TW526688B - Mounting method of electronic component and mounting apparatus - Google Patents
Mounting method of electronic component and mounting apparatus Download PDFInfo
- Publication number
- TW526688B TW526688B TW088105036A TW88105036A TW526688B TW 526688 B TW526688 B TW 526688B TW 088105036 A TW088105036 A TW 088105036A TW 88105036 A TW88105036 A TW 88105036A TW 526688 B TW526688 B TW 526688B
- Authority
- TW
- Taiwan
- Prior art keywords
- mounting
- control system
- ultrasonic
- bonding
- ultrasonic vibration
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/02—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating by means of a press ; Diffusion bonding
- B23K20/023—Thermo-compression bonding
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/02—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating by means of a press ; Diffusion bonding
- B23K20/023—Thermo-compression bonding
- B23K20/025—Bonding tips therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/10—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating making use of vibrations, e.g. ultrasonic welding
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/10—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating making use of vibrations, e.g. ultrasonic welding
- B23K20/106—Features related to sonotrodes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C65/00—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor
- B29C65/02—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by heating, with or without pressure
- B29C65/08—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by heating, with or without pressure using ultrasonic vibrations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/75—Apparatus for connecting with bump connectors or layer connectors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
- B23K2101/40—Semiconductor devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/80—General aspects of machine operations or constructions and parts thereof
- B29C66/83—General aspects of machine operations or constructions and parts thereof characterised by the movement of the joining or pressing tools
- B29C66/832—Reciprocating joining or pressing tools
- B29C66/8322—Joining or pressing tools reciprocating along one axis
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
- H01L2224/131—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/13138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/13144—Gold [Au] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/7525—Means for applying energy, e.g. heating means
- H01L2224/75251—Means for applying energy, e.g. heating means in the lower part of the bonding apparatus, e.g. in the apparatus chuck
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/8112—Aligning
- H01L2224/81121—Active alignment, i.e. by apparatus steering, e.g. optical alignment using marks or sensors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/8119—Arrangement of the bump connectors prior to mounting
- H01L2224/81191—Arrangement of the bump connectors prior to mounting wherein the bump connectors are disposed only on the semiconductor or solid-state body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/812—Applying energy for connecting
- H01L2224/81201—Compression bonding
- H01L2224/81203—Thermocompression bonding, e.g. diffusion bonding, pressure joining, thermocompression welding or solid-state welding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/812—Applying energy for connecting
- H01L2224/81201—Compression bonding
- H01L2224/81205—Ultrasonic bonding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/812—Applying energy for connecting
- H01L2224/81201—Compression bonding
- H01L2224/81205—Ultrasonic bonding
- H01L2224/81206—Direction of oscillation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/818—Bonding techniques
- H01L2224/81801—Soldering or alloying
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01004—Beryllium [Be]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01023—Vanadium [V]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01074—Tungsten [W]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12042—LASER
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/30105—Capacitance
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/30107—Inductance
Description
526688 A7 _____ B7 五、發明說明(1 ) 〔發明所屬之技術領域〕 (請先閱讀背面之注意事項δ寫本頁) 本發明係有關於一種對電子零件基板導體之安裝方法 ,特別是有關於檢查進行觸發晶片接合之際的熔接接合良 否之方法與裝置。 〔習知之技術〕 對習知電子零子,特別是半導體晶片基板導體的高密 度安裝方式,開發、實用化觸發晶片接合方式。 上述觸發晶片接合方式,是在半導體晶片電極或者基 板導體電極形成撞凸(焊鍚撞凸或金撞凸),以半導體晶 片電極爲背面而於基板導體相對的電極介於撞凸加以接合 的方式,因從晶片表面任意位置取出電極,基板導體與最 短矩離正好無法連接,即使增加電極數還是不會造成晶片 尺寸變大型,而能薄形安裝爲其特徵。 設在上述觸發晶片接合方式中的半導體晶片電極或基 板導體電極的撞凸與對邊電極的接合方法,乃採用焊鍚回 流、異方導電性樹脂連接、熱壓接、超音波併用熱壓接等 〇 經濟部智慧財產局員工消費合作社印製 當中利用超音波倂用熱壓接之接合方法,乃如第1 2 圖由超音波振動產生裝置8、和喇叭形體7、和彈性夾具 6、和基板導體加熱裝置4、和控.制系裝置9製成的,一 面用基板導體加熱裝置4來加熱進行觸發晶片接合方式的 超音波倂用熱壓接連接的電子零件的半導體晶片3的安裝 裝置1 0的基板導體1,一面在半導體晶片3的彈性夾具 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 526688 A7 Γ-- B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(2 ) 6利用壓電元件8介於喇叭形體7加上超音波振動,擴散 接合形成在半導體晶片3的撞凸5與基板導體1的電極2 之方法。 該超音波倂用熱壓接與其他方式比較,具有(1 )不 需接合材料、(口)可在短時間連接、(八)可用比較低 的溫度連接等優點。 〔發明欲解決之課題〕 但利用上述習知觸發晶片接合方式的超音波倂用熱壓 接連接方法的安裝方法,在上述種種優點之一方,會發生 超音波振動不穩定引起接合不良具危險性之問題。此被視 爲是造成第1 2圖的習知半導體晶片3內面(圖的上面) 與彈性夾具6之間的滑動、來自喇叭形體7的振動擴散、 電壓元件8經常劣化等的原因。 此外,觸發晶片接合方式,由外觀看接合部分爲隱藏 在半導體晶片3的內側,無法從後做接合部的外觀檢查。 因而發生上述接合不良特別重大的問題。 本發明爲有鑑於上述情形之發明,提供一將電子零件 用超音波倂用熱壓接連接方法,在基板導體一面逐步檢查 觸發晶片接合之際的接合狀態 一面安裝之方法及其安裝裝置。· 〔用以解決課題之手段〕 本發明 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項寫本頁) —裝 ·
-丨線J 526688 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(3 ) (1 )針對由超音波振動產生裝置、和喇叭形體、和 彈性夾具、基板導體加熱裝置、控制系裝置製成之’進行 觸發晶片接合方式的超音波倂用熱壓接連接之電子零件之 安裝裝置中,藉由提供一將監視面對電子零件的基板導體 的高度之高度測定裝置與控制系裝置連結而配備爲其特徵 之電子零件之安裝裝置’達成上述目的。 (2 )此外,藉由提供一以用上述(1 )記載的電子 零件之安裝裝置,使電子零件針對基板導體而下降’從與 設在電子零件的電極及基板導體的電極的撞凸相對的對邊 電極連接的時點外加所定加重,接著將利用以所定時間外 加所定加重與超音波振動的撞凸沈入量用高度測定裝置加 以監視,根據前述超音波振動外加時的撞凸沈入量是否在 所期望的範圍內,來進行利用觸發晶片接合方式的超音波 倂用熱壓接連接的接合良否之判定爲其特徵之電子零件之 安裝方法,達成上述目的。 (3),此外,藉由提供一以於上述(2)記載的電 子零件之安裝方法中,將從與相對撞凸的對邊電極連接的 時點,以所定時間外加所定加重的狀態的第一階段撞凸沈 入量、和進而利用所定時間外加超音波振動的第二階段撞 凸沈入量個別用高度測定裝置加以監視,根據前述各階段 的撞凸沈入量是否分別在所期望的範圍內,來進行利用觸 發晶片接合方式的超音波併用熱壓接連接的接合良否之判 定爲其特徵之電子零件之安裝方法,達成上述目的。 (4 )此外,針對由超音波振動產生裝置、和喇叭形 (請先閱讀背面之注意事項寫本頁) k 裝 - 線· 本纸張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 526688 A7 B7 五、發明說明(4 ) • n ϋ I— n ϋ ϋ n ·.1 ϋ ϋ ϋ 1 I - ·1 I (請先閱讀背面之注意事項ΙίΙ寫本頁) 體、和彈性夾具、基板導體加熱裝置、控制系裝置製成, 進行觸發晶片接合方式的超音波倂用熱壓接連接之電子零 件之安裝裝置中,藉由提供一將監視電子零件或撞凸的振 動狀態之振動測定裝置與控制系裝置連結而配備爲其特徵 之電子零件之安裝裝置,達成上述目的。 (5 )此外,藉由提供一用上述(4 )記載的電子零 件之安裝裝置來測定安裝時的電子零件振動狀態的同時, 將此與基準波形做比較,判定是否正常外加超音波振動而 加以檢查接合良否爲特徵之對利用觸發晶片接合方式的超 音波倂用熱壓接連接方法之基板導體的電子零件之安裝方 法,達成上述目的。 --線」 (6 )此外,針對由超音波振動產生裝置、和喇叭形 體、和彈性夾具、基板導體加熱裝置、控制系裝置製成之 ,進行觸發晶片接合方式的超音波倂用熱壓接連接之電子 零件之安裝裝置中,藉由提供一將監視外加在超音波振動 發生裝置的電壓或電流或其兩方的測定裝置與控制系裝置 連結而配備爲其特徵之電子零件之安裝裝置,達成上述目 的。 經濟部智慧財產局員工消費合作社印製 (7 )此外,藉由提供一用上述(6 )記載的電子零 件之安裝裝置來測定外加於超音波振動裝置的電壓、電流 的同時,將此與基準波形做比較,判定是否正常外加超音 波.振動而加以檢查接合良否爲特徵之對利用觸發晶片接合 方式的超音波倂用熱壓接連接方法之基板導體的電子零件 之安裝方法,達成上述目的。 本紙張尺度適用中國國家標準(CNS)A4規格(210 χ 297公釐) 526688 A7 一 B7 五、發明說明(5 ) 亦即,一面用上述(1 ) 、( 2 )及(3 )監視安裝 時電子零件(主要爲半導體晶片)的撞凸高度位移(沈入 量)的機構,還以上述(4) 、(5)監視安裝時電子零 件或撞凸振動狀態(振幅或振動速度或振動加速度等)的 機構,此外以上述(6 )、( 7 )監視外加在超音波振動 產生裝置(主要爲利用壓電元件)的電壓、電流的機構, 一面將接合良否與基準做比較進行安裝。 〔發明之實施形態〕 第1圖係有關本發明申請項第1項及第2項的電子零 件之安裝裝置之系統槪念圖。 第2圖係表示夾頭高度時間變化之圖,第3圖係說明 安裝時夾頭之動作圖。 第4圖係表示A u撞凸高度與基板導體電極的接合強 度關係之曲線圖。 第5圖係具備有利用閘極的撞凸沈入量檢測機構的電 子零件之安裝裝置之系統槪念圖。 第6圖係具備有利用靜電容量變化的沈入量檢測機構 的電子零件之安裝裝置之系統槪念圖。 第7圖係有關本發明申請項第3項及第4項的安裝裝 置之系統槪念圖。 第8圖係振動波形W與預先設定的基準波形W 0之比 較圖。 第9圖係頻率分解振動波形W將各波譜與各個基準波 本纸張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項3寫本頁) .. 經濟部智慧財產局員工消費合作社印製 526688 Α7 ____Β7 五、發明說明(6 ) 形w 0對應的基準波波譜比較之圖。 第10圖係有關本發明申請項第5項及第6項的電子 零件之安裝裝置之系統槪念個。 第1 1圖係外加在監視的壓電元件的電流波形與基準 電流波形i 0之比較圖。 .於第1圖中,本發明電子零件之安裝裝置2 0,將雷 射位移計1 1的超音波振動產生裝置8、喇叭形體7、彈 性夾具6、基板導體加熱裝置(圖式省略)、和控制系裝 置9、和加上監視面對吸附在上述彈性夾具6的電子零件 的半導體晶片3的基板導體(圖式省略)高度的高度測定 裝置與控制系裝置9連結而配備爲其特徵(對應申請項第 1項)。 然後對使用上述半導體晶片3的.安裝裝置2 0的基板 導體的安裝由以下步驟進行。 例如,第1如第3圖(a)所示,將高度H=50 //m的撞凸5 (A u撞凸),形成在電極的半導體晶片3 用彈性夾具6的夾頭1 2吸附,而使之相對於基板導體1 的電極2下降。 第2如第3圖(b )所示,在連接半導體晶片3的撞 凸5與基板導體1的電極2的時點,以約數百毫克秒外加 所定加重R (根據撞凸5的材質、形狀、大小與件數等而 適當設定,但通常爲數百gw/lkgw)。此時利用前 述所定加重R讓撞凸5稍微受撞而沈入(此爲第一階段沈 入量Η 1 )。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項寫本頁) J^T· -線. 經濟部智慧財產局員工消費合作社印製 526688 Α7 Β7 五、發明說明(7 ) (請先閱讀背面之注意事項寫本頁) 第3如第3圖(c )所示,以所定時間外加所定加重 R與超音波振動U S (橫向振動),並以撞凸5的超音波 倂用熱壓接來接合半導體晶3的電極與基板導體1的電極 2。 第4如第3圖(d)所示,將彈性夾具的夾頭1 2從 半導體晶片3離開而上昇的同時,將利用以所定時間外加 前述所定加重R與超音波振動US的撞凸5的沈入量(此 爲第二階段沈入量Η 2 ),用雷射位移計1 1 (高度測定 裝置)加以監視,根據前述撞凸5的沈入量Η 2是否在所 期望的範圍內,來進行利用觸發晶片接合方式的超音波倂 用熱壓接連接的接合良否判定。 上述安裝時彈性夾具的夾頭1 2的高度方向動作乃如 第2圖所示,與第3圖對應如以下所述。 經濟部智慧財產局員工消費合作社印製 (Α)爲夾頭1 2的下降階段,對應第3圖(a )的 狀態。(B)爲從連接撞凸5與對邊基板導體1的電極2 的時點,以所定時間T 1外加定所加重R之階段,對應第 3圖(b )的狀態。(C )爲以所定時間T 2外加所定加 重R與超音波振動US的階段,對應第3圖(c)的狀態 。(D)爲接合結束,並監視撞凸的前述(c)階段的沈 入量Η 2加以判定接合良否的同時,上昇夾頭1 2的階段 ,對應第3圖(d )的狀態。 此例,撞凸5高度的第二階段沈入量Η 2 (換言之就 是針對撞凸5外加所定加重R與振動超音波u S而受撞的 半導體晶片3的基板導體的高度位移量)與該撞凸5的半 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -10- ~ - 526688 Α7 _ _______ Β7 經濟部智慧財.產局員工消費合作社印製 五、發明說明(8 ) 導體晶片3的電極和基板導體1的電極2的接合強度,由 實驗了解如第4圖的關係。 於是,例如對撞凸5 ( A u撞凸)的電極2的接合強 度5 0 g f以上爲良好,就可預先設定達到5 〇 g f以上 的判定基準,在第2圖(c )過程的第二階段沈入量Η 2 爲2 5 以上爲良好,是否未滿2 5 //m,根據來自先 前雷射位移計1 1的監視資料,用控制系裝置9進行接合 良否判定(對應申請項第2項)。 按上述方法,爲了是否成爲接合強度5 0 g f以下的 製品,成爲不良,要是做以後處理,或者再度外加超音波 得到所期望的沈入量Η 2就能加以再生,藉此接合不良的 製品就不會流至後面工程,而能提升製品良品率。 如以上,上述安裝方法爲僅監視在第2圖(c )過程 的第二階段沈入量Η 2之方法,當然用此監視手段也能滿 足接合狀態的良否判定,但進行更精良的良否判定,也是 將前述第一階段的沈入量Η 1做監視,希望將第一階段的 沈入量Η 1與第二階段的沈入量Η 2兩者做爲接合良否判 定資料方面。 於是,上述安裝方法中,從與撞凸5相對的對邊電極 連接的時點,將以所定時間Τ 1外加所定加重R的狀態的 第一階段撞凸的沈入量Η 1,和進而利用以所定時間Τ 2 外加超音波振動U S的第二階段撞凸的沈入量Η 2,個別 用高度測定裝置的雷射位移計1 1加以監視,前述各階段 的撞凸沈入量Η 1,Η2分別用控制系裝置9來判定是否 (請先閱讀背面之注意事項寫本頁) 歸 裝: . 丨線. 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) ΠΤ- 526688 A7 B7 五、發明說明(9 ) (請先閱讀背面之注意事項Λ寫本頁) 在所期望範圍內,藉此進行對利用觸發晶片接合方式的超 音波倂用熱壓接連接的該半導體晶片3的基板導體1的接 合良否判定(對應申請項第3項)。 按上述安裝方法,從設定以所定時間T 1外加在第2 圖(B)階段的所定加重R的的撞凸5的沈入量Η 1的通 常數値範圍偏離的情形下,認爲會引起撞凸形狀異常和撞 凸消除,所以能在接合前的前階段形成撞凸良否判定。像 這樣分成第一階段的沈入量Η 1與第二階段的沈入量Η 2 而各別做監視評估,就能藉此以高精度進行接合良否判定 〇 再者,逐次監視在上述實施形態監視沈入量Η 1, Η 2的夾頭1 2高度的高度測定裝置除了上述雷射位移計 1 1以外,例如也可爲脈衝馬達的脈衝數計時等其他裝置 〇 經濟部智慧財產局員工消費合作社印製 此外,上述高度測定的機構,爲如第5圖所示的系統 ,以閘極G爲刻度加在彈性夾具6的手段,亦即吸附電子 零件,於接合在基板導體的彈性夾具6側面例如形成1 //m刻度,彈性夾具前端的半導體晶片3是以接觸撞凸時 爲基準,在超音波振動U S外加中將通過閘極感應器3 1 的閘極次數,用光、雷射等加以計時,依此求得晶片第二 階段的沈入量Η 2。再者,以磁性體進行上述皮子G的形 成,以磁性感應器計時亦可。此外,進入閘極的位置也可 以在喇叭形體的前端。 進而,測定相對於夾頭的基板導體高度的其他測定手 本纸張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 526688 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(1G) 段,有利用靜電容量的計測手段。亦即,如第6圖所示, 從喇叭形體7的下死點,例如在1 m .m下方設平板電極B ,求得此平板電極B與用金屬製成的喇叭形體之間的靜電 容量C。靜電容量C利用喇叭形體7與平板電極B之間的 距離S來決定,所以利用靜電容量檢測計來計測該靜電容 量C,檢知半導體晶片3的沈入量,與前述實施形態同樣 地進行良否的判定。 此外,沒有上述平板電極B也可直接安裝線圈喇叭形 體的喇叭形體7利用其感應成份來求得該線圈喇叭形體與 基板導體的距離。 接著就本發明申請項第4項的安裝裝置及申請項第5 項之安裝方法做說明。_ 第7圖係其安裝裝置3 0的系統槪念圖,但加上習知 電子零件(半導體晶片)的安裝裝置1 0,將監視半導體 晶片3與撞凸5的振動狀態的振動測定裝置2 1與控制系 裝置9連結而配備爲其特徵(應對申請項第4項),測定 安裝時半導體晶片3的例如振動波形W的同時,將此與第 8圖預先設定的基準波形W〇做比較,藉此判定是否正常 外加超音波振動U S來檢查接合良否(對應申靖項第5項 )〇 總之,利用半導體晶片3和撞凸5的超音波振動U S 昀振動波形,接合過程中表示一定變化,以致於從基準振 動波形W0與監視的振動波形W的偏離,即可判斷是否在 接合部正常外加超音波振動US。 (請先閱讀背面之注意事項Θ'寫本頁) 裝 ΊΗΙσ4· •線· 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 526688 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(11) 具體而言以振動波形W爲測定對象的振動狀態的監視 ’具備有雷射多普勒振動計2 2的振動測定裝置2 1。然 後對半導體晶片3照射雷射多普勒振動計2 2的雷射光, 以安裝時半導體晶片3的振動狀態(振幅與振動速度)爲 波形加以監視。將得到的振動波形W用控制系裝置9與基 準波形W0做比較,藉此檢知超音波振動U S是否正常外 加在撞凸5,以從基準波形W0的容許範圍偏離者成爲不 良而加以處理。 此判定時,如第9圖所示,將振動波形W 1利用 F F T (高速傅里葉變換)加以頻率分解,將各波譜W1 、W 2分別與基準波形W 〇對應的基準波波譜W 〇 1、 W 〇 2、· · ·做比較,就可完成更定量地比較判定。 接著就有關本發明申請項第6項及申請項第7項之安 裝裝置做說明。 第1 0圖係該安裝裝置4 0的系統槪念圖,但加上習 知電子零件(半導體晶片)之安裝裝置1 0,將監視外加 在超音波振動產生裝置(壓電元件)8的電流i的測定裝 置與控制系裝置9連結,而配備在其內部爲其特徵(對應 申請項第6項),將測定的電流i波形與第1圖預先設定 的基準電流波形i 〇做比較,藉此判定超音波振動U S是 否正常外加在撞凸5來檢測接合良否(對應申請項第7項 )° 總之,由第1 1圖可判定,外加在作爲超音波振動產 生裝置8的壓電元件的電壓V、電流i於接合過程中表示 (請先閱讀背面之注意事項寫本頁) —裝 · -線」 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 526688 A7 B7 五、發明說明(12) (請先閱讀背面之注意事項3寫本頁) 一定變化,故從基準電壓波形V 〇或基準電流波形i 0與 監視對應的波形V、I的偏離,就能判斷接合時超音波振 動U S是否正常。 再者,監視外加電壓V的波形或其兩者來取代外加電 流i .的波形,並分別與基準波形做比較。 此外,使用採用喇叭形體的電流探測器作爲監視流至 超音波振動產生裝置8 (壓電元件)的電流i的測定裝置 ,就能減低測定時的雜訊提升測定精度。 然後如第1 1圖比較電流i的波形與基準電流波形 i 0,藉此(利用前述F F T的波譜比較分析)得知超音 波振動U S是否正常外加在撞凸5,以從基準電流波形 i 0的容許範圍偏離形成不良而做以後處理。 再者,以上說明的實施形態全爲撞凸5設在半導體晶 片3的電極側的案例,但不必說撞凸5在基板導體1的電 極2的案例亦同。 此外,上述本發明對象的電子零件之安裝方法,主要 .以半導體晶片3爲對象做說明,但不必說用超音波倂用熱 壓接方式的可觸發晶片接合的電子零件全部適用。 經濟部智慧財產局員工消費合作社印製 〔發明之效果〕 以上由詳述實施形態即可明白,有關本發明之電子零 件的安裝方法及安裝裝置,係監視安裝高度、振動狀態、 超音波振產生裝置(壓電元件)的電壓、電流,與基準値 或基準波形做比較,藉此與安裝同時判斷利用該電子零件 -1b- 本紙張尺度適用中國國家標準(CNS)A4規格(210x297公釐) 526688 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(13) 的接凸的接合狀態、超音波振動狀態是否正常,依此發生 異常時能適當採取 (a)直接停止機械通知異常; (b )將不良的製品做記號; '(c)再度外加超音波來再生製品; (d )外加超音波持續到正常爲止的措施,具有判別或再 生接合不良的優良效果。 〔圖面之簡單說明〕 第1圖係有關本發明申請項第1項及第2項的電子零 件之安裝裝置之系統槪念圖。 第2圖係表示夾頭高度時間變化之圖。 第3圖係說明安裝時夾頭之動作圖。 第4圖係表示A u撞凸高度與基板導體電極的接合強 度關係之曲線圖。 第5圖係具備有利用閘極的撞凸沈入量檢測機構的電 子零件之安裝裝置之系統槪念圖。 第6圖係具備有利用靜電容量變化的沈入量檢測機構 的電子零件之安裝裝置之系統槪念圖。 第7圖係有關本發明申請項第3項及第4項的安裝裝 置之系統槪念圖。 第8圖係振動波形W與預先設定的基準波形W0之比 較圖。 第9圖係頻率分解振動波形W將各波譜與各個基準波 (請先閱讀背面之注意 寫本頁) 裝 ••線‘ 本紙張尺度適用中國國家標準(CNS)A4規格(210x297公釐) 526688 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(14) 形W 〇對應的基準波波譜比較之圖。 第10圖係有關本發明申請項第5項及第6項的電子 零件之安裝裝置之系統槪念圖。 第1 1圖係外加在監視的壓電元件的電流i的波形與 基準電流波形i 0之比較圖。 第1 2圖係利用習知觸發晶片接 熱壓接連接方法的安裝裝置之系統槪 〔符號之說明〕 1 基板導體 2 電極 3 半導體晶片 4 基板導體加熱裝置 5 撞凸(金撞凸) 6 彈性夾具 7 喇叭形體 8 超音波振動產生裝置 9 控制系裝置 1 0、2 0、3 0、4 0 安 11 雷射位移計 .* 12 夾頭 2 1 振動測定裝置 2 2 雷射多譜勒振動計 R 所定加重 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項3寫本頁) •線, 526688 A7 _B7 五、發明說明(15) 經濟部智慧財產局員工消費合作社印製 U s 超 音 波 振動 Η 1 第 一 階 段沈 入 量 Η 2 第 二 階 段沈 入 量 G 閘 極 B 平板 電 極 C 靜 電 容 量 W 振 動 波 形 w 0 基 準 波 形 w 1、W 2、 • · • 振 動 波 形 波譜 w 0 1、W 〇 2、 • • • 基 準 波 波 口曰 i 電 流 i 0 基 準 電 流波 形 V 電 壓 (請先閱讀背面之注意事項寫本頁) 裝 •線; 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -18 -
Claims (1)
- 526688 A8 B8 C8 D8 六、申請專利範圍 1 · 一種電子零件之安裝裝置,針對由超音波振動產 生裝置、和喇叭形體、和彈性夾具、·基板導體加熱裝置、 控制系裝置製成之,進行觸發晶片接合方式的超音波倂用 熱壓接連接之電子零件之安裝裝置中,其爲特徵:將監視 面對電子零件的基板導體的高度之高度測定裝置與控制系 裝置連結而配備之。 2 · —種電子零件之安裝方法,其特徵爲:用申請專 利範圍第1項之電子零件之安裝裝置,使電子零件針對基 板導體而下降,從與設在電子零件的電極或基板導體的電 極的撞凸相對的對邊電極連接的時點外加所定加重,接著 將利用以所定時間外加所定加重與超音波振動的撞凸沈入 量用高度測定裝置加以監視,根據前述超音波振動外加時 的撞凸沈入量是否在所期望的範圍內,來進行利用觸發晶 片接合方式的超音波倂用熱壓接連接的接合良否之判定。 經濟部智慧財產局員工消費合作社印製 3.如申請專利範圍第2項所述之電子零件之安裝方 法,其中從與撞凸相對的對邊電極連接的時點,將以所定 時間外加所定加重的狀態的第一階段撞凸沈入量、和進而 利用所定時間外加超音波振動的第二階段撞凸沈入量個別 用高度測定裝置加以監視,根據前述各階段的撞凸沈入量 是否分別在所期望的範圍內,來進行利用觸發晶片接合方 式的超音波倂用熱壓接連接的接合良否之判定。 4 . 一種電子零件之安裝裝置,針對由超音波振動產 生裝置、和喇叭形體、和彈性夾具、基板導體加熱裝置、 控制系裝置製成,進行觸發晶片接合方式的超音波倂用熱 本纸張尺度適用中國國家標準(CNS ) A4規格(210 X 297公釐) -19- 526688 A8 B8 C8 D8 六、申請專利範圍 壓接連接之電子零件之安裝裝置中,其爲特徵:將監視電 子零件或撞凸的振動狀態之振動測定裝置與控制系裝置連 結而配備之。 5.—種電子零件之安裝方法,其特徵爲:用申請專 利範圍第4項之電子零件之安裝裝置來測定安裝時的電子 零件振動狀態的同時,將此與基準波形做比較,藉此判定 是否正常外加超音波振動而加以檢查接合良否。 6 · —種電子零件之安裝裝置,針對由超音波振動產 生裝置、和喇叭形體、和彈性夾具、基板導體加熱裝置、 控制系裝置製成之,進行觸發晶片接合方式的超音波倂用 熱壓接連接之電子零件之安裝裝置中,其特徵爲:將監視 外加在超音波振動發生裝置的電壓或電流或其兩者的測定 裝置與控制系裝置連結而配備。 7 · —種對利用觸發晶片接合方式的超音波併用熱壓 接連接方法之基板導體的電子零件之安裝方法,其特徵爲 經濟部智慧財產局員工消費合作社印製 :用申請專利範圍第6項的電子零件之安裝裝置來測定外 加於超音波振動裝置的電壓、電流的同時,將此與基準波 形做比較,藉此判定是否正常外加超音波振動而加以檢查 接合良否。 本纸張尺度適用中國國家標隼(CNS ) A4規格(210X297公釐) -20-
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP09733598A JP3176580B2 (ja) | 1998-04-09 | 1998-04-09 | 電子部品の実装方法及び実装装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW526688B true TW526688B (en) | 2003-04-01 |
Family
ID=14189624
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW088105036A TW526688B (en) | 1998-04-09 | 1999-03-30 | Mounting method of electronic component and mounting apparatus |
Country Status (5)
Country | Link |
---|---|
US (1) | US6543668B1 (zh) |
EP (3) | EP1486790B1 (zh) |
JP (1) | JP3176580B2 (zh) |
DE (3) | DE69928457T2 (zh) |
TW (1) | TW526688B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI451819B (zh) * | 2007-02-22 | 2014-09-01 | Shibaura Mechatronics Corp | Installation device and installation method of electronic parts |
Families Citing this family (54)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10020374A1 (de) * | 1999-07-02 | 2001-01-25 | Fujitsu Ltd | Kopfbaugruppe einer Plattenvorrichtung mit einem Kopf-IC-Chip, der durch Ultraschallbonden an eine Aufhängung montiert ist |
JP3451373B2 (ja) * | 1999-11-24 | 2003-09-29 | オムロン株式会社 | 電磁波読み取り可能なデータキャリアの製造方法 |
JP2004511081A (ja) * | 2000-03-10 | 2004-04-08 | チップパック,インク. | フリップ・チップ・イン・リードフレームのパッケージ及び方法 |
JP3506233B2 (ja) * | 2000-06-28 | 2004-03-15 | シャープ株式会社 | 半導体装置及びその製造方法 |
JP2004047944A (ja) * | 2002-05-22 | 2004-02-12 | Nec Corp | 接合装置および接合の良否判別方法を有する接合方法 |
JP4507582B2 (ja) * | 2003-12-12 | 2010-07-21 | パナソニック株式会社 | バンプ付電子部品の実装方法 |
US7017422B2 (en) * | 2004-04-02 | 2006-03-28 | Luna Innovations Incorporated | Bond testing system, method, and apparatus |
JP2005340780A (ja) * | 2004-04-27 | 2005-12-08 | Matsushita Electric Ind Co Ltd | 電子部品装着装置および電子部品装着方法 |
US7622367B1 (en) * | 2004-06-04 | 2009-11-24 | The Board Of Trustees Of The University Of Illinois | Methods and devices for fabricating and assembling printable semiconductor elements |
JP4529759B2 (ja) * | 2005-03-29 | 2010-08-25 | パナソニック株式会社 | 電子部品装着装置および電子部品装着方法 |
WO2006134953A1 (en) * | 2005-06-13 | 2006-12-21 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device bonding apparatus and method for bonding semiconductor device using the same |
KR100662820B1 (ko) | 2005-09-27 | 2006-12-28 | 삼성테크윈 주식회사 | 플립칩 본더 |
WO2008139668A1 (ja) * | 2007-04-27 | 2008-11-20 | Panasonic Corporation | 電子部品装着装置および電子部品装着方法 |
US20090155958A1 (en) * | 2007-12-13 | 2009-06-18 | Boris Kolodin | Robust die bonding process for led dies |
JP4924480B2 (ja) * | 2008-03-03 | 2012-04-25 | 日本電気株式会社 | 半導体装置の製造方法および装置 |
US20090289101A1 (en) * | 2008-05-23 | 2009-11-26 | Yong Du | Method for ball grid array (bga) solder attach for surface mount |
JP2010153672A (ja) * | 2008-12-26 | 2010-07-08 | Nec Corp | 半導体装置の製造装置およびその製造方法 |
US8939346B2 (en) * | 2011-02-15 | 2015-01-27 | International Business Machines Corporation | Methods and systems involving soldering |
JP5877645B2 (ja) * | 2011-02-15 | 2016-03-08 | 東レエンジニアリング株式会社 | 実装方法および実装装置 |
JP5686321B2 (ja) * | 2011-03-31 | 2015-03-18 | Jukiオートメーションシステムズ株式会社 | 実装装置、電子部品の実装方法及び基板の製造方法 |
US8967452B2 (en) * | 2012-04-17 | 2015-03-03 | Asm Technology Singapore Pte Ltd | Thermal compression bonding of semiconductor chips |
US8870051B2 (en) * | 2012-05-03 | 2014-10-28 | International Business Machines Corporation | Flip chip assembly apparatus employing a warpage-suppressor assembly |
JP5878843B2 (ja) * | 2012-08-08 | 2016-03-08 | 日本特殊陶業株式会社 | スパークプラグの製造方法 |
DE102013204590B3 (de) * | 2013-03-15 | 2014-07-24 | Asm Assembly Systems Gmbh & Co. Kg | Erkennen eines schwingenden Bauelementeträgers während einer Bestückung mit Bauelementen |
US9165902B2 (en) * | 2013-12-17 | 2015-10-20 | Kulicke And Soffa Industries, Inc. | Methods of operating bonding machines for bonding semiconductor elements, and bonding machines |
US9575560B2 (en) | 2014-06-03 | 2017-02-21 | Google Inc. | Radar-based gesture-recognition through a wearable device |
US9921660B2 (en) | 2014-08-07 | 2018-03-20 | Google Llc | Radar-based gesture recognition |
US9811164B2 (en) | 2014-08-07 | 2017-11-07 | Google Inc. | Radar-based gesture sensing and data transmission |
US9588625B2 (en) | 2014-08-15 | 2017-03-07 | Google Inc. | Interactive textiles |
US10268321B2 (en) | 2014-08-15 | 2019-04-23 | Google Llc | Interactive textiles within hard objects |
US11169988B2 (en) | 2014-08-22 | 2021-11-09 | Google Llc | Radar recognition-aided search |
US9778749B2 (en) | 2014-08-22 | 2017-10-03 | Google Inc. | Occluded gesture recognition |
US9600080B2 (en) | 2014-10-02 | 2017-03-21 | Google Inc. | Non-line-of-sight radar-based gesture recognition |
WO2016087904A1 (zh) * | 2014-12-05 | 2016-06-09 | 三星电子株式会社 | 制造半导体装置的设备和利用其制造半导体封装件的方法 |
US10016162B1 (en) | 2015-03-23 | 2018-07-10 | Google Llc | In-ear health monitoring |
US9983747B2 (en) | 2015-03-26 | 2018-05-29 | Google Llc | Two-layer interactive textiles |
US9847313B2 (en) * | 2015-04-24 | 2017-12-19 | Kulicke And Soffa Industries, Inc. | Thermocompression bonders, methods of operating thermocompression bonders, and horizontal scrub motions in thermocompression bonding |
CN111880650A (zh) | 2015-04-30 | 2020-11-03 | 谷歌有限责任公司 | 基于宽场雷达的手势识别 |
KR102327044B1 (ko) | 2015-04-30 | 2021-11-15 | 구글 엘엘씨 | 타입-애그노스틱 rf 신호 표현들 |
KR102002112B1 (ko) | 2015-04-30 | 2019-07-19 | 구글 엘엘씨 | 제스처 추적 및 인식을 위한 rf―기반 마이크로―모션 추적 |
JP5930563B2 (ja) * | 2015-05-14 | 2016-06-08 | 東レエンジニアリング株式会社 | 実装方法および実装装置 |
US10088908B1 (en) | 2015-05-27 | 2018-10-02 | Google Llc | Gesture detection and interactions |
US9693592B2 (en) * | 2015-05-27 | 2017-07-04 | Google Inc. | Attaching electronic components to interactive textiles |
US9929121B2 (en) | 2015-08-31 | 2018-03-27 | Kulicke And Soffa Industries, Inc. | Bonding machines for bonding semiconductor elements, methods of operating bonding machines, and techniques for improving UPH on such bonding machines |
US10817065B1 (en) | 2015-10-06 | 2020-10-27 | Google Llc | Gesture recognition using multiple antenna |
US9837760B2 (en) | 2015-11-04 | 2017-12-05 | Google Inc. | Connectors for connecting electronics embedded in garments to external devices |
KR102427644B1 (ko) | 2015-11-16 | 2022-08-02 | 삼성전자주식회사 | 광원 모듈, 광원 모듈의 제조방법 및 이를 포함하는 디스플레이 장치 |
US10492302B2 (en) | 2016-05-03 | 2019-11-26 | Google Llc | Connecting an electronic component to an interactive textile |
WO2017200570A1 (en) | 2016-05-16 | 2017-11-23 | Google Llc | Interactive object with multiple electronics modules |
US10579150B2 (en) | 2016-12-05 | 2020-03-03 | Google Llc | Concurrent detection of absolute distance and relative movement for sensing action gestures |
KR102242248B1 (ko) * | 2017-05-02 | 2021-04-20 | 주식회사 엘지화학 | 이차전지의 용접 검사장치 및 검사방법 |
DE102019109262A1 (de) * | 2019-04-09 | 2020-10-15 | Lisa Dräxlmaier GmbH | VORRICHTUNG ZUM BESTIMMEN EINES ZUSTANDS EINES ULTRASCHALLSCHWEIßPROZESSES |
KR20220133377A (ko) * | 2021-03-24 | 2022-10-05 | 삼성전자주식회사 | 반도체 제조 장치 |
WO2022222148A1 (zh) * | 2021-04-23 | 2022-10-27 | 重庆康佳光电技术研究院有限公司 | 芯片转移方法、装置、显示背板及显示器 |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3596050A (en) * | 1970-05-05 | 1971-07-27 | Union Carbide Corp | Automatic torch height control |
SU1128201A1 (ru) * | 1983-04-07 | 1984-12-07 | Предприятие П/Я Р-6668 | Устройство контрол па ных соединений |
DD217088A1 (de) * | 1983-08-29 | 1985-01-02 | Adw Ddr | Verfahren zur einstellung eines optimalen arbeitsbereiches beim ultraschallbonden |
JP2506958B2 (ja) * | 1988-07-22 | 1996-06-12 | 松下電器産業株式会社 | ワイヤボンディング装置 |
CA1285661C (en) * | 1988-08-19 | 1991-07-02 | Randy Tsang | Automatic visual measurement of surface mount device placement |
US5176140A (en) * | 1989-08-14 | 1993-01-05 | Olympus Optical Co., Ltd. | Ultrasonic probe |
JPH03125447A (ja) * | 1989-10-11 | 1991-05-28 | Toshiba Corp | ボンディング装置 |
US4998664A (en) * | 1989-12-22 | 1991-03-12 | Hughes Aircraft Company | Bond signature analyzer |
ATE117611T1 (de) * | 1991-02-15 | 1995-02-15 | Esec Sa | Verfahren und einrichtung zur messung der schwingungsamplitude an einem energietransducer. |
JP2953116B2 (ja) * | 1991-06-11 | 1999-09-27 | 日本電気株式会社 | ワイヤーボンディング装置 |
JP3007195B2 (ja) * | 1991-09-18 | 2000-02-07 | 株式会社日立製作所 | ボンディング装置およびボンディング部検査装置 |
JP2705423B2 (ja) * | 1992-01-24 | 1998-01-28 | 株式会社日立製作所 | 超音波接合装置及び品質モニタリング方法 |
US5230458A (en) * | 1992-06-23 | 1993-07-27 | National Semiconductor Corp. | Interconnect formation utilizing real-time feedback |
JPH06210475A (ja) * | 1993-01-14 | 1994-08-02 | Fanuc Ltd | レーザロボットのハイトセンサ装置 |
JP3194553B2 (ja) * | 1993-08-13 | 2001-07-30 | 富士通株式会社 | 半導体装置の製造方法 |
US5341979A (en) * | 1993-09-03 | 1994-08-30 | Motorola, Inc. | Method of bonding a semiconductor substrate to a support substrate and structure therefore |
JPH07115109A (ja) * | 1993-10-15 | 1995-05-02 | Nec Corp | フリップチップボンディング方法及び装置 |
US5446261A (en) * | 1993-10-26 | 1995-08-29 | International Business Machines Corporation | Solder application system using helix to control solder meniscus |
US5493775A (en) * | 1994-01-21 | 1996-02-27 | International Business Machines Corporation | Pressure contact open-circuit detector |
US5427301A (en) * | 1994-05-06 | 1995-06-27 | Ford Motor Company | Ultrasonic flip chip process and apparatus |
JPH0817876A (ja) * | 1994-06-29 | 1996-01-19 | Fujitsu Ltd | ワイヤーボンダー |
JPH0951007A (ja) * | 1995-08-09 | 1997-02-18 | Mitsubishi Electric Corp | ダイボンド装置および半導体装置の製造方法 |
US5992729A (en) * | 1996-10-02 | 1999-11-30 | Mcnc | Tacking processes and systems for soldering |
JP3330037B2 (ja) * | 1996-11-29 | 2002-09-30 | 富士通株式会社 | チップ部品の接合方法および装置 |
EP1010492B1 (en) * | 1998-12-10 | 2004-09-01 | Ultex Corporation | Ultrasonic vibration bonding method |
-
1998
- 1998-04-09 JP JP09733598A patent/JP3176580B2/ja not_active Expired - Lifetime
-
1999
- 1999-03-30 TW TW088105036A patent/TW526688B/zh not_active IP Right Cessation
- 1999-04-07 DE DE69928457T patent/DE69928457T2/de not_active Expired - Lifetime
- 1999-04-07 DE DE69925878T patent/DE69925878T2/de not_active Expired - Lifetime
- 1999-04-07 EP EP04017117A patent/EP1486790B1/en not_active Expired - Lifetime
- 1999-04-07 EP EP04017118A patent/EP1469319B1/en not_active Expired - Lifetime
- 1999-04-07 US US09/287,639 patent/US6543668B1/en not_active Expired - Lifetime
- 1999-04-07 EP EP99106876A patent/EP0949670B1/en not_active Expired - Lifetime
- 1999-04-07 DE DE69930433T patent/DE69930433T2/de not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI451819B (zh) * | 2007-02-22 | 2014-09-01 | Shibaura Mechatronics Corp | Installation device and installation method of electronic parts |
Also Published As
Publication number | Publication date |
---|---|
EP1486790A1 (en) | 2004-12-15 |
DE69925878D1 (de) | 2005-07-28 |
EP1469319A1 (en) | 2004-10-20 |
JPH11297761A (ja) | 1999-10-29 |
EP0949670A2 (en) | 1999-10-13 |
EP1486790B1 (en) | 2005-11-16 |
DE69928457T2 (de) | 2006-07-27 |
EP0949670A3 (en) | 1999-11-17 |
US6543668B1 (en) | 2003-04-08 |
DE69925878T2 (de) | 2006-05-11 |
EP0949670B1 (en) | 2005-06-22 |
JP3176580B2 (ja) | 2001-06-18 |
EP1469319B1 (en) | 2006-03-22 |
DE69930433D1 (de) | 2006-05-11 |
DE69930433T2 (de) | 2006-12-07 |
DE69928457D1 (de) | 2005-12-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW526688B (en) | Mounting method of electronic component and mounting apparatus | |
US7492449B2 (en) | Inspection systems and methods | |
WO2006095759A1 (ja) | 接続ピンの形成方法,プローブ,接続ピン,プローブカード及びプローブカードの製造方法 | |
JPH02187286A (ja) | 自動ワイヤ接着装置 | |
Luk et al. | Development of gold to gold interconnection flip chip bonding for chip on suspension assemblies | |
US5533398A (en) | Method and apparatus for testing lead connections of electronic components | |
US5201841A (en) | Thermal delay non-destructive bond integrity inspection | |
JP2782940B2 (ja) | 浮動型磁気ヘッド装置 | |
Long et al. | Wire loss monitoring in ultrasonic wedge bonding using the Kalman filter algorithm | |
Ume et al. | Laser ultrasonic inspection of solder bumps in flip-chip packages using virtual chip package as reference | |
US20020195476A1 (en) | Head assembly of a disk apparatus having a head IC chip mounted on a suspension by ultrasonic bonding | |
US5493775A (en) | Pressure contact open-circuit detector | |
Harman | Acoustic-emission-monitored tests for TAB inner lead bond quality | |
Seah et al. | Fatigue crack propagation behavior of lead-free solder joints under high-strain-rate cyclic loading | |
TWI824274B (zh) | 導線接合狀態判斷方法及導線接合狀態判斷裝置 | |
JP7462270B2 (ja) | デバイス製造装置の検査方法及びデバイス製造装置 | |
JPH06163651A (ja) | 半導体ウェハ検査装置 | |
JPH07103860A (ja) | Tcp用ハンドラ | |
JP2001127112A (ja) | 半導体チップボンディング方法および装置 | |
CN116952453A (zh) | 气压传感器封装结构、检测系统及自测试方法 | |
KR20200045334A (ko) | 다이 풀 테스트 장치 | |
Gao et al. | An investigation of capillary vibration during wire bonding process | |
JP2023006251A (ja) | ボンディング装置、制御方法、および、制御システム | |
JPH0415556A (ja) | 接合部の接合欠陥検出方法及びその装置 | |
JPH02108983A (ja) | プローブボード |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
GD4A | Issue of patent certificate for granted invention patent | ||
MK4A | Expiration of patent term of an invention patent |