TWI558847B - Method and device of manufacturing solder plating wire - Google Patents
Method and device of manufacturing solder plating wire Download PDFInfo
- Publication number
- TWI558847B TWI558847B TW100120460A TW100120460A TWI558847B TW I558847 B TWI558847 B TW I558847B TW 100120460 A TW100120460 A TW 100120460A TW 100120460 A TW100120460 A TW 100120460A TW I558847 B TWI558847 B TW I558847B
- Authority
- TW
- Taiwan
- Prior art keywords
- copper wire
- wire
- immersion plating
- plating
- immersion
- Prior art date
Links
- 238000007747 plating Methods 0.000 title claims description 560
- 229910000679 solder Inorganic materials 0.000 title claims description 157
- 238000004519 manufacturing process Methods 0.000 title claims description 140
- 238000000034 method Methods 0.000 title claims description 114
- 238000007654 immersion Methods 0.000 claims description 392
- 238000000137 annealing Methods 0.000 claims description 253
- 230000007246 mechanism Effects 0.000 claims description 235
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 220
- 238000010438 heat treatment Methods 0.000 claims description 156
- 238000004804 winding Methods 0.000 claims description 141
- 239000007789 gas Substances 0.000 claims description 116
- 238000004140 cleaning Methods 0.000 claims description 109
- 238000005406 washing Methods 0.000 claims description 108
- 230000008569 process Effects 0.000 claims description 99
- 238000011144 upstream manufacturing Methods 0.000 claims description 81
- 239000002253 acid Substances 0.000 claims description 73
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 69
- 238000005476 soldering Methods 0.000 claims description 62
- 239000007788 liquid Substances 0.000 claims description 45
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 38
- 229910052802 copper Inorganic materials 0.000 claims description 32
- 239000010949 copper Substances 0.000 claims description 32
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 27
- 239000000463 material Substances 0.000 claims description 25
- 229910001873 dinitrogen Inorganic materials 0.000 claims description 23
- 230000008859 change Effects 0.000 claims description 16
- 238000012545 processing Methods 0.000 claims description 15
- 238000007598 dipping method Methods 0.000 claims description 6
- 239000011248 coating agent Substances 0.000 claims description 5
- 238000000576 coating method Methods 0.000 claims description 5
- 238000003618 dip coating Methods 0.000 claims description 4
- 238000012546 transfer Methods 0.000 claims description 4
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 230000003647 oxidation Effects 0.000 claims 1
- 238000007254 oxidation reaction Methods 0.000 claims 1
- 230000000694 effects Effects 0.000 description 55
- 238000002474 experimental method Methods 0.000 description 46
- 238000012790 confirmation Methods 0.000 description 25
- 230000000052 comparative effect Effects 0.000 description 21
- 239000000498 cooling water Substances 0.000 description 14
- 230000002829 reductive effect Effects 0.000 description 14
- 230000009467 reduction Effects 0.000 description 13
- 238000012795 verification Methods 0.000 description 13
- 238000012360 testing method Methods 0.000 description 11
- 238000005554 pickling Methods 0.000 description 10
- 239000001257 hydrogen Substances 0.000 description 9
- 229910052739 hydrogen Inorganic materials 0.000 description 9
- 239000012535 impurity Substances 0.000 description 9
- 239000004020 conductor Substances 0.000 description 7
- 230000005484 gravity Effects 0.000 description 7
- 229910019142 PO4 Inorganic materials 0.000 description 6
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 6
- 239000010452 phosphate Substances 0.000 description 6
- 239000000314 lubricant Substances 0.000 description 5
- 238000002156 mixing Methods 0.000 description 5
- 238000001816 cooling Methods 0.000 description 4
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 238000004891 communication Methods 0.000 description 3
- 239000003599 detergent Substances 0.000 description 3
- 230000000630 rising effect Effects 0.000 description 3
- 238000005096 rolling process Methods 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 238000013020 steam cleaning Methods 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 238000003490 calendering Methods 0.000 description 1
- 239000003245 coal Substances 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 238000009795 derivation Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000005246 galvanizing Methods 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 235000021110 pickles Nutrition 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000004506 ultrasonic cleaning Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
- B21C—MANUFACTURE OF METAL SHEETS, WIRE, RODS, TUBES OR PROFILES, OTHERWISE THAN BY ROLLING; AUXILIARY OPERATIONS USED IN CONNECTION WITH METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL
- B21C47/00—Winding-up, coiling or winding-off metal wire, metal band or other flexible metal material characterised by features relevant to metal processing only
- B21C47/003—Regulation of tension or speed; Braking
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
- B21C—MANUFACTURE OF METAL SHEETS, WIRE, RODS, TUBES OR PROFILES, OTHERWISE THAN BY ROLLING; AUXILIARY OPERATIONS USED IN CONNECTION WITH METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL
- B21C47/00—Winding-up, coiling or winding-off metal wire, metal band or other flexible metal material characterised by features relevant to metal processing only
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
- B21C—MANUFACTURE OF METAL SHEETS, WIRE, RODS, TUBES OR PROFILES, OTHERWISE THAN BY ROLLING; AUXILIARY OPERATIONS USED IN CONNECTION WITH METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL
- B21C47/00—Winding-up, coiling or winding-off metal wire, metal band or other flexible metal material characterised by features relevant to metal processing only
- B21C47/02—Winding-up or coiling
- B21C47/10—Winding-up or coiling by means of a moving guide
- B21C47/12—Winding-up or coiling by means of a moving guide the guide moving parallel to the axis of the coil
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
- B21C—MANUFACTURE OF METAL SHEETS, WIRE, RODS, TUBES OR PROFILES, OTHERWISE THAN BY ROLLING; AUXILIARY OPERATIONS USED IN CONNECTION WITH METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL
- B21C47/00—Winding-up, coiling or winding-off metal wire, metal band or other flexible metal material characterised by features relevant to metal processing only
- B21C47/34—Feeding or guiding devices not specially adapted to a particular type of apparatus
- B21C47/345—Feeding or guiding devices not specially adapted to a particular type of apparatus for monitoring the tension or advance of the material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C2/00—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
- C23C2/003—Apparatus
- C23C2/0034—Details related to elements immersed in bath
- C23C2/00342—Moving elements, e.g. pumps or mixers
- C23C2/00344—Means for moving substrates, e.g. immersed rollers or immersed bearings
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C2/00—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
- C23C2/003—Apparatus
- C23C2/0035—Means for continuously moving substrate through, into or out of the bath
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C2/00—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
- C23C2/003—Apparatus
- C23C2/0038—Apparatus characterised by the pre-treatment chambers located immediately upstream of the bath or occurring locally before the dipping process
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C2/00—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
- C23C2/02—Pretreatment of the material to be coated, e.g. for coating on selected surface areas
- C23C2/022—Pretreatment of the material to be coated, e.g. for coating on selected surface areas by heating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C2/00—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
- C23C2/02—Pretreatment of the material to be coated, e.g. for coating on selected surface areas
- C23C2/022—Pretreatment of the material to be coated, e.g. for coating on selected surface areas by heating
- C23C2/0222—Pretreatment of the material to be coated, e.g. for coating on selected surface areas by heating in a reactive atmosphere, e.g. oxidising or reducing atmosphere
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C2/00—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
- C23C2/02—Pretreatment of the material to be coated, e.g. for coating on selected surface areas
- C23C2/022—Pretreatment of the material to be coated, e.g. for coating on selected surface areas by heating
- C23C2/0224—Two or more thermal pretreatments
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C2/00—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
- C23C2/02—Pretreatment of the material to be coated, e.g. for coating on selected surface areas
- C23C2/024—Pretreatment of the material to be coated, e.g. for coating on selected surface areas by cleaning or etching
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C2/00—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
- C23C2/04—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor characterised by the coating material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C2/00—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
- C23C2/04—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor characterised by the coating material
- C23C2/08—Tin or alloys based thereon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C2/00—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
- C23C2/34—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor characterised by the shape of the material to be treated
- C23C2/36—Elongated material
- C23C2/38—Wires; Tubes
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C2/00—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
- C23C2/50—Controlling or regulating the coating processes
- C23C2/52—Controlling or regulating the coating processes with means for measuring or sensing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Thermal Sciences (AREA)
- Coating With Molten Metal (AREA)
- Winding, Rewinding, Material Storage Devices (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Electroplating Methods And Accessories (AREA)
Description
本發明係有關應用於電氣電子設備或通信設備的鍍銲錫線的製造方法及製造裝置,更詳細的係作為太陽能電池的導線而應用,具有適當低耐力特性的鍍銲錫線的製造方法及製造裝置。The present invention relates to a method and a device for manufacturing a soldering wire applied to an electric or electronic device or a communication device, and more particularly to a wire for use in a solar cell, and a method and a device for manufacturing a plated solder wire having appropriate low endurance characteristics .
應用於電子組件的浸鍍線之中,被要求須具有0.2%耐力值的低耐力特性。例如,太陽能電池用導線亦為其中一例。Among the dip coating lines used for electronic components, it is required to have a low endurance characteristic of 0.2% proof value. For example, a wire for a solar cell is also an example.
為了達到構成該太陽能電池之矽材料的低成本,或緩和材料供給不足的影響,太陽電池能單元正追求薄型化。In order to achieve the low cost of the material constituting the solar cell or to alleviate the influence of insufficient material supply, the solar cell energy unit is seeking to be thinner.
然而,太陽能電池單元薄型化後,其強度變弱,且銲接太陽能電池單元之太陽能電池用導線的連接部分,因彼此的膨脹率差異,具有太陽電池容易產生彎曲或損壞的問題。However, when the solar cell is thinned, the strength thereof is weak, and the connection portion of the solar cell wires for soldering the solar cell unit has a problem that the solar cell is easily bent or damaged due to the difference in expansion ratio between the solar cells.
因此,太陽能電池用導線與太陽能電池單元的連接部分,必須隨著太陽能電池單元變形,而使其0.2%耐力值(proof stress)降低變為重要。由此,作為太陽能電池用導線,係使用具有低耐力特性的鍍銲錫線。Therefore, the connection portion between the solar cell lead wire and the solar cell unit must be deformed with the solar cell unit, and it is important to reduce the 0.2% proof stress. Therefore, as a wire for a solar cell, a plated solder wire having low endurance characteristics is used.
無關於是否具有低耐力特性,專利文獻1所揭露的鍍銲錫線,係經由鍍銲錫工序而對待鍍線形成浸鍍層。Regardless of whether or not it has low endurance characteristics, the plated solder wire disclosed in Patent Document 1 is formed by a plating process to form a immersion plating layer.
專利文獻1所揭露的鍍銲錫工序,係將作為待鍍線的金屬素線通過金屬素線導入口,且將其導入注入熔融浸鍍銲錫液的鍍液部,再從鍍銲錫線導出口導出後,以空氣冷卻等而對金屬素線施行浸鍍的工序。In the plating soldering process disclosed in Patent Document 1, a metal wire to be plated is passed through a metal wire inlet, and introduced into a plating liquid portion to be injected into a molten immersion solder liquid, and then exported from a solder wire lead. Thereafter, the metal wire is subjected to a step of immersion plating by air cooling or the like.
更進一步,於鍍銲錫線的製造工序中,除了上述鍍銲錫工序以外,亦對金屬素線的表面施行洗淨或退火等鍍銲錫前處理工序,而鍍銲錫工序的後工序係進行捲取浸鍍線的捲取工序。Further, in the manufacturing process of the plated solder wire, in addition to the above-described plating process, the surface of the metal wire is subjected to a pre-plating process such as cleaning or annealing, and the post-plating process is performed by coiling and dipping. The coiling process of the plating line.
而連續對已低耐力化的待鍍線進行這樣的工序時,待鍍線容易承受負荷,因此,連續加工變得困難,即使可連續加工,也難以使期望品質的浸鍍線安定而獲得。Further, when such a process is continuously performed on the to-be-plated wire having low endurance, the to-be-plated wire is easily subjected to a load, and thus continuous processing becomes difficult, and even if continuous processing is possible, it is difficult to obtain a desired quality immersion plating line.
例如,過於注重抑制已低耐力化之待鍍線所承受的負荷,則無法將待鍍線的表面充份洗浄,而使其表面殘留不純物或氧化層。For example, if the load on the wire to be plated which has been low in endurance is excessively emphasized, the surface of the wire to be plated cannot be sufficiently washed, and the surface is left with an impurity or an oxide layer.
如此一來,在之後的鍍銲錫工序,於待鍍線的表面形成浸鍍層時,浸鍍層變得容易剝落等,難以使期望品質的浸鍍線安定而獲得。In the subsequent plating step, when the immersion plating layer is formed on the surface to be plated, the immersion plating layer is easily peeled off, and it is difficult to obtain a desired quality immersion plating line.
其他方面也是,於製造浸鍍線的途中,為了降低浸鍍線(待鍍線)的耐力,無法提升浸鍍線的行走速度,而大幅花費製造時間,若進行連續加工,反而具有產生製造效率降低之情況的缺點。In other respects, in order to reduce the endurance of the immersion plating line (the line to be plated), the traveling speed of the immersion plating line cannot be increased, and the manufacturing time is greatly spent, and the continuous processing is performed to produce manufacturing efficiency. The disadvantage of reducing the situation.
作為具有低耐力特性的鍍銲錫線的製造方法,例如專利文獻2所提出的,太陽能電池用平角導體的製造方法。As a method of producing a plated solder wire having low endurance characteristics, for example, a method of manufacturing a flat-angle conductor for a solar cell proposed in Patent Document 2 is known.
於專利文獻2的太陽能電池用平角導體的製造方法,係藉由壓延導體等工序而成形為平角狀後,藉由熱處理工序而使0.2%耐力值降低,且在導體表面施行鍍銲錫膜的製造方法。The method for producing a flat-angle conductor for a solar cell according to Patent Document 2 is formed into a rectangular shape by a step of rolling a conductor or the like, and then a 0.2% proof stress value is lowered by a heat treatment step, and a solder film is applied to the surface of the conductor. method.
然而,引用文獻2針對進行熱處理方面的溫度設定,或還原爐(軟化退火爐)之內部環境的氣體成份等未有具體的記載,或熱處理工序以外的工序例如洗浄工序等,並無具體地提及。However, Citation 2 does not specifically describe the temperature setting for heat treatment or the gas composition of the internal environment of the reduction furnace (softening annealing furnace), or a step other than the heat treatment step, for example, a washing step, etc., and does not specifically mention and.
因此,即使假設進行洗浄工序,而這些熱處理工序、洗浄工序或浸鍍工序等各工序是否為獨立的生產線,或假設使這些複數工序係連續進行,則係以怎樣的工序順序進行,並不明確。Therefore, even if it is assumed that the respective steps of the heat treatment step, the cleaning step, or the immersion step are independent production lines, or if the plurality of steps are continuously performed, it is not clear which process is performed. .
即,如上所述,引用文獻2使平角導體的0.2%耐力值降低的同時,難以確保其作為太陽能電池導線的品質,另一方面,為了確保0.2%耐力值降低之浸鍍線的品質,而使製造效率降低的兩相反課題,於引用文獻2未有任何著墨。That is, as described above, the cited document 2 reduces the 0.2% proof stress value of the rectangular conductor, and it is difficult to ensure the quality of the solar cell lead, and on the other hand, in order to ensure the quality of the immersion plating line with a 0.2% proof endurance value, The two opposite problems of reducing manufacturing efficiency are not invented in Citation 2.
[習知技術文獻][Practical Technical Literature]
[專利文獻][Patent Literature]
[專利文獻1]日本特開2000-80460號公報[Patent Document 1] Japanese Patent Laid-Open Publication No. 2000-80460
[專利文獻2]日本特開2006-54355號公報[Patent Document 2] Japanese Patent Laid-Open Publication No. 2006-54355
在此,本發明之目的為提供一種鍍銲錫線的製造方法及製造裝置,其可獲得0.2%耐力值充份降低、期望品質的鍍線,藉由使這樣的浸鍍線安定而獲得,可提升製品產率,又,可提升製造效率。Accordingly, an object of the present invention is to provide a method and a device for manufacturing a solder wire, which can obtain a plating wire having a 0.2% proof endurance value and a desired quality, which can be obtained by setting such a immersion plating line. Improve product yield and, in turn, increase manufacturing efficiency.
本發明之一種鍍銲錫線的製造裝置,其可係以一浸鍍前處理機構、一浸鍍機構及一捲取機構而構成,該浸鍍前處理機構係對銅線進行浸鍍前處理,該浸鍍機構係於該銅線的表面施行鍍銲錫,該捲取機構係捲取表面已施行浸鍍的該銅線。其中,於該浸鍍前處理機構具有一軟化退火機構,其將該銅線軟化退火而使該銅線低耐力化;藉由該捲取機構,且以低於該銅線之耐力的捲取力將已低耐力化的該銅線捲取;將該軟化退火機構、該浸鍍機構及該捲取機構,從該銅線的行走方向的上游側依序一連串配置。The apparatus for manufacturing a soldering wire of the present invention may be configured by a pre-dip coating processing mechanism, a dip plating mechanism and a winding mechanism, wherein the pre-plating processing mechanism performs pre-dip plating treatment on the copper wire. The immersion plating mechanism applies plating solder to the surface of the copper wire, and the winding mechanism winds the copper wire which has been immersed on the surface. Wherein the pre-etching treatment mechanism has a softening annealing mechanism that softens and anneals the copper wire to make the copper wire low endurance; by the winding mechanism, and is wound up below the endurance of the copper wire The copper wire having low endurance is wound up, and the softening annealing mechanism, the immersion plating mechanism, and the winding mechanism are arranged in series from the upstream side in the traveling direction of the copper wire.
在此,藉由該捲取機構以低於該銅線之耐力的低捲取力而捲取的構成,並不限於只藉由該捲取機構捲取銅線,亦包含例如將輸送絞盤配置於捲取機構的上游側,其輔助該捲取機構的捲取,藉由該捲取機構及該輸送絞盤作為捲取銅線的構成。Here, the configuration in which the winding mechanism is wound up with a low take-up force lower than the endurance of the copper wire is not limited to the winding of the copper wire only by the winding mechanism, and includes, for example, the conveying winch arrangement. On the upstream side of the take-up mechanism, it assists in the winding of the take-up mechanism, and the take-up mechanism and the transport winch are configured to take up the copper wire.
該銅線並不限制形狀、尺寸,但較佳為平角線。藉由純銅系導體材料以平角線形成該銅線,且於其表面施行浸鍍處理,以作為連接矽結晶晶圓(矽單元)之指定區域的連接用導線,即,可用於作為太陽能電池用鍍銲錫線而使用。The copper wire is not limited in shape and size, but is preferably a flat line. The copper wire is formed by a pure copper-based conductor material in a rectangular line, and is subjected to a immersion plating treatment on the surface thereof to serve as a connection wire for connecting a predetermined region of the germanium crystal wafer (矽 unit), that is, for use as a solar cell. Soldering with solder wire.
該一連串配置,係表示從行走方向的上游側沿著下游側,無關是否連續或斷續而成列,即,以串列配置。The series of configurations are shown from the upstream side in the traveling direction to the downstream side, regardless of whether they are continuously or intermittently arranged, that is, arranged in series.
作為本發明之態樣可以係,以純銅系材料形成該銅線;以一軟化退火爐構成該軟化退火機構,其內部係還原該銅線之表面的氧化層的還原氣體環境;將該軟化退火爐傾斜配置,而使其下游側端部於該銅線行走方向的位置低於其上游側端部於該銅線行走方向的位置;於該軟化退火爐中該銅線行走方向的下游側部分設有一還原氣體供給部,其容許對該軟化退火爐供給還原性氣體。As a aspect of the present invention, the copper wire may be formed of a pure copper-based material; the softening annealing mechanism is configured by a softening annealing furnace, and the inside thereof reduces a reducing gas atmosphere of the oxide layer on the surface of the copper wire; The furnace is disposed obliquely, and the position of the downstream end portion in the traveling direction of the copper wire is lower than the position of the upstream end portion in the traveling direction of the copper wire; in the softening annealing furnace, the downstream side portion of the traveling direction of the copper wire A reducing gas supply unit is provided which allows supply of a reducing gas to the softening annealing furnace.
該純銅系材料只要係不純物少,導電率高的純銅系導體材料,並無特別限定,較佳例如無氧銅(OFC)、精銅(tough pitch copper)、磷脫氧銅(Phosphorus Deoxidized Copper)等,且未含有氧化物等不純物、純度為99.9%以上之物。The pure copper-based material is not particularly limited as long as it has less impurities, and the pure copper-based conductor material having high conductivity is preferably, for example, oxygen-free copper (OFC), tough pitch copper, and Phosphorus Deoxidized Copper. It does not contain impurities such as oxides and has a purity of 99.9% or more.
又,作為本發明之態樣,該還原性氣體可係以氮氣氣體與氫氣氣體的混合氣體而構成。Further, as a aspect of the present invention, the reducing gas may be formed by a mixed gas of a nitrogen gas and a hydrogen gas.
又,作為本發明之態樣,可將該氮氣氣體與該氫氣氣體的體積比率設定為4:1。Further, as a aspect of the present invention, the volume ratio of the nitrogen gas to the hydrogen gas may be set to 4:1.
又,作為本發明之態樣可以係,於該浸鍍前處理機構具有一加熱處理機構,其對該銅線進行加熱處理;將該加熱處理機構配置於該銅線行走方向中該軟化退火機構的上游側。Moreover, as a aspect of the present invention, the pre-dip plating treatment mechanism may have a heat treatment mechanism that heats the copper wire; and the heat treatment mechanism is disposed in the copper wire traveling direction. The upstream side.
又,作為本發明之態樣可以係,以純銅系材料構成該銅線;於該浸鍍前處理機構具有一洗浄機構,其將該銅線洗浄;將該洗浄機構配置於該銅線行走方向中該軟化退火機構的上游側。Moreover, as a aspect of the present invention, the copper wire may be formed of a pure copper-based material; the immersion plating treatment mechanism has a cleaning mechanism for cleaning the copper wire; and the cleaning mechanism is disposed in the copper wire traveling direction. The upstream side of the softening annealing mechanism.
又,作為本發明之態樣可以係,於該浸鍍前處理機構具有一加熱處理機構,其對該銅線進行加熱處理,且係配置於該銅線行走方向中該軟化退火機構的上游側;將該加熱處理機構配置於該銅線行走方向中該洗浄機構的上游側。Moreover, as a aspect of the present invention, the pre-dip plating treatment mechanism may have a heat treatment mechanism that heat-treats the copper wire and is disposed on the upstream side of the softening annealing mechanism in the traveling direction of the copper wire. The heat treatment mechanism is disposed on the upstream side of the cleaning mechanism in the traveling direction of the copper wire.
又,作為本發明之態樣可以係,以一酸洗浄機構及一水洗浄機構構成該洗浄機構係;作為該浸鍍前處理機構,將該加熱處理機構、該酸洗浄機構、該水洗浄機構及該軟化退火機構沿著該銅線行走方向依序配置。Moreover, as an aspect of the present invention, the cleaning mechanism may be configured by an acid cleaning mechanism and a water cleaning mechanism, and the heat treatment mechanism, the acid cleaning mechanism, and the water cleaning mechanism may be used as the pre-dip plating treatment mechanism. And the softening annealing mechanism is arranged in sequence along the traveling direction of the copper wire.
又,作為本發明之態樣可以係,該銅線係使用垂直剖面的寬度為0.8~10.0mm範圍內、厚度為0.05~0.5mm範圍內大小的平角銅線,垂直剖面係相對其長度方向而垂直的剖面,將該銅線的行走速度設定為約4.0m/min,於酸洗浄機構的酸洗浄時間設定為約12.8秒,且於水洗浄機構的水洗浄時間設定為約13.5秒。Moreover, as a aspect of the present invention, the copper wire may be a rectangular copper wire having a width of a vertical section of 0.8 to 10.0 mm and a thickness of 0.05 to 0.5 mm, and the vertical section is opposite to the length direction thereof. In the vertical cross section, the traveling speed of the copper wire was set to about 4.0 m/min, the acid washing time in the acid cleaning mechanism was set to about 12.8 seconds, and the water washing time in the water washing mechanism was set to about 13.5 seconds.
又,作為本發明之態樣可以係,以純銅系材料構成該銅線;於該銅線行走方向中該捲取機構的上游側具有一銅線輸送輔助機構,其輔助該捲取機構對該銅線的捲取。Further, as an aspect of the present invention, the copper wire may be formed of a pure copper-based material; in the traveling direction of the copper wire, the upstream side of the winding mechanism has a copper wire auxiliary mechanism that assists the winding mechanism Coiling of copper wire.
又,作為本發明之態樣,可將該銅線輸送輔助機構配置於該銅線行走方向中該軟化退火機構的上游側。Moreover, as a aspect of the present invention, the copper wire conveyance assisting mechanism may be disposed on the upstream side of the softening annealing mechanism in the traveling direction of the copper wire.
又,作為本發明之態樣,可將該銅線輸送輔助機構配置於該銅線行走方向中該洗浄機構的下游側。Moreover, as a aspect of the present invention, the copper wire conveyance assisting mechanism may be disposed on the downstream side of the cleaning mechanism in the traveling direction of the copper wire.
又,作為本發明之態樣可以係,以貯存熔融浸鍍銲錫液的一熔融浸鍍銲錫槽構成該浸鍍機構;將轉換該銅線之行走方向的方向轉換滾輪,以槽中方向轉換滾輪構成,其係於該熔融浸鍍銲錫槽之內部,且於該銅線通過該熔融浸鍍銲錫槽前後,將該銅線之行走方向轉換;以該銅線輸送輔助機構構成該槽中方向轉換滾輪。Moreover, as a aspect of the present invention, the immersion plating mechanism may be configured by a molten immersion solder bath for storing the molten immersion solder bath; the direction changing roller for converting the traveling direction of the copper wire, and the roller in the groove direction The structure is formed inside the molten dip solder bath, and the traveling direction of the copper wire is converted before and after the copper wire passes through the solder dipping solder bath; and the copper wire feeding auxiliary mechanism constitutes a direction change in the groove Roller.
又,作為本發明之態樣可以係,以純銅系材料構成該銅線;以貯存熔融浸鍍銲錫液的一熔融浸鍍銲錫槽構成該浸鍍機構;將轉換該銅線之行走方向的方向轉換滾輪,以槽上方向轉換滾輪構成,其係於該熔融浸鍍銲錫槽之上方,且於該銅線通過該熔融浸鍍銲錫槽後,將該銅線之行走方向轉換至該捲取機構一側;於該捲取機構架越該銅線的固定滾輪之中,且配置於上游側的固定滾輪,係以一捲取機構上游側配置滾輪構成,其將通過該槽上方向轉換滾輪後的該銅線導引至該捲取機構的下游側;將該槽上方向轉換滾輪配置在高於該捲取機構上游側配置滾輪的配置高度。Further, as a aspect of the present invention, the copper wire may be formed of a pure copper-based material; the immersion plating mechanism may be formed by a molten immersion solder bath for storing the molten immersion solder liquid; and the direction of the traveling direction of the copper wire will be changed. The conversion roller is formed by a groove-up direction changing roller, and is disposed above the molten immersion solder bath, and after the copper wire passes through the molten immersion solder bath, the traveling direction of the copper wire is converted to the winding mechanism One side; the fixed roller disposed on the upstream side of the winding mechanism of the winding mechanism, and the fixed roller disposed on the upstream side is configured by a roller disposed on the upstream side of the winding mechanism, and the roller is turned by the groove upward direction The copper wire is guided to the downstream side of the take-up mechanism; the groove-up direction change roller is disposed at a height higher than the arrangement of the roller disposed on the upstream side of the take-up mechanism.
又,作為本發明之態樣可以係,將該槽上方向轉換滾輪配置於,相對該熔融浸鍍銲錫槽所貯存的該熔融浸鍍銲錫液之液面的高度約為3m的位置。Moreover, as an aspect of the present invention, the groove upward direction switching roller may be disposed at a position where the height of the liquid surface of the molten immersion solder liquid stored in the molten immersion solder bath is about 3 m.
又,作為本發明之態樣可以係,以貯存熔融浸鍍銲錫液的一熔融浸鍍銲錫槽構成該浸鍍機構;將轉換該銅線之行走方向的方向轉換滾輪,以槽中方向轉換滾輪而構成,其係於該熔融浸鍍銲錫槽之內部,且於該銅線通過該熔融浸鍍銲錫槽前後,將該銅線的行走方向轉換;以該銅線輸送輔助機構構成該槽中方向轉換滾輪,其輔助該捲取機構對該銅線的捲取。Moreover, as a aspect of the present invention, the immersion plating mechanism may be configured by a molten immersion solder bath for storing the molten immersion solder bath; the direction changing roller for converting the traveling direction of the copper wire, and the roller in the groove direction And configured to be inside the molten immersion solder bath, and to switch the traveling direction of the copper wire before and after the copper wire passes through the molten immersion solder bath; and the copper wire feeding auxiliary mechanism forms a direction in the groove A transfer roller that assists the take-up mechanism in winding the copper wire.
又,作為本發明之態樣可以係,以純銅系材料構成該銅線;於該浸鍍機構係利用薄浸鍍設定及厚浸鍍設定之任一的設定而進行,該薄浸鍍設定係以薄浸鍍而浸鍍該銅線,該厚浸鍍設定係厚於薄浸鍍設定的浸鍍厚度而形成厚浸鍍厚度;該薄浸鍍設定,係使該銅線的行走速度為低速行走速度之下,對該銅線施行浸鍍的設定;該厚浸鍍設定,係使該銅線的行走速度,為高於該低速行走速度的高速行走速度之下,對該銅線施行浸鍍的設定;於高速行走速度中,係根據銲錫溫度及浸鍍厚度的指定關係,以對應該銲錫溫度的浸鍍厚度對該銅線施行浸鍍的設定。Further, as a aspect of the present invention, the copper wire may be formed of a pure copper-based material; and the immersion plating mechanism may be performed by any one of a thin immersion plating setting and a thick immersion plating setting. The copper wire is immersed by thin immersion plating, and the thick immersion plating is thicker than the immersion plating thickness set by the thin immersion plating to form a thick immersion plating thickness; the thin immersion plating setting is such that the traveling speed of the copper wire is low speed Setting the immersion plating on the copper wire under the walking speed; the thick immersion plating setting is such that the traveling speed of the copper wire is below the high speed running speed of the low speed walking speed, and the copper wire is immersed The setting of the plating; in the high-speed traveling speed, the copper wire is subjected to the immersion plating setting according to the immersion plating thickness corresponding to the solder temperature according to the specified relationship between the solder temperature and the immersion plating thickness.
又,作為本發明之態樣可以係,於該洗浄機構與該軟化退火機構之間具有一預先加熱機構,其將通過該軟化退火機構前的該銅線加熱;該浸鍍機構於該厚浸鍍設定的設定中,係對通過該預先加熱機構及該軟化退火機構後的該銅線施行浸鍍。Moreover, as an aspect of the present invention, a preheating mechanism may be provided between the cleaning mechanism and the softening annealing mechanism, which heats the copper wire before passing through the softening annealing mechanism; the immersion plating mechanism is in the thick dipping In the setting of the plating setting, the copper wire which has passed through the preheating means and the softening annealing means is subjected to immersion plating.
又,本發明之一種鍍銲錫線的製造方法,其可係以一浸鍍前處理工序、一浸鍍工序及一捲取工序而構成,該浸鍍前處理工序對銅線進行浸鍍前處理,該浸鍍工序於該銅線的表面施行鍍銲錫,該捲取工序捲取表面已施行浸鍍的該銅線。其中,於該浸鍍前處理工序,進行一將該銅線軟化退火而使該銅線低耐力化的軟化退火工序;該捲取工序,係以低於已低耐力化的該銅線之耐力的捲取力進行捲取的工序;於該捲取工序期間,連續進行該軟化退火工序及該浸鍍工序。Moreover, the method for producing a plated solder wire according to the present invention may be configured by a pre-coating treatment step, a immersion plating step, and a coiling step, and the pre-dip plating treatment step is performed on the copper wire before immersion plating. The immersion plating process applies a solder to the surface of the copper wire, and the winding process winds the copper wire which has been subjected to immersion plating on the surface. Wherein, in the pre-dip plating treatment step, a softening annealing step of softening and annealing the copper wire to reduce the endurance of the copper wire is performed; and the winding step is lower than the endurance of the copper wire having low endurance The winding force is performed in the winding step; during the winding step, the softening annealing step and the immersion plating step are continuously performed.
又,作為本發明之態樣可以係,該銅線係使用以純銅系材料而形成之物;於該軟化退火工序,係其從行走方向之下游側部分所設置的一還原氣體供給部,供給還原性氣體至一軟化退火爐,該軟化退火爐係傾斜配置,而使其下游側端部於行走方向的位置低於其上游側端部於行走方向的位置,還原性氣體係還原該銅線之表面的氧化層;使軟化退火爐之內部為還原性氣體環境,且使該銅線行走於該軟化退火爐。Further, in the aspect of the present invention, the copper wire may be formed of a pure copper-based material, and the softening annealing step may be supplied from a reducing gas supply unit provided on a downstream side portion in the traveling direction. Reductive gas to a softening annealing furnace, the softening annealing furnace is arranged obliquely, and the position of the downstream end portion in the traveling direction is lower than the position of the upstream end portion in the traveling direction, and the reducing gas system restores the copper wire An oxide layer on the surface; the interior of the softening annealing furnace is a reducing gas atmosphere, and the copper wire is allowed to travel in the softening annealing furnace.
又,作為本發明之態樣,可係該還原性氣體以氮氣氣體與氫氣氣體的混合氣體而構成。Further, as a aspect of the present invention, the reducing gas may be formed by a mixed gas of a nitrogen gas and a hydrogen gas.
又,作為本發明之態樣,可將該氮氣氣體與該氫氣氣體的體積比率設定為4:1。Further, as a aspect of the present invention, the volume ratio of the nitrogen gas to the hydrogen gas may be set to 4:1.
又,作為本發明之態樣可以係,於該浸鍍前處理工序中,在該軟化退火工序前,對該銅線進行加熱處理工序。Moreover, as an aspect of the present invention, in the pre-dip plating treatment step, the copper wire may be subjected to a heat treatment step before the softening annealing step.
又,作為本發明之態樣可以係,該銅線係使用以純銅系材料而形成之物;於該浸鍍前處理工序中,在該軟化退火工序前,進行一將該銅線洗浄的洗浄工序。Moreover, as a aspect of the present invention, the copper wire may be formed of a pure copper-based material; in the pre-dip pretreatment process, a cleaning of the copper wire is performed before the softening annealing process. Process.
又,作為本發明之態樣可以係,於該浸鍍前處理工序包含一加熱處理工序,其在該軟化退火工序前對該銅線進行加熱處理;在該洗浄工序前,進行該加熱處理工序。Moreover, the aspect of the present invention may include a heat treatment step of heat-treating the copper wire before the softening annealing step, and performing the heat treatment step before the cleaning step. .
又,作為本發明之態樣可以係,於該洗浄工序具有一酸洗浄工序及一水洗浄工序;於該浸鍍前處理工序中,依序進行該加熱處理工序、該酸洗浄工序、該水洗浄工序及該軟化退火工序。Moreover, as an aspect of the present invention, the cleaning step may include an acid washing step and a water washing step, and in the pre-plating treatment step, the heat treatment step, the acid washing step, and the water may be sequentially performed. a washing step and the softening annealing step.
又,作為本發明之態樣可以係,該銅線係使用垂直剖面的寬度為0.8~10.0mm範圍內、厚度為0.05~0.5mm範圍內大小的平角銅線,垂直剖面係相對其長度方向而垂直的剖面。將該銅線的行走速度設定為約4.0m/min,於該酸洗浄工序的酸洗浄時間設定為約12.8秒,且於該水洗浄工序的水洗浄時間設定為約13.5秒。Moreover, as a aspect of the present invention, the copper wire may be a rectangular copper wire having a width of a vertical section of 0.8 to 10.0 mm and a thickness of 0.05 to 0.5 mm, and the vertical section is opposite to the length direction thereof. Vertical section. The traveling speed of the copper wire was set to about 4.0 m/min, the acid washing time in the acid washing step was set to about 12.8 seconds, and the water washing time in the water washing step was set to about 13.5 seconds.
又,作為本發明之態樣可以係,該銅線係使用以純銅系材料而形成之物;於進行該捲取工序期間,進行銅線輸送輔助工序,其輔助該捲取工序所進行的該銅線的捲取。Moreover, as a aspect of the present invention, the copper wire may be formed of a pure copper-based material; during the winding process, a copper wire conveyance assisting step may be performed to assist the winding process. Coiling of copper wire.
又,作為本發明之態樣可以係,該銅線係使用以純銅系材料而形成之物;於該浸鍍工序後,在該熔融浸鍍銲錫槽之上方,藉由一槽上方向轉換滾輪,將通過該熔融浸鍍銲錫槽後的該銅線的行走方向,方向轉換至一捲取機構上游側配置滾輪的一側,該槽上方向轉換滾輪係配置於一將表面已施行浸鍍的該銅線捲取的捲取機構的上游側,且係高於該捲取機構上游側配置滾輪的配置高度而配置,該捲取機構上游側配置滾輪該銅線導引至該捲取機構的下游側。Moreover, as a aspect of the present invention, the copper wire may be formed of a pure copper-based material; after the immersion plating process, a groove-up direction change roller is disposed above the molten-dip solder bath; Passing the direction of travel of the copper wire after the melt-dip solder bath to the side of the upstream side of the winding mechanism, the groove-aligning roller is disposed on the surface to be immersed The upstream side of the winding mechanism for winding the copper wire is disposed higher than the arrangement height of the roller disposed on the upstream side of the winding mechanism, and the upstream side of the winding mechanism is disposed with the roller to guide the copper wire to the winding mechanism Downstream side.
又,作為本發明之態樣可以係,該銅線係使用以純銅系材料而形成之物;於該浸鍍工序係利用薄浸鍍設定及厚浸鍍設定之任一的設定而進行,該薄浸鍍設定係以薄浸鍍而浸鍍該銅線,該厚浸鍍設定係厚於薄浸鍍設定的浸鍍厚度而形成厚浸鍍厚度;該薄浸鍍設定,係使該銅線的行走速度為低速行走速度之下,對該銅線施行浸鍍的設定;該厚浸鍍設定,係使該銅線的行走速度,為高於該低速行走速度的高速行走速度之下,對該銅線施行浸鍍的設定;於高速行走速度中,係根據銲錫溫度及浸鍍厚度的指定關係,以對應該銲錫溫度的浸鍍厚度對銅線施行浸鍍的設定。Further, as a aspect of the present invention, the copper wire may be formed of a pure copper-based material, and the immersion plating process may be performed by any one of a thin immersion plating setting and a thick immersion plating setting. The thin immersion plating is performed by dipping the copper wire by thin immersion plating, and the thick immersion plating is thicker than the immersion plating thickness set by the thin immersion plating to form a thick immersion plating thickness; the thin immersion plating setting is to make the copper wire The walking speed is lower than the low speed walking speed, and the copper wire is subjected to immersion plating setting; the thick immersion plating setting is such that the traveling speed of the copper wire is lower than the high speed walking speed of the low speed walking speed, The copper wire is subjected to the setting of the immersion plating. In the high-speed traveling speed, the copper wire is subjected to the immersion plating setting according to the immersion plating thickness corresponding to the solder temperature according to the specified relationship between the solder temperature and the immersion plating thickness.
又,作為本發明之態樣,較佳可將低速行走速度設定為約4m/min左右;較佳可將高速行走速度設定為約13m/min左右。Further, as a aspect of the present invention, it is preferable to set the low speed traveling speed to about 4 m/min; preferably, the high speed running speed is set to about 13 m/min.
又,作為本發明之態樣,於高速行走速度中,可將銲錫溫度設定為約240℃左右。Further, as a aspect of the present invention, the solder temperature can be set to about 240 ° C at a high speed traveling speed.
又,作為本發明之態樣可以係,以該厚浸鍍設定進行該浸鍍工序時,於該洗浄工序與該軟化退火工序期間,進行預先加熱工序,其將通過該軟化退火工序前的銅線加熱;於該軟化退火工序後,對已進行該軟化退火工序的銅線進行浸鍍工序。Further, in the aspect of the present invention, when the immersion plating step is performed by the thick immersion plating, a preheating step is performed during the cleaning step and the softening annealing step, and the copper before passing through the softening annealing step is performed. Wire heating; after the softening annealing process, the copper wire which has been subjected to the softening annealing step is subjected to a immersion plating step.
依據本發明,可提供鍍銲錫線的製造方法及製造裝置,其可獲得0.2%耐力值充份降低、期望品質的浸鍍線1b,藉由使這樣的浸鍍線1b安定而獲得,可提升製品產率,又,可提升製造效率。According to the present invention, it is possible to provide a method and a manufacturing apparatus for a soldered wire, which can obtain a dip plating line 1b having a 0.2% sufficient endurance value and a desired quality, which can be obtained by setting such a dip plating line 1b. Product yield, in turn, can increase manufacturing efficiency.
利用以下圖示說明本發明之一實施態樣。An embodiment of the present invention will be described using the following drawings.
如圖1所示,本實施態樣之鍍銲錫線的製造裝置10,係以浸鍍前處理機構2、浸鍍機構61及捲取機構71而構成,浸鍍前處理機構2係對待鍍線1a進行浸鍍前處理,浸鍍機構61係對待鍍線1a的表面施行鍍銲錫,捲取機構71係捲取表面已施行浸鍍的浸鍍線1b。 As shown in Fig. 1, the apparatus for manufacturing a plated solder wire according to the present embodiment is constituted by a pre-coating treatment mechanism 2, a dip plating mechanism 61, and a winding mechanism 71, and the pre-dip plating treatment mechanism 2 is a plating line. 1a is subjected to pre-dip plating treatment, and the dip plating mechanism 61 applies plating solder to the surface of the plating line 1a, and the winding mechanism 71 winds the dip plating line 1b on which the surface has been subjected to immersion plating.
待鍍線1a係使用平角銅線,平角銅線係藉由另行準備的平角線(flat square wire)製造機(圖未顯示),將無氧銅(oxygen-free copper)壓延成厚度0.05~0.5mm、寬度0.8~10mm,較佳係厚度0.08~0.24mm、寬度1~2mm。 The to-be-plated wire 1a is made of a flat-angle copper wire, and the flat-angle copper wire is calendered to a thickness of 0.05 to 0.5 by a separately prepared flat square wire manufacturing machine (not shown). Mm, width 0.8~10mm, preferably thickness 0.08~0.24mm, width 1~2mm.
上述浸鍍前處理機構2主要係以供給裝置(supplier)12、加熱處理爐22、酸洗浄槽31、超音波水洗淨槽41及軟化退火爐51而構成。 The pre-dip pretreatment mechanism 2 is mainly composed of a supply unit 12, a heat treatment furnace 22, an acid cleaning tank 31, an ultrasonic water washing tank 41, and a softening annealing furnace 51.
供給裝置12係藉由將捲曲於滾筒之狀態的待鍍線1a轉動,一邊依序解開一邊供給至製造線。供給裝置12係可對應所需而附有旋轉功能,又,亦可係一般橫向連續輸送的構成。 The supply device 12 is supplied to the manufacturing line while being sequentially unwound by rotating the wire 1a to be plated which is curled in the state of the drum. The supply device 12 may be provided with a rotation function as needed, or may be configured to be continuously conveyed in a lateral direction.
加熱處理爐22的構成係與稍後說明的軟化退火爐51略同,係相對厚度方向且在行走方向,為長直方體形狀的外觀形狀而構成。加熱處理爐22係沿著行走方向為傾斜配置,而使其下游側端部於行走方向的位置低於上游側端部於行走方向的位置。加熱處理爐22之內部係以200℃的設定溫度作為蒸氣環境(atmosphere)。 The configuration of the heat treatment furnace 22 is similar to that of the softening annealing furnace 51 described later, and is configured to have a long rectangular parallelepiped appearance shape in the thickness direction and in the traveling direction. The heat treatment furnace 22 is disposed obliquely along the traveling direction, and the position of the downstream end portion in the traveling direction is lower than the position of the upstream end portion in the traveling direction. The inside of the heat treatment furnace 22 is set to a vapor atmosphere at a set temperature of 200 °C.
又,相對加熱處理爐22於行走方向的下游側,設有冷卻水槽23,冷卻水槽23將通過加熱處理爐22之內部的待鍍線1a冷卻。加熱處理爐22的下游側端部及冷卻水槽23係以連結管24相互連結,連結管24將從加熱處理爐22導出的待鍍線1a導引至冷卻水槽23,以使待鍍線1a不接觸空氣。Further, a cooling water tank 23 is provided on the downstream side of the heat treatment furnace 22 in the traveling direction, and the cooling water tank 23 cools the wire to be plated 1a passing through the inside of the heat treatment furnace 22. The downstream end portion of the heat treatment furnace 22 and the cooling water tank 23 are connected to each other by a connection pipe 24, and the connection pipe 24 guides the wire 1a to be plated which is led out from the heat treatment furnace 22 to the cooling water tank 23 so that the wire 1a to be plated is not Contact with air.
作為洗浄機構30的酸洗浄槽31貯存有磷酸系洗浄液32,磷酸系洗浄液32酸洗淨待鍍線1a的表面。The acid cleaning tank 32 as the cleaning mechanism 30 stores the phosphate-based cleaning liquid 32, and the phosphate-based cleaning liquid 32 pickles the surface of the to-be-plated wire 1a.
作為洗浄機構30的超音波水洗浄槽41貯存有水43,以用於洗浄,藉由另行準備的超音波水洗淨機,洗浄待鍍線1a之表面所附著的水溶性潤滑劑或其他不純物。超音波水洗浄槽41之底面配置有超音波振動板42a,超音波振動板42a沿著待鍍線1a的行走方向而構成超音波水洗浄機42的一部分。又,超音波水洗浄槽41之上方設置有空氣雨刷(air wiper)45,空氣雨刷45從待鍍線1a行走軌道上的側方朝向待鍍線1a噴吹空氣。The ultrasonic water washing tank 41 as the cleaning mechanism 30 stores water 43 for washing, and washes the water-soluble lubricant or other impurities attached to the surface of the wire 1a to be plated by a separately prepared ultrasonic water washing machine. . An ultrasonic vibration plate 42a is disposed on the bottom surface of the ultrasonic water washing tank 41, and the ultrasonic vibration plate 42a constitutes a part of the ultrasonic water washing machine 42 along the traveling direction of the wire 1a to be plated. Further, an air wiper 45 is disposed above the ultrasonic water washing tank 41, and the air wiper 45 blows air from the side on the traveling rail of the line to be plated 1a toward the to-be-plated line 1a.
如圖2所示,上述軟化退火爐51係傾斜配置,而使其下游側端部於行走方向的位置緩緩低於其上游側端部於行走方向的位置。上述軟化退火爐51係以軟化退火爐本體52、鞘管53及加熱器54而構成,軟化退火爐本體52與加熱處理爐22同樣以直方體形狀構成,鞘管53呈管狀,並具有容許待鍍線1a插入的內徑,且貫通該軟化退火爐本體52而配置,加熱器54將軟化退火爐本體52的內部加熱。As shown in FIG. 2, the softening annealing furnace 51 is disposed obliquely, and the position of the downstream end portion in the traveling direction is gradually lower than the position of the upstream end portion in the traveling direction. The softening annealing furnace 51 is configured by softening the annealing furnace main body 52, the sheath tube 53, and the heater 54, and the softening annealing furnace main body 52 is formed in a rectangular parallelepiped shape similarly to the heating processing furnace 22, and the sheath tube 53 has a tubular shape and has a tolerance The inner diameter of the plating wire 1a is inserted through the softening annealing furnace body 52, and the heater 54 heats the inside of the softening annealing furnace body 52.
鞘管53係沿著行走方向而配置於軟化退火爐本體52的內部空間,且於軟化退火爐本體52之長度方向(行走方向)的兩端部,即長度方向的上端部及下端部突出。於鞘管53的軟化退火爐本體52中,於其上端部突出的鞘管上側突出部分55之上端,形成有上端開口部55u。The sheath tube 53 is disposed in the inner space of the softening annealing furnace main body 52 along the traveling direction, and protrudes at both end portions in the longitudinal direction (traveling direction) of the softening annealing furnace main body 52, that is, the upper end portion and the lower end portion in the longitudinal direction. In the softened annealing furnace body 52 of the sheath tube 53, an upper end opening portion 55u is formed at the upper end of the sheath upper side protruding portion 55 which protrudes at the upper end portion thereof.
上端開口部55u容許待鍍線1a往鞘管53的內部導入,且如稍後所述,將填充於鞘管53之內部的還原氣體G排出。於鞘管53的軟化退火爐本體52,於其下端部突出的鞘管下側突出部分56之下端,形成有下端開口部55d。The upper end opening portion 55u allows the to-be-plated wire 1a to be introduced into the inside of the sheath tube 53, and the reducing gas G filled in the inside of the sheath tube 53 is discharged as will be described later. The lower end opening 55d is formed in the lower end of the sheath lower protruding portion 56 which protrudes from the lower end portion of the softened annealing furnace body 52 of the sheath tube 53.
下端開口部55d容許待鍍線1a從鞘管53導出。鞘管下側突出部分56與連結管55串聯地連結。更進一步,鞘管下側突出部分56之中間部分構成一分枝部分,該分枝部分係作為還原氣體供給部57而構成,還原氣體供給部57將供給還原氣體G供給至鞘管53之內部。The lower end opening portion 55d allows the wire 1a to be plated to be led out from the sheath tube 53. The sheath lower protruding portion 56 is coupled to the connecting tube 55 in series. Further, the intermediate portion of the lower projection portion 56 of the sheath constitutes a branch portion which is configured as the reducing gas supply portion 57, and the reducing gas supply portion 57 supplies the supply of the reducing gas G to the inside of the sheath 53 .
又,雖圖未顯示,還原氣體供給部57係具有壓力調節閥、壓力計等,且還原氣體供給部57對應上述軟化退火爐51之內部的還原氣體G的濃度,可調節還原氣體G的流入量。Further, although not shown, the reducing gas supply unit 57 includes a pressure regulating valve, a pressure gauge, and the like, and the reducing gas supply unit 57 adjusts the inflow of the reducing gas G in accordance with the concentration of the reducing gas G inside the softening annealing furnace 51. the amount.
藉由還原氣體G從還原氣體G供給部57流入鞘管53的內部,而將內部作為還原氣體環境。The reducing gas G flows into the inside of the sheath tube 53 from the reducing gas G supply portion 57, and the inside thereof serves as a reducing gas atmosphere.
加熱器54具有複數個構成於直線的棒狀物,且相對鞘管53配置於上方側空間及下方側空間,而於軟化退火爐本體52之內部空間隔著鞘管53相對。加熱器54係設置於相對待鍍線1a之行走方向垂直的方向,詳細而言,係正面觀視圖2之紙面時,相當於相對圖2之紙面而垂直的方向,複數個加熱器54分別於上方側空間及下方側空間,沿著行走方向且每隔一指定間隔並列配置。The heater 54 has a plurality of rods formed in a straight line, and is disposed in the upper side space and the lower side space with respect to the sheath tube 53, and is opposed to the sheath tube 53 with the inside of the softening annealing furnace body 52 interposed therebetween. The heater 54 is disposed in a direction perpendicular to the traveling direction of the to-be-plated wire 1a. Specifically, when it is the paper surface of the front view 2, it corresponds to a direction perpendicular to the paper surface of FIG. 2, and the plurality of heaters 54 are respectively The upper side space and the lower side space are arranged side by side at every specified interval along the traveling direction.
軟化退火爐51之內部係藉由加熱器54設定為800℃或800℃以上的溫度設定。The inside of the softening annealing furnace 51 is set by the heater 54 to a temperature of 800 ° C or higher.
藉由鞘管下側突出部分56與連結管55串聯地連結,可使通過軟化退火爐51的待鍍線1a在浸入熔融浸鍍銲錫液63中之前,不與空氣接觸而行走。 By connecting the sheath lower protruding portion 56 and the connecting tube 55 in series, the wire 1a to be plated through the softening annealing furnace 51 can be moved without coming into contact with the air before being immersed in the molten immersion solder liquid 63.
浸鍍機構61係以貯存有熔融浸鍍銲錫液63的熔融浸鍍銲錫槽62而構成,熔融浸鍍銲錫液63係設定為260℃的設定溫度,且係使用熔融錫(Sn-3.0Ag-0.5Cu)。 The immersion plating mechanism 61 is configured by a molten immersion solder bath 62 in which the molten immersion solder liquid 63 is stored, and the molten immersion solder liquid 63 is set at a set temperature of 260 ° C, and molten tin (Sn-3.0Ag- is used). 0.5Cu).
熔融浸鍍銲錫槽62的內部配置有槽中方向轉換滾輪64,槽中方向轉換滾輪64係將表面附著有熔融浸鍍銲錫液63的浸鍍線1b的行走方向,轉換為往垂直上方的方向。 In the molten dip solder bath 62, a groove direction direction changing roller 64 is disposed, and the groove direction direction changing roller 64 converts the traveling direction of the dip plating line 1b to which the molten dip solder liquid 63 adheres to the direction vertically upward. .
更進一步,槽中方向轉換滾輪64的垂直上方具有槽上方向轉換滾輪65,槽上方向轉換滾輪65係將浸鍍線1b從垂直上方的行走方向轉換為朝向捲取機構71的方向。 Further, the in-slot direction changing roller 64 has a groove upward direction changing roller 65 vertically upward, and the groove up direction switching roller 65 converts the dip plating line 1b from the vertically upward traveling direction to the direction toward the winding mechanism 71.
槽中方向轉換滾輪64及槽上方向轉換滾輪65係大於一般ψ 20mm左右的滾輪,例如係以ψ 100mm左右的滾輪而構成。更進一步,槽中方向轉換滾輪64及槽上方向轉換滾輪65係藉由各別所具有、圖未顯示的驅動馬達,以略同於捲取機構71所具有、稍後說明的張力擺動輪(dancer roller)74,或線架(bobbin)的轉動速度,自我積極地主動轉動,使其與捲取機構71的捲取速度同一步調,而進行浸鍍線1b的方向轉換。其中,根據日本工業規格(JIS)第JISZ8317-1號標準所記載的準則,「ψ」係表示圓弧或全圓的直徑數值前方所標注的記號。 The in-slot direction changing roller 64 and the in-slot direction changing roller 65 are larger than a roller having a diameter of about 20 mm, for example, a roller having a diameter of about 100 mm. Further, the in-slot direction changing roller 64 and the in-slot direction changing roller 65 are similar to those of the winding mechanism 71, which will be described later, by a drive motor not shown in the drawings. The rotation speed of the roller 74 or the bobbin is actively and actively rotated to make the same direction as the take-up speed of the take-up mechanism 71, and the direction of the dip plating line 1b is switched. In addition, according to the standard described in Japanese Industrial Standards (JIS) JIS Z8317-1, "ψ" is a symbol indicated in front of the diameter value of an arc or a full circle.
接著,針對捲取機構71作說明。 Next, the winding mechanism 71 will be described.
捲取機構71係以捲取張力調節機72及橫動線架 (bobbin traverse)方式捲取機75而構成。 The take-up mechanism 71 is a take-up tension adjusting machine 72 and a traverse wire frame (bobbin traverse) is constructed by the winding machine 75.
捲取張力調節機72具有張力擺動輪74,對應架越於固定滾輪73的浸鍍線1b被施加的張力,使張力擺動輪74於上下方向可動,調節張力的狀態。雖圖未顯示,捲取張力調節機72更係以張力檢測感應器、控制部及滾輪可動機而構成,張力檢測感應器係檢測浸鍍線1b的張力,控制部係對應該張力檢測感應器所檢測的張力而控制,以使張力安定,滾輪可動機係根據控制部的指令而使張力擺動輪74可動。 The take-up tension adjusting machine 72 has a tension swinging wheel 74, and the tension swinging wheel 74 is movable in the vertical direction to adjust the tension state in response to the tension applied to the dip plating line 1b of the fixed roller 73. Although not shown, the take-up tension adjuster 72 is further configured by a tension detecting sensor, a control unit, and a roller actuator. The tension detecting sensor detects the tension of the immersion plating line 1b, and the control unit corresponds to the tension detecting sensor. The detected tension is controlled so that the tension is stabilized, and the roller actuator is made to move the tension swinging wheel 74 in accordance with an instruction from the control unit.
如圖3(a)所示,橫動線架方式捲取機75係以線架76、馬達77及傳達機構78而構成,線架76係對應浸鍍線1b的寬度而粗寬地構成,馬達77使該線架76沿著該線架76的軸方向擺動,傳達機構78係傳達馬達77之驅動的滾珠螺桿(ball screw)等。橫動線架方式捲取機75更係以捲取力檢測感應器79、控制部81及馬達82而構成,捲取力檢測感應器79係檢測線架76之捲取力,控制部81係對應該捲取張力檢測感應器79所檢測的捲取力而控制,以使該張力安定,馬達82係根據控制部81的指令而使線架76轉動。 As shown in Fig. 3 (a), the traverse bobbin winding machine 75 is constituted by a bobbin 76, a motor 77, and a transmission mechanism 78, and the bobbin 76 is formed to be thick and wide corresponding to the width of the dip plating line 1b. The motor 77 swings the wire frame 76 in the axial direction of the wire frame 76, and the transmission mechanism 78 transmits a ball screw or the like that drives the motor 77. The traverse bobbin winding machine 75 is configured by a winding force detecting sensor 79, a control unit 81, and a motor 82. The winding force detecting sensor 79 detects the winding force of the bobbin 76, and the control unit 81 is used. The winding force is detected by the winding force detected by the tension detecting sensor 79 so that the tension is stabilized, and the motor 82 rotates the wire frame 76 in accordance with an instruction from the control unit 81.
依此構成的鍍銲錫線的製造裝置10,係將浸鍍前處理機構2、浸鍍機構61及捲取機構71,分別從待鍍線1a及浸鍍線1b的行走方向的上游側依序串列地一連串配置,其中供給裝置12、加熱處理爐22、酸洗淨槽31、超音波水洗淨槽41及軟化退火爐51作為浸鍍前處理機構2,熔 融浸鍍銲錫槽62作為浸鍍機構61。 The apparatus for manufacturing a plated solder wire 10 configured as described above is a step of immersing the pre-coating treatment mechanism 2, the dip plating mechanism 61, and the winding mechanism 71 from the upstream side of the traveling direction of the to-be-plated wire 1a and the dip plating line 1b. A series of arrangements in which the supply device 12, the heat treatment furnace 22, the acid cleaning tank 31, the ultrasonic water washing tank 41, and the softening annealing furnace 51 are used as the pre-dip processing mechanism 2, and are melted. The immersion plating solder bath 62 serves as the immersion plating mechanism 61.
更進一步,鍍銲錫線的製造裝置10的構成,係使施行浸浸鍍前的待鍍線1a的0.2%耐力值(proof stress)降低,其後,於此已低耐力化的待鍍線1a施行浸鍍,在進行這些工序期間,藉由上述捲取機構71,且以低於該浸鍍線1b之耐力的捲取力進行捲取。 Further, the structure of the soldering wire manufacturing apparatus 10 is such that the 0.2% proof stress of the wire 1a to be plated before the immersion plating is lowered, and thereafter, the line to be plated 1a having low endurance is used. The immersion plating is performed, and during the process, the winding mechanism 71 is used to wind up at a winding force lower than the endurance of the immersion plating line 1b.
具體地,作為捲取機構71,係採用上述捲取張力調節機72及橫動線架方式捲取機75,且設置第一輸送絞盤(capstan)91及第二輸送絞盤92,其輔助捲取機構71的捲取。第一輸送絞盤91及第二輸送絞盤92皆設置於軟化退火爐51之上游側,以輔助輸送低耐力化前的待鍍線1a的行走。 Specifically, as the take-up mechanism 71, the above-described take-up tension adjusting machine 72 and the traverse bobbin type winding machine 75 are used, and a first conveying winch 91 and a second conveying winch 92 are provided, which are auxiliary winding. The winding of the mechanism 71. The first conveying winch 91 and the second conveying winch 92 are both disposed on the upstream side of the softening annealing furnace 51 to assist in the conveyance of the to-be-plated wire 1a before the low endurance.
詳細而言,第一輸送絞盤91係設置於加熱處理爐22與酸洗淨槽31之間,而第二輸送絞盤92係設置於超音波水洗浄槽41與軟化退火爐51之間。 Specifically, the first transfer winch 91 is disposed between the heat treatment furnace 22 and the pickling tank 31, and the second feed winch 92 is disposed between the ultrasonic water washing tank 41 and the softening annealing furnace 51.
又,浸鍍線1b的捲取速度太慢或太快時,浸鍍線1b所承受的負荷變大。特別係捲取速度太快時,亦會產生線條偏移的問題,因此,第一輸送絞盤91及第二輸送絞盤92的速度僅稍快於捲取機構71的捲取速度,例如,相對捲取速度係快於+1m/min左右的輸送速度,將待鍍線1a及浸鍍線1b送出至下游側。 Further, when the winding speed of the dip plating line 1b is too slow or too fast, the load on the dip plating line 1b becomes large. In particular, when the take-up speed is too fast, the problem of line offset is also generated. Therefore, the speeds of the first transport winch 91 and the second transport winch 92 are only slightly faster than the take-up speed of the take-up mechanism 71, for example, a relative roll. The take-up speed is faster than the transport speed of about +1 m/min, and the to-be-plated line 1a and the dip-plating line 1b are sent out to the downstream side.
捲取機構71於上述捲取張力調節機72及橫動線架方式捲取機75的附近,適當地具有複數架越浸鍍線1b的固定滾輪73。 The winding mechanism 71 appropriately has a plurality of fixed rollers 73 that are immersed in the immersion plating line 1b in the vicinity of the winding tension adjusting device 72 and the traverse bobbin winding machine 75.
於捲取機構71所配置的複數固定滾輪73之中,於行走方向最上游側所設置的固定滾輪73,係設定為捲取機構上游側配置滾輪73A。捲取機構上游側配置滾輪73A,係浸鍍線1b藉由槽上方向轉換滾輪65方向轉換後,最初將往捲取機構71一側行走的浸鍍線1b架越在捲取機構71一側的滾輪。 Among the plurality of fixed rollers 73 disposed in the winding mechanism 71, the fixed roller 73 provided on the most upstream side in the traveling direction is set as the upstream side arrangement roller 73A of the winding mechanism. The roller 73A is disposed on the upstream side of the winding mechanism, and the dip plating line 1b is firstly wound on the side of the winding mechanism 71 by the direction of the groove direction switching roller 65. Roller.
槽上方向轉換滾輪65係配置在高於捲取機構上游側配置滾輪73A的位置。 The groove direction changing roller 65 is disposed at a position higher than the roller 73A on the upstream side of the winding mechanism.
接著,針對鍍銲錫線的製造方法作說明。 Next, a method of manufacturing a plating solder wire will be described.
鍍銲錫線的製造方法係經由浸鍍前處理工序、浸鍍工序及捲取工序而製造,浸鍍前處理工序對待鍍線1a進行浸鍍前處理,浸鍍工序於待鍍線1a的表面施行鍍銲錫,捲取工序捲取表面已施行浸鍍的浸鍍線1b。 The method of manufacturing the plated solder wire is produced by a pre-dip plating process, a dip plating process, and a coiling process, and the pre-dip plating process is performed on the plating line 1a before the immersion plating process, and the immersion plating process is performed on the surface of the to-be-plated wire 1a. The soldering is performed, and the coiling process is performed on the surface of which the immersion plating line 1b has been subjected to immersion plating.
浸鍍前處理工序係依序進行加熱處理工序、酸洗浄工序、水洗浄工序及軟化退火工序的工序。 The pre-dip plating treatment step is a step of sequentially performing a heat treatment step, an acid washing step, a water washing step, and a softening annealing step.
加熱處理工序依藉由待鍍線1a行走於作為蒸氣環境的加熱處理爐22之內部,而將待鍍線1a的表面蒸氣洗浄的工序。藉由此蒸氣洗浄,可使待鍍線1a的表面所附著的水溶性潤滑劑或其他不純物從其表面分離,而容易去除待鍍線1a之表面所附著的水溶性潤滑劑或其他不純物。 The heat treatment step is a step of washing the surface vapor of the wire 1a to be plated by the inside of the heat treatment furnace 22 as a vapor atmosphere by the wire 1a to be plated. By the vapor cleaning, the water-soluble lubricant or other impurities adhering to the surface of the wire 1a to be plated can be separated from the surface thereof, and the water-soluble lubricant or other impurities adhering to the surface of the wire 1a to be plated can be easily removed.
加熱處理工序係加熱處理爐22內的退火溫度設定為低於一般650℃左右的200℃退火溫度,將設定為此低溫的加熱處理爐22內作為蒸氣環境,而使待鍍線1a行走,以對待鍍線1a進行水蒸氣洗浄。 In the heat treatment step, the annealing temperature in the heat treatment furnace 22 is set to be lower than the annealing temperature of 200 ° C which is generally about 650 ° C, and the inside of the heat treatment furnace 22 set to the low temperature is used as a vapor atmosphere, and the wire to be plated 1a is moved to The plating line 1a is subjected to steam cleaning.
如上所述,加熱處理工序對待鍍線1a進行水蒸氣洗浄之外,更藉由將待鍍線1a退火而使其低耐力化。但,加熱處理工序係藉由將退火溫度設定為例如200℃等低溫設定,而抑制待鍍線1a低耐力化的程度。 As described above, in the heat treatment step, the plating wire 1a is subjected to steam cleaning, and the wire to be plated 1a is annealed to have low endurance. However, the heat treatment step suppresses the degree of low endurance of the to-be-plated wire 1a by setting the annealing temperature to a low temperature setting such as 200 °C.
又,通過加熱處理爐22後的待鍍線1a,係通過連結管24後藉由行走於冷卻水槽23之內部所貯存的冷卻水,而冷卻至指定溫度。 Moreover, the wire 1a to be plated after the heat treatment furnace 22 is heated is cooled to a predetermined temperature by the connection pipe 24 and then by the cooling water stored in the inside of the cooling water tank 23.
酸洗浄工序係藉由待鍍線1a行走於酸洗浄槽31所貯存的磷酸系洗浄液32,而對行走於其中之待鍍線1a的表面進行酸洗浄。 In the acid washing step, the surface of the wire to be plated 1a on which the wire to be plated 1a is stored is acid-washed by the phosphate-based cleaning liquid 32 stored in the acid cleaning tank 31 to be plated.
水洗浄工序係於超音波洗浄槽41中超音波水洗浄待鍍線1a的表面,而除去該待鍍線1a之表面所附著的水溶性潤滑劑或其他不純物。 The water washing step is to wash the surface of the to-be-plated wire 1a by ultrasonic water in the ultrasonic cleaning tank 41, and remove the water-soluble lubricant or other impurities attached to the surface of the wire 1a to be plated.
軟化退火工序係藉由待鍍線1a行走於內部作為還原氣體環境的軟化退火爐51之內部,而使待鍍線1a軟化退火、低耐力化,且還原待鍍線1a之表面的氧化層。 The softening annealing step is performed by softening and annealing the wire to be plated 1a, lowering the endurance, and reducing the oxide layer on the surface of the wire to be plated 1a by the inside of the softening annealing furnace 51 in which the wire 1a to be plated is to be used as a reducing gas atmosphere.
詳細如圖2所示,軟化退火工序,係從鞘管下側突出部分56所設置之還原氣體供給部57,供給還原氣體G至軟化退火爐51的鞘管53的內部,軟化退火爐51係傾斜配置,而使其下游側端部於行走方向的位置低於上游側端部於行走方向的位置,作為還原氣體G,例如係氫氣氣體(hydrogen gas)與氮氣氣體(nitrogen gas)混合的混合氣體,鞘管53之內部作為還原性氣體環境(atmosphere)。更進一步,藉由加熱器54,使軟化退火爐本體52的內部 空間加熱至約800℃。 Specifically, as shown in FIG. 2, the softening annealing step is to supply the reducing gas G to the inside of the sheath tube 53 of the softening annealing furnace 51 from the reducing gas supply unit 57 provided in the lower projection portion 56 of the sheath tube, and to soften the annealing furnace 51. The inclined arrangement is such that the position of the downstream end portion in the traveling direction is lower than the position of the upstream side end portion in the traveling direction, and the reducing gas G is, for example, a mixture of hydrogen gas and nitrogen gas. The gas, the inside of the sheath tube 53 serves as a reducing gas atmosphere. Further, the inside of the softening annealing furnace body 52 is made by the heater 54 The space is heated to about 800 °C.
於作為還原氣體環境的鞘管53之內部中,從上端開口部55u導入的待鍍線1a係往還原氣體G之上升方向d1的相反方向,即下方向D行走(參照圖2中一部分放大圖所示的箭頭d1、D)。 In the inside of the sheath tube 53 as the reducing gas atmosphere, the wire 1a to be plated introduced from the upper end opening 55u is moved in the opposite direction to the rising direction d1 of the reducing gas G, that is, in the lower direction D (refer to a partial enlarged view in FIG. 2). Arrows d1, D) are shown.
接續的浸鍍工序,係藉由待鍍線1a行走於熔融浸鍍銲錫槽62所貯存的熔融浸鍍銲錫液63,而使熔融錫附著於待鍍線1a的表面。 In the subsequent immersion plating step, the molten immersion plating liquid 63 stored in the molten immersion solder bath 62 is to be adhered to the surface of the line to be plated 1a by the molten immersion plating liquid 63 stored in the molten immersion solder bath 62.
從軟化退火爐51之下端開口部55d導出的待鍍線1a,係藉由行走於連結管55之內部,而不與空氣接觸,在浸入熔融浸鍍銲錫液63之前被引導。 The wire 1a to be plated, which is led out from the lower end opening 55d of the softening annealing furnace 51, is guided by the inside of the connecting pipe 55 without being in contact with the air, and before being immersed in the molten immersion soldering liquid 63.
浸入熔融浸鍍銲錫液63的待鍍線1a,係其表面附著熔融浸鍍銲錫液63,而變成表面整體係以熔融浸鍍銲錫液63覆蓋的浸鍍線1b。浸鍍線1b在行走於熔融浸鍍銲錫槽62之內部的過程,係藉由熔融浸鍍銲錫槽62中所具有的槽中方向轉換滾輪64,在行走於熔融浸鍍銲錫槽62之過程,方向轉換至垂直上方,而從熔融浸鍍銲錫槽62朝向垂直上方導出。 The wire 1a to be plated which is immersed in the molten immersion solder liquid 63 is adhered to the surface of the molten immersion soldering liquid 63, and the immersion plating line 1b which is covered with the molten immersion soldering liquid 63 is formed on the entire surface. The process of walking the inside of the molten dip solder bath 62 by the dip plating line 1b is carried out by the in-slot direction changing roller 64 provided in the molten dip solder bath 62 while walking in the molten dip solder bath 62. The direction is shifted to the vertical direction and is led out from the molten dip solder bath 62 toward the vertical direction.
浸鍍線1b係從熔融浸鍍銲錫槽62導出後,藉由槽上方向轉換滾輪65進行方向轉換,往捲取機構71側行走。 The dip plating line 1b is led out from the molten dip solder bath 62, and is direction-shifted by the groove up direction switching roller 65, and travels toward the winding mechanism 71 side.
捲取工序係在待鍍線1a進行上述浸鍍前工序與浸鍍工序期間,一邊藉由捲取張力調節機72之張力擺動輪74的控制,對已經經由這些工序的浸鍍線1b進行張力調節,一邊整列地將浸鍍線1b捲起於橫動線架方式捲取機75所 配置的線架76。 In the winding-up process, the tension of the immersion plating line 1b which has passed through these processes is controlled by the tension oscillation wheel 74 of the winding tension adjusting machine 72 during the immersion plating process and the immersion plating process in the to-be-plated wire 1a. Adjusting, rolling the dip plating line 1b to the traverse line frame winding machine 75 in a row The configured wire rack 76.
詳細如圖3(a)、(b)所示,一邊使橫動線架方式捲取機75的線架76軸轉動,一邊使線架76往軸方向擺動,可將浸鍍線1b沿著線架76的軸方向並列捲起,且係可複數層重合而捲取。 As shown in detail in Fig. 3 (a) and (b), while the wire frame 76 of the traverse bobbin type winding machine 75 is pivoted, the wire frame 76 is swung in the axial direction, and the dip plating line 1b can be along The axial direction of the wire frame 76 is rolled up side by side, and the plurality of layers may be overlapped and taken up.
上述鍍銲錫線的製造裝置10及製造方法可獲得如下各式各樣的作用、效果。 The above-described various functions and effects of the above-described various types of the soldering wire manufacturing apparatus 10 and the manufacturing method can be obtained.
鍍銲錫線的製造裝置10,係將浸鍍前處理機構2、浸鍍機構61及捲取機構71,分別從浸鍍線1b之行走方向的上游側依序一連串配置,其中供給裝置12、加熱處理爐22、酸洗淨槽31、超音波水洗淨槽41及軟化退火爐51作為浸鍍前處理機構2,熔融浸鍍銲錫槽62作為浸鍍機構61。 In the manufacturing apparatus 10 for the soldering wire, the immersion plating pretreatment mechanism 2, the immersion plating mechanism 61, and the winding mechanism 71 are arranged in series from the upstream side in the traveling direction of the immersion plating line 1b, wherein the supply device 12 and the heating are provided. The processing furnace 22, the acid cleaning tank 31, the ultrasonic water washing tank 41, and the softening annealing furnace 51 are used as the pre-dip plating treatment mechanism 2, and the molten dip solder bath 62 is used as the dip plating mechanism 61.
藉由這樣一連串配置各機構,可防止已低耐力化的浸鍍線1b於製造中行走無謂的距離,且可降低浸鍍線1b於行走中所承受的負荷。 By arranging the respective mechanisms in this series, it is possible to prevent the immersion plating line 1b having low endurance from walking an unnecessary distance during manufacture, and to reduce the load on the immersion plating line 1b during traveling.
因此,可獲得0.2%耐力值充份降低、期望品質的浸鍍線1b,藉由使這樣的浸鍍線1b安定而獲得,可提升製品產率,又,可提升製造效率。 Therefore, the dip plating line 1b having a 0.2% sufficient endurance value and a desired quality can be obtained, and by obtaining such a dip plating line 1b, the product yield can be improved and the manufacturing efficiency can be improved.
又更進一步,鍍銲錫線的製造方法,係連續地進行加熱處理工序、酸洗淨工序、超音波水洗淨工序及軟化退火工序、浸鍍處理工序及捲取工序各工序,加熱處理工序、酸洗淨工序、水洗淨工序及軟化退火工序係作為浸鍍前處理工序。 Furthermore, the method for producing a plated solder wire is to continuously perform a heat treatment step, an acid cleaning step, an ultrasonic water washing step, a softening annealing step, a dip plating treatment step, and a winding step, and a heat treatment step, The acid washing step, the water washing step, and the softening annealing step are used as a pre-dip plating treatment step.
藉由這樣連續進行各工序,不需花費將浸鍍線1b(待鍍線1a)移行至另一行走線等的時間,例如每經過一指定工序,為了進行下一工序而中斷浸鍍線1b(待鍍線1a)的行走。因此,可大幅地緩和浸鍍線1b所承受的負荷,且可使期望品質的浸鍍線1b安定而獲得。 By continuously performing the respective steps in this manner, it is not necessary to spend the time of moving the dip plating line 1b (the line to be plated 1a) to another traveling line or the like, for example, every time a predetermined process is passed, the immersion plating line 1b is interrupted for the next process. Walking of (to be plated 1a). Therefore, the load applied to the immersion plating line 1b can be greatly alleviated, and the immersion plating line 1b of a desired quality can be stabilized and obtained.
因此,可獲得0.2%耐力值充份降低、期望品質的浸鍍線1b,藉由使這樣的浸鍍線1b安定而獲得,可提升製品產率,又,可提升製造效率。 Therefore, the dip plating line 1b having a 0.2% sufficient endurance value and a desired quality can be obtained, and by obtaining such a dip plating line 1b, the product yield can be improved and the manufacturing efficiency can be improved.
更進一步,可有效率地製造0.2%耐力值充份降低、期望品質的浸鍍線1b,因此,可達到大量生產適合且低耐力化的浸鍍線1b,以作為太陽能電池用導線。 Further, the dip plating line 1b having a 0.2% proof endurance value and a desired quality can be efficiently produced, and therefore, a dip plating line 1b suitable for mass production and low endurance can be obtained as a lead wire for a solar cell.
又,鍍銲錫線的製造裝置10,係上述軟化退火爐51係傾斜配置,而使其下游側端部於行走方向的位置低於其上游側端部於行走方向的位置,且於上述軟化退火爐51之行走方向的下游側設有還原氣體供給部57,其容許對鞘管53供給還原氣體G,鞘管53則容許待鍍線1a於插入其內部之狀態行走。 Further, in the apparatus for manufacturing a solder wire, the softening annealing furnace 51 is disposed obliquely, and the position of the downstream end portion in the traveling direction is lower than the position of the upstream end portion in the traveling direction, and the softening is performed. The downstream side of the traveling direction of the furnace 51 is provided with a reducing gas supply portion 57 that allows the reducing gas G to be supplied to the sheath tube 53, and the sheath tube 53 allows the wire to be plated 1a to travel while being inserted into the inside.
鍍銲錫線的製造方法,係於軟化退火工序中,且於軟化退火爐51之內部,由通過鞘管53之下端側部分(下游側部分)所設置的還原氣體供給部57,將還原氣體G供給至鞘管53之內部,使待鍍線1a於作為還原氣體環境之鞘管53的內部,從行走方向的上游側朝向下游側行走。 The method of producing the soldering wire is in the softening annealing step, and inside the softening annealing furnace 51, the reducing gas G is supplied from the reducing gas supply portion 57 provided through the lower end side portion (downstream side portion) of the sheath tube 53. The inside of the sheath tube 53 is supplied, and the wire to be plated 1a is moved inside the sheath tube 53 as a reducing gas atmosphere from the upstream side in the traveling direction toward the downstream side.
如圖2所示,藉由上述鍍銲錫線的製造裝置10及製造方法,在作為還原氣體環境的鞘管53的內部中,待鍍 線1a可朝向還原氣體G上升之方向d1相反的方向,即朝向下方向D行走。 As shown in FIG. 2, in the inside of the sheath tube 53 as a reducing gas atmosphere, the apparatus for manufacturing a plating wire and the manufacturing method thereof are to be plated. The line 1a can travel in a direction opposite to the direction d1 in which the reducing gas G rises, that is, in the downward direction D.
藉此,可使行走於鞘管53之內部的待鍍線1a,積極地暴露於還原氣體G上升的環境中,因此,可有效率地促進待鍍線1a之表面的氧化層的還原及待鍍線1a的低耐力。 Thereby, the to-be-plated wire 1a which walks inside the sheath tube 53 can be actively exposed to the environment in which the reducing gas G rises, and therefore, the reduction of the oxide layer on the surface of the to-be-plated wire 1a can be efficiently promoted. Low endurance of plating line 1a.
再者,於鞘管53之內部,行走中的待鍍線1a其長度方向的下端側部分(下游側部分),通過還原氣體供給部57,可暴露於重新供給至鞘管53之內部不久的還原氣體G的環境(參照圖2)。 Further, in the inside of the sheath tube 53, the lower end side portion (downstream side portion) in the longitudinal direction of the to-be-plated wire 1a during traveling is exposed to the inside of the sheath tube 53 by the reducing gas supply portion 57. The environment in which the gas G is reduced (refer to Fig. 2).
即,於鞘管53之內部,行走中的待鍍線1a接近還原氣體供給部57時,可積極地促進待鍍線1a的低耐力化及表面的氧化層的還原,待鍍線1a通過還原氣體供給部57而從軟化退火爐51導出期間,藉由在加熱器54的加熱之下,可確實地進行待鍍線1a的低耐力化及表面的氧化層的還原。 In other words, in the inside of the sheath tube 53, when the to-be-plated line 1a while walking is close to the reducing gas supply unit 57, the low endurance of the to-be-plated wire 1a and the reduction of the oxide layer on the surface can be actively promoted, and the plating line 1a is restored. During the derivation of the gas supply unit 57 from the softening annealing furnace 51, under the heating of the heater 54, the low endurance of the to-be-plated wire 1a and the reduction of the oxide layer on the surface can be surely performed.
又,依此可確實且有效率地進行待鍍線1a的低耐力化及表面的氧化層的還原,因此,可達到縮短待鍍線1a行走於軟化退火爐51之內部的行走距離,且可達到提升待鍍線1a的行走速度。 Further, in this way, the low endurance of the to-be-plated wire 1a and the reduction of the oxide layer on the surface can be reliably and efficiently performed, so that the walking distance of the wire to be plated 1a traveling inside the softening annealing furnace 51 can be shortened, and The traveling speed of the wire 1a to be plated is increased.
更進一步,於浸鍍前處理工序中,係於軟化退火工序中使用軟化退火爐51同時進行待鍍線1a的低耐力化及其表面的氧化層的去除,而相較以各別工序串聯地進行還原待鍍線1a之表面所具有的氧化膜的還原工序,以及進行待鍍線1a之軟化退火的軟化退火工序,前者可達到縮短待鍍 線1a的行走距離。 Further, in the pre-dip plating treatment step, the softening annealing furnace 51 is used in the softening annealing step to simultaneously perform the low endurance of the to-be-plated wire 1a and the removal of the oxide layer on the surface thereof, and in series with the respective processes. The reduction step of reducing the oxide film on the surface of the line to be plated 1a, and the softening annealing step of softening annealing of the line to be plated 1a, the former can be shortened to be plated The walking distance of line 1a.
因此,可降低低耐力化的待鍍線1a所承受的負荷,而可製造高品質的浸鍍線1b。 Therefore, it is possible to reduce the load on the line to be plated 1a which is low in endurance, and to manufacture a high-quality immersion plating line 1b.
又,於軟化退火工序前所進行的加熱處理工序,係於加熱處理爐22中藉由加熱去除待鍍線1a之表面所附著的附著物。例如,附著物係油等液狀附著物的情況,可將其汽化。依此,無關固狀、液狀等附著物的性質,可從待鍍線1a之表面去除附著物。 Further, the heat treatment step performed before the softening annealing step is to remove the adhering matter adhering to the surface of the wire to be plated 1a by heating in the heat treatment furnace 22. For example, when the deposit is a liquid deposit such as oil, it can be vaporized. Accordingly, the deposit can be removed from the surface of the wire 1a to be plated regardless of the nature of the adhering substance such as solid or liquid.
特別地,藉由在酸洗浄工序之前進行加熱處理工序,係在加熱處理工序中預先加熱待鍍線1a,而可在酸洗浄工序對加熱狀態的待鍍線1a進行酸洗浄,因此,更可提升酸洗浄效果。 In particular, by performing the heat treatment step before the acid washing step, the line to be plated 1a is previously heated in the heat treatment step, and the line to be plated 1a in the heated state can be acid washed in the acid washing step, and therefore, Improve the acid cleansing effect.
更進一步,於加熱處理爐22中,亦可根據加熱溫度而獲得對待鍍線1a的退火效果。 Further, in the heat treatment furnace 22, the annealing effect of the plating wire 1a can be obtained according to the heating temperature.
然而,依據上述鍍銲錫線的製造裝置10及製造方法,於加熱處理工序,係軟化退火爐51之上游側所配置的加熱處理爐22,於待鍍線1a的0.2%耐力值完全降低至指定值前,不對待鍍線1a進行軟化退火,而係停留在輕度的軟化退火。接著,於加熱處理工序後的洗浄工序,對待鍍線1a完成必要的洗浄,其後,於浸鍍工序之前進行的軟化退火工序,對待鍍線1a進行軟化退火,以使其0.2%耐力值降低至指定值。 However, according to the above-described soldering wire manufacturing apparatus 10 and the manufacturing method, in the heat treatment process, the heat treatment furnace 22 disposed on the upstream side of the softening annealing furnace 51 is completely lowered to 0.2% of the endurance value to be plated 1a. Before the value, the plating line 1a is not subjected to softening annealing, but is left in a mild softening annealing. Next, in the washing step after the heat treatment step, the plating line 1a is subjected to necessary washing, and then the softening annealing step is performed before the immersion plating step, and the plating line 1a is soft-annealed to lower the 0.2% proof value. To the specified value.
藉此,不須對已低耐力化的待鍍線1a進行洗浄工序,因此,可減輕待鍍線1a所承受的負荷。 Thereby, it is not necessary to perform the washing process for the to-be-plated wire 1a which has low endurance, and it can reduce the load which the to-be-plated wire 1a can bear.
詳細而言,相對一般加熱處理爐進行退火時的設定度溫度約650℃,加熱處理爐22係如上所述,例如設定為約200℃的低溫,以作為蒸氣環境。 Specifically, the set temperature at the time of annealing in a general heat treatment furnace is about 650 ° C, and the heat treatment furnace 22 is set to a low temperature of about 200 ° C as a vapor atmosphere as described above.
更進一步,相對一般軟化退火爐的溫度設定為約530℃,軟化退火爐51係如上所述,例如設定為約800℃的高溫。 Further, the temperature of the general softening annealing furnace is set to about 530 ° C, and the softening annealing furnace 51 is set to, for example, a high temperature of about 800 ° C as described above.
藉此,於加熱處理工序抑制待鍍線1a的低耐力化,而於其後的酸洗浄、超音波水洗浄等洗浄工序之後所進行的軟化退火工序,使用軟化退火爐51,而使待鍍線1a之0.2%耐力值降低至指定值而低耐力化。 In this way, in the heat treatment step, the low-endurance of the to-be-plated wire 1a is suppressed, and the softening annealing process performed after the subsequent washing step such as acid washing or ultrasonic water washing uses the softening annealing furnace 51 to be plated. The 0.2% endurance value of the line 1a is lowered to a specified value and the endurance is low.
因此,藉由對低耐力化前的待鍍線1a進行酸洗浄、超音波水洗浄,相較例如習知係對低耐力化後的待鍍線1a進行這些工序的情況,前者可減輕帶給待鍍線1a負荷的影響,此程度係可達到提升浸鍍線1b的品質。 Therefore, the acid to be plated 1a before the low endurance is washed by the ultrasonic wave and the ultrasonic wave is washed, and the former can be lightened, for example, in the case where the process is performed on the to-be-plated wire 1a after the low endurance. The effect of the load of the plating line 1a is such that the quality of the immersion plating line 1b can be improved.
又,加熱處理爐22係其內部作為蒸氣環境,因此,根據加熱溫度,亦可對待鍍線1a進行軟化退火,亦可期待蒸氣洗浄的效果。因此,於加熱處理爐22對待鍍線1a進行蒸氣洗浄之同時,藉由蒸氣可使待鍍線1a之表面所附著之附著物容易去除而表層化,因此,於其後所進行的酸洗浄工序及水洗浄工序,可確實地去除待鍍線1a之表面所附著的水溶性潤滑劑或其他不純物。 Further, since the inside of the heat treatment furnace 22 serves as a vapor atmosphere, the plating line 1a may be soft-annealed depending on the heating temperature, and the effect of steam washing may be expected. Therefore, in the heat treatment furnace 22, the plating line 1a is subjected to vapor cleaning, and the adhering matter adhering to the surface of the to-be-plated wire 1a is easily removed by the vapor to be surface-formed, and therefore, the acid cleaning process is performed thereafter. And the water washing step, which can surely remove the water-soluble lubricant or other impurities attached to the surface of the wire 1a to be plated.
因此,可製造以均勻浸鍍厚度覆蓋、高品質的浸鍍線1b。 Therefore, it is possible to manufacture a high-quality immersion plating line 1b which is covered with a uniform immersion plating thickness.
以下,針對效果確認實驗作說明。 Hereinafter, an effect confirmation experiment will be described.
(效果確認實驗) (Effect confirmation experiment)
首先,作為加熱處理工序及軟化退火工序相關的效果確認實驗,針對進行的退火效果確認實驗A、B二個實驗作說明。 First, as an effect confirmation test related to the heat treatment step and the softening annealing step, two experiments of the experiments A and B for confirming the annealing effect were described.
(退火效果確認實驗A) (annealing effect confirmation experiment A)
退火效果確認實驗A係在加熱處理溫度為100度的低溫設定之下,進行加熱處理工序,其後,於軟化退火工序係在各式各樣的退火溫度之下,進行軟化退火。於此情況,使退火溫度的設定與捲取工序後銅線的低耐力值之關係明確,根據此關係,針對為了獲得期望的低耐力值而於軟化退火工序中所須設定的退火溫度作確認。 Annealing effect confirmation Experiment A was subjected to a heat treatment step at a low temperature setting of a heat treatment temperature of 100 degrees, and then soft annealing was performed in a softening annealing step under various annealing temperatures. In this case, the relationship between the setting of the annealing temperature and the low endurance value of the copper wire after the winding step is made clear, and based on this relationship, the annealing temperature to be set in the softening annealing step in order to obtain a desired low endurance value is confirmed. .
又,退火效果確認實驗A係使用上述製造裝置10,且以表1所示的實驗條件進行。 Further, the annealing effect confirmation experiment A was carried out using the above-described manufacturing apparatus 10 under the experimental conditions shown in Table 1.
又,退火效果確認實驗A的結果表示於表2及圖4。 Further, the results of the annealing effect confirmation experiment A are shown in Table 2 and FIG.
於此,表2係表示浸鍍線1b於捲取工序捲取後,測定其拉張特性之一,0.2%耐力值的結果,係於軟化退火爐 51中每一指定退火溫度的設定之下,對待鍍線1a進行退火,再測定浸鍍線1b於捲取工序捲取後的0.2%耐力值。圖4係根據圖2而將浸鍍線1b於捲取工序捲取後的0.2%耐力值與軟化退火溫度的關係曲線化。 Here, Table 2 shows that one of the tensile properties of the dip plating line 1b after winding up in the winding step, and the result of 0.2% proof stress, is in the softening annealing furnace. Under the setting of each of the specified annealing temperatures in 51, the plating line 1a is annealed, and the 0.2% proof stress value of the immersion plating line 1b after the winding step is taken. Fig. 4 is a graph showing the relationship between the 0.2% proof stress value and the softening annealing temperature after the dip plating line 1b is taken up in the winding step according to Fig. 2 .
如表2及圖4所示之結果,係於加熱處理工序的加熱處理溫度為100度的低溫之下,進行加熱處理工序的情況,軟化退火工序的退火溫度例如係550℃左右的低溫時,對待鍍線1a的退火不充份,而顯示0.2%耐力值為偏高傾向的結果。 As shown in Table 2 and FIG. 4, the heat treatment process is performed at a low temperature of 100 degrees in the heat treatment process, and the annealing temperature in the softening annealing process is, for example, a low temperature of about 550 °C. The annealing of the plating line 1a was insufficient, and the 0.2% proof stress value was a tendency to be high.
然而,即使加熱處理工序的加熱處理溫度為100度的低溫,若軟化退火工序的退火溫度為800℃~900℃,可確認捲取後的浸鍍線1b的0.2%耐力值確實地收歛至55MPa以下,為期望的低耐力值。 However, even if the heat treatment temperature in the heat treatment step is a low temperature of 100 degrees, if the annealing temperature in the softening annealing step is 800 ° C to 900 ° C, it can be confirmed that the 0.2% proof stress value of the dip plating line 1b after winding is surely converged to 55 MPa. Hereinafter, it is a desired low endurance value.
(退火效果確認實驗B) (annealing effect confirmation experiment B)
退火效果確認實驗B係在各式各樣的加熱處理溫度之下,進行加熱處理工序,使加熱處理工序後待鍍線1a的0.2%耐力值與加熱處理溫度之關係明確,且於850℃一定的退火溫度設定之下,對這些待鍍線1a進行軟化退火工序,而使軟化退火工序後的0.2%耐力值與加熱處理溫度之關係明確。 Annealing effect confirmation experiment B is performed under various heat treatment temperatures, and the heat treatment process is performed so that the relationship between the 0.2% proof stress value of the to-be-plated wire 1a and the heat treatment temperature after the heat treatment process is clear, and is fixed at 850 ° C. Under the annealing temperature setting, the softening annealing step is performed on the to-be-plated wire 1a, and the relationship between the 0.2% proof stress value after the softening annealing step and the heat treatment temperature is made clear.
又,本效果確認實驗B係應用上述製造裝置10,且以表3所示的實驗條件進行。 Further, this effect confirmation experiment B was carried out by applying the above-described manufacturing apparatus 10 and under the experimental conditions shown in Table 3.
又,退火效果確認實驗B的結果表示於表4及圖5。 Further, the results of the annealing effect confirmation experiment B are shown in Table 4 and FIG.
於此,表4(a)係表示於每一指定加熱處理溫度的設定,測定進行軟化退火工序前待鍍線1a的0.2%耐力值的結果,係於加熱處理工序對待鍍線1a進行加熱處理,且為每一指定加熱處理溫度的設定,測定進行軟化退火工序前待鍍線1a的0.2%耐力值。 Here, Table 4(a) shows the result of setting the 0.2% proof stress of the to-be-plated line 1a before the softening annealing process, and setting the heat-treatment process to the plating line 1a heat-heating process. And, for each setting of the specified heat treatment temperature, the 0.2% proof stress value of the to-be-plated wire 1a before the softening annealing process was measured.
表4(b)係表示測定浸鍍線1b於捲取後的0.2%耐力值的結果,係於上述每一指定加熱處理溫度的設定,且於軟化退火工序中850℃相同退火溫度的設定之下,對已進行加熱處理工序的各待鍍線1a進行退火,測定浸鍍線1b於捲取後的0.2%耐力值。 Table 4(b) shows the results of measuring the 0.2% proof stress value of the dip plating line 1b after coiling, setting the temperature of each of the above specified heat treatment temperatures, and setting the same annealing temperature at 850 ° C in the softening annealing step. Next, each of the to-be-plated wires 1a which have been subjected to the heat treatment step is annealed, and the 0.2% proof stress value of the dip-plating line 1b after winding is measured.
圖5係根據表4(a)所表示的結果而畫出通過加熱處理爐22後的待鍍線1a的0.2%耐力值與加熱處理爐溫度之關係,且根據表4(b)所表示的結果而畫出通過軟化退火爐後的待鍍線1a的0.2%耐力值與退火溫度之關係的曲線 圖。 5 is a graph showing the relationship between the 0.2% proof stress value of the wire 1a to be plated after passing through the heat treatment furnace 22 and the temperature of the heat treatment furnace according to the results shown in Table 4 (a), and according to Table 4 (b). As a result, a curve showing the relationship between the 0.2% proof stress value and the annealing temperature of the wire 1a to be plated after softening the annealing furnace is drawn. Figure.
如表4(a)、(b)及圖5所示,於加熱處理工序,加熱處理溫度低時退火效果小,且0.2%耐力值未降低。然而,於軟化退火工序退火效果變大,而可使0.2%耐力值降低。 As shown in Tables 4(a), (b) and 5, in the heat treatment step, when the heat treatment temperature is low, the annealing effect is small, and the 0.2% proof stress value is not lowered. However, the annealing effect in the softening annealing step becomes large, and the 0.2% proof stress value can be lowered.
另一方面,於加熱處理工序中,若加熱處理溫度高,亦可在該加熱處理工序獲得充份的退火效果,其程度使軟化退火工序的退火效果變小。 On the other hand, in the heat treatment step, if the heat treatment temperature is high, a sufficient annealing effect can be obtained in the heat treatment step, and the annealing effect in the softening annealing step can be reduced to the extent.
即,無關加熱處理工序的加熱處理溫度,利用將軟化退火工序的退火溫度設定為850℃的高溫,可確認0.2%耐力值確實地降低,為約55MPa以下的低值。 In other words, the heat treatment temperature in the heat treatment step was set to a high temperature of 850 ° C in the softening annealing step, and it was confirmed that the 0.2% proof value was reliably lowered to a low value of about 55 MPa or less.
依此,無關加熱處理工序的加熱處理溫度,藉由將加熱處理工序後所進行的軟化退火工序的退火溫度設定為850℃,結果可使進行軟化退火工序的待鍍線1a充份低耐力化。從此結果,相反地,從加熱處理工序一側來看,加熱處理溫度未必須要設定為高溫,係可對應目的而任意地設定。 According to this, irrespective of the heat treatment temperature of the heat treatment step, the annealing temperature of the softening annealing step performed after the heat treatment step is set to 850 ° C, and as a result, the line to be plated 1 a subjected to the softening annealing step can be sufficiently low-resistance. . As a result, on the contrary, from the side of the heat treatment process, the heat treatment temperature is not necessarily set to a high temperature, and can be arbitrarily set in accordance with the purpose.
詳細而言,於加熱處理工序係藉由將加熱處理溫度設定為例如100~300度左右的低溫,可抑制待鍍線1a在加熱處理爐22的低耐力化。因此,可確認於加熱處理工序中可使待鍍線1a低耐力化的程度,係在加熱處理工序後、軟化退火工序前所進行的洗浄工序中,即使於待鍍線1a施加負荷,也不至於突然伸長或破壞的程度。 Specifically, in the heat treatment process, by setting the heat treatment temperature to a low temperature of, for example, about 100 to 300 degrees, it is possible to suppress low endurance of the wire to be plated 1a in the heat treatment furnace 22. Therefore, it is confirmed that the degree of endurance of the to-be-plated wire 1a can be reduced in the heat treatment process, and even after the heat treatment process and the cleaning process performed before the softening annealing process, even if a load is applied to the wire 1a to be plated, As for the extent of sudden elongation or destruction.
於加熱處理工序中,即使將加熱處理溫度設定為例如 100度~300度左右的情況,亦可在加熱處理工序中達到某種程度促進待鍍線1a的低耐力化。 In the heat treatment process, even if the heat treatment temperature is set to, for example, In the case of about 100 to 300 degrees, the low endurance of the to-be-plated wire 1a can be promoted to some extent in the heat treatment process.
即,於加熱處理工序中,藉由將加熱處理溫度設定為例如100度~300度,而可使加熱處理工序作為待鍍線1a低耐力化時預備退火的機能奏效,且為了使待鍍線1a充份低耐力化至約55MPa以下程度,而在軟化退火工序中進行正式退火所須的退火時間,可達到縮短。 In other words, in the heat treatment step, by setting the heat treatment temperature to, for example, 100 to 300 degrees, the heat treatment step can be performed as a function of preliminary annealing when the line to be plated 1a is low in endurance, and in order to make the line to be plated 1a is sufficiently low-resistance to about 55 MPa or less, and the annealing time required for the main annealing in the softening annealing step can be shortened.
因此,為了提升太陽能電池用鍍銲錫線的生產性,而提高待鍍線1a之線速時,亦不須將軟化退火爐51的長度長形地構成,而係可順利對應線速提升的要求。 Therefore, in order to improve the productivity of the solder wire for solar cells and increase the line speed of the wire 1a to be plated, it is not necessary to form the length of the softening annealing furnace 51, and the line speed can be smoothly improved. .
接著,於軟化退火工序中,進行退火爐氫濃度驗證實驗A及退火爐氫濃度驗證實驗B二個實驗,以作為驗證供給至軟化退火爐51內部的還原氣體G所含有的氫氣體濃度的差異,對0.2%耐力值產生的影響。 Next, in the softening annealing step, two experiments of the annealing furnace hydrogen concentration verification experiment A and the annealing furnace hydrogen concentration verification experiment B are performed to verify the difference in the hydrogen gas concentration contained in the reducing gas G supplied to the softening annealing furnace 51. , the impact on the 0.2% endurance value.
(退火爐氫氣濃度驗證實驗A) (Annealed furnace hydrogen concentration verification experiment A)
退火爐氫氣濃度驗證實驗A,係以本發明例之浸鍍線1b及比較例之鍍線作為試驗樣本,其經由上述製造工序而生成。 In the annealing furnace hydrogen concentration verification experiment A, the immersion plating line 1b of the present invention example and the plating line of the comparative example were used as test samples, which were produced through the above-described manufacturing process.
本發明例之浸鍍線1b及比較例之浸鍍線只有軟化退火工序相異,而其他皆經由相同工序而生成。 The immersion plating line 1b of the present invention example and the immersion plating line of the comparative example differ only in the softening annealing process, and others are formed through the same process.
為了生成本發明例之浸鍍線1b及比較例之浸鍍線而進行的軟化退火工序,兩者皆係以軟化退火爐51之內部作為還原性氣體環境,但還原氣體G的成份相異。 In order to form the immersion plating line 1b of the present invention and the softening annealing process performed by the immersion plating line of the comparative example, both of the softening annealing furnace 51 are used as a reducing gas atmosphere, but the composition of the reducing gas G is different.
即,生成比較例之浸鍍線的情況,係還原氣體G只由 氮氣氣體(Nitrogen gas)構成,相對於此,生成本發明例之浸鍍線1b的情況,還原氣體G係氮氣氣體與氫氣氣體混合的混合氣體。 That is, in the case where the immersion plating line of the comparative example is produced, the reducing gas G is only In the case of the immersion plating line 1b of the present invention, the reducing gas G is a mixed gas of a nitrogen gas and a hydrogen gas.
又,本實驗於製造本發明例之浸鍍線1b及比較例之浸鍍線時,係使用無氧銅作為待鍍線1a,待鍍線1a的尺寸為0.16×2mm,加熱處理爐22的溫度設定為200℃,第一輸送絞盤91及第二輸送絞盤92的各別捲取線速為+1m/min而進行。 Further, in the present experiment, in the production of the immersion plating line 1b of the present invention and the immersion plating line of the comparative example, oxygen-free copper was used as the wire 1a to be plated, and the size of the wire 1a to be plated was 0.16 × 2 mm, and the heat treatment furnace 22 was used. The temperature was set to 200 ° C, and the respective take-up wire speeds of the first conveying winch 91 and the second conveying winch 92 were +1 m/min.
又,製造這些浸鍍線1b時,於軟化退火工序前對待鍍線1a進行酸洗浄工序及超音波水洗浄工序。又,於酸洗浄工序係將磷酸系洗浄液的設定溫度設為50℃而進行。於浸鍍工序係將熔融浸鍍銲錫液63的設定溫度設為260℃而進行,作為熔融浸鍍銲錫液63係使用熔融錫(Sn-3.0Ag-0.5Cu)。又,捲取機構71之構成未具有捲取張力調節機72,而係藉由橫動線架方式捲取機75而直接捲取。 Moreover, when these immersion plating lines 1b are manufactured, the plating line 1a is subjected to an acid washing step and an ultrasonic water washing step before the softening annealing step. Further, the acid washing step was carried out by setting the set temperature of the phosphate-based cleaning liquid to 50 °C. In the immersion plating step, the set temperature of the molten immersion solder liquid 63 is 260 ° C, and the molten immersion solder liquid 63 is made of molten tin (Sn-3.0Ag-0.5Cu). Further, the winding mechanism 71 does not have the take-up tension adjusting device 72, but is directly wound by the traverse bobbin winding machine 75.
本發明例之浸鍍線1b及比較例之浸鍍線分別於上述設定之下,各生成三種浸鍍厚度20μm、30μm、40μm,針對各別0.2%耐力值作比較,結果如圖6所示的曲線圖。 In the immersion plating line 1b of the present invention and the immersion plating line of the comparative example, respectively, three immersion plating thicknesses of 20 μm, 30 μm, and 40 μm were generated, and the respective 0.2% proof values were compared, and the results are shown in FIG. The graph.
如圖6所示的曲線圖,於浸鍍厚度為20μm、30μm、40μm之任一情況,比較本發明例之浸鍍線1b及比較例之浸鍍線,0.2%耐力值皆低。其中可確認浸鍍厚度為40μm時,相較比較例之浸鍍線,本發明例之浸鍍線1b的0.2%耐力值的降低率係最高的。 As shown in the graph of Fig. 6, in the case where the thickness of the immersion plating was 20 μm, 30 μm, or 40 μm, the immersion plating line 1b of the present invention and the immersion plating line of the comparative example were compared, and the 0.2% proof stress values were all low. When it was confirmed that the thickness of the immersion plating was 40 μm, the rate of decrease in the 0.2% proof stress value of the immersion plating line 1b of the present invention was the highest as compared with the immersion plating line of the comparative example.
因此,可確認於退火工序中,藉由待鍍線1a行走於軟化退火爐51之內部,且軟化退火爐51之內部為含有氫氣氣體的還原性氣體環境,更有效率地促進待鍍線1a的低耐力化。 Therefore, it can be confirmed that in the annealing step, the wire to be plated 1a is moved inside the softening annealing furnace 51, and the inside of the softening annealing furnace 51 is a reducing gas atmosphere containing hydrogen gas, and the wire to be plated 1a is more efficiently promoted. Low endurance.
(退火爐氫氣濃度驗證實驗B) (Annealed furnace hydrogen concentration verification experiment B)
退火爐氫氣濃度驗證實驗B,係從還原氣體供給部57對軟化退火爐51之內部供給的還原氣體G,設為至少含有氮氣與氫氣的混合氣體,且以氫氣氣體相對混合氣體的占有體積比率所表示的混合率之差異,對浸鍍線1b(待鍍線1a)的0.2%耐力值的影響而進行驗證的實驗,係應用上述製造裝置10,且在表5所表示的實驗條件之下進行。 In the annealing furnace hydrogen gas concentration verification test B, the reducing gas G supplied from the reducing gas supply unit 57 to the inside of the softening annealing furnace 51 is a mixed gas containing at least nitrogen gas and hydrogen gas, and the volume ratio of the hydrogen gas to the mixed gas is occupied. The experiment of verifying the difference in the mixing ratio indicated by the influence of the 0.2% proof stress value of the immersion plating line 1b (to be plated wire 1a) was applied to the above-mentioned manufacturing apparatus 10, and under the experimental conditions shown in Table 5. get on.
退火爐氫濃度驗證實驗B的結果表示於表6及圖7。 The results of the annealing furnace hydrogen concentration verification experiment B are shown in Table 6 and Figure 7.
於此,表6係表示測定浸鍍線1b於捲取工序後的0.2%耐力值的結果,係氫氣氣體相對至少由氮氣氣體構成之還原氣體的占有混合比率,分別設定為0、10、20、30、40、 50%時,一邊以4.0l/min的流量供給還原氣體至軟化退火爐51之內部,一邊進行退火工序,而測定浸鍍線1b於捲取工序後的0.2%耐力值的結果。 Here, Table 6 shows the result of measuring the 0.2% proof stress value of the dip plating line 1b after the coiling step, and the mixing ratio of the hydrogen gas to the reducing gas composed of at least nitrogen gas is set to 0, 10, and 20, respectively. , 30, 40, At 50%, the reducing gas was supplied to the inside of the softening annealing furnace 51 at a flow rate of 4.0 l/min, and the annealing step was performed to measure the 0.2% proof stress value of the immersion plating line 1b after the winding step.
圖7係根據表6而畫出氫氣氣體於作為還原氣體之混合氣體的占有混合比率與捲取工序後的浸鍍線1b的0.2%耐力值之關係的曲線圖。 Fig. 7 is a graph showing the relationship between the ratio of the mixing ratio of the hydrogen gas to the mixed gas as the reducing gas and the 0.2% proof value of the dip plating line 1b after the winding step, according to Table 6.
如圖7及表6所示的結果,可確認隨著提高氫氣氣體的混合比率,0.2%耐力值係相同或變低。由此看來,可確認氫氣氣體的混合比率高者,顯示0.2%耐力值至少有變低的傾向。 As a result of the results shown in Fig. 7 and Table 6, it was confirmed that the 0.2% proof value was the same or lower as the mixing ratio of the hydrogen gas was increased. From this point of view, it can be confirmed that the mixing ratio of the hydrogen gas is high, and the 0.2% proof stress value tends to be at least low.
因此,可確認氫氣氣體具有還原待鍍線1a之表面的氧化膜的效果,對應還原氣體中氫氣氣體的濃度,可提高使0.2%耐力值降低的效果程度。 Therefore, it was confirmed that the hydrogen gas has an effect of reducing the oxide film on the surface of the to-be-plated wire 1a, and the effect of lowering the 0.2% proof stress value can be improved in accordance with the concentration of the hydrogen gas in the reducing gas.
接著,根據圖7所示之還原氣體中氫氣氣體的濃度與浸鍍線1b之0.2%耐力值的關係,藉由控制氫氣氣體相對還原氣體的濃度,可看出控制待鍍線1a低耐力化程度的可能性。 Next, according to the relationship between the concentration of the hydrogen gas in the reducing gas shown in FIG. 7 and the 0.2% proof value of the immersion plating line 1b, by controlling the concentration of the hydrogen gas relative to the reducing gas, it can be seen that the control of the to-be-plated line 1a is low in endurance. The possibility of degree.
又,本發明之鍍銲錫線的製造裝置及鍍銲錫線的製造方法,並不限於上述鍍銲錫線的製造裝置10及鍍銲錫線的製造方法的構成,係可藉由各式各樣的構成而構成。 Moreover, the apparatus for manufacturing a plated solder wire and the method for producing a plated solder wire according to the present invention are not limited to the configuration of the above-described plating solder wire manufacturing apparatus 10 and the method of manufacturing a solder wire, and can be formed by various configurations. And constitute.
例如,其他實施態樣的製造裝置10A,係如圖8(a)、(b)所示,可將預先加熱爐51P設置於超音波水洗浄槽41與軟化退火爐51之間。 For example, in the manufacturing apparatus 10A of another embodiment, as shown in FIGS. 8(a) and 8(b), the preheating furnace 51P can be disposed between the ultrasonic water washing tank 41 and the softening annealing furnace 51.
如圖8(b)所示,即使在待鍍線1a的行走時間及行 走距離短的情況,預先加熱爐51P也急劇提高待鍍線1a的溫度而為特殊化的構成。 As shown in Fig. 8(b), even in the walking time and line of the wire 1a to be plated When the walking distance is short, the preheating furnace 51P also sharply raises the temperature of the to-be-plated wire 1a, and is a special structure.
具體而言,預先加熱爐51P於預先加熱爐本體52P具有鞘管53L。該鞘管53L係沿著待鍍線1a的行走方向而直線狀構成的中空管,將預先加熱爐本體52P及軟化退火爐本體52各自內部作為連通配置的狀態,以使待鍍線1a通過預先加熱爐51P及軟化退火爐51時,該待鍍線1a不接觸空氣而氧化。 Specifically, the preheating furnace 51P has a sheath tube 53L in the preheating furnace body 52P. The sheath tube 53L is a hollow tube that is linearly formed along the traveling direction of the wire 1a to be plated, and the inside of each of the preheating furnace body 52P and the softening annealing furnace body 52 is placed in communication with each other to pass the wire 1a to be plated. When the furnace 51P and the softening annealing furnace 51 are preheated, the wire 1a to be plated is oxidized without being exposed to air.
預先加熱爐51P的內部與軟化退火爐51相同,預先加熱爐本體52P之內部,沿著鞘管53L的長邊方向具有複複個加熱器54P,且係以狹小於軟化退火爐51之加熱器54的配置間隔的距離而配置。又,加熱器54P的配置數量並不限制多於軟化退火爐51之加熱器54的數量,亦可係提高其電量(瓦數)等。 The inside of the preheating furnace 51P is the same as the softening annealing furnace 51, and the inside of the furnace main body 52P is preliminarily heated, and the heaters 54P are provided along the longitudinal direction of the sheath tube 53L, and are narrower than the heater of the softening annealing furnace 51. The configuration of 54 is configured by the distance of the interval. Further, the number of the heaters 54P is not limited to the number of the heaters 54 of the softening annealing furnace 51, and the amount of electric power (wattage) or the like may be increased.
藉此,即使加速速線使待鍍線1a行走,於軟化退火工序之前,可在預先加熱爐51P將待鍍線1a加熱,而可將加熱狀態的待鍍線1a供給至軟化退火爐51,以作為預先加熱工序。 Thereby, even if the speed line is allowed to walk the wire 1a to be plated, the wire 1a to be plated can be heated in the preheating furnace 51P before the softening annealing process, and the wire 1a to be plated in a heated state can be supplied to the softening annealing furnace 51. Take the preheating process.
因此,對應待鍍線1a之線速的高速化,於軟化退火工序,可確實使待鍍線1a為充份低耐力化的狀態。 Therefore, in response to the increase in the linear velocity of the wire 1a to be plated, in the softening annealing step, the wire 1a to be plated can be surely in a state of being sufficiently low in endurance.
又,於鞘管53L的軟化退火爐51與預先加熱爐51P之間的部分構成有預先還原氣體供給部57P,其供給還原氣體至相當於鞘管53L之長度方向的預先加熱爐51P的部分。 Further, a portion between the softening annealing furnace 51 of the sheath tube 53L and the preheating furnace 51P is configured with a pre-reduction gas supply portion 57P that supplies a reducing gas to a portion corresponding to the preheating furnace 51P in the longitudinal direction of the sheath tube 53L.
上述還原氣體供給部57,係將作為還原氣體G的氫氣與氮氣之混合氣體供給至鞘管53L,以相當於鞘管53L之軟化退火爐51的內部空間作為混合氣體環境,而預先還原氣體供給部57P係將作為還原氣體G的氮氣氣體或水蒸氣氣體(steam gas),供給至相當於鞘管53L之預先加熱爐51P的內部空間,使該內部空間為氮氣氣體環境或水蒸氣氣體環境。 The reducing gas supply unit 57 supplies a mixed gas of hydrogen and nitrogen as the reducing gas G to the sheath tube 53L, and the internal space of the softening annealing furnace 51 corresponding to the sheath tube 53L is used as a mixed gas atmosphere, and the reducing gas supply is performed in advance. The portion 57P supplies a nitrogen gas or a steam gas as the reducing gas G to the internal space of the preheating furnace 51P corresponding to the sheath tube 53L, and the internal space is a nitrogen gas atmosphere or a water vapor gas atmosphere.
藉此,可防止待鍍線1a通過預先加熱爐51P時,其表面氧化,且預先加熱爐51P未使用氫氣氣體(hydrogen gas)作為還原氣體G,而係使用氮氣氣體或水蒸氣氣體,既安全又容易處理。 Thereby, it is possible to prevent the surface of the to-be-plated wire 1a from being oxidized when it passes through the preheating furnace 51P, and the preheating furnace 51P does not use hydrogen gas as the reducing gas G, but uses nitrogen gas or steam gas to be safe. It is easy to handle.
詳細而言,待鍍線1a行走時的線速,為一般設定的4m/min時,如表7(a)所示,於任一平角尺寸、溫度設定,皆可確認浸鍍線1b通過浸鍍工序後,其0.2%耐力值可降低至45Mpa以下的低值。 Specifically, when the line speed at the time of the to-be-plated line 1a is 4 m/min, as shown in Table 7 (a), it can confirm that the immersion plating line 1b is dip by any flat angle size and temperature setting. After the plating process, the 0.2% proof stress value can be lowered to a low value below 45 MPa.
又,表7(a)係表示生成浸鍍線1b時0.2%耐力值及浸鍍厚度的值,係使用三種尺寸為0.2mm×1.0mm、0.16mm×2.0mm、0.2mm×2.0mm的平角線(flat square wire)作為待鍍線1a,且分別對這些待鍍線1a設定線速為4m/min,三種銲錫溫度為240℃、260℃、280℃的設定之下,而生成浸鍍線1b。 Further, Table 7(a) shows the values of the 0.2% proof stress value and the immersion plating thickness at the time of forming the immersion plating line 1b, and three kinds of flat angles of 0.2 mm × 1.0 mm, 0.16 mm × 2.0 mm, and 0.2 mm × 2.0 mm were used. A flat square wire is used as the to-be-plated wire 1a, and a line speed of 4 m/min is set for each of the to-be-plated wires 1a, and three kinds of soldering temperatures are set at 240 ° C, 260 ° C, and 280 ° C to form a dip plating line. 1b.
相對於此,待鍍線1a行走時的線速為13m/min的高速設定時,如表7(b)所示,於任一平角尺寸、溫度設定,,浸鍍線1b在大部分的設定,0.2%耐力值皆為50Mpa以上的值,相較於一般設定線速為4m/min的情況,前者係較高的值。 On the other hand, when the line speed at which the to-be-plated wire 1a is traveling is 13 m/min, as shown in Table 7 (b), the setting of the dip plating line 1b is mostly set at any of the flat angle dimensions and temperature. The 0.2% endurance value is a value of 50 MPa or more, and the former is a higher value than the case where the general set line speed is 4 m/min.
這係因為藉由將待鍍線1a的線速高速設定,於軟化退火爐51中,待鍍線1a未充份低耐力化前即通過軟化退火爐51,而產生未充份低耐力化的浸鍍線1b之生成的狀況。 This is because, by setting the line speed of the wire 1a to be plated at a high speed, in the softening annealing furnace 51, the wire 1a to be plated is not sufficiently filled with low endurance, that is, by softening the annealing furnace 51, resulting in insufficiently low endurance. The condition of the generation of the immersion plating line 1b.
又,表7(b)係表示生成浸鍍線1b時其0.2%耐力值及浸鍍厚度的值,係在線速為13m/min的高速設定,平角尺寸、銲錫溫度與表7(a)同樣的設定之下,而生成浸鍍線1b。 Further, Table 7(b) shows the values of the 0.2% proof stress value and the immersion plating thickness when the immersion plating line 1b is formed, and is set at a high speed of 13 m/min at the line speed, and the flat angle size and the solder temperature are the same as in Table 7(a). Under the setting, the immersion plating line 1b is formed.
即,單純地將待鍍線1a之線速設定為高速時,無法達到充份低耐力化,具有無法對應線速之高速化的問題。 In other words, when the linear velocity of the to-be-plated wire 1a is simply set to a high speed, the sufficient low endurance cannot be achieved, and there is a problem that the linear velocity cannot be increased.
相對於此,上述製造裝置10A的構成,係軟化退火爐51與超音波水洗浄槽41之間設有預先加熱爐51P。 On the other hand, in the above-described manufacturing apparatus 10A, a preheating furnace 51P is provided between the softening annealing furnace 51 and the ultrasonic water washing tank 41.
在待鍍線1a被供給至軟化退火爐51前,藉由預先加熱爐51P,可在短時間將待鍍線1a加熱至高溫,而可將高溫化狀態的待鍍線1a供給至軟化退火爐51。 Before the to-be-plated wire 1a is supplied to the softening annealing furnace 51, the wire 1a to be plated can be heated to a high temperature in a short time by the preheating furnace 51P, and the wire 1a to be plated in a high temperature state can be supplied to the softening annealing furnace. 51.
因此,將線速設定為上述高速行走速度,即使待鍍線1a相對軟化退火爐51高速通過時,亦可於上述軟化退火工序中,確實地使待鍍線1a低耐力化。 Therefore, by setting the line speed to the above-described high-speed traveling speed, even when the to-be-plated wire 1a passes through the softening annealing furnace 51 at a high speed, the to-be-plated wire 1a can be reliably made low in the softening annealing process.
具體地,如上所述,藉由設置預先加熱爐51P而進行預先加熱工序,即使線速設定為13m/min的高速設定,亦可與線速為一般設定的4m/min時相同程度,使待鍍線1a的0.2%耐力值降低,因此,可藉由良好生產效率而獲得0.2%耐力值低、高品質的浸鍍線1b。 Specifically, as described above, the preheating step is performed by providing the preheating furnace 51P, and even if the line speed is set to a high speed setting of 13 m/min, the line speed can be set to the same level as the generally set 4 m/min. Since the 0.2% proof stress value of the plating line 1a is lowered, it is possible to obtain a low-quality, high-quality immersion plating line 1b having a low endurance value of 0.2% by good production efficiency.
更進一步,即使待鍍線1a以線速13m/min的高速設定行走,亦可於軟化退火爐51確實地還原處理待鍍線1a之表面的氧化層。 Further, even if the to-be-plated wire 1a is set to travel at a high speed of 13 m/min, the oxide layer on the surface of the to-be-plated wire 1a can be surely reduced in the softening annealing furnace 51.
如上所述,軟化退火爐51的上游側附近所設置的預先加熱爐51P,係作為在待鍍線1a之加熱性能特殊化的構成,且供給氮氣氣體或水蒸氣氣體至其內部,以作為安全又容易處理的氣體環境。因此,於軟化退火爐51作為確保軟化退火時間的機構,相較例如僅將軟化退火爐51長形化的構成,前者不會有設置空間或成本增加的問題,且藉由活用既有設備、追加設計變更的簡易構成,可對應線速的高速化。 As described above, the preheating furnace 51P provided in the vicinity of the upstream side of the softening annealing furnace 51 is configured to be specialized in the heating performance of the wire 1a to be plated, and supplies nitrogen gas or steam gas to the inside thereof as a safety. A gas environment that is easy to handle. Therefore, in the softening annealing furnace 51 as a mechanism for securing the softening annealing time, for example, the configuration in which only the softening annealing furnace 51 is elongated, the former does not have a problem of installation space or cost increase, and by utilizing existing equipment, The simple configuration of additional design changes can be used to speed up the line speed.
又,作為其他實施態樣,加熱處理爐22非為必要之構成,如圖9(a)所示,作為其他實施態樣之製造裝置的構成,亦可係不將加熱處理爐22設置於行走方向的供給裝置12與酸洗浄槽31之間。又進一步,加熱處理爐22並不限於係設置在行走方向中供給裝置12與酸洗浄槽31之間,只要係軟化退火爐51的上游側,設置於其他部位亦可。 Further, as another embodiment, the heat treatment furnace 22 is not necessarily required, and as shown in FIG. 9(a), the configuration of the manufacturing apparatus of another embodiment may not be such that the heat treatment furnace 22 is not provided. The supply device 12 in the direction is between the acid cleaning tank 31. Further, the heat treatment furnace 22 is not limited to being disposed between the supply device 12 and the pickling tank 31 in the traveling direction, and may be provided at another portion as long as the upstream side of the annealing furnace 51 is softened.
例如,不將加熱處理爐22設置於酸洗浄槽31之上游側,係只有設置上述預先加熱爐51P,且使用水蒸氣氣體作為還原氣體,供給至預先加熱爐51P之內部亦可。 For example, the heat treatment furnace 22 is not provided on the upstream side of the acid cleaning tank 31, and only the preheating furnace 51P is provided, and the steam gas is used as the reducing gas, and may be supplied to the inside of the preheating furnace 51P.
根據此構成,如上所述,預先加熱爐51P可兼具雙方功能,係在軟化退火爐51之前進行預先加熱的功能之外,再加上上述加熱處理爐22所進行的功能。 According to this configuration, as described above, the preheating furnace 51P can have both functions, and the function of the heating processing furnace 22 is added in addition to the function of preheating before the softening annealing furnace 51.
因此,不用說可達到設備成本的削減,更可進一步地縮短待鍍線1a的行走距離,且可生產0.2%耐力值低、高品質的浸鍍線1b。 Therefore, it is needless to say that the reduction in equipment cost can be achieved, and the walking distance of the to-be-plated wire 1a can be further shortened, and the dip plating line 1b having a low-resistance value of 0.2% and high quality can be produced.
又,如上所述,軟化退火爐51之內部作為還原氣體環境,而如上所述,此還原氣體G並不限於氮氣氣體或氮氣氣體與氫氣氣體的混合氣體,亦可含有其他成份。又,亦可係以氮氣氣體或氫氣氣體以外的還原氣體而構成。 Further, as described above, the inside of the softening annealing furnace 51 serves as a reducing gas atmosphere, and as described above, the reducing gas G is not limited to a nitrogen gas or a mixed gas of a nitrogen gas and a hydrogen gas, and may contain other components. Further, it may be configured by a reducing gas other than a nitrogen gas or a hydrogen gas.
又,藉由將洗浄機構配置於行走方向中軟化退火爐51的上游側,藉由軟化退火爐51而低耐力化前的待鍍線1a係可利用洗浄機構30進行洗浄。因此,相較已藉由軟化退火爐51而低耐力化的待鍍線1a,利用洗浄機構30進行 洗浄的情況,前者係可減輕於待鍍線1a所施加的負荷。 Further, by arranging the cleaning mechanism on the upstream side of the softening annealing furnace 51 in the traveling direction, the wire 1a to be plated before the low endurance is softened by the softening annealing furnace 51 can be cleaned by the cleaning mechanism 30. Therefore, compared with the wire 1a to be plated which has been low in endurance by the softening annealing furnace 51, the cleaning mechanism 30 is used. In the case of washing, the former can alleviate the load applied to the wire 1a to be plated.
因此,可獲得0.2%耐力值充份降低、期望品質的浸鍍線1b,特別係可獲得適合的浸鍍線1b,以作為太陽能電池用鍍銲錫線。 Therefore, a dip plating line 1b having a 0.2% proof endurance value and a desired quality can be obtained, and in particular, a suitable dip plating line 1b can be obtained as a solder wire for solar cells.
又,依此,相較已藉由軟化退火爐51而低耐力化的待鍍線1a,利用洗浄機構30進行洗浄的情況,可減輕於待鍍線1a所施加的負荷,因此,為了減輕待鍍線1a行走時的負荷,不須減少輸送絞盤之設置數量,或不須使線速降低。 In addition, in comparison with the case where the wire 1a to be plated which is low in endurance by the softening annealing furnace 51 is cleaned by the cleaning mechanism 30, the load applied to the wire 1a to be plated can be reduced, and therefore, in order to reduce the load When the plating line 1a is running, it is not necessary to reduce the number of the conveying winches or to reduce the line speed.
因此,為了達到減輕於待鍍線1a所施加的負荷,於構成方面、控制方面,更於條件設定方面,可將其對策簡略化,因此,可提升浸鍍線1b的製造效率。 Therefore, in order to reduce the load applied to the to-be-plated wire 1a, the countermeasure can be simplified in terms of configuration and control, and the condition setting can be simplified. Therefore, the manufacturing efficiency of the dip plating line 1b can be improved.
又更進一步,藉由如上述之配置具有洗浄機構30,待鍍線1a之表面所附著的不純物藉由洗浄機構30去除,且藉由其下游側所配置的浸鍍機構61,可對待鍍線1a之表面形成均勻浸鍍厚度,而形成良好品質的鍍銲錫線1b。 Further, by having the cleaning mechanism 30 as described above, the impurities adhered to the surface of the to-be-plated wire 1a are removed by the cleaning mechanism 30, and the immersion plating mechanism 61 disposed on the downstream side thereof can treat the plating line. The surface of 1a is formed into a uniform immersion plating thickness to form a good quality plating solder wire 1b.
又,浸鍍前處理機構2於行走方向中軟化退火爐51的上游側,具有對待鍍線1a進行加熱處理的加熱處理爐22,藉由將加熱處理爐22配置於行走方向中洗浄機構30的上游側,可在加熱處理爐22對待鍍線1a進行加熱處理工序後,於洗浄機構30洗浄待鍍線1a。 Further, the pre-dip pretreatment mechanism 2 is provided with a heat treatment furnace 22 for heat-treating the plating wire 1a in the upstream direction of the softening annealing furnace 51 in the traveling direction, and the heat treatment furnace 22 is disposed in the cleaning direction of the cleaning mechanism 30. On the upstream side, after the heat treatment process is performed on the plating wire 1a in the heat treatment furnace 22, the wire 1a to be plated is washed in the cleaning mechanism 30.
因此,藉由加熱處理爐22將待鍍線1a之表面所附著的附著物加熱時,即使附著物為燒焦的煤等殘留物而殘留在待鍍線1a之表面的情況,其後,可藉由通過的洗浄機構 30而洗浄,確實地去除殘留物。 Therefore, when the adhering matter adhering to the surface of the wire 1a to be plated is heated by the heat treatment furnace 22, even if the deposit is a residue such as charred coal remaining on the surface of the wire 1a to be plated, thereafter, Cleaning mechanism Washed with 30 and surely removes the residue.
更進一步,以酸洗浄槽31及超音波水洗浄槽41構成洗浄機構30,而加熱處理爐22、酸洗浄槽31、超音波水洗淨槽41及軟化退火爐51作為浸浸鍍前處理機構2,且沿著行走方向依序配置,藉此,可使未被軟化退火爐51低耐力化之待鍍線1a在加熱處理爐22、酸洗浄槽31及超音波水洗淨槽41進行的一連串工序完成。 Further, the acid cleaning tank 31 and the ultrasonic water washing tank 41 constitute the cleaning mechanism 30, and the heat treatment furnace 22, the acid cleaning tank 31, the ultrasonic water washing tank 41, and the softening annealing furnace 51 are used as the immersion plating pretreatment mechanism. 2, and sequentially arranged along the traveling direction, whereby the to-be-plated wire 1a to be subjected to the low endurance of the softening annealing furnace 51 in the heat treatment furnace 22, the pickling tank 31, and the ultrasonic water washing tank 41 can be performed. A series of processes are completed.
即,依此,作為浸浸鍍前處理機構2,而將加熱處理爐22或洗浄機構30配置於於軟化退火爐51之上游側,且於軟化退火爐51使待鍍線1a低耐力化,而可使待鍍線1a低耐力化後不久,於浸鍍機構61施行浸鍍處理工序。 In other words, the heat treatment furnace 22 or the cleaning mechanism 30 is disposed on the upstream side of the softening annealing furnace 51 as the immersion plating pretreatment mechanism 2, and the resistance to be plated 1a is low in the softening annealing furnace 51. On the other hand, shortly after the endurance of the to-be-plated wire 1a is low, the immersion plating process is performed in the immersion plating mechanism 61.
因此,可極力避免對已低耐力化的浸鍍線1b施加負荷,而可獲得品質良好的浸鍍線1b。 Therefore, it is possible to avoid the application of a load to the immersion plating line 1b which has been low in endurance, and to obtain a immersion plating line 1b of good quality.
特別地,藉由將酸洗浄槽31配置於加熱處理爐22的下游側,在加熱處理爐22將待鍍線1a加熱,可在待鍍線1a維待溫熱狀態於酸洗浄槽31對其進行酸洗浄,相較對常溫的待鍍線1a進行酸洗浄的情況,前者可格外地提升酸洗浄效果,且可獲得良好的酸洗浄效果。 In particular, by disposing the acid cleaning tank 31 on the downstream side of the heat treatment furnace 22, the wire 1a to be plated is heated in the heat treatment furnace 22, and the wire to be plated 1a is warmed to the acid cleaning tank 31. When the acid is washed, compared with the case where the line to be plated 1a at normal temperature is pickled, the former can particularly improve the acid washing effect, and a good acid washing effect can be obtained.
又,如上所述,於加熱處理爐22與酸洗浄槽31之間設置有冷卻水槽23。通過加熱處理爐22的待鍍線1a藉由冷卻水槽23冷卻後,行走至酸洗浄槽31。 Further, as described above, the cooling water tank 23 is provided between the heat treatment furnace 22 and the pickling tank 31. The line to be plated 1a of the heat treatment furnace 22 is cooled by the cooling water tank 23, and then travels to the acid cleaning tank 31.
依此,通過加熱處理爐22之後不久的待鍍線1a藉由冷卻水槽23冷卻,因加熱處理爐22而為加熱狀態的待鍍線1a,其表面維待高溫狀態溫度而行走於加熱處理爐22 與酸洗浄槽31之間,可再度防止待鍍線1a的表面形成氧化膜。 Accordingly, the wire 1a to be plated after the heat treatment furnace 22 is cooled by the cooling water tank 23, and the wire 1a to be plated in a heated state is heated by the heat treatment furnace 22, and the surface thereof is maintained in a high temperature state and travels to the heat treatment furnace. twenty two Between the acid cleaning tank 31, an oxide film can be prevented from being formed on the surface of the to-be-plated wire 1a.
但,冷卻水槽23並未使因加熱處理爐22而加熱的待鍍線1a的表面冷卻至常溫,在冷卻水槽23的待鍍線1a的冷卻,較佳係待鍍線1a的表面溫度至少停留在50度左右。 However, the cooling water tank 23 does not cool the surface of the wire 1a to be plated heated by the heat treatment furnace 22 to a normal temperature, and the cooling of the wire 1a to be plated in the cooling water tank 23 is preferably at least the surface temperature of the plating wire 1a. At around 50 degrees.
藉此,於酸洗浄槽31中,可對表面溫度至少有50度的待鍍線1a進行酸洗浄,因此,磷酸系洗浄液32可發揮更好的酸洗浄效果。依此可有效率地進行酸洗浄,因此,即使係待鍍線1a高速行走的情況,可確實獲得酸洗浄效果。 Thereby, in the acid cleaning tank 31, the wire 1a to be plated having a surface temperature of at least 50 degrees can be acid-washed, so that the phosphate-based cleaning liquid 32 can exhibit a better acid cleaning effect. According to this, the acid washing can be performed efficiently, and therefore, even if the plating line 1a is to be moved at a high speed, the acid washing effect can be surely obtained.
又,依據上述鍍銲錫線的製造裝置10及鍍銲錫線的製造方法,待鍍線1a係使用垂直剖面的寬度為0.8~10.0mm範圍內、厚度為0.05~0.5mm範圍內大小的平角銅線,垂直剖面係相對其長度方向而垂直的剖面。待鍍線1a的行走速度設定為約4.0m/min,於酸洗浄槽31的酸洗浄時間設定為約12.8秒,且藉由將超音波水洗浄槽41的超音波水洗浄時間設定為約13.5秒,可獲得良好的洗浄效果。 Further, according to the manufacturing apparatus 10 for solder plating and the method of manufacturing a solder wire, the to-be-plated line 1a is a rectangular copper wire having a width of a vertical section of 0.8 to 10.0 mm and a thickness of 0.05 to 0.5 mm. A vertical section is a section perpendicular to its length. The traveling speed of the to-be-plated wire 1a is set to about 4.0 m/min, the acid cleaning time of the acid cleaning tank 31 is set to about 12.8 seconds, and the ultrasonic water washing time of the ultrasonic water washing tank 41 is set to about 13.5. In seconds, a good cleaning effect can be obtained.
特別地,依據上述鍍銲錫線的製造裝置10及鍍銲錫線的製造方法,上述待鍍線1a係使用大小為寬度1.0~2.0mm範圍內、厚度0.16~0.2mm範圍內的平角銅線時,在與上述之待鍍線1a的行走速度、酸洗浄槽31的酸洗浄時間及超音波水洗浄槽41的超音波水洗浄時間相同的設定之下,進行洗浄,如稍後說明的洗浄效果確認實驗 1的明確結果,可獲得更良好的洗浄效果。 In particular, according to the above-described method for manufacturing the solder wire and the method of manufacturing the solder wire, the wire to be plated 1a is a rectangular copper wire having a width in the range of 1.0 to 2.0 mm and a thickness in the range of 0.16 to 0.2 mm. The cleaning is performed under the same setting as the traveling speed of the to-be-plated wire 1a, the pickling time of the pickling tank 31, and the ultrasonic water washing time of the ultrasonic water washing tank 41, and the washing effect is confirmed later. experiment A clear result of 1 can obtain a better washing effect.
接著,針對洗浄效果確認實驗作說明。 Next, the washing effect confirmation experiment will be described.
(洗浄效果確認實驗1) (Washing effect confirmation experiment 1)
洗浄效果確認實驗1係對待鍍線1a依序進行加熱處理工序、酸洗浄工序、水洗浄工序時,針對其洗浄效果的差異進行驗證的實驗,如表8所示,係藉由上述製造裝置及製造方法製造浸鍍線1b,且在本發明例及比較例二種設定例之下進行。 The cleaning effect confirmation experiment 1 is an experiment for verifying the difference in the cleaning effect when the plating line 1a is sequentially subjected to the heat treatment step, the acid washing step, and the water washing step, as shown in Table 8, by the above-described manufacturing apparatus and The manufacturing method produces the dip plating line 1b, and is performed under the two setting examples of the present invention example and the comparative example.
本發明例相對比較例的線速設定為五分之一。即,如表8所示,本發明係相對習知例五分之一的線速,通過加熱處理爐22、酸洗浄槽31、超音波水洗浄槽41各部的時間設定為5倍。 The line speed of the inventive example relative to the comparative example was set to one-fifth. That is, as shown in Table 8, the present invention is set at a line speed of one-fifth of that of the conventional example, and the time period of each of the heat treatment furnace 22, the pickling tank 31, and the ultrasonic water washing tank 41 is set to five times.
又,比較例係使用直徑0.76mm、0.65mm、0.53mm三種尺寸的圓線作為待鍍線1a,相對於此,本發明例係使用縱(厚度)及橫(寬度)為0.2mm×2.0mm、0.16mm×2.0mm、0.2mm×1.0mm三種尺寸的平角線作為待鍍線1a。 Further, in the comparative example, round wires of three sizes of 0.76 mm, 0.65 mm, and 0.53 mm in diameter were used as the to-be-plated wire 1a. In contrast, the present invention used longitudinal (thickness) and transverse (width) of 0.2 mm × 2.0 mm. A three-dimensional flat line of 0.16 mm × 2.0 mm and 0.2 mm × 1.0 mm is used as the to-be-plated wire 1a.
又,洗浄效果確認實驗係本發明例與比較例的待鍍線1a的形狀及線速以外的設定,其他為互相相同的設定。 Further, the cleaning effect confirmation test is a setting other than the shape and the line speed of the to-be-plated wire 1a of the present invention example and the comparative example, and the other settings are the same as each other.
在此,於本實驗所使用的洗浄裝置的構成,係將進行加熱處理工序的熱處理爐22、於酸洗浄工序的酸洗浄槽31、於水洗浄工序的超音波水洗浄槽41以串列配置,且加熱處理爐22、酸洗浄槽31、超音波水洗浄槽41係以圖10所示的各部分尺寸而構成。 Here, the configuration of the cleaning device used in the present experiment is a heat treatment furnace 22 that performs a heat treatment process, an acid cleaning tank 31 that is subjected to an acid washing step, and an ultrasonic water washing tank 41 that is subjected to a water washing step. The heat treatment furnace 22, the acid cleaning tank 31, and the ultrasonic water washing tank 41 are configured to have the dimensions of the respective portions shown in FIG.
又,圖10為概要地顯示在本實驗所使用的洗淨裝置及其週邊部分。 Moreover, FIG. 10 is a schematic view showing the washing apparatus used in this experiment and its peripheral part.
於加熱處理爐22中係使用蒸氣作為洗浄劑,可特別地期待對油汙等的洗浄效果。於酸洗浄槽31中係使用酸洗浄液作為洗浄劑,可期待對氧化物等的洗浄效果。超音波水洗浄槽41中係使用水作為洗浄劑,可在酸洗浄工序可特別地期待對待鍍線1a之表面所殘留的酸液等的洗浄效果。 In the heat treatment furnace 22, steam is used as a detergent, and the cleaning effect on oil stains and the like can be particularly expected. An acid cleaning solution is used as the detergent in the acid cleaning tank 31, and the effect of cleaning the oxide or the like can be expected. In the ultrasonic water washing tank 41, water is used as a detergent, and in the acid washing step, the cleaning effect of the acid liquid or the like remaining on the surface of the plating wire 1a can be particularly expected.
又,於加熱處理工序中,係以加熱處理爐22的內部作為蒸氣環境,因此,即使加熱處理爐22係一蒸氣機亦可作用。因此,於加熱處理工序中,亦可期待藉由加熱去除待鍍線1a之表面所附著的附著物的效果,因此,將加熱處理工序視為洗浄工序的一部分而包含在本實驗對象。 Further, in the heat treatment step, the inside of the heat treatment furnace 22 is used as a vapor atmosphere. Therefore, even if the heat treatment furnace 22 is a steam engine, it can function. Therefore, in the heat treatment step, the effect of removing the adhering matter adhering to the surface of the line to be plated 1a by heating is expected. Therefore, the heat treatment step is included in the test object as a part of the washing step.
洗浄效果確認實驗之評價的進行,係根據目視本發明例與比較例於各別水洗浄工序後的待鍍線1a之表面狀態以及捲取工序後的浸鍍線1b之表面狀態,所產生的指定基準,而進行比較、辨認。 The evaluation of the cleaning effect confirmation experiment was carried out by visually observing the surface state of the wire 1a to be plated after the respective water washing steps and the surface state of the immersion plating wire 1b after the winding process in the present invention example and the comparative example. Specify the benchmark and compare and identify it.
在上述條件之下所進行的結果,首先,針對水洗浄工序後待鍍線1a的表面狀態,本發明例的線速設定與比較例 的線速設定相異時,完全無法辨認待鍍線1a之表面附著有如斑點或膜般大範圍的油,或離散狀、點狀地的粉塵等附著物,而可確認可達到待鍍線1a表面的清浄化。 As a result of the above conditions, first, the line speed setting and comparative example of the example of the present invention for the surface state of the to-be-plated line 1a after the water washing step. When the line speed setting is different, it is impossible to recognize that a large amount of oil such as a spot or a film adheres to the surface of the to-be-plated wire 1a, or a dust or the like in a discrete shape or a dot shape, and it can be confirmed that the wire to be plated 1a can be obtained. Clean the surface.
更進一步,根據目視浸鍍線1b於最後的捲取工序後其表面的浸鍍狀態所產生的指定基準,而進行確認,本發明例之線速設定與比較例之線速設定相異時,無法辨認表面的凹凸,而可確認浸鍍線於長度方向及外周方向的浸鍍厚度均勻。 Further, when the visual immersion plating line 1b is in accordance with the designation standard generated by the immersion plating state of the surface after the last winding step, the linear velocity setting of the example of the present invention is different from the linear velocity setting of the comparative example. The unevenness of the surface was not recognized, and it was confirmed that the thickness of the immersion plating line in the longitudinal direction and the outer peripheral direction was uniform.
又,有關線速,相對比較例係設定為20m/min,本發明例係相對比較例的速度設定而設定為五分之一,即速度為4m/min,可獲得充分的洗浄效果,因而可期待獲得更好的洗浄效果,進而可考慮將線速設定為低於4m/min的低速。 Further, the line speed is set to 20 m/min with respect to the comparative example, and the example of the present invention is set to one-fifth with respect to the speed setting of the comparative example, that is, the speed is 4 m/min, and a sufficient washing effect can be obtained. A better cleaning effect is expected, and it is conceivable to set the line speed to a low speed of less than 4 m/min.
但,在線速低於4m/min的低速設定之下,嘗試相同的實驗,但無法獲得4m/min之速度設定時洗浄效果以上的效果,明顯看來並非將線速設定越低速越可提升洗浄效果。 However, under the low speed setting where the line speed is lower than 4m/min, the same experiment is tried, but the effect of cleaning at a speed setting of 4m/min cannot be obtained. It is obvious that the line speed is set to be lower and the speed can be improved. effect.
更進一步,將待鍍線1a之線速設定為低於4m/min的低速時,係使待鍍線1a通過各工序的通過時間變長,因此,具有生產性下降之虞。據此,從洗浄工序所獲得的洗浄效果的觀點以及生產效率的觀點,在上述實驗條件之下,可獲得線速較佳係設定為約4m/min的結果。 Further, when the line speed of the to-be-plated wire 1a is set to a low speed of less than 4 m/min, the passage time of the to-be-plated wire 1a by each process becomes long, and it has the fall of productivity. According to this, from the viewpoint of the washing effect obtained by the washing step and the production efficiency, under the above experimental conditions, a result that the line speed is preferably set to about 4 m/min can be obtained.
(洗浄效果確認實驗2) (Washing effect confirmation experiment 2)
洗浄效果確認實驗2係對待鍍線1a進行酸洗浄工序、 水洗浄工序時,針對其洗浄效果的差異進行驗證的實驗,係藉由上述製造裝置10及製造方法製造浸鍍線1b時,在本發明例及比較例二種設定例之下而進行。 The cleaning effect confirmation experiment 2 is a pickling process for the plating line 1a, In the water washing step, the experiment for verifying the difference in the washing effect was carried out under the above-described manufacturing examples and comparative examples, when the immersion plating line 1b was produced by the above-described manufacturing apparatus 10 and the manufacturing method.
比較例未進行加熱處理,而係以酸洗浄工序、水洗浄工序的順序進行洗浄工序,相對於此,本發明例係在酸洗浄工序之前進行加熱處理工序,之後再以酸洗浄工序、水洗浄工序的順序進行洗浄工序。 In the comparative example, the washing step is performed in the order of the acid washing step and the water washing step. However, in the present invention, the heat treatment step is performed before the acid washing step, and then the acid washing step and the water washing are performed. The order of the steps is performed in a washing step.
洗浄效果確認實驗之評價的進行,係根據目視本發明例與比較例在各別水洗浄工序後待鍍線1a的表面狀態以及捲取工序後浸鍍線1b的表面狀態,所產生的指定基準,而進行比較、確認。 The evaluation of the cleaning effect confirmation test was carried out according to the surface state of the to-be-plated wire 1a after the respective water washing process and the surface state of the dip plating line 1b after the winding process, according to the present invention example and the comparative example. And compare and confirm.
在比較例的設定之下,辨認進行洗浄工序後的待鍍線1a,其表面殘留酸化層。更進一步,辨認浸鍍線1b表面的浸鍍狀態,可確認浸鍍線1b的表面變粗。 Under the setting of the comparative example, the wire 1a to be plated after the cleaning step was identified, and the acidified layer remained on the surface. Further, the state of the immersion plating on the surface of the immersion plating line 1b was recognized, and it was confirmed that the surface of the immersion plating line 1b became thick.
相對於此,在本發明例的設定之下,確認進行洗浄工序後的待鍍線,無法辨認表面的油污等髒汙,氧化層也未殘留。更進一步,確認浸鍍線表面的浸鍍狀態,表面未有凹凸,而可確認形成均勻浸鍍厚度。 On the other hand, in the setting of the example of the present invention, the line to be plated after the cleaning step was confirmed, and the dirt such as oil stain on the surface could not be recognized, and the oxide layer did not remain. Furthermore, the state of the immersion plating of the surface of the immersion plating line was confirmed, and the surface was not uneven, and it was confirmed that the uniform immersion plating thickness was formed.
根據上述,相較在酸洗浄工序前進行加熱處理工序,而對常溫的待鍍線進行酸洗浄工序的情況,可確認本發明例可格外地提升酸洗浄效果,可獲得良好的酸洗浄效果。 According to the above, when the heat treatment step is performed before the acid cleaning step, and the acid-washing step is performed on the line to be plated at normal temperature, it is confirmed that the acid cleaning effect can be particularly enhanced by the example of the present invention, and a good acid cleaning effect can be obtained.
上述鍍銲錫線的製造裝置10以及鍍銲錫線的製造方法,並不限於上述之構成及製造方法,係可藉由各式各樣的構成及製造方法而構成。 The manufacturing apparatus 10 for solder plating and the manufacturing method of the soldering wire are not limited to the above-described configuration and manufacturing method, and can be configured by various configurations and manufacturing methods.
作為其他實施態樣,將冷卻水槽23設置於加熱處理爐22與酸洗浄槽31之間並非必要的構成,如圖9(b)所示,冷卻水槽23亦可係不設置於加熱處理爐22與酸洗浄槽31之間。 As another embodiment, the cooling water tank 23 is not necessarily provided between the heat treatment furnace 22 and the pickling tank 31. As shown in FIG. 9(b), the cooling water tank 23 may not be provided in the heat treatment furnace 22. Between the acid cleaning tank 31 and the acid cleaning tank 31.
未設置冷卻水槽23時,因加熱處理爐22而表面被加熱的待鍍線1a,係其表面溫度可維持高溫狀態而行走於酸洗浄槽31,可獲得更有效果的酸洗浄效果。 When the cooling water tank 23 is not provided, the surface 1a to be plated which is heated by the heat treatment furnace 22 is maintained at a high temperature and travels in the acid cleaning tank 31, whereby a more effective acid cleaning effect can be obtained.
又,依據上述鍍銲錫線的製造裝置10及鍍銲錫線的製造方法,藉由輸送絞盤91、92在行走方向的上游側輔助輸送捲取機構71的捲取,藉此,因捲取機構71於待鍍線1a施加的捲取力,可相對輸送絞盤91、92,在行走方向的上游側及下游側分散,進而減輕因捲取機構71所產生的捲取而在待鍍線1a所施加的負荷。 Further, according to the above-described method of manufacturing the plated solder wire and the method of manufacturing the solder wire, the winding of the take-up reeling mechanism 71 is assisted by the conveyance winches 91 and 92 on the upstream side in the traveling direction, whereby the winding mechanism 71 is used. The take-up force applied to the to-be-plated wire 1a can be dispersed on the upstream side and the downstream side in the traveling direction with respect to the conveying winches 91 and 92, thereby reducing the application of the wire to be plated 1a by the winding of the take-up mechanism 71. The load.
藉此,可使浸鍍線1b的0.2%耐力值充份地降低,且可抑制延展率,而可獲得期望品質的浸鍍線。 Thereby, the 0.2% proof value of the dip plating line 1b can be sufficiently reduced, and the elongation rate can be suppressed, and a dip plating line of a desired quality can be obtained.
又,依據上述鍍銲錫線的製造裝置10,藉由將輸送絞盤91、92設置於行走方向中軟化退火爐的上游側,可在軟化退火爐51輔助輸送低耐力化前的待鍍線1a。 Further, according to the above-described apparatus for manufacturing a plated solder wire 10, the transporting winches 91 and 92 are disposed on the upstream side of the softening annealing furnace in the traveling direction, and the softening annealing furnace 51 can assist in transporting the to-be-plated wire 1a before the low endurance.
因此,例如,藉由主動轉動的輸送絞盤而輔助輸送待鍍線1a時,不會對已低耐力化的待鍍線1a施加拉張張力等負荷,在確保浸鍍線1b的品質上,可確實地輔助輸送。 Therefore, for example, when the to-be-plated wire 1a is assisted by the actively rotating conveying winch, a load such as tensile tension is not applied to the to-be-plated wire 1a having low endurance, and the quality of the dip-plating wire 1b can be ensured. Conveniently assist in delivery.
特別如第二輸送絞盤92係設置於行走方向中洗浄機構30的下游側、軟化退火爐51的上游側,可在軟化退火爐51使待鍍線1a低耐力化之前,輔助輸送待鍍線1a。藉 此,待鍍線1a不會承受負擔,可有效率地輔助通過軟化退火爐51,輸送已低耐力化的待鍍線1a(浸鍍線1b)的行走。 In particular, the second conveying winch 92 is disposed on the downstream side of the cleaning mechanism 30 in the traveling direction and on the upstream side of the softening annealing furnace 51, and can assist in conveying the to-be-plated wire 1a before the softening annealing furnace 51 lowers the endurance to be plated 1a. . borrow Therefore, the to-be-plated wire 1a is not burdened, and it is possible to efficiently assist the traveling of the to-be-plated wire 1a (the immersion plating line 1b) which has low endurance by the softening annealing furnace 51.
又,轉換浸鍍線1b之行走方向的方向轉換滾輪之中,配置於熔融浸鍍銲錫槽62的內部的槽中方向轉換滾輪64,係與輸送絞盤91、92相同,將熔融浸鍍銲錫槽62之內部所具有的藉由馬達驅動而使滾輪主動轉動,以作為進行輔助輸送浸鍍線1b的輸送絞盤而構成。 Further, among the direction changing rollers that change the traveling direction of the dip plating line 1b, the groove direction changing roller 64 disposed inside the molten immersion solder bath 62 is the same as the transfer winches 91 and 92, and the molten immersion solder bath is formed. The inside of the 62 is driven by a motor to actively rotate the roller to serve as a conveying winch for assisting the conveyance of the dip plating line 1b.
藉由將槽中方向轉換滾輪64作為輸送絞盤而構成,在浸鍍線1b通過熔融浸鍍銲錫槽62前後,將浸鍍線1b的行走方向轉換時,係以與浸鍍線1b的行走速度略同的轉動速度而主動轉動,因此,槽中方向轉換滾輪64將浸鍍線1b的行走方向轉換之外,還可輔助浸鍍線1b的行走。 By forming the groove direction changing roller 64 as a conveying winch, the traveling speed of the dip plating line 1b is changed before and after the dip plating line 1b passes through the molten dip solder bath 62, and the traveling speed of the dip plating line 1b is used. The rotation speed is actively rotated by the same rotation speed. Therefore, the groove direction direction changing roller 64 converts the traveling direction of the dip plating line 1b, and also assists the walking of the dip plating line 1b.
因此,藉由槽中方向轉換滾輪64與浸鍍線1b接觸,轉動方向的摩擦抵抗所產生的負荷不會施加於浸鍍線1b,可順暢地將浸鍍線1b送出。 Therefore, by the contact of the groove direction direction changing roller 64 with the dip plating line 1b, the load generated by the frictional resistance in the rotational direction is not applied to the dip plating line 1b, and the dip plating line 1b can be smoothly sent out.
詳細而言,轉換行走方向時,會特別施加負荷於浸鍍線1b,因此,浸鍍線1b之行走方向的轉換會特別成為該浸鍍線1b的0.2%耐力值增加的要因。而將浸鍍線1b從浸漬於熔融浸鍍銲錫液63的狀態取出時,必定須要在熔融浸鍍銲錫槽62中,進行這樣的行走方向轉換。 Specifically, when the traveling direction is switched, a load is particularly applied to the dip plating line 1b. Therefore, the transition of the traveling direction of the dip plating line 1b is particularly a factor that increases the 0.2% proof value of the dip plating line 1b. When the dip plating line 1b is taken out from the state of being immersed in the molten immersion solder liquid 63, it is necessary to perform such a traveling direction conversion in the molten immersion solder bath 62.
因此,浸鍍線1b在浸漬於熔融浸鍍銲錫液63的狀態行走,且進行方向轉換時,承受來自熔融浸鍍銲錫液63的黏性抵抗,因此,行走方向轉換時更增加負荷,而使0.2% 耐力值的增加量變得明顯。 Therefore, the dip plating line 1b travels in a state of being immersed in the molten dip solder liquid 63, and is subjected to the viscous resistance from the molten immersion solder liquid 63 when the direction is changed. Therefore, the load is further increased during the switching of the traveling direction. 0.2% The increase in the endurance value becomes apparent.
因此,如上所述,藉由將槽中方向轉換滾輪64作為輸送絞盤而構成,即使浸鍍線1b在浸漬於熔融浸鍍銲錫液63的狀態進行方向轉換,可盡量抑制於浸鍍線1b施加的負荷,而可製造0.2%耐力值低的浸鍍線1b。 Therefore, as described above, the groove intermediate direction changing roller 64 is configured as a conveying winch, and even if the dip plating line 1b is immersed in the molten immersion plating liquid 63, the direction is switched, and the immersion plating line 1b can be suppressed as much as possible. The load can be made to have a dip plating line 1b with a low 0.2% endurance value.
接著,針對捲取浸鍍線1b前所施加之張力作驗證的張力驗證實驗而作說明,作為效果確認實驗。 Next, a tension verification test for verifying the tension applied before the coiling line 1b was taken up was described as an effect confirmation experiment.
(張力驗證實驗) (Tension verification experiment)
張力驗證實驗係根據浸鍍線1b的鬆弛程度對0.2%耐力值的影響進行驗證,係浸鍍線1b從槽上方向轉換滾輪65到達捲取機構71(捲取機構上游側配置滾輪73A)前期之間,對浸鍍線1b施加之張力的施加程度,浸鍍線1b的鬆弛程度而進行驗證。 The tension verification test verifies the influence of the degree of relaxation of the immersion plating line 1b on the 0.2% proof value, and the immersion plating line 1b is switched from the groove up direction to the take-up mechanism 71 (the upstream side arrangement roller 73A of the take-up mechanism). The degree of application of the tension applied to the immersion plating line 1b and the degree of slack of the immersion plating line 1b were verified.
在浸鍍線1b到達捲取機構上游側滾輪73A之前,對浸鍍線1b施加之張力的施加程度難以數值化,因此,張力的施加程度,係將影響該張力施加程度的輸送絞盤91、92的設置數量,以及使熔融浸鍍銲錫槽62之內部的軸桿(槽中方向轉換滾輪64)為被動轉動或主動轉動參數化,對應這些參數的設定,而驗證0.2%耐力特性。 Before the immersion plating line 1b reaches the upstream side roller 73A of the winding mechanism, the degree of application of the tension applied to the immersion plating line 1b is difficult to be quantified, and therefore, the degree of application of the tension is the conveying winch 91, 92 which affects the degree of application of the tension. The number of the set, and the shaft (the direction change roller 64 in the groove) inside the molten dip solder bath 62 are parameterized as passive rotation or active rotation, and the setting of these parameters is set to verify the 0.2% endurance characteristic.
詳細而言,如表9所示,在浸鍍線1b到達捲取機構上游側配置滾輪73A之前,係對浸鍍線1b的張力施加程度設定為第一張力設定至第四張力設定的四階段。 Specifically, as shown in Table 9, before the dip plating line 1b reaches the upstream side arrangement roller 73A of the winding mechanism, the degree of tension applied to the dip plating line 1b is set to four stages from the first tension setting to the fourth tension setting. .
[表9]
於第一張力設定中,係輸送絞盤的設置數量只有第一輸送絞盤91一個,且以隨動轉動滾輪構成槽中方向轉換滾輪64的設定。又,隨動轉動滾輪係未具有驅動滾輪的馬達等,係被動地自由轉動的滾輪。第一張力設定係四階段中張力最強,浸鍍線1b呈繃緊伸張的狀態。In the first tension setting, the number of the conveying winches is only one of the first conveying winches 91, and the setting of the direction changing roller 64 in the groove is formed by the following rotating rollers. Further, the follower rotating roller is a motor that does not have a drive roller, and is a roller that is freely rotatable. The first tension setting system has the strongest tension in the four stages, and the dip plating line 1b is in a state of being stretched and stretched.
於第二張力設定中,係輸送絞盤的設置數量只有第一輸送絞盤91一個,且以驅動轉動滾輪構成槽中方向轉換滾輪64的設定。In the second tension setting, the number of the conveying winches is only one of the first conveying winches 91, and the setting of the direction changing roller 64 in the groove is formed by driving the rotating rollers.
又,驅動轉動滾輪係藉由馬達等驅動而能主動轉動的滾輪。第二張力設定係相對第一張力設定張力為稍弱的狀態。Further, the driving rotary roller is a roller that can be actively rotated by a motor or the like. The second tension setting is a state in which the tension is slightly weaker than the first tension.
於第三張力設定中,係輸送絞盤的設置數量為第一輸送絞盤91及第二輸送絞盤92二個,且以隨動轉動滾輪構成槽中方向轉換滾輪64的設定,相對第二張力設定張力為稍弱的狀態。In the third tension setting, the number of the conveying winches is two, that is, the first conveying winch 91 and the second conveying winch 92, and the setting of the direction changing roller 64 in the groove is formed by the following rotating roller, and the tension is set with respect to the second tension. It is a weaker state.
於第四張力設定中,係輸送絞盤的設置數量為第一輸送絞盤91及第二輸送絞盤92二個,且以驅動轉動滾輪構成槽中方向轉換滾輪64的設定,相對第三張力設定張力稍弱,且係四階段中最弱,浸鍍線1b呈最鬆弛的狀態。In the fourth tension setting, the number of the delivery winches is two for the first conveying winch 91 and the second conveying winch 92, and the setting of the direction changing roller 64 is formed by driving the rotating roller, and the tension is set relatively with respect to the third tension. It is weak and is the weakest in the four stages, and the immersion plating line 1b is in the most relaxed state.
浸鍍線1b的荷重特性,包含0.2%耐力特性等,在上述第一張力設定至第四張力設定的各別設定的情況,係如表10及圖11所示的結果。The load characteristics of the dip plating line 1b include 0.2% proofurance characteristics and the like, and the results shown in Table 10 and FIG. 11 in the case of the respective settings of the first tension setting to the fourth tension setting.
又,針對待鍍線1a皆為無氧銅,尺寸分別為0.16mm×2.0mm、0.2mm×1.0mm二種平角線而進行。Further, the wires 1a to be plated were all oxygen-free copper, and the sizes were 0.16 mm × 2.0 mm and 0.2 mm × 1.0 mm, respectively.
從表10及圖4的結果,二種尺寸的待鍍線1a之任一情況,輸送絞盤的設置數量係二個比一個更可使0.2%耐力值微低設定。因此,可確認輸送絞盤的設置數量係二個比一個更具有效性。From the results of Table 10 and Fig. 4, in either case of the two sizes of the to-be-plated wire 1a, the number of the delivery winches is set to be two more than one, and the 0.2% proof value is set to be slightly lower. Therefore, it can be confirmed that the number of the setting of the conveying winch is two more effective than one.
又,輸送絞盤的設置數量係二個時,即,第四張力設定及第三張力設定的情況,如圖11(b)所示,待鍍線1a係0.2mm×1.0mm大小的平角線時,槽中方向轉換滾輪64無論是否為驅動轉動滾輪或隨動轉動滾輪,0.2%耐力值皆為相同的值。另一方面,這之外全部設定中,比較以驅動轉動滾輪構成槽中方向轉換滾輪64,與以隨動轉動滾輪構成槽中方向轉換滾輪64的情況,前者的0.2%耐力值為較低的值。Moreover, when the number of the transport winches is two, that is, the fourth tension setting and the third tension setting, as shown in FIG. 11(b), when the to-be-plated line 1a is a rectangular line of a size of 0.2 mm × 1.0 mm The groove direction direction changing roller 64 has the same value of 0.2% of the endurance value regardless of whether the driving rotating roller or the following rotating roller. On the other hand, in all the other settings, the comparison is made by driving the rotating roller to form the in-slot direction changing roller 64, and the following rotating roller is used to form the groove-in-direction switching roller 64. The former has a low 0.2% proof value. value.
由此,比較以驅動轉動滾輪構成槽中方向轉換滾輪64的情況,與以隨動轉動滾輪構成槽中方向轉換滾輪64,清楚顯示前者的0.2%耐力值有變低的傾向,可確認以驅動轉動滾輪構成槽中方向轉換滾輪64的有效性。Therefore, in comparison with the case where the groove rotating direction direction changing roller 64 is driven by the driving rotating roller, and the groove turning direction changing roller 64 is formed by the following rotating roller, it is clear that the former 0.2% proof force value tends to be low, and it can be confirmed that the driving is driven. The rotating roller constitutes the effectiveness of the direction changing roller 64 in the groove.
特別從表10及圖11的結果,第一張力設定至第四張力設定之中,第四張力設定的情況,即,浸鍍線1b到達捲取機構71(捲取機構上游側配置滾輪73A)前,以該浸鍍線1b最鬆弛的狀態捲取該浸鍍線1b時,可降低浸鍍線1b的負荷,可確認0.2%耐力值特別降低。In particular, from the results of Table 10 and FIG. 11, the first tension is set to the fourth tension setting, and the fourth tension is set, that is, the dip plating line 1b reaches the winding mechanism 71 (the winding mechanism upstream side arrangement roller 73A) When the immersion plating line 1b is wound up in a state where the immersion plating line 1b is most slack, the load of the immersion plating line 1b can be reduced, and it can be confirmed that the 0.2% proof stress value is particularly lowered.
更進一步,至少以二個輸送絞盤的設置構成,以及以驅動轉動滾輪構成槽中方向轉換滾輪64的構成之任一,輔助輸送待鍍線1a(浸鍍線1b)的捲取,係可在浸鍍線1b到達捲取機構71(捲取機構上游側配置滾輪73A)前,使該浸鍍線1b呈鬆弛的狀態,而在可獲得0.2%耐力值降低至指定值、良好品質的浸鍍線1b上,可確認有效。Further, at least one of the arrangement of the two conveying winches and the configuration of the direction changing roller 64 in the groove by the driving rotating roller, the auxiliary conveying of the to-be-plated wire 1a (the immersion plating line 1b) can be carried out. Before the dip plating line 1b reaches the winding mechanism 71 (the upstream side arrangement roller 73A of the winding mechanism), the immersion plating line 1b is relaxed, and the immersion plating having a 0.2% proof endurance value reduced to a specified value and good quality can be obtained. On line 1b, it can be confirmed that it is valid.
上述鍍銲錫線的製造裝置10及鍍銲錫線的製造方法,並不限於上述構成及製造方法,係可藉由各式各樣的構成及製造方法而構成。The manufacturing apparatus 10 and the method of manufacturing the plating solder wire of the above-described plating solder wire are not limited to the above-described configuration and manufacturing method, and may be configured by various configurations and manufacturing methods.
例如,第一輸送絞盤91、第二輸送絞盤92並不限於配置在上述配置位置,亦可配置於行走方向之任一位置。又,輸送絞盤亦可只具有第一輸送絞盤91及第二輸送絞盤92之任一的構成。For example, the first transport winch 91 and the second transport winch 92 are not limited to being disposed at the above-described arrangement position, and may be disposed at any position in the traveling direction. Further, the transport winch may have only one of the first transport winch 91 and the second transport winch 92.
具體地,例如,如圖12所示,亦可不設置第二輸送絞盤92而構成。Specifically, for example, as shown in FIG. 12, the second transport winch 92 may not be provided.
更進一步,亦可係具有第一輸送絞盤91及第二輸送絞盤92以外的複數、設置於適當位置的輸送絞盤。Furthermore, it is also possible to provide a plurality of conveying winches provided at appropriate positions other than the first conveying winch 91 and the second conveying winch 92.
又更進一步,並不限於槽中方向轉換滾輪64的構成如上所述的,以驅動轉動滾輪而主動轉動,亦可係槽上方向轉換滾輪65構成於驅動轉動滾輪而主動轉動。Further, the configuration of the groove direction direction changing roller 64 is not limited to the above, and the driving roller is driven to rotate actively. Alternatively, the groove direction changing roller 65 may be configured to drive the rotating roller to actively rotate.
又,鍍銲錫線的製造裝置10係如上所述,捲取機構71配置有捲取機構上游側配置滾輪73A。Moreover, as described above, the coiling mechanism 71 is provided with the winding mechanism upstream side arrangement roller 73A.
熔融浸鍍銲錫槽62之上方所具有的槽上方向轉換滾輪65的特徵在於,係配置在高於捲取機構上游側配置滾輪73A的位置。The groove-direction direction changing roller 65 provided above the molten-dip solder bath 62 is characterized in that it is disposed at a position higher than the roller 73A on the upstream side of the winding mechanism.
換而言之,上述鍍銲錫線的製造方法的特徵在於,係浸鍍線1b藉由槽上方向轉換滾輪65而方向轉換後,行走至捲取機構71一側,再藉由低於槽上方向轉換滾輪65之低位置所配置的捲取機構上游側配置滾輪73A,將浸鍍線開始架越在捲取機構71。In other words, the method of manufacturing the above-described plated solder wire is characterized in that the immersion plating line 1b is changed in direction by the groove direction switching roller 65, and then travels to the side of the winding mechanism 71, and is further lower than the groove. The roller 73A is disposed on the upstream side of the winding mechanism disposed at the lower position of the direction changing roller 65, and the dip plating line starts to be placed on the winding mechanism 71.
藉由這樣鍍銲錫線的製造裝置10及製造方法,可獲得0.2%耐力值充份降低,期望品質的浸鍍線1b,藉由使這樣的浸鍍線1b安定而獲得,可提升產品產率,又可提升製造效率。According to the manufacturing apparatus 10 and the manufacturing method of the solder wire, the 0.2% proof stress value can be sufficiently reduced, and the desired immersion plating line 1b can be obtained by setting such a immersion plating line 1b to improve the product yield. It can also improve manufacturing efficiency.
更進一步,可有效率地製造0.2%耐力值充份降低、期望品質的浸鍍線1b,因此,可達到大量生產適合且低耐力化的浸鍍線1b,以作為太陽能電池用導線。Further, the dip plating line 1b having a 0.2% proof endurance value and a desired quality can be efficiently produced, and therefore, a dip plating line 1b suitable for mass production and low endurance can be obtained as a lead wire for a solar cell.
若詳細說明,例如,如圖16(a)所示,習知構成係以槽上方向轉換滾輪65與捲取機構上游側配置滾輪73A略同高度而配置的情況,如圖16(a)中的X部分放大圖所示,作用在浸鍍線1b的重力g只對行走方向略垂直的方向作用。As described in detail, for example, as shown in FIG. 16(a), the conventional configuration is such that the groove upward direction switching roller 65 is disposed at the same height as the winding mechanism upstream side arrangement roller 73A, as shown in FIG. 16(a). As shown in the enlarged view of the X portion, the gravity g acting on the dip plating line 1b acts only in a direction slightly perpendicular to the traveling direction.
又,如圖16(b)所示,習知係槽上方向轉換滾輪65以低於捲取機構上游側配置滾輪73A的高度而配置的情況,如圖16(b)中的X部分放大圖所示,作用在浸鍍線1b的重力g,係與浸鍍線1b的行走方向相反方向的成份g2對浸鍍線1b作用。Further, as shown in Fig. 16 (b), the groove upper direction changing roller 65 is disposed so as to be lower than the height of the roller 73A on the upstream side of the winding mechanism, as shown in Fig. 16(b). As shown in the figure, the gravity g acting on the dip plating line 1b acts on the dip plating line 1b by the component g2 which is opposite to the traveling direction of the dip plating line 1b.
於上述任一情況,在使浸鍍線1b行走至捲取機構上游側配置滾輪73A期間,浸鍍線1b容易承受作用於其本體的重力g所產生的負荷,而產生必須加大設定捲取張力調節機72側的捲取力的必要,產生於浸鍍線1b施加的負荷變得更大的問題。In any of the above cases, while the dip plating line 1b is moved to the upstream side of the winding mechanism to arrange the roller 73A, the dip plating line 1b is easily subjected to the load generated by the gravity g acting on the main body, and the setting winding must be increased. The necessity of the winding force on the tension adjuster 72 side is caused by the problem that the load applied to the dip plating line 1b becomes larger.
相對於此,槽上方向轉換滾輪65係高於捲取機構上游側配置滾73A之配置高度的位置的相對高度關係而配置時,如圖13所示,浸鍍線1b通過熔融浸鍍銲錫槽62後,藉由槽上方向轉換滾輪65而方向轉換的浸鍍線1b,可一邊傾斜一邊行走,以使浸鍍線1b行走至捲取機構上游側配置滾輪73A期間,往行走方向的下游側前進、下降。On the other hand, when the groove-up direction changing roller 65 is disposed in a relative height relationship higher than the position at which the arrangement height of the upstream side of the winding mechanism 73A is arranged, the immersion plating line 1b is melt-dip soldered as shown in FIG. After the 62, the dip plating line 1b which is direction-converted by the groove direction switching roller 65 can be moved while being inclined so that the dip plating line 1b travels to the downstream side of the traveling direction during the upstream side of the winding mechanism 73A. Advance and decline.
藉由將浸鍍線1b設定為這樣的態樣,如圖13中X部分放大圖所示,於槽上方向轉換滾輪65與捲取機構上游側配置滾輪73A期間,作用於浸鍍線1b的重力g之中,浸浸鍍線1b的行走方向成份g2係可作為朝向捲取機構上游側配置滾輪73A,輸送浸鍍線1b的輔助力而作用。By setting the dip plating line 1b in such a manner, as shown in the enlarged view of the X portion in FIG. 13, the groove is applied to the immersion plating line 1b while the groove direction switching roller 65 and the upstream side of the winding mechanism are disposed with the roller 73A. Among the gravitational g, the traveling direction component g2 of the dip-plated wire 1b functions as an auxiliary force for arranging the roller 73A toward the upstream side of the winding mechanism and transporting the immersion plating wire 1b.
依此,作用於浸鍍線1b本體的重力g,係沿著浸鍍線1b的長度方向略均勻施加,且在浸鍍線1b不會有局部的負荷作用,可作為輸送輔助力而作用,且如滾輪或輸送帶等用於輔助輸送的元件,並非對浸鍍線1b一邊物理接觸一邊輔助輸送,因此,不會對浸鍍線1b施加摩擦抵抗,而可有效率地且不給予負荷,輔助輸送。Accordingly, the gravity g acting on the body of the dip plating line 1b is applied evenly along the longitudinal direction of the dip plating line 1b, and does not have a local load on the dip plating line 1b, and functions as a conveying assisting force. Further, an element for assisting conveyance such as a roller or a conveyor belt does not assist the conveyance while physically contacting the dip plating line 1b. Therefore, friction resistance is not applied to the dip plating line 1b, and the load can be efficiently and without load. Auxiliary delivery.
再者,利用作用於浸鍍線1b本體的重力g,可輔助輸送該浸鍍線1b本體的程度,係可使捲取張力調節機72側的捲取力微小設定,而可為簡單的構成。Further, the gravity g acting on the main body of the dip plating line 1b can assist the conveyance of the main body of the immersion plating line 1b, and the winding force on the side of the winding tension adjusting machine 72 can be set minutely, which can be a simple configuration. .
因此,於軟化退火工序中0.2%耐力值降低的浸鍍線1b,係保持其0.2%耐力值低的狀態,而可在捲取機構上游側配置滾輪73A取得,且可確保均勻浸鍍厚度。Therefore, the dip plating line 1b having a 0.2% proof endurance value in the softening annealing step is maintained in a state where the 0.2% proof value is low, and can be obtained by arranging the roller 73A on the upstream side of the winding mechanism, and the uniform immersion plating thickness can be ensured.
因此,可獲得0.2%耐力值充份降低、期望品質的浸鍍線1b。Therefore, the dip plating line 1b having a 0.2% proof endurance value and a desired quality can be obtained.
更進一步,在捲取張力調節機72側捲取0.2%耐力值降低的浸鍍線1b時,可未給予浸鍍線1b負荷而捲取,因此,浸鍍線1b不會有破壞等,而可提升製品產率,且可提升製造效率。Further, when the immersion plating line 1b having a 0.2% reduction in the endurance value is wound up on the side of the winding tension adjuster 72, the immersion plating line 1b can be wound without being wound up, so that the immersion plating line 1b is not broken or the like. The product yield can be improved and the manufacturing efficiency can be improved.
特別地,槽上方向轉換滾輪65較佳係配置於,相對熔融浸鍍銲錫槽62所貯存的熔融浸鍍銲錫液63之液面的高度約為3m的位置。In particular, the groove up direction switching roller 65 is preferably disposed at a position where the height of the liquid surface of the molten immersion solder liquid 63 stored in the molten immersion solder bath 62 is about 3 m.
藉由將槽上方向轉換滾輪65配置於相對熔融浸鍍銲錫液63之液面約3m的高度,從熔融浸鍍銲錫槽62到達槽上方向轉換滾輪65期間,可使浸鍍線1b只行走3m充份高度,因此,在這期間,可使浸鍍線1b之表面所附著的熔融浸鍍銲錫液63確實地凝固(固體化)。By arranging the groove up direction switching roller 65 at a height of about 3 m with respect to the liquid surface of the molten immersion solder liquid 63, the immersion plating line 1b can be walked only while the molten immersion solder bath 62 reaches the groove up direction change roller 65. Since the height is 3 m, the molten immersion solder liquid 63 adhering to the surface of the immersion plating line 1b can be surely solidified (solidified).
因此,浸鍍線1b藉由槽上方向轉換滾輪65方向轉換時,藉由浸鍍線1b與槽上方向轉換滾輪65接觸,不會引起浸鍍厚度的變動,而可確保均勻浸鍍厚度。Therefore, when the dip plating line 1b is changed in the direction of the groove direction changing roller 65, the dip plating line 1b comes into contact with the groove direction changing roller 65, and the thickness of the immersion plating is not caused, and the uniform immersion plating thickness can be ensured.
另一方面,槽上方向轉換滾輪65的配置高度例如係高於3m高度而配置時,浸鍍線1b不經意地在槽上方向轉換滾輪65不慎行走長距離,使得浸鍍線1b的負擔隨著行走而增加。更進一步,槽上方向轉換滾輪65的配置高度越高,則浸鍍線1b於方向轉換前的行走方向與方向轉換後的行走方向所成的角度越呈銳角,因此,進行方向轉換時,浸鍍線1b相對槽上方向轉換滾輪65接觸的長度變長等,對浸鍍線1b施加負荷,而變得不佳。On the other hand, when the arrangement height of the groove-up direction changing roller 65 is, for example, higher than the height of 3 m, the dip plating line 1b inadvertently walks a long distance in the groove direction direction changing roller 65, so that the burden of the immersion plating line 1b is Increase while walking. Further, the higher the arrangement height of the groove direction changing roller 65, the sharper the angle between the running direction of the dip plating line 1b before the direction switching and the traveling direction after the direction switching, so that the direction is changed when the direction is changed. The length of contact of the plating line 1b with respect to the groove upward direction changing roller 65 becomes long, and the load is applied to the dip plating line 1b, which is unfavorable.
因此,從確保浸鍍線1b之均勻浸鍍厚度的觀點,以及減輕於浸鍍線1b所施加的負擔的觀點,槽上方向轉換滾輪65的配置高度較佳設定為3m左右。Therefore, from the viewpoint of ensuring the uniform immersion plating thickness of the immersion plating line 1b and the reduction of the load applied to the immersion plating line 1b, the arrangement height of the groove up direction switching roller 65 is preferably set to about 3 m.
又,熔融浸鍍銲錫槽62的內部配置有槽中方向轉換滾輪64,該槽中方向轉換滾輪64係主動轉動,以使浸鍍線1b的行走方向方向轉換至垂直上方,而積極地輔助輸送浸鍍線1b往下游側。Further, a groove middle direction changing roller 64 is disposed inside the molten dip solder bath 62, and the direction changing roller 64 is actively rotated to shift the traveling direction of the dip plating line 1b vertically upward, thereby actively assisting the conveyance. The immersion plating line 1b is on the downstream side.
藉由這樣的槽中方向轉換滾輪64,在槽中方向轉換滾輪64所產生的方向轉換後,可大幅減輕在朝向槽上方向轉換滾輪65而上升的浸鍍線1b所施加的負荷,且可抑制0.2%耐力值的增加。With such a groove-in-direction direction changing roller 64, after the direction change by the direction changing roller 64 in the groove, the load applied to the dip plating line 1b which is raised toward the groove-up direction switching roller 65 can be greatly reduced, and Suppresses an increase in the 0.2% endurance value.
接著,針對進行的浸鍍槽上滾輪配置高度驗證實驗作說明,以作為效果確認實驗。Next, a height verification experiment was performed on the roller on the immersion plating tank to perform an effect confirmation experiment.
(浸鍍槽上滾輪配置高度驗證實驗)(The height verification experiment of the roller on the immersion plating tank)
本實驗係針對浸鍍線1b於捲取工序捲取後的0.2%耐力值的影響而進行驗證的實驗,係根據槽上方向轉換滾輪65的配置高度相對熔融浸鍍銲錫槽62所貯存的銲錫液之液面之差異而進行。This experiment is an experiment for verifying the influence of the 0.2% proof stress value of the dip plating line 1b after the coiling step is taken up, and the solder stored in the molten dip solder bath 62 is based on the arrangement height of the groove up direction changing roller 65. The difference in the liquid level of the liquid is carried out.
詳細而言,如圖14所示,作為本發明例的情況,係槽上方向轉換滾輪65(以下稱之「頂部鏈輪65」)的配置高度相對熔融浸鍍銲錫槽62所貯存的熔融浸鍍銲錫液63的液面,設定為3m(h1),以及作為習知例的情況,係設定為1m(h2),以驗證其與浸鍍線1b於捲取工序捲取後的0.2%耐力值的關係。Specifically, as shown in Fig. 14, in the case of the present invention, the arrangement height of the groove upper direction changing roller 65 (hereinafter referred to as "top sprocket 65") is relative to the molten immersion stored in the molten immersion solder bath 62. The liquid level of the plating solder liquid 63 was set to 3 m (h1), and as a conventional example, it was set to 1 m (h2) to verify the 0.2% endurance after the coiling line 1b was taken up in the winding process. The relationship of values.
又,圖14係顯示在本實驗所使用之裝置的一部分的概略圖,圖14中以二點鏈線表示的行走路徑係表示本發明例中浸鍍線1b的行走路徑,圖14中以一點鏈線表示的行走路徑係表示習知例中浸鍍線1b的行走路徑。又,本發明例及習知例,其捲取機構上游側配置滾輪73A的配置高度,相對銲錫液之液面皆設定為0.9m(H)。Further, Fig. 14 is a schematic view showing a part of the apparatus used in the present experiment, and the traveling path indicated by a two-dot chain line in Fig. 14 indicates the traveling path of the dip plating line 1b in the example of the present invention, and a point in Fig. 14 The traveling path indicated by the chain line indicates the traveling path of the immersion plating line 1b in the conventional example. Further, in the present invention and the conventional example, the arrangement height of the upstream side arrangement roller 73A of the winding mechanism is set to 0.9 m (H) with respect to the liquid surface of the solder liquid.
表11所示的實驗條件之下,浸鍍線1b係對應剖面尺寸,分別使用剖面A及剖面B二種平角線而進行。又,剖面A及剖面B各別剖面的平角尺寸(縱×橫)分別為0.2×1.0mm及0.16×2mm。Under the experimental conditions shown in Table 11, the dip-plating line 1b was carried out in accordance with the cross-sectional dimensions, using two kinds of rectangular lines of the cross-section A and the cross-section B, respectively. Further, the rectangular angles (length × width) of the respective sections of the section A and the section B were 0.2 × 1.0 mm and 0.16 × 2 mm, respectively.
本實驗結果表示於表12及圖15。The results of this experiment are shown in Table 12 and Figure 15.
若著注在平角尺寸為剖面A時,習知例係頂部鏈輪65的配置高度為1m,在通過頂部鏈輪65前後,0.2%耐力值從38MPa上升至42MPa,更在捲取工序捲取後,0.2%耐力值上升至50MPa。If the angle is the section A, the conventional sprocket 65 has a height of 1 m. Before and after passing the top sprocket 65, the 0.2% endurance value rises from 38 MPa to 42 MPa, and is taken up in the winding process. After that, the 0.2% endurance value rose to 50 MPa.
相對於此,本發明例係頂部鏈輪65的配置高度為3m,在通過頂部鏈輪65前後,0.2%耐力值由36MPa上升至38MPa,可抑制0.2%耐力值的上升,在捲取工序捲取後,0.2%耐力值上升至45MPa,可抑制0.2%耐力值的上升。因此,平角尺寸為剖面A時,相較習知例的頂部鏈輪65的配置高度為1m的情況,可確認本發明例可格外抑制0.2%耐力值的上升。On the other hand, in the example of the present invention, the arrangement height of the top sprocket 65 is 3 m, and the 0.2% endurance value is increased from 36 MPa to 38 MPa before and after passing through the top sprocket 65, and the increase in the 0.2% endurance value can be suppressed, and the winding process is performed. After taking it, the 0.2% endurance value rises to 45 MPa, which suppresses an increase in the 0.2% endurance value. Therefore, when the rectangular angle is the cross section A, the height of the top sprocket 65 of the conventional example is 1 m, and it can be confirmed that the example of the present invention can suppress the increase of the 0.2% proof stress value.
接著,平角尺寸為剖面B時,習知例係頂部鏈輪65的配置高度為1m,在通過頂部鏈輪65前後,0.2%耐力值沒有變化,皆為39MPa,但在捲取工序捲取後,0.2%耐力值上升至47MPa。Next, when the flat angle dimension is the cross section B, the conventional example of the top sprocket 65 has a height of 1 m, and the 0.2% endurance value does not change before and after passing through the top sprocket 65, both of which are 39 MPa, but after the winding process is taken up The 0.2% endurance value rose to 47 MPa.
相對於此,本發明例係頂部鏈輪65的配置高度為3m,於通過頂部鏈輪65前後,0.2%耐力值沒有變化,皆為39MPa,與習知例相同的值,但在捲取工序捲取後,0.2%耐力值上升至44MPa,可抑制0.2%耐力值的上升。因此,平角尺寸為剖面B時,相較習知例的頂部鏈輪65的配置高度為1m的情況,可確認本發明例亦可在最後的捲取抑制0.2%耐力值的上升。On the other hand, in the example of the present invention, the top sprocket 65 has a height of 3 m, and the 0.2% endurance value does not change before and after passing through the top sprocket 65, and is 39 MPa, which is the same value as the conventional example, but in the winding process. After the coiling, the 0.2% endurance value rose to 44 MPa, which suppressed the increase in the 0.2% endurance value. Therefore, when the rectangular angle is the cross-sectional dimension B, the arrangement height of the top sprocket 65 of the conventional example is 1 m, and it can be confirmed that the example of the present invention can also suppress the increase of the 0.2% endurance value at the last winding.
根據上述,本發明例的頂部鏈輪65的配置高度為3m時,而相較習知例的頂部鏈輪65的配置高度為1m的情況,可確認本發明例不使0.2%耐力值增加,大致為降低。According to the above, when the arrangement height of the top sprocket 65 of the present invention is 3 m, and the arrangement height of the top sprocket 65 of the conventional example is 1 m, it can be confirmed that the example of the present invention does not increase the 0.2% endurance value. Roughly lower.
又,根據鍍銲錫線的製造裝置10及製造方法,浸鍍機構61可利用薄浸鍍設定及厚浸鍍設定之任一的設定而進行,薄浸鍍設定係以薄浸鍍浸鍍待鍍線1a,厚浸鍍設定係厚於薄浸鍍設定的浸鍍厚度而形成厚浸鍍厚度。Further, according to the manufacturing apparatus 10 and the manufacturing method of the plating solder wire, the dip plating mechanism 61 can be performed by any of the settings of the thin immersion plating and the thick immersion plating, and the thin immersion plating is performed by the thin immersion plating. In the line 1a, the thick immersion plating is thicker than the immersion plating thickness set by the thin immersion plating to form a thick immersion plating thickness.
在此,上述薄浸鍍設定係使待鍍線1a的行走速度為低速行走速度時,對待鍍線1a施行浸鍍的設定。Here, in the thin dip plating setting, when the traveling speed of the to-be-plated wire 1a is a low-speed traveling speed, the plating line 1a is set by immersion plating.
另一方面,上述厚浸鍍設定之特徵在於,係使待鍍線1a的行走速度為高於上述低速行走速度的高速行走速度時,對待鍍線1a施行浸鍍的設定,且根據銲錫溫度及浸鍍厚的指定關係,以決定的浸鍍厚度,對待鍍線1a施行浸鍍的設定。On the other hand, the thick immersion plating is characterized in that the galvanizing line 1a is subjected to immersion plating when the traveling speed of the to-be-plated wire 1a is a high-speed traveling speed higher than the low-speed traveling speed, and according to the soldering temperature and The specified relationship of the immersion plating thickness is set to the immersion plating of the plating line 1a by the determined immersion plating thickness.
在此,銲錫溫度及浸鍍厚度的指定關係只在高速行走速度中成立,根據此關係,可選擇銲錫溫度所對應的浸鍍厚度。Here, the specified relationship between the solder temperature and the immersion plating thickness is established only in the high-speed traveling speed, and depending on the relationship, the immersion plating thickness corresponding to the solder temperature can be selected.
藉由上述鍍銲錫線1b的製造裝置10及製造方法,可獲得0.2%耐力值充份降低,期望品質的浸鍍線1b,藉由使這樣的浸鍍線1b安定而獲得,可提升產品產率,又可提升製造效率。According to the manufacturing apparatus 10 and the manufacturing method of the above-described plating solder wire 1b, it is possible to obtain a 0.2% proof stress value which is sufficiently reduced, and the desired immersion plating line 1b can be obtained by setting such a immersion plating line 1b, thereby improving the product production. Rate, which can increase manufacturing efficiency.
更進一步,可有效率地製造0.2%耐力值充份降低、期望品質的浸鍍線1b,因此,可達到大量生產適合且低耐力化的浸鍍線1b,以作為太陽能電池用導線。Further, the dip plating line 1b having a 0.2% proof endurance value and a desired quality can be efficiently produced, and therefore, a dip plating line 1b suitable for mass production and low endurance can be obtained as a lead wire for a solar cell.
詳細而言,例如藉由捲取機構71或輸送絞盤91、92,調節浸鍍線1b的捲取速度等,於浸鍍工程中,藉由使待鍍線1a以低速行走速度或高速行走速度任一線速行走,可對待鍍線1a形成厚浸鍍厚度或薄浸鍍厚度。Specifically, for example, by the winding mechanism 71 or the conveying winches 91, 92, the winding speed of the immersion plating line 1b is adjusted, and in the immersion plating process, the traveling line 1a is moved at a low speed or a high speed. At any line speed, the plating line 1a can be formed to have a thick immersion plating thickness or a thin immersion plating thickness.
具體地,在設定低速行走速度時,係設定薄浸鍍厚度設定,可對待鍍線1a形成薄浸鍍膜的浸鍍厚度。設定高速行走速度的情況,係設定厚浸鍍厚度設定,可對待鍍線1a形成厚浸鍍膜的浸鍍厚度。Specifically, when the low-speed traveling speed is set, the thin immersion plating thickness setting is set, and the immersion plating thickness of the thin immersion plating film can be formed for the plating line 1a. When the high-speed traveling speed is set, the thick immersion plating thickness setting is set, and the immersion plating thickness of the thick immersion plating film can be formed by the plating line 1a.
藉此,對應浸鍍線1b的使用目的、用途,可將浸鍍線1b構成厚浸鍍設定,或薄浸鍍設定之任一的浸鍍厚度。Accordingly, the dip plating line 1b can be formed into a thick immersion plating setting or a immersion plating thickness of any of the thin immersion plating settings in accordance with the purpose and use of the immersion plating line 1b.
特別係設定高速行走速度時,由於看出銲錫溫度及浸鍍厚度所表示的指定關係,因此,藉由此關係變更銲錫溫度,即使在厚浸鍍中,可進行更厚,或更薄的浸鍍厚度等厚度的細微調節。In particular, when the high-speed traveling speed is set, since the specified relationship between the solder temperature and the immersion plating thickness is seen, the solder temperature can be changed by this relationship, and thicker or thinner immersion can be performed even in thick immersion plating. Fine adjustment of thickness such as plating thickness.
根據上述,對應線速或銲錫溫度的設定,可獲得0.2%耐力值充份降低、均勻且具有期望浸鍍厚度的浸鍍線1b,藉由使這樣高品質的浸鍍線1b安定而獲得,因此,可提升產品產率,又可提升製造效率。According to the above, according to the setting of the line speed or the solder temperature, the dip plating line 1b having a 0.2% proof endurance value which is sufficiently reduced and uniform and having a desired immersion plating thickness can be obtained, and by obtaining such a high-quality immersion plating line 1b, Therefore, the product yield can be improved and the manufacturing efficiency can be improved.
又,低速行走速度較佳係設定為約4m/min左右。Further, the low speed traveling speed is preferably set to about 4 m/min.
依此,藉由低速行走速度設定為約4m/min左右,可獲得例如約14.0~24.0μm左右薄浸鍍厚度的浸鍍線1b。Accordingly, by setting the low-speed traveling speed to about 4 m/min, a dip plating line 1b having a thin immersion plating thickness of, for example, about 14.0 to 24.0 μm can be obtained.
另一方面,高速行走速度較佳係設定為約13m/min左右。On the other hand, the high speed running speed is preferably set to about 13 m/min.
依此,藉由高速行走速度設定為約13m/min左右,可形成例如約28.5~67μm左右厚浸鍍厚度的浸鍍線1b。Accordingly, by setting the high-speed traveling speed to about 13 m/min, it is possible to form the immersion plating line 1b having a thickness of about 28.5 to 67 μm.
即,對應線速係設定為上述低速行走速度,或高速行走速度之任一速度,可使浸鍍厚度的程度大大相異,因此,可生成對應用途、規格,且具有期望浸鍍厚度的浸鍍線1b。That is, the corresponding line speed is set to any of the low speed traveling speed or the high speed traveling speed, and the degree of the immersion plating thickness can be greatly different. Therefore, it is possible to generate a dip having a desired immersion plating thickness corresponding to the application and specifications. Plating line 1b.
又更進一步,藉由在線速為高速行走速度且厚浸鍍設定之下進行浸鍍工序,可使待鍍線1a的表面形成厚浸鍍厚度,但浸鍍工序的銲錫溫度高時,相較薄浸鍍設定的情況,前者具有容易產生浸鍍線1b表面的外觀粗糙的傾向。Further, by performing the immersion plating process at a high speed traveling speed and a thick immersion plating setting, the surface of the wire 1a to be plated can be formed into a thick immersion plating thickness, but when the soldering temperature of the immersion plating process is high, In the case of thin immersion plating, the former tends to have a rough appearance on the surface of the immersion plating line 1b.
因此,藉由將浸鍍工序的銲錫溫度設定為約240℃左右,可使浸鍍線1b之表面的浸鍍膜不會產生凹凸等,可獲得表面呈光滑、均勻浸鍍厚度的浸鍍線1b。Therefore, by setting the soldering temperature in the immersion plating step to about 240 ° C, the immersion plating film on the surface of the immersion plating line 1b can be made free from irregularities and the like, and the immersion plating line 1b having a smooth and uniform immersion plating thickness can be obtained. .
接著,作為效果確認實驗,針對銲錫工序之條件差異所產生的低耐力特性的確認試驗,作說明。Next, as an effect confirmation experiment, the confirmation test of the low endurance characteristic by the difference of the conditions of a soldering process is demonstrated.
(銲錫工序之條件差異所產生的低耐力特性的確認試驗)(Confirmation test of low endurance characteristics due to differences in conditions of the soldering process)
本實驗係使銲錫溫度與浸鍍厚度,以及引張特性的關係明確,而確認本實施態樣的製造方法的有效性,其中銲錫溫度作為薄浸鍍設定及厚浸鍍設定的條件。In this experiment, the relationship between the solder temperature and the immersion plating thickness and the tensile characteristics was confirmed, and the effectiveness of the manufacturing method of the present embodiment was confirmed, in which the solder temperature was set as the condition for the thin immersion plating setting and the thick immersion plating setting.
薄浸鍍設定及厚浸鍍設定各設定銲錫溫度為240℃、260℃、280℃三種,且銅線皆使用無氧銅、三種尺寸為0.2mm×1.0mm、0.16mm×2.0mm、0.2mm×2.0mm的平角線。 Thin immersion plating setting and thick immersion plating setting Each setting soldering temperature is 240 °C, 260 °C, 280 °C, and copper wire is made of oxygen-free copper, three sizes are 0.2mm × 1.0mm, 0.16mm × 2.0mm, 0.2mm × 2.0mm square line.
薄浸鍍設定的情況係在低速行走速度之下,進行浸鍍工序,低速行走速度係線速為4m/min的低速設定。另一方面,厚浸鍍設定的情況係在高速行走速度之下,進行浸鍍工序,高速行走速度係線速為13m/min的高速設定。 In the case of the thin immersion plating, the immersion plating process is performed under the low speed traveling speed, and the low speed traveling speed is set at a low speed of 4 m/min. On the other hand, in the case of thick immersion plating, the immersion plating process is performed under the high-speed traveling speed, and the high-speed traveling speed is set at a high speed of 13 m/min.
作為本實驗結果,在上述設定之下,薄浸鍍設定及厚浸鍍設定之條件的銲錫溫度、浸鍍厚度,以及引張特性的關係表示於表13(a)、(b)。 As a result of the experiment, the relationship between the solder temperature, the immersion thickness, and the tensile characteristics of the conditions of the thin immersion plating setting and the thick immersion plating setting under the above setting is shown in Tables 13(a) and (b).
又,表13(a)係表示在薄浸鍍設定之下銲錫溫度與浸鍍厚度,以及引張特性的關係,而表13(b)係表示在厚浸鍍設定之下,銲錫溫度、浸鍍厚度,以及引張特性的關係。Further, Table 13(a) shows the relationship between the soldering temperature and the immersion plating thickness and the tensile characteristics under the thin immersion plating setting, and Table 13(b) shows the soldering temperature and immersion plating under the thick immersion plating setting. Thickness, and the relationship between the tensile properties.
在線速設定為4m/min的低速行走速度之下,進行浸鍍工序的情況,以及在線速設定為13m/min的高速行走速度之下,進行浸鍍工序的情況,係分別對應每一平角尺寸、溫度的條件,針對浸鍍厚度作比較。When the line speed is set to a low speed traveling speed of 4 m/min, the immersion plating process is performed, and the line speed is set to a high speed running speed of 13 m/min, the immersion plating process is performed for each of the flat angle dimensions. The temperature conditions are compared for the thickness of the immersion plating.
其結果,可確認相較高速行走速度的情況,低速行走速度的情況皆為較薄的浸鍍厚度,而可對待鍍線1a形成浸鍍膜。As a result, it was confirmed that the low-speed traveling speed was a thinner immersion plating thickness than the high-speed traveling speed, and the immersion plating film was formed in the plating line 1a.
若著注在薄浸鍍設定之情況的結果,三種平角尺寸或溫度設定不會被影響,而係如上所述,可使浸鍍厚度變薄,又,相較厚浸鍍設定的情況,可使0.2%耐力值變低。If the result of the thin immersion plating is set, the three flat angle dimensions or temperature settings will not be affected, but as described above, the thickness of the immersion plating can be made thinner, and the thickness of the immersion plating can be set. Reduce the 0.2% endurance value.
且,在三種平角尺寸或溫度設定之組合的任一情況,可確認浸鍍膜的表面外觀皆不會產生粗糙,而可獲得高品質的浸鍍線1b。Further, in any of the combinations of the three flat-angle dimensions or the temperature setting, it was confirmed that the surface appearance of the immersion coating film was not rough, and a high-quality immersion plating line 1b was obtained.
另一方面,若著注在厚浸鍍設定之情況的結果,三種平角尺寸或溫度設定不會被影響,而可使0.2%耐力值變低,皆為50Mpa左右的值。On the other hand, if the result of the thick immersion plating is set, the three flat angle sizes or temperature settings are not affected, and the 0.2% proof stress value is lowered, which is about 50 MPa.
關於厚浸鍍設定的浸鍍厚度,例如尺寸為0.2mm×1.0mm的平角線,銲錫溫度為280℃時,浸鍍厚度為29.5~32.0μm。另一方面,銲錫溫度為240℃時,浸鍍厚度為31.5~38.0μm。Regarding the thickness of the immersion plating set by the thick immersion plating, for example, a rectangular wire having a size of 0.2 mm × 1.0 mm, and a soldering temperature of 280 ° C, the immersion plating thickness is 29.5 to 32.0 μm. On the other hand, when the solder temperature is 240 ° C, the thickness of the immersion plating is 31.5 to 38.0 μm.
更進一步,尺寸為0.16mm×2.0mm的平角線、銲錫溫度為280℃時,浸鍍厚度為44.0~47.0μm。另一方面,銲錫溫度為240℃時,浸鍍厚度為47.5~73.5μm。Further, when the size is 0.16 mm × 2.0 mm, and the solder temperature is 280 ° C, the thickness of the immersion plating is 44.0 to 47.0 μm. On the other hand, when the solder temperature is 240 ° C, the thickness of the immersion plating is 47.5 to 73.5 μm.
由這樣的結果,特別係厚浸鍍設定的情況,顯示浸鍍溫度越低浸鍍厚度有變厚的傾向,可看出銲錫溫度及浸鍍厚度的關係。As a result of this, particularly in the case of thick immersion plating, it is shown that the immersion plating temperature tends to be thicker as the immersion plating temperature is lower, and the relationship between the solder temperature and the immersion plating thickness can be seen.
因此,藉由銲錫溫度及浸鍍厚度的關係,即使在厚浸鍍設定中,可確認浸鍍厚度係可對應銲錫溫度的設定而細微調節。Therefore, by the relationship between the solder temperature and the immersion plating thickness, even in the thick immersion plating setting, it can be confirmed that the immersion plating thickness can be finely adjusted in accordance with the setting of the solder temperature.
例如,尺寸為0.2mm×1.0mm的平角線,在厚浸鍍設定中,比較想將浸鍍厚度變薄時,將銲錫溫度設定為280℃即可,相反地,在厚浸鍍設定中,比較想將浸鍍厚度變厚時,將銲錫溫度設定為240℃即可,若想設定在這些之間厚度時,將銲錫溫度設定為260℃即可。For example, in a thick immersion plating setting, when the thickness of the immersion plating is thinner, the soldering temperature is set to 280 ° C. Conversely, in the thick immersion plating setting, When it is desired to increase the thickness of the immersion plating, the solder temperature may be set to 240 ° C. If the thickness is to be set between these, the solder temperature may be set to 260 ° C.
又,尺寸為0.16mm×2.0mm的平角線,在銲錫溫度設定為260℃或280℃的情況,浸鍍線1b之表面外觀產生粗糙,因此,為了避免這樣的狀況,將銲錫溫度設定為240℃即可。Further, in the case of a rectangular wire having a size of 0.16 mm × 2.0 mm, when the solder temperature is set to 260 ° C or 280 ° C, the surface appearance of the dip plating line 1 b is rough. Therefore, in order to avoid such a situation, the solder temperature is set to 240. °C can be.
依此,根據銲錫溫度及浸鍍厚度的指定關係,藉由設定銲錫溫度,可獲得期望浸鍍厚度及外觀高品質的浸鍍線1b。Accordingly, according to the specified relationship between the solder temperature and the immersion plating thickness, by setting the solder temperature, the immersion plating line 1b having a desired immersion plating thickness and a high appearance quality can be obtained.
又,上述鍍銲錫線的製造裝置及鍍銲錫線的製造方法,並不限於上述的構成,係可藉由各式各樣的構成而構成。Moreover, the apparatus for manufacturing the above-described plating solder wire and the method for producing the soldering wire are not limited to the above-described configuration, and may be configured by various configurations.
例如,其他實施態樣的製造裝置10A,係如圖17(a)、(b)所示,可將預先加熱爐51P設置於超音波水洗浄槽41與軟化退火爐51之間。For example, in the manufacturing apparatus 10A of another embodiment, as shown in FIGS. 17(a) and 17(b), the preheating furnace 51P can be disposed between the ultrasonic water washing tank 41 and the softening annealing furnace 51.
如圖17(b)所示,即使在待鍍線1a的行走時間及行走距離短的情況,預先加熱爐51P也急劇提高待鍍線1a的溫度而為特殊化的構成。As shown in Fig. 17 (b), even in the case where the traveling time and the walking distance of the to-be-plated wire 1a are short, the preheating furnace 51P sharply raises the temperature of the to-be-plated wire 1a, and is a special structure.
具體而言,預先加熱爐51P於預先加熱爐本體52P具有鞘管53L。該鞘管53L係沿著待鍍線1a的行走方向而直線狀構成的中空管,待鍍線1a通過預先加熱爐51P及軟化退火爐51時,將預先加熱爐本體52P及軟化退火爐本體52各自內部作為連通配置的狀態,以使該待鍍線1a不接觸空氣而氧化。Specifically, the preheating furnace 51P has a sheath tube 53L in the preheating furnace body 52P. The sheath tube 53L is a hollow tube which is linearly formed along the traveling direction of the to-be-plated wire 1a. When the to-be-plated wire 1a passes through the preheating furnace 51P and the softening annealing furnace 51, the preheating furnace body 52P and the softening annealing furnace body are used. Each of the 52s is in a state of being connected to each other so that the to-be-plated wire 1a is oxidized without coming into contact with air.
預先加熱爐51P之內部與軟化退火爐51相同,預先加熱爐本體52P之內部,沿著鞘管53L的長邊方向具有複複個加熱器54P,且係以狹小於軟化退火爐51之加熱器54的配置間隔的距離而配置。The inside of the preheating furnace 51P is the same as the softening annealing furnace 51, and the inside of the furnace main body 52P is preheated, and the heater 54P is provided along the longitudinal direction of the sheath tube 53L, and is narrower than the heater of the softening annealing furnace 51. The configuration of 54 is configured by the distance of the interval.
藉此,即使加速速線使待鍍線1a行走,於軟化退火工序之前,在預先加熱爐51P加熱待鍍線1a,以作為預先加熱工序,可將加熱狀態的待鍍線1a供給至軟化退火爐51。Thereby, even if the accelerated speed line causes the wire to be plated 1a to travel, before the softening and annealing process, the wire 1a to be plated is heated in the preheating furnace 51P as a preheating process, and the wire 1a to be plated in a heated state can be supplied to the softening and retreating. Stove 51.
因此,對應待鍍線1a之線速的高速化,於軟化退火工序,可使待鍍線1a確實且充份地呈低耐力化的狀態。Therefore, in accordance with the high speed of the line speed of the to-be-plated wire 1a, in the softening annealing process, the to-be-plated wire 1a can be made into a state of a low endurance reliably and fully.
因此,依據上述鍍銲錫線的製造裝置10A及鍍銲錫線的製造方法,在厚浸鍍設定或薄浸鍍設定任一設定之下所製造的浸鍍線1b,亦可作為要求低耐力特性的太陽能電池導線而應用。Therefore, according to the above-described method for manufacturing the plated solder wire 10A and the method of manufacturing the solder wire, the dip plating line 1b manufactured under the setting of the thick immersion plating or the thin immersion plating can also be used as a low endurance characteristic. Solar cell wires are used.
又,於鞘管53L的軟化退火爐51與預先加熱爐51P之間部分構成有預先還原氣體供給部57P,其供給還原氣體至相當於鞘管53L之長度方向的預先加熱爐51P的部分。Further, a pre-reduced gas supply unit 57P is provided between the softening annealing furnace 51 of the sheath tube 53L and the preheating furnace 51P, and supplies a reducing gas to a portion corresponding to the preheating furnace 51P in the longitudinal direction of the sheath tube 53L.
上述還原氣體供給部57,係將作為還原氣體G的氫氣與氮氣之混合氣體供給至鞘管53L,以相當於鞘管53L之軟化退火爐51的內部空間作為混合氣體環境,而預先還原氣體供給部57P係將作為還原氣體G的氮氣氣體或水蒸氣氣體(steam gas),供給至相當於鞘管53L之預先加熱爐51P的內部空間,使該內部空間為氮氣氣體環境或水蒸氣氣體環境。The reducing gas supply unit 57 supplies a mixed gas of hydrogen and nitrogen as the reducing gas G to the sheath tube 53L, and the internal space of the softening annealing furnace 51 corresponding to the sheath tube 53L is used as a mixed gas atmosphere, and the reducing gas supply is performed in advance. The portion 57P supplies a nitrogen gas or a steam gas as the reducing gas G to the internal space of the preheating furnace 51P corresponding to the sheath tube 53L, and the internal space is a nitrogen gas atmosphere or a water vapor gas atmosphere.
藉此,可防止待鍍線1a通過預先加熱爐51P時,其表面氧化,且預先加熱爐51P未使用氫氣氣體作為還原氣體G,而係使用氮氣氣體或水蒸氣氣體,即安全且容易處理。Thereby, it is possible to prevent the surface of the to-be-plated wire 1a from being oxidized when it passes through the preheating furnace 51P, and the preheating furnace 51P does not use hydrogen gas as the reducing gas G, and uses nitrogen gas or steam gas, that is, it is safe and easy to handle.
詳細而言,若著注在上述低耐力特性確認實驗的表13(a)、(b)中的0.2%耐力值,相較薄浸鍍設定的情況,厚浸鍍設定於任一平角尺寸、溫度,0.2%耐力值皆為高的結果。Specifically, when the 0.2% proof value in Table 13 (a) and (b) of the low endurance characteristic confirmation test is noted, the thick immersion plating is set to any flat angle size, compared with the case of the thin immersion plating setting. Temperature, 0.2% endurance values are all high results.
其理由係因為,線速為高速行走速度時,一方面可於浸鍍工序設定厚浸鍍,另一方面使線速加快,因此,浸鍍工序前所進行的軟化退火工序在對待鍍線1a進行完全的軟化退火前,浸鍍線1b即通過軟化退火爐51,結果產生無法對待鍍線1a充份進行軟化退火等情況。The reason is that, when the line speed is a high-speed traveling speed, thick immersion plating can be set in the immersion plating process, and the line speed is accelerated. Therefore, the softening annealing process performed before the immersion plating process is performed on the plating line 1a. Before the completion of the softening annealing, the dip plating line 1b passes through the softening annealing furnace 51, and as a result, the plating line 1a cannot be sufficiently soft-annealed.
於此情況,藉由以厚浸鍍設定進行浸鍍工序,即使可在待鍍線1a之表面形成厚浸鍍厚度,由於線速也是高速行走速度,因此,相較薄浸鍍設定的情況,前者生成0.2%耐力值較高的浸鍍線1b。In this case, by performing the immersion plating step by thick immersion plating, even if a thick immersion plating thickness can be formed on the surface of the line to be plated 1a, since the line speed is also a high-speed traveling speed, compared with the case of the thin immersion plating setting, The former generates a dip plating line 1b having a 0.2% high endurance value.
對此,如上述製造裝置10A,即,如圖17(a)、(b)所示,藉由將預先加熱爐51P設置於超音波水洗浄槽41與軟化退火爐51之間,於預先加熱工序可藉由預先加熱爐51P對待鍍線1a充份加熱後,再進行軟化退火工序。On the other hand, as described above, in the manufacturing apparatus 10A, as shown in Figs. 17(a) and (b), the preheating furnace 51P is provided between the ultrasonic water washing tank 41 and the softening annealing furnace 51, and is heated in advance. In the step, the plating line 1a is sufficiently heated by the preheating furnace 51P, and then the softening annealing step is performed.
因此,即使待鍍線1a高速行走,亦可在軟化退火工序,確實地使待鍍線1a低耐力化。Therefore, even if the wire 1a to be plated is traveling at a high speed, the softening annealing process can be performed to reliably reduce the endurance of the wire 1a to be plated.
因此,最後可獲得0.2%耐力值低,且具有對應厚浸鍍設定的厚浸鍍厚度的浸鍍線1b。Therefore, it is finally possible to obtain a dip plating line 1b having a low 0.2% endurance value and a thick immersion plating thickness corresponding to the thick immersion plating setting.
軟化退火爐51的上游側附近所設置的預先加熱爐51P,係加熱器54的配置數量或電量增加,更進一步,內部不為氫氣氣體,而係供給安全又容易處理的氮氣氣體或水蒸氣氣體的氣體環境等,係在待鍍線1a的加熱性能中比軟化退火爐51為更特殊化的構成。The preheating furnace 51P provided in the vicinity of the upstream side of the softening annealing furnace 51 increases the number of electric heaters or the amount of electric power, and further, the inside is not a hydrogen gas, but supplies a nitrogen gas or a steam gas which is safe and easy to handle. The gas atmosphere or the like is a more specific structure than the softening annealing furnace 51 in the heating performance of the to-be-plated wire 1a.
因此,即使使待鍍線1a高速行走,於軟化退火爐51作為確保軟化退火時間的機構,例如,不須尋求將軟化退火爐51長形化構成等對策,相較軟化退火爐51長形化的構成,將預先加熱爐51P設置於軟化退火爐51之上游側的當前的構成,不會增加設置空間或成本。Therefore, even if the wire to be plated 1a is moved at a high speed, the softening annealing furnace 51 serves as a mechanism for securing the softening annealing time. For example, it is not necessary to seek to increase the length of the softening annealing furnace 51, and the shape is longer than that of the softening annealing furnace 51. In the configuration, the preheating furnace 51P is placed on the upstream side of the softening annealing furnace 51, and the installation space or cost is not increased.
因此,藉由活用既有設備、追加設計變更的簡易構成,可對應線速的高速化,且在厚浸鍍設定或薄浸鍍設定任一設定之下所製造的浸鍍線1b,可達成充分低耐力化,可作為要求低耐力特性的太陽能電池導線而應用。Therefore, by using a simple configuration that utilizes existing equipment and additional design changes, it is possible to achieve a higher speed of the line speed and a dip plating line 1b manufactured under any setting of thick immersion plating or thin immersion plating. It is sufficiently low-endurance and can be applied as a solar cell wire that requires low endurance characteristics.
又,加熱處理爐22不限於係設置於行走方向中供給裝置12與酸洗浄槽31之間,只要係軟化退火爐51的上游側,設置於其他部位亦可。Further, the heat treatment furnace 22 is not limited to being disposed between the supply device 12 and the pickling tank 31 in the traveling direction, and may be provided at another portion as long as it is on the upstream side of the softening annealing furnace 51.
例如,作為其他實施態樣的製造裝置,不設置上述加熱處理爐22,而係可只有設置上述預先加熱爐51P,且使用水蒸氣氣體作為還原氣體,供給至預先加熱爐51P之內部。For example, in the manufacturing apparatus of another embodiment, the heat treatment furnace 22 is not provided, and only the preheating furnace 51P is provided, and the steam gas is used as the reducing gas, and is supplied to the inside of the preheating furnace 51P.
根據此構成,如上所述,預先加熱爐51P可兼具雙方功能,係在軟化退火爐51之前進行預先加熱的功能之外,再加上上述加熱處理爐22所進行的功能。According to this configuration, as described above, the preheating furnace 51P can have both functions, and the function of the heating processing furnace 22 is added in addition to the function of preheating before the softening annealing furnace 51.
因此,不用說可達到設備成本的削減,更可進一步地縮短待鍍線1a的行走距離,且可生產0.2%耐力值低、高品質的浸鍍線1b。Therefore, it is needless to say that the reduction in equipment cost can be achieved, and the walking distance of the to-be-plated wire 1a can be further shortened, and the dip plating line 1b having a low-resistance value of 0.2% and high quality can be produced.
於本發明之構成與上述實施態樣的對應,銅線係對應本發明之待鍍線1a及浸鍍線1b,以下相同地,加熱處理機構係對應加熱處理爐22,酸洗浄機構係對應酸洗浄槽31,水洗浄機構係對應超音波水洗浄槽41,銅線輸送輔助工序係對應待鍍線輸送輔助工序,銅線輸送輔助機構係對應第一輸送絞盤91、第二輸送絞盤92及主動轉動的槽中方向轉換滾輪64,預先加熱機構係對應預先加熱爐51P,本發明並不只限於上述實施態樣的構成,係可取得許多實施態樣。Corresponding to the configuration of the present invention, the copper wire corresponds to the to-be-plated wire 1a and the dip-plating wire 1b of the present invention. Hereinafter, the heat treatment mechanism corresponds to the heat treatment furnace 22, and the acid cleaning mechanism corresponds to the acid. The cleaning tank 31, the water washing mechanism corresponds to the ultrasonic water washing tank 41, the copper wire conveying auxiliary process corresponds to the auxiliary line to be plated, and the copper wire conveying auxiliary mechanism corresponds to the first conveying winch 91, the second conveying winch 92 and the active The rotating groove direction changing roller 64 and the preheating mechanism correspond to the preheating furnace 51P. The present invention is not limited to the configuration of the above embodiment, and many embodiments can be obtained.
[產業上的可利用性][Industrial availability]
本發明係作為太陽電池的導線而應用,可利用於具有適當低耐力特性的鍍銲錫線的製造方法及製造裝置。The present invention is applied as a wire of a solar cell, and can be utilized in a method and a manufacturing apparatus for a plated solder wire having appropriate low endurance characteristics.
1a...待鍍線1a. . . To be plated
1b...浸鍍線1b. . . Immersion plating line
2...浸鍍前處理機構2. . . Immersion plating treatment mechanism
10...鍍銲錫線的製造裝置10. . . Plating solder wire manufacturing device
10A...其他實施態樣的製造裝置10A. . . Other embodiments of the manufacturing device
12...供給裝置12. . . Supply device
22...加熱處理爐twenty two. . . Heat treatment furnace
23...冷卻水槽twenty three. . . Cooling sink
24...連結管twenty four. . . Connecting tube
30...洗浄機構30. . . Cleaning mechanism
31...酸洗浄槽31. . . Acid cleaning tank
32...磷酸系洗浄液32. . . Phosphate-based cleaning solution
41...超音波水洗淨槽41. . . Ultrasonic water washing tank
42...超音波水洗浄機42. . . Ultrasonic water washing machine
42a‧‧‧超音波振動板 42a‧‧‧Supersonic vibrating plate
43‧‧‧水 43‧‧‧ water
45‧‧‧空氣雨刷 45‧‧‧Air wiper
51‧‧‧軟化退火爐 51‧‧‧softening annealing furnace
51P‧‧‧預先加熱爐 51P‧‧‧Preheating furnace
52‧‧‧軟化退火爐本體 52‧‧‧Softening annealing furnace body
52P‧‧‧預先加熱爐本體 52P‧‧‧Preheating furnace body
53、53L‧‧‧鞘管 53, 53L‧‧‧ sheath
54、54P‧‧‧加熱器 54, 54P‧‧‧ heater
55‧‧‧鞘管上側突出部分 55‧‧‧The upper part of the sheath
55d‧‧‧下端開口部 55d‧‧‧Bottom opening
55u‧‧‧上端開口部 55u‧‧‧Upper opening
56‧‧‧鞘管下側突出部分 56‧‧‧The lower part of the sheath
57‧‧‧還原氣體供給部 57‧‧‧Reducing gas supply department
57P‧‧‧預先還原氣體供給部 57P‧‧‧Pre-reduction gas supply department
61‧‧‧浸鍍機構 61‧‧‧Dip plating mechanism
62‧‧‧熔融浸鍍銲錫槽 62‧‧‧Solid immersion solder bath
63‧‧‧熔融浸鍍銲錫液 63‧‧‧Solid immersion solder bath
64‧‧‧槽中方向轉換滾輪 64‧‧‧Slot change direction wheel
65‧‧‧槽上方向轉換滾輪 65‧‧‧Slot-up direction change wheel
71‧‧‧捲取機構 71‧‧‧Winning agency
72‧‧‧捲取張力調節機 72‧‧‧Winding tension adjuster
73‧‧‧固定滾輪 73‧‧‧Fixed roller
73A‧‧‧捲取機構上游側配置滾輪73A‧‧‧ Rolling mechanism upstream side of the winding mechanism
74...張力擺動輪74. . . Tension swing wheel
75...橫動線架方式捲取機75. . . Traverse wire rack type coiler
76...線架76. . . Wire rack
77、82...馬達77, 82. . . motor
78...傳達機構78. . . Communication agency
79...捲取力檢測感應器79. . . Winding force detection sensor
81...控制部81. . . Control department
91...第一輸送絞盤91. . . First conveying winch
92...第二輸送絞盤92. . . Second conveying winch
d1...還原氣體G之上升方向D1. . . The rising direction of the reducing gas G
D...還原氣體G之上升方向的相反方向D. . . The opposite direction of the rising direction of the reducing gas G
g...重力g. . . gravity
g1、g2...重力的分力G1, g2. . . Gravity component
G...還原氣體G. . . Reduction gas
圖1為鍍銲錫線的製造裝置的概略圖;1 is a schematic view of a manufacturing apparatus for a soldered wire;
圖2為軟化退火爐的說明圖;Figure 2 is an explanatory view of a softening annealing furnace;
圖3為橫動線架方式捲取機的說明圖;Figure 3 is an explanatory view of a traverse bobbin winding machine;
圖4為表示加熱處理溫度為100℃時軟化退火爐的軟化退火溫度與0.2%耐力值的關係的曲線圖;Figure 4 is a graph showing the relationship between the softening annealing temperature of the softening annealing furnace and the 0.2% proof stress at a heat treatment temperature of 100 °C;
圖5為表示加熱處理溫度與0.2%耐力值的關係的曲線圖;Figure 5 is a graph showing the relationship between the heat treatment temperature and the 0.2% proof stress value;
圖6為表示於軟化退火工序中,待鍍線的0.2%耐力值在採用對應有無包含氫氣的還原氣體的情況的曲線圖;6 is a graph showing a case where a 0.2% proof stress value of a to-be-plated line is in a softening annealing process in a case where a reducing gas containing hydrogen gas is used;
圖7為表示還原氣體的氫氣混合比與0.2%耐力值的關係的曲線圖;Figure 7 is a graph showing the relationship between the hydrogen mixture ratio of the reducing gas and the 0.2% proof stress value;
圖8為表示其他實施態樣中鍍銲錫線的製造裝置的一部分的概略圖;8 is a schematic view showing a part of a device for manufacturing a solder wire in another embodiment;
圖9為表示其他實施態樣中鍍銲錫線的製造裝置的一部分的概略圖;Fig. 9 is a schematic view showing a part of a device for manufacturing a solder wire in another embodiment;
圖10為洗浄裝置的概略圖;Figure 10 is a schematic view of a washing device;
圖11為浸鍍線的0.2%耐力值與其對應輸送絞盤及槽中方向轉換滾輪之設置態樣的關係的曲線圖;Figure 11 is a graph showing the relationship between the 0.2% proof force value of the dip coating line and the corresponding arrangement of the conveying winch and the direction changing roller in the groove;
圖12為表示其他實施態樣中鍍銲錫線的製造裝置的一部分的概略圖;Figure 12 is a schematic view showing a part of a device for manufacturing a solder wire in another embodiment;
圖13為鍍銲錫線的製造裝置的作用說明圖;Figure 13 is an explanatory view of the operation of the apparatus for manufacturing a soldered wire;
圖14為在浸鍍槽上滾輪配置高度的驗證實驗所使用的製造裝置的概略圖;Figure 14 is a schematic view showing a manufacturing apparatus used in a verification experiment of the height of the roller arrangement on the immersion plating tank;
圖15為表示鍍銲錫線的製造裝置的實驗結果的曲線圖;Figure 15 is a graph showing experimental results of a device for manufacturing a soldered wire;
圖16為表示習知鍍銲錫線的製造裝置的一部分的概略圖;以及Figure 16 is a schematic view showing a part of a conventional apparatus for manufacturing a solder wire; and
圖17為表示其他實施態樣的鍍銲錫線的製造裝置的一部分的概略圖。Fig. 17 is a schematic view showing a part of a device for manufacturing a plated solder wire according to another embodiment.
1a‧‧‧待鍍線 1a‧‧‧To be plated
1b‧‧‧浸鍍線 1b‧‧‧ dip plating line
2‧‧‧浸鍍前處理機構 2‧‧‧Dip plating treatment mechanism
10‧‧‧鍍銲錫線的製造裝置 10‧‧‧Manufacturing device for plating solder wire
12‧‧‧供給裝置 12‧‧‧Supply device
22‧‧‧加熱處理爐 22‧‧‧heating furnace
23‧‧‧冷卻水槽 23‧‧‧Cooling trough
24‧‧‧連結管 24‧‧‧Connected tube
30‧‧‧洗浄機構 30‧‧‧ Washing agency
31‧‧‧酸洗浄槽 31‧‧‧ Acid wash tank
32‧‧‧磷酸系洗浄液 32‧‧‧phosphoric acid cleaning solution
41‧‧‧超音波水洗淨槽 41‧‧‧Supersonic water washing tank
42‧‧‧超音波水洗浄機 42‧‧‧Supersonic water washing machine
42a‧‧‧超音波振動板 42a‧‧‧Supersonic vibrating plate
43‧‧‧水 43‧‧‧ water
45‧‧‧空氣雨刷 45‧‧‧Air wiper
51‧‧‧軟化退火爐 51‧‧‧softening annealing furnace
52‧‧‧軟化退火爐本體 52‧‧‧Softening annealing furnace body
53‧‧‧鞘管 53‧‧‧sheath
55‧‧‧鞘管上側突出部分 55‧‧‧The upper part of the sheath
56‧‧‧鞘管下側突出部分56‧‧‧The lower part of the sheath
57...還原氣體供給部57. . . Reduction gas supply
61...浸鍍機構61. . . Dip plating mechanism
62...熔融浸鍍銲錫槽62. . . Molten dip solder bath
63...熔融浸鍍銲錫液63. . . Molten dip solder bath
64...槽中方向轉換滾輪64. . . Slot change direction wheel
65...槽上方向轉換滾輪65. . . In-slot direction change wheel
71...捲取機構71. . . Coiling mechanism
72...捲取張力調節機72. . . Take-up tension adjuster
73...固定滾輪73. . . Fixed roller
73A...捲取機構上游側配置滾輪73A. . . Roller on the upstream side of the take-up mechanism
74...張力擺動輪74. . . Tension swing wheel
75...橫動線架方式捲取機75. . . Traverse wire rack type coiler
76...線架76. . . Wire rack
91...第一輸送絞盤91. . . First conveying winch
92...第二輸送絞盤92. . . Second conveying winch
Claims (33)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010133533 | 2010-06-11 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201211309A TW201211309A (en) | 2012-03-16 |
TWI558847B true TWI558847B (en) | 2016-11-21 |
Family
ID=45098082
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW100120460A TWI558847B (en) | 2010-06-11 | 2011-06-10 | Method and device of manufacturing solder plating wire |
Country Status (5)
Country | Link |
---|---|
JP (5) | JP5255668B2 (en) |
KR (2) | KR101630309B1 (en) |
CN (1) | CN102939402B (en) |
TW (1) | TWI558847B (en) |
WO (1) | WO2011155477A1 (en) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5255668B2 (en) * | 2010-06-11 | 2013-08-07 | 古河電気工業株式会社 | Solder plated wire manufacturing method and manufacturing apparatus |
JP5889644B2 (en) * | 2012-01-23 | 2016-03-22 | 三菱電線工業株式会社 | Method for producing solar cell lead wire |
PT3281739T (en) * | 2015-03-30 | 2022-11-28 | Senju Metal Industry Co | Flux coating device and solder |
JP2017166068A (en) * | 2016-03-11 | 2017-09-21 | 日新製鋼株式会社 | Method for manufacturing molten aluminum plated steel wire and device for introducing steel wire for molten aluminum plating |
JP6750263B2 (en) * | 2016-03-18 | 2020-09-02 | 富士電機株式会社 | Power semiconductor module |
JP2018162494A (en) * | 2017-03-26 | 2018-10-18 | 日新製鋼株式会社 | Method and apparatus for manufacturing plated steel wire |
JP6476227B2 (en) * | 2017-03-31 | 2019-02-27 | Jx金属株式会社 | Copper or copper alloy strip, traverse coil and manufacturing method thereof |
CN107904367A (en) * | 2017-11-29 | 2018-04-13 | 苏州金钜松机电有限公司 | A kind of filament annealing component |
WO2022085207A1 (en) * | 2020-10-24 | 2022-04-28 | アートビーム有限会社 | Solder coating device and solder coating method |
CN113930592A (en) * | 2021-09-22 | 2022-01-14 | 江西腾江铜业有限公司 | Annealing device is used in tinned wire processing |
CN114807585A (en) * | 2022-06-28 | 2022-07-29 | 常州九天新能源科技有限公司 | Ultra-thin welding strip annealing equipment for laminated tile assembly |
JP7409580B1 (en) | 2022-07-25 | 2024-01-09 | Jfeスチール株式会社 | Furnace temperature control device, furnace temperature control method, and coke manufacturing method |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000080460A (en) * | 1998-06-29 | 2000-03-21 | Totoku Electric Co Ltd | Soldered wire |
JP2000282206A (en) * | 1999-03-30 | 2000-10-10 | Hitachi Cable Ltd | Production of metal-plated wire rod and apparatus therefor |
JP2006054355A (en) * | 2004-08-13 | 2006-02-23 | Hitachi Cable Ltd | Rectangular conductor for solar cell, its manufacturing method and lead wire for solar cell |
JP2008169461A (en) * | 2006-12-14 | 2008-07-24 | Hitachi Cable Ltd | Solder plated wire for solar battery and method for producing the same |
JP2008168339A (en) * | 2006-12-14 | 2008-07-24 | Hitachi Cable Ltd | Plated wire for solar cell, and its manufacturing method |
Family Cites Families (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5138891Y2 (en) * | 1972-10-03 | 1976-09-24 | ||
JPS5114138A (en) * | 1974-07-25 | 1976-02-04 | Chugai Ro Kogyo Kaisha Ltd | RENZOKUAENMETSUKISETSUBINIOKERU AENJOKINO JOKYOHOHOOYOBISONO SOCHI |
CA1044935A (en) * | 1974-08-03 | 1978-12-26 | Wilfried Pfeiffer | Pivotably operated bent x-ray film holder |
JPS5187436A (en) * | 1975-01-30 | 1976-07-31 | Nippon Steel Corp | NETSUSEKI KINZOKUMETSUKIHO |
JPS6164862A (en) * | 1984-09-04 | 1986-04-03 | Hitachi Cable Ltd | Continuous wire drawing, annealing and plating method and device therefor |
JPH0615709B2 (en) * | 1984-11-15 | 1994-03-02 | 日立電線株式会社 | Thickening method for metal materials |
JPS6267124A (en) * | 1985-09-18 | 1987-03-26 | Hitachi Cable Ltd | Annealing apparatus for wire rod |
JPH02129355A (en) * | 1988-11-08 | 1990-05-17 | Furukawa Electric Co Ltd:The | Hot dipping method for wire |
JPH02185958A (en) * | 1989-01-13 | 1990-07-20 | Furukawa Electric Co Ltd:The | Production of wire plated with metal by hot dipping |
JPH07106412B2 (en) * | 1990-03-20 | 1995-11-15 | 株式会社フジクラ | High conductivity copper coated steel trolley wire manufacturing method |
JPH0397841A (en) * | 1989-09-11 | 1991-04-23 | Mitsubishi Electric Corp | Soldered product for copper alloy |
JPH055169A (en) * | 1990-09-20 | 1993-01-14 | Totoku Electric Co Ltd | Production of hot-dip coated wire |
US5472739A (en) * | 1990-09-20 | 1995-12-05 | Totoku Electric Co., Ltd. | Process of producing a hot dipped wire from a base wire, with the absence of iron-based, iron oxide-based and iron hydroxide-based minute particles on surfaces of the base wire |
JPH04293757A (en) * | 1991-03-23 | 1992-10-19 | Totoku Electric Co Ltd | Production of flat square coated wire |
JPH0533109A (en) * | 1991-07-30 | 1993-02-09 | Furukawa Electric Co Ltd:The | Production of hot-dipped material |
JPH05115902A (en) * | 1991-10-28 | 1993-05-14 | Kawasaki Steel Corp | Method for cold rolling shutter material for disk cassette |
JPH05315502A (en) * | 1992-05-07 | 1993-11-26 | Hitachi Cable Ltd | Method and device for plating slender rod of irregular shape |
JP2973350B2 (en) * | 1994-06-14 | 1999-11-08 | 東京特殊電線株式会社 | Manufacturing method of hot-dip wire |
JP3005742B2 (en) * | 1995-01-27 | 2000-02-07 | 東京特殊電線株式会社 | Method for manufacturing tin-covered rectangular copper wire |
JPH11179422A (en) * | 1997-12-22 | 1999-07-06 | Nkk Corp | Method for controlling shape of thin steel strip |
JPH11302811A (en) * | 1998-04-17 | 1999-11-02 | Nippon Steel Corp | In-furnace atmosphere gas controller for continuous galvanizing equipment |
JP2953660B1 (en) * | 1998-10-16 | 1999-09-27 | 川崎重工業株式会社 | Drive structure of sink roll for hot-dip plating |
JP2004313881A (en) * | 2003-04-14 | 2004-11-11 | Toyobo Co Ltd | Winding method for hollow fiber membrane and hollow fiber membrane |
KR20070033335A (en) * | 2004-05-21 | 2007-03-26 | 가부시키가이샤 네오맥스 마테리아르 | Electrode Wire for Solar Cell |
JP2006144104A (en) * | 2004-11-24 | 2006-06-08 | Nippon Steel Corp | Apparatus and method for continuously annealing steel sheet for hot dip galvanizing |
JP5073386B2 (en) * | 2007-07-05 | 2012-11-14 | 株式会社Neomaxマテリアル | ELECTRODE WIRE FOR SOLAR CELL, ITS SUBSTRATE, AND METHOD FOR PRODUCING SUBSTRATE |
KR100924317B1 (en) * | 2009-03-09 | 2009-11-02 | 주식회사 월드비씨 | Wire making apparatus for pv module and making method |
JP5255668B2 (en) * | 2010-06-11 | 2013-08-07 | 古河電気工業株式会社 | Solder plated wire manufacturing method and manufacturing apparatus |
-
2011
- 2011-03-31 JP JP2011078951A patent/JP5255668B2/en active Active
- 2011-03-31 JP JP2011078949A patent/JP5367752B2/en active Active
- 2011-03-31 JP JP2011078950A patent/JP5367753B2/en active Active
- 2011-03-31 JP JP2011078952A patent/JP5367754B2/en active Active
- 2011-06-07 CN CN201180028866.8A patent/CN102939402B/en active Active
- 2011-06-07 JP JP2011127089A patent/JP5255673B2/en active Active
- 2011-06-07 WO PCT/JP2011/063008 patent/WO2011155477A1/en active Application Filing
- 2011-06-07 KR KR1020157011359A patent/KR101630309B1/en active IP Right Grant
- 2011-06-07 KR KR1020127031634A patent/KR101541790B1/en active IP Right Grant
- 2011-06-10 TW TW100120460A patent/TWI558847B/en active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000080460A (en) * | 1998-06-29 | 2000-03-21 | Totoku Electric Co Ltd | Soldered wire |
JP2000282206A (en) * | 1999-03-30 | 2000-10-10 | Hitachi Cable Ltd | Production of metal-plated wire rod and apparatus therefor |
JP2006054355A (en) * | 2004-08-13 | 2006-02-23 | Hitachi Cable Ltd | Rectangular conductor for solar cell, its manufacturing method and lead wire for solar cell |
JP2008169461A (en) * | 2006-12-14 | 2008-07-24 | Hitachi Cable Ltd | Solder plated wire for solar battery and method for producing the same |
JP2008168339A (en) * | 2006-12-14 | 2008-07-24 | Hitachi Cable Ltd | Plated wire for solar cell, and its manufacturing method |
Also Published As
Publication number | Publication date |
---|---|
JP2012017516A (en) | 2012-01-26 |
JP5255668B2 (en) | 2013-08-07 |
JP5255673B2 (en) | 2013-08-07 |
KR20150055098A (en) | 2015-05-20 |
JP2012017518A (en) | 2012-01-26 |
WO2011155477A1 (en) | 2011-12-15 |
KR101630309B1 (en) | 2016-06-14 |
CN102939402B (en) | 2014-12-10 |
KR101541790B1 (en) | 2015-08-05 |
JP5367753B2 (en) | 2013-12-11 |
CN102939402A (en) | 2013-02-20 |
JP2012017523A (en) | 2012-01-26 |
JP5367752B2 (en) | 2013-12-11 |
JP5367754B2 (en) | 2013-12-11 |
JP2012017515A (en) | 2012-01-26 |
TW201211309A (en) | 2012-03-16 |
JP2012017517A (en) | 2012-01-26 |
KR20130040899A (en) | 2013-04-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI558847B (en) | Method and device of manufacturing solder plating wire | |
CN103030026B (en) | Wire winding bobbin, wire winding method and wire winding apparatus | |
JP5667278B2 (en) | Insulated wire manufacturing method and apparatus | |
CN107587095A (en) | A kind of environmentally friendly copper and copper alloy plate strip surface hot-dip tinning method | |
JP6048783B2 (en) | Manufacturing method and equipment for solar cell lead wire | |
JP7088142B2 (en) | Metal-plated steel pipe manufacturing method and molten metal plating equipment for steel pipes | |
US1853437A (en) | Process for producing an insulating coating on articles containing aluminum | |
JP2013172032A (en) | Production method of bonding wire | |
JP2011231342A (en) | Heat treatment method of conductor for cable | |
JP5831104B2 (en) | Apparatus and method for removing surface deposits on roll in molten metal plating bath | |
TWI640652B (en) | Process for producing a wire made of a first metal and having a sheath layer made of a second metal | |
JPH02185958A (en) | Production of wire plated with metal by hot dipping | |
JP7088141B2 (en) | Metal-plated steel pipe manufacturing method and molten metal plating equipment for steel pipes | |
KR20130048623A (en) | Snout apparatus for zinc coatingline | |
CN213747797U (en) | Drying and preheating equipment for hot-dip galvanizing production | |
US20110183072A1 (en) | Hot-dip galvanization systems and methods | |
JPS6223977A (en) | Manufacture of brass plates steel wire | |
JP2013147721A (en) | Method for producing lead wire for solar cell and lead wire for solar cell | |
CN113201708A (en) | Heat treatment furnace, heating device, wire electrode manufacturing method, and thermal diffusion treatment method | |
CN103898431A (en) | On-line hot-dipping method of metal wires and adopted swinging device | |
JP5340674B2 (en) | Substrate processing equipment | |
JP2013201182A (en) | Method for manufacturing palladium coated copper bonding wire | |
JPH06336663A (en) | Continuous hot dip metal coating method of band steel | |
JP2016160497A (en) | Heat treatment method for amorphous soft magnetic alloy and heat treatment device for amorphous soft magnetic alloy | |
EP0524160A2 (en) | Method of manufacturing a hard steel wire |