TWD195583S - 電性接觸子之部分 - Google Patents

電性接觸子之部分

Info

Publication number
TWD195583S
TWD195583S TW107304475F TW107304475F TWD195583S TW D195583 S TWD195583 S TW D195583S TW 107304475 F TW107304475 F TW 107304475F TW 107304475 F TW107304475 F TW 107304475F TW D195583 S TWD195583 S TW D195583S
Authority
TW
Taiwan
Prior art keywords
design
view
line
sectional
enlarged view
Prior art date
Application number
TW107304475F
Other languages
English (en)
Chinese (zh)
Inventor
那須美佳
大喜彦
深津奈美子
Original Assignee
日商日本麥克隆尼股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商日本麥克隆尼股份有限公司 filed Critical 日商日本麥克隆尼股份有限公司
Publication of TWD195583S publication Critical patent/TWD195583S/zh

Links

TW107304475F 2018-02-02 2018-08-01 電性接觸子之部分 TWD195583S (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2018-2100F JP1622970S (enrdf_load_stackoverflow) 2018-02-02 2018-02-02
JP2018-002100 2018-02-02

Publications (1)

Publication Number Publication Date
TWD195583S true TWD195583S (zh) 2019-01-21

Family

ID=65237673

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107304475F TWD195583S (zh) 2018-02-02 2018-08-01 電性接觸子之部分

Country Status (3)

Country Link
US (1) USD874958S1 (enrdf_load_stackoverflow)
JP (1) JP1622970S (enrdf_load_stackoverflow)
TW (1) TWD195583S (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWD207500S (zh) 2019-09-19 2020-10-01 美商應用材料股份有限公司 成形電極

Family Cites Families (21)

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US4634968A (en) * 1982-12-20 1987-01-06 The Narda Microwave Corporation Wide range radiation monitor
US4740746A (en) * 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
US4716365A (en) * 1985-10-11 1987-12-29 Lisle Corporation Circuit tester
USD311346S (en) * 1987-09-25 1990-10-16 Q.A. Technology Company Electronic test probe
US5172051A (en) * 1991-04-24 1992-12-15 Hewlett-Packard Company Wide bandwidth passive probe
USD397052S (en) * 1997-04-08 1998-08-18 Societe Chauvin Arnoux Test lead
US7208971B2 (en) * 2002-10-15 2007-04-24 General Electric Company Manual probe carriage system and method of using the same
US9046568B2 (en) * 2009-03-27 2015-06-02 Essai, Inc. Universal spring contact pin and IC test socket therefor
CN102004173B (zh) * 2009-09-01 2014-02-19 鸿富锦精密工业（深圳）有限公司 探针
TWI421504B (zh) * 2010-07-02 2014-01-01 Isc Co Ltd 測試用的測試探針以及其製造方法
US8912803B2 (en) * 2011-09-19 2014-12-16 Honeywell International, Inc. Electrostatic shielding technique on high voltage diodes
EP2836847B1 (en) * 2012-04-13 2016-05-18 Delaware Capital Formation, Inc. Test probe assembly and related methods
JP6011103B2 (ja) * 2012-07-23 2016-10-19 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット
USD686098S1 (en) * 2012-11-14 2013-07-16 Agar Corporation Ltd. Antenna detection probe for a storage tank
JP6269337B2 (ja) * 2014-06-16 2018-01-31 オムロン株式会社 プローブピン、および、これを用いた電子デバイス
JP1529605S (enrdf_load_stackoverflow) * 2014-12-15 2015-07-27
JP1529608S (enrdf_load_stackoverflow) * 2014-12-15 2015-07-27
JP1529607S (enrdf_load_stackoverflow) * 2014-12-15 2015-07-27
JP1529612S (enrdf_load_stackoverflow) * 2014-12-19 2015-07-27
US10241133B2 (en) * 2014-12-31 2019-03-26 Tektronix, Inc. Probe tip and probe assembly
US9810715B2 (en) * 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWD207500S (zh) 2019-09-19 2020-10-01 美商應用材料股份有限公司 成形電極
USD956005S1 (en) 2019-09-19 2022-06-28 Applied Materials, Inc. Shaped electrode

Also Published As

Publication number Publication date
USD874958S1 (en) 2020-02-11
JP1622970S (enrdf_load_stackoverflow) 2019-01-28

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