TW463205B - Method for producing a Bi-containing ceramic layer - Google Patents
Method for producing a Bi-containing ceramic layer Download PDFInfo
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- TW463205B TW463205B TW087113644A TW87113644A TW463205B TW 463205 B TW463205 B TW 463205B TW 087113644 A TW087113644 A TW 087113644A TW 87113644 A TW87113644 A TW 87113644A TW 463205 B TW463205 B TW 463205B
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- 239000000919 ceramic Substances 0.000 title claims abstract description 12
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 10
- 239000002243 precursor Substances 0.000 claims abstract description 76
- 239000002904 solvent Substances 0.000 claims abstract description 14
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 12
- 150000007524 organic acids Chemical class 0.000 claims abstract description 5
- 125000000896 monocarboxylic acid group Chemical group 0.000 claims abstract 2
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 claims description 72
- 238000000034 method Methods 0.000 claims description 32
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 claims description 16
- 239000000758 substrate Substances 0.000 claims description 15
- 239000000463 material Substances 0.000 claims description 12
- 239000000203 mixture Substances 0.000 claims description 11
- 238000011049 filling Methods 0.000 claims description 8
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 claims description 8
- 239000012530 fluid Substances 0.000 claims description 6
- 229910052797 bismuth Inorganic materials 0.000 claims description 5
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 4
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims description 4
- 238000002844 melting Methods 0.000 claims description 4
- 230000008018 melting Effects 0.000 claims description 4
- 229910052750 molybdenum Inorganic materials 0.000 claims description 4
- 239000011733 molybdenum Substances 0.000 claims description 4
- 238000002156 mixing Methods 0.000 claims description 3
- 150000003839 salts Chemical class 0.000 claims description 3
- 230000002079 cooperative effect Effects 0.000 claims description 2
- 230000008569 process Effects 0.000 claims description 2
- HGSSJXRWSCRNPH-UHFFFAOYSA-K bismuth;butanoate Chemical compound [Bi+3].CCCC([O-])=O.CCCC([O-])=O.CCCC([O-])=O HGSSJXRWSCRNPH-UHFFFAOYSA-K 0.000 claims 1
- NBTOZLQBSIZIKS-UHFFFAOYSA-N methoxide Chemical compound [O-]C NBTOZLQBSIZIKS-UHFFFAOYSA-N 0.000 claims 1
- 239000002023 wood Substances 0.000 claims 1
- 239000000243 solution Substances 0.000 description 22
- 239000003990 capacitor Substances 0.000 description 12
- XBDQKXXYIPTUBI-UHFFFAOYSA-N dimethylselenoniopropionate Natural products CCC(O)=O XBDQKXXYIPTUBI-UHFFFAOYSA-N 0.000 description 8
- 239000007788 liquid Substances 0.000 description 6
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 6
- 239000002253 acid Substances 0.000 description 5
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 5
- 239000000126 substance Substances 0.000 description 5
- QTBSBXVTEAMEQO-UHFFFAOYSA-M Acetate Chemical compound CC([O-])=O QTBSBXVTEAMEQO-UHFFFAOYSA-M 0.000 description 4
- 230000008901 benefit Effects 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 239000012452 mother liquor Substances 0.000 description 4
- 235000019260 propionic acid Nutrition 0.000 description 4
- IUVKMZGDUIUOCP-BTNSXGMBSA-N quinbolone Chemical compound O([C@H]1CC[C@H]2[C@H]3[C@@H]([C@]4(C=CC(=O)C=C4CC3)C)CC[C@@]21C)C1=CCCC1 IUVKMZGDUIUOCP-BTNSXGMBSA-N 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 229910052715 tantalum Inorganic materials 0.000 description 4
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 description 3
- XBDQKXXYIPTUBI-UHFFFAOYSA-M Propionate Chemical compound CCC([O-])=O XBDQKXXYIPTUBI-UHFFFAOYSA-M 0.000 description 3
- CUJRVFIICFDLGR-UHFFFAOYSA-N acetylacetonate Chemical compound CC(=O)[CH-]C(C)=O CUJRVFIICFDLGR-UHFFFAOYSA-N 0.000 description 3
- 229910052454 barium strontium titanate Inorganic materials 0.000 description 3
- 210000004027 cell Anatomy 0.000 description 3
- 238000009833 condensation Methods 0.000 description 3
- 230000005494 condensation Effects 0.000 description 3
- 239000010408 film Substances 0.000 description 3
- 235000019253 formic acid Nutrition 0.000 description 3
- 125000002524 organometallic group Chemical group 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000000137 annealing Methods 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- 239000003849 aromatic solvent Substances 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 238000007865 diluting Methods 0.000 description 2
- 238000002309 gasification Methods 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 231100001261 hazardous Toxicity 0.000 description 2
- 230000007062 hydrolysis Effects 0.000 description 2
- 238000006460 hydrolysis reaction Methods 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 239000000047 product Substances 0.000 description 2
- 238000003980 solgel method Methods 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 210000000352 storage cell Anatomy 0.000 description 2
- 229910052712 strontium Inorganic materials 0.000 description 2
- NGCRLFIYVFOUMZ-UHFFFAOYSA-N 2,3-dichloroquinoxaline-6-carbonyl chloride Chemical compound N1=C(Cl)C(Cl)=NC2=CC(C(=O)Cl)=CC=C21 NGCRLFIYVFOUMZ-UHFFFAOYSA-N 0.000 description 1
- 235000017166 Bambusa arundinacea Nutrition 0.000 description 1
- 235000017491 Bambusa tulda Nutrition 0.000 description 1
- FERIUCNNQQJTOY-UHFFFAOYSA-M Butyrate Chemical compound CCCC([O-])=O FERIUCNNQQJTOY-UHFFFAOYSA-M 0.000 description 1
- FERIUCNNQQJTOY-UHFFFAOYSA-N Butyric acid Natural products CCCC(O)=O FERIUCNNQQJTOY-UHFFFAOYSA-N 0.000 description 1
- ZIPRMPRBQSJVJY-UHFFFAOYSA-N C(C(=O)C)(=O)O.C(C)(=N)N Chemical compound C(C(=O)C)(=O)O.C(C)(=N)N ZIPRMPRBQSJVJY-UHFFFAOYSA-N 0.000 description 1
- 241000406668 Loxodonta cyclotis Species 0.000 description 1
- 240000002853 Nelumbo nucifera Species 0.000 description 1
- 235000006508 Nelumbo nucifera Nutrition 0.000 description 1
- 235000006510 Nelumbo pentapetala Nutrition 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- 235000015334 Phyllostachys viridis Nutrition 0.000 description 1
- 244000082204 Phyllostachys viridis Species 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- -1 Z r Inorganic materials 0.000 description 1
- VNSWULZVUKFJHK-UHFFFAOYSA-N [Sr].[Bi] Chemical compound [Sr].[Bi] VNSWULZVUKFJHK-UHFFFAOYSA-N 0.000 description 1
- 235000011054 acetic acid Nutrition 0.000 description 1
- 150000001242 acetic acid derivatives Chemical class 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 239000011425 bamboo Substances 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000000711 cancerogenic effect Effects 0.000 description 1
- 231100000315 carcinogenic Toxicity 0.000 description 1
- 238000005119 centrifugation Methods 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 210000000078 claw Anatomy 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- NKZSPGSOXYXWQA-UHFFFAOYSA-N dioxido(oxo)titanium;lead(2+) Chemical compound [Pb+2].[O-][Ti]([O-])=O NKZSPGSOXYXWQA-UHFFFAOYSA-N 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- HHFAWKCIHAUFRX-UHFFFAOYSA-N ethoxide Chemical compound CC[O-] HHFAWKCIHAUFRX-UHFFFAOYSA-N 0.000 description 1
- 230000009969 flowable effect Effects 0.000 description 1
- HHLFWLYXYJOTON-UHFFFAOYSA-N glyoxylic acid Chemical compound OC(=O)C=O HHLFWLYXYJOTON-UHFFFAOYSA-N 0.000 description 1
- 239000000383 hazardous chemical Substances 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 231100000206 health hazard Toxicity 0.000 description 1
- 239000000413 hydrolysate Substances 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- 229910052745 lead Inorganic materials 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 230000015654 memory Effects 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000008267 milk Substances 0.000 description 1
- 210000004080 milk Anatomy 0.000 description 1
- 235000013336 milk Nutrition 0.000 description 1
- 239000010413 mother solution Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052762 osmium Inorganic materials 0.000 description 1
- SYQBFIAQOQZEGI-UHFFFAOYSA-N osmium atom Chemical compound [Os] SYQBFIAQOQZEGI-UHFFFAOYSA-N 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 238000009304 pastoral farming Methods 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 238000000197 pyrolysis Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- WOCIAKWEIIZHES-UHFFFAOYSA-N ruthenium(IV) oxide Inorganic materials O=[Ru]=O WOCIAKWEIIZHES-UHFFFAOYSA-N 0.000 description 1
- 235000015170 shellfish Nutrition 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 231100000331 toxic Toxicity 0.000 description 1
- 230000002588 toxic effect Effects 0.000 description 1
- 231100000419 toxicity Toxicity 0.000 description 1
- 230000001988 toxicity Effects 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- 239000000052 vinegar Substances 0.000 description 1
- 235000021419 vinegar Nutrition 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1204—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material inorganic material, e.g. non-oxide and non-metallic such as sulfides, nitrides based compounds
- C23C18/1208—Oxides, e.g. ceramics
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02172—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides
- H01L21/02197—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides the material having a perovskite structure, e.g. BaTiO3
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02205—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/314—Inorganic layers
- H01L21/316—Inorganic layers composed of oxides or glassy oxides or oxide based glass
- H01L21/31691—Inorganic layers composed of oxides or glassy oxides or oxide based glass with perovskite structure
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Materials Engineering (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Thermal Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Semiconductor Memories (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
- Formation Of Insulating Films (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
Description
A7 B7 4 63 20 5 五、發明説明(< ) 本發明關於含有B i成分之陶瓷層的製造方法,其由位 在基質上至少二先質予以組成,尤其關於有鐵電、順電 或超導待性之陶瓷層。 在半導體技術中,對陶瓷薄層之應用愈感興趣。在這 種材料類型中含具有超導、鐵電或介電特性及高介電常 數之化合物。當作為積體電路之電容内的貯存介電體時 ,後二種化合待別有利。陶瓷材料係關於一種氣化物, 其除氧以外尚含有至少二種成分。成分的例子為:B a、 Sr、Bi、Pb、Z r , La、Ti、T a 0 具電容之半導體電路的一痼例子為:DRAH貯存晶胞。 為提昇積體密度,其可作成堆叠的電容晶胞,此時貯存 電容偽安裝於所屬選擇電容上方。對這類電容之平板要 求的一個基本影響偽電容介電體之選用。 習用電容主要使用氣化矽或氮化矽層作為貯存介電體 ,其一般有最大為8之介電常數。前逑材料種類内之順 電材料,如B S T (钛酸鋇锶(B a S r ) Τ ί 0 3 )及相似之類,具 有大於150之介電常數e並因而在相同容量下有較小 之電容。 這類貯存元件(具有順電材料作為電容介電髏D R A Μ )在 供應電Μ下降時遣失其負«並因而遣失其所貯存之資訊 。進一步地,習用貯存元件因殘餘充電,必須重新讀寫 (R e f ! e s h T i m e )。使用鐵電材料作為貯存'介電體,基於 不同之極化方向,允許非流動性貯器之結構,其在供蔭 電壓下降時,未遣失其資訊並不須要重新讓寫。晶胞之 本紙张尺度適用中國國家標卒(('NS > ΛΊ規格(210X 297公釐) (請先聞讀背面之注意事項再填寫本頁) --° 1 6321 A7 B7 -------—____#1¾] 五、發明説明( 殘餘電流不影塑所貯存之訊號。這類鐵電材料之例子例 P z T (钛酸鉛誥(P b ( Z r 1 T i ) 0 3 )及S B T (鉬酸锶鉍
I (請先閱讀背而之注意事項再填寫本頁) (s r Bi 2 Ta 2 〇 9 )〇 這種新穎之鐵電及順電體一般偽在高溫下於氣化的氛 圍内生産,故恃別要求作為第一電容電極之材料相容於 此條件,一般適用者為Pt,Ru, Ru02或相似之類。 為了生産陶瓷薄層,已知三種基本方法:ϋ塗方法、 ) CVD方法及所謂之溶膠-凝膠方法。在溶膠-凝膠方法中 ,有機金屬化學原料一般偽溶於非極性芳香族溶劑(如 二甲苯),溶液施加在晶圓上並予以旋塗(旋轉塗佈法,s ρίπο η - m e t h 〇 d ) 。這 樣所得 的薄膜 (由 有機金 分 子組成 ) 。 接箸在氧氣内轉化成氧化膜。接著予以退火,這在S B T 的情況時為7 D 0 - 8 ϋ CTC溫度,氣化膜轉化成具有所欲特 徵之相。在S Β Τ之情況時,形成具有鐵電特性之層狀鈣 钛礦相,在BST或ΡΖΤ之情況時,呈現較簡單之鈣钛礦 (在4 5 0 - 6 5 0Ό下退火)。此類溶_凝_方法的一個例子 為W0 93/12538中所述的方法。在此生産方法中,一般 溶劑,尤其為非極性芳香族溶劑之應用,因其毒性及潜 在之致癌危險,而係有問題的。另一個SBT的生産方法, 被描述於 T. Boyle等人在 Jounal of Material Research 第11卷,第9號1996年9月第2274-2281頁的論文中。 其中,含Ta及含Sr之先質溶於醋酸中。在該論文中證實 :含祕之先質不溶於醋酸,因而必須溶於吡啶。這個方 法的缺點傜其藉由二個相異原料溶液之加壓蓮動應用而 本紙尺度適州中國國象掠卒(CNS ) Λ4说枯(2]〇〆297公梵) 經潢部中"標準扃貝工消费合竹社印*'1本 4 6320 〇 Α7 _ Β7 五、發明説明(々) 施行,而該溶在晶圓積層前立即溶解。此外,有含原料 溶液之醋酸之替換的問題。在此種情況下,含T a先質( 乙氧化钽)與醋酸反應形成醋酸酯及水^水分水解含鉅 先質,因而形成高分子量的氣化鉅針簇。隨時間流逝, 形成膠體化的接著懸浮的T a 2 0 5 ,其在約1週之後仍 維持粘性並在約2週後混蔺。因此,含钽先質在醋酸内 之保存不能長久。 本發明的目的在於提出一種在基材上簡單的陶瓷層生 産方法,該陶瓷層含有作為成分之BU該目的藉申請專 利範圍第1項所述之待擻予以完成。 在本發明中,含鉍先質之溶液偽有機酸CnH 2n+;L C 0 0 Η (η=0,1或2>,即甲酸、乙酸及丙酸。令人驚訝地證實: 相反於Boyk等人在論文中所述,前述先質,尤其是含Bi 先質能溶於此類酸中。如果先質同醋酸添加在一起,可 觀察到良好的溶解性。這可以歸因於單一先質之協乘效 應(cooperative effect),例如藉由醋酸極性之改變 (因先質引起)或先質之作用變更。藉由添加水,溶解度 fe可改善。溶解的先質接箸在旋轉方法中施加至基材上 ,該膜被乾燥並在高溫下(通常>25(TC)予以補谋。 在本發明另一實施例中,亦能解決溶解度不良之問題 。在上述例子SBT中,含铋先質及含Sr先質可溶於(例如) 醋酸。此種溶液Li偽穩定的,先質不與醋酸發生化學 度應。在添加水後,可更進一步提升長期穩定性(L2)e 含Ta先質現在能由二種方法予以補充; -5 - 本紙张尺度適m中阗國家標今.(「NS ) Λ4現格(210乂297公釐) n 1 ; ΐ衣 t—. 訂 ^ ^ ("先閱讀背面之注意事項再填寫本頁) 4 63 20 5 A7 B7 五、發明説明 ( 4- ) i 1 (a )現有之溶液L 1 及 L2在含鉅先質熔點以上的溫度 1 1 I 施 加 C 在 積 層 之 Λ.·!^ 刖 立 即 混 合 所 述 溶 液 及 液 狀 之 含 钽 先質 1 1 J 此 時 整 個 糸 統 被 提 升 至 所 述 熔 點 以 上 的 溫 度 0 溶 液及 •- 1 先 i 液 狀 含 鉅 先 質 係 直 接 混 合 > 此 時 若 含 水 之 溶 液 (L 2 )必須 閲 1 I 迅 速 混 合 Ϊ 以 便 迅 速 降 低 含 T a 先 質 之 濃 度 * 並 阻 止 水解 背 1 I 之 1 産 物 迅 速 凝 結 0 所 得 的 混 合 物 t 在 旋 轉 立 法 中 被 施 加在 注 意 古 1 I 基 材 上 〇 事 項 再 1 1 (b )也可以在其他溶劑中溶解含靼先質, 然後該混合物 填 寫 本 裝 1 在 温 合 設 備 中 與 “及L 2 混 合 〇 在 使 用 匕5 _時, 混合應 頁 1 1 迅 速 進 行 9 如 (a )中所述。 此方法之優點偽 含T a先質之 1 1 局 部 過 度 痕 縮 得 以 避 免 i 水 tpl m- 之 危 險 因 而 降 低 0 此 外, 1 1 加 熱 被 取 消 〇 考 慮 作 為 溶 劑 的 材 料 偽 不 與 先 質 在 生 成水 1 訂 時 反 m 〜LL、 者 〇 一 個 例 子 為 四 氫 呋 喃 (THF), 其僅有低的健 1 康 危 害 0 1 1 本 發 明 之 基 本 優 點 偽 使 用 •fffT m 毒 酸 作 為 含 B i先 質 (及視 1 1 情 況 之 其 他 先 質 )之溶劑。 因此, 保護措施較少及用後 1 1 處 理 較 簡 早 0 該 酸 之 進 一 步 優 點 偽 » 其 基 於 其 極 性 不僅 1 能 溶 备77 m g 前 所 用 之 有 機 金 屬 化 學 物 質 , 並 能 能 溶 解 結構 1 I 較 複 雜 之 化 合 物 〇 因 此 » 對 可 資 使 用 之 原 料 化 學 物 質有 1 1 寛 大 的 範 圍 0 巨 前 所 用 的 有 機 金 屬 化 學 物 質 的 缺 點 偽一 1 | 方 面 不 易 使 用 9 另 一 方 面 僅 有 很 低 之 纯 度 〇 前 述 的 優點 1 | 另 外 導 致 成 本 降 低 〇 1 1 在 許 多 情 況 中 * 金 屬 之 乙 酸 鹽 或 氧 化 物 適 合 作 為 先前 1 | ) 進 步 地 t 金 屬 1 尤 其 是 6 Sr , 亦 直 接 溶 於 酸 中 〇 1 1 1 1 1 本紙張尺廋逍^1中國围家標缚((、NS ) Ad規格< 210·Χ297公# ) 6320 5 A7 B7 補充丨 五、發明説明(r )
Ta(0ET)4 (acac)、 Ta(OET)5 或 Ta(OMe)5 適合作為含 Ta先質。
I 在下文中,本發明由實施例更詳细地予以解説。 圖式簡單說明: 第1及2圖傜本發明方法流程圖。第3面為一積體半 導體結構之小斷面圖,其具有一値本發明的FRAM貯存電 池。 第1圖:在第1實施例中,使用下列用以生産S B T之 先質:Ta(OET)4 (acac)作為 Ta 先質、Bi(OAc)3 作為 Bi 先質、Sr(cybu)2(H20)2作為Sr先質。(OET =乙氧化 物、acac =乙醛丙_酸酯、OAc =乙酸酯,cybu =璟己基 丁酸酯)。3.012克之Ta先質、2. 552號之Bi先質及1.451 克Sr先質,在加熱下溶於13.880克醋酸(第1圖}。冷卻 後,經由〇 . 2 a id的濾器過濾,從所得之母溶液能由溶液 能由醋酸之稀釋而得到進一步之溶液。該溶液被施加在 基材上,並以25OOUpm進行離心1分鐘。接著乾燥該層 體,其中在30分內提升溫度至100Ϊ。熱解在約460 °C時 發生於空氣中*例如鼓風爐,持續約 8小時。溫度較佳 以60°C / h調高,以便阻止Bi先質之氣化。取決母液之 稀薄程度,得到各種不同的SBT層厚度"稀釋的母液在 鉑組成之基材上得至約200nm之厚度。藉母液之稀釋而 得之層厚的計算係描述於下表(基材=Pt)。 本紙队尺度過爪中因囤家標唪(CNS ) W见格(210X297公釐)
In - - n^i I! 1— I ^^^1 ^ In - In m ^^^1 J .V ,va (討先閲讀背而之注意事項再填Js?本頁) "":部中*標卑局只工消合竹社印欠 4 63 20 5 Λ7 Α7 ___Β7 五、發明説明() 液 母液量[g ] 所添加之醋 層厚 酸量[g] 1 母液 _ 200 2 0.582 0.014 195 3 0.587 0.027 190 4 0.578 0.040 185 5 0.582 0.050 180 6 0.584 0.056 175 7 0.577 0.070 170 8 0.583 0.082 160 9 0.579 0.106 155 10 0.582 0.122 150 11 0.575 0.132 145 12 0.581 0.155 140 13 0.581 0.164 135 14 0.587 0.184 130 15 0.582 0.203 125 16 0.586 0.221 120 17 0.578 0.245 115 18 0.575 0.282 110 19 0.581 0.294 105 20 ' 0.580 0.333 100 21 0.578 0.359 100 22 0.583 0.378 95 23 0.585 0.416 90 24 0.577 0.449 90 25 0.577 0.491 85 26 0.582 0.536 85 (誚先閱讀背而之注意事項再填寫本頁) -裝 丁 丨-口 本紙张尺度迠州中阈网家標肀((’奶)六4規格(210><297公#) ά 6 3 2 〇 5 Α7 Β7 五、發明説明() (諳先閱讀背面之注意事項再填寫本頁) 若使用si〇2作為基材,在難流動之溶液時有較大之 厚度,如母液有220ΠΙΠ厚度》在稀釋溶液時,未觀察到 層厚度增加。 較大之層厚能由以下之母液取得:2·768克Ta先質、 2. 345克Bi先質、1.3 3 4克Sr先質及10、629克醋酸,此 溶液在P t基材上得到2 8 Ο τι m層厚。在此情況中,也能以 醋酸稀釋母液以降低層厚,例如0 . 7克母液及0 . 0 3 8克醋 酸之混合物得到245ηπι的厚度。較大的層厚也能由離心 及乾燥重複施行而得》 藉前述之方法,能生産具有鐵電特性的SBT層。變更 溶液時存有一問題,即在一週後粘度變化及在二週後變 混濁,這歸因於如同前述之含鉅先質水解。 在下文所逑之本發明第2個實施例中,此變化的問題 被避免,不必使用危險性的溶劑或複雜結構的先質。第 二個實施相似地以S Β Τ膜之生産為例。 第2圖示本發明第2實施例的方法流程β 2.552克之81(0&〇3及1.451克31>(04(:)2,較佳在加 熱下,溶於1 3. 8 8 0克醋酸。在先質溶解後,能以醋酸再 稀釋。這樣得到的溶液L i偽穩定。為進一步提高長期 穩定性,在溶液内再添加水,例如2 g之水(溶液L 2 )。 含“先質若非呈流體狀態(變型(a)),即為溶解狀態(變 型⑴): (a)較佳使用Ta(OEt)s作為含鉬先質,因為其為熔點較 低之簡單化合物。溶液及含组先質分開收藏。在積層之 本紙依尺度適州中國() Λ4坭格(2IOX 297公漦) A7 B7 ^ 6320 5 五、發明説明(f) --------袈-- (#先閱讀背面之注意事項再蛾寫本頁) 前立即將它們混合,此時含鉅先質以流體狀態使用。在 混合過程中,Ta先質直接以流醱狀態在混合機的噴嘴中 與溶液11及[2混合。視情況需要,混合機可被加熱, 以取得流體狀先質。混合物傜由前逑數量的溶液Li及1 及2.66克含鉅先質所生成。接著混合物在旋轉塗覆方法 中施加至基材上。(b)亦使用Ta(OEt)s作為钽先質,其 亦溶於溶劑中,如四氫呋喃(THF)。2.66克Ta(OEUs溶 於(約 6 ns 1 ) T H F 中。 如果混合物镍由含水的溶液U2 )及U)所逑之Ta先質 生成,以下僳重要的:迅速進行混合,以減低含Ta先質 之冷凝,因而避免水解産物之凝聚。此特別適用於方法 (a),因為在(t〇時先質已經稀釋。達成成分均勻混合之 時間較佳偽小於1秒,尤其是方法(a)時。 在施加至基材並離心之後,層體先予乾燥,例如在空 氣中以1 5 0°C進行5分。接箸在IE常大氣壓下以2 9 0 °C加 熱約10分(預烘烤),接著在空氣中以約75tTC進行10分 (退火)。也能使用較簡單的加熱步驟。藉此方法得到約 4 Onm厚的SBT層。如果得到所要的層厚,接著進行最後 的退火步驟(例如8 Q 0°C / 1 h / D 2 本發明的方法亦能以丙酸及丙酸酯取代醋酸及醋酸酯 。為生産StiT層,Bi -丙酸鹽及Sr丙酸鹽以及丙酸溶劑被 使用。另外,也能使用甲酸及其鹽。 _由本發明的方法,能得到其他的陶瓷層。較佳係醋 酸作為含Bi先質及視情況之其他先質的溶劑,但甲酸及 -1 0 - 本紙張尺度適用中闽阄家標肀(CNS ) Λ4規格(210X297公梦) 4, 6 3 t ^ A7 B7 五、發明説明(9 ) (誚先閲讀背而之注意事項再填寫本頁) 丙酸也可使用,並且均視情況可加水稀釋。合適的先質 也能由簡單的研究取得,尤其是乙酸酯或丙酸酯、乙氧 化物、乙醯丙酮酸酯、所需金之簡單鹽類、其氧化物 或金屬本身(Sr金屬溶於醋酸)皆在觀察之列。選擇的基 本關鍵偽本項技術人士所知之化合物特性、市場之供應 、可得之純度以及無危險性。先質及溶劑之比例取決於 欲得之厚度,及層體結構以及均可由簡單的方法予以合 計。 本方法特別可使用於積體電路,尤其是DRAH及FRAM貯 存器的電容之生産。這類貯存器的一個例子傺如第3圖 所示。在Si半導體中,HOS電晶體具有摻雜區2, 4及榈 極3 ,其由電晶體之絶緣區5與相鄰之貯存晶胞相隔。在 佈署由一絶緣層6被覆。藉由一連接結構7(例如由W或 多晶矽組成),摻雜區2穿過絶緣層6而和貯存電容之 電癀8連接。在第1電極之上或下,安裝用於阻止02 擴散之隔層3 (如TiN)。這樣子構成的基材上,接著施 加陶瓷含Bi層10,尤其是鐵電性SBf層,如本發明所生 産之貯存介電體。貯存晶胞完全穿過第2電極11。 -11-本紙ifc尺度適中囿阀家標呤((’NS ) Λ4说格(21〇'〆297公犛)
Claims (1)
- 修正 補充 ^ 6320 5 会88 C8 D8 六、申請專利範圍 第87 1 1 3644號「含鉍陶瓷的製造方法」專利案 (90年9月修正) 申請專利範圍_ 1. —種在基材上生產陶瓷層的方法,該陶瓷層含有Bi 成分並由至少二成分組成,其中 •僅使用一種有機酸CnH2n + 1COOH(n=0,l或2)及 視情況之水作爲含Bi先質之溶劑, -其他先質在其他溶劑中溶解及/或另一先質已準備 成流體狀態, -已溶成流體之先質被施加在基材上, -加熱並生成層體。 2. 如申請專利範圍第1項之方法,其中使用有機酸 C n Η 2 „ + 1 C〇OH(n = 0,1或2)及視情況之水溶劑D 3·如申請專利範圍第2項之方法,其中所有之先質同 時溶於同一先質中。 4. 如申請專利範圍第1項之方法,其中另一先質溶於 四氫呋喃(THF)中。 5. 如申請專利範圍第1項之方法,其中使用有機酸之 鹽、氧化物、乙氧化物或甲氧化物作爲先質。 6·如申請專利範圍第1項之方法,其中生產SBT層(挺 酸緦鉍)。 7. 如申請專利範圍第6項之方法,其中使用Bi(0Ac)3 及Sr(OAc)2’作爲先質,及醋酸作爲溶劑。 8. 如申請專利範圍第6項之方法,其中含秘先質及含 木紙張尺度適用中國画家標_ (CNS)A4規格(2]〇χ 297公釐) — IIIIII1I — 1^.' 1 « — — — — in ^ -1 — — — — — — ·^ (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 4 6320 5 AS B8 C8 D8六、申請專利範圍 緦先質溶解在醋酸中,並提升至高於含鉬先質熔點之 溫度,且其中含鉬先質係,以流體形式與溶液混合,並 將此混合物施加至基材。 9·如申請專利範圍第6項之方法,其中含鉍先質及含 鋸先質溶於醋酸,而含鉬先質溶於THF,且其中這些 先質混合,並將這些先質施加在基材上。 10.如申請專利範圍第S項之方法,其中醋酸溶液以水 稀釋,混合的過程在最多爲1秒的時間即完成。 (請先閱讀背面之注意事項再填寫本頁) I - I I丨I I丨丨訂丨flj丨丨丨- 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用申國國家標準(CNS)A4規格(210 X 297公釐)
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CN100481550C (zh) | 2004-07-13 | 2009-04-22 | 精工爱普生株式会社 | 用于形成铁电薄膜的组合物、铁电薄膜及其制造方法、液体喷射头 |
DK3349802T3 (en) | 2015-09-14 | 2021-10-11 | Univ Texas | Lipocationic dendrimers and uses thereof |
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US5077265A (en) * | 1988-07-22 | 1991-12-31 | The United States Of America As Represented By The Secretary Of Commerce | Co-precipitation synthesis of precursors to bismuth-containing superconductors |
JPH03295808A (ja) * | 1990-04-13 | 1991-12-26 | Sumitomo Electric Ind Ltd | 酸化物超電導体の製造方法 |
US5468679A (en) * | 1991-02-25 | 1995-11-21 | Symetrix Corporation | Process for fabricating materials for ferroelectric, high dielectric constant, and integrated circuit applications |
US5508226A (en) * | 1991-12-13 | 1996-04-16 | Symetrix Corporation | Low temperature process for fabricating layered superlattice materialsand making electronic devices including same |
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US5480862A (en) * | 1993-07-30 | 1996-01-02 | Pirelli Cavi S.P.A. | Method for the preparation of precursors for superconductors and compounds thus obtained |
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US5683614A (en) * | 1996-08-16 | 1997-11-04 | Sandia Corporation | Sol-gel type synthesis of Bi2 (Sr,Ta2)O9 using an acetate based system |
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DE59807942D1 (de) | 2003-05-22 |
JP3571229B2 (ja) | 2004-09-29 |
JPH11171546A (ja) | 1999-06-29 |
DE19743269A1 (de) | 1999-04-01 |
KR19990030232A (ko) | 1999-04-26 |
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