|
CN101713932B
(zh)
|
2002-11-12 |
2012-09-26 |
Asml荷兰有限公司 |
光刻装置和器件制造方法
|
|
US9482966B2
(en)
|
2002-11-12 |
2016-11-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
TWI232357B
(en)
|
2002-11-12 |
2005-05-11 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
US10503084B2
(en)
|
2002-11-12 |
2019-12-10 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7372541B2
(en)
*
|
2002-11-12 |
2008-05-13 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
DE10257766A1
(de)
*
|
2002-12-10 |
2004-07-15 |
Carl Zeiss Smt Ag |
Verfahren zur Einstellung einer gewünschten optischen Eigenschaft eines Projektionsobjektivs sowie mikrolithografische Projektionsbelichtungsanlage
|
|
DE10261775A1
(de)
*
|
2002-12-20 |
2004-07-01 |
Carl Zeiss Smt Ag |
Vorrichtung zur optischen Vermessung eines Abbildungssystems
|
|
SG183572A1
(en)
*
|
2003-02-26 |
2012-09-27 |
Nikon Corp |
Exposure apparatus, exposure method, and method for producing device
|
|
KR101345474B1
(ko)
*
|
2003-03-25 |
2013-12-27 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
EP1612850B1
(en)
*
|
2003-04-07 |
2009-03-25 |
Nikon Corporation |
Exposure apparatus and method for manufacturing a device
|
|
WO2004093159A2
(en)
|
2003-04-09 |
2004-10-28 |
Nikon Corporation |
Immersion lithography fluid control system
|
|
CN103383527B
(zh)
*
|
2003-04-10 |
2015-10-28 |
株式会社尼康 |
包括用于沉浸光刻装置的真空清除的环境系统
|
|
EP1611482B1
(en)
*
|
2003-04-10 |
2015-06-03 |
Nikon Corporation |
Run-off path to collect liquid for an immersion lithography apparatus
|
|
WO2004092833A2
(en)
*
|
2003-04-10 |
2004-10-28 |
Nikon Corporation |
Environmental system including a transport region for an immersion lithography apparatus
|
|
WO2004090633A2
(en)
*
|
2003-04-10 |
2004-10-21 |
Nikon Corporation |
An electro-osmotic element for an immersion lithography apparatus
|
|
JP4582089B2
(ja)
*
|
2003-04-11 |
2010-11-17 |
株式会社ニコン |
液浸リソグラフィ用の液体噴射回収システム
|
|
EP2613195B1
(en)
*
|
2003-04-11 |
2015-12-16 |
Nikon Corporation |
Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
|
|
KR20190007532A
(ko)
*
|
2003-04-11 |
2019-01-22 |
가부시키가이샤 니콘 |
액침 리소그래피에 의한 광학기기의 세정방법
|
|
JP2006523958A
(ja)
|
2003-04-17 |
2006-10-19 |
株式会社ニコン |
液浸リソグラフィで使用するためのオートフォーカス素子の光学的構造
|
|
TWI295414B
(en)
*
|
2003-05-13 |
2008-04-01 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
KR20060009356A
(ko)
*
|
2003-05-15 |
2006-01-31 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
TWI616932B
(zh)
|
2003-05-23 |
2018-03-01 |
Nikon Corp |
Exposure device and component manufacturing method
|
|
TWI470671B
(zh)
|
2003-05-23 |
2015-01-21 |
尼康股份有限公司 |
Exposure method and exposure apparatus, and device manufacturing method
|
|
CN101614966B
(zh)
|
2003-05-28 |
2015-06-17 |
株式会社尼康 |
曝光方法、曝光装置以及器件制造方法
|
|
US7213963B2
(en)
|
2003-06-09 |
2007-05-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
EP2261742A3
(en)
*
|
2003-06-11 |
2011-05-25 |
ASML Netherlands BV |
Lithographic apparatus and device manufacturing method.
|
|
KR101520591B1
(ko)
|
2003-06-13 |
2015-05-14 |
가부시키가이샤 니콘 |
노광 방법, 기판 스테이지, 노광 장치, 및 디바이스 제조 방법
|
|
CN101436003B
(zh)
|
2003-06-19 |
2011-08-17 |
株式会社尼康 |
曝光装置及器件制造方法
|
|
WO2005006026A2
(en)
*
|
2003-07-01 |
2005-01-20 |
Nikon Corporation |
Using isotopically specified fluids as optical elements
|
|
EP2466383B1
(en)
*
|
2003-07-08 |
2014-11-19 |
Nikon Corporation |
Wafer table for immersion lithography
|
|
DE602004030247D1
(de)
*
|
2003-07-09 |
2011-01-05 |
Nippon Kogaku Kk |
Belichtungsvorrichtung und verfahren zur bauelementherstellung
|
|
ATE513309T1
(de)
|
2003-07-09 |
2011-07-15 |
Nikon Corp |
Belichtungsvorrichtung und verfahren zur bauelementeherstellung
|
|
KR101296501B1
(ko)
*
|
2003-07-09 |
2013-08-13 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
US7738074B2
(en)
|
2003-07-16 |
2010-06-15 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
EP3346485A1
(en)
|
2003-07-25 |
2018-07-11 |
Nikon Corporation |
Projection optical system inspecting method and inspection apparatus, and a projection optical system manufacturing method
|
|
CN102323724B
(zh)
|
2003-07-28 |
2014-08-13 |
株式会社尼康 |
液浸曝光装置及其制造方法、曝光装置、器件制造方法
|
|
EP1503244A1
(en)
|
2003-07-28 |
2005-02-02 |
ASML Netherlands B.V. |
Lithographic projection apparatus and device manufacturing method
|
|
US7779781B2
(en)
|
2003-07-31 |
2010-08-24 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
WO2005022616A1
(ja)
*
|
2003-08-29 |
2005-03-10 |
Nikon Corporation |
露光装置及びデバイス製造方法
|
|
TWI263859B
(en)
|
2003-08-29 |
2006-10-11 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
KR101748923B1
(ko)
|
2003-09-03 |
2017-06-19 |
가부시키가이샤 니콘 |
액침 리소그래피용 유체를 제공하기 위한 장치 및 방법
|
|
JP4444920B2
(ja)
*
|
2003-09-19 |
2010-03-31 |
株式会社ニコン |
露光装置及びデバイス製造方法
|
|
SG131929A1
(en)
|
2003-09-29 |
2007-05-28 |
Nikon Corp |
Exposure apparatus, exposure method, and device manufacturing method
|
|
KR101111364B1
(ko)
|
2003-10-08 |
2012-02-27 |
가부시키가이샤 자오 니콘 |
기판 반송 장치 및 기판 반송 방법, 노광 장치 및 노광방법, 디바이스 제조 방법
|
|
JP2005136364A
(ja)
*
|
2003-10-08 |
2005-05-26 |
Zao Nikon Co Ltd |
基板搬送装置、露光装置、並びにデバイス製造方法
|
|
EP1672682A4
(en)
|
2003-10-08 |
2008-10-15 |
Zao Nikon Co Ltd |
SUBSTRATE TRANSPORT DEVICE AND METHOD, EXPOSURE DEVICE AND METHOD AND COMPONENT MANUFACTURING METHOD
|
|
TWI598934B
(zh)
|
2003-10-09 |
2017-09-11 |
Nippon Kogaku Kk |
Exposure apparatus, exposure method, and device manufacturing method
|
|
US7411653B2
(en)
*
|
2003-10-28 |
2008-08-12 |
Asml Netherlands B.V. |
Lithographic apparatus
|
|
US7528929B2
(en)
*
|
2003-11-14 |
2009-05-05 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
SG2014014955A
(en)
|
2003-12-03 |
2014-07-30 |
Nippon Kogaku Kk |
Exposure apparatus, exposure method, method for producing device, and optical part
|
|
US20070081133A1
(en)
*
|
2004-12-14 |
2007-04-12 |
Niikon Corporation |
Projection exposure apparatus and stage unit, and exposure method
|
|
WO2005057636A1
(ja)
|
2003-12-15 |
2005-06-23 |
Nikon Corporation |
ステージ装置、露光装置、及び露光方法
|
|
KR101111363B1
(ko)
*
|
2003-12-15 |
2012-04-12 |
가부시키가이샤 니콘 |
투영노광장치 및 스테이지 장치, 그리고 노광방법
|
|
JP4843503B2
(ja)
*
|
2004-01-20 |
2011-12-21 |
カール・ツァイス・エスエムティー・ゲーエムベーハー |
マイクロリソグラフィ投影露光装置および投影レンズのための測定装置
|
|
US7589822B2
(en)
*
|
2004-02-02 |
2009-09-15 |
Nikon Corporation |
Stage drive method and stage unit, exposure apparatus, and device manufacturing method
|
|
KR101377815B1
(ko)
|
2004-02-03 |
2014-03-26 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
JP5167572B2
(ja)
*
|
2004-02-04 |
2013-03-21 |
株式会社ニコン |
露光装置、露光方法及びデバイス製造方法
|
|
US8208119B2
(en)
*
|
2004-02-04 |
2012-06-26 |
Nikon Corporation |
Exposure apparatus, exposure method, and method for producing device
|
|
US8111373B2
(en)
|
2004-03-25 |
2012-02-07 |
Nikon Corporation |
Exposure apparatus and device fabrication method
|
|
US7034917B2
(en)
*
|
2004-04-01 |
2006-04-25 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method and device manufactured thereby
|
|
US8054448B2
(en)
*
|
2004-05-04 |
2011-11-08 |
Nikon Corporation |
Apparatus and method for providing fluid for immersion lithography
|
|
US7616383B2
(en)
*
|
2004-05-18 |
2009-11-10 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7486381B2
(en)
|
2004-05-21 |
2009-02-03 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
CN100594430C
(zh)
|
2004-06-04 |
2010-03-17 |
卡尔蔡司Smt股份公司 |
用于测量光学成像系统的图像质量的系统
|
|
CN103439863B
(zh)
*
|
2004-06-09 |
2016-01-06 |
株式会社尼康 |
曝光装置、曝光方法、元件制造方法及维护方法
|
|
US7463330B2
(en)
|
2004-07-07 |
2008-12-09 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
JP4894515B2
(ja)
|
2004-07-12 |
2012-03-14 |
株式会社ニコン |
露光装置、デバイス製造方法、及び液体検出方法
|
|
CN100533661C
(zh)
*
|
2004-07-12 |
2009-08-26 |
株式会社尼康 |
曝光条件的决定方法、曝光方法及装置、组件制造方法
|
|
US7304715B2
(en)
|
2004-08-13 |
2007-12-04 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
WO2006019124A1
(ja)
*
|
2004-08-18 |
2006-02-23 |
Nikon Corporation |
露光装置及びデバイス製造方法
|
|
US7701550B2
(en)
*
|
2004-08-19 |
2010-04-20 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7411657B2
(en)
|
2004-11-17 |
2008-08-12 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7256121B2
(en)
*
|
2004-12-02 |
2007-08-14 |
Texas Instruments Incorporated |
Contact resistance reduction by new barrier stack process
|
|
US7446850B2
(en)
*
|
2004-12-03 |
2008-11-04 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7196770B2
(en)
*
|
2004-12-07 |
2007-03-27 |
Asml Netherlands B.V. |
Prewetting of substrate before immersion exposure
|
|
US7397533B2
(en)
*
|
2004-12-07 |
2008-07-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7365827B2
(en)
*
|
2004-12-08 |
2008-04-29 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7352440B2
(en)
*
|
2004-12-10 |
2008-04-01 |
Asml Netherlands B.V. |
Substrate placement in immersion lithography
|
|
US7403261B2
(en)
*
|
2004-12-15 |
2008-07-22 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7880860B2
(en)
*
|
2004-12-20 |
2011-02-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7528931B2
(en)
*
|
2004-12-20 |
2009-05-05 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7405805B2
(en)
*
|
2004-12-28 |
2008-07-29 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7491661B2
(en)
*
|
2004-12-28 |
2009-02-17 |
Asml Netherlands B.V. |
Device manufacturing method, top coat material and substrate
|
|
US20060147821A1
(en)
|
2004-12-30 |
2006-07-06 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
SG124359A1
(en)
*
|
2005-01-14 |
2006-08-30 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
SG124351A1
(en)
*
|
2005-01-14 |
2006-08-30 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
KR101427056B1
(ko)
|
2005-01-31 |
2014-08-05 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
US8692973B2
(en)
*
|
2005-01-31 |
2014-04-08 |
Nikon Corporation |
Exposure apparatus and method for producing device
|
|
CN102385260B
(zh)
|
2005-02-10 |
2014-11-05 |
Asml荷兰有限公司 |
浸没液体、曝光装置及曝光方法
|
|
US8018573B2
(en)
|
2005-02-22 |
2011-09-13 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7224431B2
(en)
*
|
2005-02-22 |
2007-05-29 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7378025B2
(en)
|
2005-02-22 |
2008-05-27 |
Asml Netherlands B.V. |
Fluid filtration method, fluid filtered thereby, lithographic apparatus and device manufacturing method
|
|
US7428038B2
(en)
|
2005-02-28 |
2008-09-23 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method and apparatus for de-gassing a liquid
|
|
US7282701B2
(en)
*
|
2005-02-28 |
2007-10-16 |
Asml Netherlands B.V. |
Sensor for use in a lithographic apparatus
|
|
US7324185B2
(en)
|
2005-03-04 |
2008-01-29 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7684010B2
(en)
*
|
2005-03-09 |
2010-03-23 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method, seal structure, method of removing an object and a method of sealing
|
|
US7330238B2
(en)
*
|
2005-03-28 |
2008-02-12 |
Asml Netherlands, B.V. |
Lithographic apparatus, immersion projection apparatus and device manufacturing method
|
|
US7411654B2
(en)
|
2005-04-05 |
2008-08-12 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
USRE43576E1
(en)
|
2005-04-08 |
2012-08-14 |
Asml Netherlands B.V. |
Dual stage lithographic apparatus and device manufacturing method
|
|
US7291850B2
(en)
*
|
2005-04-08 |
2007-11-06 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
WO2006112436A1
(ja)
*
|
2005-04-18 |
2006-10-26 |
Nikon Corporation |
露光装置及び露光方法、並びにデバイス製造方法
|
|
US8248577B2
(en)
|
2005-05-03 |
2012-08-21 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7317507B2
(en)
*
|
2005-05-03 |
2008-01-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7433016B2
(en)
*
|
2005-05-03 |
2008-10-07 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7652746B2
(en)
*
|
2005-06-21 |
2010-01-26 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7751027B2
(en)
|
2005-06-21 |
2010-07-06 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
JP2007005571A
(ja)
*
|
2005-06-24 |
2007-01-11 |
Nikon Corp |
露光装置及びデバイス製造方法
|
|
US7834974B2
(en)
|
2005-06-28 |
2010-11-16 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7468779B2
(en)
*
|
2005-06-28 |
2008-12-23 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7474379B2
(en)
|
2005-06-28 |
2009-01-06 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US8054445B2
(en)
*
|
2005-08-16 |
2011-11-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7357768B2
(en)
*
|
2005-09-22 |
2008-04-15 |
William Marshall |
Recliner exerciser
|
|
US7411658B2
(en)
*
|
2005-10-06 |
2008-08-12 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7804577B2
(en)
|
2005-11-16 |
2010-09-28 |
Asml Netherlands B.V. |
Lithographic apparatus
|
|
US7864292B2
(en)
*
|
2005-11-16 |
2011-01-04 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7656501B2
(en)
*
|
2005-11-16 |
2010-02-02 |
Asml Netherlands B.V. |
Lithographic apparatus
|
|
US7633073B2
(en)
*
|
2005-11-23 |
2009-12-15 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
JP4765580B2
(ja)
*
|
2005-11-28 |
2011-09-07 |
株式会社ニコン |
液浸観察方法、液浸顕微鏡装置、及び検査装置
|
|
US20070124987A1
(en)
*
|
2005-12-05 |
2007-06-07 |
Brown Jeffrey K |
Electronic pest control apparatus
|
|
KR100768849B1
(ko)
*
|
2005-12-06 |
2007-10-22 |
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|
|
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(ja)
|
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|
|
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(en)
*
|
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|
|
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(ja)
*
|
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|
|
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(en)
*
|
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|
|
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|
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|
|
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*
|
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|
|
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*
|
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|
|
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(de)
|
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|
|
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*
|
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|
|
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*
|
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|
|
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(en)
*
|
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|
|
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(en)
*
|
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|
|
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(en)
|
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|
|
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(en)
*
|
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|
|
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(en)
|
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|
|
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(en)
*
|
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|
|
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(en)
*
|
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|
|
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(en)
*
|
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|
|
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(en)
*
|
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|
|
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(en)
*
|
2007-05-04 |
2015-02-03 |
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|
|
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(en)
|
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|
|
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(en)
*
|
2007-05-24 |
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|
|
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(en)
|
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|
|
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(en)
*
|
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|
|
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(zh)
|
2007-07-13 |
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|
|
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(en)
*
|
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|
|
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(ja)
|
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|
|
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(ko)
*
|
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|
|
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(nl)
*
|
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|
|
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(en)
*
|
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|
|
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(en)
*
|
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|
|
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(en)
*
|
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|
|
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(en)
|
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|
|
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(en)
|
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|
|
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(en)
|
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|
|
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(zh)
|
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|
|
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(en)
|
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|
|
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(en)
|
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|
|
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(en)
*
|
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|
|
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*
|
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|
|
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*
|
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|
|
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|
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|