TWI299800B - - Google Patents

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Publication number
TWI299800B
TWI299800B TW094140142A TW94140142A TWI299800B TW I299800 B TWI299800 B TW I299800B TW 094140142 A TW094140142 A TW 094140142A TW 94140142 A TW94140142 A TW 94140142A TW I299800 B TWI299800 B TW I299800B
Authority
TW
Taiwan
Prior art keywords
liquid crystal
crystal panel
gas
support portion
inspection
Prior art date
Application number
TW094140142A
Other languages
English (en)
Chinese (zh)
Other versions
TW200622388A (en
Inventor
Norie Yamaguchi
Masayuki Anzai
Jyunichi Kogawa
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200622388A publication Critical patent/TW200622388A/zh
Application granted granted Critical
Publication of TWI299800B publication Critical patent/TWI299800B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
TW094140142A 2004-12-21 2005-11-15 Apparatus for inspecting of LCD panel TW200622388A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004370059A JP2006178107A (ja) 2004-12-21 2004-12-21 液晶パネル検査装置

Publications (2)

Publication Number Publication Date
TW200622388A TW200622388A (en) 2006-07-01
TWI299800B true TWI299800B (ko) 2008-08-11

Family

ID=36732285

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094140142A TW200622388A (en) 2004-12-21 2005-11-15 Apparatus for inspecting of LCD panel

Country Status (3)

Country Link
JP (1) JP2006178107A (ko)
KR (1) KR100725896B1 (ko)
TW (1) TW200622388A (ko)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4786590B2 (ja) * 2007-05-10 2011-10-05 日本エンジニアリング株式会社 半導体装置の搬送装置
KR101615181B1 (ko) * 2014-12-30 2016-04-25 주식회사 아이에스시 카메라 모듈 테스트 소켓
CN105486689B (zh) * 2015-12-23 2018-01-23 苏州精濑光电有限公司 光学检测机
CN109426012B (zh) * 2017-08-21 2023-11-10 凌云光技术股份有限公司 一种用于显示屏检测的背光治具
CN116165814B (zh) * 2023-03-02 2024-08-20 达运精密工业（厦门）有限公司 自动点灯装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004094140A (ja) * 2002-09-04 2004-03-25 Sony Corp 液晶パネル検査装置
KR20060024051A (ko) * 2004-09-13 2006-03-16 엘지.필립스 엘시디 주식회사 액정표시장치

Also Published As

Publication number Publication date
TW200622388A (en) 2006-07-01
KR100725896B1 (ko) 2007-06-08
KR20060071313A (ko) 2006-06-26
JP2006178107A (ja) 2006-07-06

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