TWD177826S - 積體電路插座用探針引腳 - Google Patents

積體電路插座用探針引腳

Info

Publication number
TWD177826S
TWD177826S TW104303166F TW104303166F TWD177826S TW D177826 S TWD177826 S TW D177826S TW 104303166 F TW104303166 F TW 104303166F TW 104303166 F TW104303166 F TW 104303166F TW D177826 S TWD177826 S TW D177826S
Authority
TW
Taiwan
Prior art keywords
integrated circuit
socket
probe pin
case
article
Prior art date
Application number
TW104303166F
Other languages
English (en)
Chinese (zh)
Inventor
Hirotada Teranishi
Takahiro Sakai
Original Assignee
歐姆龍股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 歐姆龍股份有限公司 filed Critical 歐姆龍股份有限公司
Publication of TWD177826S publication Critical patent/TWD177826S/zh

Links

TW104303166F 2014-12-15 2015-06-11 積體電路插座用探針引腳 TWD177826S (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2014-27892F JP1529607S (enrdf_load_stackoverflow) 2014-12-15 2014-12-15

Publications (1)

Publication Number Publication Date
TWD177826S true TWD177826S (zh) 2016-08-21

Family

ID=53764634

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104303166F TWD177826S (zh) 2014-12-15 2015-06-11 積體電路插座用探針引腳

Country Status (3)

Country Link
US (1) USD769748S1 (enrdf_load_stackoverflow)
JP (1) JP1529607S (enrdf_load_stackoverflow)
TW (1) TWD177826S (enrdf_load_stackoverflow)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP1592871S (enrdf_load_stackoverflow) * 2017-02-10 2017-12-11
USD869305S1 (en) * 2017-02-10 2019-12-10 Kabushiki Kaisha Nihon Micronics Probe pin
JP1622969S (enrdf_load_stackoverflow) * 2018-02-02 2019-01-28
JP1626667S (enrdf_load_stackoverflow) * 2018-02-02 2019-03-18
JP1623280S (enrdf_load_stackoverflow) * 2018-02-02 2019-01-28
JP1622968S (enrdf_load_stackoverflow) * 2018-02-02 2019-01-28
JP1623279S (enrdf_load_stackoverflow) * 2018-02-02 2019-01-28
TWD197822S (zh) * 2018-02-02 2019-06-01 Nihon Micronics Kk 電性接觸子之部分
JP1622970S (enrdf_load_stackoverflow) * 2018-02-02 2019-01-28
JP1626668S (enrdf_load_stackoverflow) * 2018-02-02 2019-03-18
JP1624757S (enrdf_load_stackoverflow) * 2018-05-16 2019-02-18
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test
USD1042182S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
USD1042181S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
USD1015282S1 (en) * 2022-02-01 2024-02-20 Johnstech International Corporation Spring pin tip
TWD226028S (zh) * 2022-04-29 2023-06-21 南韓商普因特工程有限公司 半導體檢測針
TWD227961S (zh) * 2022-04-29 2023-10-11 南韓商普因特工程有限公司 半導體檢測針
USD1090440S1 (en) * 2023-01-12 2025-08-26 Johnstech International Corporation Spring probe contact assembly

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USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
WO2011036800A1 (ja) * 2009-09-28 2011-03-31 株式会社日本マイクロニクス 接触子及び電気的接続装置
KR101058146B1 (ko) * 2009-11-11 2011-08-24 하이콘 주식회사 스프링 콘택트 및 스프링 콘택트 내장 소켓
TWD138876S1 (zh) * 2010-01-27 2011-02-01 日本麥克隆尼股份有限公司 電接觸元件
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP4998838B2 (ja) * 2010-04-09 2012-08-15 山一電機株式会社 プローブピン及びそれを備えるｉｃソケット
JP5352525B2 (ja) 2010-04-28 2013-11-27 日本航空電子工業株式会社 プローブピン用コンタクト、プローブピンおよび電子デバイス用接続治具
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
JP5699899B2 (ja) * 2011-10-14 2015-04-15 オムロン株式会社 接触子
JP5708430B2 (ja) * 2011-10-14 2015-04-30 オムロン株式会社 接触子
TWD157152S (zh) 2012-05-08 2013-11-11 日本麥克隆尼股份有限公司 電接觸元件
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead

Also Published As

Publication number Publication date
USD769748S1 (en) 2016-10-25
JP1529607S (enrdf_load_stackoverflow) 2015-07-27

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