JP6511336B2 - 温度補償回路およびセンサ装置 - Google Patents

温度補償回路およびセンサ装置 Download PDF

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Publication number
JP6511336B2
JP6511336B2 JP2015112309A JP2015112309A JP6511336B2 JP 6511336 B2 JP6511336 B2 JP 6511336B2 JP 2015112309 A JP2015112309 A JP 2015112309A JP 2015112309 A JP2015112309 A JP 2015112309A JP 6511336 B2 JP6511336 B2 JP 6511336B2
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Japan
Prior art keywords
resistor
temperature
terminal
temperature compensation
voltage
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JP2015112309A
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English (en)
Japanese (ja)
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JP2016223974A5 (enExample
JP2016223974A (ja
Inventor
稔 有山
稔 有山
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Ablic Inc
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Ablic Inc
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Publication date
Application filed by Ablic Inc filed Critical Ablic Inc
Priority to JP2015112309A priority Critical patent/JP6511336B2/ja
Priority to TW105115241A priority patent/TWI681197B/zh
Priority to US15/165,445 priority patent/US10088532B2/en
Priority to KR1020160067941A priority patent/KR20160142240A/ko
Priority to EP16172517.1A priority patent/EP3101440B1/en
Priority to CN201610384549.4A priority patent/CN106227285B/zh
Publication of JP2016223974A publication Critical patent/JP2016223974A/ja
Publication of JP2016223974A5 publication Critical patent/JP2016223974A5/ja
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current 
    • G05F1/46—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC
    • G05F1/56—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices
    • G05F1/565—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
    • G05F1/567—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for temperature compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/007—Environmental aspects, e.g. temperature variations, radiation, stray fields
    • G01R33/0082—Compensation, e.g. compensating for temperature changes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/14—Modifications for compensating variations of physical values, e.g. of temperature

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Measuring Magnetic Variables (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP2015112309A 2015-06-02 2015-06-02 温度補償回路およびセンサ装置 Active JP6511336B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2015112309A JP6511336B2 (ja) 2015-06-02 2015-06-02 温度補償回路およびセンサ装置
TW105115241A TWI681197B (zh) 2015-06-02 2016-05-18 溫度補償電路以及感測裝置
US15/165,445 US10088532B2 (en) 2015-06-02 2016-05-26 Temperature compensation circuit and sensor device
EP16172517.1A EP3101440B1 (en) 2015-06-02 2016-06-01 Temperature compensation circuit and sensor device
KR1020160067941A KR20160142240A (ko) 2015-06-02 2016-06-01 온도 보상 회로 및 센서 장치
CN201610384549.4A CN106227285B (zh) 2015-06-02 2016-06-02 温度补偿电路及传感器装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015112309A JP6511336B2 (ja) 2015-06-02 2015-06-02 温度補償回路およびセンサ装置

Publications (3)

Publication Number Publication Date
JP2016223974A JP2016223974A (ja) 2016-12-28
JP2016223974A5 JP2016223974A5 (enExample) 2018-06-21
JP6511336B2 true JP6511336B2 (ja) 2019-05-15

Family

ID=56684426

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015112309A Active JP6511336B2 (ja) 2015-06-02 2015-06-02 温度補償回路およびセンサ装置

Country Status (6)

Country Link
US (1) US10088532B2 (enExample)
EP (1) EP3101440B1 (enExample)
JP (1) JP6511336B2 (enExample)
KR (1) KR20160142240A (enExample)
CN (1) CN106227285B (enExample)
TW (1) TWI681197B (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6994843B2 (ja) * 2017-04-28 2022-01-14 エイブリック株式会社 磁気センサ回路
IT201700071189A1 (it) 2017-06-26 2018-12-26 St Microelectronics Srl Circuito di compensazione in temperatura, dispositivo e procedimento corrispondenti
EP3467522B1 (en) * 2017-10-06 2023-02-22 STMicroelectronics S.r.l. A temperature compensation circuit, corresponding device and method
EP3644080B1 (en) * 2018-10-23 2022-08-03 Melexis Bulgaria Ltd. Sensor circuit with offset compensation
DE102020212114A1 (de) * 2020-09-11 2022-03-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung eingetragener Verein Verfahren zum Bestimmen einer Empfindlichkeit eines Hallsensorelements und Hallsensor mit zumindest einem Hallsensorelement
CN113411074B (zh) * 2021-07-13 2022-11-15 上海艾为电子技术股份有限公司 霍尔传感器开关及电子设备
TWI789192B (zh) * 2021-12-29 2023-01-01 新唐科技股份有限公司 裸晶測試系統及其測試方法
US20230216449A1 (en) * 2022-01-03 2023-07-06 Skyworks Solutions, Inc. Methods for generating a constant current
US12411049B2 (en) * 2022-07-15 2025-09-09 Qorvo Us, Inc. Temperature coefficient of offset compensation for resistance bridge

Family Cites Families (26)

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Publication number Priority date Publication date Assignee Title
JPS5453877A (en) * 1977-10-07 1979-04-27 Hitachi Ltd Temperature compensation circuit of semiconductor strain gauge
US4143549A (en) * 1978-01-27 1979-03-13 The United States Of America As Represented By The Secretary Of The Navy Temperature measuring system
DE2940315C2 (de) * 1978-10-10 1982-11-04 Nippondenso Co., Ltd., Kariya, Aichi Einrichtung zum Ermitteln des Drehwinkels eines Drehkörpers
JPS56140203A (en) * 1980-04-02 1981-11-02 Toyota Central Res & Dev Lab Inc Bridge circuit
US4363243A (en) * 1981-05-01 1982-12-14 Eaton Corporation Strain gage measurement circuit for high temperature applications using dual constant current supplies
JPS5896202U (ja) * 1981-12-23 1983-06-30 株式会社石田衡器製作所 歪みゲ−ジの温度補償回路
US4587499A (en) * 1982-06-07 1986-05-06 Toyo Communication Equipment Co., Ltd. Temperature compensating circuit for oscillator
JPH0717029Y2 (ja) * 1988-07-29 1995-04-19 横河電機株式会社 磁場検出回路
US5121064A (en) * 1990-08-31 1992-06-09 Allied-Signal, Inc. Method and apparatus for calibrating resistance bridge-type transducers
US5187985A (en) * 1991-09-19 1993-02-23 Honeywell Inc. Amplified pressure transducer
US5253532A (en) * 1992-03-09 1993-10-19 Timex Corporation Temperature compensated pressure transducer with digital output for low voltage power supply
US5402064A (en) * 1992-09-02 1995-03-28 Santa Barbara Research Center Magnetoresistive sensor circuit with high output voltage swing and temperature compensation
US5953173A (en) * 1996-09-17 1999-09-14 International Business Machines Corporation High CMRR and sensor-disk short-circuit protection device for dual element magnetoresistive heads
KR100314438B1 (ko) * 1998-10-31 2002-04-24 구자홍 써모파일센서를이용한온도측정회로
JP2002148131A (ja) * 2000-11-10 2002-05-22 Denso Corp 物理量検出装置
JP4236402B2 (ja) * 2001-10-09 2009-03-11 富士通マイクロエレクトロニクス株式会社 半導体装置
WO2006033214A1 (ja) * 2004-09-24 2006-03-30 Rohm Co., Ltd ファンモータ駆動装置および冷却装置
JP2006121891A (ja) * 2004-09-24 2006-05-11 Rohm Co Ltd ファンモータ駆動装置および冷却装置
SG139588A1 (en) 2006-07-28 2008-02-29 St Microelectronics Asia Addressable led architecure
JP5363075B2 (ja) * 2008-11-13 2013-12-11 セイコーインスツル株式会社 センサ回路
JP5363074B2 (ja) 2008-11-13 2013-12-11 セイコーインスツル株式会社 センサ回路
CN101594140A (zh) * 2009-06-18 2009-12-02 浙江大学 一种薄膜体声波振荡器的温度漂移补偿方法和电路
CN101706345A (zh) * 2009-10-30 2010-05-12 江苏大学 一种用于微型压力传感器灵敏度热漂移的补偿方法
JP6049488B2 (ja) * 2013-02-14 2016-12-21 エスアイアイ・セミコンダクタ株式会社 センサ回路
WO2014189733A1 (en) * 2013-05-24 2014-11-27 Allegro Microsystems, Llc Magnetic field sensor for detecting a magnetic field in any direction above thresholds
CN104579172B (zh) * 2014-11-28 2017-06-06 上海华虹宏力半导体制造有限公司 具有温度系数补偿的电阻电路

Also Published As

Publication number Publication date
KR20160142240A (ko) 2016-12-12
EP3101440B1 (en) 2018-08-01
TWI681197B (zh) 2020-01-01
CN106227285A (zh) 2016-12-14
JP2016223974A (ja) 2016-12-28
CN106227285B (zh) 2019-08-16
US10088532B2 (en) 2018-10-02
US20160356862A1 (en) 2016-12-08
EP3101440A1 (en) 2016-12-07
TW201643442A (zh) 2016-12-16

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