USD874958S1 - Electric contact - Google Patents

Electric contact Download PDF

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Publication number
USD874958S1
USD874958S1 US29/658,653 US201829658653F USD874958S US D874958 S1 USD874958 S1 US D874958S1 US 201829658653 F US201829658653 F US 201829658653F US D874958 S USD874958 S US D874958S
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US
United States
Prior art keywords
electric contact
view
design
indicated
section
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
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US29/658,653
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English (en)
Inventor
Mika NASU
Yoshihiko Otsuka
Namiko Fukatsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
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Micronics Japan Co Ltd
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Assigned to KABUSHIKI KAISHA NIHON MICRONICS reassignment KABUSHIKI KAISHA NIHON MICRONICS ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: FUKATSU, NAMIKO, OTSUKA, YOSHIHIKO, NASU, MIKA
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US29/658,653 2018-02-02 2018-08-01 Electric contact Active USD874958S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2018-2100F JP1622970S (enrdf_load_stackoverflow) 2018-02-02 2018-02-02
JP2018-002100 2018-02-02

Publications (1)

Publication Number Publication Date
USD874958S1 true USD874958S1 (en) 2020-02-11

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ID=65237673

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/658,653 Active USD874958S1 (en) 2018-02-02 2018-08-01 Electric contact

Country Status (3)

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US (1) USD874958S1 (enrdf_load_stackoverflow)
JP (1) JP1622970S (enrdf_load_stackoverflow)
TW (1) TWD195583S (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD956005S1 (en) 2019-09-19 2022-06-28 Applied Materials, Inc. Shaped electrode

Citations (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4634968A (en) * 1982-12-20 1987-01-06 The Narda Microwave Corporation Wide range radiation monitor
US4716365A (en) * 1985-10-11 1987-12-29 Lisle Corporation Circuit tester
US4740746A (en) * 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
USD311346S (en) * 1987-09-25 1990-10-16 Q.A. Technology Company Electronic test probe
US5172051A (en) * 1991-04-24 1992-12-15 Hewlett-Packard Company Wide bandwidth passive probe
USD397052S (en) * 1997-04-08 1998-08-18 Societe Chauvin Arnoux Test lead
US7208971B2 (en) * 2002-10-15 2007-04-24 General Electric Company Manual probe carriage system and method of using the same
US20110050261A1 (en) * 2009-09-01 2011-03-03 Hon Hai Precision Industry Co., Ltd. Test probe
US20130069669A1 (en) * 2011-09-19 2013-03-21 Vasu MOGAVEERA Electrostatic shielding technique on high voltage diodes
USD686098S1 (en) * 2012-11-14 2013-07-16 Agar Corporation Ltd. Antenna detection probe for a storage tank
US20150070040A1 (en) * 2012-04-13 2015-03-12 Xcerra Corporation Test probe assembly and related methods
US9046568B2 (en) * 2009-03-27 2015-06-02 Essai, Inc. Universal spring contact pin and IC test socket therefor
US20150369859A1 (en) * 2012-07-23 2015-12-24 Yamaichi Electronics Co., Ltd. Contact probe and semiconductor element socket provided with same
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
US9547023B2 (en) * 2010-07-02 2017-01-17 Isc Co., Ltd. Test probe for test and fabrication method thereof
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
US20170138985A1 (en) * 2014-06-16 2017-05-18 Omron Corporation Probe pin and electronic device using the same
US9810715B2 (en) * 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip
US10241133B2 (en) * 2014-12-31 2019-03-26 Tektronix, Inc. Probe tip and probe assembly

Patent Citations (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4634968A (en) * 1982-12-20 1987-01-06 The Narda Microwave Corporation Wide range radiation monitor
US4740746A (en) * 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
US4716365A (en) * 1985-10-11 1987-12-29 Lisle Corporation Circuit tester
USD311346S (en) * 1987-09-25 1990-10-16 Q.A. Technology Company Electronic test probe
US5172051A (en) * 1991-04-24 1992-12-15 Hewlett-Packard Company Wide bandwidth passive probe
USD397052S (en) * 1997-04-08 1998-08-18 Societe Chauvin Arnoux Test lead
US7208971B2 (en) * 2002-10-15 2007-04-24 General Electric Company Manual probe carriage system and method of using the same
US9046568B2 (en) * 2009-03-27 2015-06-02 Essai, Inc. Universal spring contact pin and IC test socket therefor
US20110050261A1 (en) * 2009-09-01 2011-03-03 Hon Hai Precision Industry Co., Ltd. Test probe
US8283939B2 (en) * 2009-09-01 2012-10-09 Hon Hai Precision Industry Co., Ltd. Test probe
US9547023B2 (en) * 2010-07-02 2017-01-17 Isc Co., Ltd. Test probe for test and fabrication method thereof
US20130069669A1 (en) * 2011-09-19 2013-03-21 Vasu MOGAVEERA Electrostatic shielding technique on high voltage diodes
US20150070040A1 (en) * 2012-04-13 2015-03-12 Xcerra Corporation Test probe assembly and related methods
US20150369859A1 (en) * 2012-07-23 2015-12-24 Yamaichi Electronics Co., Ltd. Contact probe and semiconductor element socket provided with same
USD686098S1 (en) * 2012-11-14 2013-07-16 Agar Corporation Ltd. Antenna detection probe for a storage tank
US20170138985A1 (en) * 2014-06-16 2017-05-18 Omron Corporation Probe pin and electronic device using the same
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
US9810715B2 (en) * 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip
US10241133B2 (en) * 2014-12-31 2019-03-26 Tektronix, Inc. Probe tip and probe assembly

Also Published As

Publication number Publication date
TWD195583S (zh) 2019-01-21
JP1622970S (enrdf_load_stackoverflow) 2019-01-28

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