TWI483389B - 受光裝置 - Google Patents
受光裝置 Download PDFInfo
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- TWI483389B TWI483389B TW095103686A TW95103686A TWI483389B TW I483389 B TWI483389 B TW I483389B TW 095103686 A TW095103686 A TW 095103686A TW 95103686 A TW95103686 A TW 95103686A TW I483389 B TWI483389 B TW I483389B
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- Taiwan
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- group
- receiving device
- receiving element
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- GKASDNZWUGIAMG-UHFFFAOYSA-N triethyl orthoformate Chemical compound CCOC(OCC)OCC GKASDNZWUGIAMG-UHFFFAOYSA-N 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/10—Containers; Seals characterised by the material or arrangement of seals between parts, e.g. between cap and base of the container or between leads and walls of the container
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3157—Partial encapsulation or coating
- H01L23/3192—Multilayer coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14618—Containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
- H01L27/14627—Microlenses
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Description
本發明係關於受光裝置,其具備:設有受光元件之基板、密閉構件以及透明蓋。
在受光裝置中,受光元件部由於必需將進來之光正確捕捉,有必要與外部大氣(如濕氣等)隔離。在此,一般在受光元件部之上部設有玻璃板等透明蓋,而受光元件部係藉以下所述之方法與外部大氣隔離。
與外部隔離以保護受光元件之方法係除了用樹脂來填埋受光元件區域以隔絕外來之濕氣等之方法之外,已知一種使受光元件區域之上部形成未填有樹脂之中空構造後,用樹脂來圍繞受光元件區域之周圍,以隔絕外來之濕氣等之方法(專利文獻1及2)。在此,上述樹脂係使用環氧樹脂等。
專利文獻1:日本專利特開2004-31939號公報專利文獻2:日本專利特開2002-329852號公報
然而,在使用環氧樹脂來形成一種使受光元件與外部隔絕之構造之受光元件之情況,有因環氧樹脂吸濕而發生水分侵入受光元件部分之事態。因此,於受光元件表面發生模糊而造成受光率之經時劣質化。
本發明乃鑒於上述實情所創之發明,旨在提供一種難於吸收外部之水分且受光率之經時劣質化少之受光裝置。依照本發明,提供一種受光裝置,其具備:基板、設在上述基板之一面上之受光元件、設在前述基板之該面上部之透明蓋子、及在上述基板與上述透明蓋之間,至少設在上述受光元件之周圍部分,以使上述受光元件對外部密閉之密閉構件;上述密閉構件為含有環狀烯烴樹脂者。
本發明之受光元件由於使用一含有低吸濕性環狀烯烴樹脂之密閉構件,故可有效抑制水分侵入受光元件部分。藉此,可提供受光率之經時劣質化少之受光裝置。
上述之目的、其他目的、特徵及優點係參照以下所述之較佳實施形態及所附帶之圖式即可進一步明瞭。
以下,將應用於形態不同之CMOS影像感測器之例子舉出,以說明本發明之受光裝置。又按,本發明之受光裝置並未受到此等例子之限制,其在CMOS影像感測器以外,亦包含如CCD等各種實施形態。CMOS影像感測器形成於支持體上,包含受光元件。支持體1為包含構成其他影像感測器之複數積體電路之矽晶片。
圖1展示本實施形態之受光元件之概略構造之圖。此受光元件具備:基板1、設在基板1之一面上之受光元件2、設在該面上部之透明蓋6、以可填充基板1與透明蓋6之間隙之方式被設置以使受光元件2對外部密閉之密閉構件5。密閉構件5係由含有環狀烯烴樹脂之材料所構成。
支持體1上之受光元件2為由光電區域4與微型透鏡3所構成之像素感測器之二次元排列,此為具有標準結構之物亦可。其影像感測器可表現之影像解析度係取決於該像素感測器之尺寸及數量,其排列通常每行或每列含有數百個或數千個像素感測器。
在光電區域4上形成微型透鏡3之排列。各微型透鏡3係與各光電區域4相對應排列。此等微型透鏡3之形成係例如將折射率1.3~2.0之透明樹脂(包含光阻)所構成之層藉光蝕刻法等按指定形狀區劃後,施行熱處理以使各區劃之透明樹脂熔融,利用表面張力以使角部去角,然後予以冷卻等,即可形成圓筒形之透鏡。此等微型透鏡3通常具有約2~6 μ m之寬度及約1~2 μ m之高度。此等受光元件以可與密閉構件5接觸而被填埋之方式在其周圍被覆有密閉構件5。在密閉構件5之上方設有透明蓋6。光乃從此透明蓋6之上方經由密閉構件5到達受光元件。
密閉構件5含有環狀烯烴樹脂,藉以得到難於吸收外部濕氣、受光率之劣質化少、製造安定性優異等效果。使環狀烯烴樹脂均勻存在於密閉構件5全體或呈局部存在於密閉構件5之一部分之狀態均可。較佳的是環狀烯烴樹脂被使用以充當密閉構件5之主成分。
其次,說明上述受光裝置之製造方法。對於形成有與各受光區域相對應而配置之微型透鏡3之受光元件,且在微型透鏡區域以外之區域形成有表面電極之半導體基板,進行塗佈使用旋塗器以將所製備之含有具環氧基之環狀烯烴樹脂及交聯劑之樹脂組成物,予以乾燥而得到塗膜。然後,將透明蓋載置於此塗膜上,按50℃至250℃之溫度加熱全體以使接合。如此得到如圖1所示之受光裝置。
在以往之情形,有時使用環氧樹脂以代替擁有環氧基之環狀烯烴樹脂以作為上述密封構件5,但在以可與環氧樹脂直接接觸而被填埋之方式保護受光元件之情況,由於受光元件與環氧樹脂之折射率差異小,而有造成其失去聚光功能之問題。再者,在長時間使用之情況,受光元件上之環氧樹脂因光等而劣質化,有造成受光元件之受光率降低之問題。
在本發明中,由於使用擁有環氧基之環狀烯烴樹脂以充當密閉構件,有可能大幅抑制此種樹脂之劣質化,又,由於可適度確保受光元件與上述樹脂之折射率差異,有可能繼續維持聚光功能。
圖2展示本實施形態之受光元件之概略構造之圖。此受光元件具備:基板1、設在基板1之一面上之受光元件2、及設在該面上部之透明蓋6。在基板1與透明蓋6之間設有由含有環狀烯烴樹脂之材料所構成之密閉構件5。密閉構件5係以圍繞受光元件2之方式,設置在與受光元件2隔開之位置,在基板1與透明蓋6接合之同,其內側形成中空部分。密封構件5係由含有環狀烯烴樹脂之材料所構成。
密閉構件5係用以形成設在透明蓋6與受光元件2之間之中空構造而充當一種間隔物(隔牆)的作用。密閉構件5與透明蓋6亦可以如圖3所示,藉由黏附劑(adhesive)接合。密閉構件5為由擁有環氧基之環狀烯烴樹脂所構成,較佳的是由擁有環氧基之感光性環狀烯烴樹脂所構成。由於被賦予感光性而具有:作業性被改善、位置精度高、尺寸上之高度均勻性優異之優點。又,由於密閉構件5包含擁有環氧基之環狀烯烴樹脂,難於吸收外部濕氣,因此可得到透明蓋6難於發生模糊等之效果。
其次,說明上述受光裝置之製造方法。
將擁有環氧基之感光性環狀烯烴樹脂組成物使用旋塗器予以塗佈於設有微型透鏡3之半導體基板上之後,用熱板予以加熱、乾燥而得到塗膜。對此塗膜之形成隔牆部分施行曝光,然後,在熱板上按50℃~180℃之溫度加熱數分鐘,以促進交聯反應。其次,在顯影液中浸漬30秒左右,以將未曝光部溶化除去。
然後,將透明蓋載置於此塗膜上,按50℃至250℃之溫度加熱全體以使接合。或者,將此塗膜在50℃至250℃之溫度下加熱後,將黏附劑塗佈於此塗膜上,載置透明蓋,並使接合。其結果係以圍繞受光元件區域之方式實現隔牆之成形,而製成一種在微型透鏡3上無殘渣之受光裝置。
圖3及圖4展示本實施形態之受光元件之概略構造之圖。圖4展示屬於本發明擁有中空構造之如圖3所示受光裝置之一的晶片級CSP(Chip Size Package)構造之CMOS影像感測器之剖面圖。
本實施形態之受光裝置係以可圍繞受光元件2之方式配置有密閉構件5,以使基板1與透明蓋6接合之同時,在其內側形成中空部分。密閉構件5之上部係呈平坦形狀,必要時在其頂面藉由黏附劑7設置透明蓋。密閉構件5高於微型透鏡3,而在透明蓋6被設在密閉構件5之頂面上之情況,微型透鏡3與透明蓋6之間則形成空氣間隙。此密閉構件5具有約5~40 μ m之高度及約100~1000 μ m之寬度。然而,密閉構件5之形狀亦可依照像素感測器之大小或微型透鏡3之高度等之各種因素而大不相同。
在形成密閉構件5後,藉加熱而黏貼透明蓋6。此際,依照需要使用黏附劑7亦可。將熱硬化型黏附劑7塗佈於密閉構件5之頂面上。將黏附劑7藉網板印刷等選擇性塗佈於密閉構件5,將透明蓋6載置於密閉構件5上,藉熱處理使黏附劑7硬化。在本發明之形態中,由於設置一具有指定高度之密閉構件5而使屬於支持體1之晶片10與透明蓋6黏貼在一起,可使晶片10與透明蓋6之間隔一定,位置之對準亦容易實現。此黏附步驟最好能在真空中或在惰性氣體(如氮氣等)環境中實施。
在使透明蓋6黏附於密閉構件5之頂面上之後,例如使用在殼箱方式CSP所用之電器引線之形成方法來形成佈線,按受光元件單位予以切斷,以分離為各個受光裝置,可得到如圖4所示之以CSP所構成之受光裝置。在圖4所示之受光裝置中,為透明蓋6使用玻璃基板。在CSP由於在電極墊11接合之引線13延伸至晶方背面,而有可能在背面形成佈線,與藉焊線接合法接合半導體晶片之封裝體相比,可大幅減少佈線空間。再者,若使用此項方法,則從半導體元件之形成起直至封裝體化為止之全製程可在晶片狀態下進行,因此,與習知之受光裝置相比,可大幅降低製造成本。
此外,由於在製造受光裝置之際先與透明蓋黏貼後,再予以分割為元件單位,在切片時受光元件表面不會被污染而可確保可靠性。
以上,已說明本發明之實施形態。以下,說明關於本發明之密閉構件所使用之環狀烯烴樹脂。
作為本發明使用之環狀烯烴單體,一般可舉出如環己烯、環辛烯等之單環物,如降烯、降二烯、二環戊二烯、二氫二環戊二烯、四環十二碳烯、三環戊二烯、二氫三環戊二烯、四環戊二烯、二氫四環戊二烯等之多環物。亦可以使用由此等單體結合官能基而成之取代物。
為本發明使用之環狀烯烴樹脂,可舉出上述環狀烯烴單體之聚合物。又按,聚合方法可使用無視聚合、嵌段聚合等之習知方法。關於具體例子,係有降烯型單體之(共)聚合物、降烯型單體與聚合之其他單體(如α-烯烴)等之共聚物及此等共聚物之氫化物等。此等環狀烯烴有可能利用習知之聚合法來製造,其聚合方法包括加成聚合法及開環聚合法。其中,以降烯單體之加成(共)聚合所得之聚合物較佳,但本發明並未受到此項聚合物之任何限制。在本發明之密閉構件使用降烯樹脂之情況,在受光裝置之製造時可實現更高精度之圖案化等,具有製造安定性優異之益處。
作為環狀烯烴樹脂之加成聚合物,可舉出(1)由降烯型單體之加成(共)聚合所得之降烯型單體之加成(共)聚合物,(2)降烯型單體與乙烯或α-烯烴類之加成共聚物,(3)降烯型單體與非共軛二烯以及必要時使用之其他單體之加成共聚物。此等樹脂係可利用所有習知之聚合方法而得到。
環狀烯烴樹脂之開環聚合物係可舉出(4)降烯型單體之開環(共)聚合物及必要時使該(共)聚合物氫化而得到之樹脂,(5)降型單體與乙烯或α-烯烴類之開環共聚物及必要時使該(共)聚合物氫化而得到之樹脂,(6)降烯型單體與非共軛二烯或其他單體之開環共聚物以及必要時使該(共)聚合物氫化而得到之樹脂。此等樹脂係利用所有習知之聚合方法即可得到。
在上述中,以(1)由降烯型單體之加成(共)聚合所得之加成(共)聚合物較佳,但本發明並未受到此項聚合物上之任何限制。
本發明使用之環狀烯烴樹脂最好能含有反應性官能基。反應性官能基之具體例子為環氧基(如縮水甘油醚基等)、氧化環丁烷基、羧基、羥基、不飽和鍵、胺基等。尤其以環氧基特別合適。
本發明使用之具有環氧基之環狀烯烴樹脂在一般係由分子內含有環氧基之單體之直接聚合即可得到,亦可利用一種在聚合後藉改質反應將環氧基導入側鏈之方法,以得到相同之聚合物。改質反應包括下述習知方法:對上述聚合物使含環氧基不飽和單體發生接枝反應;使含環氧基化合物起反應於上述聚合物之反應性官能基部位;使用如過酸、氫過氧化物等之環氧化劑以使在分子內擁有碳-碳雙鍵之上述聚合物直接環氧化等。
環狀烯烴樹脂之加成聚合物係利用藉金屬觸媒之配位聚合或利用自由基聚合即可得到者。其中,關於配位聚合,使單體在過渡金屬觸媒之存在下,在溶液中聚合即可得到聚合物(NiCOLE R.GROVE et al.Journal of Polymer Science:part B,Polymer Physics,Vol.37,3003-3010(19999))。
作為配位聚合用之金屬觸媒,具有代表性之鎳觸媒及鉑觸媒係在PCT WO 9733198及PCT WO 00/20472中有所敘述。配位聚合用之金屬觸媒之例子係可舉出(甲苯)雙(全氟苯基)鎳、(亞甲基)雙(全氟苯基)鎳、(苯)雙(全氟苯基)鎳、雙(四氫)雙(全氟苯基)鎳、雙(乙基乙酸酯)雙(全氟苯基)鎳、雙(二烷)雙(全氟苯基)鎳等之習知金屬觸媒。
關於自由基聚合技術,在Encyclopedia of Polymer Science,John Wiley & Sons,13,708(1988)中有所敘述。
一般而言,自由基聚合係在自由基引發劑之存在下,將溫度提高至50℃~150℃,以使單體在溶液中進行反應。自由基引發劑為如偶氮雙異丁腈(AIBN)、過氧化苯甲醯基、過氧化月桂基、偶氮雙異己腈、偶氮雙異戊腈、第三丁過氧化氫等。
環狀烯烴樹脂之開環聚合物係依照習知之開環聚合法,在鈦或鎢化合物為觸煤之下,使至少一種降烯型單體進行開環(共)聚合以製造開環(共)聚合物,其次,在必要時依照平常之氫化法使上述開環(共)聚合物中之碳-碳雙鍵氫化以製造熱塑性飽和降烯樹脂而得到。
上述聚合系之適當聚合溶媒包括烴熔媒及芳香族溶媒。烴溶媒之例子為戊烷、己烷、庚烷、環己烷等,但不受到此等例子之限制。芳香族溶媒之例子為苯、甲苯、二甲苯、1,3,5-三甲苯等,但不受到此等例子之限制。亦可以使用二乙醚、四氫呋喃、乙酸乙酯、酯(類)、內酯(類)、酮(類)、或醯胺(類)。此等溶劑可單獨或混合使用以充當聚合溶媒。
本發明之環狀烯烴樹脂之分子量可利用引發劑與單體之比率之改變或聚合時間之改變來控制。在採用上述配位聚合之情況,如美國專利第6,136,499號所揭示,使用鏈轉移觸媒來控制分子量。在本發明中,乙烯、丙烯、1-己烯、1-癸烯、4-甲基-1-戊烯等之α-烯烴適於控制分子量。
在本發明中,重量平均分子量為10,000~500,000,以80,000~200,000較佳,而以100,000~125,000更佳。重量平均分子量可在使用標準聚降烯之下利用膠體層析法(GPC)來測定。(根據ASTMDS3536-91)
為了製造本發明所用之具有環氧基之環狀烯烴樹脂而使用之環狀烯烴單體係以通式(7)所示之降烯型單體較佳。
烷基之具體例子可舉出甲基、乙基、丙基、異丙基、丁基、戊基、己基、庚基、辛基、壬基、癸基、十二基、環戊基、環己基、環辛基等,烯基之具體例子可舉出乙烯基、烯丙基、丁烯基、環己基等,炔基之具體例子可舉出乙炔基、1-丙炔基、2-丙炔基、1-丁炔基、2-丁炔基等,芳基之具體例子可舉出苯基、萘基、蒽基等,而芳烷基之具體例子可舉出苄基、苯乙基等,但本發明並未受到此等具體例子之任何限制。
關於含有酯基之官能基、含有酮基之官能基及含有醚基之官能基,若屬於擁有此等基之官能基,則未特別在構造上受到限制。含有環氧基之官能基之較佳例子可舉出擁有縮水甘油醚基之官能基,不過若屬於擁有環氧基之官能基,則未特別在構造上受到限制。
為了製造本發明所用環狀烯烴樹脂而使用之環狀烯烴單體,例如,擁有烷基者可舉出5-甲基-2-降烯、5-乙基-2-降烯、5-丙基-2-降烯、5-丁基-2-降烯、5-戊基-2-降烯、5-己基-2-降烯、5-庚基-2-降烯、5-辛基-2-降烯、5-壬基-2-降烯、5-癸基-2-降烯等,擁有烯基者可舉出5-烯丙基-2-降烯、5-偏甲基-2-降烯、5-偏乙基-2-降烯、5-偏異丙基-2-降烯、5-(2-丙烯)-2-降烯、5-(3-丁烯)-2-降烯、5-(1-甲基-2-丙烯)-2-降烯、5-(4-戊烯)-2-降烯、5-(1-甲基-3-丁烯)-2-降烯、5-(5-己烯)-2-降烯、5-(1-甲基-4-丁烯)-2-降烯、5-(2,3-二甲-3-丁烯)-2-降烯、5-(2-乙基-3-丁烯)-2-降烯、5-(3,4-二甲-4-戊烯)-2-降烯、5-(7-辛烯)-2-降烯、5-(2-甲基-6-庚烯)-2-降烯、5-(1,2-二甲-己烯)-2-降烯、5-(5-乙基-5-己烯)-2-降烯、5-(1,2,3-三甲-4-戊烯)-2-降烯等,擁有炔基者可舉出5-乙炔基-2-降烯等,擁有烷氧矽烷基者可舉出二甲雙((5-降烯-2-基)甲氧)矽烷等,擁有矽烷基者可舉出1,1,3,3,5,5-六甲-1,5-二甲雙(2-(5-降烯-2-基)乙基)三矽氧烷等,擁有芳基者可舉出5-苯基-2-降烯、5-萘基-2-降烯、5-五氟苯-2-降烯等,擁有芳烷基者可舉出5-苄基-2-降烯、5-苯乙-2-降烯、5-五氟苯甲烷-2-降烯、5-(2-五氟苯乙)-2-降烯、5-(3-五氟苯丙)-2-降烯等,擁有烷氧矽烷基者可舉出5-三甲氧矽烷-2-降烯、5-三乙氧矽烷-2-降烯、5-(2-三甲氧矽烷乙)-2-降烯、5-(2-三乙氧矽烷乙)-2-降烯、5-(3-三甲氧丙)-2-降烯、5-(4-三甲氧丁)-2-降烯、5-三甲矽烷甲醚-2-降烯等,擁有羥基、醚基、羧基、酯基、丙烯醯基、或甲基丙烯醯基者可舉出5-降烯-2-甲醇及其烷基醚、乙酸5-降烯-2-甲酯、丙酸5-降烯-2-甲酯、丁酸5-降烯-2-甲酯、戊酸5-降烯-2-甲酯、己酸5-降烯-2-甲酯、辛酸5-降烯-2-甲酯、癸酸5-降烯-2-甲酯、月桂酸5-降烯-2-甲酯、硬脂酸5-降烯-2-甲酯、油酸5-降烯-2-甲酯、9,12,15-十八碳三烯酸5-降烯-2-甲酯、5-降烯-2-羧酸、5-降烯-2-羧酸甲酯、5-降烯-2-羧酸乙酯、5-降烯-2-羧酸第三丁酯、5-降烯-2-羧酸異丁酯、5-降烯-2-羧酸三甲矽烷酯、5-降烯-2-羧酸三乙矽烷酯、5-降烯-2-羧酸異酯、5-降烯-2-羧酸2-羥乙酯、5-降烯-2-甲基-2-羧酸甲酯、桂皮酸5-降烯-2-甲酯、碳酸5-降烯-2-甲基乙酯、碳酸5-降烯-2-甲基正丁酯、碳酸5-降烯-2-甲基第三丁酯、5-甲氧-2-降烯、(甲基)丙烯酸5-降烯-2-甲酯、(甲基)丙烯酸5-降烯-2-乙酯、(甲基)丙烯酸5-降烯-2-正丁酯、(甲基)丙烯酸5-降烯-2-正丙酯、(甲基)丙烯酸5-降烯-2-異丁酯、(甲基)丙烯酸5-降烯-2-異丙酯、(甲基)丙烯酸5-降烯-2-己酯、(甲基)丙烯酸5-降烯-2-辛酯、(甲基)丙烯酸5-降烯-2-癸酯等,擁有環氧基者可舉出5-[2,3-環氧丙氧]甲基]-2-降烯等,再者,由四環所構成者可舉出8-甲氧羰四環[4.4.012 , 5
.17 , 1 0
]十二碳-3-烯、8-乙氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-正丙羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-異丙羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-正丁氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-(2-甲基丙氧)羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8(1-甲基丙氧)羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-第三丁氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-環己氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-(4’-第三丁環己氧)羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-苯氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-四氫呋喃氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-四氫哌喃氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-甲基-8-甲氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-甲基-8-乙氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-甲基-8-正丙氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-甲基-8-異丙氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-甲基-8-正丁氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-甲基-8-(2-甲基丙氧)羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-甲基-8-(1-甲基丙氧)羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-甲基-8-第三丁氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-甲基-8-環己氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-甲基-8-(4’-第三丁環己氧)羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-甲基-8-苯氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-甲基-8-四氫呋喃氧羰四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-甲基-8-四氫哌喃氧羰四環[4.4.0.12 , 5
.17 , 1 0
]-3-十二烯、8-甲基-8-乙醯氧四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8,9-二(甲氧羰)四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8,9-二(乙氧羰)四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8,9-二(正丙氧羰)四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8,9-二(異丙氧羰)四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8,9-二(正丁氧羰)四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8,9-二(第三丁氧羰)四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8,9-二(環己氧羰)四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8,9-二(苯氧羰)四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8,9-二(四氫呋喃氧羰)四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8,9-二(四氫哌喃氧羰)四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8,9-四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯-8-羧酸、8-甲基四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯-8-羧酸、8-甲基四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-乙基四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-甲基四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-偏乙基四環[4.4.0.12 , 5
.17 , 1 0
]十二碳-3-烯、8-偏乙基四環[4.4.0.12 , 5
.17 , 1 0
01 , 6
]十二碳-3-烯等。
本發明使用之擁有環氧基之環狀烯烴樹脂最好能為降烯型單體之加成(共)聚合物,如一般以式(8)所示者。
作為本發明使用之擁有環氧基之環狀烯烴樹脂,在硬化後之膜特性之觀點上,以式(9)、(10)所示之聚合物較佳。將擁有芳烷基(如式(10)所示)之降烯單體導入聚合物時,藉此可提高對極性溶媒(如環戊烷或庚烷等被用作負型顯影液之溶媒者)之溶解性,因此具有操作性優異之益處。
作為本發明使用之擁有環氧基之環狀烯烴樹脂,在硬化後之膜特性之觀點上,以式(11)所示之聚合物進一步較佳。將具有癸基之單體導入時,藉此可得到低彈性膜,再者,將具有苯乙基之單體導入時,藉此可得到在低吸水性、耐藥品性、極性溶媒溶解性上均優之膜。
擁有環氧基之單體在共聚物中之含有率係可利用由曝光交聯得到可耐顯影液之交聯密度之方法來決定者。擁有環氧基之單體之含有率係按5~95莫耳%(以20~80莫耳%較佳,而以30~70莫耳%進一步較佳)之比率使用者。如此得到之聚合物顯示低吸水性(<0.3重量%)、低介電常數(<2.6)、低介電損失(0.001)、玻璃轉移點(170~400℃)等之優異之物理特性。
在本發明為了使擁有環氧基之環狀烯烴樹脂交聯而使用之交聯劑為一般習知之交聯劑,例如可使用藉加熱發揮其能力之硬化劑或光反應性物質等。
可藉加熱使擁有環氧基之環狀烯烴樹脂進行交聯反應之硬化劑係可舉出脂肪族多元胺、脂環族多元胺、芳香族多元胺、雙疊氮化物、酸酐、二羧酸、多價酚、聚醯胺等。作為此種硬化劑,例如可舉出:六亞甲二胺、三伸乙四胺、二伸乙三胺、四伸乙五胺等之脂肪族多元胺;二胺環己烷、3(4),8(9)-雙(胺甲)三環[5,2,1,02 , 6
]癸烷;1,3-(二胺甲)環己烷、烯二胺、異佛爾酮二胺、N-胺乙六氫吡、雙(4-胺-3-甲基環己)甲烷、雙(4-胺環己)甲烷等之脂環族多元胺;如4,4’-二胺二苯醚、4,4’-二胺二苯甲烷、α,α’-雙(4-胺苯)-1,3-二異丙苯、α,α’-雙(4-胺苯)-1,4-二異丙苯、4,4’-二胺二苯碸、間伸苯二胺等之芳香族多元胺類;如4,4’-雙疊氮苯亞甲(4-甲基)環己酮、4,4’-雙疊氮苯基苯乙烯基酮、2,6-雙(4’-疊氮苯亞甲)環己酮、2,6-雙(4’-疊氮苯亞甲)-4-甲基環己酮、4,4’-二疊氮二苯碸、4,4’-二疊氮二苯甲烷、2,2’-二疊氮二苯乙烯等之雙疊氮化物;如酞酸酐、1,2,4,5-苯四甲酸酐、二苯基酮四羧酸酐、甲基-5-降烯-2,3-二甲酐、1,2-環己烷二羧酸酐、順丁烯二酐改質聚丙烯、順丁烯二酐改質環狀烯烴樹脂等之酸酐類;如反丁烯二酸、酞酸、順丁烯二酸、偏苯三甲酸、內-5-降烯-2,3-二甲酸等之二羧酸類;如苯酚酚醛樹脂、甲苯酚酚醛樹脂等之多價酚類;如耐綸-6、耐綸-66、耐綸-610、耐綸-11、耐綸-612、耐綸-12、耐綸-46、甲氧甲基化聚醯胺、聚酞醯二胺六亞甲二酯、聚異酞醯二胺六亞甲二酯等之聚醯胺類等等。將此等硬化劑單獨使用,或以二種以上之混合物使用均可。
作為光反應性物質,可使用光酸產生劑。光酸產生劑可使用習知之任何化合物。光酸產生劑施行環氧基之交聯,並且在其後引起硬化,因而提高對基板之緊密附著性。較佳之光酸產生劑為鎓鹽、鹵素化合物、硫酸鹽、或其混合物。例如,鎓鹽為重氮鎓鹽、銨鹽、錪鹽、鋶鹽、磷酸鹽、鉮鹽、鹽等。只要屬於可與上述鎓鹽形成相對陰離子之化合物,則未受到相對陰離子上之限制。相對陰離子之例子為硼酸、鉮酸、磷酸、銻酸、硫酸鹽、羧酸及其氯化物,但並未受到此等例子之限制。鎓鹽之光酸產生劑,將四氟硼酸三苯鋶鹽、六氟硼酸三苯鋶鹽、四氟砷酸三苯鋶鹽、四氟磷酸三苯鋶鹽、四氟硫酸三苯鋶鹽、四氟硼酸4-硫苯氧二苯鋶鹽、六氟銻酸4-硫苯氧二苯鋶鹽、六氟砷酸4-硫苯氧二苯鋶鹽、四氟磷酸4-硫苯氧二苯鋶鹽、三氟磺酸4-硫苯氧二苯鋶鹽、四氟硼酸4-第三丁苯二苯鋶鹽、六氟砷酸4-第三丁苯二苯鋶鹽、六氟銻酸4-第三丁苯二苯鋶鹽、六氟膦酸4-第三丁苯二苯鋶鹽、三氟磺酸4-第三丁苯二苯鋶鹽、四氟硼酸參(4-甲苯)鋶鹽、六氟砷酸參(4-甲苯)鋶鹽、六氟磷酸參(4-甲苯)鋶鹽、六氟磺酸參(4-甲苯)鋶鹽、四氟硼酸參(4-甲氧苯)鋶鹽、六氟銻酸參(4-甲苯)鋶鹽、六氟磷酸參(4-甲苯)鋶鹽、三氟磺酸參(4-甲苯)鋶鹽、四氟硼酸三苯錪鹽、六氟銻酸三苯錪鹽、六氟砷酸三苯錪鹽、六氟膦酸三苯錪鹽、三氟磺酸三苯錪鹽、四氟硼酸3,3-二硝二苯錪鹽、六氟銻酸3,3-二硝二苯錪鹽、六氟砷酸3,3-二硝二苯錪鹽、三氟磺酸3,3-二硝二苯錪鹽、四氟硼酸4,4-二硝二苯錪鹽、六氟銻酸4,4-二硝二苯錪鹽、六氟砷酸4,4-二硝二苯錪鹽及三氟磺酸4,4-二硝二苯錪鹽單獨使用或混合使用均可。
含有氟以外之鹵素之光酸產生劑之例子為2,4,6-參(三氯甲)三、2-烯丙-4,6-雙(三氯甲)三、α,β,α-三溴甲苯碸、α,α-2,3,5,6-六氯二甲苯、2,2-雙(3,5-二溴-4-羥苯)-1,1,1,3,3,3-六氟二甲苯、1,1,1-參(3,5-二溴-4-羥苯)乙烷及其混合物。
磺酸鹽系之光酸產生劑為2-硝苄對甲苯磺酸鹽、2,6-二硝苄對甲苯磺酸鹽、2,4-二硝苄對甲苯磺酸鹽、2-硝苄甲磺酸鹽、2-硝苄醋酸鹽、9,10-二甲氧蒽-2-磺酸鹽、1,2,3-參(甲磺醯氧)苯、1,2,3-參(乙磺醯氧)苯、1,2,3-參(丙磺醯氧)苯等,但並未受到此等例子之限制。
較佳光酸產生劑為4,4’-二第三丁苯錪三氟甲磺酸鹽、4,4’,4”-參(第三丁苯)鋶三氟甲磺酸鹽、二苯錪肆(五氟苯)硼酸鹽、三苯鋶二苯錪肆(五氟苯)硼酸鹽、4,4’-二第三丁苯錪肆(五氟苯)硼酸鹽、參(第三丁苯)鋶肆(五氟苯)硼酸鹽、(4-甲苯)-4-(1-甲基乙基)苯錪肆(五氟苯)硼酸鹽及其混合物。
本發明有關之光酸產生劑之配合比例係相對於聚合物100重量份,為0.1至100重量份,以0.1至10重量份較佳。
本發明之交聯劑可依照受光裝置之步驟組合之情形適當選擇。在所組合之全步驟中含有曝光、顯影步驟之情況,必需使用光反應性物質以充當交聯劑。另在所組合之全步驟中未含曝光、顯影步驟之情況,使用硬化劑或光反應性物質均可。
在本發明之環狀烯烴樹脂組成物中,有可能在必要時使用增感劑以提高感光特性。增感劑有可能擴展光酸產生劑可活化之波長範圍,而可在聚合物之交聯反應未直接受到影響之範圍內添加。最適合之增感劑為在所用之光源附近具有最大吸光係數而可將所吸收之能量有效交給光酸產生劑之化合物。光酸產生劑之增感劑包括蒽、芘、苝(perylene)等之多環芳香族化合物。其例子包括2-異丙-9H-二苯并硫哌喃-9-烯、4-異丙-9H-二苯并硫哌喃-9-酮、1-氯-4-丙氧二苯并硫哌喃、啡噻、以及其混合物。本發明有關之光酸產生劑之配合比例係相對於聚合物100重量份,為0.1至10重量份,以0.2至5重量份較佳。在光源之波長屬於如g-射線(436nm)、i-射線(365nm)等長波長之情況,增感劑係在光酸產生劑之活化上有效者。
在添加少量之酸捕捉劑時,有可能藉此提高解析度。在光化學反應之期間,酸捕捉劑可吸收對未曝光部擴散之酸。酸捕捉劑包括如吡啶、二甲啶、啡噻、三正丙胺、三乙胺等之第二胺及第三胺,但並未受限於所列舉者。酸捕捉劑之配合例係相對於聚合物100重量份,為0.1至0.05重量份。
對本發明有關之包含擁有環氧基之環狀烯烴樹脂及光酸產生劑之樹脂組成物,在必要時可添加如均塗劑、抗氧化劑、難燃劑、可塑劑、矽烷偶合劑等之添加劑。
在本發明中,使此等成分溶於溶劑,以使形成清漆狀而予以使用。溶劑包括非反應性溶劑及反應性溶劑,非反應性溶劑充當聚合物或添加物之載體而起作用,在塗佈或硬化之過程中被除去。反應性溶劑含有與加入樹脂組成物之硬化劑有相溶性之反應基。非反應性溶劑為烴溶劑或芳香族溶劑。其例子可舉出如戊烷、己烷、庚烷、環己烷、十氫萘等之烷屬烴或環烷屬烴之烴溶劑,但並未受到此等例子之限制。芳香族溶劑為苯、甲苯、二甲苯、1,3,5-三甲苯等。二乙醚、四氫呋喃、苯基甲基醚、乙酸酯/鹽、酯類、內酯類、酮類、以及醯胺類亦屬有用。作為反應性溶劑,將如氧化環己烯、氧化α-蘋烯等之環醚化合物,如[亞甲雙(4,1-伸苯氧亞甲)]雙環氧乙烷等之芳香族環醚,如1,4-環己烷二甲醇二乙烯醚等之脂環式乙烯醚化合物,如雙(4-乙烯苯)甲烷等之芳香族化合物單獨使用或混合使用均可。較佳之溶劑為1,3,5-三甲苯或十氫萘,此等較佳之溶劑最適於樹脂在矽、矽氧化物、矽氮化物、矽氧氮化物等材質基板上之塗佈。
本發明使用之樹脂組成物之樹脂固形分為約5~60重量%。較佳的是該含量為30~55重量%,進一步較佳的是該含量為35~45重量%。溶液黏度為10~25,000cP,以100~3,000cP較佳。
本發明之樹脂組成物係將擁有環氧基之環狀降烯樹脂、光酸產生劑、以及必要時使用之溶劑、增感劑、酸捕捉劑、均塗劑、抗氧化劑、難燃劑、可塑劑、矽烷偶合劑等單純混合即可得到者。
其次,關於本發明之半導體裝置之製造方法,加以敘述。首先,將環狀烯烴樹脂組成物塗佈於適當之支持體例如矽晶片、陶瓷、鋁基板等之上。塗佈方法包括:使用旋塗器之旋轉塗佈法、使用噴霧塗佈設備之噴霧塗佈法、浸漬法、印刷法、輥塗法等。其次,在90~140℃溫度下施行預烘以使塗膜乾燥後,按所想要之圖案形狀照射以光化射線(actinic rays)。光化射線可使用X射線、電子射線、紫外線、可視光線等,不過以具有200~700nm波長者較佳。
繼光化射線之照射之後,施行烘焙。藉此步驟使環氧交聯之反應速度增加。烘焙條件為50~200℃溫度。較佳為80~150℃,進一步較佳為90~130℃。
其次,將未照射部使用顯影液予以溶解除去,藉此得到浮雕狀圖案。顯影液包括如戊烷、己烷、庚烷或環己烷等等之烷烴溶媒,如環烷烴溶媒,如甲苯、二甲苯、1,3,5-三甲苯等之芳香族烴溶媒。再者,可以使用檸檬油精、二戊烯、蘋烯、烷等之萜烯類,如環戊酮、環己酮、2-庚酮等之酮類,而可合適使用由適量之界面活性劑加入此等有機溶媒者。
顯影方法係如顯影液噴霧方式、基板旋轉方式、基板浸漬方法、施加超音波方式等之方式均有可行性。其次,將由顯影而形成之浮雕圖案予以清洗。作為清洗液,使用醇類。其次,在50~200℃溫度下施行加熱處理,以除去顯影液或清洗液,然後完成環氧基之硬化而得到富於耐熱性之最後圖案。
再者,本發明使用之黏附劑最好能由二氧化矽填料、常溫下為液狀之環氧樹脂及硬化劑所構成,較佳的是該項成分中含有二氧化矽填料(A)1~10重量%,且二氧化矽填料為平均粒徑2-500nm之超微粒二氧化矽粉末。本發明使用之環氧樹脂係限定為常溫呈液狀者,若屬於常溫非液狀,則在其與二氧化矽填料混合時必需使用溶劑。溶劑係成為產生氣泡之原因,造成硬化物之黏附強度、熱傳導率之降低,因此不合適。
本發明使用之環氧樹脂之例子包括由雙苯酚A、雙苯酚F、苯酚酚醛樹脂類與表氯醇之反應所得之聚縮水甘油醚等之常溫液狀者,如二氧化乙烯基環己烯、二氧化二環戊二烯、脂環二環氧己二酸酯等之脂環系環氧樹脂,而有可能使用其中之一種類,或二種以上一起使用,但並未特別受到限制。此外,亦有可能使用如正丁基縮水甘油基醚、柯赫酸縮水甘油酯、苯環氧乙烷、苯基縮水甘油基醚、甲苯甲氧基縮水甘油基醚、丁苯基縮水甘油基醚等之平常之環氧樹脂。
再者,作為本發明使用之硬化劑,最好能將雙苯酚F與潛在型胺化合物(如二胺二醯胺、己二酸醯肼等)一起使用,雙苯酚F在黏附劑中之含量最好能為2~30重量%。若少於2重量%,摻配量則太少,造成黏附強度不足,另若多於30重量%,酚性羥基對環氧基之量比則變得過高,致使硬化物中留存有未反應之酚性羥基,因此不合適。
本發明使用之二氧化矽填料為由平均粒徑2~500nm之超微粒二氧化矽粉末所構成,其在黏附劑中之含量最好能為1~10重量%。黏附劑中之全二氧化矽填料含量若多於1重量%,則可解決如糊劑之下垂等之塗佈性問題,另若少於10重量%,則可改善操作性之降低(如網板印刷用孔模發生塞孔等)。再者,對本發明使用之黏附劑在必要時使用如硬化促進劑、撓性賦予劑、顏料、染料、消泡劑等之添加劑亦可。本發明之製造方法例如包括使各成分經過初步混合,使用三輥組合式混合裝置予以混合而得到糊料,在真空下施行脫泡等。
以下根據實施例具體說明本發明。
○環狀烯烴樹脂組成物之製備舉出5-癸基-2-降烯(以下稱為「癸基降烯」)/5-[(2,3-環氧丙氧)甲基]-2-降烯(以下稱為「縮水甘油基甲基醚降烯」)=70/30共聚物之共聚物(A-1)之例子。
使所有之玻璃儀器在60℃、0.1Torr下乾燥18小時。然後,將玻璃儀器移至一種手套操作/防污染密箱式實驗設備(glove box)中,而裝設在其內。將乙酸乙酯(917g)、環己烷(917g)、癸基降烯(192g,0.82mol)、以及縮水甘油基甲基醚降烯(62g,0.35mol)加入反應用燒瓶。將反應用燒瓶從該實驗設備取出,而將乾燥氮氣導入。使氮氣對溶液中通氣30分鐘,以使反應中間物脫除空氣。在該實驗設備內,使鎳觸媒(即雙甲苯隻全氟苯鎳)9.36g(19.5mmol)溶於甲苯15ml,予以裝入25ml注射筒,從該實驗設備取出,而裝入反應用燒瓶。在20℃溫度下攪拌5小時而完成反應。其次,添加過乙酸溶液(975mmol),予以攪拌18小時。停止攪拌時,發生水層與溶媒層之分層。分離水層後,添加蒸餾水1升,而攪拌20分鐘。由於水層分離,予以除去。用1升蒸餾水以施行洗滌3次。然後,將聚合物投入甲醇,而藉過濾收集沈澱物,對此用水予以充分洗滌後,在真空下乾燥。乾燥後回收了243g(收率96%)之聚合物。所得聚合物之分子量根據GPC時,Mw=115,366,Mn=47,000,Mw/Mn=2.45。聚合物之組成乃由H-NMR得知,癸基降烯為70莫耳%,環氧降烯為30莫耳%。
使上述所合成之樹脂228g溶於十氫萘342g後,對此添加肆(五氟苯)硼酸4-甲基苯基-4-(1-甲基乙基)苯錪(0.2757g,2.71×10- 4
mol)、1-氯-4-丙氧-9H-二苯并硫哌喃-9-酮(0.826g,2.71×10- 4
mol)、啡噻(0.054g,2.71×10- 4
mol)及4-羥基氫桂皮酸3,5-二第三丁酯(0.1378g,2.60×10- 4
mol)以使溶解後,用0.2 μ m之氟樹脂製濾器予以過濾,而得到環狀烯烴樹脂組成物。
○黏附劑之製備將平均粒徑約12nm之超微粒二氧化矽粉末(3.0g)、由雙苯酚F與表氯醇之反應所得之二縮水甘油醚(環氧當量180,常溫液狀)(91.0g)、雙苯酚F(5.0g)及二胺二醯胺(1.0g)予以摻配,用三輥組合式混合裝置予以混合而得到絕緣樹脂糊劑。將此絕緣樹脂糊劑在真空室內按2mmHg施行脫泡30分鐘而得到黏附劑。
○受光裝置之製備對於半導體基板(形成有一配置有與各受光區域相對應之微型透鏡之受光元件且在微型透鏡區域以外之區域形筬有表面電極者),使用旋塗器以將所製備之上述環狀烯烴樹脂組成物塗佈於其上之後,用熱板在110℃溫度下乾燥5分鐘而得到膜厚約40 μ m之塗膜。對此塗膜在使用一寬頻步進型曝光裝置(ULTRATECH(股)所製造)之下,藉由標線按1500mJ/cm2
施行隔牆(dam)形成部分之曝光。然後,用熱板在90℃溫度下加熱4分鐘以促進曝光部之交聯反應。
其次,在檸檬油精中浸漬30秒鐘,以將未曝光部溶解除去後,用異丙醇予以清洗20秒鐘。於是,以位於與受光元件隔開之位置可圍繞受光元件之方式形成隔牆,而得以確認微型透鏡上無殘渣之事實。再者,在殘存圖案中全然未觀察到圖案之剝離,而得以確認顯影時之緊密附著性優異之事實。然後,160℃溫度下用60分鐘之時間實現硬化而完成交聯反應。此硬化膜之吸水率為0.2%。
其次,在所形成之隔牆上藉網板印刷法塗佈上述黏附劑後,將玻璃基板載置於隔牆上,在100℃溫度下用60分鐘之時間達成硬化,而使隔牆與玻璃基板黏附在一起。
再來,使用殼箱方式CSP所用之電器引線之形成方法來形成佈線,並按受光元件單位切斷,而得到受光裝置。所得之受光裝置在充當受光裝置時之動作上並無困難之事實被確認。
除了使用癸基降烯(129g,0.55mol)、縮水甘油基甲基醚降烯(177g,0.30mol)、以及苯乙基降烯(29.7g,0.15mol)以代替實施例1之癸基降烯(192g,0.82mol)及縮水甘油基甲基醚降烯(62g,0.35mol)之外,均與實施例1一樣實施而得到癸基降烯/縮水甘油基甲基醚降烯/苯乙基降烯=55/30/15之三元共聚物(A-2)。施行聚合、再沈澱,乾燥後回收了309g(收率92%)之聚合物。所得聚合物之分子量根據GPC時,Mw=68000,Mn=30000,Mw/Mn=2.3。聚合物之組成係由H-NMR得知,癸基降烯為54莫耳%,環氧降烯為31莫耳%,苯乙基降烯為15莫耳%。
施行與實施例1相同之步驟而得到受光裝置。所得之受光裝置在充當受光裝置時之動作上並無困難之事實被確認。
施行與實施例相同之合成及摻配而得到環狀烯烴樹脂組成物。
○受光裝置之製備對於半導體基板(形成有一配置有與各受光區域相對應之微型透鏡之受光元件且在微型透鏡區域以外之區域形成有表面電極者),使用旋塗器以將所製備之上述環狀烯烴樹脂組成物塗佈於其上之後,用熱板在110℃溫度下乾燥5分鐘而得到膜厚約40 μ m之塗膜。對此塗膜在使用一寬頻步進型曝光裝置(ULTRATECH(股)所製造)之下,藉由標線按1500mJ/cm2
施行隔牆形成部分之曝光。然後,用熱板在90℃溫度下加熱4分鐘以促進曝光部之交聯反應。
其次,在檸檬油精中浸漬30秒鐘,以將未曝光部溶解除去後,用異丙醇予以清洗20秒鐘。於是,以位於與受光元件隔開之位置可圍繞受光元件之方式形成隔牆,而得以確認微型透鏡上無殘渣之事實。再者,在殘存圖案中全然未觀察到圖案之剝離,而得以確認顯影時之緊密附著性優異之事實。其次,將玻璃基板載置於所形成之隔牆上,在施加80kPa之壓力下,且在160℃溫度下用30分鐘之時間達成硬化,而使半導體基板與玻璃基板黏附在一起。此硬化膜之吸水率為0.2%。其次,使用殼箱方式CSP所用之電器引線之形成方法來形成佈線,並按受光元件單位切斷,而得到受光裝置。所得之受光裝置在充當受光裝置時之動作上並無困難之事實被確認。
施行與施例相同之合成及摻配而得到環狀烯烴樹脂組成物。
○受光裝置之製備對於半導體基板(形成有一配置有與各受光區域相對應之微型透鏡之受光元件且在微型透鏡區域以外之區域形成有表面電極者),使用旋塗器以將所製備之上述環狀烯烴樹脂組成物塗佈於其上之後,用熱板在110℃溫度下乾燥5分鐘而得到膜厚約10 μ m之塗膜。
其次,將玻璃基板載置於塗膜上,在施加80kPa之壓力下,且在160℃溫度下用30分鐘之時間達成硬化,而使半導體基板與玻璃基板黏附在一起。此硬化膜之吸水率為0.2%。再來,使用殼箱方式CSP所用之電器引線之形成方法來形成佈線,並按受光元件單位切斷,而得到受光裝置。所得之受光裝置在充當受光裝置時之動作上並無困難之事實被確認。
以上係說明本發明之實施形態,但本發明並未受到以上所述形態之限制,而係包含各種態樣者。例如,本發明亦包含以下之態樣。
[1]一種受光裝置,係由含有至少一個受光元件之半導體基板、圍繞被設在該半導體基板上之受光元件之隔牆、被設在該隔牆上之黏附劑層、被設在該黏附劑層之上方之透明蓋所構成,其特徵為,該隔牆為由一包含擁有環氧基之環狀烯烴樹脂及光酸產生劑之樹脂組成物所構成。
[2]如[1]所載述之受光裝置,其中,環狀烯烴樹脂為聚降烯樹脂。
[3]如[1]或[2]所載述之受光裝置,其中,擁有環氧基之環狀烯烴樹脂為含有式(1)所示之重複單元者。
[4]如[1]至[3]中任一項所載述之受光裝置,其中,擁有環氧基之環狀烯烴樹脂為含有式(2)及式(3)所示之重複單元者。
[5]如[1]至[4]中任一項所載述之受光裝置,其中,擁有環氧基之環狀烯烴樹脂為含有式(4)、(5)、以及式(6)所示之重複單元者。
[6]如[1]至[5]中任一項所載述之受光裝置,其中,[1]所載述之半導體基板為矽,該受光元件為包含配置有微型透鏡之CMOS影像裝置者。
[7]如[1]至[6]中任一項所載述之受光裝置,其中,該隔牆之高度為高於微型透鏡之高度。
[8]如[1]至[7]中任一項所載述之受光裝置,其中,構成前述黏附劑層之黏附劑係由二氧化矽填料(A)、常溫液狀之環氧樹脂(B)及硬化劑(C)所構成。
[9]如[8]所載述之受光裝置,其中,在前述黏附劑中含有二氧化矽填料(A)1~10重量%。
[10]如[8]或[9]所載述之受光裝置,其中,前述黏附劑中之二氧化矽填料(A)之平均粒徑為2~500nm。
1...支持體(基板)
2...受光元件
3...微型透鏡
4...光電區域
5...密閉構件
6...透明蓋
7...黏附劑
10...晶片
11...電極墊
13...引線
圖1係在受光元件與透明蓋構件之間填埋有密閉構件之受光裝置之剖面圖。
圖2係具有未用黏附劑之中空構造之受光裝置之剖面圖。
圖3係具有使用黏附劑之中空構造之受光裝置之剖面圖。
圖4係具有使用黏附劑之中空構造之晶片級CSP構造之受光裝置之剖面圖。
1...支持體(基板)
2...受光元件
3...微型透鏡
4...光電區域
5...密閉構件
6...透明蓋
Claims (13)
- 一種受光裝置,其具備:基板;設在上述基板之一面上之受光元件;設在上述基板之上述面上部之透明蓋;及在上述基板與上述透明蓋之間,至少設在上述受光元件之周圍部分,以使上述受光元件對外部密閉之密閉構件;上述密閉構件藉由含有環狀烯烴樹脂與光酸產生劑之感光性樹脂組成物而形成;上述受光元件含有微型透鏡,該微型透鏡在上述受光元件的表面上,且設置成位於上述受光元件與上述透明蓋之間。
- 如申請專利範圍第1項之受光裝置,其中,以於與受光元件隔開之位置圍繞上述受光元件之方式,設置上述密閉構件。
- 如申請專利範圍第1項之受光裝置,其中,以填充上述基板與上述透明蓋之間隙之方式,設置上述密閉構件。
- 如申請專利範圍第1項之受光裝置,其中,上述密閉構件為擁有環氧基之環狀烯烴樹脂之交聯物。
- 如申請專利範圍第1項之受光裝置,其中,上述環狀烯烴樹脂為降烯樹脂。
- 如申請專利範圍第4項之受光裝置,其中,上述擁有環氧基之環狀烯烴樹脂為含有式(1)所示之重複單元者:
- 如申請專利範圍第4項之受光裝置,其中,上述擁有環氧基之環狀烯烴樹脂為分別含有式(2)及式(3)所示之重複單元者:
- 如申請專利範圍第4項之受光裝置,其中,上述擁有環氧基之環狀烯烴樹脂為含有式(4)、(5)及式(6)所示之重複單元者:
- 如申請專利範圍第1項之受光裝置,其中,上述密閉構件之厚度大於上述受光元件從基板突出之突起高度。
- 如申請專利範圍第1項之受光裝置,其中,上述密閉構件與上述透明蓋係透過黏附劑層接合。
- 如申請專利範圍第10項之受光裝置,其中,上述黏附劑層係使含有二氧化矽填料、常溫下為液狀之環氧樹脂及硬化劑之黏附劑硬化所得者。
- 如申請專利範圍第11項之受光裝置,其中,上述黏 附劑含有上述二氧化矽填料1重量%以上且10重量%以下。
- 如申請專利範圍第11項之受光裝置,其中,上述二氧化矽填料之平均粒徑為2~500nm。
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US20090008682A1 (en) | 2009-01-08 |
EP1804296B1 (en) | 2008-10-01 |
JP4760713B2 (ja) | 2011-08-31 |
WO2006040986A1 (ja) | 2006-04-20 |
ATE409960T1 (de) | 2008-10-15 |
JPWO2006040986A1 (ja) | 2008-05-15 |
EP1804296A4 (en) | 2008-02-20 |
KR100892204B1 (ko) | 2009-04-07 |
JP2011199294A (ja) | 2011-10-06 |
DE602005010107D1 (de) | 2008-11-13 |
EP1804296A1 (en) | 2007-07-04 |
TW200709406A (en) | 2007-03-01 |
KR20070067184A (ko) | 2007-06-27 |
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