JP6117398B1 - 鋼板の表面欠陥検査装置および表面欠陥検査方法 - Google Patents
鋼板の表面欠陥検査装置および表面欠陥検査方法 Download PDFInfo
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
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- G01N21/88—Investigating the presence of flaws or contamination
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- G01N2021/8854—Grading and classifying of flaws
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/888—Marking defects
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- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
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Abstract
Description
2 鋼板
3 照明部
4 第1の乱反射光撮像部
5 第2の乱反射光撮像部
6 画像信号処理部
7 検査結果出力部
8 撮像対象部位
T1 第1の乱反射画像信号
T2 第2の乱反射画像信号
Claims (4)
- 鋼板の表面上にある撮像対象部位を照明する照明部と、
照明光の正反射方向との成す角度が第1の角度となる方向への前記撮像対象部位からの反射光が撮像される位置に設けられることで、正反射光ではなく第1の乱反射光が撮像されるようにした第1の乱反射光撮像部と、
照明光の正反射方向との成す角度が前記第1の角度より大きな第2の角度となる方向への前記撮像対象部位からの反射光が撮像される位置に設けられることで、正反射光ではなく第2の乱反射光が撮像されるようにした第2の乱反射光撮像部と、
前記第1の乱反射光撮像部が撮像して得られた第1の乱反射画像信号と、前記第2の乱反射光撮像部が撮像して得られた第2の乱反射画像信号とを処理する画像信号処理部と、
を備える鋼板の表面欠陥検査装置において、
前記第1の乱反射光撮像部と前記第2の乱反射光撮像部とは同時に前記撮像対象部位からの反射光を撮像するものであり、
前記画像信号処理部は、
前記第1の乱反射光撮像部が撮像して得られた第1の乱反射画像信号のうち所定の第1の閾値より低輝度となる部位であって、同部位について前記第2の乱反射光撮像部が撮像して得られた第2の乱反射画像信号が所定の第2の閾値より高輝度となる部位を表面欠陥部位として検出する、
ことを特徴とする鋼板の表面欠陥検査装置。 - 請求項1に記載の鋼板の表面欠陥検査装置において、
前記画像信号処理部は、
前記所定の第1の閾値を、前記第1の乱反射光撮像部が地合を撮像して得られる第1の乱反射画像信号の値に基づいて設定し、
前記所定の第2の閾値を、前記第2の乱反射光撮像部が地合を撮像して得られる第2の乱反射画像信号の値に基づいて設定する、
ことを特徴とする鋼板の表面欠陥検査装置。 - 鋼板の表面上にある撮像対象部位を照明し、
照明光の前記撮像対象部位からの正反射光ではなく、照明光の正反射方向との成す角度が第1の角度となる方向への前記撮像対象部位からの第1の乱反射光、および、照明光の正反射方向との成す角度が前記第1の角度より大きな第2の角度となる方向への前記撮像対象部位からの第2の乱反射光を撮像し、
撮像してそれぞれ得られた第1の乱反射画像信号と第2の乱反射画像信号とを処理する、
鋼板の表面欠陥検査方法において、
前記第1の乱反射光の撮像および前記第2の乱反射光の撮像は、同時に行われるものであり、
前記処理は、
撮像して得られた第1の乱反射画像信号のうち所定の第1の閾値より低輝度となる部位であって、同部位について撮像して得られた第2の乱反射画像信号が所定の第2の閾値より高輝度となる部位を表面欠陥部位として検出するものである、
ことを特徴とする鋼板の表面欠陥検査方法。 - 請求項3に記載の鋼板の表面欠陥検査方法において、
前記所定の第1の閾値は、地合を撮像して得られる第1の乱反射画像信号の値に基づいて設定されたものであり、
前記所定の第2の閾値は、地合を撮像して得られる第2の乱反射画像信号の値に基づいて設定されたものである、
ことを特徴とする鋼板の表面欠陥検査方法。
Priority Applications (10)
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JP2016067003A JP6117398B1 (ja) | 2016-03-30 | 2016-03-30 | 鋼板の表面欠陥検査装置および表面欠陥検査方法 |
BR112018069911A BR112018069911A2 (pt) | 2016-03-30 | 2016-08-24 | dispositivo de inspeção de defeito de superfície e método para lâminas de aço |
PCT/JP2016/074638 WO2017168780A1 (ja) | 2016-03-30 | 2016-08-24 | 鋼板の表面欠陥検査装置および表面欠陥検査方法 |
KR1020177034753A KR101867256B1 (ko) | 2016-03-30 | 2016-08-24 | 강판의 표면 결함 검사 장치 및 표면 결함 검사 방법 |
EP16896997.0A EP3364173A4 (en) | 2016-03-30 | 2016-08-24 | Device and method for inspecting surface defect in steel plate |
MYPI2018703470A MY181779A (en) | 2016-03-30 | 2016-08-24 | Surface defect inspecting device and method for steel sheets |
MX2018010422A MX367708B (es) | 2016-03-30 | 2016-08-24 | Dispositivo y metodo de inspeccion de defectos superficiales para laminas de acero. |
CN201680014977.6A CN107533013B (zh) | 2016-03-30 | 2016-08-24 | 钢板的表面缺陷检查装置及表面缺陷检查方法 |
TW105128630A TWI621850B (zh) | 2016-03-30 | 2016-09-05 | 鋼板的表面缺陷檢查裝置及表面缺陷檢查方法 |
US16/123,141 US10267747B2 (en) | 2016-03-30 | 2018-09-06 | Surface defect inspecting device and method for steel sheets |
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JP2016067003A JP6117398B1 (ja) | 2016-03-30 | 2016-03-30 | 鋼板の表面欠陥検査装置および表面欠陥検査方法 |
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EP (1) | EP3364173A4 (ja) |
JP (1) | JP6117398B1 (ja) |
KR (1) | KR101867256B1 (ja) |
CN (1) | CN107533013B (ja) |
BR (1) | BR112018069911A2 (ja) |
MX (1) | MX367708B (ja) |
MY (1) | MY181779A (ja) |
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JP7067321B2 (ja) * | 2018-06-29 | 2022-05-16 | オムロン株式会社 | 検査結果提示装置、検査結果提示方法及び検査結果提示プログラム |
CN109909308B (zh) * | 2019-03-15 | 2020-06-05 | 本钢板材股份有限公司 | 一种冷轧带钢纵向条纹缺陷检测方法 |
GB201906037D0 (en) | 2019-04-30 | 2019-06-12 | Univ Sheffield | Non-destructive detection of surface and near surface abnormalities in a metallic product |
CN110118784A (zh) * | 2019-06-20 | 2019-08-13 | 山西大数据产业发展有限公司 | 基于机器视觉的钢卷表面质量缺陷检测系统 |
DE102019210727A1 (de) * | 2019-07-19 | 2021-01-21 | Thyssenkrupp Steel Europe Ag | Verfahren zum Bestimmen eines Reinigungszustands einer Oberfläche eines Flachprodukts und Flachprodukt |
CN112394063A (zh) * | 2019-08-16 | 2021-02-23 | 研祥智能科技股份有限公司 | Led支架缺陷的检测方法、取像装置及检测设备 |
JP7343781B2 (ja) | 2020-01-22 | 2023-09-13 | 日本製鉄株式会社 | 金属板の表面欠陥検査装置 |
KR20210100992A (ko) | 2020-02-07 | 2021-08-18 | 광주과학기술원 | 금형 표면검사장치를 이용한 표면검사방법 |
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JP2015200603A (ja) * | 2014-04-09 | 2015-11-12 | Jfeスチール株式会社 | 表面欠陥検査装置および表面欠陥検査方法 |
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