TWI597127B - Workpiece grinding device - Google Patents
Workpiece grinding device Download PDFInfo
- Publication number
- TWI597127B TWI597127B TW103114539A TW103114539A TWI597127B TW I597127 B TWI597127 B TW I597127B TW 103114539 A TW103114539 A TW 103114539A TW 103114539 A TW103114539 A TW 103114539A TW I597127 B TWI597127 B TW I597127B
- Authority
- TW
- Taiwan
- Prior art keywords
- workpiece
- polishing
- template
- abrasive
- polishing cloth
- Prior art date
Links
- 238000005498 polishing Methods 0.000 claims description 183
- 239000004744 fabric Substances 0.000 claims description 84
- 238000003825 pressing Methods 0.000 claims description 40
- 239000000945 filler Substances 0.000 claims description 24
- 239000002759 woven fabric Substances 0.000 claims description 23
- 229920005989 resin Polymers 0.000 claims description 16
- 239000011347 resin Substances 0.000 claims description 16
- 230000007246 mechanism Effects 0.000 claims description 9
- 230000002093 peripheral effect Effects 0.000 description 38
- 235000012431 wafers Nutrition 0.000 description 25
- 239000006061 abrasive grain Substances 0.000 description 10
- 238000000034 method Methods 0.000 description 9
- 239000012530 fluid Substances 0.000 description 8
- 230000000052 comparative effect Effects 0.000 description 7
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 6
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 6
- 239000003795 chemical substances by application Substances 0.000 description 6
- 239000003822 epoxy resin Substances 0.000 description 6
- 229920000647 polyepoxide Polymers 0.000 description 6
- 238000005520 cutting process Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- 239000003365 glass fiber Substances 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- CETPSERCERDGAM-UHFFFAOYSA-N ceric oxide Chemical compound O=[Ce]=O CETPSERCERDGAM-UHFFFAOYSA-N 0.000 description 2
- 229910000420 cerium oxide Inorganic materials 0.000 description 2
- 229910000422 cerium(IV) oxide Inorganic materials 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 1
- 239000007767 bonding agent Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007865 diluting Methods 0.000 description 1
- 238000010790 dilution Methods 0.000 description 1
- 239000012895 dilution Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004049 embossing Methods 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000007517 polishing process Methods 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000009966 trimming Methods 0.000 description 1
- 238000009941 weaving Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
- B24B37/32—Retaining rings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02024—Mirror polishing
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013103719A JP5870960B2 (ja) | 2013-05-16 | 2013-05-16 | ワークの研磨装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201505762A TW201505762A (zh) | 2015-02-16 |
| TWI597127B true TWI597127B (zh) | 2017-09-01 |
Family
ID=51897996
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW103114539A TWI597127B (zh) | 2013-05-16 | 2014-04-22 | Workpiece grinding device |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US20160082567A1 (enExample) |
| JP (1) | JP5870960B2 (enExample) |
| KR (1) | KR102192288B1 (enExample) |
| CN (1) | CN105189045B (enExample) |
| DE (1) | DE112014002107T5 (enExample) |
| SG (1) | SG11201509094YA (enExample) |
| TW (1) | TWI597127B (enExample) |
| WO (1) | WO2014185003A1 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10341371B2 (en) * | 2016-08-31 | 2019-07-02 | Nicira, Inc. | Identifying and handling threats to data compute nodes in public cloud |
| JP6312229B1 (ja) * | 2017-06-12 | 2018-04-18 | 信越半導体株式会社 | 研磨方法及び研磨装置 |
| JP7139126B2 (ja) * | 2018-03-16 | 2022-09-20 | 富士紡ホールディングス株式会社 | 保持具及びその製造方法 |
| CN110394706A (zh) * | 2019-07-25 | 2019-11-01 | 西安奕斯伟硅片技术有限公司 | 一种硅片处理装置及方法 |
| CN111644977A (zh) * | 2020-07-17 | 2020-09-11 | 中国科学院微电子研究所 | 研磨用固定环以及研磨头 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5267418A (en) * | 1992-05-27 | 1993-12-07 | International Business Machines Corporation | Confined water fixture for holding wafers undergoing chemical-mechanical polishing |
| TW400567B (en) * | 1995-04-10 | 2000-08-01 | Matsushita Electric Industrial Co Ltd | The polishing device and its polishing method for the substrate |
| JP3615592B2 (ja) | 1995-07-11 | 2005-02-02 | 不二越機械工業株式会社 | 研磨装置 |
| JPH1190820A (ja) | 1997-09-12 | 1999-04-06 | Shin Etsu Handotai Co Ltd | ウエーハ研磨用テンプレートと該テンプレートを利用したウエーハ剥がし方法 |
| US6899610B2 (en) * | 2001-06-01 | 2005-05-31 | Raytech Innovative Solutions, Inc. | Retaining ring with wear pad for use in chemical mechanical planarization |
| US6893327B2 (en) * | 2001-06-04 | 2005-05-17 | Multi Planar Technologies, Inc. | Chemical mechanical polishing apparatus and method having a retaining ring with a contoured surface |
| JP2005169568A (ja) * | 2003-12-11 | 2005-06-30 | Mitsui Chemicals Inc | リテーナリング及びそれを用いた研磨装置 |
| US7086939B2 (en) * | 2004-03-19 | 2006-08-08 | Saint-Gobain Performance Plastics Corporation | Chemical mechanical polishing retaining ring with integral polymer backing |
| WO2006038259A1 (ja) * | 2004-09-30 | 2006-04-13 | Renesas Technology Corp. | 半導体装置の製造方法 |
| KR20070118277A (ko) * | 2005-04-12 | 2007-12-14 | 니혼 세이미츠 덴시 가부시키가이샤 | Ｃｍｐ 장치용 리테이너링과 그 제조방법 및 ｃｍｐ 장치 |
| JP2008543058A (ja) * | 2005-05-24 | 2008-11-27 | インテグリス・インコーポレーテッド | Ｃｍｐ保持リング |
| JP4534165B2 (ja) * | 2006-12-18 | 2010-09-01 | エルピーダメモリ株式会社 | 半導体装置の製造装置及び、半導体装置の製造方法 |
| JP5615589B2 (ja) * | 2010-05-07 | 2014-10-29 | 富士紡ホールディングス株式会社 | 枠材および枠材を有する保持具 |
| JP5683398B2 (ja) * | 2011-07-06 | 2015-03-11 | 株式会社クレハ | 研磨装置用ワークピース保持リング |
-
2013
- 2013-05-16 JP JP2013103719A patent/JP5870960B2/ja active Active
-
2014
- 2014-04-10 SG SG11201509094YA patent/SG11201509094YA/en unknown
- 2014-04-10 DE DE112014002107.5T patent/DE112014002107T5/de not_active Withdrawn
- 2014-04-10 US US14/787,659 patent/US20160082567A1/en not_active Abandoned
- 2014-04-10 WO PCT/JP2014/002066 patent/WO2014185003A1/ja not_active Ceased
- 2014-04-10 KR KR1020157032613A patent/KR102192288B1/ko active Active
- 2014-04-10 CN CN201480026546.2A patent/CN105189045B/zh active Active
- 2014-04-22 TW TW103114539A patent/TWI597127B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| US20160082567A1 (en) | 2016-03-24 |
| KR20160008550A (ko) | 2016-01-22 |
| KR102192288B1 (ko) | 2020-12-17 |
| JP5870960B2 (ja) | 2016-03-01 |
| CN105189045B (zh) | 2017-05-10 |
| SG11201509094YA (en) | 2015-12-30 |
| WO2014185003A1 (ja) | 2014-11-20 |
| DE112014002107T5 (de) | 2016-01-14 |
| TW201505762A (zh) | 2015-02-16 |
| CN105189045A (zh) | 2015-12-23 |
| JP2014223692A (ja) | 2014-12-04 |
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