TWI735699B - 脆性材料基板之分斷方法及分斷裝置 - Google Patents
脆性材料基板之分斷方法及分斷裝置 Download PDFInfo
- Publication number
- TWI735699B TWI735699B TW106138639A TW106138639A TWI735699B TW I735699 B TWI735699 B TW I735699B TW 106138639 A TW106138639 A TW 106138639A TW 106138639 A TW106138639 A TW 106138639A TW I735699 B TWI735699 B TW I735699B
- Authority
- TW
- Taiwan
- Prior art keywords
- brittle material
- material substrate
- breaking
- support plate
- elastic support
- Prior art date
Links
Images
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
- B28D5/0011—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing with preliminary treatment, e.g. weakening by scoring
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
- B28D5/0041—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing the workpiece being brought into contact with a suitably shaped rigid body which remains stationary during breaking
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
- B28D5/0052—Means for supporting or holding work during breaking
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0064—Devices for the automatic drive or the program control of the machines
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
- Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
- Dicing (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016231163A JP7020660B2 (ja) | 2016-11-29 | 2016-11-29 | 脆性材料基板の分断方法及び分断装置 |
JPJP2016-231163 | 2016-11-29 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201820440A TW201820440A (zh) | 2018-06-01 |
TWI735699B true TWI735699B (zh) | 2021-08-11 |
Family
ID=62228620
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW106138639A TWI735699B (zh) | 2016-11-29 | 2017-11-08 | 脆性材料基板之分斷方法及分斷裝置 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP7020660B2 (ja) |
KR (1) | KR102451845B1 (ja) |
CN (1) | CN108115853B (ja) |
SG (1) | SG10201709740TA (ja) |
TW (1) | TWI735699B (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112331589B (zh) * | 2020-10-26 | 2023-08-22 | 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) | 一种辊压单元、划槽晶圆分离装置及划槽晶圆分离方法 |
JP2022180079A (ja) * | 2021-05-24 | 2022-12-06 | 株式会社ディスコ | 基板の分離方法 |
CN114226996B (zh) * | 2021-12-09 | 2024-05-24 | 深圳泰德激光技术股份有限公司 | 宝石的切割方法及装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9310427B2 (en) * | 2013-07-24 | 2016-04-12 | Advantest Corporation | High speed tester communication interface between test slice and trays |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05217969A (ja) * | 1992-01-31 | 1993-08-27 | Oki Electric Ind Co Ltd | 半導体発光素子のウエハ劈開方法 |
JP2000124537A (ja) * | 1998-10-21 | 2000-04-28 | Sharp Corp | 半導体レーザチップの製造方法とその方法に用いられる製造装置 |
JP2001257180A (ja) | 2000-03-10 | 2001-09-21 | Sony Corp | 材料基板のへき開方法及びへき開装置 |
KR20040022926A (ko) * | 2002-09-10 | 2004-03-18 | 삼성전자주식회사 | 박형 웨이퍼용 테이프 부착 장치 |
JP4705418B2 (ja) | 2005-06-29 | 2011-06-22 | 株式会社ディスコ | ウェーハの加工方法 |
JP2008066684A (ja) * | 2006-09-08 | 2008-03-21 | Takatori Corp | ダイシングフレームへの基板のマウント装置 |
JP2009054624A (ja) | 2007-08-23 | 2009-03-12 | Nec Electronics Corp | ウェーハ補助シート、半導体ウェーハのブレーキング装置及びブレーキング方法 |
JP2010029930A (ja) * | 2008-07-31 | 2010-02-12 | Disco Abrasive Syst Ltd | レーザ加工装置及びレーザ加工方法 |
JP5431053B2 (ja) | 2009-07-27 | 2014-03-05 | 日東電工株式会社 | 粘着テープ貼付け方法および粘着テープ貼付け装置 |
JP2012209635A (ja) * | 2011-03-29 | 2012-10-25 | Seiko Instruments Inc | 接合ガラスの切断方法、パッケージの製造方法、パッケージ、圧電振動子、発振器、電子機器及び電波時計 |
JP5824231B2 (ja) * | 2011-04-11 | 2015-11-25 | シャープ株式会社 | ブレーキング装置 |
JP5912283B2 (ja) * | 2011-04-20 | 2016-04-27 | 株式会社ディスコ | 粘着テープ及びウエーハの加工方法 |
JP2013197149A (ja) * | 2012-03-16 | 2013-09-30 | Kansai Seiki Kogyo Kk | テープ貼付装置およびテープ貼付方法 |
JP2014031293A (ja) * | 2012-08-03 | 2014-02-20 | Mitsuboshi Diamond Industrial Co Ltd | 脆性材料基板のスクライブ方法 |
JP6039363B2 (ja) * | 2012-10-26 | 2016-12-07 | 三星ダイヤモンド工業株式会社 | 脆性材料基板の分断方法並びに分断装置 |
CN104347354A (zh) * | 2013-08-07 | 2015-02-11 | 日东电工株式会社 | 粘合带粘贴方法及粘合带粘贴装置 |
JP6650663B2 (ja) * | 2014-03-28 | 2020-02-19 | 三星ダイヤモンド工業株式会社 | 樹脂シートの分断方法及び分断装置 |
JP6481465B2 (ja) * | 2014-08-21 | 2019-03-13 | 三星ダイヤモンド工業株式会社 | 複合基板のブレイク方法 |
JP6428113B2 (ja) * | 2014-09-30 | 2018-11-28 | 三星ダイヤモンド工業株式会社 | パターニング基板のブレイク方法並びにブレイク装置 |
KR101623026B1 (ko) * | 2014-10-06 | 2016-05-20 | 한국미쯔보시다이아몬드공업(주) | 접합 기판의 커팅 방법 |
-
2016
- 2016-11-29 JP JP2016231163A patent/JP7020660B2/ja active Active
-
2017
- 2017-11-08 TW TW106138639A patent/TWI735699B/zh active
- 2017-11-24 SG SG10201709740TA patent/SG10201709740TA/en unknown
- 2017-11-27 KR KR1020170159226A patent/KR102451845B1/ko active IP Right Grant
- 2017-11-27 CN CN201711206172.4A patent/CN108115853B/zh active Active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9310427B2 (en) * | 2013-07-24 | 2016-04-12 | Advantest Corporation | High speed tester communication interface between test slice and trays |
Also Published As
Publication number | Publication date |
---|---|
TW201820440A (zh) | 2018-06-01 |
KR20180061024A (ko) | 2018-06-07 |
KR102451845B1 (ko) | 2022-10-07 |
JP2018086784A (ja) | 2018-06-07 |
JP7020660B2 (ja) | 2022-02-16 |
SG10201709740TA (en) | 2018-06-28 |
CN108115853A (zh) | 2018-06-05 |
CN108115853B (zh) | 2021-05-04 |
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