PH12020552062A1 - Glass bottle inspection method and glass bottle manufacturing method - Google Patents

Glass bottle inspection method and glass bottle manufacturing method

Info

Publication number
PH12020552062A1
PH12020552062A1 PH12020552062A PH12020552062A PH12020552062A1 PH 12020552062 A1 PH12020552062 A1 PH 12020552062A1 PH 12020552062 A PH12020552062 A PH 12020552062A PH 12020552062 A PH12020552062 A PH 12020552062A PH 12020552062 A1 PH12020552062 A1 PH 12020552062A1
Authority
PH
Philippines
Prior art keywords
glass bottle
engraving
image
inspection method
manufacturing
Prior art date
Application number
PH12020552062A
Other languages
English (en)
Inventor
Takashi Harada
Takashi Suzuki
Original Assignee
Toyo Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyo Glass Co Ltd filed Critical Toyo Glass Co Ltd
Publication of PH12020552062A1 publication Critical patent/PH12020552062A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Textile Engineering (AREA)
  • Theoretical Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
PH12020552062A 2019-06-21 2020-11-27 Glass bottle inspection method and glass bottle manufacturing method PH12020552062A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019115236A JP7220128B2 (ja) 2019-06-21 2019-06-21 ガラスびんの検査方法及びガラスびんの製造方法
PCT/JP2020/011122 WO2020255498A1 (ja) 2019-06-21 2020-03-13 ガラスびんの検査方法及びガラスびんの製造方法

Publications (1)

Publication Number Publication Date
PH12020552062A1 true PH12020552062A1 (en) 2021-05-31

Family

ID=73994983

Family Applications (1)

Application Number Title Priority Date Filing Date
PH12020552062A PH12020552062A1 (en) 2019-06-21 2020-11-27 Glass bottle inspection method and glass bottle manufacturing method

Country Status (6)

Country Link
JP (1) JP7220128B2 (ko)
KR (1) KR102540808B1 (ko)
CN (1) CN112492887A (ko)
PH (1) PH12020552062A1 (ko)
TW (1) TWI753384B (ko)
WO (1) WO2020255498A1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4325206A1 (en) 2022-08-18 2024-02-21 F. Hoffmann-La Roche AG Method for compensating defective partitions of a microfluidic chip

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58216906A (ja) 1983-05-12 1983-12-16 Toyo Glass Kk びん方向自動検査方法
KR900007548B1 (ko) * 1985-10-04 1990-10-15 다이닛뽕스쿠링세이소오 가부시키가이샤 패턴 마스킹 방법 및 그 장치
EP0344617B1 (en) * 1988-05-30 1995-08-02 Kabushiki Kaisha Kirin Techno System Method and apparatus for inspecting sidewalls of bottles
JP3283356B2 (ja) * 1993-09-22 2002-05-20 マツダ株式会社 表面検査方法
JPH07160887A (ja) * 1993-12-13 1995-06-23 Hewtec:Kk パターンマッチング検査方法とその装置
JPH09161056A (ja) * 1995-12-08 1997-06-20 Fuji Electric Co Ltd 円形容器内面検査方法
JP2002140695A (ja) * 2000-11-01 2002-05-17 Omron Corp 検査方法およびその装置
JP3934359B2 (ja) * 2001-04-23 2007-06-20 日立エンジニアリング株式会社 透明容器内充填液体中の異物検査装置
HU226345B1 (en) * 2001-11-16 2008-09-29 Heineken Tech Services Method and apparatus for generating a robust reference image of a container and for selecting of a container
JP4284646B2 (ja) * 2002-12-27 2009-06-24 キリンテクノシステム株式会社 異物検査装置及び異物検査用の照明装置
JP2004251662A (ja) * 2003-02-18 2004-09-09 Shibuya Kogyo Co Ltd 物品検査方法と物品検査装置
JP4508838B2 (ja) * 2004-11-11 2010-07-21 大日本印刷株式会社 容器の口部の検査装置
JP2008107311A (ja) * 2006-09-29 2008-05-08 Hitachi Chem Co Ltd 欠陥検査方法及び欠陥検査装置
JP2010048745A (ja) * 2008-08-25 2010-03-04 Asahi Glass Co Ltd 欠陥検査システムおよび欠陥検査方法
JP2010060312A (ja) * 2008-09-01 2010-03-18 Kirin Techno-System Co Ltd 異物検査装置及び異物検査システム
JP5726045B2 (ja) * 2011-11-07 2015-05-27 株式会社神戸製鋼所 タイヤ形状検査方法、及びタイヤ形状検査装置
JP2013134101A (ja) * 2011-12-26 2013-07-08 Kirin Techno-System Co Ltd 異物検査装置
US9807316B2 (en) * 2014-09-04 2017-10-31 Htc Corporation Method for image segmentation
JP6585992B2 (ja) * 2015-10-16 2019-10-02 株式会社キーエンス 画像検査装置
JP6851802B2 (ja) * 2016-12-12 2021-03-31 東洋ガラス株式会社 製びん機の金型制御システム
KR102205582B1 (ko) * 2017-02-28 2021-01-21 도요 가라스 가부시키가이샤 용기 검사장치 및 용기 검사방법
KR102300158B1 (ko) * 2017-04-26 2021-09-10 도요 가라스 가부시키가이샤 용기 검사장치 및 용기 검사방법
CN206974915U (zh) * 2017-06-22 2018-02-06 山东明佳科技有限公司 一种玻璃容器视觉在线检测设备
CN207181324U (zh) * 2017-06-27 2018-04-03 建湖国创机械制造有限公司 一种透明玻璃瓶全方位智能检测装置
TWM578796U (zh) * 2019-01-31 2019-06-01 統一企業股份有限公司 Container defect detecting device

Also Published As

Publication number Publication date
CN112492887A (zh) 2021-03-12
JP7220128B2 (ja) 2023-02-09
JP2021001793A (ja) 2021-01-07
WO2020255498A1 (ja) 2020-12-24
KR102540808B1 (ko) 2023-06-12
KR20210002528A (ko) 2021-01-08
TWI753384B (zh) 2022-01-21
TW202100988A (zh) 2021-01-01

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