TWI285796B - Exposure apparatus and device manufacturing method - Google Patents

Exposure apparatus and device manufacturing method Download PDF

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Publication number
TWI285796B
TWI285796B TW093139536A TW93139536A TWI285796B TW I285796 B TWI285796 B TW I285796B TW 093139536 A TW093139536 A TW 093139536A TW 93139536 A TW93139536 A TW 93139536A TW I285796 B TWI285796 B TW I285796B
Authority
TW
Taiwan
Prior art keywords
fluid
carbon dioxide
exposure apparatus
optical system
unit
Prior art date
Application number
TW093139536A
Other languages
English (en)
Chinese (zh)
Other versions
TW200532388A (en
Inventor
Tokuyuki Honda
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Publication of TW200532388A publication Critical patent/TW200532388A/zh
Application granted granted Critical
Publication of TWI285796B publication Critical patent/TWI285796B/zh

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G03F7/2041—Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04—Apparatus for manufacture or treatment
    • H10P72/0448—Apparatus for applying a liquid, a resin, an ink or the like

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
TW093139536A 2003-12-19 2004-12-17 Exposure apparatus and device manufacturing method TWI285796B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003422932A JP4323946B2 (ja) 2003-12-19 2003-12-19 露光装置

Publications (2)

Publication Number Publication Date
TW200532388A TW200532388A (en) 2005-10-01
TWI285796B true TWI285796B (en) 2007-08-21

Family

ID=34708744

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093139536A TWI285796B (en) 2003-12-19 2004-12-17 Exposure apparatus and device manufacturing method

Country Status (6)

Country Link
US (1) US7292309B2 (enExample)
EP (1) EP1697974A4 (enExample)
JP (1) JP4323946B2 (enExample)
KR (1) KR100801354B1 (enExample)
TW (1) TWI285796B (enExample)
WO (1) WO2005062351A1 (enExample)

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CN103605262B (zh) * 2004-06-09 2016-06-29 株式会社尼康 曝光装置及其维护方法、以及元件制造方法
JP4752473B2 (ja) 2004-12-09 2011-08-17 株式会社ニコン 露光装置、露光方法及びデバイス製造方法
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EP1849040A2 (en) * 2005-02-10 2007-10-31 ASML Netherlands B.V. Immersion liquid, exposure apparatus, and exposure process
USRE43576E1 (en) 2005-04-08 2012-08-14 Asml Netherlands B.V. Dual stage lithographic apparatus and device manufacturing method
US20060232753A1 (en) 2005-04-19 2006-10-19 Asml Holding N.V. Liquid immersion lithography system with tilted liquid flow
CN100541719C (zh) * 2005-04-25 2009-09-16 株式会社尼康 曝光方法和曝光装置、以及器件制造方法
WO2006115186A1 (ja) * 2005-04-25 2006-11-02 Nikon Corporation 露光方法及び露光装置、並びにデバイス製造方法
JP2006319064A (ja) 2005-05-11 2006-11-24 Canon Inc 測定装置、露光方法及び装置
EP1895571A4 (en) * 2005-06-21 2011-04-27 Nikon Corp EXPOSURE DEVICE, EXPOSURE METHOD, MAINTENANCE METHOD AND COMPONENT MANUFACTURING METHOD
US20070085989A1 (en) * 2005-06-21 2007-04-19 Nikon Corporation Exposure apparatus and exposure method, maintenance method, and device manufacturing method
WO2007001848A2 (en) * 2005-06-24 2007-01-04 Sachem, Inc. High refractive index fluids with low absorption for immersion lithography
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KR101712219B1 (ko) 2009-03-10 2017-03-03 가부시키가이샤 니콘 노광 장치, 노광 방법, 및 디바이스 제조 방법
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JP6505534B2 (ja) * 2015-07-22 2019-04-24 株式会社平間理化研究所 現像液の管理方法及び装置

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI414909B (zh) * 2007-10-04 2013-11-11 佳能股份有限公司 定位設備、曝光設備、和製造裝置的方法

Also Published As

Publication number Publication date
KR100801354B1 (ko) 2008-02-05
US20060050257A1 (en) 2006-03-09
TW200532388A (en) 2005-10-01
WO2005062351A1 (en) 2005-07-07
JP2005183693A (ja) 2005-07-07
JP4323946B2 (ja) 2009-09-02
US7292309B2 (en) 2007-11-06
KR20060101529A (ko) 2006-09-25
EP1697974A4 (en) 2009-07-29
EP1697974A1 (en) 2006-09-06

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