TWI572864B - 可固定之探針及探針固定組件 - Google Patents

可固定之探針及探針固定組件 Download PDF

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Publication number
TWI572864B
TWI572864B TW105114517A TW105114517A TWI572864B TW I572864 B TWI572864 B TW I572864B TW 105114517 A TW105114517 A TW 105114517A TW 105114517 A TW105114517 A TW 105114517A TW I572864 B TWI572864 B TW I572864B
Authority
TW
Taiwan
Prior art keywords
probe
horizontal portion
insertion protrusion
horizontal
floating
Prior art date
Application number
TW105114517A
Other languages
English (en)
Chinese (zh)
Other versions
TW201631322A (zh
Inventor
Young Ho Kim
Keun Young Maeng
Hwang Sub Koo
Hyun Je Kim
Hee Seok Jung
Original Assignee
Gigalane Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gigalane Co Ltd filed Critical Gigalane Co Ltd
Publication of TW201631322A publication Critical patent/TW201631322A/zh
Application granted granted Critical
Publication of TWI572864B publication Critical patent/TWI572864B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Liquid Crystal (AREA)
  • Geometry (AREA)
TW105114517A 2015-05-18 2016-05-10 可固定之探針及探針固定組件 TWI572864B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020150068652A KR101558256B1 (ko) 2015-05-18 2015-05-18 고정 가능한 프로브 핀 및 프로브 핀 고정 어셈블리

Publications (2)

Publication Number Publication Date
TW201631322A TW201631322A (zh) 2016-09-01
TWI572864B true TWI572864B (zh) 2017-03-01

Family

ID=54347174

Family Applications (2)

Application Number Title Priority Date Filing Date
TW105114517A TWI572864B (zh) 2015-05-18 2016-05-10 可固定之探針及探針固定組件
TW106100662A TWI600908B (zh) 2015-05-18 2016-05-10 可固定之探針

Family Applications After (1)

Application Number Title Priority Date Filing Date
TW106100662A TWI600908B (zh) 2015-05-18 2016-05-10 可固定之探針

Country Status (4)

Country Link
JP (1) JP6055951B2 (ja)
KR (1) KR101558256B1 (ja)
CN (2) CN110531124A (ja)
TW (2) TWI572864B (ja)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108834330B (zh) * 2018-06-29 2021-07-20 惠州市金百泽电路科技有限公司 一种pcb“d”字型异型焊盘的加工方法
CN111141938B (zh) * 2018-11-02 2021-10-29 旺矽科技股份有限公司 适用于具有倾斜导电接点的多待测单元的探针模块
KR102098650B1 (ko) * 2019-07-24 2020-04-10 주식회사 프로이천 핀 타입 프로브 장치
KR102241061B1 (ko) * 2020-01-14 2021-04-16 (주)위드멤스 프로브 블록 조립체
KR102241059B1 (ko) * 2020-01-14 2021-04-16 (주)위드멤스 프로브 블록 조립체
KR102121618B1 (ko) 2020-02-06 2020-06-10 주식회사 프로이천 일체형 프로브 어레이블록
KR102121620B1 (ko) 2020-02-11 2020-06-10 주식회사 프로이천 분리형 프로브 어레이블록
KR102225546B1 (ko) 2020-11-13 2021-03-10 주식회사 프로이천 프로브핀블록
KR102563643B1 (ko) * 2021-06-10 2023-08-04 주식회사 프로이천 핀 보드
KR102357377B1 (ko) * 2021-09-06 2022-02-08 가온솔루션 주식회사 프로브핀 및 이를 구비하는 프로브유닛
KR102614928B1 (ko) * 2021-11-24 2023-12-19 (주)티에스이 프로브 카드

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200809211A (en) * 2006-05-08 2008-02-16 Tokyo Electron Ltd Probe
CN101236310A (zh) * 2007-01-30 2008-08-06 De&T株式会社 用于检测显示面板的方法及装置
TWM375884U (en) * 2009-01-12 2010-03-11 Dm & T Co Ltd Probe unit for inspecting display panel
TWI461696B (zh) * 2011-11-25 2014-11-21 Gigalane Co Ltd 接觸膜及其製造方法以及探針單元和ｌｃｄ面板檢測裝置

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JPH08271579A (ja) * 1995-03-30 1996-10-18 Fujitsu Ltd Ｉｃソケット及びそれを用いたｉｃ試験方法
JP4496456B2 (ja) * 2001-09-03 2010-07-07 軍生 木本 プローバ装置
US7230437B2 (en) * 2004-06-15 2007-06-12 Formfactor, Inc. Mechanically reconfigurable vertical tester interface for IC probing
JP4571517B2 (ja) * 2004-10-19 2010-10-27 株式会社日本マイクロニクス プローブ組立体
KR100697218B1 (ko) 2005-03-17 2007-03-21 주식회사 코디에스 평판형 디스플레이의 패턴 검사용 프로브블록 조립체 및그의 조립방법
KR100600700B1 (ko) 2005-07-29 2006-07-19 프롬써어티 주식회사 평판표시패널 검사용 프로브 장치
CN101315391B (zh) * 2007-05-28 2011-11-23 旺矽科技股份有限公司 拉伸式折叠探针
CN101329366B (zh) * 2007-06-22 2011-03-30 旺矽科技股份有限公司 一种探针短路防止结构的制作方法
JP5222038B2 (ja) * 2008-06-20 2013-06-26 東京エレクトロン株式会社 プローブ装置
JP5491790B2 (ja) * 2009-07-27 2014-05-14 株式会社日本マイクロニクス プローブ装置
CN102081110B (zh) * 2009-11-26 2014-03-26 日本麦可罗尼克斯股份有限公司 探针装置
JP5690105B2 (ja) * 2009-11-26 2015-03-25 株式会社日本マイクロニクス プローブ装置
JP5417265B2 (ja) * 2010-06-24 2014-02-12 株式会社日本マイクロニクス プローブ組立体
CN102565470B (zh) * 2010-12-03 2014-06-04 日本麦可罗尼克斯股份有限公司 探针组合体
JP2014182976A (ja) * 2013-03-21 2014-09-29 Enplas Corp 電気接触子及び電気部品用ソケット

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200809211A (en) * 2006-05-08 2008-02-16 Tokyo Electron Ltd Probe
CN101236310A (zh) * 2007-01-30 2008-08-06 De&T株式会社 用于检测显示面板的方法及装置
TWM375884U (en) * 2009-01-12 2010-03-11 Dm & T Co Ltd Probe unit for inspecting display panel
TWI461696B (zh) * 2011-11-25 2014-11-21 Gigalane Co Ltd 接觸膜及其製造方法以及探針單元和ｌｃｄ面板檢測裝置

Also Published As

Publication number Publication date
CN110531124A (zh) 2019-12-03
TWI600908B (zh) 2017-10-01
TW201716783A (zh) 2017-05-16
KR101558256B1 (ko) 2015-10-12
JP6055951B2 (ja) 2016-12-27
CN106168632A (zh) 2016-11-30
JP2016218056A (ja) 2016-12-22
TW201631322A (zh) 2016-09-01

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