TW376637B - Dust and scratch correction for a film scanner - Google Patents

Dust and scratch correction for a film scanner

Info

Publication number
TW376637B
TW376637B TW087109877A TW87109877A TW376637B TW 376637 B TW376637 B TW 376637B TW 087109877 A TW087109877 A TW 087109877A TW 87109877 A TW87109877 A TW 87109877A TW 376637 B TW376637 B TW 376637B
Authority
TW
Taiwan
Prior art keywords
medium
optical path
image
artifacts
point
Prior art date
Application number
TW087109877A
Other languages
English (en)
Chinese (zh)
Inventor
Donald J Stavely
Daniel M Bloom
Amy E Battles
Dav Id K Campbell
E Oscar R Herrera
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Application granted granted Critical
Publication of TW376637B publication Critical patent/TW376637B/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/024Details of scanning heads ; Means for illuminating the original
    • H04N1/028Details of scanning heads ; Means for illuminating the original for picture information pick-up
    • H04N1/02815Means for illuminating the original, not specific to a particular type of pick-up head
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/00002Diagnosis, testing or measuring; Detecting, analysing or monitoring not otherwise provided for
    • H04N1/00007Diagnosis, testing or measuring; Detecting, analysing or monitoring not otherwise provided for relating to particular apparatus or devices
    • H04N1/00023Colour systems
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/00002Diagnosis, testing or measuring; Detecting, analysing or monitoring not otherwise provided for
    • H04N1/00026Methods therefor
    • H04N1/00037Detecting, i.e. determining the occurrence of a predetermined state

Landscapes

  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Input (AREA)
  • Facsimile Scanning Arrangements (AREA)
TW087109877A 1997-10-14 1998-06-19 Dust and scratch correction for a film scanner TW376637B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/949,507 US5969372A (en) 1997-10-14 1997-10-14 Film scanner with dust and scratch correction by use of dark-field illumination

Publications (1)

Publication Number Publication Date
TW376637B true TW376637B (en) 1999-12-11

Family

ID=25489185

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087109877A TW376637B (en) 1997-10-14 1998-06-19 Dust and scratch correction for a film scanner

Country Status (4)

Country Link
US (1) US5969372A (enExample)
JP (1) JP4183807B2 (enExample)
KR (1) KR19990037083A (enExample)
TW (1) TW376637B (enExample)

Families Citing this family (80)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0901614B1 (en) 1996-05-10 2005-08-10 Eastman Kodak Company Luminance-priority color sensor
US6442301B1 (en) 1997-01-06 2002-08-27 Applied Science Fiction, Inc. Apparatus and method for defect channel nulling
US6380539B1 (en) 1997-01-30 2002-04-30 Applied Science Fiction, Inc. Four color trilinear CCD scanning
US6396565B1 (en) * 1998-01-27 2002-05-28 Noritsu Koki Co., Ltd. Photograph printing device, electronic image input device, film scanner, scratch recognition method, memory medium recording scratch recognition program, and image restoration method
AU2563199A (en) 1998-02-04 1999-08-23 Applied Science Fiction, Inc. Multilinear array sensor with an infrared line
EP1062636A1 (en) 1998-03-13 2000-12-27 Applied Science Fiction, Inc. Image defect correction method
US7067473B1 (en) * 1998-07-14 2006-06-27 Janssen Pharmaceutica N.V. Neurotrophic growth factor
US7164510B1 (en) * 1998-09-17 2007-01-16 Canon Kabushiki Kaisha Image scanning apparatus and method, and storage medium
US6832008B1 (en) 1998-09-25 2004-12-14 Canon Kabushiki Kaisha Image reading apparatus and method, and storage medium
US6437358B1 (en) * 1999-02-04 2002-08-20 Applied Science Fiction, Inc. Apparatus and methods for capturing defect data
JP2000253284A (ja) * 1999-02-26 2000-09-14 Canon Inc 画像読取装置、画像処理システム、画像読取方法、及び記憶媒体
US20010035491A1 (en) * 1999-03-15 2001-11-01 Toru Ochiai Image reading device, method and program
US6552778B1 (en) * 1999-08-02 2003-04-22 Fuji Photo Film Co., Ltd. Image reading device
EP1221256A1 (en) 1999-09-16 2002-07-10 Applied Science Fiction, Inc. Method and system for altering defects in a digital image
AU1077101A (en) * 1999-10-08 2001-04-23 Applied Science Fiction, Inc. Method and apparatus for differential illumination image-capturing and defect handling
WO2001028225A1 (en) * 1999-10-08 2001-04-19 Applied Science Fiction, Inc. Scanner and method
AU1962701A (en) 1999-10-08 2001-04-23 Applied Science Fiction, Inc. System and method for correcting defects in digital images through selective fill-in from surrounding areas
US6924911B1 (en) 1999-10-12 2005-08-02 Eastman Kodak Company Method and system for multi-sensor signal detection
JP4497671B2 (ja) * 1999-10-19 2010-07-07 キヤノン株式会社 画像読取装置の画像処理方法
US6711302B1 (en) 1999-10-20 2004-03-23 Eastman Kodak Company Method and system for altering defects in digital image
JP3486587B2 (ja) * 1999-11-16 2004-01-13 キヤノン株式会社 画像読取装置、画像形成装置、画像形成システム、及び記憶媒体
US6683995B2 (en) 1999-12-23 2004-01-27 Eastman Kodak Company Method and apparatus for correcting large defects in digital images
US7164511B2 (en) * 1999-12-29 2007-01-16 Eastman Kodak Company Distinguishing positive and negative films system and method
US6704458B2 (en) 1999-12-29 2004-03-09 Eastman Kodak Company Method and apparatus for correcting heavily damaged images
US6720560B1 (en) 1999-12-30 2004-04-13 Eastman Kodak Company Method and apparatus for scanning images
US6862117B1 (en) 1999-12-30 2005-03-01 Eastman Kodak Company Method and apparatus for reducing the effect of bleed-through on captured images
JP4056670B2 (ja) * 2000-01-31 2008-03-05 富士フイルム株式会社 画像処理方法
TW520594B (en) * 2000-06-20 2003-02-11 Veutron Corp Optical filtering method and mechanism of optical scanner
US6465801B1 (en) 2000-07-31 2002-10-15 Hewlett-Packard Company Dust and scratch detection for an image scanner
DE10046353A1 (de) * 2000-09-19 2002-04-11 Agfa Gevaert Ag Beleuchtungseinrichtung zum Beleuchten einer transparenten Bildvorlage
US6750435B2 (en) * 2000-09-22 2004-06-15 Eastman Kodak Company Lens focusing device, system and method for use with multiple light wavelengths
AU2001295059A1 (en) * 2000-09-22 2002-04-02 Applied Science Fiction Multiple-orientation image defect detection and correction
TW512621B (en) * 2001-02-15 2002-12-01 Benq Corp Photography negative scanning device using cold cathode tube to unify infrared
GB2372391A (en) * 2001-02-16 2002-08-21 Hewlett Packard Co Removal of specular reflection
US6963355B2 (en) * 2001-02-24 2005-11-08 Eyesee380, Inc. Method and apparatus for eliminating unwanted mirror support images from photographic images
TW573428B (en) * 2001-03-15 2004-01-21 Canon Kk Image reading apparatus and illumination apparatus
JP4630476B2 (ja) * 2001-03-15 2011-02-09 キヤノン株式会社 画像信号処理装置、画像信号処理方法、画像読取システム、プログラム及び媒体
TW563345B (en) * 2001-03-15 2003-11-21 Canon Kk Image processing for correcting defects of read image
JP4012371B2 (ja) * 2001-04-17 2007-11-21 富士フイルム株式会社 欠陥検査装置及び方法
US6987892B2 (en) * 2001-04-19 2006-01-17 Eastman Kodak Company Method, system and software for correcting image defects
US7183532B2 (en) 2001-04-30 2007-02-27 Hewlett-Packard Development Company, L.P. Detecting a defect in an image scanner
DE10137340A1 (de) * 2001-07-31 2003-02-20 Heidelberger Druckmasch Ag Verfahren und Vorrichtung zur Erkennung von Fremdkörpern und Oberflächendefekten auf einer transparenten Vorlage sowie zur Korrektur von dadurch verursachten Bildfehlern einer Abbildung der Vorlage
JP4208115B2 (ja) * 2001-09-12 2009-01-14 富士フイルム株式会社 全反射減衰を利用したセンサー
DE10212919B4 (de) * 2002-03-22 2004-11-11 Heidelberger Druckmaschinen Ag Verfahren zur automatischen Erkennung von Bildfehlern
US20040021769A1 (en) * 2002-07-31 2004-02-05 Eastman Kodak Company Method for detecting artifacts for use in a film scanner
US7103208B2 (en) * 2002-08-26 2006-09-05 Eastman Kodak Company Detecting and classifying blemishes on the transmissive surface of an image sensor package
US6710329B1 (en) 2002-09-12 2004-03-23 Eastman Kodak Company Light integrator for film scanning with enhanced suppression of artifacts due to scratches and debris
US7336400B2 (en) * 2002-10-31 2008-02-26 Hewlett-Packard Development Company, L.P. Transforming an input image to produce an output image
JP2004343319A (ja) * 2003-05-14 2004-12-02 Noritsu Koki Co Ltd 画像読取装置
US7590305B2 (en) * 2003-09-30 2009-09-15 Fotonation Vision Limited Digital camera with built-in lens calibration table
US7676110B2 (en) * 2003-09-30 2010-03-09 Fotonation Vision Limited Determination of need to service a camera based on detection of blemishes in digital images
US7340109B2 (en) * 2003-09-30 2008-03-04 Fotonation Vision Limited Automated statistical self-calibrating detection and removal of blemishes in digital images dependent upon changes in extracted parameter values
US7369712B2 (en) * 2003-09-30 2008-05-06 Fotonation Vision Limited Automated statistical self-calibrating detection and removal of blemishes in digital images based on multiple occurrences of dust in images
US7310450B2 (en) * 2003-09-30 2007-12-18 Fotonation Vision Limited Method of detecting and correcting dust in digital images based on aura and shadow region analysis
US7206461B2 (en) * 2003-09-30 2007-04-17 Fotonation Vision Limited Digital image acquisition and processing system
US7315658B2 (en) * 2003-09-30 2008-01-01 Fotonation Vision Limited Digital camera
US7295233B2 (en) 2003-09-30 2007-11-13 Fotonation Vision Limited Detection and removal of blemishes in digital images utilizing original images of defocused scenes
US8369650B2 (en) 2003-09-30 2013-02-05 DigitalOptics Corporation Europe Limited Image defect map creation using batches of digital images
US7308156B2 (en) * 2003-09-30 2007-12-11 Fotonation Vision Limited Automated statistical self-calibrating detection and removal of blemishes in digital images based on a dust map developed from actual image data
US7424170B2 (en) * 2003-09-30 2008-09-09 Fotonation Vision Limited Automated statistical self-calibrating detection and removal of blemishes in digital images based on determining probabilities based on image analysis of single images
US20050152616A1 (en) * 2004-01-09 2005-07-14 Bailey James R. Method and apparatus for automatic scanner defect detection
TWI241837B (en) * 2004-01-16 2005-10-11 Lite On Technology Corp Method for controlling on/off of LEDs in a scanner
US7719728B2 (en) * 2004-06-16 2010-05-18 Kyocera Mita Corporation Image reading device, image processing system and image forming device
US7634152B2 (en) 2005-03-07 2009-12-15 Hewlett-Packard Development Company, L.P. System and method for correcting image vignetting
JP2006333078A (ja) * 2005-05-26 2006-12-07 Canon Inc 画像読取装置
WO2007095556A2 (en) 2006-02-14 2007-08-23 Fotonation Vision Limited Digital image acquisition device with built in dust and sensor mapping capability
JP4821372B2 (ja) * 2006-03-03 2011-11-24 富士ゼロックス株式会社 画像読み取り装置
DE102006043956A1 (de) * 2006-09-14 2008-04-03 Deutsche Thomson Ohg Filmabtaster und Erfassungsvorrichtung dafür
US9172836B2 (en) * 2007-08-28 2015-10-27 Hewlett-Packard Development Company, Lp. Optical scanner illumination system and method
DE102008027653B4 (de) * 2008-06-10 2012-11-08 Basler Ag Verfahren zur Kontrasterhöhung
US20100195096A1 (en) * 2009-02-04 2010-08-05 Applied Materials, Inc. High efficiency multi wavelength line light source
US8144973B2 (en) * 2009-03-24 2012-03-27 Orbotech Ltd. Multi-modal imaging
JP5056798B2 (ja) * 2009-06-08 2012-10-24 日本電気株式会社 判定装置、指紋入力装置、判定方法および判定プログラム
DE102009049203B4 (de) * 2009-10-13 2016-10-13 Arnold & Richter Cine Technik Gmbh & Co. Betriebs Kg Diagnoseeinheit für eine elektronische Kamera und Kamerasystem
US8416409B2 (en) * 2010-06-04 2013-04-09 Lockheed Martin Corporation Method of ellipsometric reconnaissance
US9488597B2 (en) * 2011-11-30 2016-11-08 Corning Incorporated Apparatus and methods for determining surface compliance for a glass surface
KR101665977B1 (ko) * 2014-09-23 2016-10-24 주식회사 신도리코 이미지 보정 장치 및 방법
EP3016368A1 (en) * 2014-10-27 2016-05-04 Thomson Licensing Method and apparatus for handling a defect object in an image
JP2021068971A (ja) * 2019-10-21 2021-04-30 京セラドキュメントソリューションズ株式会社 画像読取装置
US12175654B2 (en) 2020-11-06 2024-12-24 Carl Zeiss Metrology Llc Surface inspection system and method for differentiating particulate contamination from defects on a surface of a specimen

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4232937A (en) * 1978-10-16 1980-11-11 American Optical Corporation Bright field-dark field illumination system
US4265545A (en) * 1979-07-27 1981-05-05 Intec Corporation Multiple source laser scanning inspection system
US4647196A (en) * 1981-01-20 1987-03-03 Hitachi Metals, Ltd. Surface flaw detection method
DE3610165A1 (de) * 1985-03-27 1986-10-02 Olympus Optical Co., Ltd., Tokio/Tokyo Optisches abtastmikroskop
US4972091A (en) * 1989-05-16 1990-11-20 Canadian Patents And Development Limited/Societe Canadienne Des Brevets Et D'exploitation Limitee Method and apparatus for detecting the presence of flaws in a moving sheet of material
US5179422A (en) * 1991-05-15 1993-01-12 Environmental Research Institute Of Michigan Contamination detection system
JPH05149889A (ja) * 1991-11-29 1993-06-15 Sumitomo Metal Ind Ltd 光学式疵検査装置の感度調整方法および感度調整用試片
US5266805A (en) * 1992-05-05 1993-11-30 International Business Machines Corporation System and method for image recovery
JPH06207910A (ja) * 1993-01-11 1994-07-26 Fuji Photo Film Co Ltd 表面検査装置
JPH09163133A (ja) * 1995-12-12 1997-06-20 Fuji Photo Film Co Ltd フィルムスキャナ装置
US5665963A (en) * 1996-01-24 1997-09-09 Hewlett-Packard Company Reflective color filter for color correction of photodetector filters
JPH09251528A (ja) * 1996-03-15 1997-09-22 Sony Corp フィルム画像読み取り装置
US6442301B1 (en) * 1997-01-06 2002-08-27 Applied Science Fiction, Inc. Apparatus and method for defect channel nulling
US6380539B1 (en) * 1997-01-30 2002-04-30 Applied Science Fiction, Inc. Four color trilinear CCD scanning

Also Published As

Publication number Publication date
JP4183807B2 (ja) 2008-11-19
US5969372A (en) 1999-10-19
JPH11185028A (ja) 1999-07-09
KR19990037083A (ko) 1999-05-25

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