TWI683130B - 使用亮視野暗視野物鏡的獨特斜射照明技術及與該技術有關的成像方法 - Google Patents

使用亮視野暗視野物鏡的獨特斜射照明技術及與該技術有關的成像方法 Download PDF

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TWI683130B
TWI683130B TW107123342A TW107123342A TWI683130B TW I683130 B TWI683130 B TW I683130B TW 107123342 A TW107123342 A TW 107123342A TW 107123342 A TW107123342 A TW 107123342A TW I683130 B TWI683130 B TW I683130B
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light
dark field
arc
sample
opening
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TW107123342A
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TW201908805A (zh
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馬修 普特曼
約翰 普特曼
茱莉 奧蘭多
約瑟夫 包曼
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美商奈米創尼克影像公司
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/082—Condensers for incident illumination only
    • G02B21/084—Condensers for incident illumination only having annular illumination around the objective
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/12—Condensers affording bright-field illumination
    • G02B21/125—Condensers affording bright-field illumination affording both dark- and bright-field illumination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/005—Diaphragms

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
TW107123342A 2014-10-14 2015-10-14 使用亮視野暗視野物鏡的獨特斜射照明技術及與該技術有關的成像方法 TWI683130B (zh)

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US201462063564P 2014-10-14 2014-10-14
US62/063,564 2014-10-14

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TW201908805A TW201908805A (zh) 2019-03-01
TWI683130B true TWI683130B (zh) 2020-01-21

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TW107123342A TWI683130B (zh) 2014-10-14 2015-10-14 使用亮視野暗視野物鏡的獨特斜射照明技術及與該技術有關的成像方法
TW104133705A TWI636281B (zh) 2014-10-14 2015-10-14 使用亮視野暗視野物鏡的獨特斜射照明技術及與該技術有關的成像方法

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US (4) US10437034B2 (enExample)
EP (2) EP4030201B1 (enExample)
JP (2) JP6596492B2 (enExample)
KR (1) KR102058453B1 (enExample)
CN (1) CN107250872B (enExample)
TW (2) TWI683130B (enExample)
WO (1) WO2016061070A1 (enExample)

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CN109884082B (zh) * 2019-03-27 2020-04-03 爱丁堡（南京）光电设备有限公司 一种光滑表面缺陷的检测方法
CN110609039B (zh) * 2019-09-23 2021-09-28 上海御微半导体技术有限公司 一种光学检测装置及其方法
CN110926429A (zh) * 2019-12-23 2020-03-27 中芯长电半导体（江阴）有限公司 一种光源识别设备
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KR102315010B1 (ko) * 2020-02-19 2021-10-21 한국표준과학연구원 파라볼릭 미러를 이용한 반사형 ｆｐｍ
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US11689821B2 (en) * 2020-08-07 2023-06-27 The Government Of The United States Of America, As Represented By The Secretary Of The Navy Incoherent Fourier ptychographic super-resolution imaging system with priors
CN113092415A (zh) * 2021-03-09 2021-07-09 中国科学院苏州生物医学工程技术研究所 用于无标记生物样品的相衬成像装置
KR102786752B1 (ko) * 2022-09-29 2025-03-28 한국표준과학연구원 Ｄｕｖ 반사형 ｆｐｍ
CN116990320B (zh) * 2023-09-27 2023-12-19 江西驰宇光电科技发展有限公司 一种用于疵病检测的暗场成像方法及装置

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WO2016061070A1 (en) 2016-04-21
US10437034B2 (en) 2019-10-08
US20210208377A1 (en) 2021-07-08
KR102058453B1 (ko) 2019-12-23
US20200026053A1 (en) 2020-01-23
US10955651B2 (en) 2021-03-23
US11846765B2 (en) 2023-12-19
US11561383B2 (en) 2023-01-24
JP2017532561A (ja) 2017-11-02
CN107250872A (zh) 2017-10-13
CN107250872B (zh) 2020-09-08
EP3207409B1 (en) 2022-04-13
EP4030201B1 (en) 2024-12-04
EP3207409A1 (en) 2017-08-23
TWI636281B (zh) 2018-09-21
JP2020079927A (ja) 2020-05-28
US20170235117A1 (en) 2017-08-17
TW201617681A (zh) 2016-05-16
TW201908805A (zh) 2019-03-01
JP6596492B2 (ja) 2019-10-23
EP4030201A1 (en) 2022-07-20
KR20170091089A (ko) 2017-08-08
US20230161144A1 (en) 2023-05-25
JP7072892B2 (ja) 2022-05-23

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