TW488060B - Ferroelectric memory - Google Patents
Ferroelectric memory Download PDFInfo
- Publication number
- TW488060B TW488060B TW090105317A TW90105317A TW488060B TW 488060 B TW488060 B TW 488060B TW 090105317 A TW090105317 A TW 090105317A TW 90105317 A TW90105317 A TW 90105317A TW 488060 B TW488060 B TW 488060B
- Authority
- TW
- Taiwan
- Prior art keywords
- memory
- power
- power supply
- circuit
- block
- Prior art date
Links
- 239000003990 capacitor Substances 0.000 claims abstract description 31
- 230000004044 response Effects 0.000 claims abstract 3
- 238000001514 detection method Methods 0.000 claims description 29
- 239000000872 buffer Substances 0.000 claims description 6
- 230000002079 cooperative effect Effects 0.000 claims description 6
- 230000000875 corresponding effect Effects 0.000 claims description 6
- 238000010586 diagram Methods 0.000 description 5
- 230000001939 inductive effect Effects 0.000 description 3
- 230000002159 abnormal effect Effects 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 2
- 238000003491 array Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 230000002269 spontaneous effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000066689A JP3916837B2 (ja) | 2000-03-10 | 2000-03-10 | 強誘電体メモリ |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW488060B true TW488060B (en) | 2002-05-21 |
Family
ID=18586009
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW090105317A TW488060B (en) | 2000-03-10 | 2001-03-07 | Ferroelectric memory |
Country Status (3)
| Country | Link |
|---|---|
| US (2) | US6643162B2 (enExample) |
| JP (1) | JP3916837B2 (enExample) |
| TW (1) | TW488060B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI675291B (zh) * | 2017-08-29 | 2019-10-21 | 力晶積成電子製造股份有限公司 | 電源控制電路以及具備電源控制電路的邏輯電路裝置 |
Families Citing this family (51)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1187140A3 (en) * | 2000-09-05 | 2002-09-11 | Matsushita Electric Industrial Co., Ltd. | Method for driving semiconductor memory |
| JP3951773B2 (ja) * | 2002-03-28 | 2007-08-01 | 富士通株式会社 | リーク電流遮断回路を有する半導体集積回路 |
| US6735117B2 (en) * | 2002-07-01 | 2004-05-11 | Honeywell International Inc. | Hold-up power supply for flash memory |
| KR100469153B1 (ko) | 2002-08-30 | 2005-02-02 | 주식회사 하이닉스반도체 | 강유전체 메모리 장치 |
| JP2005101522A (ja) * | 2003-08-21 | 2005-04-14 | Matsushita Electric Ind Co Ltd | 半導体集積回路装置 |
| JP2005115857A (ja) * | 2003-10-10 | 2005-04-28 | Sony Corp | ファイル記憶装置 |
| US20070130425A1 (en) * | 2004-05-25 | 2007-06-07 | Eiji Ueda | Semiconductor memory card |
| JP4197678B2 (ja) * | 2004-12-24 | 2008-12-17 | 富士通マイクロエレクトロニクス株式会社 | 半導体装置 |
| US7212431B2 (en) * | 2004-12-29 | 2007-05-01 | Hynix Semiconductor Inc. | Nonvolatile ferroelectric memory device and control method thereof |
| KR100665844B1 (ko) * | 2005-01-04 | 2007-01-09 | 삼성전자주식회사 | 강유전체 메모리 장치 및 그의 구동방법 |
| US7589584B1 (en) * | 2005-04-01 | 2009-09-15 | Altera Corporation | Programmable voltage regulator with dynamic recovery circuits |
| JP4822828B2 (ja) * | 2005-12-13 | 2011-11-24 | ルネサスエレクトロニクス株式会社 | 不揮発性記憶装置 |
| JP2007251351A (ja) * | 2006-03-14 | 2007-09-27 | Renesas Technology Corp | 半導体装置 |
| JP4996277B2 (ja) | 2007-02-09 | 2012-08-08 | 株式会社東芝 | 半導体記憶システム |
| WO2008142732A1 (ja) * | 2007-05-18 | 2008-11-27 | Fujitsu Microelectronics Limited | 半導体メモリ |
| JP2009003991A (ja) * | 2007-06-19 | 2009-01-08 | Toshiba Corp | 半導体装置及び半導体メモリテスト装置 |
| JP2009032324A (ja) * | 2007-07-26 | 2009-02-12 | Spansion Llc | 複数のメモリブロックを備える不揮発性記憶装置 |
| CN101682325B (zh) * | 2008-02-27 | 2013-06-05 | 松下电器产业株式会社 | 半导体集成电路以及包括该半导体集成电路的各种装置 |
| US8031549B2 (en) * | 2008-09-19 | 2011-10-04 | Freescale Semiconductor, Inc. | Integrated circuit having boosted array voltage and method therefor |
| JP2010097633A (ja) * | 2008-10-14 | 2010-04-30 | Toshiba Corp | 半導体記憶装置 |
| US8072237B1 (en) * | 2009-06-04 | 2011-12-06 | Altera Corporation | Computer-aided design tools and memory element power supply circuitry for selectively overdriving circuit blocks |
| JP4908560B2 (ja) * | 2009-08-31 | 2012-04-04 | 株式会社東芝 | 強誘電体メモリ及びメモリシステム |
| US8164964B2 (en) * | 2009-09-16 | 2012-04-24 | Arm Limited | Boosting voltage levels applied to an access control line when accessing storage cells in a memory |
| DE102010011749B4 (de) | 2010-03-17 | 2018-05-03 | Texas Instruments Deutschland Gmbh | Elektronische Vorrichtung und Verfahren zur FRAM-Spannungsversorgungsverwaltung |
| US8120984B2 (en) * | 2010-03-23 | 2012-02-21 | Ememory Technology Inc. | High-voltage selecting circuit which can generate an output voltage without a voltage drop |
| US8437169B2 (en) * | 2010-12-20 | 2013-05-07 | Texas Instruments Incorporated | Fast response circuits and methods for FRAM power loss protection |
| JP2013077962A (ja) * | 2011-09-30 | 2013-04-25 | Renesas Electronics Corp | 論理回路、半導体集積回路 |
| JP2013191262A (ja) * | 2012-03-15 | 2013-09-26 | Elpida Memory Inc | 半導体装置 |
| US9444460B1 (en) | 2013-11-22 | 2016-09-13 | Altera Corporation | Integrated circuits with programmable overdrive capabilities |
| JP6287609B2 (ja) * | 2014-06-11 | 2018-03-07 | 株式会社ソシオネクスト | 半導体装置及び半導体装置の設計方法 |
| US10121534B1 (en) | 2015-12-18 | 2018-11-06 | Altera Corporation | Integrated circuit with overdriven and underdriven pass gates |
| KR20180047835A (ko) * | 2016-11-01 | 2018-05-10 | 에스케이하이닉스 주식회사 | 저항성 메모리 장치 |
| US10229727B1 (en) | 2018-03-13 | 2019-03-12 | Micron Technology, Inc. | Apparatus and method for controlling erasing data in ferroelectric memory cells |
| US10600468B2 (en) * | 2018-08-13 | 2020-03-24 | Wuxi Petabyte Technologies Co, Ltd. | Methods for operating ferroelectric memory cells each having multiple capacitors |
| US11476260B2 (en) | 2019-02-27 | 2022-10-18 | Kepler Computing Inc. | High-density low voltage non-volatile memory with unidirectional plate-line and bit-line and pillar capacitor |
| US10847201B2 (en) | 2019-02-27 | 2020-11-24 | Kepler Computing Inc. | High-density low voltage non-volatile differential memory bit-cell with shared plate line |
| US11527277B1 (en) | 2021-06-04 | 2022-12-13 | Kepler Computing Inc. | High-density low voltage ferroelectric memory bit-cell |
| US11696451B1 (en) | 2021-11-01 | 2023-07-04 | Kepler Computing Inc. | Common mode compensation for non-linear polar material based 1T1C memory bit-cell |
| US11482270B1 (en) * | 2021-11-17 | 2022-10-25 | Kepler Computing Inc. | Pulsing scheme for a ferroelectric memory bit-cell to minimize read or write disturb effect and refresh logic |
| US12327581B2 (en) * | 2021-12-21 | 2025-06-10 | Intel Corporation | Embedded memory IC's with power supply droop circuitry coupled to ferroelectric capacitors |
| US12108609B1 (en) | 2022-03-07 | 2024-10-01 | Kepler Computing Inc. | Memory bit-cell with stacked and folded planar capacitors |
| US12324163B1 (en) | 2022-03-15 | 2025-06-03 | Kepler Computing Inc. | Planar capacitors with shared electrode and methods of fabrication |
| US20230395134A1 (en) | 2022-06-03 | 2023-12-07 | Kepler Computing Inc. | Write disturb mitigation for non-linear polar material based multi-capacitor bit-cell |
| US12289894B1 (en) | 2022-06-17 | 2025-04-29 | Kepler Computing Inc. | Method of fabricating transistors and stacked planar capacitors for memory and logic applications |
| US12300297B1 (en) | 2022-08-05 | 2025-05-13 | Kepler Computing Inc. | Memory array with buried or backside word-line |
| US12062584B1 (en) | 2022-10-28 | 2024-08-13 | Kepler Computing Inc. | Iterative method of multilayer stack development for device applications |
| US11741428B1 (en) | 2022-12-23 | 2023-08-29 | Kepler Computing Inc. | Iterative monetization of process development of non-linear polar material and devices |
| US12347476B1 (en) | 2022-12-27 | 2025-07-01 | Kepler Computing Inc. | Apparatus and method to improve sensing noise margin in a non-linear polar material based bit-cell |
| US12334127B2 (en) | 2023-01-30 | 2025-06-17 | Kepler Computing Inc. | Non-linear polar material based multi-capacitor high density bit-cell |
| US11765908B1 (en) | 2023-02-10 | 2023-09-19 | Kepler Computing Inc. | Memory device fabrication through wafer bonding |
| US20240274651A1 (en) | 2023-02-10 | 2024-08-15 | Kepler Computing Inc. | Method of forming stacked capacitors through wafer bonding |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US633517A (en) * | 1899-06-03 | 1899-09-19 | Thorber Thorvalson | Car-coupling. |
| JP2768172B2 (ja) * | 1992-09-30 | 1998-06-25 | 日本電気株式会社 | 半導体メモリ装置 |
| US5532953A (en) * | 1995-03-29 | 1996-07-02 | Ramtron International Corporation | Ferroelectric memory sensing method using distinct read and write voltages |
| JP3497601B2 (ja) * | 1995-04-17 | 2004-02-16 | 松下電器産業株式会社 | 半導体集積回路 |
| KR100200922B1 (ko) * | 1995-12-27 | 1999-06-15 | 윤종용 | 반도체 메모리장치의 펌핑전압발생기 |
| US5703804A (en) | 1996-09-26 | 1997-12-30 | Sharp Kabushiki K.K. | Semiconductor memory device |
| JP3961680B2 (ja) * | 1998-06-30 | 2007-08-22 | 株式会社東芝 | 半導体記憶装置 |
| JP2000123578A (ja) | 1998-10-13 | 2000-04-28 | Sharp Corp | 半導体メモリ装置 |
| JP3309822B2 (ja) * | 1999-01-12 | 2002-07-29 | 日本電気株式会社 | 半導体記憶装置及びその試験方法 |
| JP2002042496A (ja) * | 2000-07-26 | 2002-02-08 | Matsushita Electric Ind Co Ltd | 強誘電体メモリ |
-
2000
- 2000-03-10 JP JP2000066689A patent/JP3916837B2/ja not_active Expired - Fee Related
-
2001
- 2001-03-07 TW TW090105317A patent/TW488060B/zh not_active IP Right Cessation
- 2001-03-07 US US09/799,694 patent/US6643162B2/en not_active Expired - Lifetime
-
2003
- 2003-10-02 US US10/676,004 patent/US6906944B2/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI675291B (zh) * | 2017-08-29 | 2019-10-21 | 力晶積成電子製造股份有限公司 | 電源控制電路以及具備電源控制電路的邏輯電路裝置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20010022741A1 (en) | 2001-09-20 |
| JP2001256775A (ja) | 2001-09-21 |
| JP3916837B2 (ja) | 2007-05-23 |
| US20040062115A1 (en) | 2004-04-01 |
| US6643162B2 (en) | 2003-11-04 |
| US6906944B2 (en) | 2005-06-14 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GD4A | Issue of patent certificate for granted invention patent | ||
| MM4A | Annulment or lapse of patent due to non-payment of fees |