TWD173713S - 積體電路插座用探針引腳 - Google Patents

積體電路插座用探針引腳

Info

Publication number
TWD173713S
TWD173713S TW104303164F TW104303164F TWD173713S TW D173713 S TWD173713 S TW D173713S TW 104303164 F TW104303164 F TW 104303164F TW 104303164 F TW104303164 F TW 104303164F TW D173713 S TWD173713 S TW D173713S
Authority
TW
Taiwan
Prior art keywords
integrated circuit
socket
probe pin
case
article
Prior art date
Application number
TW104303164F
Other languages
English (en)
Inventor
Hirotada Teranishi
Takahiro Sakai
Original Assignee
歐姆龍股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 歐姆龍股份有限公司 filed Critical 歐姆龍股份有限公司
Publication of TWD173713S publication Critical patent/TWD173713S/zh

Links

Abstract

【物品用途】;本案設計之物品係積體電路插座用探針引腳,連接於積體電路之通電檢查所使用之積體電路插座。;【設計說明】;本案設計係新穎獨特之樣式,藉由獨特地設計積體電路插座用探針引腳,可顯現出先前技藝所未有之視覺效果。
TW104303164F 2014-12-15 2015-06-11 積體電路插座用探針引腳 TWD173713S (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2014-27890F JP1529605S (zh) 2014-12-15 2014-12-15

Publications (1)

Publication Number Publication Date
TWD173713S true TWD173713S (zh) 2016-02-11

Family

ID=53764632

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104303164F TWD173713S (zh) 2014-12-15 2015-06-11 積體電路插座用探針引腳

Country Status (3)

Country Link
US (1) USD776551S1 (zh)
JP (1) JP1529605S (zh)
TW (1) TWD173713S (zh)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP1592871S (zh) * 2017-02-10 2017-12-11
USD869305S1 (en) * 2017-02-10 2019-12-10 Kabushiki Kaisha Nihon Micronics Probe pin
JP1622970S (zh) * 2018-02-02 2019-01-28
JP1622968S (zh) * 2018-02-02 2019-01-28
JP1622969S (zh) * 2018-02-02 2019-01-28
JP1626667S (zh) * 2018-02-02 2019-03-18
JP1626668S (zh) * 2018-02-02 2019-03-18
JP1623279S (zh) * 2018-02-02 2019-01-28
JP1623280S (zh) * 2018-02-02 2019-01-28
TWD197822S (zh) * 2018-02-02 2019-06-01 日商日本麥克隆尼股份有限公司 電性接觸子之部分
JP1624757S (zh) * 2018-05-16 2019-02-18
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test
TWD226028S (zh) * 2022-04-29 2023-06-21 南韓商普因特工程有限公司 半導體檢測針

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
WO2011036800A1 (ja) * 2009-09-28 2011-03-31 株式会社日本マイクロニクス 接触子及び電気的接続装置
KR101058146B1 (ko) * 2009-11-11 2011-08-24 하이콘 주식회사 스프링 콘택트 및 스프링 콘택트 내장 소켓
TWD138876S1 (zh) * 2010-01-27 2011-02-01 日本麥克隆尼股份有限公司 電接觸元件
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP4998838B2 (ja) * 2010-04-09 2012-08-15 山一電機株式会社 プローブピン及びそれを備えるicソケット
JP5352525B2 (ja) 2010-04-28 2013-11-27 日本航空電子工業株式会社 プローブピン用コンタクト、プローブピンおよび電子デバイス用接続治具
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
JP5708430B2 (ja) * 2011-10-14 2015-04-30 オムロン株式会社 接触子
JP5699899B2 (ja) * 2011-10-14 2015-04-15 オムロン株式会社 接触子
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester

Also Published As

Publication number Publication date
JP1529605S (zh) 2015-07-27
USD776551S1 (en) 2017-01-17

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