TWI256097B - Time resolved non-invasive diagnostics system - Google Patents

Time resolved non-invasive diagnostics system

Info

Publication number
TWI256097B
TWI256097B TW091134678A TW91134678A TWI256097B TW I256097 B TWI256097 B TW I256097B TW 091134678 A TW091134678 A TW 091134678A TW 91134678 A TW91134678 A TW 91134678A TW I256097 B TWI256097 B TW I256097B
Authority
TW
Taiwan
Prior art keywords
optics
chip
light source
time resolved
diagnostics system
Prior art date
Application number
TW091134678A
Other languages
English (en)
Other versions
TW200301528A (en
Inventor
Daniel Murdoch Cotton
Nader Pakdaman
James Squire Vickers
Thomas Wong
Original Assignee
Optonics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=25541938&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=TWI256097(B) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Optonics Inc filed Critical Optonics Inc
Publication of TW200301528A publication Critical patent/TW200301528A/zh
Application granted granted Critical
Publication of TWI256097B publication Critical patent/TWI256097B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
TW091134678A 2001-11-28 2002-11-28 Time resolved non-invasive diagnostics system TWI256097B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/995,548 US6621275B2 (en) 2001-11-28 2001-11-28 Time resolved non-invasive diagnostics system

Publications (2)

Publication Number Publication Date
TW200301528A TW200301528A (en) 2003-07-01
TWI256097B true TWI256097B (en) 2006-06-01

Family

ID=25541938

Family Applications (1)

Application Number Title Priority Date Filing Date
TW091134678A TWI256097B (en) 2001-11-28 2002-11-28 Time resolved non-invasive diagnostics system

Country Status (7)

Country Link
US (3) US6621275B2 (zh)
EP (1) EP1448999A1 (zh)
JP (3) JP2005510737A (zh)
KR (1) KR20040071686A (zh)
CN (1) CN100381832C (zh)
TW (1) TWI256097B (zh)
WO (1) WO2003046593A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
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TWI803568B (zh) * 2018-01-26 2023-06-01 日商濱松赫德尼古斯股份有限公司 光檢測裝置

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JP2005510737A (ja) 2005-04-21
JP5205531B2 (ja) 2013-06-05
KR20040071686A (ko) 2004-08-12
US6621275B2 (en) 2003-09-16
US20070206846A1 (en) 2007-09-06
WO2003046593A1 (en) 2003-06-05
US7466852B2 (en) 2008-12-16
CN100381832C (zh) 2008-04-16
JP2010014723A (ja) 2010-01-21
US7224828B2 (en) 2007-05-29
US20030098692A1 (en) 2003-05-29
CN1592854A (zh) 2005-03-09
US20030210057A1 (en) 2003-11-13
TW200301528A (en) 2003-07-01
EP1448999A1 (en) 2004-08-25
JP5140049B2 (ja) 2013-02-06
JP2012168191A (ja) 2012-09-06

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