BR112018069911A2 - dispositivo de inspeção de defeito de superfície e método para lâminas de aço - Google Patents

dispositivo de inspeção de defeito de superfície e método para lâminas de aço

Info

Publication number
BR112018069911A2
BR112018069911A2 BR112018069911A BR112018069911A BR112018069911A2 BR 112018069911 A2 BR112018069911 A2 BR 112018069911A2 BR 112018069911 A BR112018069911 A BR 112018069911A BR 112018069911 A BR112018069911 A BR 112018069911A BR 112018069911 A2 BR112018069911 A2 BR 112018069911A2
Authority
BR
Brazil
Prior art keywords
image
reflection light
diffused
image signal
reflection
Prior art date
Application number
BR112018069911A
Other languages
English (en)
Inventor
Fukui Keita
SHIGA Syunsuke
Original Assignee
Nisshin Steel Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nisshin Steel Co Ltd filed Critical Nisshin Steel Co Ltd
Publication of BR112018069911A2 publication Critical patent/BR112018069911A2/pt

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/204—Structure thereof, e.g. crystal structure
    • G01N33/2045—Defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8921—Streaks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/888—Marking defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)

Abstract

a presente invenção detecta e distingue uma anormalidade de aparência nociva de uma mancha de óleo, tira de recozimento ou similares como uma anormalidade de aparência inofensiva em uma folha de aço como um objeto de inspeção em que plaqueamento ou outro tratamento de superfície não é realizado em uma superfície da mesma. a presente invenção é fornecida de uma unidade de iluminação 3 para iluminar uma região de objeto de imageamento 8, uma primeira unidade de imageamento de luz de reflexão difusa 4 para capturar uma imagem de luz de reflexão difusa em uma direção na qual o ângulo da mesma com uma direção de reflexão regular é um primeiro ângulo ?, uma segunda unidade de imageamento de luz de reflexão difusa 5 para capturar uma imagem de luz de reflexão difusa em uma direção na qual o ângulo da mesma com a direção de reflexão regular é um segundo ângulo d (em que d > ?), e uma unidade de processamento de sinal de imagem 6 para processar um sinal de imagem de primeira reflexão difusa t1 obtido por captura de imagem pela primeira unidade de imageamento de luz de reflexão difusa 4 e um sinal de imagem de segunda reflexão difusa t2 obtido por captura de imagem pela segunda unidade de imageamento de luz de reflexão difusa 5. a unidade de processamento de sinal de imagem 6 detecta como uma região de defeito de superfície uma região que tem uma luminância menor do que um primeiro valor limítrofe predeterminado no sinal de imagem de primeira reflexão difusa t1, sendo que o sinal de imagem de segunda reflexão difusa t2 tem uma luminância maior do que um segundo valor limítrofe predeterminado para a região.
BR112018069911A 2016-03-30 2016-08-24 dispositivo de inspeção de defeito de superfície e método para lâminas de aço BR112018069911A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016067003A JP6117398B1 (ja) 2016-03-30 2016-03-30 鋼板の表面欠陥検査装置および表面欠陥検査方法
PCT/JP2016/074638 WO2017168780A1 (ja) 2016-03-30 2016-08-24 鋼板の表面欠陥検査装置および表面欠陥検査方法

Publications (1)

Publication Number Publication Date
BR112018069911A2 true BR112018069911A2 (pt) 2019-02-05

Family

ID=58667220

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112018069911A BR112018069911A2 (pt) 2016-03-30 2016-08-24 dispositivo de inspeção de defeito de superfície e método para lâminas de aço

Country Status (10)

Country Link
US (1) US10267747B2 (pt)
EP (1) EP3364173A4 (pt)
JP (1) JP6117398B1 (pt)
KR (1) KR101867256B1 (pt)
CN (1) CN107533013B (pt)
BR (1) BR112018069911A2 (pt)
MX (1) MX367708B (pt)
MY (1) MY181779A (pt)
TW (1) TWI621850B (pt)
WO (1) WO2017168780A1 (pt)

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JP7343781B2 (ja) * 2020-01-22 2023-09-13 日本製鉄株式会社 金属板の表面欠陥検査装置
KR20210100992A (ko) 2020-02-07 2021-08-18 광주과학기술원 금형 표면검사장치를 이용한 표면검사방법
JP6808888B1 (ja) * 2020-11-05 2021-01-06 Ｐｒｉｍｅｔａｌｓ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｊａｐａｎ株式会社 不良判断装置および不良判断方法
KR20240071141A (ko) 2022-11-15 2024-05-22 광주과학기술원 사상공정 측정 시스템

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Also Published As

Publication number Publication date
MX2018010422A (es) 2018-11-09
US20190003987A1 (en) 2019-01-03
TW201734437A (zh) 2017-10-01
EP3364173A4 (en) 2018-12-05
MX367708B (es) 2019-09-03
KR101867256B1 (ko) 2018-06-12
TWI621850B (zh) 2018-04-21
KR20170137222A (ko) 2017-12-12
MY181779A (en) 2021-01-06
WO2017168780A1 (ja) 2017-10-05
JP6117398B1 (ja) 2017-04-19
EP3364173A1 (en) 2018-08-22
CN107533013B (zh) 2018-11-27
US10267747B2 (en) 2019-04-23
JP2017181222A (ja) 2017-10-05
CN107533013A (zh) 2018-01-02

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B11B Dismissal acc. art. 36, par 1 of ipl - no reply within 90 days to fullfil the necessary requirements
B350 Update of information on the portal [chapter 15.35 patent gazette]