KR20160142240A - 온도 보상 회로 및 센서 장치 - Google Patents

온도 보상 회로 및 센서 장치 Download PDF

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Publication number
KR20160142240A
KR20160142240A KR1020160067941A KR20160067941A KR20160142240A KR 20160142240 A KR20160142240 A KR 20160142240A KR 1020160067941 A KR1020160067941 A KR 1020160067941A KR 20160067941 A KR20160067941 A KR 20160067941A KR 20160142240 A KR20160142240 A KR 20160142240A
Authority
KR
South Korea
Prior art keywords
resistor
temperature
temperature compensation
quot
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020160067941A
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English (en)
Korean (ko)
Inventor
미노루 아리야마
Original Assignee
에스아이아이 세미컨덕터 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 에스아이아이 세미컨덕터 가부시키가이샤 filed Critical 에스아이아이 세미컨덕터 가부시키가이샤
Publication of KR20160142240A publication Critical patent/KR20160142240A/ko
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current 
    • G05F1/46—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC
    • G05F1/56—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices
    • G05F1/565—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
    • G05F1/567—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for temperature compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/007—Environmental aspects, e.g. temperature variations, radiation, stray fields
    • G01R33/0082—Compensation, e.g. compensating for temperature changes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/14—Modifications for compensating variations of physical values, e.g. of temperature

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Measuring Magnetic Variables (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Semiconductor Integrated Circuits (AREA)
KR1020160067941A 2015-06-02 2016-06-01 온도 보상 회로 및 센서 장치 Withdrawn KR20160142240A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2015-112309 2015-06-02
JP2015112309A JP6511336B2 (ja) 2015-06-02 2015-06-02 温度補償回路およびセンサ装置

Publications (1)

Publication Number Publication Date
KR20160142240A true KR20160142240A (ko) 2016-12-12

Family

ID=56684426

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020160067941A Withdrawn KR20160142240A (ko) 2015-06-02 2016-06-01 온도 보상 회로 및 센서 장치

Country Status (6)

Country Link
US (1) US10088532B2 (enExample)
EP (1) EP3101440B1 (enExample)
JP (1) JP6511336B2 (enExample)
KR (1) KR20160142240A (enExample)
CN (1) CN106227285B (enExample)
TW (1) TWI681197B (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6994843B2 (ja) * 2017-04-28 2022-01-14 エイブリック株式会社 磁気センサ回路
IT201700071189A1 (it) 2017-06-26 2018-12-26 St Microelectronics Srl Circuito di compensazione in temperatura, dispositivo e procedimento corrispondenti
EP3467522B1 (en) * 2017-10-06 2023-02-22 STMicroelectronics S.r.l. A temperature compensation circuit, corresponding device and method
EP3644080B1 (en) * 2018-10-23 2022-08-03 Melexis Bulgaria Ltd. Sensor circuit with offset compensation
DE102020212114A1 (de) * 2020-09-11 2022-03-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung eingetragener Verein Verfahren zum Bestimmen einer Empfindlichkeit eines Hallsensorelements und Hallsensor mit zumindest einem Hallsensorelement
CN113411074B (zh) * 2021-07-13 2022-11-15 上海艾为电子技术股份有限公司 霍尔传感器开关及电子设备
TWI789192B (zh) * 2021-12-29 2023-01-01 新唐科技股份有限公司 裸晶測試系統及其測試方法
US20230216449A1 (en) * 2022-01-03 2023-07-06 Skyworks Solutions, Inc. Methods for generating a constant current
US12411049B2 (en) * 2022-07-15 2025-09-09 Qorvo Us, Inc. Temperature coefficient of offset compensation for resistance bridge

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010117270A (ja) 2008-11-13 2010-05-27 Seiko Instruments Inc センサ回路

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JPS5453877A (en) * 1977-10-07 1979-04-27 Hitachi Ltd Temperature compensation circuit of semiconductor strain gauge
US4143549A (en) * 1978-01-27 1979-03-13 The United States Of America As Represented By The Secretary Of The Navy Temperature measuring system
DE2940315C2 (de) * 1978-10-10 1982-11-04 Nippondenso Co., Ltd., Kariya, Aichi Einrichtung zum Ermitteln des Drehwinkels eines Drehkörpers
JPS56140203A (en) * 1980-04-02 1981-11-02 Toyota Central Res & Dev Lab Inc Bridge circuit
US4363243A (en) * 1981-05-01 1982-12-14 Eaton Corporation Strain gage measurement circuit for high temperature applications using dual constant current supplies
JPS5896202U (ja) * 1981-12-23 1983-06-30 株式会社石田衡器製作所 歪みゲ−ジの温度補償回路
US4587499A (en) * 1982-06-07 1986-05-06 Toyo Communication Equipment Co., Ltd. Temperature compensating circuit for oscillator
JPH0717029Y2 (ja) * 1988-07-29 1995-04-19 横河電機株式会社 磁場検出回路
US5121064A (en) * 1990-08-31 1992-06-09 Allied-Signal, Inc. Method and apparatus for calibrating resistance bridge-type transducers
US5187985A (en) * 1991-09-19 1993-02-23 Honeywell Inc. Amplified pressure transducer
US5253532A (en) * 1992-03-09 1993-10-19 Timex Corporation Temperature compensated pressure transducer with digital output for low voltage power supply
US5402064A (en) * 1992-09-02 1995-03-28 Santa Barbara Research Center Magnetoresistive sensor circuit with high output voltage swing and temperature compensation
US5953173A (en) * 1996-09-17 1999-09-14 International Business Machines Corporation High CMRR and sensor-disk short-circuit protection device for dual element magnetoresistive heads
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JP2006121891A (ja) * 2004-09-24 2006-05-11 Rohm Co Ltd ファンモータ駆動装置および冷却装置
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JP5363075B2 (ja) * 2008-11-13 2013-12-11 セイコーインスツル株式会社 センサ回路
CN101594140A (zh) * 2009-06-18 2009-12-02 浙江大学 一种薄膜体声波振荡器的温度漂移补偿方法和电路
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JP6049488B2 (ja) * 2013-02-14 2016-12-21 エスアイアイ・セミコンダクタ株式会社 センサ回路
WO2014189733A1 (en) * 2013-05-24 2014-11-27 Allegro Microsystems, Llc Magnetic field sensor for detecting a magnetic field in any direction above thresholds
CN104579172B (zh) * 2014-11-28 2017-06-06 上海华虹宏力半导体制造有限公司 具有温度系数补偿的电阻电路

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JP2010117270A (ja) 2008-11-13 2010-05-27 Seiko Instruments Inc センサ回路

Also Published As

Publication number Publication date
EP3101440B1 (en) 2018-08-01
JP6511336B2 (ja) 2019-05-15
TWI681197B (zh) 2020-01-01
CN106227285A (zh) 2016-12-14
JP2016223974A (ja) 2016-12-28
CN106227285B (zh) 2019-08-16
US10088532B2 (en) 2018-10-02
US20160356862A1 (en) 2016-12-08
EP3101440A1 (en) 2016-12-07
TW201643442A (zh) 2016-12-16

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PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 20160601

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination