TWI347443B - Delay circuit and testing device - Google Patents

Delay circuit and testing device

Info

Publication number
TWI347443B
TWI347443B TW093139598A TW93139598A TWI347443B TW I347443 B TWI347443 B TW I347443B TW 093139598 A TW093139598 A TW 093139598A TW 93139598 A TW93139598 A TW 93139598A TW I347443 B TWI347443 B TW I347443B
Authority
TW
Taiwan
Prior art keywords
delay circuit
testing device
testing
delay
circuit
Prior art date
Application number
TW093139598A
Other languages
English (en)
Other versions
TW200521459A (en
Inventor
Masakatsu Suda
Shusuke Kantake
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200521459A publication Critical patent/TW200521459A/zh
Application granted granted Critical
Publication of TWI347443B publication Critical patent/TWI347443B/zh

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
    • H03K5/133—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals using a chain of active delay devices
    • H03K5/134—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals using a chain of active delay devices with field-effect transistors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
    • H03K5/133—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals using a chain of active delay devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K2005/00013—Delay, i.e. output pulse is delayed after input pulse and pulse length of output pulse is dependent on pulse length of input pulse
    • H03K2005/00019—Variable delay
    • H03K2005/00026—Variable delay controlled by an analog electrical signal, e.g. obtained after conversion by a D/A converter
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K2005/00013—Delay, i.e. output pulse is delayed after input pulse and pulse length of output pulse is dependent on pulse length of input pulse
    • H03K2005/00019—Variable delay
    • H03K2005/00026—Variable delay controlled by an analog electrical signal, e.g. obtained after conversion by a D/A converter
    • H03K2005/00032—Dc control of switching transistors
    • H03K2005/00039—Dc control of switching transistors having four transistors serially
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K2005/00013—Delay, i.e. output pulse is delayed after input pulse and pulse length of output pulse is dependent on pulse length of input pulse
    • H03K2005/00019—Variable delay
    • H03K2005/00058—Variable delay controlled by a digital setting
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K2005/00013—Delay, i.e. output pulse is delayed after input pulse and pulse length of output pulse is dependent on pulse length of input pulse
    • H03K2005/00078—Fixed delay
    • H03K2005/0013—Avoiding variations of delay due to power supply
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K2005/00013—Delay, i.e. output pulse is delayed after input pulse and pulse length of output pulse is dependent on pulse length of input pulse
    • H03K2005/0015—Layout of the delay element
    • H03K2005/00195—Layout of the delay element using FET's
    • H03K2005/00202—Layout of the delay element using FET's using current mirrors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K2005/00013—Delay, i.e. output pulse is delayed after input pulse and pulse length of output pulse is dependent on pulse length of input pulse
    • H03K2005/0015—Layout of the delay element
    • H03K2005/00234—Layout of the delay element using circuits having two logic levels
    • H03K2005/00267—Layout of the delay element using circuits having two logic levels using D/A or A/D converters

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Pulse Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
TW093139598A 2003-12-18 2004-12-20 Delay circuit and testing device TWI347443B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003421617 2003-12-18

Publications (2)

Publication Number Publication Date
TW200521459A TW200521459A (en) 2005-07-01
TWI347443B true TWI347443B (en) 2011-08-21

Family

ID=34697311

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093139598A TWI347443B (en) 2003-12-18 2004-12-20 Delay circuit and testing device

Country Status (7)

Country Link
US (1) US7511547B2 (zh)
EP (1) EP1699134A4 (zh)
JP (1) JP4558649B2 (zh)
KR (1) KR101177150B1 (zh)
CN (1) CN100563103C (zh)
TW (1) TWI347443B (zh)
WO (1) WO2005060098A1 (zh)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4825131B2 (ja) * 2004-09-27 2011-11-30 株式会社アドバンテスト 消費電流バランス回路、補償電流量調整方法、タイミング発生器及び半導体試験装置
JP4925630B2 (ja) * 2005-09-06 2012-05-09 株式会社アドバンテスト 試験装置および試験方法
JPWO2007114379A1 (ja) 2006-03-31 2009-08-20 株式会社アドバンテスト 可変遅延回路、試験装置および電子デバイス
KR101324341B1 (ko) 2006-08-24 2013-10-31 가부시키가이샤 어드밴티스트 가변 지연 회로, 타이밍 발생기 및 반도체 시험 장치
US7456672B1 (en) * 2006-09-11 2008-11-25 Lattice Semiconductor Corporation Clock systems and methods
US8729944B2 (en) * 2011-12-21 2014-05-20 Advanced Micro Devices, Inc. Clock generator with integrated phase offset programmability
CN103226180A (zh) * 2012-01-31 2013-07-31 哈尔滨建成集团有限公司 一种电子延时器测试系统
DE102012107024B3 (de) 2012-08-01 2013-08-29 Infineon Technologies Ag Schaltung zum strombegrenzten Umladen eines Knotens
US9000822B2 (en) 2013-04-09 2015-04-07 International Business Machines Corporation Programmable delay circuit
US9628059B2 (en) 2015-06-18 2017-04-18 International Business Machines Corporation Fine delay structure with programmable delay ranges
US9715941B2 (en) * 2015-10-30 2017-07-25 Sony Semiconductor Solutions Corporation State machine controlled MOS linear resistor

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05145382A (ja) * 1991-11-25 1993-06-11 Nec Eng Ltd パルス遅延回路
JPH05327425A (ja) * 1992-05-15 1993-12-10 Nec Corp 発振回路
JP3399616B2 (ja) * 1994-01-31 2003-04-21 富士通株式会社 オシレータ回路、そのオシレータ回路を用いたセルフリフレッシュ用オシレータ及び基板バイアス回路
JPH08139573A (ja) * 1994-11-08 1996-05-31 Hitachi Ltd ワンショットパルス発生回路
JP3688392B2 (ja) * 1996-05-31 2005-08-24 三菱電機株式会社 波形整形装置およびクロック供給装置
JPH11306757A (ja) * 1998-04-27 1999-11-05 Mitsubishi Electric Corp 同期型半導体記憶装置
JP4394788B2 (ja) * 1999-05-10 2010-01-06 株式会社アドバンテスト 遅延時間判定装置
JP2001028195A (ja) * 1999-07-14 2001-01-30 Matsushita Electric Ind Co Ltd 遅延回路および半導体メモリ
JP2001185993A (ja) * 1999-12-24 2001-07-06 Oki Electric Ind Co Ltd 電圧制御発振回路
JP2002176340A (ja) * 2000-12-06 2002-06-21 Toshiba Corp 遅延回路及び電圧制御発振回路
JP2002223149A (ja) * 2001-01-29 2002-08-09 Hitachi Ltd 半導体集積回路
JP4866514B2 (ja) * 2001-06-29 2012-02-01 株式会社アドバンテスト 遅延回路、及び試験装置
JP4133814B2 (ja) * 2001-07-27 2008-08-13 株式会社アドバンテスト タイミング発生器及び半導体試験装置
JP4093961B2 (ja) * 2001-10-19 2008-06-04 株式会社アドバンテスト 位相ロックループ回路、遅延ロックループ回路、タイミング発生器、半導体試験装置及び半導体集積回路
US7089135B2 (en) 2002-05-20 2006-08-08 Advantest Corp. Event based IC test system
US6909316B2 (en) 2003-02-21 2005-06-21 Agilent Technologies, Inc. Variable delay circuit with high resolution

Also Published As

Publication number Publication date
US20060267656A1 (en) 2006-11-30
CN1894852A (zh) 2007-01-10
US7511547B2 (en) 2009-03-31
EP1699134A4 (en) 2010-12-08
TW200521459A (en) 2005-07-01
JPWO2005060098A1 (ja) 2007-07-12
KR20070031857A (ko) 2007-03-20
CN100563103C (zh) 2009-11-25
JP4558649B2 (ja) 2010-10-06
EP1699134A1 (en) 2006-09-06
KR101177150B1 (ko) 2012-08-24
WO2005060098A1 (ja) 2005-06-30

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees