TW429315B - IC test apparatus - Google Patents
IC test apparatusInfo
- Publication number
- TW429315B TW429315B TW088104556A TW88104556A TW429315B TW 429315 B TW429315 B TW 429315B TW 088104556 A TW088104556 A TW 088104556A TW 88104556 A TW88104556 A TW 88104556A TW 429315 B TW429315 B TW 429315B
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- tested
- contact portion
- head
- expel
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Discharge Of Articles From Conveyors (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10106913A JPH11287843A (ja) | 1998-04-02 | 1998-04-02 | Ic試験装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW429315B true TW429315B (en) | 2001-04-11 |
Family
ID=14445680
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW088104556A TW429315B (en) | 1998-04-02 | 1999-03-23 | IC test apparatus |
Country Status (7)
Country | Link |
---|---|
JP (1) | JPH11287843A (zh) |
KR (1) | KR100722644B1 (zh) |
CN (1) | CN1232184A (zh) |
DE (1) | DE19914776A1 (zh) |
MY (1) | MY125628A (zh) |
SG (1) | SG81269A1 (zh) |
TW (1) | TW429315B (zh) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4566482B2 (ja) * | 2001-09-07 | 2010-10-20 | ヤマハ発動機株式会社 | 部品試験装置 |
KR100440780B1 (ko) * | 2002-01-23 | 2004-07-19 | 삼성테크윈 주식회사 | 트레이 반도체 부품배치장치 |
KR100679155B1 (ko) * | 2005-01-25 | 2007-02-05 | (주)테크윙 | 테스트 핸들러 |
KR100714106B1 (ko) | 2005-12-15 | 2007-05-02 | (주)테크윙 | 테스트핸들러 및 테스트핸들러의 작동방법 |
CN101339204B (zh) * | 2007-07-05 | 2010-10-27 | 京元电子股份有限公司 | 匣盘输送装置 |
KR101149334B1 (ko) | 2007-10-31 | 2012-06-01 | 가부시키가이샤 아드반테스트 | 콘택트 아암의 접촉부의 이상을 검출하는 이상검출장치, 이를 구비한 전자부품 시험장치 및 전자부품 시험시스템, 및 이상검출방법 |
JP6069831B2 (ja) * | 2011-12-16 | 2017-02-01 | 富士電機株式会社 | 半導体試験装置 |
KR101428655B1 (ko) * | 2013-02-08 | 2014-08-13 | 바이옵트로 주식회사 | 검사 장치 |
CN109911541B (zh) * | 2019-01-29 | 2021-06-25 | 迈克医疗电子有限公司 | 一种流水线系统 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4869636A (en) * | 1987-06-24 | 1989-09-26 | Reid-Ashman Manufacturing, Inc. | Handler for IC packages |
KR960007507B1 (ko) * | 1990-10-08 | 1996-06-05 | 가부시끼가이샤 아드반테스트 | Ic시험장치 |
US5307011A (en) * | 1991-12-04 | 1994-04-26 | Advantest Corporation | Loader and unloader for test handler |
JP3316075B2 (ja) * | 1994-02-03 | 2002-08-19 | 株式会社アドバンテスト | Ic試験装置用オートハンドラ |
US5588797A (en) * | 1994-07-18 | 1996-12-31 | Advantek, Inc. | IC tray handling apparatus and method |
JPH08170976A (ja) * | 1994-09-06 | 1996-07-02 | Advantest Corp | 半導体試験装置用ハンドラ機構 |
JP3412114B2 (ja) * | 1995-07-26 | 2003-06-03 | 株式会社アドバンテスト | Ic試験装置 |
JPH09113581A (ja) * | 1995-10-20 | 1997-05-02 | Advantest Corp | Ic試験装置 |
-
1998
- 1998-04-02 JP JP10106913A patent/JPH11287843A/ja active Pending
-
1999
- 1999-03-23 TW TW088104556A patent/TW429315B/zh not_active IP Right Cessation
- 1999-03-31 SG SG9901610A patent/SG81269A1/en unknown
- 1999-03-31 DE DE19914776A patent/DE19914776A1/de not_active Withdrawn
- 1999-04-01 MY MYPI99001250A patent/MY125628A/en unknown
- 1999-04-02 CN CN99104796A patent/CN1232184A/zh active Pending
- 1999-04-02 KR KR1019990011643A patent/KR100722644B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR19990082894A (ko) | 1999-11-25 |
KR100722644B1 (ko) | 2007-05-28 |
CN1232184A (zh) | 1999-10-20 |
SG81269A1 (en) | 2001-06-19 |
MY125628A (en) | 2006-08-30 |
DE19914776A1 (de) | 1999-11-25 |
JPH11287843A (ja) | 1999-10-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
GD4A | Issue of patent certificate for granted invention patent | ||
MM4A | Annulment or lapse of patent due to non-payment of fees |