TWI491451B - A substrate heating apparatus, a liquid material coating apparatus provided with the apparatus, and a substrate heating method - Google Patents

A substrate heating apparatus, a liquid material coating apparatus provided with the apparatus, and a substrate heating method Download PDF

Info

Publication number
TWI491451B
TWI491451B TW098122529A TW98122529A TWI491451B TW I491451 B TWI491451 B TW I491451B TW 098122529 A TW098122529 A TW 098122529A TW 98122529 A TW98122529 A TW 98122529A TW I491451 B TWI491451 B TW I491451B
Authority
TW
Taiwan
Prior art keywords
substrate
heating
opening
contact
gas
Prior art date
Application number
TW098122529A
Other languages
English (en)
Chinese (zh)
Other versions
TW201006568A (en
Inventor
Kazumasa Ikushima
Original Assignee
Musashi Engineering Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Musashi Engineering Inc filed Critical Musashi Engineering Inc
Publication of TW201006568A publication Critical patent/TW201006568A/zh
Application granted granted Critical
Publication of TWI491451B publication Critical patent/TWI491451B/zh

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • H01L21/563Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/741Apparatus for manufacturing means for bonding, e.g. connectors
    • H01L24/743Apparatus for manufacturing layer connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01004Beryllium [Be]

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Coating Apparatus (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
TW098122529A 2008-07-04 2009-07-03 A substrate heating apparatus, a liquid material coating apparatus provided with the apparatus, and a substrate heating method TWI491451B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008176071A JP5465846B2 (ja) 2008-07-04 2008-07-04 基板加熱装置、それを備える液体材料塗布装置および基板加熱方法

Publications (2)

Publication Number Publication Date
TW201006568A TW201006568A (en) 2010-02-16
TWI491451B true TWI491451B (zh) 2015-07-11

Family

ID=41465715

Family Applications (1)

Application Number Title Priority Date Filing Date
TW098122529A TWI491451B (zh) 2008-07-04 2009-07-03 A substrate heating apparatus, a liquid material coating apparatus provided with the apparatus, and a substrate heating method

Country Status (6)

Country Link
JP (1) JP5465846B2 (xx)
KR (1) KR101568238B1 (xx)
CN (1) CN102077333B (xx)
HK (1) HK1154118A1 (xx)
TW (1) TWI491451B (xx)
WO (1) WO2010001608A1 (xx)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9029740B2 (en) * 2013-01-15 2015-05-12 Nordson Corporation Air impingement heater
US11426750B2 (en) 2016-10-07 2022-08-30 Musashi Engineering, Inc. Liquid material discharge device with temperature control device, application device for same, and application method
WO2023082170A1 (en) * 2021-11-12 2023-05-19 Illinois Tool Works Inc. Multi-pattern tooling plate
CN116504686B (zh) * 2023-06-28 2023-10-20 北京中科科美科技股份有限公司 一种基于液态均匀温控的半导体加热盘

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11224889A (ja) * 1998-02-06 1999-08-17 Matsushita Electric Ind Co Ltd 電子部品共晶ボンディング用ヒートブロック
JP2001250835A (ja) * 2000-03-07 2001-09-14 Matsushita Electric Ind Co Ltd 電子部品実装装置用の板状ワーク加熱装置
JP2006314861A (ja) * 2005-05-10 2006-11-24 Matsushita Electric Ind Co Ltd 基板加熱装置および基板加熱方法ならびに液状物質の塗布装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3399367B2 (ja) 1998-06-26 2003-04-21 松下電器産業株式会社 ワークの熱圧着装置
JP3223283B2 (ja) * 1999-09-14 2001-10-29 カシオ計算機株式会社 半導体装置の製造方法
JP3935303B2 (ja) 2000-03-17 2007-06-20 東京エレクトロン株式会社 加熱処理装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11224889A (ja) * 1998-02-06 1999-08-17 Matsushita Electric Ind Co Ltd 電子部品共晶ボンディング用ヒートブロック
JP2001250835A (ja) * 2000-03-07 2001-09-14 Matsushita Electric Ind Co Ltd 電子部品実装装置用の板状ワーク加熱装置
JP2006314861A (ja) * 2005-05-10 2006-11-24 Matsushita Electric Ind Co Ltd 基板加熱装置および基板加熱方法ならびに液状物質の塗布装置

Also Published As

Publication number Publication date
JP2010016252A (ja) 2010-01-21
WO2010001608A1 (ja) 2010-01-07
HK1154118A1 (en) 2012-04-20
TW201006568A (en) 2010-02-16
JP5465846B2 (ja) 2014-04-09
KR101568238B1 (ko) 2015-11-20
KR20110039300A (ko) 2011-04-15
CN102077333A (zh) 2011-05-25
CN102077333B (zh) 2013-12-11

Similar Documents

Publication Publication Date Title
JP5752639B2 (ja) 接合システム、接合方法、プログラム及びコンピュータ記憶媒体
JP5421967B2 (ja) 接合方法、プログラム、コンピュータ記憶媒体及び接合システム
KR102358962B1 (ko) 반도체 제조 장치
WO2006001279A1 (ja) Icチップ実装体の製造装置
TWI491451B (zh) A substrate heating apparatus, a liquid material coating apparatus provided with the apparatus, and a substrate heating method
JP5314607B2 (ja) 接合装置、接合方法、プログラム及びコンピュータ記憶媒体
TWI540661B (zh) 接合方法、電腦記憶媒體及接合系統
JP2014231185A (ja) 樹脂モールド装置および樹脂モールド方法
JP5528405B2 (ja) 接合方法、プログラム、コンピュータ記憶媒体及び接合システム
CN108525941B (zh) 涂覆装置以及涂覆方法
TW202203334A (zh) 物品的製造裝置、物品的製造方法、及記錄媒體
JP5221508B2 (ja) 基板処理装置
JP6055387B2 (ja) 接合方法、プログラム、コンピュータ記憶媒体及び接合システム
JP6284816B2 (ja) 基板処理システム、基板処理方法、プログラム及びコンピュータ記憶媒体
TW202249128A (zh) 樹脂密封裝置以及樹脂密封方法
TWI423359B (zh) 半導體安裝裝置及半導體安裝方法
JP7109244B2 (ja) 粘着テープ搬送方法および粘着テープ搬送装置
JP7149238B2 (ja) 樹脂成形装置及び樹脂成形品の製造方法
JP3314659B2 (ja) チップのボンディング装置
JP3949035B2 (ja) ダイボンド装置
TW202312291A (zh) 半導體裝置的製造方法、工件一體化裝置、薄膜積層體及半導體裝置
JP2016157718A (ja) ウエーハの搬送方法及びウエーハの搬送機構
KR20240140843A (ko) Fpcb 접합 장치
JP2023170999A (ja) 圧縮成形装置及び圧縮成形方法
WO2016152661A1 (ja) ボンディングツール冷却装置およびこれを備えたボンディング装置ならびにボンディングツール冷却方法