JP1529607S - - Google Patents

Info

Publication number
JP1529607S
JP1529607S JPD2014-27892F JP2014027892F JP1529607S JP 1529607 S JP1529607 S JP 1529607S JP 2014027892 F JP2014027892 F JP 2014027892F JP 1529607 S JP1529607 S JP 1529607S
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JPD2014-27892F
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JPD2014-27892F priority Critical patent/JP1529607S/ja
Priority to TW104303166F priority patent/TWD177826S/zh
Priority to US29/530,263 priority patent/USD769748S1/en
Application granted granted Critical
Publication of JP1529607S publication Critical patent/JP1529607S/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JPD2014-27892F 2014-12-15 2014-12-15 Active JP1529607S (enrdf_load_stackoverflow)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JPD2014-27892F JP1529607S (enrdf_load_stackoverflow) 2014-12-15 2014-12-15
TW104303166F TWD177826S (zh) 2014-12-15 2015-06-11 積體電路插座用探針引腳
US29/530,263 USD769748S1 (en) 2014-12-15 2015-06-15 Probe pin

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2014-27892F JP1529607S (enrdf_load_stackoverflow) 2014-12-15 2014-12-15

Publications (1)

Publication Number Publication Date
JP1529607S true JP1529607S (enrdf_load_stackoverflow) 2015-07-27

Family

ID=53764634

Family Applications (1)

Application Number Title Priority Date Filing Date
JPD2014-27892F Active JP1529607S (enrdf_load_stackoverflow) 2014-12-15 2014-12-15

Country Status (3)

Country Link
US (1) USD769748S1 (enrdf_load_stackoverflow)
JP (1) JP1529607S (enrdf_load_stackoverflow)
TW (1) TWD177826S (enrdf_load_stackoverflow)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP1592871S (enrdf_load_stackoverflow) * 2017-02-10 2017-12-11
USD869305S1 (en) * 2017-02-10 2019-12-10 Kabushiki Kaisha Nihon Micronics Probe pin
JP1622969S (enrdf_load_stackoverflow) * 2018-02-02 2019-01-28
JP1626667S (enrdf_load_stackoverflow) * 2018-02-02 2019-03-18
JP1623280S (enrdf_load_stackoverflow) * 2018-02-02 2019-01-28
JP1622968S (enrdf_load_stackoverflow) * 2018-02-02 2019-01-28
JP1623279S (enrdf_load_stackoverflow) * 2018-02-02 2019-01-28
TWD197822S (zh) * 2018-02-02 2019-06-01 Nihon Micronics Kk 電性接觸子之部分
JP1622970S (enrdf_load_stackoverflow) * 2018-02-02 2019-01-28
JP1626668S (enrdf_load_stackoverflow) * 2018-02-02 2019-03-18
JP1624757S (enrdf_load_stackoverflow) * 2018-05-16 2019-02-18
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test
USD1042182S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
USD1042181S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
USD1015282S1 (en) * 2022-02-01 2024-02-20 Johnstech International Corporation Spring pin tip
TWD226028S (zh) * 2022-04-29 2023-06-21 南韓商普因特工程有限公司 半導體檢測針
TWD227961S (zh) * 2022-04-29 2023-10-11 南韓商普因特工程有限公司 半導體檢測針
USD1090440S1 (en) * 2023-01-12 2025-08-26 Johnstech International Corporation Spring probe contact assembly

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
WO2011036800A1 (ja) * 2009-09-28 2011-03-31 株式会社日本マイクロニクス 接触子及び電気的接続装置
KR101058146B1 (ko) * 2009-11-11 2011-08-24 하이콘 주식회사 스프링 콘택트 및 스프링 콘택트 내장 소켓
TWD138876S1 (zh) * 2010-01-27 2011-02-01 日本麥克隆尼股份有限公司 電接觸元件
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP4998838B2 (ja) * 2010-04-09 2012-08-15 山一電機株式会社 プローブピン及びそれを備えるｉｃソケット
JP5352525B2 (ja) 2010-04-28 2013-11-27 日本航空電子工業株式会社 プローブピン用コンタクト、プローブピンおよび電子デバイス用接続治具
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
JP5699899B2 (ja) * 2011-10-14 2015-04-15 オムロン株式会社 接触子
JP5708430B2 (ja) * 2011-10-14 2015-04-30 オムロン株式会社 接触子
TWD157152S (zh) 2012-05-08 2013-11-11 日本麥克隆尼股份有限公司 電接觸元件
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead

Also Published As

Publication number Publication date
USD769748S1 (en) 2016-10-25
TWD177826S (zh) 2016-08-21

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