TW495607B - Inspecting system for flat glasses in the display manufacturing - Google Patents

Inspecting system for flat glasses in the display manufacturing Download PDF

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Publication number
TW495607B
TW495607B TW90128418A TW90128418A TW495607B TW 495607 B TW495607 B TW 495607B TW 90128418 A TW90128418 A TW 90128418A TW 90128418 A TW90128418 A TW 90128418A TW 495607 B TW495607 B TW 495607B
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TW
Taiwan
Prior art keywords
inspection system
scope
patent application
item
camera
Prior art date
Application number
TW90128418A
Other languages
English (en)
Chinese (zh)
Inventor
Oliver Bornholdt
Gunther Galfe
Detlef Hagenbruck
Wolfram Laux
Original Assignee
Basler Ag
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Filing date
Publication date
Application filed by Basler Ag filed Critical Basler Ag
Application granted granted Critical
Publication of TW495607B publication Critical patent/TW495607B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod

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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
TW90128418A 2000-11-17 2001-11-16 Inspecting system for flat glasses in the display manufacturing TW495607B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2000157036 DE10057036C2 (de) 2000-11-17 2000-11-17 Inspektionssystem für Flachgläser in der Displayfertigung

Publications (1)

Publication Number Publication Date
TW495607B true TW495607B (en) 2002-07-21

Family

ID=7663654

Family Applications (1)

Application Number Title Priority Date Filing Date
TW90128418A TW495607B (en) 2000-11-17 2001-11-16 Inspecting system for flat glasses in the display manufacturing

Country Status (5)

Country Link
JP (1) JP2002277401A (de)
KR (1) KR20020038488A (de)
CN (1) CN1174242C (de)
DE (1) DE10057036C2 (de)
TW (1) TW495607B (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI508829B (zh) * 2005-12-22 2015-11-21 Photon Dynamics Inc 用於處理及對準玻璃基材的方法及設備

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10057036C2 (de) * 2000-11-17 2002-12-12 Basler Ag Inspektionssystem für Flachgläser in der Displayfertigung
DE10231853A1 (de) * 2002-07-12 2004-01-29 Basler Ag Transportsystem für flache flexible Gegenstände
KR100516070B1 (ko) * 2003-05-30 2005-09-22 삼성코닝정밀유리 주식회사 틸팅 이송 라인스캔 검사 시스템
CN100356137C (zh) * 2004-10-20 2007-12-19 力特光电科技股份有限公司 在线自动测量光学薄板翘曲的方法以及装置
JP4780984B2 (ja) * 2005-03-18 2011-09-28 オリンパス株式会社 基板搬送装置
TWI307929B (en) * 2005-05-12 2009-03-21 Olympus Corp Substrate inspection apparatus
US7567344B2 (en) * 2006-05-12 2009-07-28 Corning Incorporated Apparatus and method for characterizing defects in a transparent substrate
WO2009082855A1 (fr) * 2007-12-26 2009-07-09 Hanchang Huang Dispositif de mesure avec une table de travail ayant un verre sur coussin d'air
TWI376500B (en) 2008-03-28 2012-11-11 Ind Tech Res Inst System for detecting defect of panel device
CN101566583B (zh) * 2008-04-23 2011-04-13 财团法人工业技术研究院 面板元件缺陷检测系统
CN101718828B (zh) * 2008-12-24 2012-08-08 四川虹欧显示器件有限公司 用于平板显示器的缺陷确认装置及其操作方法
CN101871896B (zh) * 2009-04-24 2012-11-14 湖南科创信息技术股份有限公司 表面压纹玻璃瑕疵在线检测方法
CN101633441B (zh) * 2009-08-19 2012-05-23 友达光电股份有限公司 基板处理系统及其基板搬运装置
DE102010046433B4 (de) * 2010-09-24 2012-06-21 Grenzebach Maschinenbau Gmbh Vorrichtung und Verfahren zum Detektieren von Fehlstellen in kontinuierlich erzeugtem Float-Glas
AT511055B1 (de) * 2011-03-24 2012-09-15 Softsolution Gmbh Vorrichtung zur projektion von produkt- bzw. produktionsrelevanten bild- und textdaten an anlagen zur produktion von einzel- bzw. isolierglasscheiben
US20130215419A1 (en) * 2012-02-22 2013-08-22 Cooper S. K. Kuo Optical inspection device
US9140655B2 (en) 2012-12-27 2015-09-22 Shenzhen China Star Optoelectronics Technology Co., Ltd. Mother glass inspection device and mother glass inspection method
CN103076343B (zh) * 2012-12-27 2016-09-14 深圳市华星光电技术有限公司 素玻璃激光检查机及素玻璃检查方法
CN103115928A (zh) * 2013-02-05 2013-05-22 深圳市华星光电技术有限公司 玻璃表面异物检查装置、检查机及其检查方法
CN103557789B (zh) * 2013-10-25 2017-02-08 广州福耀玻璃有限公司 烘弯玻璃的检测方法及装置
KR20150056713A (ko) 2013-11-15 2015-05-27 삼성전자주식회사 영상표시장치의 비파괴 검사 시스템 및 방법과 이를 위한 비파괴 검사 장치
CN113103661A (zh) * 2014-11-19 2021-07-13 鲍勃斯脱梅克斯股份有限公司 用于光学控制坯料的面的设备
WO2017221825A1 (ja) * 2016-06-23 2017-12-28 日本電気硝子株式会社 ガラス基板歪測定方法及びガラス基板歪測定装置
CN108344747B (zh) * 2018-02-08 2021-12-03 芜湖美智空调设备有限公司 滤网洁净度检测方法、滤网洁净度传感器和空气处理设备
CN114858082B (zh) * 2022-05-07 2023-09-29 交通运输部公路科学研究所 一种露石混凝土路表功能检测装置及其检测方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3857637A (en) * 1973-01-10 1974-12-31 Ppg Industries Inc Surface distortion analyzer
IT206200Z2 (it) * 1985-11-22 1987-07-13 Bottero Spa Dispositivo per il trasporto dilastre di vetro piane
DE9211860U1 (de) * 1991-09-16 1992-11-05 Lisec, Peter, Amstetten-Hausmening, At
JPH06255775A (ja) * 1993-03-05 1994-09-13 Ochiai Nekusasu:Kk 搬送装置
US5411617A (en) * 1993-04-26 1995-05-02 Hughes Aircraft Company Method for use in fabricating and/or testing a thin mirror
JP3290535B2 (ja) * 1994-03-23 2002-06-10 東芝エンジニアリング株式会社 欠陥検出装置
JP3178644B2 (ja) * 1995-02-10 2001-06-25 セントラル硝子株式会社 透明板状体の欠点検出方法
JP2996390B2 (ja) * 1996-08-09 1999-12-27 アツサ・インダストリーズ（シー．エス．）リミテツド パレットの上に置かれている物品の保管、取出しおよび輸送用システム
DE19813072A1 (de) * 1998-03-25 1999-09-30 Laser Sorter Gmbh Verfahren und Vorrichtung zur Bestimmung der optischen Qualität und zur Detektion von Fehlern von Flachglas und anderen optisch transparenten Materialien
DE19822282C1 (de) * 1998-05-18 1999-07-01 Torgauer Maschinenbau Gmbh Vorrichtung zum Glasschneiden
DE19858428C2 (de) * 1998-12-17 2002-09-12 Leica Microsystems Koordinaten-Messanordnung
DE19913928B4 (de) * 1999-03-26 2015-06-11 Voith Patent Gmbh Vorrichtung zum Bestimmen von Eigenschaften einer laufenden Materialbahn
DE10057036C2 (de) * 2000-11-17 2002-12-12 Basler Ag Inspektionssystem für Flachgläser in der Displayfertigung

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI508829B (zh) * 2005-12-22 2015-11-21 Photon Dynamics Inc 用於處理及對準玻璃基材的方法及設備

Also Published As

Publication number Publication date
DE10057036A1 (de) 2002-05-29
CN1354362A (zh) 2002-06-19
CN1174242C (zh) 2004-11-03
KR20020038488A (ko) 2002-05-23
DE10057036C2 (de) 2002-12-12
JP2002277401A (ja) 2002-09-25

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