TW200622388A - Apparatus for inspecting of LCD panel - Google Patents

Apparatus for inspecting of LCD panel

Info

Publication number
TW200622388A
TW200622388A TW094140142A TW94140142A TW200622388A TW 200622388 A TW200622388 A TW 200622388A TW 094140142 A TW094140142 A TW 094140142A TW 94140142 A TW94140142 A TW 94140142A TW 200622388 A TW200622388 A TW 200622388A
Authority
TW
Taiwan
Prior art keywords
liquid crystal
crystal panel
rear face
inspection stage
inspecting
Prior art date
Application number
TW094140142A
Other languages
Chinese (zh)
Other versions
TWI299800B (en
Inventor
Norie Yamaguchi
Masayuki Anzai
Jyunichi Kogawa
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200622388A publication Critical patent/TW200622388A/en
Application granted granted Critical
Publication of TWI299800B publication Critical patent/TWI299800B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Computer Hardware Design (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

To suppress the temperature rising of a liquid crystal panel by blowing a gas on a rear face of the liquid crystal panel supported on an inspection stage. The liquid crystal panel (48) is supported with a panel holder (14) of the inspection stage on its peripheral portion. At least a part of the rear face of the liquid crystal panel 48 is exposed to an inner space (64) of the inspection stage. A nozzle (62) has an opening in the inner space (64). Air (68) from the nozzle (62) is blown to the rear face of the liquid crystal panel (48). After cooling the liquid crystal panel (48), the air 68 goes out from a discharge space (28). Even when the liquid crystal panel (48) is illuminated with a backlight (34), the temperature of the liquid crystal panel (48) does not rise significantly.
TW094140142A 2004-12-21 2005-11-15 Apparatus for inspecting of LCD panel TW200622388A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004370059A JP2006178107A (en) 2004-12-21 2004-12-21 Device for inspecting liquid crystal panel

Publications (2)

Publication Number Publication Date
TW200622388A true TW200622388A (en) 2006-07-01
TWI299800B TWI299800B (en) 2008-08-11

Family

ID=36732285

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094140142A TW200622388A (en) 2004-12-21 2005-11-15 Apparatus for inspecting of LCD panel

Country Status (3)

Country Link
JP (1) JP2006178107A (en)
KR (1) KR100725896B1 (en)
TW (1) TW200622388A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107655899A (en) * 2015-12-23 2018-02-02 苏州精濑光电有限公司 Optical detector

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4786590B2 (en) * 2007-05-10 2011-10-05 日本エンジニアリング株式会社 Semiconductor device transfer device
KR101615181B1 (en) * 2014-12-30 2016-04-25 주식회사 아이에스시 camera module testing socket
CN109426012B (en) * 2017-08-21 2023-11-10 凌云光技术股份有限公司 Backlight jig for display screen detection

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004094140A (en) * 2002-09-04 2004-03-25 Sony Corp Inspection apparatus of liquid crystal panel
KR20060024051A (en) * 2004-09-13 2006-03-16 엘지.필립스 엘시디 주식회사 Liquid crystal display device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107655899A (en) * 2015-12-23 2018-02-02 苏州精濑光电有限公司 Optical detector

Also Published As

Publication number Publication date
TWI299800B (en) 2008-08-11
JP2006178107A (en) 2006-07-06
KR20060071313A (en) 2006-06-26
KR100725896B1 (en) 2007-06-08

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