TW331028B - Semiconductor memory device - Google Patents
Semiconductor memory deviceInfo
- Publication number
- TW331028B TW331028B TW086104658A TW86104658A TW331028B TW 331028 B TW331028 B TW 331028B TW 086104658 A TW086104658 A TW 086104658A TW 86104658 A TW86104658 A TW 86104658A TW 331028 B TW331028 B TW 331028B
- Authority
- TW
- Taiwan
- Prior art keywords
- memory cell
- bit line
- line pairs
- internal
- internal address
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/30—Accessing single arrays
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/36—Data generation devices, e.g. data inverters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/46—Test trigger logic
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Dram (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Dicing (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8325340A JPH10172298A (ja) | 1996-12-05 | 1996-12-05 | 半導体記憶装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW331028B true TW331028B (en) | 1998-05-01 |
Family
ID=18175720
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW086104658A TW331028B (en) | 1996-12-05 | 1997-04-11 | Semiconductor memory device |
Country Status (6)
Country | Link |
---|---|
US (1) | US6065143A (ja) |
JP (1) | JPH10172298A (ja) |
KR (1) | KR100272939B1 (ja) |
CN (1) | CN1096083C (ja) |
DE (1) | DE19734908A1 (ja) |
TW (1) | TW331028B (ja) |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4249285B2 (ja) * | 1998-03-25 | 2009-04-02 | 株式会社アドバンテスト | フィジカル変換定義編集装置 |
JP3797810B2 (ja) * | 1998-11-30 | 2006-07-19 | 松下電器産業株式会社 | 半導体装置 |
KR100324589B1 (ko) | 1998-12-24 | 2002-04-17 | 박종섭 | 반도체 소자의 강유전체 캐패시터 제조방법 |
KR100321714B1 (ko) | 1998-12-30 | 2002-05-09 | 박종섭 | 반도체메모리소자의캐패시터제조방법 |
KR100355225B1 (ko) * | 1999-07-12 | 2002-10-11 | 삼성전자 주식회사 | 교류 스트레스의 번-인 테스트가 가능한 집적회로 및 이를 이용한 테스트 방법 |
KR100328809B1 (ko) * | 1999-07-22 | 2002-03-14 | 윤종용 | 웨이퍼 레벨 테스트 기능을 갖는 반도체 메모리 장치 |
TW432574B (en) * | 2000-01-19 | 2001-05-01 | Yang Wen Kun | Wafer level burn in device and method |
JP4556051B2 (ja) * | 2000-08-30 | 2010-10-06 | エルピーダメモリ株式会社 | 半導体集積回路及びその動作方法。 |
US7035154B2 (en) * | 2000-08-31 | 2006-04-25 | Nec Electronics Corporation | Semiconductor memory device and its test method as well as test circuit |
JP2002373499A (ja) | 2001-06-13 | 2002-12-26 | Seiko Epson Corp | 半導体メモリ及びこのバーンイン方法 |
DE10131277A1 (de) * | 2001-06-28 | 2003-01-16 | Infineon Technologies Ag | On Chip Scrambling |
KR100386846B1 (ko) * | 2001-07-04 | 2003-06-09 | 엘지산전 주식회사 | 전자식 타임스위치의 시간 가속 테스트 방법 |
JP3759026B2 (ja) | 2001-12-06 | 2006-03-22 | セイコーエプソン株式会社 | 半導体装置およびその検査方法ならびに電子機器 |
KR100463238B1 (ko) * | 2002-04-04 | 2004-12-29 | 주식회사 하이닉스반도체 | 반도체 메모리 소자 |
JP4128395B2 (ja) * | 2002-05-23 | 2008-07-30 | 三菱電機株式会社 | データ変換装置 |
JP4623355B2 (ja) * | 2003-04-01 | 2011-02-02 | ソニー株式会社 | 半導体記憶装置及び半導体記憶装置の記憶再生方法 |
TWI242213B (en) * | 2003-09-09 | 2005-10-21 | Winbond Electronics Corp | Device and method of leakage current cuter and memory cell and memory device thereof |
DE102004009692B4 (de) * | 2004-02-27 | 2006-06-14 | Infineon Technologies Ag | Halbleiterspeichervorrichtung |
US7248511B2 (en) * | 2005-02-24 | 2007-07-24 | Infineon Technologies Ag | Random access memory including selective activation of select line |
KR100763248B1 (ko) * | 2006-07-07 | 2007-10-04 | 삼성전자주식회사 | 반도체 메모리 장치 및 그의 spa 모드 구현 방법 |
US7510960B2 (en) * | 2006-08-29 | 2009-03-31 | International Business Machines Corporation | Bridge for semiconductor internal node |
US7743305B2 (en) * | 2007-03-20 | 2010-06-22 | Advantest Corporation | Test apparatus, and electronic device |
KR100927397B1 (ko) * | 2007-06-08 | 2009-11-19 | 주식회사 하이닉스반도체 | 반도체 메모리장치 및 그 리드/라이트 방법 |
KR100845810B1 (ko) | 2007-08-14 | 2008-07-14 | 주식회사 하이닉스반도체 | 웨이퍼 번인 테스트 회로 |
US20090121357A1 (en) * | 2007-11-08 | 2009-05-14 | International Business Machines Corporation | Design structure for bridge of a seminconductor internal node |
KR100945792B1 (ko) | 2008-03-12 | 2010-03-08 | 주식회사 하이닉스반도체 | 어드레스 제어 회로를 포함하는 반도체 집적 회로 |
JP5632584B2 (ja) * | 2009-02-05 | 2014-11-26 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体装置 |
CN102142283B (zh) * | 2010-01-28 | 2013-03-13 | 中芯国际集成电路制造(上海)有限公司 | 非易失性存储器的测试方法 |
CN102707844B (zh) * | 2012-06-15 | 2016-04-13 | 广州视睿电子科技有限公司 | 提高红外触摸设备响应速度的方法以及红外触摸设备 |
KR102091524B1 (ko) * | 2018-07-23 | 2020-03-23 | 삼성전자주식회사 | 어드레스를 스크램블하는 메모리 장치 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6015900A (ja) * | 1983-07-08 | 1985-01-26 | Toshiba Corp | 半導体メモリ |
JPS6238600A (ja) * | 1985-08-14 | 1987-02-19 | Fujitsu Ltd | 半導体記憶装置 |
US5034923A (en) * | 1987-09-10 | 1991-07-23 | Motorola, Inc. | Static RAM with soft defect detection |
JPH02278847A (ja) * | 1989-04-20 | 1990-11-15 | Fujitsu Ltd | 半導体装置 |
US5463585A (en) * | 1993-04-14 | 1995-10-31 | Nec Corporation | Semiconductor device incorporating voltage reduction circuit therein |
JPH0793997A (ja) * | 1993-09-24 | 1995-04-07 | Nec Corp | スタティック型半導体記憶装置 |
JPH07282599A (ja) * | 1994-04-07 | 1995-10-27 | Hitachi Ltd | 半導体記憶装置 |
JPH08306747A (ja) * | 1995-04-28 | 1996-11-22 | Matsushita Electric Ind Co Ltd | 半導体装置の検査方法及びその検査に用いるプローブカード |
JP2780674B2 (ja) * | 1995-06-20 | 1998-07-30 | 日本電気株式会社 | 不揮発性半導体記憶装置 |
JP3865828B2 (ja) * | 1995-11-28 | 2007-01-10 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
-
1996
- 1996-12-05 JP JP8325340A patent/JPH10172298A/ja not_active Withdrawn
-
1997
- 1997-04-11 TW TW086104658A patent/TW331028B/zh active
- 1997-05-21 KR KR1019970019685A patent/KR100272939B1/ko not_active IP Right Cessation
- 1997-07-21 CN CN97115439A patent/CN1096083C/zh not_active Expired - Fee Related
- 1997-08-04 US US08/905,542 patent/US6065143A/en not_active Expired - Fee Related
- 1997-08-12 DE DE19734908A patent/DE19734908A1/de not_active Ceased
Also Published As
Publication number | Publication date |
---|---|
KR100272939B1 (ko) | 2000-12-01 |
JPH10172298A (ja) | 1998-06-26 |
CN1096083C (zh) | 2002-12-11 |
DE19734908A1 (de) | 1998-06-10 |
CN1184330A (zh) | 1998-06-10 |
KR19980063307A (ko) | 1998-10-07 |
US6065143A (en) | 2000-05-16 |
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