JP1622970S - - Google Patents

Info

Publication number
JP1622970S
JP1622970S JPD2018-2100F JP2018002100F JP1622970S JP 1622970 S JP1622970 S JP 1622970S JP 2018002100 F JP2018002100 F JP 2018002100F JP 1622970 S JP1622970 S JP 1622970S
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JPD2018-2100F
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JPD2018-2100F priority Critical patent/JP1622970S/ja
Priority to US29/658,653 priority patent/USD874958S1/en
Priority to TW107304475F priority patent/TWD195583S/zh
Application granted granted Critical
Publication of JP1622970S publication Critical patent/JP1622970S/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JPD2018-2100F 2018-02-02 2018-02-02 Active JP1622970S (enrdf_load_stackoverflow)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JPD2018-2100F JP1622970S (enrdf_load_stackoverflow) 2018-02-02 2018-02-02
US29/658,653 USD874958S1 (en) 2018-02-02 2018-08-01 Electric contact
TW107304475F TWD195583S (zh) 2018-02-02 2018-08-01 電性接觸子之部分

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2018-2100F JP1622970S (enrdf_load_stackoverflow) 2018-02-02 2018-02-02

Publications (1)

Publication Number Publication Date
JP1622970S true JP1622970S (enrdf_load_stackoverflow) 2019-01-28

Family

ID=65237673

Family Applications (1)

Application Number Title Priority Date Filing Date
JPD2018-2100F Active JP1622970S (enrdf_load_stackoverflow) 2018-02-02 2018-02-02

Country Status (3)

Country Link
US (1) USD874958S1 (enrdf_load_stackoverflow)
JP (1) JP1622970S (enrdf_load_stackoverflow)
TW (1) TWD195583S (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD956005S1 (en) 2019-09-19 2022-06-28 Applied Materials, Inc. Shaped electrode

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4634968A (en) * 1982-12-20 1987-01-06 The Narda Microwave Corporation Wide range radiation monitor
US4740746A (en) * 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
US4716365A (en) * 1985-10-11 1987-12-29 Lisle Corporation Circuit tester
USD311346S (en) * 1987-09-25 1990-10-16 Q.A. Technology Company Electronic test probe
US5172051A (en) * 1991-04-24 1992-12-15 Hewlett-Packard Company Wide bandwidth passive probe
USD397052S (en) * 1997-04-08 1998-08-18 Societe Chauvin Arnoux Test lead
US7208971B2 (en) * 2002-10-15 2007-04-24 General Electric Company Manual probe carriage system and method of using the same
US9046568B2 (en) * 2009-03-27 2015-06-02 Essai, Inc. Universal spring contact pin and IC test socket therefor
CN102004173B (zh) * 2009-09-01 2014-02-19 鸿富锦精密工业（深圳）有限公司 探针
TWI421504B (zh) * 2010-07-02 2014-01-01 Isc Co Ltd 測試用的測試探針以及其製造方法
US8912803B2 (en) * 2011-09-19 2014-12-16 Honeywell International, Inc. Electrostatic shielding technique on high voltage diodes
EP2836847B1 (en) * 2012-04-13 2016-05-18 Delaware Capital Formation, Inc. Test probe assembly and related methods
JP6011103B2 (ja) * 2012-07-23 2016-10-19 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット
USD686098S1 (en) * 2012-11-14 2013-07-16 Agar Corporation Ltd. Antenna detection probe for a storage tank
JP6269337B2 (ja) * 2014-06-16 2018-01-31 オムロン株式会社 プローブピン、および、これを用いた電子デバイス
JP1529605S (enrdf_load_stackoverflow) * 2014-12-15 2015-07-27
JP1529608S (enrdf_load_stackoverflow) * 2014-12-15 2015-07-27
JP1529607S (enrdf_load_stackoverflow) * 2014-12-15 2015-07-27
JP1529612S (enrdf_load_stackoverflow) * 2014-12-19 2015-07-27
US10241133B2 (en) * 2014-12-31 2019-03-26 Tektronix, Inc. Probe tip and probe assembly
US9810715B2 (en) * 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip

Also Published As

Publication number Publication date
TWD195583S (zh) 2019-01-21
USD874958S1 (en) 2020-02-11

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