JP2006178107A - 液晶パネル検査装置 - Google Patents

液晶パネル検査装置 Download PDF

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Publication number
JP2006178107A
JP2006178107A JP2004370059A JP2004370059A JP2006178107A JP 2006178107 A JP2006178107 A JP 2006178107A JP 2004370059 A JP2004370059 A JP 2004370059A JP 2004370059 A JP2004370059 A JP 2004370059A JP 2006178107 A JP2006178107 A JP 2006178107A
Authority
JP
Japan
Prior art keywords
liquid crystal
crystal panel
gas
support portion
stage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004370059A
Other languages
English (en)
Japanese (ja)
Inventor
Norihide Yamaguchi
憲栄 山口
Masayuki Anzai
正行 安斎
Junichi Furukawa
順一 古川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
Original Assignee
Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Priority to JP2004370059A priority Critical patent/JP2006178107A/ja
Priority to TW094140142A priority patent/TW200622388A/zh
Priority to KR1020050114091A priority patent/KR100725896B1/ko
Publication of JP2006178107A publication Critical patent/JP2006178107A/ja
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2004370059A 2004-12-21 2004-12-21 液晶パネル検査装置 Pending JP2006178107A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2004370059A JP2006178107A (ja) 2004-12-21 2004-12-21 液晶パネル検査装置
TW094140142A TW200622388A (en) 2004-12-21 2005-11-15 Apparatus for inspecting of LCD panel
KR1020050114091A KR100725896B1 (ko) 2004-12-21 2005-11-28 액정패널 검사장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004370059A JP2006178107A (ja) 2004-12-21 2004-12-21 液晶パネル検査装置

Publications (1)

Publication Number Publication Date
JP2006178107A true JP2006178107A (ja) 2006-07-06

Family

ID=36732285

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004370059A Pending JP2006178107A (ja) 2004-12-21 2004-12-21 液晶パネル検査装置

Country Status (3)

Country Link
JP (1) JP2006178107A (ko)
KR (1) KR100725896B1 (ko)
TW (1) TW200622388A (ko)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008281439A (ja) * 2007-05-10 2008-11-20 Nippon Eng Kk 半導体装置の搬送装置
CN105486689A (zh) * 2015-12-23 2016-04-13 苏州精濑光电有限公司 光学检测机

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101615181B1 (ko) * 2014-12-30 2016-04-25 주식회사 아이에스시 카메라 모듈 테스트 소켓
CN109426012B (zh) * 2017-08-21 2023-11-10 凌云光技术股份有限公司 一种用于显示屏检测的背光治具

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004094140A (ja) * 2002-09-04 2004-03-25 Sony Corp 液晶パネル検査装置
KR20060024051A (ko) * 2004-09-13 2006-03-16 엘지.필립스 엘시디 주식회사 액정표시장치

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008281439A (ja) * 2007-05-10 2008-11-20 Nippon Eng Kk 半導体装置の搬送装置
CN105486689A (zh) * 2015-12-23 2016-04-13 苏州精濑光电有限公司 光学检测机
CN107655899A (zh) * 2015-12-23 2018-02-02 苏州精濑光电有限公司 光学检测机

Also Published As

Publication number Publication date
KR20060071313A (ko) 2006-06-26
TW200622388A (en) 2006-07-01
TWI299800B (ko) 2008-08-11
KR100725896B1 (ko) 2007-06-08

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