JPH0397841A - Soldered product for copper alloy - Google Patents
Soldered product for copper alloyInfo
- Publication number
- JPH0397841A JPH0397841A JP1235402A JP23540289A JPH0397841A JP H0397841 A JPH0397841 A JP H0397841A JP 1235402 A JP1235402 A JP 1235402A JP 23540289 A JP23540289 A JP 23540289A JP H0397841 A JPH0397841 A JP H0397841A
- Authority
- JP
- Japan
- Prior art keywords
- solder
- elements
- copper alloy
- zinc
- total amount
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229910000881 Cu alloy Inorganic materials 0.000 title claims abstract description 23
- 229910000679 solder Inorganic materials 0.000 claims abstract description 31
- 229910052725 zinc Inorganic materials 0.000 claims abstract description 17
- 229910052718 tin Inorganic materials 0.000 claims abstract description 15
- 229910052742 iron Inorganic materials 0.000 claims abstract description 3
- 238000007747 plating Methods 0.000 claims description 27
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 14
- 239000011701 zinc Substances 0.000 claims description 14
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 11
- 239000000203 mixture Substances 0.000 claims description 9
- 229910052759 nickel Inorganic materials 0.000 claims description 2
- 230000006866 deterioration Effects 0.000 abstract 2
- 229910052745 lead Inorganic materials 0.000 abstract 2
- 230000001105 regulatory effect Effects 0.000 abstract 1
- 238000009792 diffusion process Methods 0.000 description 12
- 239000010949 copper Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- 239000011800 void material Substances 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 229910000906 Bronze Inorganic materials 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 239000010974 bronze Substances 0.000 description 1
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000003303 reheating Methods 0.000 description 1
Landscapes
- Coating With Molten Metal (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は飼合金、特に電子部品用銅合金のはんだめっ
き品に関するものであり、特に経時変化や熱に対して、
めっき接合の信頼性を高めた銅合金川はんだめっき品に
関するものである.〔従来の技術〕
従来、電子部品材料として使用されている銅合金は,素
条段階で錫やはんだめっきを施したものが多く使われて
おり,そのめっき組威としては、純錫,90%l−10
%鉛,60%M−40%鉛等が代表的なものである.
最近の電子部品材料の高度な戒長に伴い,部品の信頼性
向上は大きな課題であり,例えばコネクタや集積回路(
rc)の基板実装や,接触子等において,使用環境ある
いは電子部品自体の発熱に伴い,めっき部が劣化し゜〔
信頼性の低下を招くことがあり、使用条件によっては,
めっき部が剥離してしまうケースも出ている。[Detailed Description of the Invention] [Industrial Application Field] This invention relates to solder-plated copper alloys, especially copper alloys for electronic parts, and is particularly resistant to changes over time and heat.
This article relates to copper alloy solder-plated products that improve the reliability of plating connections. [Conventional technology] Conventionally, copper alloys used as electronic component materials are often plated with tin or solder at the raw stage, and the plating strength is 90% pure tin. l-10
Typical examples include % lead, 60% M-40% lead, etc. With the recent advances in electronic component materials, improving the reliability of components has become a major issue, such as connectors and integrated circuits (
rc), the plating parts deteriorate due to the use environment or the heat generation of the electronic components themselves.
Depending on the conditions of use, this may lead to a decrease in reliability.
There have also been cases where the plating has peeled off.
第1図は従来のはんだめっきを行った直後の銅合金の模
型断面図、第2図はその加熱後の模型断面図であり、図
において,(I)は銅合金、(2)は銅合金(1)上に
めっきされたはんだめっき層、(3)ははんだめっき層
(2)を構或する錫,(4)は釦、(5)は拡散層(η
相) . (6)は拡散M(ε相) . (7)はカー
ケンダルボイドである.
銅合金にはんだめっきを施した直後は、第1図に示すよ
うなはんだめっき層(2)が得られるが、その後加熱や
経時変化によって、第2図に示すような拡散状態が生じ
、剥iilII!現象の原因となっているカーケンダル
ボイド(7)が発生する。Figure 1 is a cross-sectional view of a copper alloy model immediately after conventional solder plating, and Figure 2 is a cross-sectional view of the model after heating. In the figure, (I) is a copper alloy, and (2) is a copper alloy. (1) the solder plating layer plated on top, (3) the tin constituting the solder plating layer (2), (4) the button, and (5) the diffusion layer (η
Phase) . (6) is diffusion M (ε phase). (7) is a Kirkendall void. Immediately after applying solder plating to the copper alloy, a solder plating layer (2) as shown in Fig. 1 is obtained, but after that, due to heating and changes over time, a diffusion state as shown in Fig. 2 occurs, resulting in peeling. ! Kirkendall void (7), which is the cause of the phenomenon, occurs.
この方ーケンダルボイド(7)は、銅合金(1)とはん
だめっき層(2)の相互拡散が進むときに原子の移動に
伴う拡散速度の差により,ボイドとなって空洞ができる
現象である。拡散層は一般的には第2図に示すようにク
相(5)(Cu,Sn,)、ε相(6)(Cu,Sn)
が主であるが,めっきされる銅合金(1)の組成或分に
よって状況が異なる場合があり,従ってめっき後の信頼
性についても差が出てくる。The Kendall void (7) is a phenomenon in which voids are formed due to the difference in diffusion speed due to the movement of atoms when the copper alloy (1) and the solder plating layer (2) progress through mutual diffusion. The diffusion layer generally has a Cu phase (5) (Cu, Sn,) and an ε phase (6) (Cu, Sn) as shown in Figure 2.
However, the situation may differ depending on the composition of the copper alloy (1) to be plated, and therefore the reliability after plating will also differ.
従来の銅合金用はんだめっき品においては、上記のよう
に拡散を生じるため、拡散時におけるカーケンダルボイ
ドの発生を防止することが部品の信頼性向上のために重
要な課題である。In conventional solder-plated products for copper alloys, diffusion occurs as described above, so preventing Kirkendall voids from occurring during diffusion is an important issue for improving component reliability.
この発明は、上記のような問題点を解決するためになさ
れたもので、従来のはんだめっき組成に亜鉛を添加して
カーケンダルボイドの発生を抑え,これにより熱による
はんだめっきの密着性低下や剥離現象を改善することが
できる銅合金用はんだめっき品を得ることを目的とする
ものである。This invention was made to solve the above-mentioned problems by adding zinc to the conventional solder plating composition to suppress the occurrence of Kirkendall voids, thereby reducing the adhesion of solder plating caused by heat. The object of the present invention is to obtain a solder-plated copper alloy product that can improve the peeling phenomenon.
この発明は次の銅合金用はんだめっき品である。 This invention relates to the following solder plated product for copper alloys.
(1)めっき組成として重量基準で、亜鉛0.03〜5
%を含み、残部が錫、鉛および不可避の元素から成り、
亜鉛と錫と鉛の合計量が98%以上、他の元素の合計量
が2%以下である網合金用はんだめっき品.
・・・・・・はんだめっき品(1)(2)めっき組成
として重量基準で、亜鉛0.03〜5%を含み、残部が
錫、鉛および他の元素から成り、亜鉛と錫と鉛の合計量
が98%以上、他の元素の合計量が2%以下,かつFe
. Ni. Go、SiおよびPの合計量が0.4%以
下である銅合金用はんだめっき品. ・・
・・・・はんだめっき品(II)本発明において、めっ
き組成としての錫と鉛の組戒比は任意の割合とすること
ができる。また他の元素としてはFe. Ni. Go
、SL. P ,その他任意の元素があげられる。(1) Zinc 0.03 to 5 on a weight basis as a plating composition
%, with the remainder consisting of tin, lead and unavoidable elements,
Solder plated products for wire mesh alloys in which the total amount of zinc, tin, and lead is 98% or more, and the total amount of other elements is 2% or less.
...Solder plated products (1) (2) The plating composition contains 0.03 to 5% zinc on a weight basis, and the balance consists of tin, lead, and other elements. The total amount is 98% or more, the total amount of other elements is 2% or less, and Fe
.. Ni. A solder plated product for copper alloy in which the total amount of Go, Si and P is 0.4% or less.・・・
...Solder plated product (II) In the present invention, the ratio of tin and lead as a plating composition can be set to any desired ratio. Other elements include Fe. Ni. Go
, S.L. Examples include P and other arbitrary elements.
この発明のはんだめっき品(1)、(II)における亜
鉛添加の目的は、拡散時において亜鉛元素の移動がカー
ケンダルボイドの発生を抑えることにあり、その効果は
最小量0.03%で認められ、添加量が多くなるにつれ
て顕著となる。一方、亜鉛の添加量増加は部品実装時の
はんだ付け性を低下させる傾向にあり,このため上限を
5%に定めた.また他の元素の合計量が2%以下とした
のは同様にはんだ付け性が低下するためである.はんだ
めっき品(■)におけるFe.Ni. Co. Si,
Pの合計量の上限値の制限は、これらの元素は添加によ
り逆にカーケンダルボイドの発生が増加する傾向にある
ため、その悪影響の認められない量として決められてお
り、各元素の最大値はそれぞれ0.2%とするのが好ま
しい。The purpose of adding zinc in the solder plated products (1) and (II) of this invention is to suppress the generation of Kirkendall voids due to the movement of zinc element during diffusion, and this effect is observed at a minimum amount of 0.03%. This becomes more noticeable as the amount added increases. On the other hand, increasing the amount of zinc added tends to reduce solderability during component mounting, so the upper limit was set at 5%. The reason why the total amount of other elements was set to 2% or less is because solderability similarly decreases. Fe in solder plated products (■). Ni. Co. Si,
The upper limit of the total amount of P is determined as an amount that does not have any adverse effects, since the addition of these elements tends to increase the occurrence of Kirkendall voids, and the maximum value of each element is is preferably 0.2% each.
以下,この発明の一実施例について説明する。 An embodiment of the present invention will be described below.
市販のばね用りん青@(JIS C5210)に、表1
の組成のはんだを直接電気めっきにより2μmのめっき
厚となるようにめっきした。その後150℃で加熱試験
を行い,曲げ試験により剥離の発生するまでの時間を測
定した結果,ならびに電気はんだめっき後,240℃で
溶融はんだめっきを行い、はんだめっき層が濡れるまで
の時間を測定した。はんだめっき層が濡れるまでの時間
は、溶融した6o%Sn−40%pbの中に、はんだを
電気めっきしたりん青銅を浸漬したときに生ずる表面張
カによる浮カと張力がつり合うまでの時間とした。結果
を表工に示す。Commercially available phosphor blue for springs (JIS C5210), Table 1
Solder having the composition was plated by direct electroplating to a plating thickness of 2 μm. After that, a heating test was conducted at 150℃, and the time until peeling occurred was measured by a bending test. After electrolytic solder plating, molten solder plating was performed at 240℃, and the time until the solder plating layer became wet was measured. . The time it takes for the solder plating layer to get wet is the time it takes for the tension to balance out the floating force caused by the surface tension that occurs when phosphor bronze electroplated with solder is immersed in molten 6o%Sn-40%PB. did. Show the results to the table worker.
表1の結果より、亜鉛を添加した本発明のはんだめっき
品は耐熱剥離に対し大きな改善効果が認められる.
亜鉛の添加量は試料Nα1〜5の結果より、多くなるほ
ど耐熱剥離は向上するが、逆にはんだ付け性が低下して
いることがわかり,添加量を0.03〜5%とした根拠
となっている.
また試料Nα8〜1lの結果より. Fe, Ni,
Go. Si.P等は、亜鉛添加による耐熱剥離の向上
を打ち消す結果が得られており、この結果より上限値が
それぞれ0.2%とされている.
なお、上記実施例では,はんだと銅の拡散現象より、銅
合金を対象としたはんだめっき品となっているが,銅合
金以外に適用しても特に支障はないと考えられる。From the results in Table 1, the solder-plated products of the present invention with zinc added have a significant improvement effect on heat-resistant peeling. From the results of samples Nα1 to Nα5, it was found that the higher the amount of zinc added, the better the heat peeling resistance was, but on the contrary, the solderability decreased, which served as the basis for setting the amount of addition to 0.03 to 5%. ing. Also, from the results of samples Nα8 to 1l. Fe, Ni,
Go. Si. It has been found that P and the like cancel out the improvement in heat peeling resistance due to the addition of zinc, and based on these results, the upper limit of each is set at 0.2%. In the above embodiment, due to the diffusion phenomenon of solder and copper, the solder-plated product is intended for copper alloys, but it is thought that there will be no particular problem if it is applied to materials other than copper alloys.
また、はんだ付け性の向上や密着性の向上を目的とし、
電気めっき後に再加熱リフロー処理して活用することも
当然可能である.
〔発明の効果〕
この発明によれば、はんだめっき組成に亜鈴を添加した
ので、カーケンダルボイドの発生を抑えることができ、
これにより熱によるはんだめっきの密着性低下や剥m現
象を防止することができる.In addition, with the aim of improving solderability and adhesion,
Of course, it is also possible to use it by reheating and reflowing it after electroplating. [Effects of the Invention] According to the present invention, since dumbbell is added to the solder plating composition, the occurrence of Kirkendall voids can be suppressed,
This can prevent the solder plating from deteriorating in adhesion and peeling due to heat.
第1図は従来のはんだめっきを行った直後の銅合金の模
型断面図,第2図はその加熱後の模型断面図である。
各図中、同一符号は同一または相当部分を示し,(1)
は銅合金,(2)ははんだめっき層、(5)は拡散層(
η相) . (6)は拡散層(ε相) . (7)はカ
ーケンダルボイドである。FIG. 1 is a sectional view of a copper alloy model immediately after conventional solder plating, and FIG. 2 is a sectional view of the model after heating. In each figure, the same reference numerals indicate the same or corresponding parts, (1)
is a copper alloy, (2) is a solder plating layer, and (5) is a diffusion layer (
η phase). (6) is a diffusion layer (ε phase). (7) is Kirkendall void.
Claims (2)
5%を含み、残部が錫、鉛および不可避の元素から成り
、亜鉛と錫と鉛の合計量が98%以上、他の元素の合計
量が2%以下であることを特徴とする銅合金用はんだめ
っき品。(1) Plating composition: Zinc 0.03 to 0.03 on a weight basis
For copper alloys containing 5% and the remainder consisting of tin, lead and unavoidable elements, the total amount of zinc, tin and lead being 98% or more and the total amount of other elements being 2% or less Solder plated product.
5%を含み、残部が錫、鉛および他の元素から成り、亜
鉛と錫と鉛の合計量が98%以上、他の元素の合計量が
2%以下、かつFe、Ni、Co、SiおよびPの合計
量が0.4%以下であることを特徴とする銅合金用はん
だめっき品。(2) Zinc 0.03~ on a weight basis as a plating composition
5%, the balance consists of tin, lead and other elements, the total amount of zinc, tin and lead is 98% or more, the total amount of other elements is 2% or less, and Fe, Ni, Co, Si and A solder plated product for copper alloy, characterized in that the total amount of P is 0.4% or less.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1235402A JPH0397841A (en) | 1989-09-11 | 1989-09-11 | Soldered product for copper alloy |
KR1019900014305A KR930005262B1 (en) | 1989-09-11 | 1990-09-11 | Soldered product and tinned product for copper alloy |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1235402A JPH0397841A (en) | 1989-09-11 | 1989-09-11 | Soldered product for copper alloy |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0397841A true JPH0397841A (en) | 1991-04-23 |
Family
ID=16985562
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1235402A Pending JPH0397841A (en) | 1989-09-11 | 1989-09-11 | Soldered product for copper alloy |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0397841A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011155477A1 (en) * | 2010-06-11 | 2011-12-15 | 古河電気工業株式会社 | Process and apparatus for producing solder-plated wire |
-
1989
- 1989-09-11 JP JP1235402A patent/JPH0397841A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011155477A1 (en) * | 2010-06-11 | 2011-12-15 | 古河電気工業株式会社 | Process and apparatus for producing solder-plated wire |
JP2012017523A (en) * | 2010-06-11 | 2012-01-26 | Furukawa Electric Co Ltd:The | Method and apparatus for manufacturing solder plated wire |
CN102939402A (en) * | 2010-06-11 | 2013-02-20 | 古河电气工业株式会社 | Process and apparatus for producing solder-plated wire |
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