MX367708B - Dispositivo y metodo de inspeccion de defectos superficiales para laminas de acero. - Google Patents

Dispositivo y metodo de inspeccion de defectos superficiales para laminas de acero.

Info

Publication number
MX367708B
MX367708B MX2018010422A MX2018010422A MX367708B MX 367708 B MX367708 B MX 367708B MX 2018010422 A MX2018010422 A MX 2018010422A MX 2018010422 A MX2018010422 A MX 2018010422A MX 367708 B MX367708 B MX 367708B
Authority
MX
Mexico
Prior art keywords
diffused reflection
image signal
reflection light
angle
image
Prior art date
Application number
MX2018010422A
Other languages
English (en)
Other versions
MX2018010422A (es
Inventor
Fukui Keita
SHIGA Syunsuke
Original Assignee
Nippon Steel Nisshin Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Nisshin Co Ltd filed Critical Nippon Steel Nisshin Co Ltd
Publication of MX2018010422A publication Critical patent/MX2018010422A/es
Publication of MX367708B publication Critical patent/MX367708B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/204—Structure thereof, e.g. crystal structure
    • G01N33/2045—Defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8921—Streaks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/888—Marking defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)

Abstract

La presente invención detecta y distingue una anormalidad de apariencia dañina a partir de una mancha de aceite, una raya de recocido o similar, como una anormalidad de apariencia inocua en una lámina de acero como un objeto de inspección en el cual la laminación u otro tratamiento superficial no es realizado sobre una superficie de la misma. La presente invención es proporcionada con una unidad de iluminación 3 para iluminar una región 8 de objeto de formación de imagen, una primera unidad de formación de imagen por luz de reflexión difusa 4 para capturar una imagen de luz de reflexión difusa en una dirección en la cual el ángulo de la misma con una dirección de reflexión regular es un primer ángulo ?, una segunda unidad de formación de imagen por luz de reflexión difusa 5 para capturar una imagen de la luz de reflexión difusa en una dirección en la cual el ángulo de la misma con la dirección de reflexión regular es un segundo ángulo d (donde d > ?), y una unidad de procesamiento de señal de imagen 6 para procesar una primera señal de imagen de reflexión difusa T1 obtenida por la captura de la imagen por la primera unidad de formación de imagen por luz de reflexión difusa 4 y una segunda señal de imagen de reflexión difusa T2 obtenida por la captura de la imagen por la segunda unidad de formación de imagen por luz de reflexión difusa 5. La unidad de procesamiento de señal de imagen 6 detecta como una región de defecto superficial, una región que tiene una luminancia menor que un primer valor de umbral predeterminado en la primera señal de imagen de reflexión difusa T1, la segunda señal de imagen de reflexión difusa T2 que tiene una luminancia mayor que un segundo valor de umbral predeterminado para la región.
MX2018010422A 2016-03-30 2016-08-24 Dispositivo y metodo de inspeccion de defectos superficiales para laminas de acero. MX367708B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016067003A JP6117398B1 (ja) 2016-03-30 2016-03-30 鋼板の表面欠陥検査装置および表面欠陥検査方法
PCT/JP2016/074638 WO2017168780A1 (ja) 2016-03-30 2016-08-24 鋼板の表面欠陥検査装置および表面欠陥検査方法

Publications (2)

Publication Number Publication Date
MX2018010422A MX2018010422A (es) 2018-11-09
MX367708B true MX367708B (es) 2019-09-03

Family

ID=58667220

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2018010422A MX367708B (es) 2016-03-30 2016-08-24 Dispositivo y metodo de inspeccion de defectos superficiales para laminas de acero.

Country Status (10)

Country Link
US (1) US10267747B2 (es)
EP (1) EP3364173A4 (es)
JP (1) JP6117398B1 (es)
KR (1) KR101867256B1 (es)
CN (1) CN107533013B (es)
BR (1) BR112018069911A2 (es)
MX (1) MX367708B (es)
MY (1) MY181779A (es)
TW (1) TWI621850B (es)
WO (1) WO2017168780A1 (es)

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CN108773745A (zh) * 2018-06-29 2018-11-09 洛阳点晶智控科技有限公司 一种矿井提升机制动闸盘油污在线检测及清洁装置
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US20230366073A1 (en) * 2020-10-27 2023-11-16 Jfe Steel Corporation Surface temperature measuring method, surface temperature measuring apparatus, hot-dip zinc plated steel sheet manufacturing method, and hot-dip zinc plated steel sheet manufacturing equipment
JP6808888B1 (ja) * 2020-11-05 2021-01-06 Ｐｒｉｍｅｔａｌｓ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｊａｐａｎ株式会社 不良判断装置および不良判断方法
KR20240071141A (ko) 2022-11-15 2024-05-22 광주과학기술원 사상공정 측정 시스템

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Also Published As

Publication number Publication date
CN107533013B (zh) 2018-11-27
US20190003987A1 (en) 2019-01-03
MX2018010422A (es) 2018-11-09
MY181779A (en) 2021-01-06
CN107533013A (zh) 2018-01-02
BR112018069911A2 (pt) 2019-02-05
US10267747B2 (en) 2019-04-23
KR101867256B1 (ko) 2018-06-12
JP6117398B1 (ja) 2017-04-19
TW201734437A (zh) 2017-10-01
EP3364173A1 (en) 2018-08-22
EP3364173A4 (en) 2018-12-05
JP2017181222A (ja) 2017-10-05
TWI621850B (zh) 2018-04-21
KR20170137222A (ko) 2017-12-12
WO2017168780A1 (ja) 2017-10-05

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