TWI558501B - 用於拋光半導體基板之軟性拋光墊及其製備方法 - Google Patents
用於拋光半導體基板之軟性拋光墊及其製備方法 Download PDFInfo
- Publication number
- TWI558501B TWI558501B TW100101304A TW100101304A TWI558501B TW I558501 B TWI558501 B TW I558501B TW 100101304 A TW100101304 A TW 100101304A TW 100101304 A TW100101304 A TW 100101304A TW I558501 B TWI558501 B TW I558501B
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- Prior art keywords
- curing agent
- prepolymer
- polishing pad
- soft
- mixture
- Prior art date
Links
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- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 claims description 34
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
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- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
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- B32B3/30—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by a particular shape of the outline of the cross-section of a continuous layer; characterised by a layer with cavities or internal voids ; characterised by an apertured layer characterised by a layer formed with recesses or projections, e.g. hollows, grooves, protuberances, ribs
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- B32B7/04—Interconnection of layers
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- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
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- C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
- C08G18/28—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the compounds used containing active hydrogen
- C08G18/30—Low-molecular-weight compounds
- C08G18/32—Polyhydroxy compounds; Polyamines; Hydroxyamines
- C08G18/3203—Polyhydroxy compounds
- C08G18/3206—Polyhydroxy compounds aliphatic
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- C—CHEMISTRY; METALLURGY
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- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G18/00—Polymeric products of isocyanates or isothiocyanates
- C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
- C08G18/70—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the isocyanates or isothiocyanates used
- C08G18/72—Polyisocyanates or polyisothiocyanates
- C08G18/74—Polyisocyanates or polyisothiocyanates cyclic
- C08G18/76—Polyisocyanates or polyisothiocyanates cyclic aromatic
- C08G18/7614—Polyisocyanates or polyisothiocyanates cyclic aromatic containing only one aromatic ring
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Description
本發明之實施例係關於化學機械拋光(CMP)領域,且特定言之,係關於用於拋光半導體基板之軟性拋光墊。
化學機械平坦化或化學機械拋光(通常縮寫為CMP)係一種用於平坦化半導體晶圓或其他基板之半導體製造中之技術。
該程序使用一磨料及腐蝕化學漿體(通常一膠體)結合一拋光墊及扣環(通常直徑大於該晶圓)。該等墊及晶圓係藉由一動態拋光頭而壓在一起,且藉由一塑膠扣環而保持在合適位置。該動態拋光頭係利用不同旋轉軸(即,不同心)而旋轉。此移除材料且傾向於均化任何不規則形貌,使得該晶圓平面化或平坦化。此可係必須的以便設定該晶圓以形成額外電路元件。舉例而言,此可係必須的以便將整個表面帶入一微影蝕刻系統之景深內,或基於該晶圓之位置而選擇性移除材料。典型景深要求係低至最新45 nm技術節點之埃(Angstrom)位準。
該材料移除程序並非簡單如磨料刮削(如在木材上用砂紙)程序。該漿體中之化學物質亦與待移除之材料反應及/或弱化該材料。該磨料加速此弱化程序,且該拋光墊有助於從該表面消除反應之材料。該程序已經被比喻成小孩吃膠質糖果之程序。若在周圍無刮削下糖果位於舌頭上,則該糖果變為覆蓋有一凝膠塗層,但該糖果之大部分不受影響。只有利用一劇烈刮削使該糖果溶解掉。另一比喻係刷牙行為。牙刷係機械部分,及牙膏係化學部分。單獨使用牙刷或牙膏將使牙齒稍微乾淨,但是一起使用牙刷及牙膏獲得一優異程序。
因此,除了漿體技術之進步以外,該拋光墊在日益複雜之CMP操作中扮演重要作用。然而,在CMP墊技術之演進中需要額外改良。
在一實施例中,一軟性拋光墊包含一模塑均質拋光本體,其包含一熱固性、閉孔型聚胺基甲酸酯材料,該熱固性、閉孔型聚胺基甲酸酯材料具有大約在20蕭氏D至45蕭氏D之範圍內之一硬度。
在另一實施例中,一軟性拋光墊包含一局部區域透明(LAT)區,該局部區域透明區佈置於一模塑均質拋光本體中且與該模塑均質拋光本體共價鍵結,該模塑均質拋光本體包含一熱固性、閉孔型聚胺基甲酸酯材料,該熱固性、閉孔型聚胺基甲酸酯材料具有大約在20蕭氏D至45蕭氏D之範圍內之一硬度。
在另一實施例中,一種製造用於拋光半導體基板之一軟性拋光墊之方法包含在一形成模具中,混合一預聚合物、一主固化劑及不同於該主固化劑之一次固化劑以形成一混合物。該方法亦包含固化該混合物以提供一模塑均質拋光本體,該模塑均質拋光本體包含一熱固性、閉孔型聚胺基甲酸酯材料,該熱固性、閉孔型聚胺基甲酸酯材料具有大約在20蕭氏D至45蕭氏D之範圍內之一硬度。
在另一實施例中,一種製造用於拋光半導體基板之一軟性拋光墊之方法包含在在一形成模具中混合一預聚合物、一主固化劑及一次固化劑之前,在一第二分開形成模具中混合一芳香族胺基甲酸酯預聚合物與一固化劑以形成一第二混合物。該方法亦包含在該第二形成模具中,部分固化該第二混合物以形成一模塑凝膠。該方法亦包含:將該模塑凝膠定位於該形成模具之一指定區中。接著,混合該預聚合物及該主固化劑及該次固化劑以形成該混合物包含:將該混合物至少部分形成於該模塑凝膠周圍。固化該混合物以提供該模塑均質拋光本體進一步包含固化該模塑凝膠以提供一局部區域透明(LAT)區,該局部區域透明區佈置於該模塑均質拋光本體中且與該模塑均質拋光本體共價鍵結。
本文描述用於拋光半導體基板之軟性拋光墊。在以下描述中,闡述許多特定細節,諸如特定軟性拋光墊及局部區域透明(LAT)配方混合物,以便提供對本發明之實施例的徹底理解。熟習此項技術者應明白,本發明之實施例可在無此等特定細節的情況下而實踐。在其他情況下,不詳細描述諸如一漿體與一拋光墊之組合以執行半導體基板之CMP之眾所周知處理技術以便不必要混淆本發明之實施例。此外,應瞭解,圖式中所顯示之各種實施例係說明性陳述且無須按照比例繪製。
本文揭示用於拋光半導體基板之軟性拋光墊。在一實施例中,一軟性拋光墊包含一模塑均質拋光本體,其包含一熱固性、閉孔型聚胺基甲酸酯材料,該熱固性、閉孔型聚胺基甲酸酯材料具有大約在20蕭氏D至45蕭氏D之範圍內之一硬度。在一實施例中,一軟性拋光墊包含一局部區域透明(LAT)區,該局部區域透明區佈置於該模塑均質拋光本體中且與該模塑均質拋光本體共價鍵結。在一實施例中,一軟性拋光墊包含一模塑均質拋光本體,其包含一熱固性、閉孔型聚胺基甲酸酯材料,該熱固性、閉孔型聚胺基甲酸酯材料具有大約在60蕭氏A至95蕭氏A之範圍內之一硬度。
本文亦揭示製造用於拋光半導體基板之軟性拋光墊之方法。在一實施例中,一種方法包含:在一形成模具中,混合一預聚合物、一主固化劑及不同於該主固化劑之一次固化劑以形成一混合物。固化該混合物以提供一模塑均質拋光本體,其包含一熱固性、閉孔型聚胺基甲酸酯材料,該熱固性、閉孔型聚胺基甲酸酯材料具有大約在20蕭氏D至45蕭氏D之範圍內之一硬度。在一實施例中,一種方法包含在混合該預聚合物及該主固化劑及該次固化劑之前,在一第二分開形成模具中混合一芳香族胺基甲酸酯預聚合物與一固化劑以形成一第二混合物。在該第二形成模具中,部分固化該第二混合物以形成一模塑凝膠。將該模塑凝膠定位於該形成模具之一指定區中。在該實施例中,混合該預聚合物及該主固化劑及該次固化劑以形成該混合物包含將該混合物至少部分形成於該成形凝膠周圍,及固化該混合物以提供該模塑均質拋光本體進一步包含固化該成形凝膠以提供一局部區域透明區,該局部區域透明區佈置於該模塑均質拋光本體中且與該模塑均質拋光本體共價鍵結。
本文中所描述之軟性拋光墊可適用於化學機械拋光裝置。圖1繪示與根據本發明之一實施例之一用於拋光半導體基板之軟性拋光墊相容之一種拋光裝置之一等軸側視圖。
參考圖1,一種拋光裝置100包含一平台104。平台104之頂面102可係用於支撐一軟性拋光墊。平台104可經組態以提供心軸旋轉106及滑塊振盪108。一樣本載體110係用於在利用一軟性拋光墊拋光一半導體晶圓期間固持例如該半導體晶圓在合適位置。樣本載體係藉由一懸吊機構112而進一步支撐。該拋光裝置100包含一漿體進料裝置114以在該半導體晶圓之拋光之前及在該半導體晶圓之拋光期間提供漿體至一軟性拋光墊之一表面。
根據本發明之一實施例,提供一「軟性」墊(相對於習知墊之蕭氏D值為軟性)以與諸如拋光裝置100之一拋光裝置一起使用。該軟性拋光墊可係用於半導體基板之化學機械拋光(CMP)中。在一實施例中,該軟性拋光墊係一直徑大約20英寸(例如,大約在50至52公分之範圍內)或大約30英寸(例如,大約在75至78公分之範圍內)之圓柱形閉孔型、熱固性聚胺基甲酸酯墊。該軟性拋光墊可各自具有一不透明部分,該不透明部分具有一選用局部區域透明部分。根據本發明之另一實施例,該軟性拋光墊係具有大約在42至48英寸之範圍內之一直徑之一圓柱形閉孔型、熱固性聚胺基甲酸酯墊,且係適用於450 mm晶圓處理。
在一實施例中,各聚胺基甲酸酯墊之上部係具有一開槽設計之一拋光表面,例如用於在諸如拋光裝置100之一拋光裝置上拋光期間接觸一半導體基板。在一實施例中,該聚胺基甲酸酯墊之平坦底面係利用一聚對苯二甲酸二乙酯(PET)載體膜而完全覆蓋,該PET載體膜具有大約在0.5至3密耳(mil)之範圍內之一厚度,且該PET載體膜在理想情況下係大約0.5密耳厚(例如,大約在10至15微米厚之範圍內)。該PET載體膜對光可係半透明的。該PET載體膜可經由一第一壓敏黏合劑而黏合至該底墊面,該第一壓敏黏合劑完全覆蓋該PET載體膜之一側。在一實施例中,完全覆蓋該PET載體膜之另一側係一第二壓敏黏合劑層。大約2.5密耳厚(例如,大約在60至65微米之範圍內)之一PET釋離襯墊可經由此第二壓敏黏合劑而附接至該PET載體膜。在一實施例中,該第一壓敏黏合劑係一橡膠類型,而該第二壓敏黏合劑係一丙烯酸類型。在一替代性實施例中,省略該PET載體膜及該等壓敏黏合劑之一者,使得該PET釋離襯墊係藉由一單一壓敏黏合劑層而直接黏合至該聚胺基甲酸酯墊之底面。
在本發明之一態樣中,提供一種用於半導體基板表面之化學機械拋光之軟性拋光墊。圖2繪示根據本發明之一實施例之一種用於拋光半導體基板之軟性拋光墊之一截面圖。
參考圖2,一軟性拋光墊200包含一模塑均質拋光本體202,其係由一熱固性、閉孔型聚胺基甲酸酯材料組成,該熱固性、閉孔型聚胺基甲酸酯材料具有大約在20蕭氏D至45蕭氏D之範圍內之一硬度。在一實施例中,術語「均質」係用於指示該熱固性、閉孔型聚胺基甲酸酯材料之成分遍及該拋光本體之整個成分係一致的。舉例而言,在一實施例中,術語「均質」排除由例如浸漬氈製品或多個不同材料層之一組合物(複合物)組成之拋光墊。在一實施例中,術語「熱固性」係用於指示不可逆轉固化例如材料之前驅物之該聚合物材料藉由固化而不可逆轉地改變為一不熔性、不溶性聚合物網。舉例而言,在一實施例中,術語「熱固性」排除由例如「熱塑性」材料或「熱塑性塑膠」(由當加熱時轉變為液體且當充分冷卻時成極似玻璃狀態之一聚合物組成之該等材料)組成之拋光墊。在一實施例中,術語「模塑」係用於指示在一形成模具中形成模塑均質拋光本體202,如下文更詳細描述。
在一實施例中,模塑均質拋光本體202包含一第一開槽表面204及與該第一表面204相對之一第二平坦表面206。作為第一開槽表面204之一圖案之一實例,圖3繪示根據本發明之一實施例之一種用於拋光半導體基板之軟性拋光墊之一俯視圖。參考圖3,一模塑均質拋光本體300包含一開槽表面,該開槽表面具有例如連同複數個徑向線304之複數個同心圓302。
在一實施例中,模塑均質拋光本體202係不透明的。在一實施例中,術語「不透明」係用於指示容許大約10%或更少可見光通過之一材料。在一實施例中,模塑均質拋光本體202在大多數情況下或完全歸因於在整個模塑均質拋光本體202之均質熱固性、閉孔型聚胺基甲酸酯材料(例如,作為該材料中之另一組分)包含一不透明潤滑劑而係不透明的。根據本發明之一實施例,該不透明潤滑劑係一材料,諸如,但不限於石墨、硼氮化物、二硫化鎢、聚四氟乙烯、鈰氟化物、鉬硫化物、石墨氟化物、鈮硫化物、鉭硫化物或雲母。
在一實施例中,模塑均質拋光本體202包含成孔劑。在一實施例中,術語「成孔劑」係用於指示具有「空心」中心之微米或奈米規模球狀顆粒。該等空心中心不用固態材料填充,而相反可包含一氣態或液態核。在一實施例中,模塑均質拋光本體202包含在模塑均質拋光本體202之整個熱固性、閉孔型聚胺基甲酸酯材料(例如,作為該材料中之另一組分)之一成孔劑預膨脹及充氣之EXPANCEL。在一特定實施例中,該EXPANCEL係利用戊烷填充。
再次參考圖2,軟性拋光墊200進一步包含佈置於模塑均質拋光本體202之上之一載體膜208。在一實施例中,載體膜208係由聚對苯二甲酸二乙酯(PET)組成。在一實施例中,載體膜208具有大約0.5密耳之一厚度,例如大約在10至15微米之範圍內。在一實施例中,載體膜208對光係半透明的。
再次參考圖2,軟性拋光墊200進一步包含佈置於載體膜208與模塑均質拋光本體202之間之一第一壓敏黏合劑層210。在一實施例中,第一壓敏黏合劑層210係由一橡膠類型材料組成。
再次參考圖2,軟性拋光墊200進一步包含佈置於載體膜208之上之一第二壓敏黏合劑層212。在一實施例中,第二壓敏黏合劑層212係由一丙烯酸類型材料組成。
再次參考圖2,軟性拋光墊200進一步包含放置於第二壓敏黏合劑層212之上之一釋離襯墊214。在一實施例中,釋離襯墊214係由聚對苯二甲酸二乙酯(PET)組成。在一替代性實施例(未顯示)中,在不插入載體膜或第一及第二壓敏黏合劑層的情況下,軟性拋光墊200進一步包含直接佈置於模塑均質拋光本體202上之一釋離襯墊。
應瞭解,模塑均質拋光本體202之大小可根據應用而改變。然而,某些參數可係用於使包含此一模塑均質拋光本體202之軟性拋光墊與習知處理設備或甚至與習知化學機械處理操作相容。舉例而言,根據本發明之一實施例,模塑均質拋光本體202具有大約在0.075英寸至0.130英寸之範圍內之一厚度,例如大約在1.9至3.3毫米之範圍內。在一實施例中,模塑均質拋光本體202具有大約在20英寸至30.3英寸之範圍內之一直徑,例如大約在50至77公分之範圍內,且有可能大約在10英寸至42英寸之範圍內,例如大約在25至107公分之範圍內。在一實施例中,模塑均質拋光本體202具有大約35蕭氏D之一硬度。在一實施例中,模塑均質拋光本體202具有大約在18%至30%總孔隙體積之範圍內之一孔密度,且有可能大約在15%至35%總孔隙體積之範圍內。在一實施例中,模塑均質拋光本體202具有閉孔類型之一孔隙度。在一實施例中,模塑均質拋光本體202具有大約40微米直徑之一孔大小,但該孔大小可係更小,例如大約20微米直徑。在一實施例中,模塑均質拋光本體202具有大約2.5%之一壓縮率。在一實施例中,模塑均質拋光本體202具有大約在每立方公分0.80至0.90克之範圍內或大約在每立方公分0.95至1.05克之範圍內之一密度。
應瞭解,使用一包含模塑均質拋光本體202之軟性拋光墊之各種膜之移除速率可取決於所使用之拋光工具、漿體、調節或拋光方法而改變。然而,在一實施例中,模塑均質拋光本體202呈現大約在每分鐘30至900奈米之範圍內之一銅移除速率。在一實施例中,模塑均質拋光本體202呈現大約在每分鐘30至900奈米之範圍內之一氧化物移除速率。在一實施例中,模塑均質拋光本體202具有在攝氏25度大約30 MPa之一彈性儲存模數E'。在一實施例中,模塑均質拋光本體202具有在攝氏40度大約25 MPa之一彈性儲存模數E'。在一實施例中,模塑均質拋光本體202具有在攝氏70度大約20 MPa之一彈性儲存模數E'。在一實施例中,模塑均質拋光本體202具有在攝氏90度大約18 MPa之一彈性儲存模數E'。在一實施例中,模塑均質拋光本體202具有隨溫度變化之自在T=攝氏-75度大約0.04至在T=攝氏-15度大約0.23之一阻尼相(tan delta),其具有在攝氏25度大約0.19之一值。在一實施例中,模塑均質拋光本體202具有在攝氏25度大約10500、在攝氏40度大約13500或在攝氏70度大約15500之一動能損失因子KEL(1/Pa)。根據本發明之一實施例,一軟性拋光墊具有在攝氏45度大約2000至45000之範圍內之一KEL。
在本發明之一態樣中,一軟性拋光墊包含由形成一單一類型聚胺基甲酸酯聚合物之一非聚合胺基甲酸酯前驅物製造之一模塑均質拋光本體,諸如模塑均質拋光本體202。舉例而言,根據本發明之一實施例,一模塑均質拋光本體係藉由將(a)一芳香族胺基甲酸酯預聚合物,諸如AIRTHANE 60:聚四亞甲基二醇甲苯二異氰酸酯(b)一成孔劑,諸如EXPANCEL 40:具有一異丁烯或戊烷填充物之丙烯腈偏氯乙烯(c)一潤滑劑及白化劑填充物(d)一多元醇,諸如Terathane T-200:聚氧四亞甲基二醇及(e)一催化劑,諸如DABCO 1027與(f)一固化劑,諸如CURENE 107:硫醚芳香族二胺,(g)一熱穩定劑,諸如PUR68及(h)一紫外線吸收劑,諸如Tinuvin 213反應以形成具有一大體上均勻微孔、閉孔型結構之一幾乎不透明暗黃色熱固性聚胺基甲酸酯而製造。該幾乎不透明模塑均質拋光本體可能不由複數個聚合物材料製成,及聚合物材料之一混合物可能不藉由以上反應而形成。相反,在一實施例中,該不透明墊模塑均質拋光本體係由形成一單一類型聚胺基甲酸酯聚合物之一非聚合胺基甲酸酯前驅物製成。此外,在一實施例中,一製成之軟性拋光墊之模塑均質拋光本體部分不包含分散於水不溶聚合基質不透明材料中之任何水溶顆粒。在一實施例中,該不透明區本質係均勻疏水性。在一特定實施例中,在調節時,若干部分變得更具親水性以便係可潤濕的。在一實施例中,上述EXPANCEL材料不具有一液態核,該液態核大體上全係水。替代該EXPANCEL之核係一氣體,且各EXPANCEL單元之平均孔大小係大約在20至40微米之範圍內。
如上所述,一軟性拋光墊可係由形成一單一類型聚胺基甲酸酯聚合物之一非聚合胺基甲酸酯前驅物製造。圖4係代表根據本發明之一實施例之一種製造用於拋光半導體基板之一軟性拋光墊之方法中之操作之一流程圖400。圖5A至5C繪示根據本發明之一實施例之一種用於拋光半導體基板之軟性拋光墊之製造之一截面圖,該等圖對應於流程圖400之操作。
參考圖5A及流程圖400之相對應操作402,一種製造用於拋光半導體基板之一軟性拋光墊之方法包含:在一形成模具504中,混合一預聚合物、一主固化劑及不同於該主固化劑之一次固化劑(組合502)以形成一混合物506。
根據本發明之一實施例,該預聚合物包含一聚胺基甲酸酯前驅物,該主固化劑包含一芳香族二胺化合物,及該次固化劑包含一醚鍵聯。在一實施例中,該聚胺基甲酸酯前驅物係一異氰酸酯,該主固化劑係一芳香族二胺,及該次固化劑係一固化劑,諸如,但不限於聚四亞甲基二醇、氨官能基乙二醇或氨官能基聚氧化丙烯。在一實施例中,預聚合物、一主固化劑及一次固化劑(組合502)具有一大約100份預聚合物、85份主固化劑及15份次固化劑之莫耳比。應瞭解,該比之變動可係用於提供具有變化蕭氏D值或基於該預聚合物及該等第一及第二固化劑之特定性質之軟性拋光墊。在一實施例中,該混合進一步包含:混合一不透明潤滑劑與該預聚合物、該主固化劑及該次固化劑。
參考圖5B及流程圖400之相對應操作404,製造用於拋光半導體基板之一軟性拋光墊之方法亦包含:固化混合物506以提供一模塑均質拋光本體508。
根據本發明之一實施例,固化混合物506包含:在形成模具504中,部分固化以提供一聚胺基甲酸酯材料。在該實施例中,固化混合物506包含:在一烤箱中,進一步固化以提供模塑均質拋光本體508。在一實施例中,形成模具504包含一蓋505,該蓋505具有形成於該蓋上或形成於該蓋中之一開槽圖案507,如圖5B中所示。在一實施例中,在烤箱固化之前部分固化可在存在蓋505之情況下在大約在華氏200至260度之範圍內之一溫度及大約在每平方英寸2至12磅之範圍內之一壓力下執行,其中該蓋將混合物506封閉於形成模具504中。
參考圖5C及再次參考流程圖400之相對應操作404,模塑均質拋光本體508係由一熱固性、閉孔型聚胺基甲酸酯材料組成,該熱固性、閉孔型聚胺基甲酸酯材料具有大約在20蕭氏D至45蕭氏D之範圍內之一硬度。在一實施例中,由於形成模具504之蓋505之開槽圖案507,模塑均質拋光本體508包含一第一開槽表面510及與第一表面510相對之一第二平坦表面512,如圖5C中所示。在一實施例中,模塑均質拋光本體508係不透明的。在一實施例中,模塑均質拋光本體508歸因於包含一不透明潤滑劑而係不透明的。
在本發明之另一態樣中,一軟性拋光墊可製造成包含在一模塑程序操作期間形成之溝槽,但是該開槽圖案並不一定由一形成模具之蓋中包含一開槽圖案而形成。圖4係代表根據本發明之另一實施例之一種製造用於拋光半導體基板之一軟性拋光墊之方法之操作之一流程圖400。圖6A至6C繪示根據本發明之一實施例之一種用於拋光半導體基板之軟性拋光墊之製造之一截面圖,該等圖對應於流程圖400之操作。
參考圖6A及流程圖400之相對應操作402,一種製造用於拋光半導體基板之一軟性拋光墊之方法包含:在一形成模具604中,混合一預聚合物、一主固化劑及不同於該主固化劑之一次固化劑(組合602)以形成一混合物606。
根據本發明之一實施例,該預聚合物包含一聚胺基甲酸酯前驅物,該主固化劑包含一芳香族二胺化合物,及該次固化劑包含一醚鍵聯。在一實施例中,該聚胺基甲酸酯前驅物係一異氰酸酯,該主固化劑係一芳香族二胺,及該次固化劑係一固化劑,諸如,但不限於聚四亞甲基二醇、胺基官能化二醇或胺基官能化聚氧化丙烯。在一實施例中,預聚合物、一主固化劑及一次固化劑(組合502)具有一大約100份預聚物、85份主固化劑及15份次固化劑之莫耳比。應瞭解,該比之變動可係用於提供具有變化蕭氏D值之軟性拋光墊。在一實施例中,該混合進一步包含:混合一不透明潤滑劑與該預聚合物、該主固化劑及該次固化劑。
參考圖6B及流程圖400之相對應操作404,製造用於拋光半導體基板之一軟性拋光墊之方法亦包含:固化混合物606以提供一模塑均質拋光本體608。
根據本發明之一實施例,固化混合物606包含:在形成模具604中,部分固化以提供一聚胺基甲酸酯材料。在該實施例中,固化混合物606包含:在一烤箱中,進一步固化以提供模塑均質拋光本體608。在一實施例中,形成模具604包含一蓋605。然而,與上文所述蓋505不同,蓋605具有與混合物606接觸之一平坦表面。相反,一開槽圖案607包含於形成模具604之底面處,如圖6A及6B中所示。在一實施例中,在烤箱固化之前部分固化可在存在蓋605之情況下在大約在華氏200至260度之範圍內之一溫度及大約在每平方英寸2至12磅之範圍內之一壓力下執行,其中該蓋將混合物606封閉於形成模具604中。
參考圖6C及再次參考流程圖400之相對應操作404,模塑均質拋光本體608係由一熱固性、閉孔型聚胺基甲酸酯材料組成,該熱固性、閉孔型聚胺基甲酸酯材料具有大約在20蕭氏D至45蕭氏D之範圍內之一硬度。在一實施例中,由於在形成模具604之底部處之開槽圖案607,模塑均質拋光本體608包含一第一開槽表面610及與第一表面610相對之一第二平坦表面612,如圖6C中所示。在一實施例中,模塑均質拋光本體608係不透明。在一實施例中,模塑均質拋光本體608歸因於包含一不透明潤滑劑而係不透明。
如上所述一軟性拋光墊之形成之實施例可容易適用於更複雜之化學配方。舉例而言,根據本發明之另一實施例,一種製造用於拋光半導體基板之一軟性拋光墊之方法包含:在一形成模具中,使一芳香族胺基甲酸酯預聚合物、一成孔劑、一潤滑劑及白化劑填充物、一多元醇及一催化劑與一固化劑、一熱穩定劑及一紫外線吸收劑反應以形成具有一混合物。在一實施例中,該芳香族胺基甲酸酯預聚合物係由聚四亞甲基二醇甲苯二異氰酸酯組成,該成孔劑係由具有一異丁烯或戊烷填充物之丙烯腈偏氯乙烯組成,該潤滑劑及白化劑填充物係由一不透明潤滑劑組成,該多元醇係由聚四亞甲基二醇組成,該催化劑係由DABCO 1027組成,該固化劑係由硫醚芳香族二胺組成,該熱穩定劑係由PUR68組成,及該紫外線吸收劑係由Tinuvin 213組成。該製造用於拋光半導體基板之該軟性拋光墊之方法亦包含:固化以上複雜混合物以提供該軟性拋光墊之一模塑均質拋光本體。
根據本發明之一實施例,製造用於拋光半導體基板之該軟性拋光墊之方法進一步包含:形成一載體膜於該模塑均質拋光本體之一表面之上。在一實施例中,該載體膜係由聚對苯二甲酸二乙酯(PET)組成。在一實施例中,該載體膜具有大約0.5密耳之一厚度,例如大約在10至15微米之範圍內。在一實施例中,該載體膜414對光係半透明的。在一特定實施例中,該載體膜係由聚對苯二甲酸二乙酯(PET)組成,該載體膜具有大約0.5密耳之一厚度,例如大約在10至15微米之範圍內,且該載體膜對光係半透明的。在一實施例中,該載體膜係一MYLAR聚對苯二甲酸二乙酯膜。在一特定實施例中,該MYLAR膜係完全不滲水,且不具有形成於該膜中之孔。
根據本發明之一實施例,製造用於拋光半導體基板之該軟性拋光墊之方法進一步包含形成介於該模塑均質拋光本體之該表面與該載體膜之間之一第一壓敏黏合劑層。在一實施例中,該第一壓敏黏合劑層係直接形成於該模塑均質拋光本體之該表面與該載體膜之間。在一實施例中,形成該第一壓敏黏合劑層包含形成一橡膠類型材料。在一實施例中,該第一壓敏黏合劑層係一永久鍵結類型黏合劑。
根據本發明之一實施例,製造用於拋光半導體基板之該軟性拋光墊之方法進一步包含形成一第二壓敏黏合劑層於該載體膜之上。在一實施例中,該第二壓敏黏合劑層係直接形成於該載體膜上。在一實施例中,形成該第二壓敏黏合劑層包含形成一丙烯酸類型材料。在一實施例中,該第二壓敏黏合劑層係一可釋離鍵結類型黏合劑。
根據本發明之一實施例,製造用於拋光半導體基板之該軟性拋光墊之方法進一步包含形成一釋離襯墊於該第二壓敏黏合劑層之上。在一實施例中,該釋離襯墊係直接形成於該第二壓敏黏合劑層上。在一實施例中,該釋離襯墊係由聚對苯二甲酸二乙酯(PET)組成。在一實施例中,該釋離襯墊係一MYLAR聚對苯二甲酸二乙酯膜層,該膜具有大約2.5密耳之一厚度,例如大約在60至65微米之範圍內。然而,在一替代性實施例中,該釋離襯墊係由一材料組成,諸如,但不限於紙或聚丙烯。或者,一軟性拋光墊可僅包含該模塑均質拋光本體及一釋離襯墊。為此,根據本發明之一替代性實施例,一種製造用於拋光半導體基板之一軟性拋光墊之方法包含直接於該模塑均質拋光本體之一平坦表面上形成一釋離襯墊。在一實施例中,該釋離襯墊係由聚對苯二甲酸二乙酯(PET)組成。
在本發明之另一態樣中,一局部區域透明可包含於一軟性拋光墊中。舉例而言,在一實施例中,要求在一CMP操作期間可見地接達一基板之頂面之一技術係用於偵測該操作之終點。然而,如上所述,該軟性拋光墊可係不透明的,且因此受限於用於此一終點偵測之各種可能技術。圖7繪示根據本發明之一實施例之一種用於拋光半導體基板之軟性拋光墊之一截面圖,該軟性拋光墊包含一局部區域透明區。
參考圖7,諸如關聯圖2所述之軟性拋光墊200之一軟性拋光墊之一模塑均質拋光本體702進一步包含一局部區域透明(LAT)區704,該局部區域透明(LAT)區704佈置於該模塑均質拋光本體702中且與該模塑均質拋光本體702共價鍵結。
在一實施例中,模塑均質拋光本體702係不透明的,而LAT區704非不透明的。在一實施例中,至少部分歸因於在用於製造一軟性拋光墊之模塑均質拋光本體部分之材料中包含一無機物,故模塑均質拋光本體702係不透明的。在該實施例中,該局部區域透明區係製造成不包含該無機物,且其對例如可見光、紫外光、紅外光或其一組合係大體上(若不完全是)透明的。在一特定實施例中,該模塑均質拋光本體702中所包含之該無機物係一不透明潤滑劑,而該局部區域透明部分不含有包含該不透明潤滑劑之任何無機材料。因此,在一實施例中,模塑均質拋光本體702係不透明的,且包含硼氮化物,而LAT區704係基本上沒有一不透明潤滑劑。在一實施例中,LAT區704係實際上透明(理想而言全透明)以便使光能夠透射通過用於例如終點偵測之一軟性拋光墊。然而,可能係此情況,即LAT區704不可或無須製造成完美地透明,而可對用於終點偵測之光透射仍係有效。舉例而言,在一實施例中,LAT區704透射少至在700至710奈米範圍內之入射光之80%,但仍適合於作用為在一軟性拋光墊內之一窗。
在一實施例中,模塑均質拋光本體702及LAT區具有不同硬度。舉例而言,在一實施例中,模塑均質拋光本體702具有比LAT區704之蕭氏D更小之一蕭氏D。在一特定實施例中,模塑均質拋光本體702具有大約在20至45之範圍內之一蕭氏D,而LAT區704具有大約60之一蕭氏D。雖然硬度可能不同,但是介於LAT區704與模塑均質拋光本體702之間之交聯(例如,經由共價鍵結)仍可係延伸。舉例而言,根據本發明之一實施例,模塑均質拋光本體702及LAT區704之蕭氏D之差係10或更大,而介於模塑均質拋光本體702及LAT區704之間之交聯之程度係大的。
應瞭解,一軟性拋光墊及佈置於該軟性拋光墊中之一LAT區之尺寸可根據所需應用而改變。舉例而言,在一實施例中,模塑均質拋光本體702係具有大約在75至78公分之範圍內之一直徑之圓,及LAT區704具有沿模塑均質拋光本體702之一徑向軸之大約在4至6公分之範圍內之一長度、大約在1至2公分之範圍內之一寬度,且定位於距離模塑均質拋光本體702之中心大約在16至20公分之範圍內。
關於垂直定位,在一模塑均質拋光本體上之一LAT區之位置可經選擇用於特定應用,且亦可係該形成程序之結果。舉例而言,藉由經由該模塑程序包含一LAT區於一模塑均質拋光本體中,可達成之定位及準確度比在其中形成之後切割一拋光墊及在該墊形成之後添加一窗插入物之一程序可係明顯更適當。在一實施例中,藉由使用如下文所述之一模塑程序,一LAT區包含於一模塑均質拋光本體中,該模塑均質拋光本體待與該模塑均質拋光本體之一開槽表面之凹槽之底部齊平。在一特定實施例中,藉由包含待與該模塑均質拋光本體之一開槽表面之凹槽之底部齊平之LAT區,該LAT區不會與在由該模塑均質拋光本體及該LAT區製造之一軟性拋光墊之整個使用壽命與CMP處理操作干擾。
在另一實施例中,藉由使用如下文所述之一模塑程序,一LAT區包含於一模塑均質拋光本體中,該模塑均質拋光本體待與該模塑均質拋光本體之相對平坦表面齊平。此平坦性可藉由研磨模塑均質拋光本體之背側直到該LAT區曝露出或在模塑時製成平坦而達成。在任一情形下,根據本發明之一實施例,該LAT區之凹口未進入至模塑均質拋光本體之背側中。為此,當一軟性拋光墊與用於CMP程序操作之一CMP工具一起使用時,介於該CMP工具之一平台與該軟性拋光墊之一LAT區之間少有或不可能有不符需要捕集之空氣或水分。
在一實施例中,在不添加插入層的情況下,包含一LAT區之一軟性拋光墊可藉由一黏膜或殘留物介面而黏合至該CMP平台。舉例而言,在一實施例中,具有一LAT區之一軟性拋光墊之模塑均質拋光本體部分之底板(與開槽表面相對之平坦側)具有佈置於該底板上之一轉移膠帶層。在該轉移膠帶移除時,例如在一CMP工具上之軟性拋光墊之使用時,會建立一黏性介面,使該模塑均質拋光本體及該LAT區能夠直接應用至該CMP工具之一平台。在一實施例中,該LAT區係放置於該平台包含之一發光終點偵測系統上。在一實施例中,介於該模塑均質拋光本體與該平台之間(及因此介於該LAT區與該平台之間)之該黏性介面係完全或幾乎透明的,且不與透過該LAT區之來自一終點偵測系統之光之透射干擾。在一特定實施例中,該黏性介面係一丙烯酸介面。在一實施例中,因為介於該模塑均質拋光本體與該平台之間之間不保留額外拋光墊層,所以不需要與切割在具有該LAT區之此等層中之窗及對準該等層相關聯之成本及時間。
因此,在一實施例中,一局部區域透明區併入於一軟性拋光墊中。在一實施例中,在該墊之實際模塑及形成期間包含該局部區域透明,使得用於形成該墊之反應前驅物經佈置以包圍定位於一形成模具中之一預製造局部區域透明。接著在存在該局部區域透明的情況下,固化該軟性拋光墊材料,因此將該局部區域透明併入至該軟性拋光墊本身中。舉例而言,圖8繪示根據本發明之一實施例之一種軟性拋光墊之一部分之一斜視圖,該軟性拋光墊具有併入於該軟性拋光墊中之一局部區域透明。參考圖8,軟性拋光墊802包含併入於該軟性拋光墊中之一局部區域透明(LAT)區804。在一實施例中,局部區域透明區804係凹陷於軟性拋光墊802之開槽表面之溝槽806之下,如圖8中繪示。
該局部區域透明區可具有一尺寸,且係位於與各種終點偵測技術相容及適用於包含於藉由一模塑程序製造之一軟性拋光墊中之一位置中。舉例而言,根據本發明之一實施例,一局部區域透明區具有大約2英寸之一長度(例如,大約在4至6公分之範圍內)及大約0.5英寸之一寬度(例如,大約在1至2公分之範圍內)。在一實施例中,該局部區域透明區係定位成距離一軟性拋光墊之中心大約7英寸,例如大約在16至20公分之範圍內,諸如,但不限於具有30英寸之一直徑(例如,大約在75至78公分之範圍內之一直徑)之一軟性拋光墊。
該局部區域透明區可由與各種終點偵測技術相容及適用於包含於藉由一模塑程序製造之一軟性拋光墊中之一材料組成。舉例而言,根據本發明之一實施例,一局部區域透明區經形成以在上述流程圖400之操作402及404期間容置在一模塑均質拋光本體中。
舉例而言,根據本發明之一實施例,如關聯流程圖400所述,製造用於拋光半導體基板之該軟性拋光墊之方法進一步包含在混合該預聚合物及該主固化劑及該次固化劑之前,在一第二分開形成模具中混合一芳香族胺基甲酸酯預聚合物與一固化劑以形成一第二混合物。接著在該第二形成模具中部分固化該第二混合物以形成一模塑凝膠。接著將該模塑凝膠定位於該形成模具之一指定區中。
根據本發明之一實施例,混合該預聚合物及該主固化劑及該次固化劑以形成該軟性拋光墊混合物包含將該軟性拋光墊混合物至少部分形成於該模塑凝膠周圍。在一實施例中,固化該軟性拋光墊混合物以提供該模塑均質拋光本體進一步包含固化該模塑凝膠以提供一局部區域透明(LAT)區,該局部區域透明區佈置於該模塑均質拋光本體中且與該模塑均質拋光本體共價鍵結。
在一實施例中,固化該軟性拋光墊混合物及該模塑凝膠包含在該軟性拋光墊形成模具中,部分固化以提供一聚胺基甲酸酯材料(拋光本體前驅物)及提供一LAT區前驅物。在該實施例中,固化該軟性拋光墊混合物及該模塑凝膠包含在一烤箱中,進一步固化以提供由一熱固性、閉孔型聚胺基甲酸酯材料組成之該模塑均質拋光本體及提供該LAT區。
根據本發明之一實施例,在形成該LAT區中,該芳香族胺基甲酸酯預聚物包含聚四亞甲基二醇甲苯二異氰酸酯,及該固化劑包含硫醚芳香族二胺。在一實施例中,單獨利用熱能執行該第二(LAT區前驅物)混合物之部分固化。在一實施例中,該芳香族胺基甲酸酯預聚合物係由一高分子量多元醇組成。
在一實施例中,一種製造一軟性拋光墊之一局部區域透明區之方法包含在一形成模具中,使一芳香族胺基甲酸酯預聚合物與一固化劑反應以形成一混合物。在一實施例中,該芳香族胺基甲酸酯預聚合物係由聚四亞甲基二醇甲苯二異氰酸酯(AIRTHANE 60)組成,及該固化劑係由硫醚芳香族二胺(CURENE 70)組成。因此,在一實施例中,該局部區域透明區非由複數個聚合物材料製成,及聚合物材料之一混合物不由以上反應而製成。相反,該局部區域透明區係由形成一單一類型聚胺基甲酸酯聚合物之一非聚合胺基甲酸酯前驅物製成。此外,形成該局部區域透明區之所得聚合物不是一非琥珀狀聚胺基甲酸酯彈性體。此外,在一實施例中,沒有分散於用於形成該局部區域透明區之水不溶聚合基質中之水溶顆粒。在一實施例中,該局部區域透明區非由透氣材料、玻璃或結晶性材料製成。該等選用局部區域透明區可藉由首先在配備有一化學攪拌器及氮氣頂隙之混合槽中將上述局部區域透明區前驅物成分(除了該固化劑以外)混合在一起而製成。根據本發明之一實施例,在徹底混合之後,該混合物經由一混合頭而轉移至一形成模具,其中該固化劑添加至用於形成該軟性拋光墊之模塑均質拋光本體部分之該混合物。
在一實施例中,一種製造一軟性拋光墊之一局部區域透明區之方法包含在一形成模具中,部分固化以上混合物以形成一模塑凝膠,該模塑凝膠最終轉變以提供該LAT。在一實施例中,在該LAT形成模具中部分固化該混合物以製成所需局部區域透明區形狀之一透明類凝膠顆粒。在一實施例中,單獨藉由熱能而不是藉由光固化或其他技術而部分固化該混合物。
在一實施例中,一種製造一軟性拋光墊之一局部區域透明(LAT)區之方法亦包含在該模塑凝膠之頂面處形成一支撐膜。根據本發明之一實施例,該支撐膜係由一聚醯亞胺膜(例如,可購得之KAPTON聚醯亞胺膜)組成。在一實施例中,該支撐膜係定位於該模塑凝膠之頂部處以在轉移至一較大墊形成模具期間支撐該窗前驅物。
在一實施例中,一種製造一軟性拋光墊之一局部區域透明區之方法亦包含將該模塑凝膠定位於一軟性拋光墊形成模具之蓋之一指定區中。在一實施例中,該支撐膜係在此點處移除。根據本發明之一實施例,該指定區係指定用於接受及定位該模塑凝膠。在一實施例中,一聚合物套筒不用於將該模塑凝膠固持於該軟性拋光墊形成模具之蓋中或軟性拋光墊形成模具之蓋上。在一實施例中,該模塑凝膠係定位於該軟性拋光墊形成模具中,使得由該軟性拋光墊形成模具形成之一局部區域透明區之頂部係低於提供以產生形成於該局部區域透明區周圍之一軟性拋光墊中之拋光表面(或溝槽區域)之該軟性拋光墊形成模具之蓋之部分之位準。
在一實施例中,一種製造一軟性拋光墊之一局部區域透明區之方法亦包含在該軟性拋光墊形成模具中,使軟性拋光墊前驅物反應以一旦該軟性拋光墊形成模具之蓋被放置於該軟性拋光墊前驅物混合物上時形成包圍該指定區中之模塑凝膠之一混合物。根據本發明之一實施例,該軟性拋光墊混合物係由若干材料組成,且係藉由與關聯流程圖400之操作402所述之混合物506類似或相同之方式而形成。
在一實施例中,一種製造一軟性拋光墊之一局部區域透明區之方法亦包含完全固化該軟性拋光墊混合物及該模塑凝膠以提供一模塑均質拋光本體,其具有佈置於該模塑均質拋光本體中之一局部區域透明區。根據本發明之一實施例,該模塑均質拋光本體係由若干材料組成,且係藉由與關聯流程圖400之操作404所述之模塑均質拋光本體508類似或相同之方式而形成。
在製成一模塑均質拋光本體時,該模塑均質拋光本體具有佈置於其中之一局部區域透明區,可視需要執行額外操作(諸如,添加底板層、薄化該墊等)以進一步完成一軟體拋光墊之製造。因此,一軟性拋光墊可製造成包含例如用於終點偵測之一局部區域透明區。該終點偵測可包含透過該軟性拋光墊之該LAT之光之透射。下文提供可用於形成具有一局部區域透明區之此一軟性拋光墊之更多細節。
根據本發明之一實施例,為了形成一軟性拋光墊,液態不透明墊前驅物被添加至三個或四個分開混合槽,其各配備有一機械攪拌器及氮氣頂隙。一第一混合槽含有一預聚合物、一不透明潤滑劑及白化劑填充物以及一成孔劑。一第二混合槽含有一固化劑、一紫外線穩定劑及一熱穩定劑。一第三混合槽含有一多元醇及一催化劑。或者,該催化劑可固持於一第四混合槽中。混合槽中之混合物在徹底混合之後經由真空而轉移至一分開日用槽。當準備使用時,各混合物經由該等成分反應之一混合頭而轉移至一CMP軟性拋光墊模具。該不透明前驅物混合被物添加進入至該模具以填滿該模具之其餘部分且大致上包圍一局部區域透明區。在一實施例中,在此操作中所使用之混合裝置係一Baule混合系統。
在一實施例中,在添加選用類凝膠插入物(LAT前驅物)及不透明部分之前,預加熱該模具至大約華氏250度或大約攝氏121度。在該插入物定位於該模具中且該不透明部分填充該模具之其餘部分之後,該模具封閉且加熱約8分鐘以部分固化該不透明材料及進一步固化該凝膠插入物(透明材料)。因為該模具之頂部及底部之熱質量可使在一軟性拋光墊之製造期間循環模具溫度不切實際,所以在執行製造時,該模具之內部一直保持在大約處理溫度。在一實施例中,類固態之部分固化材料經「脫模」且從該模具移除。
在一實施例中,該類固態部分固化墊接著移至一固化烤箱且在大約華氏200度或大約攝氏93度加熱大約12小時。該加熱可完全固化該墊。該固化墊接著從該烤箱移除,機械加工該墊及該局部區域透明區之背側(根本不處理前側或開槽側),使得該墊之不透明部分之底面與該局部區域透明區之底面齊平。此外,該機械加工可引起達成所需墊厚度。
在一實施例中,一透明MYLAR層接著佈置於該經固化及機械加工之墊之底面上。一卷MYLAR膜經展開且透過一壓層板與該墊底面接觸,該膜具有在該膜之一側上之一第一壓敏黏合劑及在另一側上之一第二壓敏黏合劑及釋離片。定位及切割該MYLAR卷,使得MYLAR載體膜覆蓋該墊之整個底面。因此,產生該墊/黏合劑層/MYLAR膜/黏合劑層/MYLAR釋離層之一複合物。或者,替代上述該卷MYLAR膜而使用一「轉移黏合劑」。此「轉移黏合劑」可係展開之一黏合劑/釋離片,及該黏合劑層係黏合至該軟性拋光墊之底部。在該實施例中,該釋離墊保持與該黏合劑層接觸。
在一實施例中,接著清潔、檢驗及包裝上述該層複合物以裝運作為一軟性拋光墊。在一實施例中,當該墊需要使用時,從該複合物移除該釋離層,曝露該第二黏合劑層。該複合物接著定位抵於具有黏合至一CMP機械平台之曝露黏合劑層之該平台。該釋離層可在移除之後丟棄。或者,若該軟性拋光墊沒有載體膜,則可移除該釋離襯墊,且該單一黏合劑層抵於平台放置。在一實施例中,經安裝之軟性拋光墊接著準備用於該CMP拋光操作。
應瞭解,基於上文所揭示之方法可達成之軟性拋光墊之特性對於特定應用而言可改變成略微不同(例如,在硬度上)。舉例而言,根據本發明之另一實施例,提供一種適用於拋光半導體基板之軟性拋光墊。該軟性拋光墊包含一澆鑄聚胺基甲酸酯聚合材料,該聚合材料具有約20蕭氏D至約40蕭氏D之一硬度、約每立方公分0.85克至約每立方公分1.00克之一密度、約1050至約1400(1/Pa在攝氏40度)之一KEL及以體積計約10%至約30%之一孔隙度。在一實施例中,該軟性拋光墊具有自約20蕭氏D至約35蕭氏D之一硬度。在一實施例中,該軟性拋光墊具有自每立方公分0.88克至約每立方公分0.95克之一密度。在一實施例中,該軟性拋光墊具有自約1100至約1350(1/Pa在攝氏40度)之一KEL。在一實施例中,該軟性拋光墊具有以體積計自約15%至約25%之一孔隙度。
亦應瞭解,固化反應產物,在完全固化的情況下,仍可留下一些殘餘反應物或副產物於該最後軟性拋光墊中。舉例而言,根據本發明之另一實施例,提供一種適用於拋光半導體基板之軟性拋光墊。該軟性拋光墊包含由聚合微球形成之一澆鑄聚胺基甲酸酯聚合材料,其中該等聚合微球組成該軟性拋光墊之約10至約40體積百分比。該軟性拋光墊亦包含具有自約6至8重量百分比之未反應NCO之異氰酸酯終止反應產物。在一實施例中,該異氰酸酯終止反應產物係利用一固化劑而固化,該固化劑包含至少一固化聚胺基甲酸酯化合物及至少一固化羥基官能化化合物之一混合物。在一實施例中,該固化聚胺基甲酸酯化合物與該固化羥基官能化化合物之莫耳比係自約1:1至約20:1。在一實施例中,該軟性拋光墊具有至少0.1體積百分比之一孔隙度及約蕭氏D 20至約蕭氏D 40之一硬度(例如,大約在約蕭氏A 60至約蕭氏A 90之範圍內)。
因此,已經揭示用於拋光半導體基板之軟性拋光墊。根據本發明之一實施例,一軟性拋光墊包含一模塑均質拋光本體,該模塑均質拋光本體包含一熱固性、閉孔型聚胺基甲酸酯材料,其具有大約在20蕭氏D至45蕭氏D之範圍內之一硬度。在一實施例中,該模塑均質拋光本體包含一第一開槽表面及與該第一表面相對之一第二平坦表面。在一實施例中,一局部區域透明(LAT)區佈置於該模塑均質拋光本體中且與該模塑均質拋光本體共價鍵結。根據本發明之另一實施例,一種製造用於拋光半導體基板之一軟性拋光墊之方法包含在一形成模具中,混合一預聚合物、一主固化劑及不同於該主固化劑之一次固化劑以形成一混合物。固化該混合物以提供一模塑均質拋光本體,其包含一熱固性、閉孔型聚胺基甲酸酯材料,該熱固性、閉孔型聚胺基甲酸酯材料具有大約在20蕭氏D至45蕭氏D之範圍內之一硬度。在一實施例中,該預聚合物包含一聚胺基甲酸酯前驅物,該主固化劑包含一芳香族二胺化合物,及該次固化劑包含一醚鍵聯。
100...拋光裝置
102...頂面
104...平台
106...心軸旋轉
108...滑塊振盪
110...樣本載體
112...懸吊機構
114...漿體進料裝置
200...軟性拋光墊
202...模塑均質拋光本體
204...第一開槽表面
206...第二平坦表面
208...載體膜
210...第一壓敏黏合劑層
212...第二壓敏黏合劑層
214...釋離襯墊
300...模塑均質拋光本體
302...同心圓
304...徑向線
502...組合
504...形成模具
505...蓋
506...混合物
507...開槽圖案
508...模塑均質拋光本體
510...第一開槽表面
512...第二平坦表面
602...組合
604...形成模具
605...蓋
606...混合物
607...開槽圖案
608...模塑均質拋光本體
610...第一開槽表面
612...第二平坦表面
702...模塑均質拋光本體
704...局部區域透明區
802...軟性拋光墊
804...局部區域透明區
806...溝槽
圖1繪示與根據本發明之一實施例之一種用於拋光半導體基板之軟性拋光墊相容之一種拋光裝置之一等軸側視圖。
圖2繪示根據本發明之一實施例之一種用於拋光半導體基板之軟性拋光墊之一截面圖。
圖3繪示根據本發明之一實施例之一種用於拋光半導體基板之軟性拋光墊之一俯視圖。
圖4係代表根據本發明之一實施例之一種製造用於拋光半導體基板之一軟性拋光墊之方法之操作之一流程圖。
圖5A繪示根據本發明之一實施例之一種用於拋光半導體基板之軟性拋光墊之製造之一截面圖,該圖對應於圖4之流程圖之操作402。
圖5B繪示根據本發明之一實施例之一種用於拋光半導體基板之軟性拋光墊之製造之一截面圖,該圖對應於圖4之流程圖之操作404。
圖5C繪示根據本發明之一實施例之一種用於拋光半導體基板之軟性拋光墊之製造之一截面圖,該圖再次對應於圖4之流程圖之操作404。
圖6A繪示根據本發明之一實施例之一種用於拋光半導體基板之軟性拋光墊之製造之一截面圖,該圖對應於圖4之流程圖之操作402。
圖6B繪示根據本發明之一實施例之一種用於拋光半導體基板之軟性拋光墊之製造之一截面圖,該圖對應於圖4之流程圖之操作404。
圖6C繪示根據本發明之一實施例之一種用於拋光半導體基板之軟性拋光墊之製造之一截面圖,該圖再次對應於圖4之流程圖之操作404。
圖7繪示根據本發明之一實施例之一種用於拋光半導體基板之軟性拋光墊之一截面圖,該軟性拋光墊包含一局部區域透明(LAT)區。
圖8繪示根據本發明之一實施例之一種軟性拋光墊之一部分之一斜視圖,該軟性拋光墊具有併入該軟性拋光墊中之一局部區域透明(LAT)區。
200...軟性拋光墊
202...模塑均質拋光本體
204...第一開槽表面
206...第二平坦表面
208...載體膜
210...第一壓敏黏合劑層
212...第二壓敏黏合劑層
214...釋離襯墊
Claims (28)
- 一種製造用於拋光半導體基板之軟性拋光墊之方法,該方法包括:混合預聚合物、主固化劑及不同於該主固化劑之次固化劑以形成混合物,其中該主固化劑係二胺化合物且該次固化劑係二醇化合物,其中混合該預聚合物、該主固化劑及該次固化劑以形成混合物包含混合莫耳比大約100份之該預聚合物、85份之該主固化劑及15份之該次固化劑;及固化該混合物以提供均質拋光本體,其包括熱固性、閉孔型聚胺基甲酸酯材料,該熱固性、閉孔型聚胺基甲酸酯材料具有大約在20蕭氏D至40蕭氏D之範圍內之硬度。
- 如請求項1之方法,其中該預聚合物包括聚胺基甲酸酯前驅物,且該主固化劑係芳香族二胺化合物。
- 如請求項2之方法,其中該聚胺基甲酸酯前驅物係異氰酸酯,及該次固化劑係聚四亞甲基二醇。
- 如請求項1之方法,其中固化該混合物包括在形成模具中部分固化以提供聚胺基甲酸酯材料;及在烤箱中進一步固化以提供包括該熱固性、閉孔型聚胺基甲酸酯材料之該均質拋光本體。
- 如請求項1之方法,其中該均質拋光本體包括第一開槽表面及與該第一開槽表面相對之第二平坦表面。
- 如請求項1之方法,其中該混合進一步包括將不透明潤 滑劑與該預聚合物、該主固化劑及該次固化劑混合,且其中該均質拋光本體係不透明。
- 如請求項4之方法,其進一步包括:在混合該預聚合物及該主固化劑及該次固化劑之前,在第二分開形成模具中混合芳香族胺基甲酸酯預聚合物與固化劑以形成第二混合物;在該第二形成模具中,部分固化該第二混合物以形成模塑凝膠;及將該模塑凝膠定位於該形成模具之指定區中,其中混合該預聚合物及該主固化劑及該次固化劑以形成該混合物包括將該混合物至少部分形成於該模塑凝膠周圍,及其中固化該混合物以提供該均質拋光本體進一步包括固化該模塑凝膠以提供局部區域透明(LAT)區,該局部區域透明區佈置於該均質拋光本體中且與該均質拋光本體共價鍵結。
- 如請求項7之方法,其中固化該混合物包括在該形成模具中部分固化以提供該聚胺基甲酸酯材料及提供LAT區前驅物;及在該烤箱中進一步固化以提供包括該熱固性、閉孔型聚胺基甲酸酯材料之該均質拋光本體及提供該LAT區。
- 如請求項7之方法,其中該芳香族胺基甲酸酯預聚合物包括聚四亞甲基二醇甲苯二異氰酸酯,及該固化劑包括硫醚芳香族二胺。
- 如請求項7之方法,其中該第二混合物之部分固化係單 獨利用熱能而執行。
- 如請求項1之方法,其中該預聚合物係聚四亞甲基二醇甲苯二異氰酸酯,該主固化劑係硫醚芳香族二胺,及該次固化劑係聚氧四亞甲基二醇。
- 如請求項1之方法,其中該混合物進一步包含催化劑。
- 一種用於拋光半導體基板之軟性拋光墊,該軟性拋光墊包括:均質拋光本體,其包括熱固性、閉孔型聚胺基甲酸酯材料,該熱固性、閉孔型聚胺基甲酸酯材料係由作為預聚合物之聚四亞甲基二醇甲苯二異氰酸酯、作為主固化劑之硫醚芳香族二胺及作為次固化劑之聚氧四亞甲基二醇製得,其中該預聚合物、該主固化劑及該次固化劑具有大約100份該預聚合物、85份該主固化劑及15份該次固化劑之莫耳比,該均質拋光本體具有大約在20蕭氏D至40蕭氏D之範圍內之硬度。
- 如請求項13之軟性拋光墊,其中該均質拋光本體包括第一開槽表面及與該第一開槽表面相對之第二平坦表面。
- 如請求項13之軟性拋光墊,其中該均質拋光本體包括不透明潤滑劑。
- 如請求項13之軟性拋光墊,其中所製得之該聚胺基甲酸酯材料係進一步由催化劑製得。
- 如請求項13之軟性拋光墊,其中該均質拋光本體係模塑均質拋光本體。
- 一種製造用於拋光半導體基板之軟性拋光墊之方法,該 方法包括:在形成模具中混合預聚合物、主固化劑及不同於該主固化劑之次固化劑以形成混合物,其中混合該預聚合物、該主固化劑及該次固化劑以形成該混合物包含混合莫耳比大約100份之該預聚合物、85份之該主固化劑及15份之該次固化劑;及固化該混合物以提供模塑均質拋光本體,其包括熱固性、閉孔型聚胺基甲酸酯材料,該熱固性、閉孔型聚胺基甲酸酯材料具有大約在20蕭氏D至45蕭氏D之範圍內之硬度。
- 如請求項18之方法,其中該預聚合物包含聚胺基甲酸酯前驅物,該主固化劑包含芳香族二胺化合物,及該次固化劑包含醚鍵聯。
- 如請求項19之方法,其中該聚胺基甲酸酯前驅物係異氰酸酯,該主固化劑係芳香族二胺,及該次固化劑係選自由以下組成之群:聚四亞甲基二醇、胺官能基乙二醇及胺官能基聚氧化丙烯。
- 如請求項18之方法,其中該混合進一步包括將不透明潤滑劑與該預聚合物、該主固化劑及該次固化劑混合,且其中該模塑均質拋光本體係不透明。
- 如請求項18之方法,其中該預聚合物係聚四亞甲基二醇甲苯二異氰酸酯,該主固化劑係硫醚芳香族二胺,及該次固化劑係聚氧四亞甲基二醇。
- 如請求項18之方法,其中該混合物進一步包含催化劑。
- 一種用於拋光半導體基板之軟性拋光墊,該軟性拋光墊包括:均質拋光本體,其包括熱固性、閉孔型聚胺基甲酸酯材料,該熱固性、閉孔型聚胺基甲酸酯材料係由聚胺基甲酸酯前驅物預聚合物、主固化劑及不同於該主固化劑之次固化劑製得,其中該主固化劑係二胺化合物且該次固化劑係二醇化合物,其中該聚胺基甲酸酯前驅物預聚合物、該主固化劑及該次固化劑具有大約100份該聚胺基甲酸酯前驅物預聚合物、85份該主固化劑及15份該次固化劑之莫耳比,該均質拋光本體具有大約在20蕭氏D至40蕭氏D之範圍內之硬度。
- 如請求項24之軟性拋光墊,其中該均質拋光本體包括第一開槽表面及與該第一開槽表面相對之第二平坦表面。
- 如請求項24之軟性拋光墊,其中該均質拋光本體包括不透明潤滑劑。
- 如請求項24之軟性拋光墊,其中所製得之該聚胺基甲酸酯材料係進一步由催化劑製得。
- 如請求項24之軟性拋光墊,其中該均質拋光本體係模塑均質拋光本體。
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-
2010
- 2010-07-08 US US12/832,908 patent/US9156124B2/en active Active
-
2011
- 2011-01-11 MY MYPI2013000052A patent/MY164313A/en unknown
- 2011-01-11 CN CN201180043031.XA patent/CN103097080B/zh active Active
- 2011-01-11 SG SG10201505004QA patent/SG10201505004QA/en unknown
- 2011-01-11 KR KR1020137001876A patent/KR20130048292A/ko not_active Application Discontinuation
- 2011-01-11 SG SG2013000336A patent/SG186908A1/en unknown
- 2011-01-11 WO PCT/US2011/020840 patent/WO2012005778A1/en active Application Filing
- 2011-01-11 JP JP2013518379A patent/JP6076900B2/ja active Active
- 2011-01-11 EP EP11700490.3A patent/EP2590782B1/en active Active
- 2011-01-13 TW TW105101581A patent/TWI587978B/zh active
- 2011-01-13 TW TW100101304A patent/TWI558501B/zh active
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2012
- 2012-12-31 IL IL224052A patent/IL224052A/en active IP Right Grant
-
2014
- 2014-12-29 JP JP2014267011A patent/JP2015062260A/ja active Pending
-
2015
- 2015-08-11 US US14/823,956 patent/US20150343595A1/en not_active Abandoned
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Also Published As
Publication number | Publication date |
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EP2590782A1 (en) | 2013-05-15 |
WO2012005778A1 (en) | 2012-01-12 |
MY164313A (en) | 2017-12-15 |
CN103097080B (zh) | 2016-10-05 |
SG186908A1 (en) | 2013-02-28 |
JP2015062260A (ja) | 2015-04-02 |
TW201201956A (en) | 2012-01-16 |
US9156124B2 (en) | 2015-10-13 |
US20150343595A1 (en) | 2015-12-03 |
JP2013535810A (ja) | 2013-09-12 |
JP6076900B2 (ja) | 2017-02-08 |
TWI587978B (zh) | 2017-06-21 |
US20120009855A1 (en) | 2012-01-12 |
TW201615343A (zh) | 2016-05-01 |
EP2590782B1 (en) | 2018-02-21 |
IL224052A (en) | 2017-05-29 |
KR20130048292A (ko) | 2013-05-09 |
CN103097080A (zh) | 2013-05-08 |
SG10201505004QA (en) | 2015-07-30 |
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