TWD173049S - 積體電路插座用探針引腳 - Google Patents

積體電路插座用探針引腳

Info

Publication number
TWD173049S
TWD173049S TW104302993F TW104302993F TWD173049S TW D173049 S TWD173049 S TW D173049S TW 104302993 F TW104302993 F TW 104302993F TW 104302993 F TW104302993 F TW 104302993F TW D173049 S TWD173049 S TW D173049S
Authority
TW
Taiwan
Prior art keywords
socket
probe pin
integrated circuit
case
probe pins
Prior art date
Application number
TW104302993F
Other languages
English (en)
Inventor
Hirotada Teranishi
Takahiro Sakai
Original Assignee
歐姆龍股份有限公司
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 歐姆龍股份有限公司, Omron Tateisi Electronics Co filed Critical 歐姆龍股份有限公司
Publication of TWD173049S publication Critical patent/TWD173049S/zh

Links

Abstract

【物品用途】;本案設計之物品係積體電路插座用探針引腳。;【設計說明】;本案設計係新穎獨特之樣式，藉由獨特地設計積體電路插座用探針引腳，可顯現出先前技藝所未有之視覺效果。
TW104302993F 2014-12-04 2015-06-03 積體電路插座用探針引腳 TWD173049S (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2014-27120F JP1529602S (zh) 2014-12-04 2014-12-04

Publications (1)

Publication Number Publication Date
TWD173049S true TWD173049S (zh) 2016-01-11

Family

ID=53764629

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104302993F TWD173049S (zh) 2014-12-04 2015-06-03 積體電路插座用探針引腳

Country Status (3)

Country Link
US (1) USD764330S1 (zh)
JP (1) JP1529602S (zh)
TW (1) TWD173049S (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWD226028S (zh) * 2022-04-29 2023-06-21 南韓商普因特工程有限公司 半導體檢測針

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
KR100701498B1 (ko) 2006-02-20 2007-03-29 주식회사 새한마이크로텍 반도체 검사용 프로브핀 조립체 및 그 제조방법
WO2011036800A1 (ja) * 2009-09-28 2011-03-31 株式会社日本マイクロニクス 接触子及び電気的接続装置
KR101058146B1 (ko) * 2009-11-11 2011-08-24 하이콘 주식회사 스프링 콘택트 및 스프링 콘택트 내장 소켓
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP4998838B2 (ja) * 2010-04-09 2012-08-15 山一電機株式会社 プローブピン及びそれを備えるｉｃソケット
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
JP5708430B2 (ja) * 2011-10-14 2015-04-30 オムロン株式会社 接触子
JP5699899B2 (ja) * 2011-10-14 2015-04-15 オムロン株式会社 接触子
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester

Also Published As

Publication number Publication date
JP1529602S (zh) 2015-07-27
USD764330S1 (en) 2016-08-23

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