TWD197822S - 電性接觸子之部分 - Google Patents

電性接觸子之部分

Info

Publication number
TWD197822S
TWD197822S TW107304473F TW107304473F TWD197822S TW D197822 S TWD197822 S TW D197822S TW 107304473 F TW107304473 F TW 107304473F TW 107304473 F TW107304473 F TW 107304473F TW D197822 S TWD197822 S TW D197822S
Authority
TW
Taiwan
Prior art keywords
design
electrical contact
article
enlarged view
designed
Prior art date
Application number
TW107304473F
Other languages
English (en)
Inventor
Mika Nasu
Tsuyoshi Muramoto
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TWD197822S publication Critical patent/TWD197822S/zh

Links

Abstract

【物品用途】;本設計物品為一種電性接觸子，係作為與被檢測物之電極電性接觸的探針而使用在例如半導體元件或積體電路等電子零件的檢測裝置中。;【設計說明】;本設計物品之設計要點在於物品的形狀。;圖式所揭露之虛線為本案不主張設計之部分；圖式所揭露之一點鏈線為本案所欲主張設計之部分與不主張設計之部分的邊界線，該一點鏈線實際上不可見，為本案不主張設計之部分。;A-A部分放大圖為前視圖中之A-A部分的放大圖。
TW107304473F 2018-02-02 2018-08-01 電性接觸子之部分 TWD197822S (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018002096 2018-02-02

Publications (1)

Publication Number Publication Date
TWD197822S true TWD197822S (zh) 2019-06-01

Family

ID=69157294

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107304473F TWD197822S (zh) 2018-02-02 2018-08-01 電性接觸子之部分

Country Status (2)

Country Link
US (1) USD873161S1 (zh)
TW (1) TWD197822S (zh)

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
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US4740746A (en) * 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
US4716365A (en) * 1985-10-11 1987-12-29 Lisle Corporation Circuit tester
USD311346S (en) * 1987-09-25 1990-10-16 Q.A. Technology Company Electronic test probe
US5172051A (en) * 1991-04-24 1992-12-15 Hewlett-Packard Company Wide bandwidth passive probe
USD397052S (en) * 1997-04-08 1998-08-18 Societe Chauvin Arnoux Test lead
US7208971B2 (en) * 2002-10-15 2007-04-24 General Electric Company Manual probe carriage system and method of using the same
KR200445565Y1 (ko) 2007-02-02 2009-08-14 리노공업주식회사 반도체 칩 검사용 사각 프로브
US9046568B2 (en) * 2009-03-27 2015-06-02 Essai, Inc. Universal spring contact pin and IC test socket therefor
CN102004173B (zh) * 2009-09-01 2014-02-19 鸿富锦精密工业（深圳）有限公司 探针
TWI421504B (zh) * 2010-07-02 2014-01-01 Isc Co Ltd 測試用的測試探針以及其製造方法
US8912803B2 (en) * 2011-09-19 2014-12-16 Honeywell International, Inc. Electrostatic shielding technique on high voltage diodes
TWD150990S (zh) 2012-03-27 2012-12-21 欣興電子股份有限公司 針格陣列的針腳
SG11201406561XA (en) * 2012-04-13 2014-11-27 Capital Formation Inc Test probe assembly and related methods
JP6011103B2 (ja) * 2012-07-23 2016-10-19 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット
USD686098S1 (en) * 2012-11-14 2013-07-16 Agar Corporation Ltd. Antenna detection probe for a storage tank
JP6269337B2 (ja) * 2014-06-16 2018-01-31 オムロン株式会社 プローブピン、および、これを用いた電子デバイス
JP1529607S (zh) * 2014-12-15 2015-07-27
JP1529608S (zh) * 2014-12-15 2015-07-27
JP1529605S (zh) * 2014-12-15 2015-07-27
JP1529612S (zh) * 2014-12-19 2015-07-27
US10241133B2 (en) * 2014-12-31 2019-03-26 Tektronix, Inc. Probe tip and probe assembly
US9810715B2 (en) * 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip

Also Published As

Publication number Publication date
USD873161S1 (en) 2020-01-21

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