置換的構成(結構)。且,本發明,是包含可達成與實施方式所說明的構成(結構)相同的作用效果的構成(結構)、或是可以相同的目的構成(結構)。且,本發明,是包含了在實施方式所說明的構成(結構)附加了公知技術的構成(結構)。The present invention is not limited to the above-described embodiments, and various modifications can be made, and includes substantially the same configuration (configuration) as the configuration (configuration) described in the embodiment. Here, "the same structure (structure)" means that the function, method, and result are the same structure (structure), or the structure (structure) with the same purpose and effect. In addition, the present invention includes a configuration (structure) in which non-essential parts of the configuration (configuration) described in the embodiment are replaced. In addition, the present invention includes a configuration (configuration) that can achieve the same functions and effects as the configuration (configuration) described in the embodiment, or a configuration (configuration) that can achieve the same purpose. In addition, the present invention includes a configuration (configuration) in which a known technique is added to the configuration (configuration) described in the embodiment.

1:檢查裝置 10:玻璃瓶 11:頸部 12:中心軸 13:胴部 14:底部 15:雕刻 15a:模樣 16:接縫線 18:表面氣泡 18a:表面氣泡陰影 19:口部 20:發光部 22:發光面 30:載置台 32:側滾子 35:皮帶 40:攝像部 50:控制部 52:判別部 53:畫像處理部 54:旋轉檢出部 60:馬達 62:旋轉控制部 80:畫像 81:雕刻領域 82:第1檢查領域 83:第2檢查領域 84:第3檢查領域 85:圖型搜尋領域 86:圖型登錄畫像 87:遮罩 88:第4檢查領域 D1,D2:二線間距離 H1:第1高度 H2:第2高度 W1,W2:全寬度1: Inspection device 10: glass bottle 11: Neck 12: Center axis 13: Carcass 14: Bottom 15: Carving 15a: Appearance 16: seam line 18: Surface bubbles 18a: Surface Bubble Shadows 19: Mouth 20: Light-emitting part 22: Glowing Surface 30: Mounting table 32: Side Roller 35: Belt 40: Camera Department 50: Control Department 52: Discrimination Department 53: Image Processing Department 54: Rotation detection part 60: Motor 62: Rotation control part 80: Portrait 81: Sculpting Field 82: 1st inspection area 83: 2nd inspection area 84: 3rd inspection area 85: Graph Search Field 86: Graphical login portrait 87: Mask 88: 4th inspection area D1, D2: distance between two lines H1: first height H2: 2nd height W1,W2: full width

[第1圖]示意檢查裝置的側面圖。 [第2圖]示意檢查裝置的俯視圖。 [第3圖]本實施方式的檢查方法的流程圖。 [第4圖]畫像的一例。 [第5圖]說明畫像處理、檢出過程及屏蔽過程的圖。 [第6圖]說明畫像處理及屏蔽過程的圖。 [第7圖]說明判別過程的圖。[Fig. 1] A side view showing a schematic inspection device. [Fig. 2] A plan view showing a schematic inspection device. [FIG. 3] A flowchart of the inspection method of the present embodiment. [Figure 4] An example of a portrait. [FIG. 5] A diagram explaining the image processing, the detection process, and the masking process. [FIG. 6] A diagram explaining the image processing and masking process. [FIG. 7] A diagram illustrating the discrimination process.

Claims (5)

一種玻璃瓶的檢查方法,對於在胴部的表面具有雕刻的玻璃瓶,進行檢查的方法,前述雕刻是藉由成形時被刻在模具的凹凸而成形,其特徵為,包含:將旋轉的前述玻璃瓶攝像並將前述胴部的全周被攝像的畫像取得的畫像取得過程、及將前述畫像中包含源自前述雕刻的模樣的雕刻領域屏蔽的屏蔽過程、及對於前述畫像中除了被屏蔽的前述雕刻領域以外的領域判別有無缺點的判別過程。 A method for inspecting a glass bottle, the method for inspecting a glass bottle having an engraving on the surface of the body, wherein the engraving is formed by concavities and convexities engraved on a mold during forming, characterized by comprising: rotating the rotating The image acquisition process of photographing the glass bottle and acquiring the image of the entire circumference of the carcass, and the masking process of shielding the engraving area that includes the image originating from the engraving in the image, and the masking process for the image except the masked image. The judgment process for judging the presence or absence of defects in fields other than the aforementioned engraving field. 如請求項1的玻璃瓶的檢查方法,其中,前述缺點,是至少包含表面缺點,前述畫像取得過程,是由線感測器將透過了前述胴部的透過光攝像。 The inspection method for a glass bottle according to claim 1, wherein the defects include at least surface defects, and the image acquisition process is performed by imaging the transmitted light passing through the body with a line sensor. 如請求項1或2的玻璃瓶的檢查方法,其中,進一步包含模樣位置檢出過程,其是使用事先依據前述雕刻的外形而作成的圖型登錄畫像,圖型搜尋由前述畫像取得過程所取得的前述畫像,而檢出前述模樣,前述屏蔽過程,是將包含由前述模樣位置檢出過程所檢出的前述模樣的前述雕刻領域屏蔽;根據藉由前述圖型搜尋所檢出的前述模樣的位置,將事先設定的形狀的複數的檢查領域,並排配置於前述畫像 的橫方向,前述複數的檢查領域的至少兩個檢查領域配置在前述畫像的接縫線出現的部分。 The inspection method for glass bottles according to claim 1 or 2, further comprising a pattern position detection process using a pattern registration portrait created in advance based on the shape of the engraving, and the pattern search is obtained by the image acquisition process The aforementioned image is detected, and the aforementioned pattern is detected, and the aforementioned masking process is to mask the aforementioned engraving area including the aforementioned pattern detected by the aforementioned pattern position detection process; according to the aforementioned pattern detected by the aforementioned pattern search. position, and arranges a plurality of inspection fields with a preset shape in parallel on the above-mentioned image. , at least two inspection areas of the plurality of inspection areas are arranged in the portion where the seam line of the portrait image appears. 如請求項3的玻璃瓶的檢查方法,其中,前述模樣位置檢出過程,是對於前述畫像中的規定高度範圍進行圖型搜尋。 The glass bottle inspection method according to claim 3, wherein the pattern position detection process is to perform pattern search for a predetermined height range in the portrait. 一種玻璃瓶的製造方法,其特徵為:由粗模從塊料成形成型坯,由精整模型將前述型坯成形成前述玻璃瓶,對於前述玻璃瓶進行如請求項1至4中任一項的玻璃瓶的檢查方法,而獲得被判別為無前述缺點的玻璃瓶。 A method of manufacturing a glass bottle, characterized in that: forming a preform from a block material by a rough mold, forming the above-mentioned parison into the above-mentioned glass bottle by a finishing model, and performing any one of claims 1 to 4 for the above-mentioned glass bottle. The inspection method of the glass bottle is obtained, and the glass bottle that is judged to be free of the aforementioned shortcomings is obtained.
TW109109179A 2019-06-21 2020-03-19 Glass bottle inspection method and glass bottle manufacturing method TWI753384B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019115236A JP7220128B2 (en) 2019-06-21 2019-06-21 Glass bottle inspection method and glass bottle manufacturing method
JP2019-115236 2019-06-21

Publications (2)

Publication Number Publication Date
TW202100988A TW202100988A (en) 2021-01-01
TWI753384B true TWI753384B (en) 2022-01-21

Family

ID=73994983

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109109179A TWI753384B (en) 2019-06-21 2020-03-19 Glass bottle inspection method and glass bottle manufacturing method

Country Status (6)

Country Link
JP (1) JP7220128B2 (en)
KR (1) KR102540808B1 (en)
CN (1) CN112492887A (en)
PH (1) PH12020552062A1 (en)
TW (1) TWI753384B (en)
WO (1) WO2020255498A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4325206A1 (en) 2022-08-18 2024-02-21 F. Hoffmann-La Roche AG Method for compensating defective partitions of a microfluidic chip

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5004909A (en) * 1988-05-30 1991-04-02 Kirin Beer Kabushiki Kaisha Method and apparatus for inspecting sidewalls of bottles using stripe pattern illumination
WO2003042673A1 (en) * 2001-11-16 2003-05-22 Heineken Technical Services B.V. Method and apparatus for generating a robust reference image of a container and for selecting of a container
CN105407346A (en) * 2014-09-04 2016-03-16 宏达国际电子股份有限公司 Method For Image Segmentation
CN206974915U (en) * 2017-06-22 2018-02-06 山东明佳科技有限公司 A kind of glass container vision online detection instrument
CN207181324U (en) * 2017-06-27 2018-04-03 建湖国创机械制造有限公司 A kind of Clear glass bottles and jars all-around intelligent detection means
TWM578796U (en) * 2019-01-31 2019-06-01 統一企業股份有限公司 Container defect detecting device

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58216906A (en) 1983-05-12 1983-12-16 Toyo Glass Kk Automatic bottle direction inspecting method
KR900007548B1 (en) * 1985-10-04 1990-10-15 다이닛뽕스쿠링세이소오 가부시키가이샤 Pattern masking method and an apparatus therefor
JP3283356B2 (en) * 1993-09-22 2002-05-20 マツダ株式会社 Surface inspection method
JPH07160887A (en) * 1993-12-13 1995-06-23 Hewtec:Kk Method and device for patterm matching inspection
JPH09161056A (en) * 1995-12-08 1997-06-20 Fuji Electric Co Ltd Inspecting method for inner surface of circular container
JP2002140695A (en) * 2000-11-01 2002-05-17 Omron Corp Inspection method and its device
JP3934359B2 (en) * 2001-04-23 2007-06-20 日立エンジニアリング株式会社 Foreign matter inspection device in liquid filled in transparent container
JP4284646B2 (en) * 2002-12-27 2009-06-24 キリンテクノシステム株式会社 Foreign matter inspection device and illumination device for foreign matter inspection
JP2004251662A (en) * 2003-02-18 2004-09-09 Shibuya Kogyo Co Ltd Method and apparatus for article inspection
JP4508838B2 (en) * 2004-11-11 2010-07-21 大日本印刷株式会社 Container mouth inspection device
JP2008107311A (en) * 2006-09-29 2008-05-08 Hitachi Chem Co Ltd Defect inspection method and device
JP2010048745A (en) * 2008-08-25 2010-03-04 Asahi Glass Co Ltd Defect inspection system and defect inspection method
JP2010060312A (en) * 2008-09-01 2010-03-18 Kirin Techno-System Co Ltd Device and system for inspecting foreign matter
JP5726045B2 (en) * 2011-11-07 2015-05-27 株式会社神戸製鋼所 Tire shape inspection method and tire shape inspection device
JP2013134101A (en) * 2011-12-26 2013-07-08 Kirin Techno-System Co Ltd Foreign substance inspection device
JP6585992B2 (en) * 2015-10-16 2019-10-02 株式会社キーエンス Image inspection device
JP6851802B2 (en) * 2016-12-12 2021-03-31 東洋ガラス株式会社 Mold control system for bottle making machines
CN110431406B (en) * 2017-02-28 2022-04-01 东洋玻璃株式会社 Container inspection device and container inspection method
CN110546650B (en) * 2017-04-26 2023-05-19 东洋玻璃株式会社 Container inspection device and container inspection method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5004909A (en) * 1988-05-30 1991-04-02 Kirin Beer Kabushiki Kaisha Method and apparatus for inspecting sidewalls of bottles using stripe pattern illumination
WO2003042673A1 (en) * 2001-11-16 2003-05-22 Heineken Technical Services B.V. Method and apparatus for generating a robust reference image of a container and for selecting of a container
CN105407346A (en) * 2014-09-04 2016-03-16 宏达国际电子股份有限公司 Method For Image Segmentation
CN206974915U (en) * 2017-06-22 2018-02-06 山东明佳科技有限公司 A kind of glass container vision online detection instrument
CN207181324U (en) * 2017-06-27 2018-04-03 建湖国创机械制造有限公司 A kind of Clear glass bottles and jars all-around intelligent detection means
TWM578796U (en) * 2019-01-31 2019-06-01 統一企業股份有限公司 Container defect detecting device

Also Published As

Publication number Publication date
JP7220128B2 (en) 2023-02-09
WO2020255498A1 (en) 2020-12-24
PH12020552062A1 (en) 2021-05-31
KR102540808B1 (en) 2023-06-12
KR20210002528A (en) 2021-01-08
JP2021001793A (en) 2021-01-07
TW202100988A (en) 2021-01-01
CN112492887A (en) 2021-03-12

Similar Documents

Publication Publication Date Title
US10890537B2 (en) Appearance inspection device, lighting device, and imaging lighting device
US20060000968A1 (en) Glass bottle inspection device
US20060045324A1 (en) Method and device for preparing reference image in glass bottle inspection device
JP7382519B2 (en) Glass bottle inspection method, glass bottle manufacturing method, and glass bottle inspection device
JP6778754B2 (en) Burn inspection device for glass containers
TWI753384B (en) Glass bottle inspection method and glass bottle manufacturing method
JPH0736004B2 (en) Inspection method and device
JP5773741B2 (en) Appearance inspection apparatus and appearance inspection method for transparent body bottle
JP4986255B1 (en) Container mouth inspection method and apparatus
JP3241666B2 (en) Glass container defect inspection equipment
JP2004020254A (en) Inspecting apparatus for transparent electrode film substrate
KR102205582B1 (en) Container inspection device and container inspection method
JP6049652B2 (en) Bottle bottom inspection device
KR101168399B1 (en) Irregularity inspection method for tire wheel
JP2008076223A (en) Inspection method of cylindrical transparent body, and inspection apparatus used for it
JP2023137057A (en) Method of generating defect prediction model, bottle appearance inspection method and bottle appearance inspection device
CN114820622A (en) Interlayer foreign matter detection method and device
JP2004361085A (en) Visual examination device
JPH0695077B2 (en) Bottom inspection device for glass bottles
JP7040972B2 (en) Support ring inspection device and support ring inspection method for containers with support rings
JPH08304295A (en) Method and apparatus for detecting surface defect
JP2008203168A (en) Visual inspection method for belt
JP2010008125A (en) Bubble sorting method in glass substrate
JP6073261B2 (en) Bottle bottom inspection device
JP6420180B2 (en) Surface inspection apparatus and surface inspection method