TWI361437B - Test apparatus - Google Patents
Test apparatus Download PDFInfo
- Publication number
- TWI361437B TWI361437B TW097107830A TW97107830A TWI361437B TW I361437 B TWI361437 B TW I361437B TW 097107830 A TW097107830 A TW 097107830A TW 97107830 A TW97107830 A TW 97107830A TW I361437 B TWI361437 B TW I361437B
- Authority
- TW
- Taiwan
- Prior art keywords
- memory
- defective
- count
- unit
- bad
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
- G11C29/4401—Indication or identification of errors, e.g. for repair for self repair
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C2029/1208—Error catch memory
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2007/054573 WO2008107996A1 (ja) | 2007-03-08 | 2007-03-08 | 試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200903506A TW200903506A (en) | 2009-01-16 |
| TWI361437B true TWI361437B (en) | 2012-04-01 |
Family
ID=39737901
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW097107830A TWI361437B (en) | 2007-03-08 | 2008-03-06 | Test apparatus |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JPWO2008107996A1 (ja) |
| KR (1) | KR101015488B1 (ja) |
| CN (1) | CN101627445A (ja) |
| TW (1) | TWI361437B (ja) |
| WO (1) | WO2008107996A1 (ja) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4889792B2 (ja) * | 2007-11-14 | 2012-03-07 | 株式会社アドバンテスト | 試験装置 |
| KR101312348B1 (ko) * | 2009-03-10 | 2013-09-27 | 가부시키가이샤 어드밴티스트 | 시험 장치 및 시험 방법 |
| TWI401691B (zh) * | 2009-03-20 | 2013-07-11 | Phison Electronics Corp | 具快閃記憶體測試功能的控制器及其儲存系統與測試方法 |
| JP2013007710A (ja) * | 2011-06-27 | 2013-01-10 | Advantest Corp | 試験装置および試験方法 |
| KR20150006167A (ko) | 2013-07-08 | 2015-01-16 | 에스케이하이닉스 주식회사 | 반도체 시스템 및 그 리페어 방법 |
| KR101980689B1 (ko) | 2017-02-14 | 2019-05-22 | 주식회사 투엔 | 배송 중개서비스를 위한 역경매 기반 배송비 산정 방법 |
| CN108121628B (zh) * | 2017-12-19 | 2021-01-05 | 珠海市君天电子科技有限公司 | 一种读写速度的测试方法、装置及电子设备 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0933615A (ja) * | 1995-07-19 | 1997-02-07 | Advantest Corp | 半導体メモリ試験装置のメモリ不良解析装置 |
| JPH11102598A (ja) * | 1997-09-29 | 1999-04-13 | Toshiba Corp | メモリ不良救済解析装置 |
| JP2001014890A (ja) * | 1999-06-30 | 2001-01-19 | Mitsubishi Electric Corp | 半導体装置および半導体装置のテスト方法 |
| JP4601119B2 (ja) * | 2000-05-02 | 2010-12-22 | 株式会社アドバンテスト | メモリ試験方法・メモリ試験装置 |
| JP2003228997A (ja) * | 2002-02-05 | 2003-08-15 | Mitsubishi Electric Corp | 半導体記憶装置 |
| JP4119417B2 (ja) | 2004-11-15 | 2008-07-16 | 株式会社アドバンテスト | 試験装置及び試験方法 |
-
2007
- 2007-03-08 WO PCT/JP2007/054573 patent/WO2008107996A1/ja active Application Filing
- 2007-03-08 JP JP2007541555A patent/JPWO2008107996A1/ja not_active Withdrawn
- 2007-03-08 CN CN200780052065A patent/CN101627445A/zh active Pending
- 2007-03-08 KR KR1020097017761A patent/KR101015488B1/ko not_active IP Right Cessation
-
2008
- 2008-03-06 TW TW097107830A patent/TWI361437B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| CN101627445A (zh) | 2010-01-13 |
| KR101015488B1 (ko) | 2011-02-22 |
| WO2008107996A1 (ja) | 2008-09-12 |
| KR20100004983A (ko) | 2010-01-13 |
| JPWO2008107996A1 (ja) | 2010-06-10 |
| TW200903506A (en) | 2009-01-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |