TWI681197B - 溫度補償電路以及感測裝置 - Google Patents

溫度補償電路以及感測裝置 Download PDF

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Publication number
TWI681197B
TWI681197B TW105115241A TW105115241A TWI681197B TW I681197 B TWI681197 B TW I681197B TW 105115241 A TW105115241 A TW 105115241A TW 105115241 A TW105115241 A TW 105115241A TW I681197 B TWI681197 B TW I681197B
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TW
Taiwan
Prior art keywords
resistor
temperature compensation
temperature
resistance
terminal
Prior art date
Application number
TW105115241A
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English (en)
Chinese (zh)
Other versions
TW201643442A (zh
Inventor
有山稔
Original Assignee
日商艾普凌科有限公司
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Publication date
Application filed by 日商艾普凌科有限公司 filed Critical 日商艾普凌科有限公司
Publication of TW201643442A publication Critical patent/TW201643442A/zh
Application granted granted Critical
Publication of TWI681197B publication Critical patent/TWI681197B/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current 
    • G05F1/46—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC
    • G05F1/56—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices
    • G05F1/565—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
    • G05F1/567—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for temperature compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/007—Environmental aspects, e.g. temperature variations, radiation, stray fields
    • G01R33/0082—Compensation, e.g. compensating for temperature changes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/14—Modifications for compensating variations of physical values, e.g. of temperature

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Measuring Magnetic Variables (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Semiconductor Integrated Circuits (AREA)
TW105115241A 2015-06-02 2016-05-18 溫度補償電路以及感測裝置 TWI681197B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015-112309 2015-06-02
JP2015112309A JP6511336B2 (ja) 2015-06-02 2015-06-02 温度補償回路およびセンサ装置

Publications (2)

Publication Number Publication Date
TW201643442A TW201643442A (zh) 2016-12-16
TWI681197B true TWI681197B (zh) 2020-01-01

Family

ID=56684426

Family Applications (1)

Application Number Title Priority Date Filing Date
TW105115241A TWI681197B (zh) 2015-06-02 2016-05-18 溫度補償電路以及感測裝置

Country Status (6)

Country Link
US (1) US10088532B2 (enExample)
EP (1) EP3101440B1 (enExample)
JP (1) JP6511336B2 (enExample)
KR (1) KR20160142240A (enExample)
CN (1) CN106227285B (enExample)
TW (1) TWI681197B (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6994843B2 (ja) * 2017-04-28 2022-01-14 エイブリック株式会社 磁気センサ回路
IT201700071189A1 (it) 2017-06-26 2018-12-26 St Microelectronics Srl Circuito di compensazione in temperatura, dispositivo e procedimento corrispondenti
EP3467522B1 (en) * 2017-10-06 2023-02-22 STMicroelectronics S.r.l. A temperature compensation circuit, corresponding device and method
EP3644080B1 (en) * 2018-10-23 2022-08-03 Melexis Bulgaria Ltd. Sensor circuit with offset compensation
DE102020212114A1 (de) * 2020-09-11 2022-03-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung eingetragener Verein Verfahren zum Bestimmen einer Empfindlichkeit eines Hallsensorelements und Hallsensor mit zumindest einem Hallsensorelement
CN113411074B (zh) * 2021-07-13 2022-11-15 上海艾为电子技术股份有限公司 霍尔传感器开关及电子设备
TWI789192B (zh) * 2021-12-29 2023-01-01 新唐科技股份有限公司 裸晶測試系統及其測試方法
US20230216449A1 (en) * 2022-01-03 2023-07-06 Skyworks Solutions, Inc. Methods for generating a constant current
US12411049B2 (en) * 2022-07-15 2025-09-09 Qorvo Us, Inc. Temperature coefficient of offset compensation for resistance bridge

Citations (2)

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Publication number Priority date Publication date Assignee Title
US4143549A (en) * 1978-01-27 1979-03-13 The United States Of America As Represented By The Secretary Of The Navy Temperature measuring system
US20080088268A1 (en) * 2004-09-24 2008-04-17 Rohm Co., Ltd. Fan Motor Drive Device and Cooler

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JPS5453877A (en) * 1977-10-07 1979-04-27 Hitachi Ltd Temperature compensation circuit of semiconductor strain gauge
DE2940315C2 (de) * 1978-10-10 1982-11-04 Nippondenso Co., Ltd., Kariya, Aichi Einrichtung zum Ermitteln des Drehwinkels eines Drehkörpers
JPS56140203A (en) * 1980-04-02 1981-11-02 Toyota Central Res & Dev Lab Inc Bridge circuit
US4363243A (en) * 1981-05-01 1982-12-14 Eaton Corporation Strain gage measurement circuit for high temperature applications using dual constant current supplies
JPS5896202U (ja) * 1981-12-23 1983-06-30 株式会社石田衡器製作所 歪みゲ−ジの温度補償回路
US4587499A (en) * 1982-06-07 1986-05-06 Toyo Communication Equipment Co., Ltd. Temperature compensating circuit for oscillator
JPH0717029Y2 (ja) * 1988-07-29 1995-04-19 横河電機株式会社 磁場検出回路
US5121064A (en) * 1990-08-31 1992-06-09 Allied-Signal, Inc. Method and apparatus for calibrating resistance bridge-type transducers
US5187985A (en) * 1991-09-19 1993-02-23 Honeywell Inc. Amplified pressure transducer
US5253532A (en) * 1992-03-09 1993-10-19 Timex Corporation Temperature compensated pressure transducer with digital output for low voltage power supply
US5402064A (en) * 1992-09-02 1995-03-28 Santa Barbara Research Center Magnetoresistive sensor circuit with high output voltage swing and temperature compensation
US5953173A (en) * 1996-09-17 1999-09-14 International Business Machines Corporation High CMRR and sensor-disk short-circuit protection device for dual element magnetoresistive heads
KR100314438B1 (ko) * 1998-10-31 2002-04-24 구자홍 써모파일센서를이용한온도측정회로
JP2002148131A (ja) * 2000-11-10 2002-05-22 Denso Corp 物理量検出装置
JP4236402B2 (ja) * 2001-10-09 2009-03-11 富士通マイクロエレクトロニクス株式会社 半導体装置
JP2006121891A (ja) * 2004-09-24 2006-05-11 Rohm Co Ltd ファンモータ駆動装置および冷却装置
SG139588A1 (en) 2006-07-28 2008-02-29 St Microelectronics Asia Addressable led architecure
JP5363075B2 (ja) * 2008-11-13 2013-12-11 セイコーインスツル株式会社 センサ回路
JP5363074B2 (ja) 2008-11-13 2013-12-11 セイコーインスツル株式会社 センサ回路
CN101594140A (zh) * 2009-06-18 2009-12-02 浙江大学 一种薄膜体声波振荡器的温度漂移补偿方法和电路
CN101706345A (zh) * 2009-10-30 2010-05-12 江苏大学 一种用于微型压力传感器灵敏度热漂移的补偿方法
JP6049488B2 (ja) * 2013-02-14 2016-12-21 エスアイアイ・セミコンダクタ株式会社 センサ回路
WO2014189733A1 (en) * 2013-05-24 2014-11-27 Allegro Microsystems, Llc Magnetic field sensor for detecting a magnetic field in any direction above thresholds
CN104579172B (zh) * 2014-11-28 2017-06-06 上海华虹宏力半导体制造有限公司 具有温度系数补偿的电阻电路

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4143549A (en) * 1978-01-27 1979-03-13 The United States Of America As Represented By The Secretary Of The Navy Temperature measuring system
US20080088268A1 (en) * 2004-09-24 2008-04-17 Rohm Co., Ltd. Fan Motor Drive Device and Cooler

Also Published As

Publication number Publication date
KR20160142240A (ko) 2016-12-12
EP3101440B1 (en) 2018-08-01
JP6511336B2 (ja) 2019-05-15
CN106227285A (zh) 2016-12-14
JP2016223974A (ja) 2016-12-28
CN106227285B (zh) 2019-08-16
US10088532B2 (en) 2018-10-02
US20160356862A1 (en) 2016-12-08
EP3101440A1 (en) 2016-12-07
TW201643442A (zh) 2016-12-16

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