JPS54150051A - Characteristic test device - Google Patents

Characteristic test device

Info

Publication number
JPS54150051A
JPS54150051A JP5928278A JP5928278A JPS54150051A JP S54150051 A JPS54150051 A JP S54150051A JP 5928278 A JP5928278 A JP 5928278A JP 5928278 A JP5928278 A JP 5928278A JP S54150051 A JPS54150051 A JP S54150051A
Authority
JP
Japan
Prior art keywords
circuit
test
speed
measured
parameter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5928278A
Other languages
Japanese (ja)
Inventor
Yukio Oda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP5928278A priority Critical patent/JPS54150051A/en
Publication of JPS54150051A publication Critical patent/JPS54150051A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: To accelerate the response test of the measured circuit and thus to insure the AC parameter by providing the high-speed measurement auxiliary circuit between the general-purpose circuit test device and the measured circuit.
CONSTITUTION: High-speed measurement auxiliary circuit 3 features the synchronization and operation of several times as high as the speed of general-purpose circuit test device 1, and generated both the test data and circuit operation series based on a certain action execution order when receiving the test data and action mode designations from device 1 in order to activate measured circuit 2. And the quality decision is carried out according to the answer given from circuit 2, and the result is sent back to device 1 in the form of the expected value data or its inverse value. If the timing is prepared so that all AC parameters of circuit 2 can be insured to the actions and series generated from circuit 3 with every cycle of them, the test can be finished by just one execution. As a result, the response test and the perfect test of the AC parameter are possible in a high speed, shortening the test time.
COPYRIGHT: (C)1979,JPO&Japio
JP5928278A 1978-05-18 1978-05-18 Characteristic test device Pending JPS54150051A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5928278A JPS54150051A (en) 1978-05-18 1978-05-18 Characteristic test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5928278A JPS54150051A (en) 1978-05-18 1978-05-18 Characteristic test device

Publications (1)

Publication Number Publication Date
JPS54150051A true JPS54150051A (en) 1979-11-24

Family

ID=13108868

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5928278A Pending JPS54150051A (en) 1978-05-18 1978-05-18 Characteristic test device

Country Status (1)

Country Link
JP (1) JPS54150051A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02159585A (en) * 1988-12-13 1990-06-19 Toshiba Corp Testing device of lsi
JP2002528726A (en) * 1998-10-23 2002-09-03 テラダイン・インコーポレーテッド Remote test module for automatic test equipment

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02159585A (en) * 1988-12-13 1990-06-19 Toshiba Corp Testing device of lsi
JP2002528726A (en) * 1998-10-23 2002-09-03 テラダイン・インコーポレーテッド Remote test module for automatic test equipment
JP4708566B2 (en) * 1998-10-23 2011-06-22 テラダイン・インコーポレーテッド Remote test module for automatic test equipment

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