TWI319498B - Electrical connection device for use in display panel examination device - Google Patents

Electrical connection device for use in display panel examination device

Info

Publication number
TWI319498B
TWI319498B TW094121110A TW94121110A TWI319498B TW I319498 B TWI319498 B TW I319498B TW 094121110 A TW094121110 A TW 094121110A TW 94121110 A TW94121110 A TW 94121110A TW I319498 B TWI319498 B TW I319498B
Authority
TW
Taiwan
Prior art keywords
display panel
electrical connection
connection device
panel examination
examination device
Prior art date
Application number
TW094121110A
Other languages
English (en)
Other versions
TW200613817A (en
Inventor
Masayuki Anzai
Hideki Ikeuchi
Yutaka Kosaka
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200613817A publication Critical patent/TW200613817A/zh
Application granted granted Critical
Publication of TWI319498B publication Critical patent/TWI319498B/zh

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Measuring Leads Or Probes (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
TW094121110A 2004-10-22 2005-06-24 Electrical connection device for use in display panel examination device TWI319498B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004308233A JP4570930B2 (ja) 2004-10-22 2004-10-22 パネルの検査装置に用いられる電気的接続装置

Publications (2)

Publication Number Publication Date
TW200613817A TW200613817A (en) 2006-05-01
TWI319498B true TWI319498B (en) 2010-01-11

Family

ID=36537049

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094121110A TWI319498B (en) 2004-10-22 2005-06-24 Electrical connection device for use in display panel examination device

Country Status (3)

Country Link
JP (1) JP4570930B2 (zh)
KR (1) KR100707686B1 (zh)
TW (1) TWI319498B (zh)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100748072B1 (ko) * 2005-08-01 2007-08-09 가부시키가이샤 니혼 마이크로닉스 표시패널의 전기검사장치
JP4916712B2 (ja) * 2005-12-16 2012-04-18 株式会社日本マイクロニクス 表示パネル検査装置
JP5137336B2 (ja) * 2006-05-29 2013-02-06 株式会社日本マイクロニクス 可動式プローブユニット機構及び電気検査装置
KR100822026B1 (ko) 2006-07-27 2008-04-15 (주)엠에스쎌텍 엘시디모듈의 탭본딩 불량검사장치
JP4917852B2 (ja) * 2006-08-21 2012-04-18 株式会社日本マイクロニクス パネル支持機構及び検査装置
JP5019827B2 (ja) * 2006-09-06 2012-09-05 株式会社日本マイクロニクス 検査装置
JP2008064682A (ja) * 2006-09-08 2008-03-21 Micronics Japan Co Ltd 検査装置
JP5001681B2 (ja) * 2007-03-12 2012-08-15 株式会社日本マイクロニクス インライン自動検査装置及びインライン自動検査システム
JP4845897B2 (ja) * 2008-01-15 2011-12-28 株式会社東芝 サンプルステージ
JP5631020B2 (ja) * 2009-05-01 2014-11-26 株式会社日本マイクロニクス 平板状被検査体の試験装置
KR101093646B1 (ko) 2009-05-01 2011-12-15 가부시키가이샤 니혼 마이크로닉스 평판형상 피검사체의 시험장치
JP5480756B2 (ja) * 2009-11-06 2014-04-23 株式会社日本マイクロニクス 平板状被検査体の試験装置
CN102884567B (zh) * 2010-06-17 2015-01-28 夏普株式会社 点亮检查装置
JP5631114B2 (ja) * 2010-08-24 2014-11-26 株式会社日本マイクロニクス 平板状被検査体の検査装置
KR101269443B1 (ko) * 2011-09-20 2013-05-30 참엔지니어링(주) 기판 검사 및 리페어 장치
KR101269446B1 (ko) 2011-10-05 2013-05-30 참엔지니어링(주) 기판 검사 및 리페어 장치
JP6194767B2 (ja) * 2013-03-14 2017-09-13 株式会社リコー 液体吐出ヘッド及び画像形成装置
KR101593505B1 (ko) * 2014-10-27 2016-02-12 주식회사 애이시에스 가변 엘시디/오엘이디 검사 장치
CN112595725A (zh) * 2020-11-30 2021-04-02 大族激光科技产业集团股份有限公司 一种检测载物台及检测系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5391376A (en) * 1977-01-24 1978-08-11 Hirohide Yano Device for inspecting printed board
JPS62147369A (ja) * 1985-12-20 1987-07-01 Matsushita Electric Ind Co Ltd パネル接続装置
JP3350899B2 (ja) * 1999-08-31 2002-11-25 株式会社双晶テック プローブブロックの支持枠体
JP3480925B2 (ja) * 2000-09-12 2003-12-22 株式会社双晶テック ディスプレイパネル又はプローブブロックの支持枠体
JP4582958B2 (ja) * 2001-05-30 2010-11-17 株式会社日本マイクロニクス 表示用基板の検査装置
JP4167010B2 (ja) * 2002-06-18 2008-10-15 株式会社日本マイクロニクス 表示用基板の処理装置
JP3816031B2 (ja) * 2002-07-04 2006-08-30 株式会社双晶テック フラットパネルディスプレイの検査装置

Also Published As

Publication number Publication date
JP2006119031A (ja) 2006-05-11
KR100707686B1 (ko) 2007-04-16
KR20060039845A (ko) 2006-05-09
TW200613817A (en) 2006-05-01
JP4570930B2 (ja) 2010-10-27

Similar Documents

Publication Publication Date Title
TWI319498B (en) Electrical connection device for use in display panel examination device
TWI366702B (en) Display device
GB0503150D0 (en) Display device and stand therefor
EP1804233A4 (en) DISPLAY DEVICE
AP2007003936A0 (en) Display device
EP1809086A4 (en) DISPLAY DEVICE
EP1903425A4 (en) SENSITIVE PANEL DISPLAY DEVICE AND PORTABLE APPARATUS
GB2421347B (en) Display device
GB0401999D0 (en) Display device
EP1779218A4 (en) PORTABLE DISPLAY DEVICE
EP1754129A4 (en) PORTABLE DISPLAY DEVICE
EP1742461A4 (en) DISPLAY DEVICE
EP1757092A4 (en) DISPLAY DEVICE
EP1876579A4 (en) DRIVE CIRCUIT AND DISPLAY DEVICE
GB2399217B (en) Flat panel display device
GB2410610B (en) Flat panel display apparatus
EP1751976A4 (en) DISPLAY DEVICE
TWI318310B (en) Probe unit for flat display panel tester
EP1820180A4 (en) DISPLAY DEVICE AND ELECTRONIC DEVICE THEREFOR
EP1749400A4 (en) DISPLAY DEVICE
EP1785970A4 (en) DISPLAY DEVICE
EP1721200A4 (en) MAGNETO-OPTICAL DISPLAY
EP1756699A4 (en) CONNECTOR DEVICE AND DISPLAY EQUIPMENT THEREWITH
TWI369526B (en) Display device
PL1730716T3 (pl) Urządzenie wskazujące