TW523605B - Remote test module for automatic test equipment - Google Patents

Remote test module for automatic test equipment Download PDF

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Publication number
TW523605B
TW523605B TW088118281A TW88118281A TW523605B TW 523605 B TW523605 B TW 523605B TW 088118281 A TW088118281 A TW 088118281A TW 88118281 A TW88118281 A TW 88118281A TW 523605 B TW523605 B TW 523605B
Authority
TW
Taiwan
Prior art keywords
test
signal
module
patent application
item
Prior art date
Application number
TW088118281A
Other languages
English (en)
Chinese (zh)
Inventor
Jonathan Fuller
Charles Crapuchettes
Stuart Nelson
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Application granted granted Critical
Publication of TW523605B publication Critical patent/TW523605B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31724—Test controller, e.g. BIST state machine
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
TW088118281A 1998-10-23 2000-03-14 Remote test module for automatic test equipment TW523605B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/178,257 US6275962B1 (en) 1998-10-23 1998-10-23 Remote test module for automatic test equipment

Publications (1)

Publication Number Publication Date
TW523605B true TW523605B (en) 2003-03-11

Family

ID=22651840

Family Applications (1)

Application Number Title Priority Date Filing Date
TW088118281A TW523605B (en) 1998-10-23 2000-03-14 Remote test module for automatic test equipment

Country Status (7)

Country Link
US (1) US6275962B1 (ko)
EP (1) EP1123514B1 (ko)
JP (1) JP4708566B2 (ko)
KR (1) KR100649648B1 (ko)
DE (1) DE69904854T2 (ko)
TW (1) TW523605B (ko)
WO (1) WO2000025144A1 (ko)

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* Cited by examiner, † Cited by third party
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CN108291937A (zh) * 2015-11-20 2018-07-17 泰拉丁公司 用于自动测试设备的校准装置
CN110208680A (zh) * 2019-06-26 2019-09-06 长电科技（滁州）有限公司 一种芯片测试系统及方法
TWI845899B (zh) * 2021-04-28 2024-06-21 日商愛德萬測試股份有限公司 用於校準多個自動化測試設備通道的電路和方法

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108291937A (zh) * 2015-11-20 2018-07-17 泰拉丁公司 用于自动测试设备的校准装置
CN110208680A (zh) * 2019-06-26 2019-09-06 长电科技（滁州）有限公司 一种芯片测试系统及方法
TWI845899B (zh) * 2021-04-28 2024-06-21 日商愛德萬測試股份有限公司 用於校準多個自動化測試設備通道的電路和方法

Also Published As

Publication number Publication date
JP4708566B2 (ja) 2011-06-22
EP1123514A1 (en) 2001-08-16
KR100649648B1 (ko) 2006-11-24
JP2002528726A (ja) 2002-09-03
WO2000025144A1 (en) 2000-05-04
EP1123514B1 (en) 2003-01-08
DE69904854D1 (de) 2003-02-13
US6275962B1 (en) 2001-08-14
DE69904854T2 (de) 2003-11-20
KR20010080184A (ko) 2001-08-22

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