TWI494981B - 改進的微研磨方法 - Google Patents
改進的微研磨方法 Download PDFInfo
- Publication number
- TWI494981B TWI494981B TW102134178A TW102134178A TWI494981B TW I494981 B TWI494981 B TW I494981B TW 102134178 A TW102134178 A TW 102134178A TW 102134178 A TW102134178 A TW 102134178A TW I494981 B TWI494981 B TW I494981B
- Authority
- TW
- Taiwan
- Prior art keywords
- abrasive
- wafer
- grinding
- substrate
- plate
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/08—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for double side lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/10—Single-purpose machines or devices
- B24B7/16—Single-purpose machines or devices for grinding end-faces, e.g. of gauges, rollers, nuts, piston rings
- B24B7/17—Single-purpose machines or devices for grinding end-faces, e.g. of gauges, rollers, nuts, piston rings for simultaneously grinding opposite and parallel end faces, e.g. double disc grinders
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Polishing Bodies And Polishing Tools (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261707528P | 2012-09-28 | 2012-09-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201413809A TW201413809A (zh) | 2014-04-01 |
TWI494981B true TWI494981B (zh) | 2015-08-01 |
Family
ID=50385635
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW102134178A TWI494981B (zh) | 2012-09-28 | 2013-09-23 | 改進的微研磨方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US20140094094A1 (ja) |
JP (1) | JP6120974B2 (ja) |
KR (1) | KR20150056633A (ja) |
CN (1) | CN104813448A (ja) |
IN (1) | IN2015DN03023A (ja) |
RU (1) | RU2015114097A (ja) |
TW (1) | TWI494981B (ja) |
WO (1) | WO2014052130A1 (ja) |
Families Citing this family (29)
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---|---|---|---|---|
TWI553723B (zh) * | 2014-05-27 | 2016-10-11 | Crystalwise Technology | Sapphire wafer processing methods and their processing in the process of intermediates |
CN104015122A (zh) * | 2014-06-18 | 2014-09-03 | 蓝思科技股份有限公司 | 一种蓝宝石面板的双面铜盘研磨工艺 |
US20170069791A1 (en) * | 2015-09-08 | 2017-03-09 | Epistar Corporation | Light-emitting device and method of manufacturing thereof |
CN105290904B (zh) * | 2015-10-12 | 2017-08-18 | 中国建筑材料科学研究总院 | 消除光学玻璃亚表面裂纹的方法 |
JP6323515B2 (ja) * | 2016-08-31 | 2018-05-16 | 株式会社Sumco | 半導体ウェーハのラッピング方法および半導体ウェーハ |
JP7085323B2 (ja) * | 2017-08-03 | 2022-06-16 | 東洋鋼鈑株式会社 | 研磨用または研削用のキャリアおよびそれを用いた磁気ディスク用アルミ基板の製造方法 |
JP2019141974A (ja) * | 2018-02-22 | 2019-08-29 | 株式会社ミズホ | 両面ラップ盤とそれを用いた薄肉ファインセラミックスの研削方法 |
CN109012918B (zh) * | 2018-10-12 | 2024-01-12 | 河南先导机械力化学研究院有限公司 | 行星球磨机 |
CN111098224B (zh) * | 2018-10-26 | 2022-08-26 | 东莞新科技术研究开发有限公司 | 半导体基板及其表面研磨方法 |
US11342256B2 (en) | 2019-01-24 | 2022-05-24 | Applied Materials, Inc. | Method of fine redistribution interconnect formation for advanced packaging applications |
CN110018028B (zh) * | 2019-04-17 | 2023-01-13 | 宸鸿科技(厦门)有限公司 | 一种蓝宝石基材电子组件的金相切片样品制备方法 |
IT201900006736A1 (it) | 2019-05-10 | 2020-11-10 | Applied Materials Inc | Procedimenti di fabbricazione di package |
IT201900006740A1 (it) | 2019-05-10 | 2020-11-10 | Applied Materials Inc | Procedimenti di strutturazione di substrati |
US11931855B2 (en) | 2019-06-17 | 2024-03-19 | Applied Materials, Inc. | Planarization methods for packaging substrates |
JP7236970B2 (ja) * | 2019-09-23 | 2023-03-10 | 日本特殊陶業株式会社 | セラミックヒータ及びグロープラグ |
US11862546B2 (en) | 2019-11-27 | 2024-01-02 | Applied Materials, Inc. | Package core assembly and fabrication methods |
CN110900342B (zh) * | 2019-11-29 | 2020-12-08 | 上海磐盟电子材料有限公司 | 一种磨片机 |
US11257790B2 (en) | 2020-03-10 | 2022-02-22 | Applied Materials, Inc. | High connectivity device stacking |
US11454884B2 (en) | 2020-04-15 | 2022-09-27 | Applied Materials, Inc. | Fluoropolymer stamp fabrication method |
US11400545B2 (en) | 2020-05-11 | 2022-08-02 | Applied Materials, Inc. | Laser ablation for package fabrication |
CN111761505B (zh) * | 2020-07-10 | 2021-07-27 | 浙江中晶科技股份有限公司 | 一种硅片双面磨削设备及其生产工艺 |
US11232951B1 (en) | 2020-07-14 | 2022-01-25 | Applied Materials, Inc. | Method and apparatus for laser drilling blind vias |
US11676832B2 (en) | 2020-07-24 | 2023-06-13 | Applied Materials, Inc. | Laser ablation system for package fabrication |
US11521937B2 (en) | 2020-11-16 | 2022-12-06 | Applied Materials, Inc. | Package structures with built-in EMI shielding |
US11404318B2 (en) | 2020-11-20 | 2022-08-02 | Applied Materials, Inc. | Methods of forming through-silicon vias in substrates for advanced packaging |
JP7240013B2 (ja) * | 2021-03-19 | 2023-03-15 | 大昌精機株式会社 | 立型研削盤 |
US11705365B2 (en) | 2021-05-18 | 2023-07-18 | Applied Materials, Inc. | Methods of micro-via formation for advanced packaging |
CN115070512B (zh) * | 2022-03-11 | 2024-04-26 | 北京爱瑞思光学仪器有限公司 | 一种锗晶片的双抛工艺、装置及锗晶片 |
CN114800109A (zh) * | 2022-06-27 | 2022-07-29 | 苏州博宏源机械制造有限公司 | 双面抛光机及其抛光方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100323585A1 (en) * | 2009-06-17 | 2010-12-23 | Siltronic Ag | Method For Chemically Grinding A Semiconductor Wafer On Both Sides |
US20100330881A1 (en) * | 2009-06-24 | 2010-12-30 | Siltronic Ag | Method For The Double Sided Polishing Of A Semiconductor Wafer |
US20110244762A1 (en) * | 2010-03-31 | 2011-10-06 | Siltronic Ag | Method for the double-side polishing of a semiconductor wafer |
US20120071064A1 (en) * | 2009-06-04 | 2012-03-22 | Sumco Corporation | Fixed abrasive-grain processing device, method of fixed abrasive-grain processing, and method for producing semiconductor wafer |
Family Cites Families (26)
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US4593495A (en) * | 1983-11-25 | 1986-06-10 | Toshiba Machine Co., Ltd. | Polishing machine |
US4974370A (en) * | 1988-12-07 | 1990-12-04 | General Signal Corp. | Lapping and polishing machine |
DE3929484A1 (de) * | 1989-09-05 | 1991-03-14 | Wacker Chemitronic | Verfahren zum zweiseitigen chemomechanischen polieren von halbleiterscheiben, sowie vorrichtung zu seiner durchfuehrung und dadurch erhaeltliche halbleiterscheiben |
JPH04261768A (ja) * | 1991-02-18 | 1992-09-17 | Toshiba Corp | 両面ラップ加工装置 |
JPH0592363A (ja) * | 1991-02-20 | 1993-04-16 | Hitachi Ltd | 基板の両面同時研磨加工方法と加工装置及びそれを用いた磁気デイスク基板の研磨加工方法と磁気デイスクの製造方法並びに磁気デイスク |
US6099394A (en) * | 1998-02-10 | 2000-08-08 | Rodel Holdings, Inc. | Polishing system having a multi-phase polishing substrate and methods relating thereto |
US5389579A (en) * | 1993-04-05 | 1995-02-14 | Motorola, Inc. | Method for single sided polishing of a semiconductor wafer |
US5595529A (en) * | 1994-03-28 | 1997-01-21 | Speedfam Corporation | Dual column abrading machine |
US5643405A (en) * | 1995-07-31 | 1997-07-01 | Motorola, Inc. | Method for polishing a semiconductor substrate |
JPH10166259A (ja) * | 1996-12-12 | 1998-06-23 | Okamoto Kosaku Kikai Seisakusho:Kk | サファイア基板研削研磨方法および装置 |
US5873772A (en) * | 1997-04-10 | 1999-02-23 | Komatsu Electronic Metals Co., Ltd. | Method for polishing the top and bottom of a semiconductor wafer simultaneously |
JP2984263B1 (ja) * | 1998-10-23 | 1999-11-29 | システム精工株式会社 | 研磨方法および研磨装置 |
US6746309B2 (en) * | 1999-05-27 | 2004-06-08 | Sanyo Electric Co., Ltd. | Method of fabricating a semiconductor device |
JP3791302B2 (ja) * | 2000-05-31 | 2006-06-28 | 株式会社Sumco | 両面研磨装置を用いた半導体ウェーハの研磨方法 |
JP2003145412A (ja) * | 2001-08-27 | 2003-05-20 | Nippon Sheet Glass Co Ltd | 情報記録媒体用ガラス基板の研磨方法及び情報記録媒体用ガラス基板 |
JP3935757B2 (ja) * | 2002-03-28 | 2007-06-27 | 信越半導体株式会社 | ウエーハの両面研磨装置及び両面研磨方法 |
CN100380600C (zh) * | 2002-03-28 | 2008-04-09 | 信越半导体株式会社 | 晶片的两面研磨装置及两面研磨方法 |
JP2004200526A (ja) * | 2002-12-20 | 2004-07-15 | Hitachi Cable Ltd | 半導体ウェハ研削装置及び研削方法 |
US20040176017A1 (en) * | 2003-02-25 | 2004-09-09 | Aleksander Zelenski | Apparatus and methods for abrading a work piece |
KR100550491B1 (ko) * | 2003-05-06 | 2006-02-09 | 스미토모덴키고교가부시키가이샤 | 질화물 반도체 기판 및 질화물 반도체 기판의 가공 방법 |
JP4198607B2 (ja) * | 2004-01-13 | 2008-12-17 | Hoya株式会社 | 磁気ディスク用ガラス基板の製造方法及び磁気ディスクの製造方法 |
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JP4818613B2 (ja) * | 2005-01-19 | 2011-11-16 | アイオン株式会社 | 両面平面研磨装置 |
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-
2013
- 2013-09-18 CN CN201380058733.4A patent/CN104813448A/zh active Pending
- 2013-09-18 JP JP2015534558A patent/JP6120974B2/ja active Active
- 2013-09-18 KR KR1020157009892A patent/KR20150056633A/ko active Search and Examination
- 2013-09-18 US US14/030,843 patent/US20140094094A1/en not_active Abandoned
- 2013-09-18 RU RU2015114097A patent/RU2015114097A/ru not_active Application Discontinuation
- 2013-09-18 IN IN3023DEN2015 patent/IN2015DN03023A/en unknown
- 2013-09-18 WO PCT/US2013/060442 patent/WO2014052130A1/en active Application Filing
- 2013-09-23 TW TW102134178A patent/TWI494981B/zh not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20120071064A1 (en) * | 2009-06-04 | 2012-03-22 | Sumco Corporation | Fixed abrasive-grain processing device, method of fixed abrasive-grain processing, and method for producing semiconductor wafer |
US20100323585A1 (en) * | 2009-06-17 | 2010-12-23 | Siltronic Ag | Method For Chemically Grinding A Semiconductor Wafer On Both Sides |
US20100330881A1 (en) * | 2009-06-24 | 2010-12-30 | Siltronic Ag | Method For The Double Sided Polishing Of A Semiconductor Wafer |
US20110244762A1 (en) * | 2010-03-31 | 2011-10-06 | Siltronic Ag | Method for the double-side polishing of a semiconductor wafer |
Also Published As
Publication number | Publication date |
---|---|
KR20150056633A (ko) | 2015-05-26 |
WO2014052130A1 (en) | 2014-04-03 |
US20140094094A1 (en) | 2014-04-03 |
JP6120974B2 (ja) | 2017-04-26 |
IN2015DN03023A (ja) | 2015-10-02 |
TW201413809A (zh) | 2014-04-01 |
RU2015114097A (ru) | 2016-11-20 |
JP2015531318A (ja) | 2015-11-02 |
CN104813448A (zh) | 2015-07-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |